JP2010064947A - Method for producing group iii nitride semiconductor crystal, and apparatus for producing group iii nitride semiconductor - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for producing a group III nitride semiconductor crystal in which a low quality crystal is not grown during the temperature decrease after the completion of crystal growth by a flux method, and to provide an apparatus for producing a group III nitride semiconductor. <P>SOLUTION: The apparatus for producing a group III nitride semiconductor has a melt feeder 17 for feeding an Na melt with which Si is mixed to a mixed melt 14 in a crucible 11. After the completion of the growth of a GaN crystal, the Na melt with which Si is mixed is fed to the mixed melt 14 by the melt feeder 17 before the temperature is decreased. Since Si has an effect to prevent the crystal growth of GaN, the growth of the GaN crystal stops at the stage where Si is introduced into the mixed melt 14. As a result, a low quality crystal is not grown during the temperature decrease. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a method for producing a group III nitride semiconductor crystal by a flux method using an alkali metal, and a group III nitride semiconductor production apparatus.

  Conventionally, a method for growing a group III nitride semiconductor crystal by the Na flux method is known. In this method, Na (sodium) and Ga (gallium) are melted and maintained at about 800 ° C., and reacted with nitrogen under a pressure of several tens of atmospheres to grow GaN (gallium nitride) on the seed crystal surface. is there.

Patent Document 1 shows that an oxide or hydroxide inhibits crystal growth when a group III nitride semiconductor crystal is grown by the Na flux method.
JP 2008-69028 A

  However, in the conventional method for producing a group III nitride semiconductor crystal by the Na flux method, when the temperature is lowered while holding the crystal grown in the mixed melt after the completion of the crystal growth, the temperature is lower than a suitable growth temperature. There was a problem that crystal growth occurred and a low-quality crystal was formed.

  Accordingly, an object of the present invention is to provide a group III nitride semiconductor crystal manufacturing method and a group III nitride semiconductor manufacturing apparatus in which low quality crystals do not grow when the temperature is lowered.

  A first invention relates to a method for producing a group III nitride semiconductor crystal in which a mixed melt containing at least a group III metal and an alkali metal is reacted with a gas containing at least nitrogen to grow a group III nitride semiconductor crystal. The method for producing a group III nitride semiconductor crystal is characterized in that when the crystal growth is terminated, a substance that inhibits the crystal growth is supplied into the mixed melt, and then the temperature is lowered.

  The alkali metal is usually Na, but K (potassium) can also be used. Moreover, you may mix 2 group metals, such as Mg (magnesium) and Ca (calcium), Li (lithium), carbon, etc. Further, the gas containing nitrogen refers to a single or mixed gas containing nitrogen molecule or nitrogen compound gas, and may contain an inert gas such as a rare gas.

  The substance that inhibits growth is, for example, a simple substance of Si, a compound containing Si, or a compound containing oxygen, such as a simple substance of oxygen, an oxide, or a hydroxide.

  Further, the substance that inhibits the growth may be supplied by mixing with Ga melt, Na melt, Ga and Na mixed melt, or the like. When the substance that inhibits growth is a gas, it may be mixed with nitrogen and supplied.

  According to a second invention, in the group III nitride semiconductor crystal according to the first invention, the substance that inhibits crystal growth is a simple substance of Si, a compound containing Si, or a simple substance of oxygen or a compound containing oxygen. It is a manufacturing method.

  According to a third invention, in the first invention or the second invention, the substance that inhibits crystal growth is mixed and supplied to a mixed melt containing a Group III metal melt, an alkali metal melt, or both. This is a method for producing a Group III nitride semiconductor crystal.

  According to a fourth invention, there is provided a group III nitride semiconductor manufacturing apparatus for crystal growth of a group III nitride semiconductor by reacting a mixed melt containing at least a group III metal and an alkali metal with a gas containing at least nitrogen. A group III nitride semiconductor manufacturing apparatus having a supply pipe for supplying a substance that inhibits growth.

  A fifth invention is the group III nitride semiconductor manufacturing apparatus according to the fourth invention, wherein the substance that inhibits crystal growth is a simple substance of Si or a compound containing Si.

  According to a sixth invention, in the fourth or fifth invention, the supply pipe mixes a substance that inhibits crystal growth into a mixed melt containing a Group III metal melt, an alkali metal melt, or both. A group III nitride semiconductor manufacturing apparatus, characterized in that:

  As in the first aspect of the invention, by introducing a substance that inhibits the crystal growth of the group III nitride semiconductor before the crystal growth is finished and the temperature is lowered, a low quality crystal grows at the time of the temperature fall. Can be prevented. As a result, a high-quality group III nitride semiconductor crystal can be obtained.

  In addition, as in the second invention, the substance that inhibits crystal growth can be a simple substance of Si or a compound containing Si.

  Further, as in the third aspect of the invention, if a substance that inhibits crystal growth is mixed with a mixed melt containing a group III metal melt, an alkali metal melt, or both, crystal growth can easily occur in the mixed melt. Can be introduced.

  Further, according to the Group III nitride semiconductor manufacturing apparatus of the fourth to sixth inventions, a substance that inhibits the crystal growth of the Group III nitride semiconductor can be supplied before the temperature is lowered. Semiconductor crystals can be manufactured.

  Hereinafter, specific examples of the present invention will be described with reference to the drawings. However, the present invention is not limited to the examples.

  FIG. 1 is a diagram showing a configuration of a group III nitride semiconductor manufacturing apparatus. The group III nitride semiconductor manufacturing apparatus is a reaction vessel 10, a mixed melt 14 of Ga and Na, a crucible 11 for holding a seed crystal 13, and heating for heating the reaction vessel 10. The apparatus 12, the supply pipe 16 for supplying nitrogen into the reaction vessel 10, the melt supply device 17 for supplying Na melt mixed with Si into the crucible 11, and the atmosphere inside the reaction vessel 10 are exhausted to the outside. And an exhaust pipe 19.

  The reaction vessel 10 is made of cylindrical stainless steel and has pressure resistance and heat resistance. A crucible 11 is arranged inside the reaction vessel 10.

  The crucible 11 is made of BN (boron nitride) and disposed inside the reaction vessel 10. A mixed melt 14 of Ga and Na is held inside the crucible 11.

  The seed crystal 13 may be a GaN substrate, or a template substrate obtained by growing GaN on a heterogeneous substrate such as sapphire by the MOCVD method or the like. In addition, substrates having various plane orientations such as c-plane, a-plane, and m-plane can be used.

  The supply pipe 16 is provided with a valve 16v, and the supply amount of nitrogen is controlled by the valve 16v. The exhaust pipe 19 is provided with a valve 19v for controlling the exhaust amount from the reaction vessel 10.

  The melt supply device 17 supplies Na melt obtained by mixing Si into the mixed melt 14 held in the crucible 11 through the supply pipe 18. The mixing ratio of Si may be an arbitrary value. The supply pipe 18 is provided with a valve 18v for adjusting the amount of Na melt supplied.

  Next, the manufacturing process of the GaN crystal using this group III nitride semiconductor manufacturing apparatus will be described.

  First, seed crystal 13 and predetermined amounts of Ga and Na are put in crucible 11, crucible 11 is placed in reaction vessel 10, and reaction vessel 10 is covered and sealed. A series of these operations is performed in a glove box filled with an inert gas such as argon so that Ga and Na are not oxidized.

  Next, the valve 16v of the supply pipe 16 and the valve 19v of the exhaust pipe 19 are opened to supply nitrogen into the reaction vessel 10, and the pressure is increased to 4.5 to 4.7 MPa by adjusting the valves 16v and 19v.

  And it heats up to 800-900 degreeC with the heating apparatus 12, and maintains this pressure and temperature for 100 hours or more. Thereby, a GaN crystal is grown on the surface of the seed crystal 13. It is desirable to provide a rotation device for supporting and rotating the crucible in the group III nitride semiconductor manufacturing apparatus so that the crucible 11 is rotated by the rotation device during crystal growth. Since the mixed melt 14 is agitated by the rotation of the crucible 11, GaN can be grown uniformly.

  Next, the valve 18v of the supply pipe 18 is opened, and the Na melt obtained by mixing Si into the mixed melt 14 in the crucible 11 is supplied by the melt supply device 17. Since Si has an effect of inhibiting the growth of GaN crystals, the growth of GaN crystals stops when Si is mixed in the mixed melt 14. The amount of Si may be extremely small, and if it is contained in an amount of 0.01 mol% or more with respect to the mixed melt 14, an effect of sufficiently inhibiting crystal growth can be obtained. As for the addition range of Si, 0.01-1 mol% is desirable. If the amount is less than 0.01 mol%, low quality GaN is partially grown, which is not desirable. If the amount is more than 1 mol%, a large amount of Si remains, which is not desirable. More desirable is the range of 0.1 to 0.5 mol%.

  Next, heating by the heating device 12 is stopped, and the temperature is lowered to room temperature. Here, since the growth of the GaN crystal is stopped by the introduction of Si, the low-quality GaN crystal does not grow during the temperature lowering as in the prior art.

  Next, after reducing the pressure to normal pressure, the reaction vessel 10 is opened and the crucible 11 is taken out. Then, the mixed melt 14 remaining in the crucible 11 is removed, and the GaN crystal grown on the seed crystal 13 is taken out. Further, after that, the GaN substrate can be obtained by cutting the seed crystal 13 portion with a wire or the like and performing polishing or the like.

  As described above, in the GaN crystal manufacturing method of Example 1, Si is introduced into the mixed melt at the end of growth, so that low-quality crystals do not grow when the temperature is lowered, so that high-quality GaN crystals are obtained. It is done.

  In the embodiment, Si is mixed and supplied to the Na melt, but it may be mixed and supplied to the Ga melt, or Si may be mixed and supplied to the mixed melt of Na and Ga. You may make it do. Further, instead of mixing Si alone, a compound containing Si as a constituent element may be mixed and supplied. A gas containing Si as a constituent element such as silane may be mixed with nitrogen and supplied.

  In the embodiment, Si is introduced into the mixed melt to inhibit crystal growth. However, substances other than Si that inhibit crystal growth may be introduced. For example, crystal growth of GaN can be inhibited by a compound containing oxygen such as an oxide or a hydroxide.

  In the embodiments, a method for producing a GaN crystal is described. However, the present invention is not limited to GaN, and can be applied to a method for producing a group III nitride semiconductor crystal such as AlGaN, InGaN, and AlGaInN.

  In the embodiment, Na is used as the flux, but other alkali metals such as Li and K, alkaline earth metals such as Mg and Ca, and mixtures thereof can be used. Further, carbon or the like may be mixed in order to promote crystal growth or suppress generation of miscellaneous crystals.

  The group III nitride semiconductor crystal obtained by the present invention can be used as a growth substrate for manufacturing semiconductor devices.

The figure which showed the structure of the group III nitride semiconductor manufacturing apparatus.

Explanation of symbols

10: reaction vessel 11: crucible 12: heating device 13: seed crystal 14: mixed melt 16, 18: supply pipe 17: melt supply device 19: exhaust pipe

Claims (6)

In a method for producing a Group III nitride semiconductor crystal, a Group III nitride semiconductor crystal is grown by reacting a mixed melt containing at least a Group III metal and an alkali metal with a gas containing at least nitrogen.
When terminating crystal growth, a substance that inhibits crystal growth is supplied into the mixed melt, and then the temperature is lowered.
A method for producing a group III nitride semiconductor crystal characterized by the above.   2. The method for producing a group III nitride semiconductor crystal according to claim 1, wherein the substance that inhibits crystal growth is a simple substance of Si, a compound containing Si, or a simple substance of oxygen or a compound containing oxygen.   3. The substance according to claim 1, wherein the substance that inhibits crystal growth is supplied by being mixed with a Group III metal melt, an alkali metal melt, or a mixed melt containing both. A method for producing a group III nitride semiconductor crystal. In a Group III nitride semiconductor manufacturing apparatus for crystal growth of a Group III nitride semiconductor by reacting a mixed melt containing at least a Group III metal and an alkali metal with a gas containing at least nitrogen,
A group III nitride semiconductor manufacturing apparatus having a supply pipe for supplying a substance that inhibits crystal growth.   5. The group III nitride semiconductor manufacturing apparatus according to claim 4, wherein the substance that inhibits crystal growth is a simple substance of Si or a compound containing Si.   The said supply pipe | tube mixes and supplies the substance which inhibits the said crystal growth to a group III metal melt, an alkali metal melt, or the said mixed melt, The Claim 4 or Claim 5 characterized by the above-mentioned. Group III nitride semiconductor manufacturing equipment.

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