JP2010203823A - Temperature control device - Google Patents

Temperature control device Download PDF

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JP2010203823A
JP2010203823A JP2009047640A JP2009047640A JP2010203823A JP 2010203823 A JP2010203823 A JP 2010203823A JP 2009047640 A JP2009047640 A JP 2009047640A JP 2009047640 A JP2009047640 A JP 2009047640A JP 2010203823 A JP2010203823 A JP 2010203823A
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temperature control
microchip
control unit
temperature
elastomer
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Tomonori Nozawa
知則 野澤
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Shimadzu Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a temperature control device for uniformly bringing a temperature conditioning element into close contact with the flat surface of a microchip even when the microchip is deformed by heating. <P>SOLUTION: The temperature control device includes the temperature conditioning element. The temperature conditioning element includes a heat conductive temperature control unit having a heat transfer surface and a Peltier element coming into contact with the flat surface on the side opposite to the heat transfer surface of the temperature control unit to heat or cool the temperature control unit. The heat transfer surface of the temperature control unit is covered with a heat conductive elastomer following the surface shape of the part to be controlled in temperature of the microchip by the elasticity of the heat conductive elastomer. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、生物や化学の分野において各種反応を行なわせるためのマイクロチップの温度調節を行なうための温度制御装置に関するものである。   The present invention relates to a temperature control device for adjusting the temperature of a microchip for performing various reactions in the fields of biology and chemistry.

内部に反応ウェルを有するマイクロチップを用いてPCR法、LAMP法、SMAP法といった核酸増幅反応などを行なう装置には、ペルチェ素子などによって構成される温調素子をマイクロチップの平面に押し当てて反応ウェルの温度を反応に適した温度に調節する温度制御装置が設けられている。この温度制御装置は、ペルチェ素子を例えばアルミ板など熱伝導性部材を介してマイクロチップの平面に接触させるようになっている。   For devices that perform nucleic acid amplification reactions such as PCR, LAMP, and SMAP using a microchip that has a reaction well inside, the reaction is carried out by pressing a temperature-regulating element such as a Peltier element against the surface of the microchip. A temperature control device for adjusting the temperature of the well to a temperature suitable for the reaction is provided. In this temperature control device, the Peltier element is brought into contact with the plane of the microchip via a heat conductive member such as an aluminum plate.

特開2006−224060号公報JP 2006-224060 A

マイクロチップは厚みが薄く、ペルチェ素子で加熱し続けると湾曲することがある。マイクロチップが湾曲すると、マイクロチップの被温度調節面が反り返ってしまうために温調素子の密着が不均一になり、正確なマイクロチップの温度制御ができなくなる。しかし、温調素子を反ったマイクロチップに密着させるように過度にマイクロチップに押し付けると、ペルチェ素子にクラックが入るなど温調素子が破損する虞があるため、一定以上の圧力をかけることはできない。   The microchip is thin and may bend if it is continuously heated by a Peltier element. When the microchip is curved, the temperature adjustment surface of the microchip is warped, so that the temperature control element is not evenly adhered, and accurate temperature control of the microchip cannot be performed. However, if the temperature control element is excessively pressed against the warped microchip, the temperature control element may be damaged, such as a crack in the Peltier element. .

温度制御装置の一部にエラストマー(弾性体)を用いることによって温調素子と被温度制御部との間の接触状態を改善しようとする試みはすでに提案されている(特許文献1参照。)。特許文献1に開示されている温度制御装置は、マイクロチップの複数箇所の局所的な温度制御を行なうために、マイクロチップ平面の複数の箇所に個別に接触する複数の温調素子(該文献における温度制御装置に相当)を備えたものである。各温調素子はそれぞれペルチェ素子及び銅やアルミニウムなどの熱伝導体からなる温度制御部を備えている。温度制御部はマイクロチップに直接接触してペルチェ素子からの熱をマイクロチップに伝えるものである。各ペルチェ素子は共通の放熱フィン(ヒートシンク)に取り付けられている。エラストマーはペルチェ素子と温度制御部の間、又は温度制御部と放熱フィンの間に挟み込まれていることにより、マイクロチップが湾曲するなどの変形が生じてもエラストマーが弾性変形することによってその変形を吸収でき、各温度制御部をマイクロチップに密着させることができるとされている。   There has already been proposed an attempt to improve the contact state between the temperature control element and the temperature controlled part by using an elastomer (elastic body) as a part of the temperature control device (see Patent Document 1). In order to perform local temperature control at a plurality of locations on a microchip, a temperature control device disclosed in Patent Document 1 is provided with a plurality of temperature control elements (in this document) that individually contact a plurality of locations on a microchip plane. Equivalent to a temperature control device). Each temperature control element includes a Peltier element and a temperature control unit made of a heat conductor such as copper or aluminum. The temperature controller directly contacts the microchip and transfers heat from the Peltier element to the microchip. Each Peltier element is attached to a common radiating fin (heat sink). Since the elastomer is sandwiched between the Peltier element and the temperature control unit, or between the temperature control unit and the heat radiating fin, even if the microchip is bent, the elastomer is elastically deformed. It is said that each temperature control unit can be closely attached to the microchip.

しかし、マイクロチップの湾曲などの変形によってマイクロチップの温調素子が接触する部分の形状も変形してしまうため、温調素子のマイクロチップに直接的に接触する部分が銅やアルミニウムなどの熱伝導体で構成されているとその変形に追従できず、均一な密着性を維持することができない。温調素子を接触させるマイクロチップの接触部分の形状が変形した場合には、ペルチェ素子と温度制御部の間又は温度制御部と放熱フィンの間に挟み込まれたエラストマーではその変形を吸収することはできない。したがって、特許文献1に開示された温度制御装置ではマイクロチップが変形しても温調素子とマイクロチップとの間の均一な密着性を維持するという効果を期待することはできない。   However, deformation of the microchip, such as the curvature of the microchip, also deforms the shape of the portion of the microchip that contacts the temperature control element. Therefore, the portion of the temperature control element that directly contacts the microchip is thermally conductive such as copper or aluminum. If it is composed of a body, it cannot follow the deformation, and uniform adhesion cannot be maintained. When the shape of the contact portion of the microchip that contacts the temperature control element is deformed, the elastomer sandwiched between the Peltier element and the temperature control unit or between the temperature control unit and the heat radiation fin can absorb the deformation. Can not. Therefore, the temperature control device disclosed in Patent Document 1 cannot be expected to maintain the uniform adhesion between the temperature control element and the microchip even if the microchip is deformed.

本発明は、上記の問題に鑑み、マイクロチップが加熱によって変形したときも温調素子を均一にマイクロチップの平面に密着させることができる温度制御装置を提供することを目的とするものである。   In view of the above problems, an object of the present invention is to provide a temperature control device that can uniformly attach a temperature control element to a plane of a microchip even when the microchip is deformed by heating.

本発明にかかる温度制御装置は、伝熱面を有する熱伝導性の温度制御部、及び温度制御部の伝熱面とは反対側の平面に接して温度制御部を加熱又は冷却するペルチェ素子を備えた温調素子と、温度制御部の伝熱面上に設けられ、弾性をもってマイクロチップの被温度制御部の表面形状に追従する熱伝導性のエラストマーと、マイクロチップの被温度制御部とエラストマーとの密着を維持するように温調素子をマイクロチップ側へ付勢する付勢機構と、を備えたものである。   A temperature control device according to the present invention includes a heat conductive temperature control unit having a heat transfer surface, and a Peltier element that heats or cools the temperature control unit in contact with a plane opposite to the heat transfer surface of the temperature control unit. The temperature control element provided, a heat conductive elastomer that is provided on the heat transfer surface of the temperature control unit and elastically follows the surface shape of the temperature control unit of the microchip, and the temperature control unit and elastomer of the microchip And a biasing mechanism that biases the temperature control element toward the microchip so as to maintain close contact with the microchip.

マイクロチップが表側と裏側の両側に被温度制御部をもつものである場合には、該温度制御装置は温調素子、エラストマー及び付勢機構の組を2組備え、マイクロチップの両側からエラストマーを介して温調素子を密着させるようにすることで対応することができる。   In the case where the microchip has a temperature controlled part on both the front side and the back side, the temperature control device includes two sets of a temperature control element, an elastomer, and an urging mechanism, and the elastomer is applied from both sides of the microchip. This can be dealt with by closely contacting the temperature control element.

本発明では、マイクロチップの被温度制御部に接触させる温度制御部の伝熱面が、弾性をもってマイクロチップの被温度制御部の表面形状に追従する熱伝導性のエラストマーで覆われており、付勢機構によって被温度制御部とエラストマーとの密着を維持するように温調素子がマイクロチップ側へ付勢されているので、マイクロチップの湾曲などによって被温度制御部の表面形状が変化しても温調素子と被温度制御部との密着性を維持することができる。   In the present invention, the heat transfer surface of the temperature control unit that is brought into contact with the temperature control unit of the microchip is covered with a heat conductive elastomer that elastically follows the surface shape of the temperature control unit of the microchip. Since the temperature control element is urged toward the microchip so as to maintain the adhesion between the temperature controlled part and the elastomer by the biasing mechanism, even if the surface shape of the temperature controlled part changes due to the curvature of the microchip, etc. Adhesion between the temperature control element and the temperature control unit can be maintained.

温度制御装置の一実施例を示す概略構成断面図である。It is a schematic structure sectional view showing one example of a temperature control device. 同実施例の温度制御装置によるマイクロチップの温度制御時の様子を示す断面図である。It is sectional drawing which shows the mode at the time of the temperature control of the microchip by the temperature control apparatus of the Example.

温度制御装置の一実施例について図1を参照しながら説明する。図1は温度制御装置の一実施例を示す概略構成断面図である。
マイクロチップ2の周縁部が保持部4に保持されている。マイクロチップ2の上下に、マイクロチップ2の被温度制御部の上面に接して温度制御を行なう上面側温調素子6aと、被温度制御部の下面に接して温度制御を行なう下面側温調素子6bが配置されている。
An embodiment of the temperature control device will be described with reference to FIG. FIG. 1 is a schematic sectional view showing an embodiment of a temperature control device.
The peripheral edge of the microchip 2 is held by the holding part 4. The upper surface side temperature control element 6a that controls temperature by contacting the upper surface of the temperature controlled portion of the microchip 2 above and below the microchip 2, and the lower surface temperature control element that controls temperature by contacting the lower surface of the temperature controlled portion 6b is arranged.

温調素子6aはペルチェ素子8aを備え、ペルチェ素子のマイクロチップ2側の面に例えばアルミニウム板や銅板などからなる温度制御部10aが取り付けられている。温度制御部10aのマイクロチップ2側の面(伝熱面)はエラストマー12aにより覆われている。   The temperature control element 6a includes a Peltier element 8a, and a temperature control unit 10a made of, for example, an aluminum plate or a copper plate is attached to the surface of the Peltier element on the microchip 2 side. The surface (heat transfer surface) on the microchip 2 side of the temperature control unit 10a is covered with an elastomer 12a.

ペルチェ素子8aの温度制御部10aとは反対側の面に放熱フィン14aが取り付けられている。放熱フィン14aには例えばコイルバネ、板バネなど上下方向に弾性変形する弾性体からなる付勢機構15aを介して駆動軸16aの一端が接続されている。駆動軸16aの他端は駆動部20aに接続されている。駆動部20aはモータを駆動することによって駆動軸16aを上下動させる機構を有するものである。
下側温調素子6bの構造は上側温調素子6aと同じである。
Radiation fins 14a are attached to the surface of the Peltier element 8a opposite to the temperature controller 10a. One end of a drive shaft 16a is connected to the radiating fin 14a via an urging mechanism 15a made of an elastic body that elastically deforms in the vertical direction, such as a coil spring or a leaf spring. The other end of the drive shaft 16a is connected to the drive unit 20a. The drive unit 20a has a mechanism for moving the drive shaft 16a up and down by driving a motor.
The structure of the lower temperature control element 6b is the same as that of the upper temperature control element 6a.

温度制御部10a,10bのマイクロチップ2側の面を覆うエラストマー12a,12bは厚み方向に弾性をもつ熱伝導性部材である。その例として、シリコン系、アクリル系、スチレン系、オレフィン系、塩化ビニル系、ポリエステル系、ポリウレタン系、ポリアミド系などのエラストマーが挙げられる。エラストマー12a,12bの厚みは0.1mm〜3.0mmが適当である。   The elastomers 12a and 12b covering the surface of the temperature control units 10a and 10b on the microchip 2 side are heat conductive members having elasticity in the thickness direction. Examples thereof include silicon-based, acrylic-based, styrene-based, olefin-based, vinyl chloride-based, polyester-based, polyurethane-based, and polyamide-based elastomers. The thickness of the elastomers 12a and 12b is suitably 0.1 mm to 3.0 mm.

温調素子6a,6bのペルチェ素子8a,8b、駆動部20a,20bは制御部22により制御されている。制御部20は、マイクロチップ2の温度制御を行なう際に、駆動部20aによって上側温調素子6aを下降させてエラストマー12aをマイクロチップ2の上面に密着させ、駆動部20bによって下側温調素子6bを上昇させてエラストマー12bをマイクロチップ2の下面に密着させる。   The Peltier elements 8a and 8b and the drive units 20a and 20b of the temperature control elements 6a and 6b are controlled by the control unit 22. When controlling the temperature of the microchip 2, the control unit 20 lowers the upper temperature control element 6a by the drive unit 20a to bring the elastomer 12a into close contact with the upper surface of the microchip 2, and the lower temperature control element by the drive unit 20b. 6b is raised to bring the elastomer 12b into close contact with the lower surface of the microchip 2.

温調素子6aと駆動軸16aとの間、温調素子6bと駆動軸16bとの間にはそれぞれ弾性体からなる付勢機構15a,15bが介在し、マイクロチップ2の温度制御時に付勢機構15a,15bがそれぞれ温調素子6a,6bをマイクロチップ2側へ付勢している。そのため、図2に示されているように、加熱によってマイクロチップ2の湾曲した場合も厚み方向に弾性をもつエラストマー12a,12bがマイクロチップ2の表面形状に追従して密着性をマイクロチップ2の湾曲前と同じ状態で維持することができる。   Biasing mechanisms 15a and 15b made of an elastic body are interposed between the temperature control element 6a and the drive shaft 16a and between the temperature control element 6b and the drive shaft 16b, respectively. 15a and 15b urge the temperature control elements 6a and 6b to the microchip 2 side, respectively. Therefore, as shown in FIG. 2, even when the microchip 2 is bent by heating, the elastomers 12 a and 12 b having elasticity in the thickness direction follow the surface shape of the microchip 2 to improve the adhesion of the microchip 2. It can be maintained in the same state as before bending.

制御部22には操作者が分析条件などを入力して該温度制御装置を操作するための操作部24や操作者が設定条件を表示させて確認するためのモニタ26が接続されている。   Connected to the control unit 22 are an operation unit 24 for an operator to input analysis conditions and the like to operate the temperature control device, and a monitor 26 for the operator to display and confirm the set conditions.

なお、この実施例では、マイクロチップ2の上面と下面から温度制御を行なうように2つの温調素子6a,6bを備えているが、本発明はこれに限定されるものではなく、温調素子6a及び6bのいずれか一方のみを備えているものであってもよい。   In this embodiment, the two temperature control elements 6a and 6b are provided so as to control the temperature from the upper surface and the lower surface of the microchip 2, but the present invention is not limited to this and the temperature control element is not limited thereto. Only one of 6a and 6b may be provided.

2 マイクロチップ
4 保持部
6a 上側温調素子
6b 下側温調素子
8a,8b ペルチェ素子
10a,10b 温度制御部
12a,12b エラストマー
14a,14b 放熱フィン
15a,15b 付勢機構
16a,16b 駆動軸
20a,20b 駆動部
22 制御部
24 操作部
26 モニタ
2 Microchip 4 Holding part 6a Upper temperature adjustment element 6b Lower temperature adjustment element 8a, 8b Peltier element 10a, 10b Temperature control part 12a, 12b Elastomer 14a, 14b Radiation fin 15a, 15b Energizing mechanism 16a, 16b Drive shaft 20a, 20b Drive unit 22 Control unit 24 Operation unit 26 Monitor

Claims (2)

伝熱面を有する熱伝導性の温度制御部、及び前記温度制御部の前記伝熱面とは反対側の平面に接して前記温度制御部を加熱又は冷却するペルチェ素子を備えた温調素子と、
前記温度制御部の前記伝熱面上に設けられ、弾性をもってマイクロチップの前記被温度制御部の表面形状に追従する熱伝導性のエラストマーと、
マイクロチップの前記被温度制御部と前記エラストマーとの密着を維持するように前記温調素子をマイクロチップ側へ付勢する付勢機構と、を備えた温度制御装置。
A temperature control element including a heat conductive temperature control unit having a heat transfer surface, and a Peltier element that is in contact with a plane opposite to the heat transfer surface of the temperature control unit to heat or cool the temperature control unit; ,
A thermally conductive elastomer that is provided on the heat transfer surface of the temperature control unit and elastically follows the surface shape of the temperature control unit of the microchip; and
A temperature control device comprising: an urging mechanism that urges the temperature control element toward the microchip so as to maintain close contact between the temperature controlled portion of the microchip and the elastomer.
前記マイクロチップは表側と裏側の両側に被温度制御部をもつものであり、
該温度制御装置は前記温調素子、エラストマー及び付勢機構の組を2組備え、前記マイクロチップの両側から前記エラストマーを介して温調素子を密着させるものである請求項1に記載の温度制御装置。
The microchip has a temperature controlled part on both the front side and the back side,
2. The temperature control according to claim 1, wherein the temperature control device includes two sets of the temperature control element, the elastomer, and the urging mechanism, and the temperature control element is closely attached to the microchip via the elastomer from both sides of the microchip. apparatus.
JP2009047640A 2009-03-02 2009-03-02 Temperature control device Pending JP2010203823A (en)

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JP2016061691A (en) * 2014-09-18 2016-04-25 株式会社島津製作所 Mounting/heating mechanism of sample recovery container
AT518304A1 (en) * 2016-02-09 2017-09-15 Grabner Instr Messtechnik Gmbh Device for tempering a test sample
US10722893B2 (en) 2017-01-13 2020-07-28 Shimadzu Corporation Mounting and heating mechanism of sample collection containers

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JP2005040784A (en) * 2003-07-10 2005-02-17 Citizen Watch Co Ltd Device for regulating temperature of microchemical chip
JP2006224060A (en) * 2005-02-21 2006-08-31 Yamaha Corp Temperature control apparatus for microchip
JP2006234467A (en) * 2005-02-23 2006-09-07 Yamaha Corp Temperature control device for microchip
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013226497A (en) * 2012-04-25 2013-11-07 Panasonic Corp Micro fluid device
JP2015216850A (en) * 2014-05-14 2015-12-07 凸版印刷株式会社 Temperature control device and method
JP2016061691A (en) * 2014-09-18 2016-04-25 株式会社島津製作所 Mounting/heating mechanism of sample recovery container
AT518304A1 (en) * 2016-02-09 2017-09-15 Grabner Instr Messtechnik Gmbh Device for tempering a test sample
US11740195B2 (en) 2016-02-09 2023-08-29 Grabner Instruments Messtechnik Gmbh Device for controlling the temperature of a test sample
US10722893B2 (en) 2017-01-13 2020-07-28 Shimadzu Corporation Mounting and heating mechanism of sample collection containers

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