JP2010203999A5 - - Google Patents

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Publication number
JP2010203999A5
JP2010203999A5 JP2009051773A JP2009051773A JP2010203999A5 JP 2010203999 A5 JP2010203999 A5 JP 2010203999A5 JP 2009051773 A JP2009051773 A JP 2009051773A JP 2009051773 A JP2009051773 A JP 2009051773A JP 2010203999 A5 JP2010203999 A5 JP 2010203999A5
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Japan
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sample
image
image acquisition
surface observation
moving
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JP2009051773A
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English (en)
Japanese (ja)
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JP5481883B2 (ja
JP2010203999A (ja
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Priority to JP2009051773A priority Critical patent/JP5481883B2/ja
Priority claimed from JP2009051773A external-priority patent/JP5481883B2/ja
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Publication of JP2010203999A5 publication Critical patent/JP2010203999A5/ja
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JP2009051773A 2009-03-05 2009-03-05 特定部位検出方法を用いた試料分析装置 Active JP5481883B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009051773A JP5481883B2 (ja) 2009-03-05 2009-03-05 特定部位検出方法を用いた試料分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009051773A JP5481883B2 (ja) 2009-03-05 2009-03-05 特定部位検出方法を用いた試料分析装置

Publications (3)

Publication Number Publication Date
JP2010203999A JP2010203999A (ja) 2010-09-16
JP2010203999A5 true JP2010203999A5 (https=) 2012-03-22
JP5481883B2 JP5481883B2 (ja) 2014-04-23

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ID=42965617

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JP2009051773A Active JP5481883B2 (ja) 2009-03-05 2009-03-05 特定部位検出方法を用いた試料分析装置

Country Status (1)

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JP (1) JP5481883B2 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101903631B1 (ko) * 2016-12-09 2018-10-04 한국과학기술연구원 3차원 화학성분 이미지 측정 시스템 및 측정 방법
CN107167089A (zh) * 2017-06-21 2017-09-15 苏州卡睿知光电科技有限公司 高温环境下物体变形的测量方法、装置及系统
JP6627903B2 (ja) * 2018-03-20 2020-01-08 株式会社島津製作所 データ補正方法、データ補正方法をコンピュータに実行させるプログラム、画像処理装置、走査型プローブ顕微鏡
WO2024014185A1 (ja) * 2022-07-11 2024-01-18 株式会社島津製作所 画像処理方法、画像処理装置、走査型プローブ顕微鏡、およびプログラム
WO2025022875A1 (ja) * 2023-07-25 2025-01-30 株式会社島津製作所 画像処理方法、プログラム、画像処理装置、および走査型プローブ顕微鏡

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09190534A (ja) * 1996-01-11 1997-07-22 Canon Inc 画像処理装置
JP3551667B2 (ja) * 1996-12-04 2004-08-11 株式会社日立製作所 はんだバンプの高さ測定方法
JP2005071344A (ja) * 2003-08-07 2005-03-17 Matsushita Electric Ind Co Ltd 画像処理方法、画像処理装置及び画像処理プログラムを記録した記録媒体
JP4348712B2 (ja) * 2005-08-05 2009-10-21 株式会社クマタカ エンジニアリング 路面性状測定装置
JP5206499B2 (ja) * 2009-03-02 2013-06-12 富士通株式会社 測定方法、測定装置、測定制御プログラム

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