JP2010050129A - Organic electroluminescent element and manufacturing method thereof - Google Patents
Organic electroluminescent element and manufacturing method thereof Download PDFInfo
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- JP2010050129A JP2010050129A JP2008210488A JP2008210488A JP2010050129A JP 2010050129 A JP2010050129 A JP 2010050129A JP 2008210488 A JP2008210488 A JP 2008210488A JP 2008210488 A JP2008210488 A JP 2008210488A JP 2010050129 A JP2010050129 A JP 2010050129A
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Landscapes
- Electroluminescent Light Sources (AREA)
Abstract
Description
本発明は有機エレクトロルミネッセンス素子に関する。詳しくは、ウェットプロセスのような簡便なプロセスでも製造可能であり、発光効率と寿命が改善された有機エレクトロルミネッセンス素子およびその製造方法に関する。 The present invention relates to an organic electroluminescence element. More specifically, the present invention relates to an organic electroluminescent element that can be manufactured by a simple process such as a wet process and has improved luminous efficiency and lifetime, and a method for manufacturing the same.
発光型の電子ディスプレイデバイスとして、エレクトロルミネッセンスディスプレイ(以下、ELDと略記する)がある。ELDの構成要素としては、無機エレクトロルミネッセンス素子(以下、無機EL素子ともいう)や有機エレクトロルミネッセンス素子(以下、有機EL素子ともいう)が挙げられる。無機EL素子は平面型光源として使用されてきたが、発光素子を駆動させるためには交流の高電圧が必要である。 As a light-emitting electronic display device, there is an electroluminescence display (hereinafter abbreviated as ELD). As a constituent element of ELD, an inorganic electroluminescence element (hereinafter also referred to as an inorganic EL element) and an organic electroluminescence element (hereinafter also referred to as an organic EL element) can be given. Inorganic EL elements have been used as planar light sources, but an alternating high voltage is required to drive the light emitting elements.
一方、有機エレクトロルミネッセンス素子は、発光する化合物を含有する発光層を、陰極と陽極で挟んだ構成を有し、発光層に電子および正孔を注入して、再結合させることにより励起子(エキシトン)を生成させ、このエキシトンが失活する際の光の放出(蛍光・燐光)を利用して発光する素子であり、数V〜数十V程度の電圧で発光が可能であり、更に自己発光型であるために視野角に富み、視認性が高く、薄膜型の完全固体素子であるために省スペース、携帯性等の観点から注目されている。 On the other hand, an organic electroluminescence device has a structure in which a light emitting layer containing a compound that emits light is sandwiched between a cathode and an anode, and injects electrons and holes into the light emitting layer and recombines them to exciton (exciton). ), Which emits light by using light emission (fluorescence / phosphorescence) when the exciton is deactivated, and can emit light at a voltage of several V to several tens of V, and further self-emission. Since it is a type, it has a wide viewing angle, high visibility, and since it is a thin-film type completely solid element, it has attracted attention from the viewpoints of space saving, portability, and the like.
また、有機エレクトロルミネッセンス素子は、従来実用に供されてきた主要な光源、例えば、発光ダイオードや冷陰極管と異なり、面光源であることも大きな特徴である。この特性を有効に活用できる用途として、照明用光源や様々なディスプレイのバックライトがある。特に近年、需要の増加が著しい液晶フルカラーディスプレイのバックライトとして用いることも好適である。 Another major feature of the organic electroluminescence element is that it is a surface light source, unlike main light sources that have been put to practical use, such as light-emitting diodes and cold-cathode tubes. Applications that can effectively utilize this characteristic include illumination light sources and various display backlights. In particular, it is also suitable to be used as a backlight of a liquid crystal full color display whose demand has been increasing in recent years.
有機エレクトロルミネッセンス素子をこのような照明用光源、あるいはディスプレイのバックライトとして実用する為の課題として発光効率および寿命の向上が挙げられる。一方、これら有機エレクトロルミネッセンス素子の製造方法としては、蒸着法、ウェットプロセス(スピンコート法、キャスト法、インクジェット法、スプレー法、印刷法)等があるが、真空プロセスを必要とせず、連続生産が簡便であるという理由で近年はウェットプロセスにおける製造方法が注目されている。すなわち、ウェットプロセスで製造された有機エレクトロルミネッセンス素子においても発光効率および寿命の向上が求められている。ウェットプロセスで複数層からなる有機エレクトロルミネッセンス素子を製造する場合、先に製膜した層の不溶化が必要となる。反応性有機化合物を塗布後に硬化して有機溶媒不要の膜を形成する技術が開示されている(例えば、特許文献1,2参照。)が、これらの実施形態は、硬化させるエネルギーを加熱のみに頼っており、熱のみで硬化を充分なものにするためには高温に長時間曝す必要があり、生産性が劣るだけでなく、Tgを大きく超える温度に長時間曝すことで膜の結晶化等が生じることでモロフォルジーを大きく損ない、均一な膜を形成することが非常に困難である。一方、光照射で硬化する場合、充分な硬化を得るためには大きなエネルギーが必要となり、材料に与えるダメージが大きく、分解による不純物精製の問題がある。これを改善する為に、微量の重合開始剤を添加する方法もあるが、この場合、膜中に残留した微量の重合開始剤が発光素子の寿命に対して大きな劣化因子となる。また、光のみで硬化した場合、膜収縮による表面の凹凸が発生し、この状態で積層して素子を作製しても充分な性能が得られないことがわかった。
本発明は、上記課題に鑑みなされたものであり、その目的は、白色発光効率が改善された有機エレクトロルミネッセンス素子、更にはウェットプロセスのような簡便なプロセスでも製造可能な有機エレクトロルミネッセンス素子を提供することにある。 The present invention has been made in view of the above problems, and an object of the present invention is to provide an organic electroluminescent device with improved white light emission efficiency, and further an organic electroluminescent device that can be manufactured by a simple process such as a wet process. There is to do.
本発明の上記目的は下記の構成により達成される。 The above object of the present invention can be achieved by the following constitution.
1.基板上に少なくとも陽極、陰極、および該陽極、陰極間に挟まれた発光層および正孔輸送層を少なくとも有する有機エレクトロルミネッセンス素子において、少なくとも一層が反応性有機化合物を含有し、製膜後に反応させることで形成され、反応前の表面粗さRa1および表面凹凸差Rt1と反応後の表面粗さRa2および表面凹凸差Rt2が下記関係にあることを特徴とする有機エレクトロルミネッセンス素子。 1. In an organic electroluminescence device having at least an anode, a cathode, and a light emitting layer and a hole transport layer sandwiched between the anode and cathode on a substrate, at least one layer contains a reactive organic compound and is reacted after film formation An organic electroluminescence device, wherein the surface roughness Ra1 and surface unevenness difference Rt1 before reaction and the surface roughness Ra2 and surface unevenness difference Rt2 after reaction are in the following relationship:
Ra2−Ra1<0.3nm
Rt2−Rt1<5.0nm
2.前記反応性有機化合物が下記部分構造の何れかを有する化合物であることを特徴とする前記1記載の有機エレクトロルミネッセンス素子。
Ra2-Ra1 <0.3nm
Rt2-Rt1 <5.0nm
2. 2. The organic electroluminescence device as described in 1 above, wherein the reactive organic compound is a compound having any one of the following partial structures.
3.前記反応性有機化合物が下記一般式(1)で表される正孔輸送材料であることを特徴とする前記1または2に記載の有機エレクトロルミネッセンス素子。 3. 3. The organic electroluminescence device as described in 1 or 2 above, wherein the reactive organic compound is a hole transport material represented by the following general formula (1).
〔式中、Ar1〜Ar5は置換又は無置換のフェニル基またはナフチル基を表す。Ar1〜Ar5の少なくとも一つに下記部分構造を含む置換基を含む。nは1または2の整数を表す。〕 [In formula, Ar < 1 > -Ar < 5 > represents a substituted or unsubstituted phenyl group or a naphthyl group. At least one of Ar 1 to Ar 5 contains a substituent containing the following partial structure. n represents an integer of 1 or 2. ]
4.前記1〜3の何れか1項に記載の有機エレクトロルミネッセンス素子の製造方法であって、前記反応性有機化合物を反応させる手段が加熱しながら紫外線を照射することであることを特徴とする有機エレクトロルミネッセンス素子の製造方法。 4). 4. The method for producing an organic electroluminescent element according to any one of 1 to 3, wherein the means for reacting the reactive organic compound is irradiation with ultraviolet rays while heating. Manufacturing method of luminescence element.
5.前記加熱の温度Tが、反応性有機化合物のガラス転移温度Tgに対して以下の関係にあることを特徴とする前記4に記載の有機エレクトロルミネッセンス素子の製造方法。 5. 5. The method for producing an organic electroluminescent element according to 4 above, wherein the heating temperature T is in the following relationship with respect to the glass transition temperature Tg of the reactive organic compound.
Tg<T<Tg+100℃
6.前記反応性有機化合物を含む層がウェットプロセスで形成されることを特徴とする前記4または5に記載の有機エレクトロルミネッセンス素子の製造方法。
Tg <T <Tg + 100 ° C.
6). 6. The method for producing an organic electroluminescent element according to 4 or 5, wherein the layer containing the reactive organic compound is formed by a wet process.
反応性有機化合物を用い、硬化の際の加熱と光照射をバランスさせることにより、硬化前後の表面粗さの差及び表面凹凸差の差をコントロールすることにより、優れた性能を有する有機エレクトロルミネッセンス素子を得ることができた。 An organic electroluminescence device with excellent performance by controlling the difference in surface roughness before and after curing and the difference in surface unevenness by using a reactive organic compound and balancing heating and light irradiation during curing. Could get.
以下、本発明の有機エレクトロルミネッセンス素子(以下、本発明の有機EL素子ともいう)の各構成要素の詳細について、順次説明する。 Hereinafter, the details of each component of the organic electroluminescence device of the present invention (hereinafter also referred to as the organic EL device of the present invention) will be sequentially described.
《有機EL素子の層構成》
次に、本発明の有機EL素子の層構成の好ましい具体例を以下に示すが、本発明はこれらに限定されない。
<< Layer structure of organic EL element >>
Next, although the preferable specific example of the layer structure of the organic EL element of this invention is shown below, this invention is not limited to these.
(i)陽極/正孔輸送層/中間層/発光層/電子輸送層/陰極
(ii)陽極/正孔輸送層/中間層/発光層/正孔阻止層/電子輸送層/陰極
(iii)陽極/正孔輸送層/中間層/発光層/正孔阻止層/電子輸送層/陰極バッファー層/陰極
(iv)陽極/陽極バッファー層/正孔輸送層/中間層/発光層/正孔阻止層/電子輸送層/陰極バッファー層/陰極
《発光層》
本発明に係る発光層は、電極または電子輸送層、正孔輸送層から注入されてくる電子及び正孔が再結合して発光する層であり、発光する部分は発光層の層内であっても発光層と隣接層との界面であってもよい。
(I) Anode / hole transport layer / intermediate layer / light emitting layer / electron transport layer / cathode (ii) Anode / hole transport layer / intermediate layer / light emitting layer / hole blocking layer / electron transport layer / cathode (iii) Anode / hole transport layer / intermediate layer / light emitting layer / hole blocking layer / electron transport layer / cathode buffer layer / cathode (iv) Anode / anode buffer layer / hole transport layer / intermediate layer / light emitting layer / hole blocking Layer / electron transport layer / cathode buffer layer / cathode << light emitting layer >>
The light emitting layer according to the present invention is a layer that emits light by recombination of electrons and holes injected from the electrode, the electron transport layer, or the hole transport layer, and the light emitting portion is in the layer of the light emitting layer. May be the interface between the light emitting layer and the adjacent layer.
発光層の膜厚は、特に制限はないが、形成する膜の均質性や、発光時に不必要な高電圧を印加するのを防止し、且つ、駆動電流に対する発光色の安定性向上の観点から、2nm〜200nmの範囲に調整することが好ましく、更に好ましくは5nm以上、100nm以下の範囲に調整される。 The thickness of the light emitting layer is not particularly limited, but from the viewpoint of the uniformity of the film to be formed, the application of unnecessary high voltage during light emission, and the improvement of the stability of the emission color with respect to the drive current. It is preferable to adjust to the range of 2 nm-200 nm, More preferably, it adjusts to the range of 5 nm or more and 100 nm or less.
本発明の請求項4に係る有機エレクトロルミネッセンス素子の発光層は、ウェットプロセスにより形成される。既知のウェットプロセスの塗布方法としては、スピンコート法、キャスト法、インクジェット法、スプレー法、印刷法等があるが、均質な膜が得られやすく、かつピンホールが生成しにくい等の点から、本発明においてはスピンコート法、インクジェット法、スプレー法、印刷法等の塗布法による成膜が好ましい。 The light emitting layer of the organic electroluminescent element according to claim 4 of the present invention is formed by a wet process. Examples of known wet process coating methods include spin coating, casting, inkjet, spraying, printing, etc., but it is easy to obtain a homogeneous film, and pinholes are difficult to generate. In the present invention, film formation by a coating method such as a spin coating method, an ink jet method, a spray method, or a printing method is preferable.
以下に発光層に含まれる発光ドーパント(発光ドーパント化合物ともいう)、ホスト化合物について説明する。 Hereinafter, a light-emitting dopant (also referred to as a light-emitting dopant compound) and a host compound contained in the light-emitting layer will be described.
(ホスト化合物(発光ホスト等ともいう))
本発明に用いられるホスト化合物について説明する。
(Host compound (also called luminescent host))
The host compound used in the present invention will be described.
ここで、本発明においてホスト化合物とは、発光層に含有される化合物の内でその層中での質量比が20%以上であり、且つ室温(25℃)においてリン光発光のリン光量子収率が、0.1未満の化合物と定義される。好ましくはリン光量子収率が0.01未満である。また、発光層に含有される化合物の中で、その層中での質量比が20%以上であることが好ましい。 Here, in the present invention, the host compound means a phosphorescent quantum yield of phosphorescence emission at a room temperature (25 ° C.) having a mass ratio of 20% or more in the compound contained in the light emitting layer. Is defined as a compound of less than 0.1. The phosphorescence quantum yield is preferably less than 0.01. Moreover, it is preferable that the mass ratio in the layer is 20% or more among the compounds contained in a light emitting layer.
ホスト化合物としては、公知のホスト化合物を単独で用いてもよく、または複数種併用して用いてもよい。ホスト化合物を複数種用いることで、電荷の移動を調整することが可能であり、有機EL素子を高効率化することができる。また、後述する発光ドーパントを複数種用いることで、異なる発光を混ぜることが可能となり、これにより任意の発光色を得ることができる。 As the host compound, known host compounds may be used alone or in combination of two or more. By using a plurality of types of host compounds, it is possible to adjust the movement of charges, and the organic EL element can be made highly efficient. Moreover, it becomes possible to mix different light emission by using multiple types of light emission dopants mentioned later, and, thereby, arbitrary luminescent colors can be obtained.
また、本発明に用いられる発光ホストとしては、従来公知の低分子化合物でも、繰り返し単位をもつ高分子化合物でもよく、ビニル基やエポキシ基のような重合性基を有する低分子化合物(蒸着重合性発光ホスト)でも良い。 The light emitting host used in the present invention may be a conventionally known low molecular compound or a high molecular compound having a repeating unit, and a low molecular compound having a polymerizable group such as a vinyl group or an epoxy group (deposition polymerization property). Light emitting host).
併用してもよい公知のホスト化合物としては、正孔輸送能、電子輸送能を有しつつ、且つ発光の長波長化を防ぎ、なお且つ高Tg(ガラス転移温度)である化合物が好ましい。 As a known host compound that may be used in combination, a compound that has a hole transporting ability and an electron transporting ability, prevents the emission of light from being increased in wavelength, and has a high Tg (glass transition temperature) is preferable.
公知のホスト化合物の具体例としては、以下の文献に記載されている化合物が挙げられる。 Specific examples of known host compounds include compounds described in the following documents.
特開2001−257076号公報、同2002−308855号公報、同2001−313179号公報、同2002−319491号公報、同2001−357977号公報、同2002−334786号公報、同2002−8860号公報、同2002−334787号公報、同2002−15871号公報、同2002−334788号公報、同2002−43056号公報、同2002−334789号公報、同2002−75645号公報、同2002−338579号公報、同2002−105445号公報、同2002−343568号公報、同2002−141173号公報、同2002−352957号公報、同2002−203683号公報、同2002−363227号公報、同2002−231453号公報、同2003−3165号公報、同2002−234888号公報、同2003−27048号公報、同2002−255934号公報、同2002−260861号公報、同2002−280183号公報、同2002−299060号公報、同2002−302516号公報、同2002−305083号公報、同2002−305084号公報、同2002−308837号公報等。 JP-A-2001-257076, 2002-308855, 2001-313179, 2002-319491, 2001-357777, 2002-334786, 2002-8860, 2002-334787, 2002-15871, 2002-334788, 2002-43056, 2002-334789, 2002-75645, 2002-338579, 2002-105445 gazette, 2002-343568 gazette, 2002-141173 gazette, 2002-352957 gazette, 2002-203683 gazette, 2002-363227 gazette, 2002-231453 gazette, No. 003-3165, No. 2002-234888, No. 2003-27048, No. 2002-255934, No. 2002-286061, No. 2002-280183, No. 2002-299060, No. 2002. -302516, 2002-305083, 2002-305084, 2002-308837, and the like.
(発光ドーパント)
本発明に係る発光ドーパントについて説明する。
(Luminescent dopant)
The light emitting dopant according to the present invention will be described.
本発明に係る発光ドーパントとしては、蛍光ドーパント(蛍光性化合物ともいう)、リン光ドーパント(リン光発光体、リン光性化合物、リン光発光性化合物等ともいう)を用いることができるが、より発光効率の高い有機EL素子を得る観点からは、本発明の有機EL素子の発光層に使用される発光ドーパント(単に、発光材料ということもある)としては、上記のホスト化合物を含有すると同時に、リン光ドーパントを含有することが好ましい。 As the light-emitting dopant according to the present invention, a fluorescent dopant (also referred to as a fluorescent compound) or a phosphorescent dopant (also referred to as a phosphorescent emitter, a phosphorescent compound, a phosphorescent compound, or the like) can be used. From the viewpoint of obtaining an organic EL device with high luminous efficiency, the light-emitting dopant used in the light-emitting layer of the organic EL device of the present invention (sometimes simply referred to as a light-emitting material) contains the above host compound, It is preferable to contain a phosphorescent dopant.
(リン光ドーパント)
本発明に係るリン光ドーパントについて説明する。
(Phosphorescent dopant)
The phosphorescent dopant according to the present invention will be described.
本発明に係るリン光ドーパントは、励起三重項からの発光が観測される化合物であり、具体的には、室温(25℃)にてリン光発光する化合物であり、リン光量子収率が、25℃において0.01以上の化合物であると定義されるが、好ましいリン光量子収率は0.1以上である。 The phosphorescent dopant according to the present invention is a compound in which light emission from an excited triplet is observed. Specifically, the phosphorescent dopant is a compound that emits phosphorescence at room temperature (25 ° C.) and has a phosphorescence quantum yield of 25. Although it is defined as a compound of 0.01 or more at ° C., a preferable phosphorescence quantum yield is 0.1 or more.
上記リン光量子収率は、第4版実験化学講座7の分光IIの398頁(1992年版、丸善)に記載の方法により測定できる。溶液中でのリン光量子収率は種々の溶媒を用いて測定できるが、本発明に係るリン光ドーパントは、任意の溶媒のいずれかにおいて上記リン光量子収率(0.01以上)が達成されればよい。 The phosphorescence quantum yield can be measured by the method described in Spectroscopic II, page 398 (1992 edition, Maruzen) of Experimental Chemistry Course 4 of the 4th edition. Although the phosphorescence quantum yield in a solution can be measured using various solvents, the phosphorescence dopant according to the present invention achieves the phosphorescence quantum yield (0.01 or more) in any solvent. That's fine.
リン光ドーパントの発光は原理としては2種挙げられ、一つはキャリアが輸送されるホスト化合物上でキャリアの再結合が起こってホスト化合物の励起状態が生成し、このエネルギーをリン光ドーパントに移動させることでリン光ドーパントからの発光を得るというエネルギー移動型、もう一つはリン光ドーパントがキャリアトラップとなり、リン光ドーパント上でキャリアの再結合が起こりリン光ドーパントからの発光が得られるというキャリアトラップ型であるが、何れの場合においても、リン光ドーパントの励起状態のエネルギーはホスト化合物の励起状態のエネルギーよりも低いことが条件である。 There are two types of light emission of phosphorescent dopants in principle. One is the recombination of carriers on the host compound to which carriers are transported to generate an excited state of the host compound, and this energy is transferred to the phosphorescent dopant. The energy transfer type that obtains light emission from the phosphorescent dopant, and the other is that the phosphorescent dopant becomes a carrier trap, carrier recombination occurs on the phosphorescent dopant, and light emission from the phosphorescent dopant is obtained. Although it is a trap type, in any case, it is a condition that the excited state energy of the phosphorescent dopant is lower than the excited state energy of the host compound.
リン光ドーパントは、有機EL素子の発光層に使用される公知のものの中から適宜選択して用いることができる。 The phosphorescent dopant can be appropriately selected from known materials used for the light emitting layer of the organic EL device.
本発明に係るリン光ドーパントとしては、好ましくは元素の周期表で8〜10族の金属を含有する錯体系化合物であり、更に好ましくはイリジウム化合物、オスミウム化合物、または白金化合物(白金錯体系化合物)、希土類錯体であり、中でも最も好ましいのはイリジウム化合物である。 The phosphorescent dopant according to the present invention is preferably a complex compound containing a group 8-10 metal in the periodic table of elements, more preferably an iridium compound, an osmium compound, or a platinum compound (platinum complex compound). Rare earth complexes, most preferably iridium compounds.
以下に、リン光ドーパントとして用いられる化合物の具体例を示すが、本発明はこれらに限定されない。これらの化合物は、例えば、Inorg.Chem.40巻、1704〜1711に記載の方法等により合成できる。 Although the specific example of the compound used as a phosphorescence dopant below is shown, this invention is not limited to these. These compounds are described, for example, in Inorg. Chem. 40, 1704-1711, and the like.
次に、本発明の有機EL素子の構成層として用いられる、注入層、阻止層、電子輸送層等について説明する。 Next, an injection layer, a blocking layer, an electron transport layer, and the like used as a constituent layer of the organic EL element of the present invention will be described.
《注入層:電子注入層、正孔注入層》
注入層は必要に応じて設け、電子注入層と正孔注入層があり、上記の如く陽極と発光層または正孔輸送層の間、および陰極と発光層または電子輸送層との間に存在させてもよい。
<< Injection layer: electron injection layer, hole injection layer >>
The injection layer is provided as necessary, and there are an electron injection layer and a hole injection layer, and as described above, it exists between the anode and the light emitting layer or the hole transport layer, and between the cathode and the light emitting layer or the electron transport layer. May be.
注入層とは、駆動電圧低下や発光輝度向上のために電極と有機層間に設けられる層のことで、「有機EL素子とその工業化最前線(1998年11月30日エヌ・ティー・エス社発行)」の第2編第2章「電極材料」(123〜166頁)に詳細に記載されており、正孔注入層(陽極バッファー層)と電子注入層(陰極バッファー層)とがある。 An injection layer is a layer provided between an electrode and an organic layer in order to reduce drive voltage and improve light emission luminance. “Organic EL element and its forefront of industrialization (issued by NTT Corporation on November 30, 1998) 2), Chapter 2, “Electrode Materials” (pages 123 to 166) in detail, and includes a hole injection layer (anode buffer layer) and an electron injection layer (cathode buffer layer).
陽極バッファー層(正孔注入層)は、特開平9−45479号公報、同9−260062号公報、同8−288069号公報等にもその詳細が記載されており、具体例として、銅フタロシアニンに代表されるフタロシアニンバッファー層、酸化バナジウムに代表される酸化物バッファー層、アモルファスカーボンバッファー層、ポリアニリン(エメラルディン)やポリチオフェン等の導電性高分子を用いた高分子バッファー層等が挙げられる。 The details of the anode buffer layer (hole injection layer) are described in JP-A-9-45479, JP-A-9-260062, JP-A-8-288069 and the like. As a specific example, copper phthalocyanine is used. Examples thereof include a phthalocyanine buffer layer represented by an oxide, an oxide buffer layer represented by vanadium oxide, an amorphous carbon buffer layer, and a polymer buffer layer using a conductive polymer such as polyaniline (emeraldine) or polythiophene.
陽極バッファー層(正孔注入層)は、特開平9−45479号公報、同9−260062号公報、同8−288069号公報等にもその詳細が記載されており、具体例として、銅フタロシアニンに代表されるフタロシアニンバッファー層、酸化バナジウムに代表される酸化物バッファー層、アモルファスカーボンバッファー層、ポリアニリン(エメラルディン)やポリチオフェン等の導電性高分子を用いた高分子バッファー層等が挙げられる。 The details of the anode buffer layer (hole injection layer) are described in JP-A-9-45479, JP-A-9-260062, JP-A-8-288069 and the like. As a specific example, copper phthalocyanine is used. Examples thereof include a phthalocyanine buffer layer represented by an oxide, an oxide buffer layer represented by vanadium oxide, an amorphous carbon buffer layer, and a polymer buffer layer using a conductive polymer such as polyaniline (emeraldine) or polythiophene.
また、特開平6−025658に記載されているフェロセン化合物、特開平10−233287等に記載されているスターバースト型の化合物、特開2000−068058、特開2004−6321に記載されているトリアリールアミン型の化合物、特開2002−117979に記載されている含硫黄環含有化合物、US2002−0158242、US2006−0251922、特開2006−49393等に記載されているヘキサアザトリフェニレン化合物等も正孔注入層として挙げられる。 Further, a ferrocene compound described in JP-A-6-025658, a starburst type compound described in JP-A-10-233287, a triaryl described in JP-A-2000-068058 and JP-A-2004-6321 Hole-injection layers include amine-type compounds, sulfur-containing ring-containing compounds described in JP-A No. 2002-117879, hexaazatriphenylene compounds described in US 2002-0158242, US 2006-0251922, JP-A 2006-49393, and the like. As mentioned.
陰極バッファー層(電子注入層)は、特開平6−325871号公報、同9−17574号公報、同10−74586号公報等にもその詳細が記載されており、具体的にはストロンチウムやアルミニウム等に代表される金属バッファー層、フッ化リチウムに代表されるアルカリ金属化合物バッファー層、フッ化マグネシウムに代表されるアルカリ土類金属化合物バッファー層、酸化アルミニウムに代表される酸化物バッファー層等が挙げられる。上記バッファー層(注入層)はごく薄い膜であることが望ましく、素材にもよるがその膜厚は0.1nm〜5μmの範囲が好ましい。 The details of the cathode buffer layer (electron injection layer) are described in JP-A-6-325871, JP-A-9-17574, JP-A-10-74586, and the like. Specifically, strontium, aluminum, etc. Metal buffer layer typified by lithium, alkali metal compound buffer layer typified by lithium fluoride, alkaline earth metal compound buffer layer typified by magnesium fluoride, oxide buffer layer typified by aluminum oxide, etc. . The buffer layer (injection layer) is preferably a very thin film, and the film thickness is preferably in the range of 0.1 nm to 5 μm although it depends on the material.
《阻止層:正孔阻止層、電子阻止層》
阻止層は、上記の如く有機化合物薄膜の基本構成層の他に必要に応じて設けられるものである。例えば、特開平11−204258号公報、同11−204359号公報、及び「有機EL素子とその工業化最前線(1998年11月30日エヌ・ティー・エス社発行)」の237頁等に記載されている正孔阻止(ホールブロック)層がある。
<Blocking layer: hole blocking layer, electron blocking layer>
The blocking layer is provided as necessary in addition to the basic constituent layer of the organic compound thin film as described above. For example, it is described in JP-A Nos. 11-204258, 11-204359, and “Organic EL elements and their forefront of industrialization” (issued by NTT, Inc. on November 30, 1998). There is a hole blocking (hole blocking) layer.
正孔阻止層とは広い意味では電子輸送層の機能を有し、電子を輸送する機能を有しつつ正孔を輸送する能力が著しく小さい正孔阻止材料からなり、電子を輸送しつつ正孔を阻止することで電子と正孔の再結合確率を向上させることができる。また、後述する電子輸送層の構成を必要に応じて、本発明に係わる正孔阻止層として用いることができる。 The hole blocking layer has a function of an electron transport layer in a broad sense, and is made of a hole blocking material that has a function of transporting electrons and has a remarkably small ability to transport holes. The probability of recombination of electrons and holes can be improved by blocking. Moreover, the structure of the electron carrying layer mentioned later can be used as a hole-blocking layer concerning this invention as needed.
本発明の有機EL素子の正孔阻止層は、発光層に隣接して設けられていることが好ましい。 The hole blocking layer of the organic EL device of the present invention is preferably provided adjacent to the light emitting layer.
正孔阻止層には、前述のホスト化合物として挙げたアザカルバゾール誘導体を含有することが好ましい。 The hole blocking layer preferably contains the azacarbazole derivative mentioned as the host compound.
また、本発明においては、複数の発光色の異なる複数の発光層を有する場合、その発光極大波長が最も短波にある発光層が、全発光層中、最も陽極に近いことが好ましいが、このような場合、該最短波層と該層の次に陽極に近い発光層との間に正孔阻止層を追加して設けることが好ましい。更には、該位置に設けられる正孔阻止層に含有される化合物の50質量%以上が、前記最短波発光層のホスト化合物に対しそのイオン化ポテンシャルが0.3eV以上大きいことが好ましい。 In the present invention, when a plurality of light emitting layers having different light emission colors are provided, the light emitting layer having the shortest wavelength of light emission is preferably closest to the anode among all the light emitting layers. In this case, it is preferable to additionally provide a hole blocking layer between the shortest wave layer and the light emitting layer next to the anode next to the anode. Furthermore, it is preferable that 50% by mass or more of the compound contained in the hole blocking layer provided at the position has an ionization potential of 0.3 eV or more larger than the host compound of the shortest wave emitting layer.
イオン化ポテンシャルは化合物のHOMO(最高被占分子軌道)レベルにある電子を真空準位に放出するのに必要なエネルギーで定義され、例えば下記に示すような方法により求めることができる。 The ionization potential is defined by the energy required to emit an electron at the HOMO (highest occupied molecular orbital) level of the compound to the vacuum level, and can be obtained by the following method, for example.
(1)米国Gaussian社製の分子軌道計算用ソフトウェアであるGaussian98(Gaussian98、Revision A.11.4,M.J.Frisch,et al,Gaussian,Inc.,Pittsburgh PA,2002.)を用い、キーワードとしてB3LYP/6−31G*を用いて構造最適化を行うことにより算出した値(eV単位換算値)の小数点第2位を四捨五入した値としてイオン化ポテンシャルを求めることができる。この計算値が有効な背景には、この手法で求めた計算値と実験値の相関が高いためである。 (1) Using Gaussian 98 (Gaussian 98, Revision A.11.4, MJ Frisch, et al, Gaussian, Inc., Pittsburgh PA, 2002.), a molecular orbital calculation software manufactured by Gaussian, USA The ionization potential can be obtained as a value obtained by rounding off the second decimal place of the value (eV unit converted value) calculated by performing structural optimization using B3LYP / 6-31G *. This calculation value is effective because the correlation between the calculation value obtained by this method and the experimental value is high.
(2)イオン化ポテンシャルは光電子分光法で直接測定する方法により求めることもできる。例えば、理研計器社製の低エネルギー電子分光装置「Model AC−1」を用いて、あるいは紫外光電子分光として知られている方法を好適に用いることができる。 (2) The ionization potential can also be obtained by a method of directly measuring by photoelectron spectroscopy. For example, a method known as ultraviolet photoelectron spectroscopy can be suitably used by using a low energy electron spectrometer “Model AC-1” manufactured by Riken Keiki Co., Ltd.
一方、電子阻止層とは広い意味では正孔輸送層の機能を有し、正孔を輸送する機能を有しつつ電子を輸送する能力が著しく小さい材料からなり、正孔を輸送しつつ電子を阻止することで電子と正孔の再結合確率を向上させることができる。また、後述する正孔輸送層の構成を必要に応じて電子阻止層として用いることができる。本発明に係る正孔阻止層、電子輸送層の膜厚としては、好ましくは3nm〜100nmであり、更に好ましくは5nm〜30nmである。 On the other hand, the electron blocking layer has a function of a hole transport layer in a broad sense, and is made of a material that has a function of transporting holes and has an extremely small ability to transport electrons, and transports electrons while transporting holes. By blocking, the recombination probability of electrons and holes can be improved. Moreover, the structure of the positive hole transport layer mentioned later can be used as an electron blocking layer as needed. The film thickness of the hole blocking layer and the electron transport layer according to the present invention is preferably 3 nm to 100 nm, and more preferably 5 nm to 30 nm.
《正孔輸送層》
正孔輸送層とは正孔を輸送する機能を有する正孔輸送材料からなり、広い意味で正孔注入層、電子阻止層も正孔輸送層に含まれる。正孔輸送層は単層または複数層設けることができる。
《Hole transport layer》
The hole transport layer is made of a hole transport material having a function of transporting holes, and in a broad sense, a hole injection layer and an electron blocking layer are also included in the hole transport layer. The hole transport layer can be provided as a single layer or a plurality of layers.
正孔輸送材料としては、正孔の注入または輸送、電子の障壁性のいずれかを有するものであり、有機物、無機物のいずれであってもよい。例えば、トリアゾール誘導体、オキサジアゾール誘導体、イミダゾール誘導体、ポリアリールアルカン誘導体、ピラゾリン誘導体及びピラゾロン誘導体、フェニレンジアミン誘導体、アリールアミン誘導体、アミノ置換カルコン誘導体、オキサゾール誘導体、スチリルアントラセン誘導体、フルオレノン誘導体、ヒドラゾン誘導体、スチルベン誘導体、シラザン誘導体、アニリン系共重合体、また導電性高分子オリゴマー、特にチオフェンオリゴマー等が挙げられる。 The hole transport material has any one of hole injection or transport and electron barrier properties, and may be either organic or inorganic. For example, triazole derivatives, oxadiazole derivatives, imidazole derivatives, polyarylalkane derivatives, pyrazoline derivatives and pyrazolone derivatives, phenylenediamine derivatives, arylamine derivatives, amino-substituted chalcone derivatives, oxazole derivatives, styrylanthracene derivatives, fluorenone derivatives, hydrazone derivatives, Examples thereof include stilbene derivatives, silazane derivatives, aniline copolymers, and conductive polymer oligomers, particularly thiophene oligomers.
正孔輸送材料としては上記のものを使用することができるが、ポルフィリン化合物、芳香族第3級アミン化合物およびスチリルアミン化合物、特に芳香族第3級アミン化合物を用いることが好ましい。 The above-mentioned materials can be used as the hole transport material, but it is preferable to use a porphyrin compound, an aromatic tertiary amine compound and a styrylamine compound, particularly an aromatic tertiary amine compound.
芳香族第3級アミン化合物およびスチリルアミン化合物の代表例としては、N,N,N′,N′−テトラフェニル−4,4′−ジアミノフェニル;N,N′−ジフェニル−N,N′−ビス(3−メチルフェニル)−〔1,1′−ビフェニル〕−4,4′−ジアミン(TPD);2,2−ビス(4−ジ−p−トリルアミノフェニル)プロパン;1,1−ビス(4−ジ−p−トリルアミノフェニル)シクロヘキサン;N,N,N′,N′−テトラ−p−トリル−4,4′−ジアミノビフェニル;1,1−ビス(4−ジ−p−トリルアミノフェニル)−4−フェニルシクロヘキサン;ビス(4−ジメチルアミノ−2−メチルフェニル)フェニルメタン;ビス(4−ジ−p−トリルアミノフェニル)フェニルメタン;N,N′−ジフェニル−N,N′−ジ(4−メトキシフェニル)−4,4′−ジアミノビフェニル;N,N,N′,N′−テトラフェニル−4,4′−ジアミノジフェニルエーテル;4,4′−ビス(ジフェニルアミノ)クオードリフェニル;N,N,N−トリ(p−トリル)アミン;4−(ジ−p−トリルアミノ)−4′−〔4−(ジ−p−トリルアミノ)スチリル〕スチルベン;4−N,N−ジフェニルアミノ−(2−ジフェニルビニル)ベンゼン;3−メトキシ−4′−N,N−ジフェニルアミノスチルベンゼン;N−フェニルカルバゾール、更には米国特許第5,061,569号明細書に記載されている2個の縮合芳香族環を分子内に有するもの、例えば、4,4′−ビス〔N−(1−ナフチル)−N−フェニルアミノ〕ビフェニル(NPD)、特開平4−308688号公報に記載されているトリフェニルアミンユニットが3つスターバースト型に連結された4,4′,4″−トリス〔N−(3−メチルフェニル)−N−フェニルアミノ〕トリフェニルアミン(MTDATA)等が挙げられる。 Representative examples of aromatic tertiary amine compounds and styrylamine compounds include N, N, N ′, N′-tetraphenyl-4,4′-diaminophenyl; N, N′-diphenyl-N, N′— Bis (3-methylphenyl)-[1,1′-biphenyl] -4,4′-diamine (TPD); 2,2-bis (4-di-p-tolylaminophenyl) propane; 1,1-bis (4-di-p-tolylaminophenyl) cyclohexane; N, N, N ′, N′-tetra-p-tolyl-4,4′-diaminobiphenyl; 1,1-bis (4-di-p-tolyl) Aminophenyl) -4-phenylcyclohexane; bis (4-dimethylamino-2-methylphenyl) phenylmethane; bis (4-di-p-tolylaminophenyl) phenylmethane; N, N'-diphenyl-N, N ' Di (4-methoxyphenyl) -4,4'-diaminobiphenyl; N, N, N ', N'-tetraphenyl-4,4'-diaminodiphenyl ether; 4,4'-bis (diphenylamino) quadriphenyl N, N, N-tri (p-tolyl) amine; 4- (di-p-tolylamino) -4 '-[4- (di-p-tolylamino) styryl] stilbene; 4-N, N-diphenylamino -(2-diphenylvinyl) benzene; 3-methoxy-4'-N, N-diphenylaminostilbenzene; N-phenylcarbazole, and also two described in US Pat. No. 5,061,569 Having a condensed aromatic ring of, for example, 4,4'-bis [N- (1-naphthyl) -N-phenylamino] biphenyl (NPD), JP-A-4-308 4,4 ', 4 "-tris [N- (3-methylphenyl) -N-phenylamino] triphenylamine in which three triphenylamine units described in Japanese Patent No. 88 are linked in a starburst type ( MTDATA) and the like.
更にこれらの材料を高分子鎖に導入した、またはこれらの材料を高分子の主鎖とした高分子材料を用いることもできる。また、p型−Si、p型−SiC等の無機化合物も正孔注入材料、正孔輸送材料として使用することができる。 Furthermore, a polymer material in which these materials are introduced into a polymer chain or these materials are used as a polymer main chain can also be used. In addition, inorganic compounds such as p-type-Si and p-type-SiC can also be used as the hole injection material and the hole transport material.
また、特開平11−251067号公報、J.Huang et.al.著文献(Applied Physics Letters 80(2002),p.139)に記載されているような、所謂p型正孔輸送材料を用いることもできる。本発明においては、より高効率の発光素子が得られることからこれらの材料を用いることが好ましい。 JP-A-11-251067, J. Org. Huang et. al. A so-called p-type hole transport material as described in a book (Applied Physics Letters 80 (2002), p. 139) can also be used. In the present invention, these materials are preferably used because a light-emitting element with higher efficiency can be obtained.
正孔輸送層は上記正孔輸送材料を、例えば、真空蒸着法、スピンコート法、キャスト法、インクジェット法を含む印刷法、LB法等の公知の方法により、薄膜化することにより形成することができる。正孔輸送層の膜厚については特に制限はないが、通常は5nm〜5μm程度、好ましくは5nm〜200nmである。この正孔輸送層は上記材料の1種または2種以上からなる一層構造であってもよい。 The hole transport layer can be formed by thinning the hole transport material by a known method such as a vacuum deposition method, a spin coating method, a casting method, a printing method including an ink jet method, or an LB method. it can. Although there is no restriction | limiting in particular about the film thickness of a positive hole transport layer, Usually, 5 nm-about 5 micrometers, Preferably it is 5 nm-200 nm. The hole transport layer may have a single layer structure composed of one or more of the above materials.
また、不純物をドープしたp性の高い正孔輸送層を用いることもできる。その例としては、特開平4−297076号公報、特開2000−196140号公報、同2001−102175号公報の各公報、J.Appl.Phys.,95,5773(2004)等に記載されたものが挙げられる。 Alternatively, a hole transport layer having a high p property doped with impurities can be used. Examples thereof include JP-A-4-297076, JP-A-2000-196140, 2001-102175, J. Pat. Appl. Phys. 95, 5773 (2004), and the like.
本発明においては、このようなp性の高い正孔輸送層を用いることが、より低消費電力の素子を作製することができるため好ましい。 In the present invention, it is preferable to use a hole transport layer having such a high p property because a device with lower power consumption can be produced.
《電子輸送層》
電子輸送層とは電子を輸送する機能を有する材料からなり、広い意味で電子注入層、正孔阻止層も電子輸送層に含まれる。電子輸送層は単層または複数層設けることができる。
《Electron transport layer》
The electron transport layer is made of a material having a function of transporting electrons, and in a broad sense, an electron injection layer and a hole blocking layer are also included in the electron transport layer. The electron transport layer can be provided as a single layer or a plurality of layers.
従来、単層の電子輸送層、及び複数層とする場合は発光層に対して陰極側に隣接する電子輸送層に用いられる電子輸送材料(正孔阻止材料を兼ねる)としては、陰極より注入された電子を発光層に伝達する機能を有していればよく、その材料としては従来公知の化合物の中から任意のものを選択して用いることができ、例えば、ニトロ置換フルオレン誘導体、ジフェニルキノン誘導体、チオピランジオキシド誘導体、カルボジイミド、フレオレニリデンメタン誘導体、アントラキノジメタンおよびアントロン誘導体、オキサジアゾール誘導体等が挙げられる。更に上記オキサジアゾール誘導体において、オキサジアゾール環の酸素原子を硫黄原子に置換したチアジアゾール誘導体、電子吸引基として知られているキノキサリン環を有するキノキサリン誘導体も、電子輸送材料として用いることができる。更にこれらの材料を高分子鎖に導入した、またはこれらの材料を高分子の主鎖とした高分子材料を用いることもできる。 Conventionally, in the case of a single electron transport layer and a plurality of layers, an electron transport material (also serving as a hole blocking material) used for an electron transport layer adjacent to the light emitting layer on the cathode side is injected from the cathode. As long as it has a function of transferring electrons to the light-emitting layer, any material can be selected and used from among conventionally known compounds. For example, nitro-substituted fluorene derivatives, diphenylquinone derivatives Thiopyrandioxide derivatives, carbodiimides, fluorenylidenemethane derivatives, anthraquinodimethane and anthrone derivatives, oxadiazole derivatives and the like. Furthermore, in the above oxadiazole derivative, a thiadiazole derivative in which the oxygen atom of the oxadiazole ring is substituted with a sulfur atom, and a quinoxaline derivative having a quinoxaline ring known as an electron withdrawing group can also be used as an electron transport material. Furthermore, a polymer material in which these materials are introduced into a polymer chain or these materials are used as a polymer main chain can also be used.
また8−キノリノール誘導体の金属錯体、例えば、トリス(8−キノリノール)アルミニウム(Alq)、トリス(5,7−ジクロロ−8−キノリノール)アルミニウム、トリス(5,7−ジブロモ−8−キノリノール)アルミニウム、トリス(2−メチル−8−キノリノール)アルミニウム、トリス(5−メチル−8−キノリノール)アルミニウム、ビス(8−キノリノール)亜鉛(Znq)等、およびこれらの金属錯体の中心金属がIn、Mg、Cu、Ca、Sn、GaまたはPbに置き替わった金属錯体も、電子輸送材料として用いることができる。その他、メタルフリーもしくはメタルフタロシアニン、またはそれらの末端がアルキル基やスルホン酸基等で置換されているものも、電子輸送材料として好ましく用いることができる。また、発光層の材料として例示したジスチリルピラジン誘導体も、電子輸送材料として用いることができるし、正孔注入層、正孔輸送層と同様にn型−Si、n型−SiC等の無機半導体も電子輸送材料として用いることができる。 Also, metal complexes of 8-quinolinol derivatives such as tris (8-quinolinol) aluminum (Alq), tris (5,7-dichloro-8-quinolinol) aluminum, tris (5,7-dibromo-8-quinolinol) aluminum, Tris (2-methyl-8-quinolinol) aluminum, tris (5-methyl-8-quinolinol) aluminum, bis (8-quinolinol) zinc (Znq), etc., and the central metals of these metal complexes are In, Mg, Cu , Ca, Sn, Ga, or Pb can also be used as an electron transport material. In addition, metal-free or metal phthalocyanine, or those having terminal ends substituted with an alkyl group or a sulfonic acid group can be preferably used as the electron transporting material. In addition, the distyrylpyrazine derivative exemplified as the material of the light emitting layer can also be used as an electron transport material, and an inorganic semiconductor such as n-type-Si, n-type-SiC, etc. as in the case of the hole injection layer and the hole transport layer Can also be used as an electron transporting material.
電子輸送層は上記電子輸送材料を、例えば、真空蒸着法、スピンコート法、キャスト法、インクジェット法を含む印刷法、LB法等の公知の方法により、薄膜化することにより形成することができる。電子輸送層の膜厚については特に制限はないが、通常は5nm〜5μm程度、好ましくは5nm〜200nmである。電子輸送層は上記材料の1種または2種以上からなる一層構造であってもよい。 The electron transport layer can be formed by thinning the electron transport material by a known method such as a vacuum deposition method, a spin coating method, a casting method, a printing method including an ink jet method, or an LB method. Although there is no restriction | limiting in particular about the film thickness of an electron carrying layer, Usually, 5 nm-about 5 micrometers, Preferably it is 5 nm-200 nm. The electron transport layer may have a single layer structure composed of one or more of the above materials.
また、請求項7および8に掛かる発明においては、不純物をドープしたn性の高い電子輸送層を用いる。その例としては、特開平4−297076号公報、同10−270172号公報、特開2000−196140号公報、同2001−102175号公報、J.Appl.Phys.,95,5773(2004)等に記載されたものが挙げられる。 In the inventions according to claims 7 and 8, an electron transport layer having a high n property doped with impurities is used. Examples thereof include JP-A-4-297076, JP-A-10-270172, JP-A-2000-196140, 2001-102175, J.A. Appl. Phys. 95, 5773 (2004), and the like.
本発明においては、このようなn性の高い電子輸送層を用いることがより低消費電力の素子を作製することができるため好ましい。 In the present invention, it is preferable to use an electron transport layer having such a high n property because an element with lower power consumption can be manufactured.
《反応性有機化合物》
本発明では、反応性基をもつ有機化合物(反応性有機化合物)を用いてもよい。反応性有機化合物を用いる層としては特に制限はなく、各層に用いることができる。
《Reactive organic compound》
In the present invention, an organic compound having a reactive group (reactive organic compound) may be used. There is no restriction | limiting in particular as a layer using a reactive organic compound, It can use for each layer.
反応性有機化合物を基板上で反応させ、有機分子によるネットワークポリマーを形成させることができる。ネットワークポリマーが生成することで、構成層のTg(ガラス転移点)調整による素子劣化の抑制させることができる。 A reactive organic compound can be reacted on a substrate to form a network polymer of organic molecules. Generation | occurrence | production of a network polymer can suppress element deterioration by Tg (glass transition point) adjustment of a structure layer.
また、素子使用中の活性ラジカルを用いて分子の共役系の切断または生成を伴う反応を調整することにより、有機EL素子の発光波長を変えたり、特定波長の劣化を抑制すること等も可能である。 It is also possible to change the emission wavelength of the organic EL element, suppress deterioration of the specific wavelength, etc. by adjusting the reaction accompanied by the cleavage or generation of the conjugated system of the molecule using the active radical in use. is there.
一方、製造面では、例えば、塗布で積層する工程の場合では、下層が上層の塗布液に溶解しないことが好ましく、下層を樹脂化し溶剤溶解性を劣化させることで、上層塗布を可能とすることができる。 On the other hand, on the manufacturing side, for example, in the case of the step of laminating by coating, it is preferable that the lower layer is not dissolved in the upper layer coating solution, and the upper layer can be applied by making the lower layer resin and degrading solvent solubility. Can do.
ここで、本発明の反応性有機化合物を反応させる際、本発明においては反応性有機化合物を製膜後、加熱しながら光照射することが好ましい。加熱する温度Tは反応性有機化合物のTgに対し下記式にあてはまる範囲で行うことが特に好ましい。 Here, when the reactive organic compound of the present invention is reacted, in the present invention, the reactive organic compound is preferably irradiated with light while being heated after film formation. It is particularly preferable that the heating temperature T is within a range corresponding to the following formula with respect to Tg of the reactive organic compound.
Tg<T<Tg+100℃
本発明に用いることのできる反応性基の一例を示す。
Tg <T <Tg + 100 ° C.
An example of the reactive group which can be used for this invention is shown.
また、反応性有機化合物の一例を示す。 Moreover, an example of a reactive organic compound is shown.
また、本発明の反応性有機化合物としては、前記一般式(1)で表される化合物を用いることが特に好ましい。更に好ましくは、前記一般式(1)で表される反応性有機化合物を正孔輸送材料として使用する。 Moreover, as the reactive organic compound of the present invention, it is particularly preferable to use the compound represented by the general formula (1). More preferably, the reactive organic compound represented by the general formula (1) is used as a hole transport material.
一般式(1)で表される化合物の一例を下記に示す。 An example of the compound represented by the general formula (1) is shown below.
《陽極》
有機EL素子における陽極としては、仕事関数の大きい(4eV以上)金属、合金、電気伝導性化合物及びこれらの混合物を電極物質とするものが好ましく用いられる。このような電極物質の具体例としては、Au等の金属、CuI、インジウムチンオキシド(ITO)、SnO2、ZnO等の導電性透明材料が挙げられる。また、IDIXO(In2O3−ZnO)等非晶質で透明導電膜を作製可能な材料を用いてもよい。陽極はこれらの電極物質を蒸着やスパッタリング等の方法により薄膜を形成させ、フォトリソグラフィー法で所望の形状のパターンを形成してもよく、あるいはパターン精度をあまり必要としない場合は(100μm以上程度)、上記電極物質の蒸着やスパッタリング時に所望の形状のマスクを介してパターンを形成してもよい。あるいは、有機導電性化合物のように塗布可能な物質を用いる場合には、印刷方式、コーティング方式等湿式成膜法を用いることもできる。この陽極より発光を取り出す場合には、透過率を10%より大きくすることが望ましく、また陽極としてのシート抵抗は数百Ω/□以下が好ましい。更に膜厚は材料にもよるが、通常10nm〜1000nm、好ましくは10nm〜200nmの範囲で選ばれる。
"anode"
As the anode in the organic EL element, an electrode material made of a metal, an alloy, an electrically conductive compound, or a mixture thereof having a high work function (4 eV or more) is preferably used. Specific examples of such electrode materials include metals such as Au, and conductive transparent materials such as CuI, indium tin oxide (ITO), SnO 2 , and ZnO. Alternatively, an amorphous material such as IDIXO (In 2 O 3 —ZnO) capable of forming a transparent conductive film may be used. For the anode, these electrode materials may be formed into a thin film by a method such as vapor deposition or sputtering, and a pattern having a desired shape may be formed by a photolithography method, or when pattern accuracy is not so high (about 100 μm or more) A pattern may be formed through a mask having a desired shape at the time of vapor deposition or sputtering of the electrode material. Or when using the substance which can be apply | coated like an organic electroconductivity compound, wet film-forming methods, such as a printing system and a coating system, can also be used. When light emission is extracted from the anode, it is desirable that the transmittance be greater than 10%, and the sheet resistance as the anode is preferably several hundred Ω / □ or less. Further, although the film thickness depends on the material, it is usually selected in the range of 10 nm to 1000 nm, preferably 10 nm to 200 nm.
《陰極》
一方、陰極としては仕事関数の小さい(4eV以下)金属(電子注入性金属と称する)、合金、電気伝導性化合物およびこれらの混合物を電極物質とするものが用いられる。このような電極物質の具体例としては、ナトリウム、ナトリウム−カリウム合金、マグネシウム、リチウム、マグネシウム/銅混合物、マグネシウム/銀混合物、マグネシウム/アルミニウム混合物、マグネシウム/インジウム混合物、アルミニウム/酸化アルミニウム(Al2O3)混合物、インジウム、リチウム/アルミニウム混合物、希土類金属等が挙げられる。これらの中で、電子注入性及び酸化等に対する耐久性の点から、電子注入性金属とこれより仕事関数の値が大きく安定な金属である第二金属との混合物、例えば、マグネシウム/銀混合物、マグネシウム/アルミニウム混合物、マグネシウム/インジウム混合物、アルミニウム/酸化アルミニウム(Al2O3)混合物、リチウム/アルミニウム混合物、アルミニウム等が好適である。陰極はこれらの電極物質を蒸着やスパッタリング等の方法により薄膜を形成させることにより、作製することができる。また、陰極としてのシート抵抗は数百Ω/□以下が好ましく、膜厚は通常10nm〜5μm、好ましくは50nm〜200nmの範囲で選ばれる。尚、発光した光を透過させるため、有機EL素子の陽極または陰極のいずれか一方が透明または半透明であれば発光輝度が向上し好都合である。
"cathode"
On the other hand, as the cathode, a material having a low work function (4 eV or less) metal (referred to as an electron injecting metal), an alloy, an electrically conductive compound, and a mixture thereof as an electrode material is used. Specific examples of such electrode materials include sodium, sodium-potassium alloy, magnesium, lithium, magnesium / copper mixture, magnesium / silver mixture, magnesium / aluminum mixture, magnesium / indium mixture, aluminum / aluminum oxide (Al 2 O 3) mixture, indium, a lithium / aluminum mixture, and rare earth metals. Among these, from the point of durability against electron injection and oxidation, etc., a mixture of an electron injecting metal and a second metal which is a stable metal having a larger work function than this, for example, a magnesium / silver mixture, Magnesium / aluminum mixtures, magnesium / indium mixtures, aluminum / aluminum oxide (Al 2 O 3 ) mixtures, lithium / aluminum mixtures, aluminum and the like are preferred. The cathode can be produced by forming a thin film of these electrode materials by a method such as vapor deposition or sputtering. The sheet resistance as a cathode is preferably several hundred Ω / □ or less, and the film thickness is usually selected in the range of 10 nm to 5 μm, preferably 50 nm to 200 nm. In order to transmit the emitted light, if either one of the anode or the cathode of the organic EL element is transparent or translucent, the light emission luminance is improved, which is convenient.
また、陰極に上記金属を1nm〜20nmの膜厚で作製した後に、陽極の説明で挙げた導電性透明材料をその上に作製することで、透明または半透明の陰極を作製することができ、これを応用することで陽極と陰極の両方が透過性を有する素子を作製することができる。 Moreover, after producing the said metal by the film thickness of 1 nm-20 nm to a cathode, the transparent or semi-transparent cathode can be produced by producing the electroconductive transparent material quoted by description of the anode on it, By applying this, an element in which both the anode and the cathode are transmissive can be manufactured.
《支持基板》
本発明の有機EL素子に用いることのできる支持基板(以下、基体、基板、基材、支持体等とも言う)としては、ガラス、プラスチック等の種類には特に限定はなく、また透明であっても不透明であってもよい。支持基板側から光を取り出す場合には、支持基板は透明であることが好ましい。好ましく用いられる透明な支持基板としては、ガラス、石英、透明樹脂フィルムを挙げることができる。特に好ましい支持基板は、有機EL素子にフレキシブル性を与えることが可能な樹脂フィルムである。
《Support substrate》
As a support substrate (hereinafter also referred to as a substrate, substrate, substrate, support, etc.) that can be used in the organic EL device of the present invention, there is no particular limitation on the type of glass, plastic, etc., and it is transparent. May be opaque. When extracting light from the support substrate side, the support substrate is preferably transparent. Examples of the transparent support substrate preferably used include glass, quartz, and a transparent resin film. A particularly preferable support substrate is a resin film capable of giving flexibility to the organic EL element.
樹脂フィルムとしては、例えば、ポリエチレンテレフタレート(PET)、ポリエチレンナフタレート(PEN)等のポリエステル、ポリエチレン、ポリプロピレン、セロファン、セルロースジアセテート、セルローストリアセテート、セルロースアセテートブチレート、セルロースアセテートプロピオネート(CAP)、セルロースアセテートフタレート(TAC)、セルロースナイトレート等のセルロースエステル類またはそれらの誘導体、ポリ塩化ビニリデン、ポリビニルアルコール、ポリエチレンビニルアルコール、シンジオタクティックポリスチレン、ポリカーボネート、ノルボルネン樹脂、ポリメチルペンテン、ポリエーテルケトン、ポリイミド、ポリエーテルスルホン(PES)、ポリフェニレンスルフィド、ポリスルホン類、ポリエーテルイミド、ポリエーテルケトンイミド、ポリアミド、フッ素樹脂、ナイロン、ポリメチルメタクリレート、アクリルあるいはポリアリレート類、アートン(商品名JSR社製)あるいはアペル(商品名三井化学社製)といったシクロオレフィン系樹脂等を挙げられる。 Examples of the resin film include polyesters such as polyethylene terephthalate (PET) and polyethylene naphthalate (PEN), polyethylene, polypropylene, cellophane, cellulose diacetate, cellulose triacetate, cellulose acetate butyrate, cellulose acetate propionate (CAP), Cellulose esters such as cellulose acetate phthalate (TAC) and cellulose nitrate or derivatives thereof, polyvinylidene chloride, polyvinyl alcohol, polyethylene vinyl alcohol, syndiotactic polystyrene, polycarbonate, norbornene resin, polymethylpentene, polyether ketone, polyimide , Polyethersulfone (PES), polyphenylene sulfide, polysulfones Cycloolefin resins such as polyetherimide, polyetherketoneimide, polyamide, fluororesin, nylon, polymethylmethacrylate, acrylic or polyarylate, Arton (trade name, manufactured by JSR) or Appel (trade name, manufactured by Mitsui Chemicals) Can be mentioned.
樹脂フィルムの表面には、無機物、有機物の被膜またはその両者のハイブリッド被膜が形成されていてもよく、JIS K 7129−1992に準拠した方法で測定された、水蒸気透過度(25±0.5℃、相対湿度(90±2)%RH)が0.01g/(m2・24h)以下のバリア性フィルムであることが好ましく、更には、JIS K 7126−1987に準拠した方法で測定された酸素透過度が、10−3ml/(m2・24h・MPa)以下、水蒸気透過度が、10−5g/(m2・24h)以下の高バリア性フィルムであることが好ましい。 On the surface of the resin film, an inorganic film, an organic film, or a hybrid film of both may be formed. Water vapor permeability (25 ± 0.5 ° C.) measured by a method according to JIS K 7129-1992. , Relative humidity (90 ± 2)% RH) is preferably 0.01 g / (m 2 · 24 h) or less, and further, oxygen measured by a method according to JIS K 7126-1987. A high barrier film having a permeability of 10 −3 ml / (m 2 · 24 h · MPa) or less and a water vapor permeability of 10 −5 g / (m 2 · 24 h) or less is preferable.
バリア膜を形成する材料としては、水分や酸素等素子の劣化をもたらすものの浸入を抑制する機能を有する材料であればよく、例えば、酸化珪素、二酸化珪素、窒化珪素等を用いることができる。更に該膜の脆弱性を改良するために、これら無機層と有機材料からなる層の積層構造を持たせることがより好ましい。無機層と有機層の積層順については特に制限はないが、両者を交互に複数回積層させることが好ましい。 As a material for forming the barrier film, any material may be used as long as it has a function of suppressing entry of elements that cause deterioration of elements such as moisture and oxygen. For example, silicon oxide, silicon dioxide, silicon nitride, or the like can be used. Further, in order to improve the brittleness of the film, it is more preferable to have a laminated structure of these inorganic layers and organic material layers. Although there is no restriction | limiting in particular about the lamination | stacking order of an inorganic layer and an organic layer, It is preferable to laminate | stack both alternately several times.
バリア膜の形成方法については特に限定はなく、例えば、真空蒸着法、スパッタリング法、反応性スパッタリング法、分子線エピタキシー法、クラスターイオンビーム法、イオンプレーティング法、プラズマ重合法、大気圧プラズマ重合法、プラズマCVD法、レーザーCVD法、熱CVD法、コーティング法等を用いることができるが、特開2004−68143号公報に記載されているような大気圧プラズマ重合法によるものが特に好ましい。 The method for forming the barrier film is not particularly limited. For example, vacuum deposition, sputtering, reactive sputtering, molecular beam epitaxy, cluster ion beam, ion plating, plasma polymerization, atmospheric pressure plasma polymerization A plasma CVD method, a laser CVD method, a thermal CVD method, a coating method, or the like can be used, but an atmospheric pressure plasma polymerization method as described in JP-A-2004-68143 is particularly preferable.
不透明な支持基板としては、例えば、アルミ、ステンレス等の金属板、フィルムや不透明樹脂基板、セラミック製の基板等が挙げられる。 Examples of the opaque support substrate include metal plates such as aluminum and stainless steel, films, opaque resin substrates, and ceramic substrates.
本発明の有機EL素子の発光の室温における外部取り出し効率は、1%以上であることが好ましく、より好ましくは5%以上である。ここに、外部取り出し量子効率(%)=有機EL素子外部に発光した光子数/有機EL素子に流した電子数×100である。 The external extraction efficiency at room temperature of light emission of the organic EL device of the present invention is preferably 1% or more, more preferably 5% or more. Here, the external extraction quantum efficiency (%) = the number of photons emitted to the outside of the organic EL element / the number of electrons sent to the organic EL element × 100.
また、カラーフィルター等の色相改良フィルター等を併用しても、有機EL素子からの発光色を蛍光体を用いて多色へ変換する色変換フィルターを併用してもよい。色変換フィルターを用いる場合においては、有機EL素子の発光のλmaxは480nm以下が好ましい。 In addition, a hue improvement filter such as a color filter may be used in combination, or a color conversion filter that converts the emission color from the organic EL element into multiple colors using a phosphor. In the case of using a color conversion filter, the λmax of light emission of the organic EL element is preferably 480 nm or less.
《封止》
本発明に用いられる封止手段としては、例えば、封止部材と電極、支持基板とを接着剤で接着する方法を挙げることができる。
<Sealing>
As a sealing means used for this invention, the method of adhere | attaching a sealing member, an electrode, and a support substrate with an adhesive agent can be mentioned, for example.
封止部材としては、有機EL素子の表示領域を覆うように配置されておればよく、凹板状でも平板状でもよい。また透明性、電気絶縁性は特に問わない。 As a sealing member, it should just be arrange | positioned so that the display area | region of an organic EL element may be covered, and concave plate shape or flat plate shape may be sufficient. Further, transparency and electrical insulation are not particularly limited.
具体的には、ガラス板、ポリマー板・フィルム、金属板・フィルム等が挙げられる。ガラス板としては、特にソーダ石灰ガラス、バリウム・ストロンチウム含有ガラス、鉛ガラス、アルミノケイ酸ガラス、ホウケイ酸ガラス、バリウムホウケイ酸ガラス、石英等を挙げることができる。また、ポリマー板としては、ポリカーボネート、アクリル、ポリエチレンテレフタレート、ポリエーテルサルファイド、ポリサルフォン等を挙げることができる。金属板としては、ステンレス、鉄、銅、アルミニウム、マグネシウム、ニッケル、亜鉛、クロム、チタン、モリブテン、シリコン、ゲルマニウムおよびタンタルからなる群から選ばれる一種以上の金属または合金からなるものが挙げられる。 Specific examples include a glass plate, a polymer plate / film, and a metal plate / film. Examples of the glass plate include soda-lime glass, barium / strontium-containing glass, lead glass, aluminosilicate glass, borosilicate glass, barium borosilicate glass, and quartz. Examples of the polymer plate include polycarbonate, acrylic, polyethylene terephthalate, polyether sulfide, and polysulfone. Examples of the metal plate include those made of one or more metals or alloys selected from the group consisting of stainless steel, iron, copper, aluminum, magnesium, nickel, zinc, chromium, titanium, molybdenum, silicon, germanium, and tantalum.
本発明においては、素子を薄膜化できるということからポリマーフィルム、金属フィルムを好ましく使用することができる。更には、ポリマーフィルムは、JIS K 7126−1987に準拠した方法で測定された酸素透過度が1×10−3ml/(m2・24h・MPa)以下、JIS K 7129−1992に準拠した方法で測定された、水蒸気透過度(25±0.5℃、相対湿度(90±2)%RH)が、1×10−3g/(m2・24h)以下のものであることが好ましい。 In the present invention, a polymer film and a metal film can be preferably used because the element can be thinned. Furthermore, the polymer film has a oxygen permeability measured by a method according to JIS K 7126-1987 of 1 × 10 −3 ml / (m 2 · 24 h · MPa) or less, and a method according to JIS K 7129-1992. It is preferable that the water vapor permeability (25 ± 0.5 ° C., relative humidity (90 ± 2)% RH) measured in (1) is 1 × 10 −3 g / (m 2 · 24 h) or less.
封止部材を凹状に加工するのは、サンドブラスト加工、化学エッチング加工等が使われる。 For processing the sealing member into a concave shape, sandblasting, chemical etching, or the like is used.
接着剤として具体的には、アクリル酸系オリゴマー、メタクリル酸系オリゴマーの反応性ビニル基を有する光硬化及び熱硬化型接着剤、2−シアノアクリル酸エステル等の湿気硬化型等の接着剤を挙げることができる。また、エポキシ系等の熱及び化学硬化型(二液混合)を挙げることができる。また、ホットメルト型のポリアミド、ポリエステル、ポリオレフィンを挙げることができる。また、カチオン硬化タイプの紫外線硬化型エポキシ樹脂接着剤を挙げることができる。 Specific examples of the adhesive include photocuring and thermosetting adhesives having reactive vinyl groups such as acrylic acid oligomers and methacrylic acid oligomers, and moisture curing adhesives such as 2-cyanoacrylates. be able to. Moreover, heat | fever and chemical curing types (two-component mixing), such as an epoxy type, can be mentioned. Moreover, hot-melt type polyamide, polyester, and polyolefin can be mentioned. Moreover, a cationic curing type ultraviolet curing epoxy resin adhesive can be mentioned.
なお、有機EL素子が熱処理により劣化する場合があるので、室温から80℃までに接着硬化できるものが好ましい。また、前記接着剤中に乾燥剤を分散させておいてもよい。封止部分への接着剤の塗布は市販のディスペンサーを使ってもよいし、スクリーン印刷のように印刷してもよい。 In addition, since an organic EL element may deteriorate by heat processing, what can be adhesive-hardened from room temperature to 80 degreeC is preferable. A desiccant may be dispersed in the adhesive. Application | coating of the adhesive agent to a sealing part may use commercially available dispenser, and may print like screen printing.
また、有機層を挟み支持基板と対向する側の電極の外側に該電極と有機層を被覆し、支持基板と接する形で無機物、有機物の層を形成し封止膜とすることも好適にできる。この場合、該膜を形成する材料としては、水分や酸素等素子の劣化をもたらすものの浸入を抑制する機能を有する材料であればよく、例えば、酸化珪素、二酸化珪素、窒化珪素等を用いることができる。更に該膜の脆弱性を改良するために、これら無機層と有機材料からなる層の積層構造を持たせることが好ましい。これらの膜の形成方法については、特に限定はなく、例えば真空蒸着法、スパッタリング法、反応性スパッタリング法、分子線エピタキシー法、クラスターイオンビーム法、イオンプレーティング法、プラズマ重合法、大気圧プラズマ重合法、プラズマCVD法、レーザーCVD法、熱CVD法、コーティング法等を用いることができる。 In addition, it is also preferable that the electrode and the organic layer are coated on the outside of the electrode facing the support substrate with the organic layer interposed therebetween, and an inorganic or organic layer is formed in contact with the support substrate to form a sealing film. . In this case, the material for forming the film may be any material that has a function of suppressing intrusion of elements that cause deterioration of elements such as moisture and oxygen. For example, silicon oxide, silicon dioxide, silicon nitride, or the like may be used. it can. Further, in order to improve the brittleness of the film, it is preferable to have a laminated structure of these inorganic layers and layers made of organic materials. The method for forming these films is not particularly limited. For example, vacuum deposition, sputtering, reactive sputtering, molecular beam epitaxy, cluster ion beam, ion plating, plasma polymerization, atmospheric pressure plasma A combination method, a plasma CVD method, a laser CVD method, a thermal CVD method, a coating method, or the like can be used.
封止部材と有機EL素子の表示領域との間隙には、気相及び液相では、窒素、アルゴン等の不活性気体やフッ化炭化水素、シリコンオイルのような不活性液体を注入することが好ましい。また真空とすることも可能である。また、内部に吸湿性化合物を封入することもできる。 In the gap between the sealing member and the display area of the organic EL element, an inert gas such as nitrogen or argon, or an inert liquid such as fluorinated hydrocarbon or silicon oil can be injected in the gas phase and liquid phase. preferable. A vacuum is also possible. Moreover, a hygroscopic compound can also be enclosed inside.
吸湿性化合物としては、例えば、金属酸化物(例えば、酸化ナトリウム、酸化カリウム、酸化カルシウム、酸化バリウム、酸化マグネシウム、酸化アルミニウム等)、硫酸塩(例えば、硫酸ナトリウム、硫酸カルシウム、硫酸マグネシウム、硫酸コバルト等)、金属ハロゲン化物(例えば、塩化カルシウム、塩化マグネシウム、フッ化セシウム、フッ化タンタル、臭化セリウム、臭化マグネシウム、沃化バリウム、沃化マグネシウム等)、過塩素酸類(例えば、過塩素酸バリウム、過塩素酸マグネシウム等)等が挙げられ、硫酸塩、金属ハロゲン化物および過塩素酸類においては無水塩が好適に用いられる。 Examples of the hygroscopic compound include metal oxides (for example, sodium oxide, potassium oxide, calcium oxide, barium oxide, magnesium oxide, aluminum oxide) and sulfates (for example, sodium sulfate, calcium sulfate, magnesium sulfate, cobalt sulfate). Etc.), metal halides (eg calcium chloride, magnesium chloride, cesium fluoride, tantalum fluoride, cerium bromide, magnesium bromide, barium iodide, magnesium iodide etc.), perchloric acids (eg perchloric acid) Barium, magnesium perchlorate, etc.), and anhydrous salts are preferably used in sulfates, metal halides and perchloric acids.
《保護膜、保護板》
有機層を挟み支持基板と対向する側の前記封止膜、あるいは前記封止用フィルムの外側に、素子の機械的強度を高めるために保護膜、あるいは保護板を設けてもよい。特に封止が前記封止膜により行われている場合には、その機械的強度は必ずしも高くないため、このような保護膜、保護板を設けることが好ましい。これに使用することができる材料としては、前記封止に用いたのと同様なガラス板、ポリマー板・フィルム、金属板・フィルム等を用いることができるが、軽量且つ薄膜化ということからポリマーフィルムを用いることが好ましい。
《Protective film, protective plate》
In order to increase the mechanical strength of the element, a protective film or a protective plate may be provided on the outer side of the sealing film on the side facing the support substrate with the organic layer interposed therebetween or on the sealing film. In particular, when the sealing is performed by the sealing film, the mechanical strength is not necessarily high, and thus it is preferable to provide such a protective film and a protective plate. As a material that can be used for this, the same glass plate, polymer plate / film, metal plate / film, and the like used for the sealing can be used, but the polymer film is light and thin. Is preferably used.
《光取り出し》
有機EL素子は空気よりも屈折率の高い(屈折率が1.7〜2.1程度)層の内部で発光し、発光層で発生した光のうち15%から20%程度の光しか取り出せないことが一般的に言われている。これは、臨界角以上の角度θで界面(透明基板と空気との界面)に入射する光は、全反射を起こし素子外部に取り出すことができないことや、透明電極ないし発光層と透明基板との間で光が全反射を起こし、光が透明電極ないし発光層を導波し、結果として光が素子側面方向に逃げるためである。
《Light extraction》
The organic EL element emits light inside a layer having a refractive index higher than that of air (refractive index is about 1.7 to 2.1) and can extract only about 15% to 20% of the light generated in the light emitting layer. It is generally said. This is because light incident on the interface (interface between the transparent substrate and air) at an angle θ greater than the critical angle causes total reflection and cannot be taken out of the device, or between the transparent electrode or light emitting layer and the transparent substrate. This is because the light is totally reflected between the light and the light is guided through the transparent electrode or the light emitting layer, and as a result, the light escapes in the direction of the element side surface.
この光の取り出しの効率を向上させる手法としては、例えば、透明基板表面に凹凸を形成し、透明基板と空気界面での全反射を防ぐ方法(米国特許第4,774,435号明細書)、基板に集光性を持たせることにより効率を向上させる方法(特開昭63−314795号公報)、素子の側面等に反射面を形成する方法(特開平1−220394号公報)、基板と発光体の間に中間の屈折率を持つ平坦層を導入し、反射防止膜を形成する方法(特開昭62−172691号公報)、基板と発光体の間に基板よりも低屈折率を持つ平坦層を導入する方法(特開2001−202827号公報)、基板、透明電極層や発光層のいずれかの層間(含む、基板と外界間)に回折格子を形成する方法(特開平11−283751号公報)等がある。 As a method of improving the light extraction efficiency, for example, a method of forming irregularities on the surface of the transparent substrate and preventing total reflection at the transparent substrate and the air interface (US Pat. No. 4,774,435), A method of improving efficiency by providing a light collecting property to a substrate (Japanese Patent Laid-Open No. 63-314795), a method of forming a reflective surface on a side surface of an element (Japanese Patent Laid-Open No. 1-220394), and light emission from a substrate A method of forming an antireflection film by introducing a flat layer having an intermediate refractive index between the bodies (Japanese Patent Laid-Open No. 62-172691), a flat having a lower refractive index between the substrate and the light emitter than the substrate A method of introducing a layer (Japanese Patent Laid-Open No. 2001-202827), a method of forming a diffraction grating between any one of a substrate, a transparent electrode layer and a light emitting layer (including between the substrate and the outside) (Japanese Patent Laid-Open No. 11-283951) Gazette).
本発明においては、これらの方法を本発明の有機EL素子と組み合わせて用いることができるが、基板と発光体の間に基板よりも低屈折率を持つ平坦層を導入する方法、あるいは基板、透明電極層や発光層のいずれかの層間(含む、基板と外界間)に回折格子を形成する方法を好適に用いることができる。 In the present invention, these methods can be used in combination with the organic EL device of the present invention. However, a method of introducing a flat layer having a lower refractive index than the substrate between the substrate and the light emitter, or a substrate, transparent A method of forming a diffraction grating between any layers of the electrode layer and the light emitting layer (including between the substrate and the outside) can be suitably used.
本発明はこれらの手段を組み合わせることにより、更に高輝度あるいは耐久性に優れた素子を得ることができる。 In the present invention, by combining these means, it is possible to obtain an element having higher luminance or durability.
透明電極と透明基板の間に低屈折率の媒質を光の波長よりも長い厚みで形成すると、透明電極から出てきた光は、媒質の屈折率が低いほど外部への取り出し効率が高くなる。 When a medium having a low refractive index is formed between the transparent electrode and the transparent substrate with a thickness longer than the wavelength of light, the light extracted from the transparent electrode has a higher extraction efficiency to the outside as the refractive index of the medium is lower.
低屈折率層としては、例えば、エアロゲル、多孔質シリカ、フッ化マグネシウム、フッ素系ポリマー等が挙げられる。透明基板の屈折率は一般に1.5〜1.7程度であるので、低屈折率層は屈折率がおよそ1.5以下であることが好ましい。また、更に1.35以下であることが好ましい。 Examples of the low refractive index layer include aerogel, porous silica, magnesium fluoride, and a fluorine-based polymer. Since the refractive index of the transparent substrate is generally about 1.5 to 1.7, the low refractive index layer preferably has a refractive index of about 1.5 or less. Further, it is preferably 1.35 or less.
また、低屈折率媒質の厚みは媒質中の波長の2倍以上となるのが望ましい。これは低屈折率媒質の厚みが、光の波長程度になってエバネッセントで染み出した電磁波が基板内に入り込む膜厚になると、低屈折率層の効果が薄れるからである。 The thickness of the low refractive index medium is preferably at least twice the wavelength in the medium. This is because the effect of the low refractive index layer is diminished when the thickness of the low refractive index medium is about the wavelength of light and the electromagnetic wave that has exuded by evanescent enters the substrate.
全反射を起こす界面もしくはいずれかの媒質中に回折格子を導入する方法は、光取り出し効率の向上効果が高いという特徴がある。この方法は回折格子が1次の回折や2次の回折といった所謂ブラッグ回折により、光の向きを屈折とは異なる特定の向きに変えることができる性質を利用して、発光層から発生した光のうち層間での全反射等により外に出ることができない光を、いずれかの層間もしくは、媒質中(透明基板内や透明電極内)に回折格子を導入することで光を回折させ、光を外に取り出そうとするものである。 The method of introducing a diffraction grating into an interface or any medium that causes total reflection is characterized by a high effect of improving light extraction efficiency. This method uses the property that the diffraction grating can change the direction of light to a specific direction different from refraction by so-called Bragg diffraction such as first-order diffraction and second-order diffraction. Light that cannot be emitted due to total internal reflection between layers is diffracted by introducing a diffraction grating in any layer or medium (in a transparent substrate or transparent electrode), and the light is removed. I want to take it out.
導入する回折格子は、二次元的な周期屈折率を持っていることが望ましい。これは発光層で発光する光はあらゆる方向にランダムに発生するので、ある方向にのみ周期的な屈折率分布を持っている一般的な1次元回折格子では、特定の方向に進む光しか回折されず、光の取り出し効率がさほど上がらない。しかしながら、屈折率分布を二次元的な分布にすることにより、あらゆる方向に進む光が回折され、光の取り出し効率が上がる。 The introduced diffraction grating desirably has a two-dimensional periodic refractive index. This is because light emitted from the light-emitting layer is randomly generated in all directions, so in a general one-dimensional diffraction grating having a periodic refractive index distribution only in a certain direction, only light traveling in a specific direction is diffracted. Therefore, the light extraction efficiency does not increase so much. However, by making the refractive index distribution a two-dimensional distribution, light traveling in all directions is diffracted, and light extraction efficiency is increased.
回折格子を導入する位置としては前述の通り、いずれかの層間もしくは媒質中(透明基板内や透明電極内)でもよいが、光が発生する場所である有機発光層の近傍が望ましい。 As described above, the position where the diffraction grating is introduced may be in any of the layers or in the medium (in the transparent substrate or in the transparent electrode), but is preferably in the vicinity of the organic light emitting layer where light is generated.
このとき、回折格子の周期は媒質中の光の波長の約1/2〜3倍程度が好ましい。 At this time, the period of the diffraction grating is preferably about 1/2 to 3 times the wavelength of light in the medium.
回折格子の配列は正方形のラチス状、三角形のラチス状、ハニカムラチス状等、2次元的に配列が繰り返されることが好ましい。 The arrangement of the diffraction grating is preferably two-dimensionally repeated, such as a square lattice, a triangular lattice, or a honeycomb lattice.
《集光シート》
本発明の有機EL素子は基板の光取り出し側に、例えば、マイクロレンズアレイ状の構造を設けるように加工したり、あるいは所謂集光シートと組み合わせることにより、特定方向、例えば、素子発光面に対し正面方向に集光することにより、特定方向上の輝度を高めることができる。
<Condenser sheet>
The organic EL device of the present invention is processed on the light extraction side of the substrate so as to provide, for example, a microlens array structure, or combined with a so-called condensing sheet, for example, with respect to a specific direction, for example, the light emitting surface By condensing in the front direction, the luminance in a specific direction can be increased.
マイクロレンズアレイの例としては、基板の光取り出し側に一辺が30μmでその頂角が90度となるような四角錐を2次元に配列する。一辺は10μm〜100μmが好ましい。これより小さくなると回折の効果が発生して色付く、大きすぎると厚みが厚くなり好ましくない。 As an example of the microlens array, quadrangular pyramids having a side of 30 μm and an apex angle of 90 degrees are two-dimensionally arranged on the light extraction side of the substrate. One side is preferably 10 μm to 100 μm. If it becomes smaller than this, the effect of diffraction will generate | occur | produce and color, and if too large, thickness will become thick and is not preferable.
集光シートとしては、例えば、液晶表示装置のLEDバックライトで実用化されているものを用いることが可能である。このようなシートとして、例えば、住友スリーエム社製輝度上昇フィルム(BEF)等を用いることができる。プリズムシートの形状としては、例えば、基材に頂角90度、ピッチ50μmの△状のストライプが形成されたものであってもよいし、頂角が丸みを帯びた形状、ピッチをランダムに変化させた形状、その他の形状であってもよい。 As the condensing sheet, for example, a sheet that is put into practical use in an LED backlight of a liquid crystal display device can be used. As such a sheet, for example, a brightness enhancement film (BEF) manufactured by Sumitomo 3M Limited can be used. As the shape of the prism sheet, for example, the base material may be formed by forming a △ -shaped stripe having a vertex angle of 90 degrees and a pitch of 50 μm, or the vertex angle is rounded and the pitch is changed randomly. Other shapes may be used.
また、発光素子からの光放射角を制御するために、光拡散板・フィルムを集光シートと併用してもよい。例えば、(株)きもと製拡散フィルム(ライトアップ)等を用いることができる。 Moreover, in order to control the light emission angle from a light emitting element, you may use together a light diffusing plate and a film with a condensing sheet. For example, a diffusion film (light-up) manufactured by Kimoto Co., Ltd. can be used.
《有機EL素子の作製方法》
本発明の有機EL素子の作製方法の一例として、陽極/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/陰極からなる有機EL素子の作製法を説明する。
<< Method for producing organic EL element >>
As an example of the method for producing the organic EL device of the present invention, a method for producing an organic EL device comprising an anode / hole injection layer / hole transport layer / light emitting layer / electron transport layer / electron injection layer / cathode will be described.
まず適当な基体上に所望の電極物質、例えば、陽極用物質からなる薄膜を1μm以下、好ましくは10nm〜200nmの膜厚になるように、蒸着やスパッタリング等の方法により形成させ陽極を作製する。 First, a desired electrode material, for example, a thin film made of an anode material is formed on a suitable substrate so as to have a film thickness of 1 μm or less, preferably 10 nm to 200 nm, to form an anode.
次に、この上に有機EL素子材料である正孔注入層、正孔輸送層、発光層、電子輸送層、電子注入層、正孔阻止層の有機化合物薄膜を形成させる。 Next, an organic compound thin film of a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, an electron injection layer, and a hole blocking layer, which are organic EL element materials, is formed thereon.
本発明の有機EL素子の発光層は前述の通り、ウェットプロセスで形成される。発光層以外の有機層の形成方法としては、蒸着法、ウェットプロセス(スピンコート法、キャスト法、インクジェット法、スプレー法、印刷法)等があるが、均質な膜が得られやすく、且つピンホールが生成しにくい等の点から、本発明においては有機層の一部もしくは全部について、スピンコート法、インクジェット法、スプレー法、印刷法等の塗布法による成膜が好ましい。 As described above, the light emitting layer of the organic EL device of the present invention is formed by a wet process. As a method for forming an organic layer other than the light emitting layer, there are a vapor deposition method, a wet process (spin coating method, casting method, ink jet method, spray method, printing method), etc., but a homogeneous film can be easily obtained and a pinhole is used. In the present invention, a part or all of the organic layer is preferably formed by a coating method such as a spin coating method, an ink jet method, a spray method, or a printing method.
本発明に係る有機EL材料を溶解または分散する液媒体としては、例えば、メチルエチルケトン、シクロヘキサノン等のケトン類、酢酸エチル等の脂肪酸エステル類、ジクロロベンゼン等のハロゲン化炭化水素類、トルエン、キシレン、メシチレン、シクロヘキシルベンゼン等の芳香族炭化水素類、シクロヘキサン、デカリン、ドデカン等の脂肪族炭化水素類、DMF、DMSO等の有機溶媒を用いることができる。また分散方法としては、超音波、高剪断力分散やメディア分散等の分散方法により分散することができる。 Examples of the liquid medium for dissolving or dispersing the organic EL material according to the present invention include ketones such as methyl ethyl ketone and cyclohexanone, fatty acid esters such as ethyl acetate, halogenated hydrocarbons such as dichlorobenzene, toluene, xylene, and mesitylene. Aromatic hydrocarbons such as cyclohexylbenzene, aliphatic hydrocarbons such as cyclohexane, decalin, and dodecane, and organic solvents such as DMF and DMSO can be used. Moreover, as a dispersion method, it can disperse | distribute by dispersion methods, such as an ultrasonic wave, high shear force dispersion | distribution, and media dispersion | distribution.
これらの層を形成後、その上に陰極用物質からなる薄膜を1μm以下、好ましくは、50nm〜200nmの範囲の膜厚になるように、例えば、蒸着やスパッタリング等の方法により形成させ、陰極を設けることにより所望の有機EL素子が得られる。 After these layers are formed, a thin film made of a cathode material is formed thereon by 1 μm or less, preferably by a method such as vapor deposition or sputtering so that the film thickness is in the range of 50 nm to 200 nm. By providing, a desired organic EL element can be obtained.
また作製順序を逆にして、陰極、電子注入層、電子輸送層、発光層、正孔輸送層、正孔注入層、陽極の順に作製することも可能である。このようにして得られた多色の表示装置に、直流電圧を印加する場合には陽極を+、陰極を−の極性として電圧2〜40V程度を印加すると発光が観測できる。また交流電圧を印加してもよい。なお、印加する交流の波形は任意でよい。 Further, it is possible to reverse the production order, and to produce the cathode, the electron injection layer, the electron transport layer, the light emitting layer, the hole transport layer, the hole injection layer, and the anode in this order. When a DC voltage is applied to the multicolor display device thus obtained, light emission can be observed by applying a voltage of about 2 to 40 V with the positive polarity of the anode and the negative polarity of the cathode. An alternating voltage may be applied. The alternating current waveform to be applied may be arbitrary.
以下、実施例を挙げて本発明を具体的に説明するが、本発明はこれらに限定されるものではない。なお、実施例において「部」あるいは「%」の表示を用いるが、特に断りがない限り「質量部」あるいは「質量%」を表す。 EXAMPLES Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited thereto. In addition, although the display of "part" or "%" is used in an Example, unless otherwise indicated, "part by mass" or "mass%" is represented.
実施例1
《有機EL素子の作製》
〔有機EL素子101の作製〕
陽極として100mm×100mm×1.1mmのガラス基板上に、ITO(インジウムチンオキシド)を100nm製膜した基板(NHテクノグラス製NA45)にパターニングを行った後、このITO透明電極を設けた基板をイソプロピルアルコールで超音波洗浄し、乾燥窒素ガスで乾燥し、UVオゾン洗浄を5分間行った。この基板上に、ポリ(3,4−エチレンジオキシチオフェン)−ポリスチレンスルホネート(PEDOT/PSS、Bayer製、Baytron P Al 4083)を純水で70%に希釈した溶液を3000rpm、30秒でスピンコート法により製膜した後、200℃にて1時間乾燥し、膜厚30nmの正孔注入層を設けた。
Example 1
<< Production of organic EL element >>
[Production of Organic EL Element 101]
After patterning a substrate (NH technoglass NA45) formed by depositing 100 nm of ITO (indium tin oxide) on a 100 mm × 100 mm × 1.1 mm glass substrate as an anode, a substrate provided with this ITO transparent electrode was formed. Ultrasonic cleaning with isopropyl alcohol, drying with dry nitrogen gas, and UV ozone cleaning were performed for 5 minutes. A solution obtained by diluting poly (3,4-ethylenedioxythiophene) -polystyrene sulfonate (PEDOT / PSS, Bayer, Baytron P Al 4083) to 70% with pure water on this substrate was spin-coated at 3000 rpm for 30 seconds. After forming into a film by the method, it was dried at 200 ° C. for 1 hour to provide a hole injection layer having a thickness of 30 nm.
この基板を、窒素雰囲気下、JIS B 9920に準拠し、測定した清浄度がクラス100で、露点温度が−80℃以下、酸素濃度0.8ppmのグローブボックスへ移した。グローブボックス中にて正孔輸送層用塗布液を下記のように調製し、スピンコーターにて、1500rpm、30秒の条件で塗布した。この基板を、150℃で10秒加熱し、加熱したまま、高圧水銀ランプ(株式会社オーク製作所製OHD−110M−ST)を用い30mW/cm2の紫外光を20秒間照射した。さらに120℃で30分間加熱し正孔輸送層を設けた。別途用意した基板にて、同条件にて塗布を行い測定したところ、膜厚は20nmであった。 This substrate was transferred to a glove box under a nitrogen atmosphere in accordance with JIS B 9920, the measured cleanliness was class 100, the dew point temperature was −80 ° C. or lower, and the oxygen concentration was 0.8 ppm. A coating solution for a hole transport layer was prepared as follows in a glove box, and applied with a spin coater under conditions of 1500 rpm and 30 seconds. This substrate was heated at 150 ° C. for 10 seconds, and irradiated with 30 mW / cm 2 of ultraviolet light for 20 seconds using a high pressure mercury lamp (OHD-110M-ST, manufactured by Oak Manufacturing Co., Ltd.). Furthermore, it heated at 120 degreeC for 30 minute (s), and provided the positive hole transport layer. The film thickness was 20 nm when it apply | coated and measured on the conditions with the board | substrate prepared separately.
(正孔輸送層用塗布液)
トルエン 100g
HT−C 0.5g
次いで、発光層塗布液を下記のように調製し、スピンコーターにて、2000rpm、30秒の条件で塗布した。さらに180℃で30分加熱し発光層を設けた。別途用意した基板にて、同条件にて塗布を行い測定したところ、膜厚は40nmであった。
(Coating liquid for hole transport layer)
Toluene 100g
HT-C 0.5g
Subsequently, the light emitting layer coating liquid was prepared as follows, and it apply | coated on 2000 rpm and the conditions for 30 seconds with the spin coater. Furthermore, it heated at 180 degreeC for 30 minutes, and provided the light emitting layer. When the coating was performed under the same conditions on a separately prepared substrate and measured, the film thickness was 40 nm.
(発光層用塗布液)
トルエン 100g
H−A 1g
Ir−A 0.11g
次いで、電子輸送層用塗布液を下記のように調製し、スピンコーターにて、1500rpm、30秒の条件で塗布した。さらに120℃で30分加熱し電子輸送層を設けた。別途用意した基板にて、同条件にて塗布を行い測定したところ、膜厚は30nmであった。
(Light emitting layer coating solution)
Toluene 100g
HA 1g
Ir-A 0.11 g
Subsequently, the coating liquid for electron carrying layers was prepared as follows, and it apply | coated on the conditions of 1500 rpm and 30 seconds with a spin coater. Furthermore, it heated at 120 degreeC for 30 minutes, and provided the electron carrying layer. The film thickness was 30 nm when it apply | coated and measured on the conditions with the board | substrate prepared separately.
(電子輸送層用塗布液)
2,2,3,3−テトラフルオロ−1−プロパノール 100g
ET−A 0.75g
次いで、電子輸送層まで設けた基板を、大気曝露せずに、蒸着機に移動し、4×10−4Paまで減圧した。尚、フッ化セシウムおよびアルミニウムをそれぞれタンタル製抵抗加熱ボートに入れ、蒸着機に取り付けておいた。
(Coating liquid for electron transport layer)
2,2,3,3-tetrafluoro-1-propanol 100 g
ET-A 0.75g
Next, the substrate provided up to the electron transport layer was moved to a vapor deposition machine without being exposed to the atmosphere, and the pressure was reduced to 4 × 10 −4 Pa. Note that cesium fluoride and aluminum were each placed in a tantalum resistance heating boat and attached to a vapor deposition machine.
先ず、フッ化セシウムの入った抵抗加熱ボートに通電し加熱し、基板上にフッ化セシウムからなる電子注入層を3nm設けた。続いて、アルミニウムの入った抵抗加熱ボートに通電加熱し、蒸着速度1〜2nm/秒でアルミニウムからなる膜厚100nmの陰極を設けた。 First, a resistance heating boat containing cesium fluoride was energized and heated to provide a 3 nm electron injection layer made of cesium fluoride on the substrate. Subsequently, a resistance heating boat containing aluminum was energized and heated, and a cathode having a film thickness of 100 nm made of aluminum was provided at a deposition rate of 1 to 2 nm / second.
陰極まで設けた基板を、大気曝露させることなく、窒素雰囲気下、JIS B9920に準拠し測定した清浄度がクラス100で、露点温度が−80℃以下、酸素濃度0.8ppmのグローブボックスへ移動し、捕水剤である酸化バリウムを添付したガラス製の封止缶にて封止を行い、素子101を得た。尚、捕水剤である酸化バリウムは、アルドリッチ社製の高純度酸化バリウム粉末を、粘着剤付きのフッ素系半透過膜(ミクロテックスS−NTF8031Q 日東電工製)でガラス製封止缶に貼り付けたものを予め準備して使用した。封止缶と有機EL素子の接着には紫外線硬化型の接着剤を用い、紫外線を照射することで両者を接着し封止素子を作製した。 The substrate provided up to the cathode is moved to a glove box with a cleanness measured in accordance with JIS B9920 of class 100, a dew point temperature of −80 ° C. or lower, and an oxygen concentration of 0.8 ppm without being exposed to the atmosphere. The element 101 was obtained by sealing with a glass sealing can attached with barium oxide as a water-absorbing agent. In addition, barium oxide which is a water-absorbing agent is a high-purity barium oxide powder manufactured by Aldrich, and is attached to a glass sealing can with a fluorine-based semipermeable membrane (Microtex S-NTF8031Q made by Nitto Denko) with an adhesive. Were prepared and used in advance. An ultraviolet curable adhesive was used for bonding the sealing can and the organic EL element, and both were bonded to each other by irradiating ultraviolet rays to produce a sealing element.
〔有機EL素子102〜113の作製〕
有機EL素子101において、正孔注入層の材料、正孔輸送層の反応性有機化合物および正孔輸送層を塗布後に反応させる際の加熱条件を表1の通り変更した以外は同様にして有機EL素子102〜113を作製した。
[Production of Organic EL Elements 102 to 113]
In the organic EL element 101, the organic EL device was similarly manufactured except that the material for the hole injection layer, the reactive organic compound for the hole transport layer, and the heating conditions for the reaction after the application of the hole transport layer were changed as shown in Table 1. Elements 102 to 113 were produced.
《有機EL素子の評価》
〔反応性有機化合物層の反応前後の表面粗さ〕
有機EL素子101〜113の作製において、別途用意したガラス基板上に反応性有機化合物層のみを20nmの厚みになるように製膜し、表1記載の条件で基板を加熱しながらUV照射し反応性有機化合物層を反応させた。得られた膜について、表面形状を反応前後で測定した。表面形状の測定は走査型プローブ顕微鏡SPI3800N DFM(エスアイアイ・ナノテクノロジー株式会社製)を用い、カンチレバーSI−DF20、測定エリア50μm×50μmの条件で測定し、表面平均粗さ(Ra)および最大凹凸差(Rt)をそれぞれ計測した。
<< Evaluation of organic EL elements >>
[Surface roughness before and after reaction of reactive organic compound layer]
In the production of the organic EL elements 101 to 113, only a reactive organic compound layer was formed on a separately prepared glass substrate so as to have a thickness of 20 nm, and UV irradiation was performed while heating the substrate under the conditions described in Table 1. The reactive organic compound layer was reacted. About the obtained film | membrane, the surface shape was measured before and behind reaction. The surface shape is measured using a scanning probe microscope SPI3800N DFM (manufactured by SII Nano Technology Co., Ltd.) under the conditions of cantilever SI-DF20, measurement area 50 μm × 50 μm, surface average roughness (Ra) and maximum unevenness. Each difference (Rt) was measured.
〔反応性有機化合物層の硬化性〕
有機EL素子101〜113の作製において、別途用意した石英基板上に反応性有機化合物層のみを20nmの厚みになるように製膜し、表1記載の条件で基板を加熱しながらUV照射し反応性有機化合物層を反応させた。この基板のUV吸収スペクトルを測定し、350nmの吸光度(A0)を計測した。同じ基板に対し、スピンコーター上でトルエンを滴下し、1000rpmで回転し乾燥させた。この操作を各サンプルに対し2回行った後、UV吸収スペクトルを測定し、350nmの吸光度(A1)を計測した。得られた結果から反応性有機化合物の硬化性を下記のように判断した。
[Curability of reactive organic compound layer]
In the production of the organic EL elements 101 to 113, only a reactive organic compound layer is formed on a separately prepared quartz substrate so as to have a thickness of 20 nm, and UV irradiation is performed while heating the substrate under the conditions described in Table 1. The reactive organic compound layer was reacted. The UV absorption spectrum of this substrate was measured, and the absorbance (A 0 ) at 350 nm was measured. Toluene was dropped on the same substrate on a spin coater and rotated at 1000 rpm and dried. After performing this operation twice for each sample, the UV absorption spectrum was measured, and the absorbance (A 1 ) at 350 nm was measured. From the obtained results, the curability of the reactive organic compound was judged as follows.
○:A1/A0≧0.95
△:0.95>A1/A0≧0.90
×:0.90>A1/A0
得られた結果を表1に表す。
○: A 1 / A 0 ≧ 0.95
Δ: 0.95> A 1 / A 0 ≧ 0.90
×: 0.90> A 1 / A 0
The obtained results are shown in Table 1.
〔外部取り出し量子効率〕
作製した有機EL素子に対し、2.5mA/cm2定電流を流したときの外部取り出し量子効率(%)を測定した。なお、測定には分光放射輝度計CS−1000(コニカミノルタセンシング製)を用いた。得られた結果を有機EL素子101の測定値を100としたときの相対値で表2に表した。
[External extraction quantum efficiency]
With respect to the produced organic EL element, the external extraction quantum efficiency (%) when a 2.5 mA / cm 2 constant current was passed was measured. For the measurement, a spectral radiance meter CS-1000 (manufactured by Konica Minolta Sensing) was used. The obtained results are shown in Table 2 as relative values when the measured value of the organic EL element 101 is 100.
〔発光寿命〕
作製した有機EL素子に対し、正面輝度1000cd/m2となるような電流を与え、連続駆動した。正面輝度が初期の半減値(500cd/m2)になるまでに掛かる時間を求め、有機EL素子102〜113の外部取り出し量子効率は、有機EL素子101の測定値を100とした相対値で表した。
[Luminescence life]
The manufactured organic EL element was continuously driven by applying a current that would give a front luminance of 1000 cd / m 2 . The time required for the front luminance to reach the initial half value (500 cd / m 2 ) is obtained, and the external extraction quantum efficiency of the organic EL elements 102 to 113 is expressed as a relative value with the measured value of the organic EL element 101 as 100. did.
〔発光面均一性〕
作製した有機EL素子に対し、直流電源(株式会社テクシオ製直流安定化電源PA13−B)を用いて、素子を発光させて、マイクロスコープ(株式会社モリテックス製MS−804、レンズA−1468)を用いて発光面の観察を行い、全発光面(4mm四方)の白点、黒点の個数を計測した。
[Light emitting surface uniformity]
Using the direct current power supply (DC stabilized power supply PA13-B manufactured by Techio Co., Ltd.) for the produced organic EL element, the device was caused to emit light, and the microscope (MS-804 manufactured by Moritex Co., Ltd., lens A-1468) was used. The light emitting surface was observed and the number of white spots and black spots on all the light emitting surfaces (4 mm square) was measured.
得られた結果を表2に表す。また、用いた化合物を下記に示す。 The obtained results are shown in Table 2. The compounds used are shown below.
本発明の素子において外部取り出し量子効率と発光寿命が改善され、発光面における白点や黒点の異常も減少していることがわかる。 It can be seen that in the device of the present invention, the external extraction quantum efficiency and the emission lifetime are improved, and the white spot and black spot abnormalities on the light emitting surface are also reduced.
実施例2
実施例1において、発光層組成を下記に変更した以外は同様にして白色有機EL素子201〜213を表3の通りに作製した。
Example 2
In Example 1, white organic EL elements 201 to 213 were similarly manufactured as shown in Table 3 except that the composition of the light emitting layer was changed to the following.
(発光層用塗布液)
トルエン 100g
H−A 1g
Ir−A 0.11g
Ir(ppy)3 0.002g
Ir(piq)3 0.002g
実施例1と同様の評価を行い、得られた結果を表3,4に表す。
(Light emitting layer coating solution)
Toluene 100g
HA 1g
Ir-A 0.11 g
Ir (ppy) 3 0.002 g
Ir (piq) 3 0.002 g
The same evaluation as in Example 1 was performed, and the obtained results are shown in Tables 3 and 4.
実施例2の白色有機EL素子においても本発明の素子において外部取り出し量子効率と発光寿命が改善され、発光面における白点や黒点の異常も減少していることがわかる。 Also in the white organic EL element of Example 2, it can be seen that the external extraction quantum efficiency and the light emission lifetime are improved in the element of the present invention, and the abnormality of the white spot and black spot on the light emitting surface is also reduced.
実施例3
実施例1において、用いる基板としてポリエチレンナフタレートからなる可塑性フィルム(帝人・デユポン社製)の全面に、大気圧プラズマ放電処理装置を用いて特開2004−68143号に記載方法で、連続して可撓性フィルム上に、SiOxからなる無機物のガスバリア膜を形成し、酸素透過度0.01ml/m2/day以下、水蒸気透過度0.01g/m2/day以下のガスバリア性の可撓性フィルムを作製したものを使用したところ、実施例1同様に本発明の構成において取り出し量子効率と発光寿命が改善され、発光面における白点や黒点の異常も減少していることが確認できた。
Example 3
In Example 1, the entire surface of a plastic film made of polyethylene naphthalate (manufactured by Teijin & Deyupon Co., Ltd.) as the substrate to be used can be continuously applied by the method described in JP-A-2004-68143 using an atmospheric pressure plasma discharge treatment apparatus. An inorganic gas barrier film made of SiO x is formed on a flexible film, and has a gas barrier flexibility with an oxygen permeability of 0.01 ml / m 2 / day or less and a water vapor permeability of 0.01 g / m 2 / day or less. When the film was used, it was confirmed that the quantum efficiency and the light emission lifetime were improved in the configuration of the present invention as in Example 1, and the white spots and black spots on the light emitting surface were also reduced.
Claims (6)
Ra2−Ra1<0.3nm
Rt2−Rt1<5.0nm In an organic electroluminescence device having at least an anode, a cathode, and a light emitting layer and a hole transport layer sandwiched between the anode and cathode on a substrate, at least one layer contains a reactive organic compound and is reacted after film formation An organic electroluminescence device, wherein the surface roughness Ra1 and surface unevenness difference Rt1 before reaction and the surface roughness Ra2 and surface unevenness difference Rt2 after reaction are in the following relationship:
Ra2-Ra1 <0.3nm
Rt2-Rt1 <5.0nm
Tg<T<Tg+100℃ The method for producing an organic electroluminescence element according to claim 4, wherein the heating temperature T is in the following relationship with respect to the glass transition temperature Tg of the reactive organic compound.
Tg <T <Tg + 100 ° C.
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WO2011114833A1 (en) * | 2010-03-15 | 2011-09-22 | 富士フイルム株式会社 | Method for producing organic electroluminescence element |
JP2012111719A (en) * | 2010-11-25 | 2012-06-14 | Idemitsu Kosan Co Ltd | Polymerizable monomer, material for organic device containing polymer thereof, hole injection and transporting material, material for organic electroluminescent element, and organic electroluminescent element |
JP2018093219A (en) * | 2018-02-20 | 2018-06-14 | パイオニア株式会社 | Organic electroluminescent element |
CN110128399A (en) * | 2019-05-31 | 2019-08-16 | 常州大学 | Based on five yuan of heteroaromatic organic molecule materials of dibenzo and its synthetic method and as the application of hole transmission layer |
JP2019216291A (en) * | 2019-10-01 | 2019-12-19 | パイオニア株式会社 | Organic electroluminescent element |
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JP2000268974A (en) * | 1999-03-18 | 2000-09-29 | Japan Atom Energy Res Inst | Manufacture of heat resistant polymer hole transporting thin film by thin film polymerization, and organic electroluminescent element manufactured by the method |
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JP2000268974A (en) * | 1999-03-18 | 2000-09-29 | Japan Atom Energy Res Inst | Manufacture of heat resistant polymer hole transporting thin film by thin film polymerization, and organic electroluminescent element manufactured by the method |
JP2004119393A (en) * | 2003-12-12 | 2004-04-15 | Toppan Printing Co Ltd | El element, and hole transporting condensate for manufacturing the same |
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WO2011114833A1 (en) * | 2010-03-15 | 2011-09-22 | 富士フイルム株式会社 | Method for producing organic electroluminescence element |
JP2012111719A (en) * | 2010-11-25 | 2012-06-14 | Idemitsu Kosan Co Ltd | Polymerizable monomer, material for organic device containing polymer thereof, hole injection and transporting material, material for organic electroluminescent element, and organic electroluminescent element |
JP2018093219A (en) * | 2018-02-20 | 2018-06-14 | パイオニア株式会社 | Organic electroluminescent element |
CN110128399A (en) * | 2019-05-31 | 2019-08-16 | 常州大学 | Based on five yuan of heteroaromatic organic molecule materials of dibenzo and its synthetic method and as the application of hole transmission layer |
CN110128399B (en) * | 2019-05-31 | 2021-11-23 | 常州大学 | Organic molecular material based on dibenzo five-membered aromatic heterocycle, synthetic method thereof and application of organic molecular material as hole transport layer |
JP2019216291A (en) * | 2019-10-01 | 2019-12-19 | パイオニア株式会社 | Organic electroluminescent element |
JP2021166314A (en) * | 2019-10-01 | 2021-10-14 | パイオニア株式会社 | Organic electroluminescent element |
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