JP2010197628A5 - - Google Patents
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- JP2010197628A5 JP2010197628A5 JP2009041585A JP2009041585A JP2010197628A5 JP 2010197628 A5 JP2010197628 A5 JP 2010197628A5 JP 2009041585 A JP2009041585 A JP 2009041585A JP 2009041585 A JP2009041585 A JP 2009041585A JP 2010197628 A5 JP2010197628 A5 JP 2010197628A5
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- light
- imaging
- optical system
- exposure apparatus
- deflecting
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Claims (40)
パターンを有するマスクを保持し、前記第1ステージ機構の前記第1方向への移動に同期して、該第1方向と交差する第2方向へ移動する第2ステージ機構と、
前記パターンからの光を受光し、前記マスク上の前記第2方向と前記基板上の前記第1方向とが光学的に対応するように前記パターンの投影像を前記基板上に形成する投影光学系と、を備えることを特徴とする露光装置。 A first stage mechanism that holds a photosensitive substrate and moves in a first direction;
A second stage mechanism that holds a mask having a pattern and moves in a second direction crossing the first direction in synchronization with the movement of the first stage mechanism in the first direction;
A projection optical system that receives light from the pattern and forms a projected image of the pattern on the substrate so that the second direction on the mask and the first direction on the substrate optically correspond to each other An exposure apparatus comprising:
前記反射部は、前記偏光ビームスプリッターを透過して生成された前記第1の光を前記偏光ビームスプリッターに向けて反射する第1反射部材と、前記偏光ビームスプリッターを反射して生成された前記第2の光を前記偏光ビームスプリッターに向けて反射する第2反射部材と、を有することを特徴とする請求項14に記載の露光装置。 The dividing unit has a polarization beam splitter,
The reflection unit reflects the first light generated through the polarization beam splitter toward the polarization beam splitter and the first member generated by reflecting the polarization beam splitter. The exposure apparatus according to claim 14, further comprising: a second reflecting member that reflects the second light toward the polarizing beam splitter.
パターンを有するマスクを保持し、前記基板の前記第1方向への移動に同期して、該第1方向と交差する第2方向へ移動させる工程と、
前記パターンからの光を受光し、前記マスク上の前記第2方向と前記基板上の前記第1方向とが光学的に対応するように前記パターンの投影像を前記基板上に形成する工程と、を含むことを特徴とする露光方法。 Holding and moving the photosensitive substrate in the first direction;
Holding a mask having a pattern and moving the substrate in a second direction crossing the first direction in synchronization with the movement of the substrate in the first direction;
Receiving light from the pattern, and forming a projected image of the pattern on the substrate such that the second direction on the mask and the first direction on the substrate optically correspond to each other; An exposure method comprising:
前記パターンが転写された前記基板を現像し、前記パターンに対応する形状の転写パターン層を形成する工程と、
前記転写パターン層を介して前記基板を加工する工程と、
を含むことを特徴とするデバイス製造方法。 A step of transferring the pattern to the substrate using the exposure apparatus according to any one of claims 1 to 24;
Developing the substrate to which the pattern has been transferred, and forming a transfer pattern layer having a shape corresponding to the pattern;
Processing the substrate via the transfer pattern layer;
A device manufacturing method comprising:
前記マスク上の照明領域を光源からの光で照明する照明系と、An illumination system for illuminating an illumination area on the mask with light from a light source;
前記マスク上の照明領域内から発生する結像光束を入射すると共に、該結像光束によって前記光源の像が作られる瞳面を形成する第1レンズ群と、A first lens unit that forms a pupil plane on which an imaged light beam generated from within an illumination region on the mask is incident and that forms an image of the light source by the imaged light beam;
該瞳面において、前記結像光束を互いに異なる角度で反射する第1結像光束と第2結像光束とに分割して前記第1レンズ群に戻す反射型光分割部材と、A reflective light splitting member that splits the imaging light beam into a first imaging light beam and a second imaging light beam that reflect the imaging light beam at mutually different angles and returns them to the first lens group on the pupil plane;
前記第1レンズ群と前記マスクとの間で、前記第1結像光束と第2結像光束を、前記マスクの照明領域から発生する結像光束の進行方向と交差する方向に偏向させると共に、前記感光性基板上の異なる領域に向かうように偏向させる光偏向部材と、Deflecting the first imaging light beam and the second imaging light beam between the first lens group and the mask in a direction crossing a traveling direction of the imaging light beam generated from the illumination area of the mask; A light deflecting member for deflecting toward different areas on the photosensitive substrate;
該光偏向部材からの前記第1結像光束を入射して、前記マスクパターンの像を前記感光性基板上の第1領域に投影する第1の投影光学系と、A first projection optical system that enters the first imaging light beam from the light deflecting member and projects an image of the mask pattern onto a first region on the photosensitive substrate;
前記光偏向部材からの前記第2結像光束を入射して、前記マスクパターンの像を前記感光性基板上の前記第1領域とは異なる第2領域に投影する第2の投影光学系、とを備えた露光装置。A second projection optical system that enters the second imaging light beam from the light deflection member and projects an image of the mask pattern onto a second region different from the first region on the photosensitive substrate; An exposure apparatus comprising:
前記反射部は、前記偏光ビームスプリッターを透過して生成された前記第1結像光束を前記偏光ビームスプリッターに向けて反射する第1反射部材と、前記偏光ビームスプリッターを反射して生成された前記第2結像光束を前記偏光ビームスプリッターに向けて反射する第2反射部材と、を有する請求項34に記載の露光装置。The reflection unit is configured to reflect the first imaging light beam generated by passing through the polarization beam splitter toward the polarization beam splitter, and the reflection member generated by reflecting the polarization beam splitter. The exposure apparatus according to claim 34, further comprising: a second reflecting member that reflects the second imaging light beam toward the polarizing beam splitter.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2009041585A JP5397748B2 (en) | 2009-02-25 | 2009-02-25 | Exposure apparatus, scanning exposure method, and device manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009041585A JP5397748B2 (en) | 2009-02-25 | 2009-02-25 | Exposure apparatus, scanning exposure method, and device manufacturing method |
Publications (3)
Publication Number | Publication Date |
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JP2010197628A JP2010197628A (en) | 2010-09-09 |
JP2010197628A5 true JP2010197628A5 (en) | 2012-08-30 |
JP5397748B2 JP5397748B2 (en) | 2014-01-22 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2009041585A Expired - Fee Related JP5397748B2 (en) | 2009-02-25 | 2009-02-25 | Exposure apparatus, scanning exposure method, and device manufacturing method |
Country Status (1)
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JP (1) | JP5397748B2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5515323B2 (en) * | 2009-02-25 | 2014-06-11 | 株式会社ニコン | Projection optical apparatus, exposure apparatus, and device manufacturing method |
JP5360379B2 (en) * | 2009-02-25 | 2013-12-04 | 株式会社ニコン | Projection optical system, exposure apparatus, and device manufacturing method |
US8264666B2 (en) * | 2009-03-13 | 2012-09-11 | Nikon Corporation | Exposure apparatus, exposure method, and method of manufacturing device |
JP5825470B2 (en) * | 2011-05-16 | 2015-12-02 | 株式会社ブイ・テクノロジー | Exposure apparatus and shading plate |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
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EP1668421A2 (en) * | 2003-09-12 | 2006-06-14 | Carl Zeiss SMT AG | Illumination system for a microlithography projection exposure installation |
JP4929762B2 (en) * | 2006-03-03 | 2012-05-09 | 株式会社ニコン | Exposure apparatus, exposure method, and device manufacturing method |
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2009
- 2009-02-25 JP JP2009041585A patent/JP5397748B2/en not_active Expired - Fee Related
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