JP2010077479A - Vacuum film deposition apparatus - Google Patents

Vacuum film deposition apparatus Download PDF

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JP2010077479A
JP2010077479A JP2008246112A JP2008246112A JP2010077479A JP 2010077479 A JP2010077479 A JP 2010077479A JP 2008246112 A JP2008246112 A JP 2008246112A JP 2008246112 A JP2008246112 A JP 2008246112A JP 2010077479 A JP2010077479 A JP 2010077479A
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synthetic resin
film
resin film
vacuum
partial pressure
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JP5320934B2 (en
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Tsutomu Shirai
励 白井
Takayuki Uegaki
孝幸 植垣
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Toppan Inc
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Toppan Printing Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a vacuum film deposition apparatus for depositing a thin film on a surface of a web-like synthetic resin-made film by the sputtering method which is capable of uniforming the amount of residual gas inside the synthetic resin-made film and on the surface thereof in the width direction of the synthetic resin-made film. <P>SOLUTION: A drying means has an infrared ray lamp heater for heating a synthetic resin-made film, a non-contact type thermometer, and a partial pressure vacuum gauge for measuring the amount of residual gas in vacuum. Each infrared ray lamp heater, each non-contact type thermometer, and each partial pressure vacuum gauge are arranged at the spacing of 200-500 mm in the width direction of the synthetic resin-made film and parallel to the traveling direction of the synthetic resin-made film. The film quality can be uniformed in the width direction of the synthetic resin-made film by providing a control means for controlling the infrared ray lamp heater and the non-contact type thermometer so that the amount of residual gas measured by the partial pressure vacuum gauge is constant. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、真空雰囲気下において、ポリエチレンテレフタレート(PET)、トリアセチルセルロース(TAC)等のウエブ状の合成樹脂フィルム表面にスパッタリング法を用いて薄膜を形成する巻取り式の真空成膜装置に関する。   The present invention relates to a take-up vacuum film forming apparatus for forming a thin film on the surface of a web-like synthetic resin film such as polyethylene terephthalate (PET) or triacetyl cellulose (TAC) using a sputtering method in a vacuum atmosphere.

例えば、図4に示すように、トルクモータ等の一定の張力にて巻取り可能な巻取り手段を持つ巻取り軸(1)を有し、かつパウダークラッチ等のトルク制御手段により一定のバックテンションをかけつつウエブ状の合成樹脂フィルムの巻出しを可能にする巻出し軸(2)を有し、かつこの二軸の間に合成樹脂フィルム(9)の走行を規制する複数のアイドルローラ(3、4)および張力を検知して巻取り軸(1)または巻出し軸(2)に適宜フィードバックを行うための張力検出器(5,6)を具備したテンションロール(7,8)があり、更に膜を形成するための温調ドラム(10)、および電極(11)と複数のプロセスガス噴出管(17、18)でなる成膜手段を配置することにより巻出し軸(2)から所定の張力を付与されつつ巻き出されるウエブ状の合成樹脂フィルム(9)が、温調ドラム(10)上で、前記の成膜手段により合成樹脂フィルム(9)の表面に膜を形成された後、所定の張力を伴いつつ巻取り軸(1)にて巻き取られ、表面に薄膜が形成されたフィルム(13)を得ることが出来る仕組みになっていた。   For example, as shown in FIG. 4, it has a winding shaft (1) having a winding means capable of winding at a constant tension such as a torque motor, and a constant back tension by a torque control means such as a powder clutch. A plurality of idle rollers (3) having an unwinding shaft (2) that enables unwinding of the web-shaped synthetic resin film while applying the pressure and restricting the travel of the synthetic resin film (9) between the two shafts. 4) and a tension roll (7, 8) equipped with a tension detector (5, 6) for detecting the tension and appropriately feeding back to the winding shaft (1) or the unwinding shaft (2), Further, a temperature control drum (10) for forming a film, and a film forming means including an electrode (11) and a plurality of process gas ejection pipes (17, 18) are disposed from the unwinding shaft (2) to a predetermined value. Winding while tension is applied The web-like synthetic resin film (9) is formed on the surface of the synthetic resin film (9) by the film forming means on the temperature control drum (10), and then with a predetermined tension. The film was wound around the winding shaft (1), and a film (13) having a thin film formed on the surface could be obtained.

しかしながら、図4に示すような従来の技術では以下のような問題を生じていた。スパッタリング法を用いてウエブ状の合成樹脂フィルムに薄膜を成膜する場合、合成樹脂フィルムの残留ガスや水分が成膜時の条件を変化させる為、成膜室に合成樹脂フィルムが入る前に乾燥させる必要があった。その場合、従来は温調ロールに接触させフィルム温度を上げて乾燥させる場合やランプヒーターで乾燥させる方法がとられていた(引用文献1参照)。   However, the conventional technique as shown in FIG. 4 has the following problems. When a thin film is formed on a web-shaped synthetic resin film by sputtering, the residual gas or moisture of the synthetic resin film changes the conditions during film formation, so it is dried before the synthetic resin film enters the film formation chamber. It was necessary to let it. In that case, conventionally, a method of bringing the film into contact with a temperature control roll to increase the film temperature for drying or a method of drying with a lamp heater has been employed (see Reference 1).

これらの温調方法では基板温度を一定に保つことで合成樹脂フィルムから発生する脱ガスや水分が一定になり合成樹脂フィルム内部の状態が均一になると考えていた。しかし、実際には温調ドラムと接触させる場合は合成樹脂フィルムの中心部で発生した脱ガスが端部に流れ、合成樹脂フィルムと温調ドラム間の隙間を生みシワの発生を誘発する場合や、シワを抑制したとしても中心部と端部では乾燥の状態が異なる現象を生んでいた。   In these temperature control methods, it was considered that degassing and moisture generated from the synthetic resin film become constant by keeping the substrate temperature constant, and the state inside the synthetic resin film becomes uniform. However, in actuality, when contacting with the temperature control drum, the degassing generated at the center of the synthetic resin film flows to the end, creating a gap between the synthetic resin film and the temperature control drum and inducing the generation of wrinkles. Even if wrinkles were suppressed, a phenomenon in which the dry state was different between the central portion and the end portion was generated.

また、非接触のランプヒーターを用いた場合、真空装置の排気口側へガスが流れることによる幅方向での圧力差により乾燥速度が変化し合成樹脂フィルムの幅方向で乾燥状態が変わるといった現象を生んでいた。   In addition, when a non-contact lamp heater is used, the drying speed changes due to the pressure difference in the width direction due to the gas flowing to the exhaust port side of the vacuum device, and the drying state changes in the width direction of the synthetic resin film. I was born.

その結果、得られる膜質には合成樹脂フィルムの乾燥状態を顕著に表す分布が発生し、その調整を行う為、成膜時に幅方向でガスの導入を変更するなどで対応せざるを得なかった。しかし、合成樹脂フィルムの種類や幅、真空成膜装置内に合成樹脂フィルムを入れる前の保管状態で乾燥条件及び幅方向の乾燥状態が異なり、成膜室での調整には限界があった。
これらの乾燥状態の差は僅かであっても成膜室で成膜される膜の性質に大きく影響し、特に透明導電膜をスパッタリング法にて成膜する場合に、電極とフィルム間に入れる反応ガスの分布を均一にしても導電性などの膜質が均一にならないといった問題が発生していた。
As a result, the resulting film quality has a distribution that remarkably represents the dry state of the synthetic resin film. In order to adjust the distribution, it has been necessary to deal with such problems as changing the introduction of gas in the width direction during film formation. . However, the drying conditions and the drying state in the width direction are different depending on the type and width of the synthetic resin film and the storage state before putting the synthetic resin film in the vacuum film forming apparatus, and there is a limit to the adjustment in the film forming chamber.
Even if the difference in the dry state is small, it greatly affects the properties of the film formed in the film formation chamber. Especially when a transparent conductive film is formed by sputtering, the reaction inserted between the electrode and the film. Even if the gas distribution is made uniform, there has been a problem that the film quality such as conductivity is not uniform.

特開2002−20863JP2002-20863

よって、本発明の目的は、上記の問題を解決するための手段を提供するものであり、スパッタリング法によりウエブ状の合成樹脂フィルム表面に薄膜を形成する真空成膜装置において、合成樹脂フィルム内部及び表面の残留ガス量を合成樹脂フィルムの幅方向で均一にすることができる真空成膜装置を提供することにある。   Therefore, an object of the present invention is to provide means for solving the above-mentioned problems. In a vacuum film forming apparatus for forming a thin film on the surface of a web-like synthetic resin film by sputtering, the inside of the synthetic resin film and An object of the present invention is to provide a vacuum film forming apparatus capable of making the amount of residual gas on the surface uniform in the width direction of the synthetic resin film.

請求項1に記載の発明は、真空雰囲気下で、ウエブ状の合成樹脂フィルムの巻出しを行う巻出し手段と前記合成樹脂フィルムの巻取りを行う巻取り手段とを有する巻出し・巻取り室と、前記巻出し手段と巻取り手段との間に設置された温調ドラムと、前記温調ドラム上を走行する前記合成樹脂フィルム表面にスパッタリング法を用いて薄膜を成膜する成膜手段を有する成膜室と、前記巻出し手段と温調ドラムとの間に設置され前記合成樹脂フィルムの乾燥を行う乾燥手段と、を備える真空成膜装置において、
前記乾燥手段は、前記合成樹脂フィルム加熱用の赤外線ランプヒーターと、非接触式温度計と、真空中の残留ガス量を測定する真空分圧計と、を備え、
前記赤外線ランプヒーターと非接触式温度計と真空分圧計は、前記合成樹脂フィルムの幅方向に200mm〜500mmの間隔で、かつ、前記合成樹脂フィルム走行方向に平行に、各一個ずつ設置されており、
前記真空分圧計により測定された残留ガス量が一定となるように、前記赤外線ランプヒーターと非接触式温度計とを制御する制御手段を備える
ことを特徴とする真空成膜装置である。
The invention according to claim 1 is an unwinding / winding chamber having unwinding means for unwinding the web-like synthetic resin film and unwinding means for winding the synthetic resin film in a vacuum atmosphere. And a temperature adjusting drum installed between the unwinding means and the winding means, and a film forming means for forming a thin film on the surface of the synthetic resin film running on the temperature adjusting drum using a sputtering method. In a vacuum film-forming apparatus comprising: a film-forming chamber having; and a drying unit that is installed between the unwinding unit and the temperature control drum and performs drying of the synthetic resin film,
The drying means includes an infrared lamp heater for heating the synthetic resin film, a non-contact type thermometer, and a vacuum partial pressure meter for measuring a residual gas amount in a vacuum,
The infrared lamp heater, the non-contact type thermometer, and the vacuum partial pressure gauge are installed one by one at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film and in parallel with the running direction of the synthetic resin film. ,
A vacuum film forming apparatus comprising a control means for controlling the infrared lamp heater and the non-contact type thermometer so that a residual gas amount measured by the vacuum partial pressure meter is constant.

請求項2に記載の発明は、前記真空分圧計は残留ガスのうち酸素分圧と水分圧を同時に測定するものであり、前記制御手段は酸素分圧と水分圧の比が前記合成樹脂フィルム幅方向で一定となるように前記赤外線ランプヒーターと非接触式温度計とを制御することを特徴とする請求項1に記載の真空成膜装置である。   According to a second aspect of the present invention, the vacuum partial pressure gauge simultaneously measures an oxygen partial pressure and a water pressure in a residual gas, and the control means has a ratio of the oxygen partial pressure and the water pressure to the synthetic resin film width. 2. The vacuum film forming apparatus according to claim 1, wherein the infrared lamp heater and the non-contact thermometer are controlled so as to be constant in a direction.

本発明の真空成膜装置を用いることで、複数個の真空分圧計で測定した残留ガスの分圧量が一定になるように非接触温度計の温度を測定しながら赤外線ランプヒーターにより合成樹脂フィルムの温度を調整することで、合成樹脂フィルムの幅方向における膜質の均一化が可能である。   By using the vacuum film forming apparatus of the present invention, a synthetic resin film is measured by an infrared lamp heater while measuring the temperature of a non-contact thermometer so that the partial pressure of residual gas measured by a plurality of vacuum partial pressure meters is constant. By adjusting the temperature, the film quality in the width direction of the synthetic resin film can be made uniform.

以下本発明の実施の形態を図面を用いて説明する。
本発明の真空成膜装置は、図1に示すように、真空雰囲気下で、ウエブ状の合成樹脂フィルム(9)の巻出しを行う巻出し手段(巻出し軸(2))と合成樹脂フィルム(9)の巻取りを行う巻取り手段(巻取り軸(1))とを有する巻出し・巻取り室と、温調ドラム(10)上を走行する合成樹脂フィルム(9)表面にスパッタリング法を用いて薄膜を成膜する成膜手段を有する成膜室と、巻出し手段(巻出し軸(2))と温調ドラム(10)との間に設置され合成樹脂フィルム(9)の乾燥を行う乾燥手段(19)と、を少なくとも備えている。
Embodiments of the present invention will be described below with reference to the drawings.
As shown in FIG. 1, the vacuum film-forming apparatus of the present invention comprises an unwinding means (unwinding shaft (2)) and a synthetic resin film for unwinding a web-shaped synthetic resin film (9) in a vacuum atmosphere. Sputtering method on the surface of the synthetic resin film (9) running on the unwinding / winding chamber having the winding means (winding shaft (1)) for winding (9) and the temperature control drum (10) Of a synthetic resin film (9) installed between a film forming chamber having a film forming means for forming a thin film by using an unwinding means and an unwinding means (unwinding shaft (2)) and a temperature control drum (10). And a drying means (19) for performing the above.

また、図2及び3に示すように、乾燥手段は、合成樹脂フィルム加熱用の赤外線ランプヒーター(20)と、非接触式温度計(21)と、真空中の残留ガス量を測定する真空分圧計(22)を備えており、赤外線ランプヒーター(20)と非接触式温度計(21)と真空分圧計(22)は、合成樹脂フィルム(9)の幅方向に200mm〜500mmの間隔で、かつ、合成樹脂フィルム(9)走行方向に平行に、各一個ずつ設置されている。
さらに、真空分圧計(22)により測定された残留ガス量が一定となるように、赤外線ランプヒーター(20)と非接触式温度計(21)とを制御する制御手段を備えている。
2 and 3, the drying means includes an infrared lamp heater (20) for heating the synthetic resin film, a non-contact thermometer (21), and a vacuum component for measuring the amount of residual gas in the vacuum. A pressure gauge (22), and an infrared lamp heater (20), a non-contact type thermometer (21), and a vacuum partial pressure gauge (22) at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film (9), And one piece of each is installed in parallel with the synthetic resin film (9) traveling direction.
Furthermore, a control means for controlling the infrared lamp heater (20) and the non-contact type thermometer (21) is provided so that the residual gas amount measured by the vacuum partial pressure gauge (22) becomes constant.

本発明では、赤外線ランプヒーター(20)と非接触式温度計(21)と真空分圧計(22)を、合成樹脂フィルム(9)の幅方向に200mm〜500mmの間隔で、かつ、合成樹脂フィルム(9)走行方向に平行に、各一個ずつ設置することにより、複数個の真空分圧計(22)で測定した残留ガスの分圧量が一定になるように非接触温度計(21)の温度を測定しながら赤外線ランプヒーター(20)により合成樹脂フィルム(9)の温度を調整することで、合成樹脂フィルム(9)の幅方向における膜質を均一なものとすることができる。
なお、通常は合成樹脂フィルム(9)を2分割から3分割するように赤外線ランプヒーター(20)と非接触式温度計(21)と真空分圧計(22)とを設置することで、合成樹脂フィルム(9)の乾燥状態を均一化することが可能となる。
In the present invention, the infrared lamp heater (20), the non-contact type thermometer (21), and the vacuum partial pressure gauge (22) are arranged at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film (9), and the synthetic resin film. (9) The temperature of the non-contact thermometer (21) is set so that the partial pressure of the residual gas measured by the plurality of vacuum partial pressure gauges (22) becomes constant by installing each one parallel to the traveling direction. The film quality in the width direction of the synthetic resin film (9) can be made uniform by adjusting the temperature of the synthetic resin film (9) with the infrared lamp heater (20) while measuring the above.
Normally, the synthetic resin film (9) is divided into two to three parts by installing an infrared lamp heater (20), a non-contact type thermometer (21), and a vacuum partial pressure gauge (22), thereby making the synthetic resin film. It becomes possible to make the dry state of a film (9) uniform.

本発明では、赤外線ランプヒーター(20)と非接触式温度計(21)と真空分圧計(22)を、合成樹脂フィルム(9)の幅方向に200mm〜500mmの間隔で設置しているが、その間隔が、200mm未満であるとヒーターと基板との距離を小さくしないと制御が困難であり、また装置が複雑化してしまうため、好ましくない。間隔が500mmより大きいと幅方向の制御が困難であるため、好ましくない。
なお、合成樹脂フィルム(9)の幅により、赤外線ランプヒーター(20)等の設置間隔を適宜変更するものである。
In the present invention, the infrared lamp heater (20), the non-contact type thermometer (21), and the vacuum partial pressure meter (22) are installed at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film (9). If the distance is less than 200 mm, control is difficult unless the distance between the heater and the substrate is reduced, and the apparatus becomes complicated. If the interval is larger than 500 mm, it is difficult to control in the width direction, which is not preferable.
The installation interval of the infrared lamp heater (20) and the like is appropriately changed depending on the width of the synthetic resin film (9).

本発明に用いられるウエブ状の合成樹脂フィルム(9)は、ポリエチレンテレフタレート(PET)、トリアセチルセルロース(TAC)、ポリカーボネート(PC)やそれらにハードコート処理や易接処理を施したものを用いることができるが、撓んで巻き取れる様な性質の長尺のものであれば、どの様な材料でも構わない。
また、厚さは20μm〜200μm程度、幅は1000mm〜2000mm程度のものを対象としている。
The web-like synthetic resin film (9) used in the present invention is made of polyethylene terephthalate (PET), triacetyl cellulose (TAC), polycarbonate (PC) or those subjected to hard coat treatment or easy-contact treatment. However, any material can be used as long as it is long enough to bend and wind.
Moreover, the thickness is about 20 μm to 200 μm, and the width is about 1000 mm to 2000 mm.

本発明に用いられる赤外線ランプヒーター(20)は、適宜温度調整できるものであれば、特に限定されるものではないが、ハロゲンランプヒーターはフィルムの赤外線吸収波長に近いため、好ましい。   The infrared lamp heater (20) used in the present invention is not particularly limited as long as the temperature can be appropriately adjusted, but a halogen lamp heater is preferable because it is close to the infrared absorption wavelength of the film.

本発明に用いられる非接触式温度計(21)は、非接触で温度を測定できるものであれば、特に限定されるものではないが、赤外線熱電対を用いることが好ましい。   The non-contact thermometer (21) used in the present invention is not particularly limited as long as the temperature can be measured in a non-contact manner, but an infrared thermocouple is preferably used.

本発明に用いられる真空分圧計(22)は、残留ガス量を測定できるものであれば、特に限定されるものではないが、残留ガスのうち酸素分圧と水分圧を同時に測定することができるため、ULVAC社製MALINを用いることが好ましい。   The vacuum partial pressure gauge (22) used in the present invention is not particularly limited as long as it can measure the amount of residual gas, but it can simultaneously measure the oxygen partial pressure and moisture pressure of the residual gas. Therefore, it is preferable to use MALIN manufactured by ULVAC.

本発明に用いられる制御手段は、真空分圧計(22)により測定された残留ガス量が一定となるように、赤外線ランプヒーター(20)と非接触式温度計(21)とを制御することができるものであれば、特に限定されるものではないが、酸素分圧と水分圧の比が合成樹脂フィルム(9)幅方向で一定となるように赤外線ランプヒーター(20)と非接触式温度計(21)とを制御できるものであると、より好ましい。   The control means used in the present invention can control the infrared lamp heater (20) and the non-contact type thermometer (21) so that the residual gas amount measured by the vacuum partial pressure gauge (22) is constant. If possible, the infrared lamp heater (20) and the non-contact type thermometer are not particularly limited, but the ratio of the oxygen partial pressure and the water pressure is constant in the width direction of the synthetic resin film (9). It is more preferable that (21) can be controlled.

また、本発明の真空成膜装置は、乾燥手段(19)を除いて、従来の図4と同様の構成であり、ウエブ状合成樹脂フィルム(9)の巻出し・巻取り室を成膜室と同様に真空環境内で設けるものでも構わないが、外部に巻出し手段及び巻取り手段を設けて真空成膜装置内に導入や排出を行うものであっても構わない。   The vacuum film-forming apparatus of the present invention has the same configuration as that of the conventional FIG. 4 except for the drying means (19), and the web-like synthetic resin film (9) unwinding / winding-up chamber is a film forming chamber. However, it may be provided in a vacuum environment, but may be provided outside and provided in a vacuum film forming apparatus by providing unwinding means and winding means.

また、温調ドラム(10)に巻き付いた状態で成膜室に搬送される機構としているが、別な搬送形態を持つものでも構わない。   Moreover, although it is set as the mechanism conveyed to the film-forming chamber in the state wound around the temperature control drum (10), what has another conveyance form may be sufficient.

また、成膜室と他の領域との仕切は、ウエブ状の合成樹脂フィルム(9)に接触しない程度に温調ドラム(10)に近づけて形成されるが、仕切の大きさ等は適宜選択可能である。   Moreover, the partition between the film forming chamber and the other region is formed as close to the temperature control drum (10) as it does not come into contact with the web-shaped synthetic resin film (9). Is possible.

以下、本発明を実施例および比較例によりさらに説明するが、本発明は下記例に制限されるものではない。   EXAMPLES Hereinafter, although an Example and a comparative example further demonstrate this invention, this invention is not restrict | limited to the following example.

<実施例1>
フィルム厚188μm、フィルム幅1000mmのPETフィルムにハードコート処理を施した合成樹脂フィルムを搬送し、幅方向350mm間隔に分割したハロゲンヒーターを3個並列に設置し、水分圧量を幅方向で一定になる様に乾燥処理を施し、スパッタ法にてITO膜を成膜した。
成膜条件は、成膜圧力2×10−3Pa、DC電源出力8kW、巻取速度10m/minとした。
その結果、得られたITO膜の表面抵抗値の幅方向分布を図5(a)に示す。
また、一般的なITO膜の評価方法であるアニール処理(150℃で1時間加熱)を施した後の表面抵抗値の分布を図5(b)に示す。
<Example 1>
A synthetic resin film that has been hard-coated on a PET film with a film thickness of 188 μm and a film width of 1000 mm is transported, and three halogen heaters divided at intervals of 350 mm in the width direction are installed in parallel to keep the moisture pressure constant in the width direction. Then, a drying process was performed, and an ITO film was formed by sputtering.
The film forming conditions were a film forming pressure of 2 × 10 −3 Pa, a DC power output of 8 kW, and a winding speed of 10 m / min.
As a result, the distribution in the width direction of the surface resistance value of the obtained ITO film is shown in FIG.
In addition, FIG. 5B shows the distribution of the surface resistance value after annealing treatment (heating at 150 ° C. for 1 hour), which is a general ITO film evaluation method.

<実施例2>
フィルム厚188μm、フィルム幅1000mmのPETフィルムにハードコート処理を施した合成樹脂フィルムを搬送し、幅方向350mm間隔に分割したハロゲンヒーターを3個並列に設置し、酸素分圧と水分圧の比を幅方向で一定になる様に乾燥処理を施し、スパッタ法にてITO膜を成膜した。
成膜条件は実施例1と同様である。
その結果、得られたITO膜の表面抵抗値の幅方向分布を図6(a)に示す。
また実施例1と同様にアニール処理(150℃で1時間加熱)を施した後の表面抵抗値の分布を図6(b)に示す。
<Example 2>
A synthetic resin film that has been hard-coated on a PET film with a film thickness of 188 μm and a film width of 1000 mm is transported, and three halogen heaters divided at intervals of 350 mm in the width direction are installed in parallel, and the ratio of oxygen partial pressure to moisture pressure is set. A drying process was performed so as to be constant in the width direction, and an ITO film was formed by sputtering.
The film forming conditions are the same as in Example 1.
As a result, the distribution in the width direction of the surface resistance value of the obtained ITO film is shown in FIG.
Further, the distribution of the surface resistance value after the annealing treatment (heating at 150 ° C. for 1 hour) as in Example 1 is shown in FIG.

<比較例1>
フィルム厚188μm、フィルム幅1000mmのPETフィルムにハードコート処理をした合成樹脂フィルムを搬送し、合成樹脂フィルムの温度のみを幅方向一定として乾燥処理をし、スパッタ法にてITO膜を成膜した。
その結果、得られたITO膜の表面抵抗値の幅方向分布を図7(a)に示す。
また実施例1と同様にアニール処理(150℃で1時間加熱)を施した後の表面抵抗値の分布を図7(b)に示す。
<Comparative Example 1>
A synthetic resin film that had been hard-coated on a PET film having a film thickness of 188 μm and a film width of 1000 mm was transported, dried only with the temperature of the synthetic resin film being constant in the width direction, and an ITO film was formed by sputtering.
As a result, the distribution in the width direction of the surface resistance value of the obtained ITO film is shown in FIG.
Further, the distribution of the surface resistance value after the annealing treatment (heating at 150 ° C. for 1 hour) as in Example 1 is shown in FIG.

なお、図5〜7に記載の分布図は、横軸が合成樹脂フィルムの幅方向における長さ(mm)を示し、縦軸が合成樹脂フィルムの幅方向における表面抵抗値(Ω/□)を示しており、中央に引かれた線がフィルムの中心線を示している。   5-7, the horizontal axis shows the length (mm) in the width direction of the synthetic resin film, and the vertical axis shows the surface resistance value (Ω / □) in the width direction of the synthetic resin film. The line drawn in the center shows the center line of the film.

実施例1より、アニール処理前の表面抵抗値の分布は比較例1と比較し均一化される効果が確認できた。アニール処理後の表面抵抗値分布も安定しているが、僅かにフィルム幅方向分布が山形になっていることが分かる。
実施例2より、初期、加熱後の抵抗値分布が均一化されていることが確認できた。
比較例1より、合成樹脂フィルムからの脱ガス量の分布の影響と考えられる抵抗値の分布が見てとれる。特に、アニール処理後の膜質変化が大きく抵抗値分布は大きく乱れ実用に適さないことが分かる。
From Example 1, it was confirmed that the distribution of the surface resistance value before the annealing treatment was made uniform as compared with Comparative Example 1. It can be seen that the surface resistance value distribution after the annealing treatment is stable, but the distribution in the film width direction is slightly mountain-shaped.
From Example 2, it was confirmed that the resistance value distribution after heating was uniform in the initial stage.
From Comparative Example 1, it can be seen that the distribution of the resistance value considered to be the influence of the distribution of the degas amount from the synthetic resin film. In particular, it can be seen that the film quality change after the annealing treatment is large and the resistance value distribution is greatly disturbed, which is not suitable for practical use.

つまり、赤外線ランプヒーターと非接触式温度計と真空分圧計が、合成樹脂フィルムの幅方向に200mm〜500mmの間隔で、かつ、合成樹脂フィルム走行方向に平行に、各一個ずつ設置されていることにより、合成樹脂フィルムの幅方向における膜質の均一化が可能であることが分かる。
また、実施例1に示すように、水分圧量を幅方向で一定になるように制御するよりも、実施例2に示すように、酸素分圧と水分圧の比を幅方向で一定になるように制御することで、より合成樹脂フィルムの幅方向における膜質の均一化が可能であることが分かる。
That is, an infrared lamp heater, a non-contact type thermometer, and a vacuum partial pressure meter are installed one by one at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film and in parallel with the synthetic resin film running direction. Thus, it can be seen that the film quality in the width direction of the synthetic resin film can be made uniform.
In addition, as shown in Example 1, the ratio of the oxygen partial pressure and the water pressure is made constant in the width direction as shown in Example 2, rather than controlling the water pressure amount to be constant in the width direction. By controlling in this way, it turns out that the film quality in the width direction of the synthetic resin film can be made more uniform.

本発明における巻取り式真空成膜装置の全体図を示す概略説明図である。It is a schematic explanatory drawing which shows the whole figure of the winding-type vacuum film-forming apparatus in this invention. 本発明に関わる真空巻取り装置の乾燥手段の概略図を示す部分概略図である。It is the partial schematic which shows the schematic of the drying means of the vacuum winding apparatus concerning this invention. 本発明に関わる真空巻取り装置の乾燥手段の一事例を示す部分拡大断面図である。It is a partial expanded sectional view which shows an example of the drying means of the vacuum winding apparatus concerning this invention. 従来技術における巻取り式真空成膜装置の全体図を示す概略説明図である。It is a schematic explanatory drawing which shows the whole view of the winding type vacuum film-forming apparatus in a prior art. (a)実施例1における表面抵抗値の幅方向分布を示す図である。 (b)実施例1におけるアニール処理後の表面抵抗値の幅方向分布を示す図である。(A) It is a figure which shows the width direction distribution of the surface resistance value in Example 1. FIG. (B) It is a figure which shows the width direction distribution of the surface resistance value after the annealing process in Example 1. FIG. (a)実施例2における表面抵抗値の幅方向分布を示す図である。 (b)実施例2におけるアニール処理後の表面抵抗値の幅方向分布を示す図である。(A) It is a figure which shows the width direction distribution of the surface resistance value in Example 2. FIG. (B) It is a figure which shows the width direction distribution of the surface resistance value after the annealing process in Example 2. FIG. (a)比較例1における表面抵抗値の幅方向分布を示す図である。 (b)比較例1におけるアニール処理後の表面抵抗値の幅方向分布を示す図である。(A) It is a figure which shows the width direction distribution of the surface resistance value in the comparative example 1. FIG. (B) It is a figure which shows the width direction distribution of the surface resistance value after the annealing process in the comparative example 1. FIG.

符号の説明Explanation of symbols

1…巻取り軸、2…巻出し軸、3、4…アイドルローラ、5、6…張力検出器、7、8…テンションローラ、9…フィルム、10…温調ドラム、11…成膜手段(電極、スパッタターゲット等)、12…ウェブ状の合成樹脂フィルム原反、13…ウェブ状の成膜済み合成樹脂フィルム、14、15…ニップローラ、16…ダンサローラ、17、18…ガス供給管、19…乾燥手段、20…赤外線ランプヒーター、21…非接触温度計、22…真空分圧計。
DESCRIPTION OF SYMBOLS 1 ... Winding shaft, 2 ... Unwinding shaft, 3, 4 ... Idle roller, 5, 6 ... Tension detector, 7, 8 ... Tension roller, 9 ... Film, 10 ... Temperature control drum, 11 ... Film forming means ( Electrode, sputter target, etc.), 12 ... web-shaped synthetic resin film, 13 ... web-shaped synthetic resin film, 14, 15 ... nip roller, 16 ... dancer roller, 17, 18 ... gas supply pipe, 19 ... Drying means, 20 ... infrared lamp heater, 21 ... non-contact thermometer, 22 ... vacuum partial pressure gauge.

Claims (2)

真空雰囲気下で、ウエブ状の合成樹脂フィルムの巻出しを行う巻出し手段と前記合成樹脂フィルムの巻取りを行う巻取り手段とを有する巻出し・巻取り室と、前記巻出し手段と巻取り手段との間に設置された温調ドラムと、前記温調ドラム上を走行する前記合成樹脂フィルム表面にスパッタリング法を用いて薄膜を成膜する成膜手段を有する成膜室と、前記巻出し手段と温調ドラムとの間に設置され前記合成樹脂フィルムの乾燥を行う乾燥手段と、を備える真空成膜装置において、
前記乾燥手段は、前記合成樹脂フィルム加熱用の赤外線ランプヒーターと、非接触式温度計と、真空中の残留ガス量を測定する真空分圧計と、を備え、
前記赤外線ランプヒーターと非接触式温度計と真空分圧計は、前記合成樹脂フィルムの幅方向に200mm〜500mmの間隔で、かつ、前記合成樹脂フィルム走行方向に平行に、各一個ずつ設置されており、
前記真空分圧計により測定された残留ガス量が一定となるように、前記赤外線ランプヒーターと非接触式温度計とを制御する制御手段を備える
ことを特徴とする真空成膜装置。
An unwinding / winding chamber having unwinding means for unwinding the web-shaped synthetic resin film and unwinding means for winding the synthetic resin film in a vacuum atmosphere; and the unwinding means and the winding A film-forming chamber having a temperature-controlling drum installed between the device, a film-forming device for forming a thin film on the surface of the synthetic resin film running on the temperature-controlling drum using a sputtering method, and the unwinding In a vacuum film forming apparatus comprising: a drying unit installed between the unit and a temperature control drum for drying the synthetic resin film,
The drying means includes an infrared lamp heater for heating the synthetic resin film, a non-contact type thermometer, and a vacuum partial pressure meter for measuring a residual gas amount in a vacuum,
The infrared lamp heater, the non-contact type thermometer, and the vacuum partial pressure gauge are installed one by one at intervals of 200 mm to 500 mm in the width direction of the synthetic resin film and in parallel with the running direction of the synthetic resin film. ,
A vacuum film forming apparatus comprising: control means for controlling the infrared lamp heater and the non-contact thermometer so that a residual gas amount measured by the vacuum partial pressure meter is constant.
前記真空分圧計は残留ガスのうち酸素分圧と水分圧を同時に測定するものであり、前記制御手段は酸素分圧と水分圧の比が前記合成樹脂フィルム幅方向で一定となるように前記赤外線ランプヒーターと非接触式温度計とを制御することを特徴とする請求項1に記載の真空成膜装置。














The vacuum partial pressure gauge measures the oxygen partial pressure and the water pressure simultaneously in the residual gas, and the control means controls the infrared ray so that the ratio of the oxygen partial pressure and the water pressure is constant in the width direction of the synthetic resin film. The vacuum film forming apparatus according to claim 1, wherein the lamp heater and the non-contact type thermometer are controlled.














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JPH11333920A (en) * 1998-05-28 1999-12-07 Toray Ind Inc Method and apparatus for producing resin film
JP2000272044A (en) * 1999-03-26 2000-10-03 Dainippon Printing Co Ltd Transparent barrier film, method and apparatus for producing the same and laminated material and packaging container using transparent barrier film
JP2004052078A (en) * 2002-07-23 2004-02-19 Toyobo Co Ltd Roll coater type continuous sputtering equipment for producing transparent electrically conductive film

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Publication number Priority date Publication date Assignee Title
JPH11333920A (en) * 1998-05-28 1999-12-07 Toray Ind Inc Method and apparatus for producing resin film
JP2000272044A (en) * 1999-03-26 2000-10-03 Dainippon Printing Co Ltd Transparent barrier film, method and apparatus for producing the same and laminated material and packaging container using transparent barrier film
JP2004052078A (en) * 2002-07-23 2004-02-19 Toyobo Co Ltd Roll coater type continuous sputtering equipment for producing transparent electrically conductive film

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016204727A (en) * 2015-04-28 2016-12-08 東レ株式会社 Film deposition apparatus

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