JP2010182895A - Method and device for setting condition of measuring pattern - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and a device for setting a condition for measuring a pattern by which measurement with high reproducibility can be performed not depending on the formation state of the pattern inside and outside an FOV. <P>SOLUTION: In the method of setting the condition for measuring the pattern of a charged particle beam device and the device of setting the condition for measuring the pattern, a beam condition of an SEM is derived based on pattern information in and/or out of the field of view of the SEM obtained from design data of a sample on which a pattern is formed. Furthermore, as one of embodiments of the method and the device, a method and a device for setting a condition for measuring a pattern are provided to derive an optical condition in accordance with the pattern information of a region where the FOV is set. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a method and apparatus for setting measurement conditions when measuring a pattern formed on a sample by a charged particle beam apparatus, and in particular, based on a situation outside the field of view of a charged particle beam. The present invention relates to a pattern measurement condition setting method for performing condition setting and a pattern measurement condition setting apparatus.

  A sample surface analyzer that scans the surface with a charged particle beam probe and analyzes the quantity or energy of emitted secondary electrons, ions, electromagnetic waves, and other signals to analyze the surface properties. , There is an advantage that information on constituent elements and the like can be easily obtained. In particular, a scanning electron microscope (SEM) that uses electrons as probes and secondary electrons as emission signals and converts the amount of secondary electrons into luminance on the screen to obtain a surface shape image has been widely put into practical use. Yes.

  In addition, as a semiconductor element inspection apparatus, a dimension measuring apparatus derived from a scanning electron microscope, such as a dimension measuring SEM (Critical Dimension-SEM: CD-SEM) and an inspection SEM, which is a shape inspection apparatus, are widely used in the semiconductor manufacturing industry. It has been.

  Measurement using a CD-SEM or the like is controlled by a program in which the operating conditions of the SEM, usually called a recipe, are registered, and is performed according to predetermined beam conditions and procedures. Patent Document 1 describes a technique for automatically generating a recipe by setting measurement conditions and the like on design data of a semiconductor device. Patent Document 2 describes a technique for automatically changing the acceleration voltage of an electron beam according to the degree of charge-up of an electron beam irradiation site on a sample and setting it as an apparatus condition.

JP 2006-351746 A JP 2000-195459 A

  Usually, if the measurement object is the same, the measurement is performed under the same measurement conditions. In other words, measurement under the same beam condition is performed on a plurality of measurement locations on the sample. On the other hand, the inventors may change the state of sample charging depending on the state of the pattern formed in the field of view (FOV) of the SEM and the state of formation of the pattern outside the FOV. It was newly found that there is a need to set measurement conditions in consideration of the situation. Patent Documents 1 and 2 do not mention that the beam condition is set in consideration of the pattern formation state inside and outside the FOV.

  Hereinafter, a pattern measurement condition setting method and a pattern measurement condition setting apparatus for setting measurement conditions capable of performing measurement with high reproducibility regardless of the pattern formation state inside and outside the FOV will be described.

  In order to achieve the above object, the following is a pattern measurement condition setting method and pattern measurement condition setting apparatus for a charged particle beam device, in the field of view of an SEM obtained from design data of a sample on which a pattern is formed, and / or Alternatively, a method and apparatus for deriving an SEM beam condition based on out-of-view pattern information is proposed. In addition, as one specific aspect of the method and apparatus, a pattern measurement condition setting method and a pattern measurement condition setting apparatus for deriving an optical condition according to pattern information of a region where an FOV is set are proposed.

  If information on the pattern density in the FOV, information on the sample status outside the FOV, optical conditions to be set according to the status, etc. are registered as the information on the area where the FOV is set, it is based on the setting of the FOV position. Thus, appropriate optical conditions can be derived.

  According to the above configuration, it is possible to provide a pattern measurement condition setting method and a pattern measurement condition setting apparatus that can be set to perform measurement with high reproducibility regardless of the pattern formation status inside and outside the FOV.

The figure explaining the process process which creates the recipe which referred the database based on the set visual field information. 10A and 10B illustrate examples of measurement target patterns of a photomask. The figure explaining the principle that the charging condition on a sample changes with the pattern formation conditions outside a visual field. The graph which recorded the dispersion | variation in the dimension when an isolated space and an isolated line pattern were measured several times with the electron beam of high acceleration and low acceleration. The graph which recorded the dispersion | variation in the dimension when two patterns from which the formation condition of the pattern outside a visual field differs were measured several times with the electron beam of the high beam current amount or the low beam current amount. The figure explaining the outline | summary of a charged particle beam apparatus.

  In a measurement / inspection apparatus using a scanning electron microscope typified by a CD-SEM, automatic measurement is performed by a program called an SEM operating condition registered as a recipe. In general, if the patterns are on the same sample, the measurement is performed under the same optical conditions. However, the inventors have clarified the fact that an appropriate beam condition may change depending on the pattern formation state outside the FOV as well as within the scanning range of the electron beam (within the FOV).

  One of the factors that change the appropriate beam condition according to the pattern formation status outside the FOV is that electrons emitted from the sample when the sample is irradiated with the electron beam are applied to the sample. It is the presence of return electrons that attach back. The charge state changes due to the attachment of return electrons having a negative charge. Return electrons reach the outside of the FOV. However, if a part of the FOV is made of an insulator and the other part is made of a conductive member, the charged electrons are different from each other. There are places that have been accumulated and places that are not. Even within the field of view, the charge distribution varies depending on the pattern formation density and the like.

  Such non-uniform charging as described above may occur in a photomask used in an optical exposure apparatus or the like. The photomask has a structure in which a pattern of a conductive member such as chromium (Cr) or molybdenum silicide (MoSi) is formed on an insulating glass substrate. In a member having a structure in which such an insulating material and a conductive member are mixed, non-uniform charging may occur in or around the FOV depending on the pattern formation state.

  FIG. 2 is a diagram for explaining an example of a measurement target portion on the photomask. In the measurement by the CD-SEM, secondary electrons generated by scanning the electron beam 101 in the FOV 104 are detected, a line profile is formed based on the detected electrons, and an edge of the line profile is formed. Based on the detection, a pattern length measurement value is calculated.

  FIG. 2A illustrates an isolated space pattern having a width of about 0.2 microns, and the space pattern is formed by a glass portion 103 surrounded by a chrome pattern 102. In the case of such a measurement object, since the ratio of the conductive chromium pattern 102 is large in the FOV 104, high-precision measurement using an electron beam with a low acceleration voltage is possible.

  FIG. 4 is a graph recording variation in dimensions when an isolated space and an isolated line pattern are measured a plurality of times with high acceleration and low acceleration electron beams. As shown in FIG. 4B, when the FOV shown in FIG. 2A is scanned with an electron beam under a low acceleration condition and measured ten times, the dimensional variation is about 0.2 nm. It was.

  On the other hand, in the case of an isolated line pattern composed of a chromium pattern 102 of about 0.2 microns formed on the glass portion 103 as illustrated in FIG. 2B, the proportion of insulating glass in the FOV 104 When an electron beam with a low acceleration voltage is scanned, a beam drift occurs due to the effect of charge, and the result of 10 measurements results in a variation of 10 nm or more as shown in the graph of FIG.

  On the other hand, when scanning is performed with the electron beam set at high acceleration, as illustrated in FIG. 4A, in the scanning with respect to the isolated pattern in FIG. This is a significant improvement up to about 0.2 nm. On the other hand, when a highly accelerated electron beam is scanned in the FOV 104 as illustrated in FIG. 2A, the chromium pattern 102 occupying most of the FOV 104 is charged up, and the dispersion of 10 measurements becomes 30 nm or more. .

  As described above, an appropriate beam condition may change depending on the pattern density in the FOV or the like (for example, the ratio of members constituting the pattern in the FOV).

  Furthermore, the charging state changes not only in the FOV but also depending on the pattern formation state (for example, pattern formation density) outside the FOV. The phenomenon will be described below.

  As illustrated in FIG. 3, when the sample surface is irradiated with the electron beam 101, reflected electrons and secondary electrons 105 are generated. When the reflected electrons and the secondary electrons 105 are returned to the portion outside the SEM observation field of view, there may be relaxation of charging, adverse effects, and both effects. As shown in FIG. 3, the pattern (a) and the pattern (b) are the same in that a single line pattern is formed in the FOV 104, but the patterns outside the FOV are greatly different.

  FIG. 3A is a diagram for explaining an example in which a plurality of chromium patterns 102 are uniformly arranged in the left-right direction in the vicinity of the FEM 104 of the SEM, and FIG. It is a figure explaining the example in which the arrangement state of 103 is non-uniformly arranged in the sample plane (in this example, the chrome pattern 102 and the glass portion 103 are arranged asymmetrically in the left-right direction).

  In the case of FIG. 3 (a), since the pattern is repeated uniformly inside and outside the FOV, when scanning with an electron beam having a high current value, the charge inside and outside the field of view can be saturated and balanced. Measurement in a stable surface state is possible.

  FIG. 5 is a graph in which dimensional variations are recorded when two patterns having different pattern formation conditions outside the FOV are measured a plurality of times with an electron beam having a high beam current amount or a low beam current amount.

  As shown in FIG. 5A, when the pattern (pattern 1) illustrated in FIG. 3A is measured using an electron beam having a high beam current amount, the 10-time measurement variation is as good as 0.4 nm. Results were obtained. On the other hand, when the pattern (pattern 2) illustrated in FIG. 3B is measured using an electron beam having a high beam current amount, reflected electrons and secondary electrons 105 may be returned to the outside of the field of view.

  Since the left side of the field of view is made of insulating glass and the right side is made of chrome that conducts electricity, scanning with an electron beam with a high beam current will cause the balance of the accumulated electrons on the left and right to be lost and the surface state to become unstable. The variation of 10 measurements is 3 nm.

  Then, when scanning with an electron beam with a low beam current amount that does not break the balance of charging, as shown in FIG. 5B, in the case of the pattern 2, the variation in the measurement 10 times is 0.3 nm. Although it is improved, with respect to the pattern 1, with an electron beam with a low beam current amount, charging is not sufficiently saturated, and the measurement variation is 1.4 nm.

  As described above, the degree of charging changes depending on the pattern density inside and outside the field of view, and it is difficult to measure a plurality of patterns under the same measurement conditions and with high accuracy. Furthermore, it is practically difficult to manually set measurement conditions for a large number of measurement points.

  Hereinafter, a measurement condition setting method for performing measurement with high reproducibility by using pattern information inside and outside the FOV regardless of the presence of charging or the like will be described.

  As an embodiment for achieving the above object, in a method or apparatus for measuring a pattern using a scanning probe such as a scanning electron microscope, an experiment and simulation are performed in advance on a charging state depending on a pattern inside and outside the field of view. Register the optimal measurement conditions for the pattern in the database. When creating a recipe using design data, calculate the pattern density inside and outside the field of view, match the calculated pattern density with the database, and automatically derive the optimum measurement conditions for each pattern. A highly accurate measurement is possible while suppressing charging depending on the pattern shape.

  Hereinafter, an example of a measurement condition setting method or a recipe creation method for automatically setting measurement conditions suitable for each pattern will be described.

  In this embodiment, a database (optimized measurement condition database) in which information related to pattern density and the like obtained from design data of semiconductor devices is stored in association with information related to pattern density and measurement conditions (optical conditions of the apparatus). A method for deriving an appropriate apparatus condition will be described with reference to FIG.

  Specifically, since the charging state varies depending on the type of pattern, first, the charging state corresponding to the pattern inside and outside the field of view is obtained by performing experiments and simulations. Then, the optimum measurement conditions for various patterns are registered in the database. At this time, as pattern information, the density of the pattern inside and outside the FOV, the ratio of the measurement target pattern to the non-measurement target pattern in the FOV, the vertical and horizontal symmetry of the conductive member and the insulating member outside the FOV, or other charge related The data indicating the information to be quantified is quantified, and the quantified value is associated with the optimal measurement condition (optical condition of the apparatus) to form a database.

  After creating such a database, a measurement point on the design data or an FOV for measuring the measurement point is set. Based on the setting, the FOV pattern information is calculated using the pattern information of the design data, and the optimal measurement stored in association with the calculated FOV pattern information by referring to the database. Derive conditions.

  According to the configuration as described above, the SEM observation conditions can be optimized based on the pattern information inside and outside the SEM observation field of view, so that the measurement error based on charging that changes according to the pattern formation state can be reduced. Is possible.

FIG. 6 is a diagram illustrating a configuration of an SEM that is an example of a charged particle beam irradiation apparatus. Evacuation device 222 by 1 × 10 ^-4 Pa about sample 202 brought from the outside of the apparatus to keep a sample chamber 201 to the high vacuum is transferred to the sample stage 203. The sample stage 20 moves the sample 202 so that the electron beam 204 is irradiated to an arbitrary position on the sample.

  The electron beam 204 is emitted from the electron source cathode 205 and applied to the first anode 206, the second anode 207, the first focusing lens 208, the diaphragm plate 209, and the second focusing lens 210 from the respective power sources 217, 218, and 219. It is accelerated and converged by the supplied voltage and current. Further, the electron beam 204 is deflected one-dimensionally or two-dimensionally by the scanning coil 212 and finally becomes a convergent beam having a minute cross-sectional diameter by the objective lens 211 and reaches the sample surface.

  The scanning coil 212 is supplied with a sawtooth current from the scanning signal power supply 221, and scans the electron beam 204 with the generated periodic magnetic field. In this embodiment, the scanning mechanism uses a magnetic field method by a scanning coil, but an electric field method in which a voltage is applied to the counter electrode is also possible. A secondary signal (secondary electrons in this case) 213 generated from the sample is pulled up by a voltage applied between the sample and the objective lens, travels above the objective lens 211, and then primary electrons are generated by the orthogonal electromagnetic field generator 214. After being separated from the beam 204 and entering the secondary signal detector 215, it is converted into an electric signal by the photoelectric effect, amplified by the signal amplifier 216, converted into an image signal by the drawing device 224, and the sample image is displayed on the image display device 225. As well as being transferred to the image storage means 226 and subjected to image processing by the image processing device 227 by the length measurement arithmetic device 227. The image processing device 227 executes processing such as addition averaging of image information captured in the image storage unit 226, shape detection, image movement detection, and measurement of a specific shape dimension. All these elements are sequentially controlled by the control device 223.

  A design data management device (not shown) is connected to the control device 223, and the design data of the semiconductor device can be read according to a request from the control device 223. The design data is registered in the GDS or OASIS format and is read for calculation of pattern density and the like. In addition, a setting device (not shown) is connected to the control device 223 or the design data management device, and information regarding the FOV (measurement position, FOV position, magnification, etc.) can be set on the design data. .

  FIG. 1 is a diagram for explaining processing steps for automatically obtaining measurement conditions based on a field of view (FOV) setting on design data. When calculating the length measurement value of the pattern, the electron beam 101 is scanned on the sample 106, a line profile is formed based on the detection of the secondary electron signal generated from the pattern, and the edge position of the line profile is calculated. The length measurement value is calculated by detecting.

  The database calculation of optimum conditions is performed as follows. First, in the simulation, since the spread of reflected electrons and secondary electrons is symmetrical with respect to the incident axis, it is easy to perform the simulation in the polar coordinate system instead of the XY coordinate system. Simulate the actual measurement device pattern, calculate the charged state F (n) in the field of view with different patterns (n is the density ratio or area ratio of the chromium and glass pattern, etc.) As the distribution of the secondary electron amount spread, G (R, θ) depending on the distance R and the angle θ from the center of the screen is obtained.

  Then, the surface potential inside and outside the observation field is calculated by synthesizing the obtained F (n) and G (R, θ). The matrix is calculated with a combination of different patterns and different measurement conditions (acceleration voltage, scanning current, pre-irradiation, etc.) to find the measurement conditions that can obtain the surface state with the most stable potential.

  Next, the actual pattern is verified by SEM using the optimum conditions obtained by the simulation. Finally, the simulation result is fitted based on the measurement result of the SEM to improve the reliability of the simulation and create a database of optimum conditions for pattern-dependent charging.

  For example, a database is constructed by associating appropriate optical conditions (energy reaching the specimen of the electron beam and beam current) for each ratio of the chromium pattern and the glass portion in the FOV. Next, by setting the position and size (magnification) of the FOV on the design data, values relating to the area of the chromium pattern and the glass portion in the FOV are calculated with reference to the design data. In general, circuit vector data is registered in the design data, so the area and the like can be calculated by an existing method.

  Since the above-mentioned database stores the value related to the ratio between the chrome pattern and the glass part and the optical condition, the optical condition can be read out by inputting the value related to the ratio between the chrome pattern and the glass part. It becomes.

  In order to link the pattern density calculated from the design data with the result of simulation or experiment when generating the recipe or deriving the apparatus conditions, it is necessary to temporarily convert the design data of the XY coordinate system to the polar coordinate system. In addition, the spread of reflected electrons and secondary electrons is in the range of about several mm from the central axis, and the range in which design data is addressed is in the range of several mm from the observation point.

  First, the pattern density inside and outside the field of view is calculated from the designed design data. Link with the database according to the density and read out the optimum measurement conditions.

  The conditions are automatically written in the recipe measurement condition table to create a recipe. When executing the recipe, the measurement conditions are loaded from the table and switched for each pattern, so that pattern-dependent charging is minimized and the measurement accuracy is improved.

  Since switching of measurement conditions causes a fixed hardware and software processing time, the measurement conditions are classified, the same conditions or similar conditions are divided into groups, and the measurement order is optimized, thereby improving the throughput.

  When measuring multiple points and overlapping each other, it is necessary to optimize the conditions considering the double charging effect of the overlapped part, including the irradiation history of the previous point measurement.

  According to the present embodiment, it is possible to set appropriate apparatus conditions according to the pattern formation status inside and outside the FOV, so that highly reproducible measurement can be performed regardless of the type of pattern. It becomes. For example, as will be described with reference to FIGS. 4 and 5, variations in all measurements can be reduced to 0.5 nm or less, and measurement accuracy can be improved.

  Optimal measurement conditions are registered in advance in the apparatus internal database for each measurement pattern. The switching of the measurement conditions can be automatically changed in conjunction with the design data at the time of creating the recipe, so that the work amount of the recipe creator can be greatly reduced.

  In the above-described embodiments, the photomask has been described as an example of the measurement object by the SEM. However, the present invention is not limited to this, and if the charging fluctuation depending on the pattern shape is significant, the measurement conditions of the semiconductor wafer It can also be applied to settings.

101 Electron beam 102 Chrome pattern 103 Glass portion 104 FOV (field of view of electron beam)
105 Secondary electron 106 Sample

Claims (5)

In a pattern measurement condition setting method for setting measurement conditions when measuring a pattern formed on the sample by irradiating the sample with a charged particle beam,
Building a database that stores pattern information relating to the field of view of the charged particle beam and measurement conditions by the charged particle beam in association with each other;
Using the design data of the sample to set the field of view of the charged particle beam;
Extracting pattern information related to the visual field based on the visual field set on the design data;
A pattern measurement condition setting method comprising: a step of deriving a measurement condition by the charged particle beam by referring to the database using the extracted pattern information. In claim 1,
The pattern measurement condition setting method, wherein the measurement conditions using the charged particle beam include information on energy reaching the sample of the charged particle beam or beam current. In the pattern measurement condition setting device that sets the measurement conditions by the charged particle beam device using the design data of the sample,
A setting device that sets information about the field of view of the charged particle beam device using pattern information of the design data;
A storage medium for registering a database for storing pattern information related to the field of view of the charged particle beam and measurement conditions by the charged particle beam in association with each other;
Based on the information on the visual field set by the setting device, the pattern information on the visual field is extracted from the design data, and the database is referred to by using the extracted pattern information. A pattern measurement condition setting device comprising a control device for deriving measurement conditions by the charged particle beam. In claim 3,
The pattern measurement condition setting device, wherein the measurement conditions using the charged particle beam include information on energy reaching the sample of the charged particle beam or beam current. In claim 3,
The pattern information registered in the database includes pattern information in and / or out of the field of view of the charged particle beam.

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