JP2010066081A - Device test system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To specify the causes of anomalies at an early stage by determining whether anomalies are caused by the failure of a device under test or due to other causes when anomalies exist in results of tests. <P>SOLUTION: A device test system performs one test or more according to settings to one device under test or more to be tested and includes a test information storage means for storing first test information for determining whether test results are normal or not and second test information for determining whether tests are valid or not for each test; a result determination means for determining whether the test results are anomalous or not on the basis of the first stored test information; a cause determination means for determining the causes of anomalies of the test results on the basis of stored second test information when it is determined that the test results are anomalous; and a display means for displaying the test results and determination results by the result determination means and further displaying information based on results of cause determination according to the determination results by the cause determination means. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a device test system for testing a device under test to be tested.

For example, Patent Document 1 receives measurement data as a test result from a measuring instrument, compares the measurement data with a criterion for determining whether or not the measurement result is normal, and determines whether or not the measurement data is normal. By determining whether or not, a test apparatus that identifies a failure site of the apparatus under test is disclosed.
JP-A-9-304129

  The present invention has been made from the background as described above. When the result of the test is abnormal, it is determined whether the cause is due to the failure of the device under test or the other. An apparatus test system improved so that the cause of abnormality can be identified.

In order to achieve the above object, an apparatus test system according to the present invention is an apparatus test system (1) that performs one or more tests on one or more devices to be tested according to settings. First test information for determining whether or not the result of the test is normal and second test information for determining whether or not the test is valid for each test. Test information storage means (224) for storing, result determination means (230) for determining whether or not the result of the test is abnormal based on the stored first test information, and result of the test Is determined to be abnormal, based on the stored second test information, cause determination means (232) for determining the cause of the abnormality of the test result, determination by the test result and the result determination means The result is displayed, and the cause determination means That according to the determination result, further comprising a display means for displaying (234) the information based on the cause determination result.
In addition, the code | symbol attached | subjected here intends helping an understanding of this invention, and does not intend limiting the technical scope of this invention.

  According to the apparatus test system according to the present invention, when the result of the test is abnormal, it is determined whether the cause is due to the failure of the apparatus under test or not, and the cause of the abnormality is identified at an early stage. can do.

[Background to the Invention]
FIG. 1A is a diagram showing a configuration of a test system 1 (test system) according to the present invention.
As shown in FIG. 1A, the test system 1 includes a control device 12, a device under test control device 14, and n measuring devices 16-1 to 16-n (n ≧ 1; n does not always indicate the same number) and n devices under test 20-1 to 20-n (devices under test) are connected to a network 10 such as a LAN, and n measuring devices 16 -1 to 16-n and n devices under test 20-1 to 20-n are connected via the switching device 18.

Prior to the description of the test system 1 according to the present invention, in order to help the understanding of the test system 1, the background to the present invention will be described first.
Hereinafter, when any one of a plurality of components such as the measuring devices 16-1 to 16-n is indicated, it may be simply referred to as the measuring device 16.
Hereinafter, in each figure, the same code | symbol is attached | subjected to the substantially same component and process.
In the test system 1, the test of the device under test 20 is started under the control of the control device 12 and the device under test control device 14, and the test signal output from the device under test 20 is connected via the switching device 18. The measured device 16 measures and outputs the measured value to the control device 12.
Further, in the test system 1, the measured value output to the control device 12 is compared with a criterion for determining whether the measured value is normal or abnormal, and the failure part of the device under test 20 is identified. To do.

However, the cause of the abnormal measurement value is not only due to the failure of the device under test, but also the failure of the measurement device 16 or the failure of connection between the measurement device 16 and the device under test 20 via the switching device 18 (measurement). It is also conceivable that the test system 1 itself has a problem (path loss).
Therefore, it is difficult to determine whether the cause of the abnormality in the measured value is due to the failure of the device under test or not based only on the criteria for determining whether the measured value is normal or abnormal. Therefore, it takes a lot of time to identify the cause of the abnormality.
The test system 1 according to the present invention has been made based on the above-described circumstances, and determines whether the cause of the abnormality in the measured value is due to the failure of the device under test or not. It has been improved so that the cause of abnormality can be identified.

[Test system 1]
Hereinafter, the test system 1 according to the present invention shown in FIG.
FIG. 1B is a diagram illustrating hardware configurations of the control device 12 and the device under test control device 14 shown in FIG.
As shown in FIG. 1B, the control device 12 and the device under test control device 14 include an information processing device 120 including a memory 122 and a CPU 124, an external input / output device 126 including a keyboard and a display device, and data, respectively. The communication device 128 includes a communication device 128 that performs communication, and a recording device 130 that records data on a recording medium 132 such as a hard disk.
That is, the control device 12 and the device under test control device 14 have components as computers capable of information processing and data communication.

Further, the control device 12 executes the control device program 22 shown in FIG. 2, starts a test for the device under test 20, determines whether or not the measurement value as the test result is abnormal,
If it is determined that there is an abnormality, it is determined whether the cause of the abnormality is due to a failure of the device under test or not.
In the test system 1, a plurality of tests are performed on the device under test 20. Each of these tests is uniquely identified with each test associated with one “test item”.
Hereinafter, “test associated with a test item” is simply referred to as “test item”.
That is, for example, “execution of test associated with test item” is described as “execution of test item”, and “measured value for test associated with test item” is “measured value for test item” Is described.

[Control device program 22]
FIG. 2 is a diagram illustrating a control device program 22 that is executed on the control device 12 (FIGS. 1A and 1B) of the test system 1.
As shown in FIG. 2, the control device program 22 includes a user interface (UI) unit 220, a test procedure creation unit 222, a test information database (DB) 224, a test control unit 226, a test result DB 228, a result determination unit 230, a cause It comprises a determination unit 232 and a display unit 234.
The control program 22 is stored in the memory 122 (FIG. 1B) and supplied to the control device 12, for example, and on the OS (not shown) installed in the control device 12 as necessary, the control program 22 The 12 hardware resources are specifically used and executed.

The UI unit 220 receives a plurality of test items input via the external input / output device 126 (FIG. 1B) and outputs the received test items to the test procedure creation unit 222.
In addition, the UI unit 220 receives test information (described later with reference to FIG. 4A) of each test item input via the external input / output device 126 and stores it in the test information DB 224.
In addition, the UI unit 220 receives information output from the display unit 234 described later, and causes the external input / output device 126 to display the information.

The test procedure creation unit 222 creates a test procedure based on a plurality of test items input from the UI unit 220.
The test procedure includes execution order information of each test item and a set of connection (connection information) between the measuring device 16 (FIG. 1A) and the device under test 20 when executing each test item.
The test procedure creation unit 222 outputs the created test procedure to the test control unit 226.
Further, the test procedure creation unit 222 outputs execution order information of each test item among the created test procedures to the display unit 234.

FIG. 4A is a diagram illustrating a table for managing the test information stored in the test information DB 224 for each test item.
The test information DB 224 receives and stores the test information of each test item input from the UI unit 220.
As shown in FIG. 4A, the test information includes, for example, a lower limit and an upper limit (first test information) of a normal reference value for determining whether or not the test result is normal, and the test is valid. The lower limit and upper limit (second test information) of the effective measurement value for determining whether or not there is, and the name of the measuring device used for the test.

When the measured value is outside the range between the lower limit and the upper limit of the effective measured value, the measured value is a value that cannot be taken as a measured value for the test on the device under test 20 even if the device under test 20 is out of order. Therefore, it is considered that an abnormal value is measured due to a defect in the test system 1 itself.
That is, if the test is valid, there is no failure in the test system 1 itself, and the result of the test is information for determining whether or not the device under test 20 has failed without considering the failure of the test system 1. Means that it can be used as
Therefore, even when it is determined that the test result is abnormal, the cause of the abnormality is not necessarily a failure of the device under test 20 except when the test is determined to be valid. It is determined that there is a possibility that the test system 1 itself is defective.

The test control unit 226 controls the switching device 18 (FIG. 1A) according to the test procedure input from the test procedure creation unit 222, and connects the measuring device 16 and the device under test 20 based on the connection information. Let
The test control unit 226 controls the device under test control device 14 according to the test procedure input from the test procedure creation unit 222 and causes the device under test 20 to output a test signal.
Further, the test control unit 226 receives the measurement value of the test signal output from the device under test 20 from the measurement device 16 and stores the received measurement value in the test result DB 228.

Furthermore, when the test control unit 226 receives the measurement values for all the test items, the test control unit 226 notifies the result determination unit 230 to start determining whether each measurement value is normal or abnormal.
The test result DB 228 receives and stores the measurement value input from the test control unit 226.
The test result DB 228 receives and stores each determination result input from the result determination unit 230 and the cause determination unit 232 described later.

Upon receiving the measurement value determination start notification from the test control unit 226, the result determination unit 230 receives the first test information corresponding to each test item from the test information DB 224, and the measurement value of each test item from the test result DB 228. Read each.
The result determination unit 230 determines whether the measurement value is normal or abnormal based on the read first test information, and stores the determination result in the test result DB 228.
If the result determination unit 230 determines that the measurement value is abnormal, the result determination unit 230 notifies the cause determination unit 232 to start determination of the cause of the abnormality.

Furthermore, when the determination of all the measurement values is completed, the result determination unit 230 notifies the display unit 234 to display the measurement value and the determination result.
When the cause determination unit 232 receives the cause determination start notification from the result determination unit 230, the cause determination unit 232 reads the second test information corresponding to the test item from the test information DB 224, and the measurement value of the test item from the test result DB 228, respectively.
Based on the read second test information, the cause determination unit 232 determines whether the cause of the abnormality in the measured value is due to the failure of the device under test or not, and determines the determination result as the test result DB 228. To remember.

If the cause determination unit 232 determines that the cause of the abnormality in the measurement value is other than the failure of the device under test, the cause determination unit 232 reads the name of the measurement device that measured the measurement value from the test information DB 224 and stores it in the test result DB 228.
When the display unit 234 receives the display notification from the result determination unit 230, the determination result and cause of the measurement value corresponding to the measurement value from the test result DB 228 according to the execution order information of each test item input from the test procedure creation unit 222. Read the judgment result.
The display unit 234 creates a test result display screen based on the execution order information of each test item, the read measurement value, the determination result of the measurement value, and the cause determination result, and the external input via the UI unit 220. The image is displayed on the output device 126 (FIG. 1B).

[Processing of Result Determination Unit 30]
FIG. 3A is a flowchart illustrating processing of the result determination unit 30 illustrated in FIG.
Hereinafter, the process of the result determination unit 30 will be further described with reference to FIG.
As described above, when the determination start notification is received from the test control unit 226, the process of the result determination unit 30 starts.
When the process starts, as shown in FIG. 3A, in step 300 (S300), the result determination unit 30 acquires a measurement value corresponding to the test item from the test result DB 228.

In step 302 (S302), the result determination unit 30 acquires the lower limit and the upper limit of the normal reference value corresponding to the test item from the test information DB 224.
In step 304 (S304), the result determination unit 30 determines that the measurement value acquired in step 300 (S300) is within the range from the lower limit to the upper limit of the normal reference value acquired in step 302 (S302). It is determined whether or not it is “within the range of”.
That is, it is determined whether or not the measured value is larger than the lower limit of the normal reference value and smaller than the upper limit.
When it is determined that the measured value is within the range of the normal reference value, the process proceeds to S306, and otherwise, the process proceeds to S308 (described later with reference to FIG. 3B).

In step 306 (S306), the result determination unit 30 outputs a determination result that the measurement value is normal to the test result DB 228.
In step 310 (S310), the result determination unit 30 determines whether or not there is a test item whose measurement value is to be determined next from the execution order information of each test item input from the test procedure creation unit 222. .
Next, if there is a test item whose measured value is to be determined, the process proceeds to S300. Otherwise, the process ends.

[Processing of cause determination unit 32]
FIG. 3B is a flowchart showing cause determination processing (S308; FIG. 3A) by the cause determination unit 32 shown in FIG.
Hereinafter, the cause determination process by the cause determination unit 32 will be further described with reference to FIG.
In step 320 (S320), the cause determination unit 32 acquires a measurement value corresponding to the test item from the test result DB 228.
In step 322 (S322), the cause determination unit 32 acquires the lower limit and the upper limit of the effective measurement value corresponding to the test item from the test information DB 224.

In step 324 (S324), the cause determination unit 30 determines that the measurement value acquired in step 320 (S320) is within the range from the lower limit to the upper limit of the effective reference value acquired in step 322 (S322). It is determined whether or not it is “within the range of”.
That is, it is determined whether or not the measured value is larger than the lower limit of the effective reference value and smaller than the upper limit.
When it is determined that the measured value is within the range of the effective reference value, the process proceeds to S326, and otherwise, the process proceeds to S328.

In step 326 (S326), the cause determination unit 30 outputs a determination result that the measurement value is abnormal to the test result DB 228.
In step 326 (S326), since the measurement value is within the range of the effective measurement value, it means that the cause of the abnormality of the measurement value is due to the failure of the device under test.
In step 328 (S328), the cause determination unit 32 reads the name of the measurement device used for measurement of the measurement value from the test information DB 224.

In step 330 (S330), the cause determination unit 32 determines that the measurement value is abnormal and that the test item needs to be remeasured, and the name of the used measuring device acquired in step 328 (S328). Is output to the test result DB 228.
Remeasurement is necessary because the cause of the abnormality in the measured value may be due to a failure of the test system 1 itself. Therefore, after the state inspection or measurement path inspection of the measuring device 16 used for the measurement, It means that it is necessary to measure the test signal of the test apparatus 20.

[Example of overall operation of test system 1]
Hereinafter, an example of the entire operation of the test system 1 (FIG. 1A) will be described.
The control device 12 receives test information of each test item input from the outside, and stores it for each test item.
The control device 12 controls the switching device 18 according to a test procedure created based on a plurality of test items input from the outside, and connects the measuring device 16 and the device under test 20.
Next, the control device 12 controls the device under test 14 according to the created test procedure, and causes the device under test 20 to output a test signal.

The device under test control device 14 notifies the device under test 20 of the output of the test signal in accordance with the control from the control device 12.
The device under test 20 receives the test signal output notification from the device under test control device 14 and outputs a test signal to the measuring device 16 connected via the switching device 18.
The measuring device 16 receives a test signal input from the device under test 20 connected via the switching device 18, and outputs a measured value of the test signal to the control device 12.

The control device 12 receives the measurement value input from the measurement device 16 and stores it.
When receiving the measurement values for all the test items from the measurement device 16, the control device 12 determines whether the measurement values are normal or abnormal based on each measurement value and the corresponding test information.
Further, when the measured value is abnormal, the control device 12 determines whether the cause is due to the failure of the device under test or the other based on the test information.

FIG. 4B is a diagram illustrating a test result screen displayed by the control device 12.
The control device 12 displays information based on the cause determination result according to the measurement value of each test item, the determination result of the measurement value, and the cause determination result.
For example, as shown in FIG. 4 (B), the measured value in test item 1 is 65, and as shown in FIG. 4 (A), the lower limit and upper limit of the normal reference value in test item 1 are 50 and 80, respectively. It is.
Therefore, since the measurement value in the test item 1 is within the range of the normal reference value, the measurement result is displayed as “normal”.

Further, for example, as shown in FIG. 4B, the measurement value in the test item 2 is 50, and as shown in FIG. 4A, the lower limit and the upper limit of the normal reference value in the test item 2 are 60 respectively. And 90, and the lower and upper limits of the effective measurement value are 30 and 150, respectively.
Therefore, the measurement value in the test item 2 is not within the range of the normal reference value, but is within the range of the effective measurement value.
Therefore, although the measurement result is displayed as “abnormal”, since the cause of the abnormality is a failure of the device under test, nothing is displayed in the remarks column of FIG.

Further, for example, as shown in FIG. 4B, the measurement value in the test item 3 is 130, and as shown in FIG. 4A, the upper limit and the lower limit of the normal reference value in the test item 3 are 0 and 0, respectively. 90, and the lower and upper limits of the effective measurement value are 0 and 120, respectively.
Therefore, the measurement value in the test item 3 is not within the range of the normal reference value and is not within the range of the effective measurement value.
Therefore, the measurement result is displayed as “abnormal”, and furthermore, the cause of the abnormality may be a malfunction of the test system 1 itself. Therefore, the remarks column in FIG. Information is displayed.

Specifically, as shown in FIG. 4B, the remarks column corresponding to test item 3 indicates that the measured value is not within the range of effective measured values, and the measurement device used for the measurement in test item 3. The state inspection and measurement path of C are inspected, and a message indicating that remeasurement should be performed is displayed.
For example, as shown in FIG. 4B, when the measurement result is abnormal or when the remarks column is displayed, the measurement result column or the remarks column is filled with diagonal lines.

FIG. 1A is a diagram illustrating a configuration of a test system according to the present invention, and FIG. 1B is a diagram illustrating a hardware configuration of a control device and a control device for a device under test. FIG. 2 is a diagram exemplifying a configuration of a control device program executed on the control device of FIGS. 1 (A) and 1 (B). FIG. 3A is a flowchart showing processing of the result determination unit shown in FIG. 2, and FIG. 3B is a flowchart showing processing of the cause determination unit shown in FIG. 4A is a diagram illustrating a table for managing the test information stored in the test information DB illustrated in FIG. 2 for each test item. FIG. 4B is a diagram illustrating the display unit illustrated in FIG. It is a figure which illustrates the test result screen to display.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Test system 10 ... Network 12 ... Control apparatus 120 ... Information processing apparatus 122 ... Memory 124 ... CPU
126 ... external input / output device 128 ... communication device 130 ... recording device 132 ... recording medium 14 ... control device for device under test 16 ... measuring device 18 ... switching device 20. ..Device under test 22 ... Control device program 220 ... UI unit 222 ... Test procedure creation unit 224 ... Test information DB
226 ... Test control unit 228 ... Test result DB
230 ... Result determination unit 232 ... Cause determination unit 234 ... Display unit

Claims (1)

An apparatus test system that performs one or more tests according to settings for one or more devices under test to be tested,
First test information for determining whether or not the test result is normal and second test information for determining whether or not the test is valid are stored for each test. Test information storage means;
A result determination means for determining whether or not the result of the test is abnormal based on the stored first test information;
When it is determined that the result of the test is abnormal, a cause determination unit that determines the cause of the abnormality of the test result based on the stored second test information;
An apparatus test system comprising: display means for displaying the test result and the determination result by the result determination means, and further displaying information based on the cause determination result according to the determination result by the cause determination means.

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