JP2010228085A - Polishing device - Google Patents

Polishing device Download PDF

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JP2010228085A
JP2010228085A JP2009081551A JP2009081551A JP2010228085A JP 2010228085 A JP2010228085 A JP 2010228085A JP 2009081551 A JP2009081551 A JP 2009081551A JP 2009081551 A JP2009081551 A JP 2009081551A JP 2010228085 A JP2010228085 A JP 2010228085A
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polishing
liquid
polishing liquid
pressure
tool
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JP5495599B2 (en
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Kazuhiro Oki
一弘 大木
Ikuhiro Zaitsu
育浩 財津
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Canon Inc
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Canon Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent a polishing liquid from entering an inner part of a device to deteriorate rotating accuracy in the polishing device which allows a polishing tool to come into contact with a surface to be polished by pressure, rotates the polishing tool and supplies the slurry type polishing liquid including micro particles to polish the surface. <P>SOLUTION: The slurry type polishing liquid 11 including the micro particles is introduced from a hollow part 1a formed at a rotating shaft of the polishing tool 1 and supplied to a pressure contact part 23 of an object 22 to be polished to polish the object. To gaps 8a and 8b of a bearing for rotatably supporting the polishing tool 1, the same liquids 16 as a solvent of the polishing liquid 11 are supplied to prevent the micro particles of the polishing liquid 11 from entering the gaps 8a and 8b of the bearing. A polishing liquid introducing port 3 communicates with the gap 8a and the supply pressure of the liquid 16 is higher than the supply pressure of the polishing liquid 11. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、高い形状精度が要求される光学素子等を研磨加工するための研磨装置に関するものである。   The present invention relates to a polishing apparatus for polishing an optical element or the like that requires high shape accuracy.

近年、X線やさらなる短波長を光源とする露光装置に搭載される光学素子等の研磨加工に用いられる高精度な研磨装置においては、数ナノメートルの研磨除去量精度が必要となる。   In recent years, a high-precision polishing apparatus used for polishing an optical element or the like mounted on an exposure apparatus using X-rays or a further short wavelength as a light source requires a polishing removal amount accuracy of several nanometers.

従来の研磨装置は、微粒子を含むスラリー状の研磨液を導入するため、研磨工具の回転軸を保持する軸受等装置内部への研磨液の浸入を防ぐ目的で、そのシール部にメカニカルシールやオイルシールを配置した構成が知られている。ここでメカニカルシールとは、回転軸に取付けられる摺動リングと、軸受ハウジングの固定リングとが、その摺動面で接触して漏れを止める構成である。また、オイルシールは、断面コの字状のシール材からなり、軸受ハウジングに固定され、シール材のシール面を回転軸の外周面に押圧するスプリングを有し、その摺動面で接触して漏れを止めるように構成されている。   Since the conventional polishing apparatus introduces a slurry-like polishing liquid containing fine particles, a mechanical seal or oil is applied to the seal portion for the purpose of preventing the polishing liquid from entering the apparatus such as a bearing that holds the rotating shaft of the polishing tool. A configuration in which a seal is arranged is known. Here, the mechanical seal has a configuration in which a sliding ring attached to the rotating shaft and a fixed ring of the bearing housing come into contact with each other on the sliding surface to stop leakage. The oil seal is made of a sealing material having a U-shaped cross section, and is fixed to the bearing housing and has a spring that presses the sealing surface of the sealing material against the outer peripheral surface of the rotating shaft, and is in contact with the sliding surface. Configured to stop leaks.

特許文献1には、摺動面での接触部位の材質を炭化珪素等にし、かつ線接触する尖端形状に形成され、互いに押圧されて漏れを止める構成が開示されている。特許文献2には、メカニカルシールにおける各密封環への接触部分を潤滑水により潤滑する構成が開示されている。   Patent Document 1 discloses a configuration in which the material of the contact portion on the sliding surface is made of silicon carbide or the like and is formed in a pointed shape that is in line contact and pressed against each other to stop leakage. Patent Document 2 discloses a configuration in which a contact portion of each mechanical seal with each sealing ring is lubricated with lubricating water.

また、特許文献3には、流体供給ポート外面に有する外筒と、この外筒に挿入されて軸受で保持され回転駆動される回転体とを設けて、流体供給ポートから回転体の端面に通ずる流路を形成する構成が開示されている。研磨液は、メカニカルシールされた空間を通り回転体に流導される。   Patent Document 3 further includes an outer cylinder that is provided on the outer surface of the fluid supply port, and a rotating body that is inserted into the outer cylinder, is held by a bearing and is driven to rotate, and communicates with the end surface of the rotating body from the fluid supply port. A configuration for forming a flow path is disclosed. The polishing liquid is guided to the rotating body through the mechanically sealed space.

さらに、図2に示すような研磨装置も提案されている。管状の軸部を有する研磨工具101は、軸受ホルダ105に設置された軸受102a、102bにより保持され、回転モータ107に接続され回転可能となっている。メカニカルシール120a、120bは研磨工具101を保持する軸受102a、102bの端面方向に配置される。   Furthermore, a polishing apparatus as shown in FIG. 2 has also been proposed. A polishing tool 101 having a tubular shaft portion is held by bearings 102a and 102b installed in a bearing holder 105, and is connected to a rotary motor 107 so as to be rotatable. The mechanical seals 120a and 120b are disposed in the end face direction of the bearings 102a and 102b that hold the polishing tool 101.

研磨液導入環110は、内部に穴を開け、研磨工具101の外周部に間隙をもって配置され、穴の内周部位には液溜り108を持つ。ポンプ112は、研磨液タンク113より液溜り108へ研磨液111を送る。回転モータ107、軸受ホルダ105及び研磨液導入環110は架台に支持されている。   The polishing liquid introduction ring 110 has a hole in the inside, is disposed with a gap in the outer peripheral portion of the polishing tool 101, and has a liquid reservoir 108 at the inner peripheral portion of the hole. The pump 112 sends the polishing liquid 111 from the polishing liquid tank 113 to the liquid reservoir 108. The rotation motor 107, the bearing holder 105, and the polishing liquid introduction ring 110 are supported by a gantry.

研磨工具101の回転による研磨加工中は、液溜り108より排出される研磨液111は、研磨液導入環110と研磨工具101との間隙から流出する。これと同時に、一部は研磨工具101の側面に形成された導入穴121より管内に流入し、研磨工具101と被加工物122との圧接部位123に吐出される。不要となり容器124へ溜まった研磨液111は、研磨液タンク113へ再集される。   During the polishing process by the rotation of the polishing tool 101, the polishing liquid 111 discharged from the liquid reservoir 108 flows out from the gap between the polishing liquid introduction ring 110 and the polishing tool 101. At the same time, a part flows into the pipe through the introduction hole 121 formed on the side surface of the polishing tool 101 and is discharged to the pressure contact portion 123 between the polishing tool 101 and the workpiece 122. The polishing liquid 111 that has become unnecessary and has accumulated in the container 124 is collected again in the polishing liquid tank 113.

一般に研磨液は、セラミック微粒子を溶媒に混合し使用する。研磨液の濃度は研磨加工の除去量に大きく起因し、濃い方が研磨除去量が大きく、逆に薄い方が小さい。従来は、予め研磨液タンク内で濃度調整を行っている。   Generally, the polishing liquid is used by mixing ceramic fine particles with a solvent. The concentration of the polishing liquid largely depends on the removal amount of the polishing process, and the darker one has a larger polishing removal amount, and the thinner one has a smaller one. Conventionally, the concentration is adjusted in advance in the polishing liquid tank.

特許第2941786号公報Japanese Patent No. 2941786 特開2001−4083号公報JP 2001-4083 A 特登録03318303号公報Japanese Patent Registration No.03318303

しかしながら、メカニカルシールを使用した場合には、研磨液中の微粒子がメカニカルシールの摺動面間に入り込むことで摺動リングが磨耗し、早期にシールが破壊されて研磨液の漏れや装置内部への侵入を生じるおそれがあった。   However, when a mechanical seal is used, fine particles in the polishing liquid enter between the sliding surfaces of the mechanical seal, so that the sliding ring wears out, and the seal is destroyed at an early stage. There was a risk of intrusion.

オイルシールにおいても、シール面と回転軸の外周面との摺動面に微粒子が入り込みシール面が磨耗し、早期にシールが破壊されて研磨液の漏れや装置内部への侵入を生じる欠点があった。   Oil seals also have the disadvantage that fine particles enter the sliding surface between the seal surface and the outer peripheral surface of the rotating shaft, and the seal surface wears out, causing the seal to break down early and causing leakage of the polishing liquid and intrusion into the device. It was.

また、摺動部位の材質を炭化珪素等にし、かつ線接触する尖端形状に形成した場合や、潤滑水により潤滑した場合においても、特に高速回転の場合に、摺動面に微粒子が入り込んでシール面が磨耗し、シールが破壊されることがあった。   Even when the sliding part is made of silicon carbide or the like and formed into a pointed shape that makes line contact, or when it is lubricated with lubricating water, especially when rotating at high speed, fine particles enter the sliding surface and seal it. The surface could wear and the seal could be destroyed.

図2に示す装置では、研磨加工中に研磨液が漏れる構造であるから、その漏れ量は不均一となって、研磨工具と被加工物との圧接部位における研磨液の圧力の正確なコントロールが難しい。研磨加工において、研磨工具と被加工物との圧接部位の圧力は、研磨除去量に比例しており、研磨液の圧力の変動は圧接部位の圧力変動となって、研磨除去量の変動となる。加えて、研磨液の装置内部への浸水や研磨液の飛散によって、メカニカルシールのシール面と回転軸との摺動面に微粒子が入り込み、シール面が磨耗してシールが破壊される。その結果、装置内部へ研磨液が侵入して軸受を破壊するため、回転精度が劣化する場合があった。研磨加工において、回転精度は研磨除去量へ影響し、回転精度の低下は研磨除去量の変動となる。   Since the apparatus shown in FIG. 2 has a structure in which the polishing liquid leaks during the polishing process, the amount of leakage is non-uniform, and accurate control of the pressure of the polishing liquid at the pressure contact portion between the polishing tool and the workpiece is possible. difficult. In the polishing process, the pressure at the pressure contact portion between the polishing tool and the workpiece is proportional to the polishing removal amount, and the fluctuation in the pressure of the polishing liquid becomes the pressure fluctuation at the pressure contact portion, resulting in a fluctuation in the polishing removal amount. . In addition, fine particles enter the sliding surface between the sealing surface of the mechanical seal and the rotating shaft due to the immersion of the polishing liquid into the apparatus or the scattering of the polishing liquid, and the seal surface is worn and the seal is destroyed. As a result, the polishing liquid enters the inside of the apparatus and destroys the bearing, which may deteriorate the rotational accuracy. In the polishing process, the rotation accuracy affects the polishing removal amount, and a decrease in the rotation accuracy results in fluctuation of the polishing removal amount.

また、予め研磨液タンク内で濃度調整を行い使用していたため、加工中に研磨液の濃度が変化しても対応できないという未解決の課題があった。研磨加工において、研磨液の濃度は研磨除去量に比例しており、研磨液濃度の変動は研磨除去量の変動となる。   Further, since the concentration is adjusted and used in the polishing liquid tank in advance, there is an unsolved problem that even if the concentration of the polishing liquid changes during processing, it cannot be dealt with. In the polishing process, the concentration of the polishing liquid is proportional to the polishing removal amount, and the fluctuation of the polishing liquid concentration becomes the fluctuation of the polishing removal amount.

本発明は、シールの破壊による研磨液の漏れや装置内部への侵入を防ぎ、研磨工具と被加工物との圧接部位における研磨液の圧力や濃度の制御も容易である研磨装置を提供することを目的とするものである。   The present invention provides a polishing apparatus that prevents the polishing liquid from leaking or entering the inside of the apparatus due to the breakage of the seal, and that can easily control the pressure and concentration of the polishing liquid at the pressure contact portion between the polishing tool and the workpiece. It is intended.

上記目的を達成するため、本発明の研磨装置は、被加工物に圧接して回転させる研磨工具と、前記研磨工具と一体である回転軸と、前記回転軸の中空部を通って、微粒子を含む研磨液を前記研磨工具と前記被加工物の間の圧接部位に供給する研磨液供給手段と、前記回転軸を回転支持する軸受と、前記軸受と前記回転軸との隙間に、前記研磨液の溶媒と同じ液体を供給するための液体供給手段と、前記隙間と前記回転軸の中空部とを連通させる連通部と、を有し、前記研磨液供給手段は、前記連通部を経て前記研磨液を前記回転軸の中空部へ導入することを特徴とする。   In order to achieve the above object, a polishing apparatus of the present invention comprises a polishing tool that is pressed against a workpiece and rotated, a rotating shaft that is integral with the polishing tool, and a hollow portion of the rotating shaft. A polishing liquid supply means for supplying a polishing liquid containing the polishing liquid to a pressure contact portion between the polishing tool and the workpiece, a bearing for rotating and supporting the rotating shaft, and a gap between the bearing and the rotating shaft in the polishing liquid A liquid supply means for supplying the same liquid as the solvent of the above, and a communication portion for communicating the gap and the hollow portion of the rotating shaft, and the polishing liquid supply means passes through the communication portion and is used for the polishing. The liquid is introduced into the hollow portion of the rotating shaft.

軸受の隙間に供給される液体は、微粒子を含むスラリー状の研磨液が軸受のシール部載に接触するのを防ぐ。これにより、研磨液によるシールの破壊を回避し、シールを長寿命化するとともに、研磨工具の回転精度を維持して高い研磨除去量精度を得ることができる。   The liquid supplied to the gap of the bearing prevents the slurry-like polishing liquid containing fine particles from coming into contact with the bearing portion of the bearing. Thereby, destruction of the seal by the polishing liquid can be avoided, the life of the seal can be extended, and the rotation accuracy of the polishing tool can be maintained to obtain high polishing removal amount accuracy.

また、研磨液の漏れによる圧力変化を防ぎ、研磨工具と被加工物との圧接部位における研磨液の圧力制御が可能となる。その結果、より高い研磨除去量精度が得られる。   Further, it is possible to prevent pressure change due to leakage of the polishing liquid, and to control the pressure of the polishing liquid at the pressure contact portion between the polishing tool and the workpiece. As a result, higher polishing removal amount accuracy can be obtained.

また、シールのための液体を研磨液に混合させることで、蒸発による研磨液の濃度の上昇を加工中に補正することが可能となり、長時間の加工においても高い研磨除去量精度を維持することができる。   Also, by mixing the sealing liquid into the polishing liquid, it is possible to correct the increase in the polishing liquid concentration due to evaporation during processing, and maintain high polishing removal amount accuracy even during long-time processing. Can do.

一実施例による研磨装置を示す模式断面図である。1 is a schematic cross-sectional view showing a polishing apparatus according to one embodiment. 従来の研磨装置を示す模式断面図である。It is a schematic cross section which shows the conventional grinding | polishing apparatus.

本発明を実施するための形態を図面に基づいて説明する。   DESCRIPTION OF EMBODIMENTS Embodiments for carrying out the present invention will be described with reference to the drawings.

図1は、一実施例による研磨装置を示すもので、研磨工具1と一体である回転軸は中空部1aを有する。研磨工具1の回転軸を回転支持する軸受は、ベアリング2a、2bと、研磨液供給手段を構成する研磨液導入穴3及び液体供給手段を構成する液体導入穴4a、4bが形成されたMハウジング5とを備える。研磨工具1は、カップリング6を介して回転モーター7によって回転駆動される。Mハウジング5は、研磨工具1の回転軸との間に隙間8aをもって配置される。隙間8aは3〜25μmである。Mハウジング5の下端には、Oリング9を介してSハウジング10が配置される。Sハウジング10は、Mハウジング5と同様に、研磨工具1の回転軸との間に隙間8bをもって配置され、液体導入穴4cを備える。隙間8bは3〜15μmである。   FIG. 1 shows a polishing apparatus according to an embodiment, and a rotating shaft integral with a polishing tool 1 has a hollow portion 1a. The bearing for rotating and supporting the rotating shaft of the polishing tool 1 is an M housing in which bearings 2a and 2b, a polishing liquid introduction hole 3 constituting a polishing liquid supply means, and liquid introduction holes 4a and 4b constituting a liquid supply means are formed. 5. The polishing tool 1 is rotationally driven by a rotary motor 7 through a coupling 6. The M housing 5 is disposed with a gap 8 a between the rotating shaft of the polishing tool 1. The gap 8a is 3 to 25 μm. An S housing 10 is disposed at the lower end of the M housing 5 via an O-ring 9. Similar to the M housing 5, the S housing 10 is arranged with a gap 8 b between the rotating shaft of the polishing tool 1 and includes a liquid introduction hole 4 c. The gap 8b is 3 to 15 μm.

研磨工具1の先端径は、φ30mmである。   The tip diameter of the polishing tool 1 is φ30 mm.

研磨液11は、酸化セリウムの微粒子を溶媒である純水に混合させたものである。   The polishing liquid 11 is obtained by mixing fine particles of cerium oxide with pure water as a solvent.

研磨液11は、研磨液ポンプ12により、研磨液タンク13からMハウジング5に形成された研磨液導入穴3へ送られる。その流路には研磨液圧力計14が設置されて研磨液11の供給圧力を計測する。   The polishing liquid 11 is sent from the polishing liquid tank 13 to the polishing liquid introduction hole 3 formed in the M housing 5 by the polishing liquid pump 12. A polishing liquid pressure gauge 14 is installed in the flow path to measure the supply pressure of the polishing liquid 11.

液体16は、研磨液11の溶媒と同じ液体である純水であって、研磨液液体ポンプ17により、液体タンク18からMハウジング5及びSハウジング10に形成された液体導入穴4a、4b、4cへ送られる。その流路には液体圧力計19が設置されて液体16の供給圧力を計測する。   The liquid 16 is pure water which is the same liquid as the solvent of the polishing liquid 11, and the liquid introduction holes 4 a, 4 b, 4 c formed in the M housing 5 and the S housing 10 from the liquid tank 18 by the polishing liquid pump 17. Sent to. A liquid pressure gauge 19 is installed in the flow path to measure the supply pressure of the liquid 16.

液体導入穴4a、4b、4cに送られた液体16は、研磨工具1の回転軸と、Mハウジング5及びSハウジング10との隙間8a、8bに満たされ、Oリング20及びOリング9によりシールされる。   The liquid 16 sent to the liquid introduction holes 4a, 4b, and 4c is filled in the clearances 8a and 8b between the rotating shaft of the polishing tool 1 and the M housing 5 and the S housing 10, and sealed by the O-ring 20 and the O-ring 9. Is done.

研磨液導入穴3はMハウジング5の隙間8aに連通し、研磨液11は、研磨工具1の回転軸の側面に形成された連通部である4箇所の繋ぎ穴21を経て中空部1aに導入され、研磨工具1と被加工物22との圧接部位23に供給される。   The polishing liquid introduction hole 3 communicates with the gap 8a of the M housing 5, and the polishing liquid 11 is introduced into the hollow part 1a through four connecting holes 21 which are communication parts formed on the side surface of the rotating shaft of the polishing tool 1. Then, it is supplied to the pressure contact portion 23 between the polishing tool 1 and the workpiece 22.

不要となり容器24に流出した研磨液11は、研磨液ドレンタンク25へ回収される。
差圧制御装置26は、研磨液圧力計14と液体圧力計19からの圧力測定値を取り込み、圧力差を算出して、後述の圧力差になるように、研磨液ポンプ制御装置27、液体ポンプ制御装置28双方に指令を出す。さらに、研磨液ポンプ制御装置27、液体ポンプ制御装置28双方の起動、停止を司る。
The polishing liquid 11 that has become unnecessary and has flowed into the container 24 is collected in the polishing liquid drain tank 25.
The differential pressure control device 26 takes in the pressure measurement values from the polishing liquid pressure gauge 14 and the liquid pressure gauge 19, calculates the pressure difference, and sets the polishing liquid pump control apparatus 27 and the liquid pump so that the pressure difference described later is obtained. Commands are issued to both control devices 28. Furthermore, it controls both starting and stopping of both the polishing liquid pump control device 27 and the liquid pump control device 28.

架台に設置されたXステージ29及びYステージ30は、容器24を載せて被加工物22を水平方向に動かす。   The X stage 29 and the Y stage 30 installed on the gantry place the container 24 and move the workpiece 22 in the horizontal direction.

研磨工具1、Mハウジング5、カップリング6、回転モーター7、Sハウジング10等は、Zスライド31に支持され、錘32の荷重を調整することにより、圧接部位23に後述するような圧力をかける。   The polishing tool 1, the M housing 5, the coupling 6, the rotary motor 7, the S housing 10, and the like are supported by the Z slide 31, and apply a pressure as described later to the pressure contact portion 23 by adjusting the load of the weight 32. .

次に本実施例の研磨装置を使った研磨加工を説明する。   Next, a polishing process using the polishing apparatus of this embodiment will be described.

被加工物22はφ160mmの合成石英ガラスであり、平面研磨加工を施す。   The workpiece 22 is a synthetic quartz glass having a diameter of 160 mm and is subjected to a surface polishing process.

まず、差圧制御装置26により液体ポンプ17を起動させ、液体導入穴4a、4b、4cを通って、研磨工具1の回転軸と各ハウジングとの隙間8a、8bに液体16を満たす。そのときの液体16の供給圧力を2500Paとした。   First, the liquid pump 17 is activated by the differential pressure control device 26, and the liquid 16 is filled in the gaps 8a and 8b between the rotating shaft of the polishing tool 1 and the respective housings through the liquid introduction holes 4a, 4b, and 4c. The supply pressure of the liquid 16 at that time was 2500 Pa.

そして、差圧制御装置26により研磨液ポンプ12を起動した。ここで、研磨液11の供給圧力を、隙間8a、8bに供給される液体16よりも低い1400Paとした。差圧制御装置26は液体圧力計19及び研磨液圧力計14からの圧力測定値を取り込み、逐次圧力差1100Paとなるように、液体ポンプ制御装置28及び研磨液ポンプ制御装置27双方に指令を出し制御する。次に、回転モーター7により研磨工具1を3000rpmで回転させた。圧接部位23にかかる荷重を、研磨工具1、Mハウジング5、カップリング6、回転モーター7等を含み錘32を調節して5Nとした。   Then, the polishing liquid pump 12 was started by the differential pressure control device 26. Here, the supply pressure of the polishing liquid 11 was set to 1400 Pa, which is lower than the liquid 16 supplied to the gaps 8a and 8b. The differential pressure control device 26 takes in pressure measurement values from the liquid pressure gauge 19 and the polishing liquid pressure gauge 14 and issues commands to both the liquid pump control apparatus 28 and the polishing liquid pump control apparatus 27 so that the pressure difference becomes 1100 Pa sequentially. Control. Next, the polishing tool 1 was rotated at 3000 rpm by the rotary motor 7. The load applied to the pressure contact portion 23 was adjusted to 5N by adjusting the weight 32 including the polishing tool 1, the M housing 5, the coupling 6, the rotary motor 7, and the like.

そして、Xステージ29及びYステージ30により被加工物22を移動させ研磨加工を7時間施した。   Then, the workpiece 22 was moved by the X stage 29 and the Y stage 30 and polished for 7 hours.

研磨液導入穴3を経た研磨液11は、液圧力の高い隙間8a、8bへは入り込まず、直接に繋ぎ穴21を通じ研磨工具1の中空部1aに流入して、圧接部位23より吐出された。シール部材であるOリング20及びOリング9に接するのは純水のみであり、Oリング内周と研磨工具1の回転軸との摺動面には微粒子は存在せず、摺動面に微粒子が入り込み磨耗して破壊することは無かった。   The polishing liquid 11 that has passed through the polishing liquid introduction hole 3 does not enter the gaps 8a and 8b with high liquid pressure, but directly flows into the hollow portion 1a of the polishing tool 1 through the connecting hole 21 and is discharged from the pressure contact portion 23. . Only pure water is in contact with the O-ring 20 and the O-ring 9 that are sealing members, and there are no fine particles on the sliding surface between the inner periphery of the O-ring and the rotating shaft of the polishing tool 1, and there are fine particles on the sliding surface. It was not worn and destroyed.

つまり、微粒子を含む研磨液11は、隙間8a、8bのシール面に接することが無くなって、シールの破壊による研磨液11の漏れを生じることが無くなり、シール部材の交換が不要となり生産性が向上した。   That is, the polishing liquid 11 containing fine particles does not come into contact with the sealing surfaces of the gaps 8a and 8b, so that the polishing liquid 11 does not leak due to the breakage of the seal, and the replacement of the seal member is unnecessary, thereby improving the productivity. did.

本実施例では、回転精度をより向上させるため、ベアリング2bから研磨工具1の先端までの距離を数十ミリメートルとした。このため、吐出された研磨液11が上方に多く飛散したが、装置内部のベアリング2a、2bへの研磨液の侵入が無く、研磨工具1の回転精度が維持された。   In this embodiment, the distance from the bearing 2b to the tip of the polishing tool 1 is set to several tens of millimeters in order to further improve the rotation accuracy. For this reason, a large amount of the discharged polishing liquid 11 was scattered upward, but the polishing liquid did not enter the bearings 2a and 2b inside the apparatus, and the rotational accuracy of the polishing tool 1 was maintained.

また、漏れによる圧力変化が無くなり、圧接部位23における研磨液11の圧力は研磨液圧力計14の値と同等となり正確に制御された。   Further, the pressure change due to leakage disappeared, and the pressure of the polishing liquid 11 at the pressure contact portion 23 was equal to the value of the polishing liquid pressure gauge 14 and was accurately controlled.

このとき、隙間8aの方が繋ぎ穴21の液圧力より高いため、液体16は隙間8aより繋ぎ穴21へ逐次流入し研磨液11と混合する。流入量は毎時30cc〜65ccであり、研磨液タンク13からの研磨液11の溶媒の蒸発量と一致させており、逐次一定の研磨液濃度に制御することができた。   At this time, since the gap 8 a is higher than the liquid pressure in the connecting hole 21, the liquid 16 sequentially flows into the connecting hole 21 through the gap 8 a and mixes with the polishing liquid 11. The amount of inflow was 30 cc to 65 cc per hour, which coincided with the evaporation amount of the solvent of the polishing liquid 11 from the polishing liquid tank 13 and could be controlled to a constant polishing liquid concentration successively.

7時間の加工において、常時1.3ナノメートルの除去量精度が得られ、被加工物22の加工後の研磨面の表面粗さは2.8ナノメートルRMSとなり、露光装置に用いるレンズ・ミラーレベルの高精度加工を行うことができた。   In 7 hours of processing, a removal accuracy of 1.3 nanometers is always obtained, and the surface roughness of the polished surface of the workpiece 22 after processing is 2.8 nanometers RMS, which is used in an exposure apparatus. We were able to perform high-precision machining at the level.

1 研磨工具
2a、2b ベアリング
3 研磨液導入穴
4a、4b、4c 液体導入穴
5 Mハウジング
6 カップリング
7 回転モーター
8a、8b 隙間
9、20 Oリング
10 Sハウジング
11 研磨液
12 研磨液ポンプ
13 研磨液タンク
14 研磨液圧力計
16 液体
17 液体ポンプ
18 液体タンク
19 液体圧力計
21 繋ぎ穴
22 被加工物
23 圧接部位
24 容器
25 研磨液ドレンタンク
26 差圧制御装置
27 研磨液ポンプ制御装置
28 液体ポンプ制御装置
29 Xステージ
30 Yステージ
31 Zスライド
32 錘
DESCRIPTION OF SYMBOLS 1 Polishing tool 2a, 2b Bearing 3 Polishing liquid introduction hole 4a, 4b, 4c Liquid introduction hole 5 M housing 6 Coupling 7 Rotating motor 8a, 8b Gap 9, 20 O-ring 10 S housing 11 Polishing liquid 12 Polishing liquid pump 13 Polishing Liquid tank 14 Polishing liquid pressure gauge 16 Liquid 17 Liquid pump 18 Liquid tank 19 Liquid pressure gauge 21 Connecting hole 22 Workpiece 23 Pressure contact part 24 Container 25 Polishing liquid drain tank 26 Differential pressure control device 27 Polishing liquid pump control device 28 Liquid pump Control device 29 X stage 30 Y stage 31 Z slide 32 Weight

Claims (2)

被加工物に圧接して回転させる研磨工具と、
前記研磨工具と一体である回転軸と、
前記回転軸の中空部を通って、微粒子を含む研磨液を前記研磨工具と前記被加工物の間の圧接部位に供給する研磨液供給手段と、
前記回転軸を回転支持する軸受と、
前記軸受と前記回転軸との隙間に、前記研磨液の溶媒と同じ液体を供給するための液体供給手段と、
前記隙間と前記回転軸の中空部とを連通させる連通部と、を有し、
前記研磨液供給手段は、前記連通部を経て前記研磨液を前記回転軸の中空部へ導入することを特徴とする研磨装置。
A polishing tool that rotates in pressure contact with the workpiece;
A rotating shaft integral with the polishing tool;
A polishing liquid supply means for supplying a polishing liquid containing fine particles to the press contact portion between the polishing tool and the workpiece through the hollow portion of the rotating shaft;
A bearing that rotatably supports the rotating shaft;
Liquid supply means for supplying the same liquid as the solvent of the polishing liquid into the gap between the bearing and the rotary shaft;
A communication portion for communicating the gap and the hollow portion of the rotary shaft;
The polishing apparatus, wherein the polishing liquid supply means introduces the polishing liquid into the hollow portion of the rotating shaft through the communication portion.
前記液体供給手段による前記液体の供給圧力は、前記研磨液供給手段による前記研磨液の供給圧力より高いことを特徴とする請求項1に記載の研磨装置。   The polishing apparatus according to claim 1, wherein a supply pressure of the liquid by the liquid supply unit is higher than a supply pressure of the polishing liquid by the polishing liquid supply unit.
JP2009081551A 2009-03-30 2009-03-30 Polishing equipment Expired - Fee Related JP5495599B2 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111331516A (en) * 2020-04-03 2020-06-26 倪四梅 Machine part equipment of polishing
CN114750078A (en) * 2022-06-13 2022-07-15 中国航发上海商用航空发动机制造有限责任公司 Nozzle, spray stop valve and finishing device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02124269A (en) * 1988-10-27 1990-05-11 Olympus Optical Co Ltd Feeding unit for grinding liquid
JPH11170161A (en) * 1997-12-09 1999-06-29 Yuzo Mori Polishing device
JP2000263429A (en) * 1999-03-16 2000-09-26 Toyoda Mach Works Ltd Sheet type double-side lapping machine
JP2002096257A (en) * 2000-09-14 2002-04-02 Toyoda Mach Works Ltd Slurry supply apparatus of lapping machine

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02124269A (en) * 1988-10-27 1990-05-11 Olympus Optical Co Ltd Feeding unit for grinding liquid
JPH11170161A (en) * 1997-12-09 1999-06-29 Yuzo Mori Polishing device
JP2000263429A (en) * 1999-03-16 2000-09-26 Toyoda Mach Works Ltd Sheet type double-side lapping machine
JP2002096257A (en) * 2000-09-14 2002-04-02 Toyoda Mach Works Ltd Slurry supply apparatus of lapping machine

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111331516A (en) * 2020-04-03 2020-06-26 倪四梅 Machine part equipment of polishing
CN111331516B (en) * 2020-04-03 2022-10-11 青岛瑞邦金属制品有限公司 Machine part equipment of polishing
CN114750078A (en) * 2022-06-13 2022-07-15 中国航发上海商用航空发动机制造有限责任公司 Nozzle, spray stop valve and finishing device
CN114750078B (en) * 2022-06-13 2022-10-21 中国航发上海商用航空发动机制造有限责任公司 Nozzle, spray stop valve and finishing device

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