JP2010055643A5 - - Google Patents

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JP2010055643A5
JP2010055643A5 JP2009277919A JP2009277919A JP2010055643A5 JP 2010055643 A5 JP2010055643 A5 JP 2010055643A5 JP 2009277919 A JP2009277919 A JP 2009277919A JP 2009277919 A JP2009277919 A JP 2009277919A JP 2010055643 A5 JP2010055643 A5 JP 2010055643A5
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JP
Japan
Prior art keywords
measuring instrument
inspection data
identification information
calibration
unit
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JP2009277919A
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Japanese (ja)
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JP2010055643A (en
JP5066165B2 (en
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Priority to JP2009277919A priority Critical patent/JP5066165B2/en
Priority claimed from JP2009277919A external-priority patent/JP5066165B2/en
Publication of JP2010055643A publication Critical patent/JP2010055643A/en
Publication of JP2010055643A5 publication Critical patent/JP2010055643A5/ja
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Publication of JP5066165B2 publication Critical patent/JP5066165B2/en
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製品の所定の検査項目に関して測定された物理量とその物理量の測定に用いられた計測器の識別情報とを関連付けて蓄積した検査データDBと、An inspection data DB in which a physical quantity measured with respect to a predetermined inspection item of a product and identification information of a measuring instrument used for the measurement of the physical quantity are associated and accumulated;
前記計測器の識別情報とその計測器の校正有効期限情報とを関連付けて蓄積した校正計測器DBと、A calibration measuring instrument DB that stores the identification information of the measuring instrument and the calibration expiration date information of the measuring instrument in association with each other;
を備えてなる検査データ管理装置であって、An inspection data management device comprising:
前記校正計測器DBには、前記計測器の識別情報に対し、前記計測器の校正証明書識別情報、ならびに、前記計測器の校正に用いられた標準器の名称、識別情報および校正有効期限情報を関連付けた情報が、さらに、蓄積されていることIn the calibration measuring instrument DB, with respect to the identification information of the measuring instrument, the calibration certificate identification information of the measuring instrument, and the name, identification information and calibration expiration date information of the standard instrument used for the calibration of the measuring instrument That the information associated with is further accumulated
を特徴とする検査データ管理装置。Inspection data management device characterized by this.
製品の所定の検査項目に関する物理量を測定する計測部、A measurement unit that measures physical quantities related to predetermined inspection items of the product,
前記計測部によって測定された物理量を外部の装置へ出力するデータ出力部、および、A data output unit that outputs the physical quantity measured by the measurement unit to an external device; and
自身が付設された計測器の計測器識別情報をメモリに記憶し、前記記憶した計測器識別情報を外部の装置へ送信するICタグ、An IC tag for storing measuring instrument identification information of a measuring instrument attached to the memory in a memory, and transmitting the stored measuring instrument identification information to an external device;
を備えてなる計測器と、A measuring instrument comprising:
前記計測器のデータ出力部から出力される前記計測部によって測定された物理量を、前記製品の検査データとして入力する検査データ入力部、An inspection data input unit for inputting the physical quantity measured by the measurement unit output from the data output unit of the measuring instrument as the inspection data of the product;
前記ICタグから送信される前記計測器識別情報を受信するICタグリーダ、An IC tag reader that receives the measuring device identification information transmitted from the IC tag;
前記検査データ入力部を介して入力される検査データを前記検査項目と対応付けて表示する表示部、A display unit for displaying inspection data input via the inspection data input unit in association with the inspection item;
所定の通信ネットワークに接続された対サーバ通信部、および、A server-to-server communication unit connected to a predetermined communication network; and
前記検査データ入力部、前記ICタグリーダまたは前記対サーバ通信部を介して入出力されるデータを処理する情報処理部、An information processing unit for processing data input / output via the inspection data input unit, the IC tag reader or the server communication unit;
を備えてなる検査データ入力端末と、An inspection data input terminal comprising:
前記通信ネットワークに接続され、前記通信ネットワークを介して前記対サーバ通信部との間でデータの送受信を行う対端末通信部、A terminal communication unit that is connected to the communication network and transmits / receives data to / from the server communication unit via the communication network;
前記製品の検査データに対し、前記検査データの物理量を測定した計測器の計測器識別情報を少なくとも関連付けたデータを蓄積する検査データDB、Inspection data DB for storing data associated with at least measuring instrument identification information of a measuring instrument that has measured a physical quantity of the inspection data with respect to the inspection data of the product,
前記計測器の計測器識別情報に対して、前記計測器の校正有効期限情報を関連付けたデータをあらかじめ蓄積した校正計測器DB、および、A calibration measuring instrument DB in which data relating the calibration expiration date information of the measuring instrument is stored in advance with respect to the measuring instrument identification information of the measuring instrument, and
前記検査データDBまたは前記校正計測器DBに対するデータ蓄積またはデータ参照を実行するとともに、前記対端末通信部を介して入出力される前記データ蓄積またはデータ参照に係るデータを処理する情報処理部、An information processing unit that performs data accumulation or data reference with respect to the inspection data DB or the calibration measuring instrument DB, and processes data related to the data accumulation or data reference input / output via the terminal communication unit,
を備えてなる検査データ管理装置と、An inspection data management device comprising:
を含んで構成された検査データ管理システムにおける検査データ管理装置であって、An inspection data management device in an inspection data management system configured to include:
前記検査データ管理装置は、さらに、The inspection data management device further includes:
前記計測器の計測器識別情報に対して、前記計測器の校正証明書識別情報、ならびに、前記計測器の校正に用いられた標準器の名称、識別情報、および、校正有効期限を関連付けた情報を、前記校正計測器DBに蓄積していることInformation relating to the measurement instrument identification information of the measurement instrument, the calibration certificate identification information of the measurement instrument, and the name, identification information, and calibration expiration date of the standard used for calibration of the measurement instrument Is stored in the calibration measuring instrument DB
を特徴とする検査データ管理装置。Inspection data management device characterized by this.
JP2009277919A 2009-12-07 2009-12-07 Inspection data management device Expired - Fee Related JP5066165B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009277919A JP5066165B2 (en) 2009-12-07 2009-12-07 Inspection data management device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009277919A JP5066165B2 (en) 2009-12-07 2009-12-07 Inspection data management device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2005164680A Division JP4500216B2 (en) 2005-06-03 2005-06-03 Inspection data management system and inspection data input terminal

Publications (3)

Publication Number Publication Date
JP2010055643A JP2010055643A (en) 2010-03-11
JP2010055643A5 true JP2010055643A5 (en) 2010-04-22
JP5066165B2 JP5066165B2 (en) 2012-11-07

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013084087A (en) * 2011-10-07 2013-05-09 Ihi Corp Data management device
JP6430263B2 (en) * 2015-01-19 2018-11-28 株式会社日立製作所 Abnormality diagnosis analyzer
JP6767786B2 (en) * 2016-06-21 2020-10-14 株式会社Kmc Measurement support system and measurement support method
JP6800031B2 (en) * 2016-10-06 2020-12-16 株式会社東日製作所 Torque Wrench
JP6439028B1 (en) * 2017-11-30 2018-12-19 シスメックス株式会社 Reagent kit, method for producing reagent kit, and method for associating measurement results
EP4375633A3 (en) * 2018-05-22 2024-07-24 Eupry ApS System for monitoring an environment
JP7553442B2 (en) * 2019-06-28 2024-09-18 株式会社堀場製作所 Management system, maintenance schedule determination method and computer program
JP2021185470A (en) * 2020-05-25 2021-12-09 富士フイルムビジネスイノベーション株式会社 Information processing device, and program
JP7457601B2 (en) * 2020-08-12 2024-03-28 株式会社日立製作所 Factor estimation device, factor estimation system and program
US12025687B2 (en) * 2021-08-06 2024-07-02 Rohde & Schwarz Gmbh & Co. Kg System for calibration management and method of managing calibration

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JP2003178390A (en) * 2001-12-11 2003-06-27 Toshiba Eng Co Ltd Measurement data determination system and measuring instrument calibration system
JP4196680B2 (en) * 2003-01-08 2008-12-17 セイコーエプソン株式会社 Measurement support device, measurement support system, and manufacturing support system including the same

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