JP2010014449A - Probe for automatic inspection device of electric device and automatic inspection device for the same - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To reduce an influence of noises in a measurement signal between a probe and a measurement device. <P>SOLUTION: The probe comprises a detection terminal 10a, brought into elastic contact with a signal terminal 2 of an electric device 1 to be inspected, outputs a signal obtained from the signal terminal 2 of an electrical device 1 to a measurement device 3 side from an output terminal 10b on the opposite side, has a plunger 10 that constitutes an insulation layer 11, in the length direction of the outer circumference except the detection terminal 10a and the output terminal 10b and is slidable only in the length direction by a cover body 13, and outputs an electric signal only via the plunger 10 to the measuring device 3 side, by bringing a measurement end of the plunger 10 in elastic contact with the signal terminal 2 of the electric device 1, by a spring 14 disposed between the plunger 10 and the cover body 13. A signal infiltrating from another part to the signal, obtained from the signal terminal 2 of the electric device 1, can be eliminated because the insulation layer 11 is formed in the length direction of the outer circumference of the plunger 10. A component, such as the spring 14, is charged by the plunger 10, and resonance frequency will not be generated. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  TECHNICAL FIELD The present invention relates to a probe for an automatic inspection device of an electronic device used for inspection of a car audio device, a navigation device, various electronic devices, etc. of an automobile, and the automatic inspection device thereof. The present invention relates to a probe for an automatic inspection device for an electronic device that extracts a signal at the predetermined measurement point and determines whether the electronic device is good based on the extracted signal and the automatic inspection device.

As an automatic inspection apparatus for this type of electronic equipment, there is a technique described in Patent Document 1.
The technique of Patent Document 1 is such that a circuit board holding part of an electronic device to be inspected can be detachably attached, and a predetermined measurement point of the circuit board attached to the board holding part is in contact with the measurement point. And a probe moving means for moving the probe in accordance with a movement command from the outside and bringing it into contact with a predetermined measurement point of the circuit board, with respect to the circuit board attached to the board holding portion. The signal applying means gives an operation signal for causing the actual operation to be performed, and the inspection control means stores in advance each measurement point of the circuit board from which the signal is to be extracted by the probe, and the circuit board In the state of being operated based on the operation signal, a movement command for bringing the probe into contact with the stored measurement points is sequentially given to the probe moving means. Then, the probe moving means moves the probe in accordance with a movement command from the inspection control means to contact a predetermined measurement point on the circuit board, whereby a signal at the measurement point is taken out from the probe. The measuring means measures the signal extracted by the probe with reference to a predetermined reference voltage, and determines the quality of the electronic device based on the measurement result.

In particular, the automatic inspection apparatus of Patent Document 1 switches the reference voltage used for measurement to any one of a plurality of types of reference voltages in response to an external switching command, and each measurement point on the circuit board and the plurality of types of references. A switching command is stored in advance in association with any of the voltages, and the reference voltage stored in correspondence with the measurement point with which the probe is brought into contact among the plurality of types of reference voltages is used for measurement by the measurement means. Is given.
Therefore, it is possible to accurately measure the voltage or waveform of the signal at the measurement point using the optimum reference voltage for each measurement point on the circuit board, and as a result, to accurately check the quality of the electronic device. become able to. In other words, the optimum reference voltage for each measurement point is examined in advance, and any one of the plurality of types of reference voltages can be selectively switched, and the optimum reference voltage for each measurement point and that measurement point. If the voltage is stored in correspondence with each other, the voltage or waveform of the signal at each measurement point is measured with reference to the optimum reference voltage for that measurement point, and the quality of the electronic device can be accurately determined. it can.
Japanese Patent Application Laid-Open No. 11-94907

  However, the technique of Patent Document 1 has a problem that when a plurality of types of reference voltages are detected from a circuit board via a probe, the detection signals are not stabilized and the electronic device cannot be evaluated properly. In addition, there is a problem that a lead wire that sends a measurement signal from the probe to the measuring device picks up radiation noise and lowers its measurement accuracy. Then, the inspection control means stores in advance each measurement point of the circuit board to be inspected from which the signal is extracted by the probe, and operates the probe to each determined measurement point. It becomes a noise (disturbance) of the electronic device and enters the measurement circuit, and the presence of the noise causes a reduction in measurement accuracy of the electronic device.

  Accordingly, the present invention has been made to solve such a problem, and it is a first object of the present invention to provide a probe for an automatic inspection device for an electronic device that makes it difficult for noise to be exerted on a measurement signal between the probe and the probe and the measurement device. A second problem is to provide an automatic inspection apparatus for electronic equipment in which a signal for moving the probe does not enter the measurement signal as noise when measuring the electronic equipment to be inspected. is there.

The probe for an automatic inspection apparatus for an electronic device according to claim 1 has a detection end portion that elastically contacts a signal terminal (ground terminal) of the electronic device to be inspected, and the electronic device to be inspected from an output end on the opposite side. A signal obtained from the signal terminal is output to the measuring device side, and at least the detection end and the output end at both ends thereof are removed, and a plunger formed by coating the outer peripheral length direction with an insulator, The cover body is slidably disposed in the length direction thereof, and elasticity is imparted in the length direction of the plunger by a spring disposed between the plunger and the cover body.
Here, the plunger has a detection end that elastically contacts a signal terminal (ground terminal) of the electronic device to be inspected and an output end that outputs a signal obtained from the signal terminal of the electronic device to be inspected to the measuring device side. The outer circumference of the outer circumference of the outer circumference is insulated by an insulating layer so long as it does not cause electrical conduction between the plunger and the cover body. Moreover, the said cover body should just cover the said spring and the said plunger is arrange | positioned slidably in the length direction. And the said spring should just be arrange | positioned between the said plunger and the said cover body, and should provide an elastic force to the said plunger.
The signal terminal in the present invention does not simply mean a terminal having a predetermined voltage, but also means a signal terminal whose output is a ground potential, and is connected to a ground terminal that is dropped to ground. Case, ground wire, etc.

According to a second aspect of the present invention, there is provided a probe for an automatic inspection device for an electronic device, which has a detection end portion that elastically contacts a signal terminal and a ground terminal of the electronic device to be inspected. While outputting the signal obtained from the signal terminal and the ground terminal to the measuring device side, excluding the detection end portion and the output end portion at both ends, a pair of plungers each having an outer peripheral length direction as an insulating layer, The cover body is slidably disposed in the length direction thereof, and an elastic force is applied in the length direction of the plunger by the springs disposed between the plunger and the cover body. In addition, the signal lines connected to the output ends of the pair of plungers that elastically contact the signal terminals of the electronic devices to be inspected of the pair of plungers are geometrically substantially symmetrical and have the same length. Including substantially the same length (roughly, the magnitude of the error is determined by the frequency).
Here, the pair of plungers, except for the signal terminal of the electronic device to be inspected and the detection end that elastically contacts the ground terminal, and the signal terminal that outputs the signal obtained from the signal terminal to the measuring device side and the ground terminal, What is necessary is just to insulate the length direction of the outer periphery as an insulating layer, and electrical conduction does not generate | occur | produce between the circumference | surroundings of a plunger. Further, the pair of springs may be any one provided between the pair of plungers and the cover body and imparting an elastic force to the pair of plungers. And as long as the said cover body covers the said spring, even if it is a pair or may be integral.
In addition, the ground terminal in the present invention does not mean only a terminal that has been dropped to ground, but a case connected to the ground, a ground wire, etc., and a signal terminal whose output is a ground potential. Is.

  According to a third aspect of the present invention, there is provided a probe for an automatic inspection device for an electronic device, wherein a signal line leading to a measurement device connected to an output end of a pair of plungers elastically contacting a signal terminal (ground terminal) of the electronic device to be inspected is provided. , Using shielded wires. Here, the signal line that is the core wire may be any one that can reduce much of the external noise by being shielded and dropped to the ground side.

The automatic inspection device for an electronic device according to claim 4 has a detection end portion that elastically contacts the signal terminal of the electronic device to be inspected, and is obtained from the signal terminal of the electronic device to be inspected from the opposite output end portion. A probe having a plunger that outputs a signal to the measuring device, a multi-axis robot that moves the probe in a two-dimensional space or a three-dimensional space, and a shield box that houses a robot control circuit that controls the posture of the multi-axis robot A measuring apparatus housed in a shield room and connected to the output ends of a pair of plungers of the probe and a robot controller for controlling the posture of the multi-axis robot are installed outside the shield room.
Here, the probe has a detection end that elastically contacts the signal terminal of the electronic device to be inspected, and a signal obtained from the signal terminal of the electronic device to be inspected from the output end on the opposite side to the measuring device side. It has a plunger to output, has a detection end that elastically contacts the signal terminal of the electronic device to be inspected, and measures the signal obtained from the signal terminal of the electronic device to be inspected from the output end on the opposite side While outputting to the apparatus side, the length direction of the outer periphery is insulated as an insulating layer except for the detection end and the output end at both ends.
The optical cable outputs a signal reaching a measuring device connected to output ends of a pair of plungers of the probe that are elastically contacted with a signal terminal and a ground terminal of the electronic device to be inspected. The multi-axis robot moves the probe in a two-dimensional space or a three-dimensional space in accordance with the position of the signal terminal of the electronic device to be inspected. Further, the shield room accommodates the multi-axis robot, the probe, and the shield box as long as it shields and blocks electromagnetic waves. In particular, it is desirable to support AM (amplitude modulation), FM (frequency modulation), and PM (pulse modulation) of frequencies from the middle wave to the giga band.
Furthermore, the measuring device is connected to the other end of the optical cable and installed outside the shield room, so that signal processing in the measuring device does not enter the measuring system due to noise. is there. The shield box only needs to prevent noise from the robot control circuit of the multi-axis robot.

  The robot control device installed outside the shield room of the automatic inspection apparatus for electronic equipment according to claim 5 controls the multi-axis robot installed inside the shield room with a fluid. Here, the robot control device may be any device that can prevent noise from the multi-axis robot without generating noise from the robot control system by using a fluid. That is, the multi-axis robot is controlled with fluid from the outside of the shield room in order to prevent noise from being generated by a drive control signal.

The probe for an automatic inspection apparatus for an electronic device according to claim 1 has a detection end portion that elastically contacts a signal terminal of an electronic device to be inspected, and is obtained from a signal terminal of the electronic device to be inspected from an opposite output end portion. The output signal is output to the measuring device side, and the plunger with an insulating layer is slid only in the length direction by the cover body except for the detection end and output end at both ends. The plunger is elastically brought into contact with the detection end of the electronic device to be inspected by a spring arranged between the plunger and the cover body, and an electric signal is transmitted only through the plunger. Output to the measuring device side.
Thus, since the length direction of the outer periphery of the plunger is an insulator, other than the plunger does not have conductivity, and enters the signal obtained from the signal terminal of the electronic device to be inspected from other parts. Noise can be eliminated and noise can be prevented from entering from the probe. In addition, since the insulating layer is formed in the length direction of the outer periphery of the plunger, parts such as a spring are energized with the plunger and no resonance frequency is generated. Therefore, noise is not placed on the measurement signal of the probe.

The probe for an automatic inspection apparatus for an electronic device according to claim 2 has a detection end portion that elastically contacts a signal terminal and a ground terminal of the electronic device to be inspected, and a terminal of the electronic device to be inspected from an output end on the opposite side A signal terminal and a ground end, a detection end and an output end that are output to the measuring device side are output to the measuring device side, and a pair of insulating layers are formed in the outer peripheral length direction. The plunger is made slidable only in the length direction by the cover body, and is connected to the signal terminal of the electronic device to be inspected by a pair of springs disposed between the pair of plungers and the cover body. The detection end of the plunger is elastically contacted, and an electric signal from the signal terminal of the electronic device to be inspected is output to the measuring device side only through the plunger. And the output on the measuring device side from the plunger is connected to the output end of a pair of plungers that are elastically contacted with the signal terminal and the ground terminal of the electronic device to be inspected, and is geometrically substantially symmetric. In addition, the signal is output by a signal line having substantially the same length.
Thus, since the length direction of the outer periphery of the plunger is coated with an insulator, other than the plunger does not have electrical conductivity, and the signal obtained from the signal terminal of the electronic device to be inspected is different from that of the signal. The signal that enters from the portion can be eliminated, and noise from the probe can be prevented. In addition, since the insulating layer is formed in the length direction of the outer periphery of the plunger, parts such as a spring are energized with the plunger and no resonance frequency is generated. Further, the output on the measuring device side from the plunger is connected to the output ends of a pair of plungers that are elastically contacted with the signal terminal and the ground terminal of the electronic device to be inspected, and has geometrically substantially symmetrical properties. In addition, since the signals are output by a pair of signal lines having substantially the same length, even if external noise enters the pair of signal lines, they are canceled out and do not appear as outputs. Therefore, no noise is placed on the measurement signal between the probe and the probe and the measuring device.

  A signal wire leading to a measuring device connected to an output end of a pair of plungers elastically contacting a signal terminal and a ground terminal of the electronic device to be inspected of the probe for an automatic inspection device for an electronic device according to claim 3 is a shielded wire. In addition to the effect according to claim 2, since the signal of the electronic device to be inspected is shielded, no noise enters from the outside, and the measurement value is caused by noise. Error does not occur.

The automatic inspection apparatus for an electronic device according to claim 4 has a detection end portion that elastically contacts a signal terminal of the electronic device to be inspected, and a signal obtained from the signal terminal of the electronic device to be inspected from an output end on the opposite side A shield box that houses a probe that outputs to the measuring device, a multi-axis robot that moves the probe in a two-dimensional space or a three-dimensional space, and a robot control circuit that controls the attitude of the multi-axis robot. A measuring apparatus connected to the output ends of a pair of plungers of the probe and a robot controller for controlling the attitude of the multi-axis robot are provided outside the shield room.
Thus, the multi-axis robot, the probe, and the shield box that houses the robot control circuit of the multi-axis robot are housed in a shield room, and the measurement device and the robot control device are disposed outside the shield room. Since the multi-axis robot, the probe, and the robot control circuit of the multi-axis robot are put in a shield box, the noise generation source is confined by the shield box in the shield room, and the shield room Since there is almost no noise from the outside and no radiation noise generated in the shield room, measurement without noise is possible. In addition, the use of the multi-axis robot can cope with changes in the shape of the electronic device to be inspected. Therefore, the control signal of the robot when the device to be inspected that moves the probe does not enter the electronic device as noise.

  The robot control device installed outside the shield room of the automatic inspection device for electronic equipment according to claim 5 is configured to control on / off of the power of the multi-axis robot installed in the shield room with a fluid. In addition to the effects described in claim 4, the robot control device uses a fluid to generate noise from the robot control system without causing noise from the robot control system. Generation of electromagnetic noise from the axis robot can be prevented.

[Embodiment 1]
Hereinafter, embodiments of the present invention will be described with reference to the drawings. Note that, in each embodiment, the same symbols and the same reference numerals in the drawings are the same or corresponding functional parts, and therefore, redundant description is omitted here.

FIG. 1 is a configuration diagram of a probe for an automatic inspection apparatus for an electronic device according to Embodiment 1 of the present invention.
In the figure, a plunger 10 made of a metal such as brass or aluminum has a detection end 10a that elastically contacts a signal terminal 2 (see FIG. 6) of an electronic device 1 to be inspected (see FIGS. 5 and 6). A signal obtained from the signal terminal 2 of the electronic device 1 to be inspected is output from the opposite output end 10b to the measuring device 3 (see FIG. 5) side, and the detection end 10a and the opposite output end 10b are output. The insulating layer 11 is formed by coating the length of the outer periphery with an insulator except for both ends. The insulating layer 11 may be coated with a synthetic resin on the surface of the plunger 10 or may be fitted with a cylindrical insulating tube. The detection end portion 10a elastically contacting the signal terminal 2 of the electronic device 1 may be conical, but in the present embodiment, the center is a concave portion, and the tip end is projected at three points on the outer periphery. The contact is surely made.

  The insulating layer 11 of the plunger 10 has the outer circumferential length direction as the insulating layer 11 except for both ends of the detection end portion 10a and the output end portion 10b opposite to the detection end portion 10a. The output end 10b may be further coated with a synthetic resin or the like so that conduction with the signal line 16 is obtained. In particular, the output end portion 10b may be coated after being connected so as to obtain conduction with the signal line 16. In any case, the insulating layer 11 may be formed at the output end 10b to such an extent that electrical conduction is obtained.

  In the present embodiment, an insulating layer 11 made of synthetic resin is formed on the outer periphery of the plunger 10, and the flange 12 made of an insulator is insulated from the plunger 10 by injection molding near the center of the length of the plunger 10. The layers 11 are formed integrally with each other. The outer periphery of the large-diameter portion of the flange 12 is a sliding surface, and has a structure that slides on the inner surface of the cover body 13. In addition, a spring 14 made of a coil spring is inserted into the small diameter portion, and the compression direction and the extension direction of the elastic force compressed between the end portion of the cover body 13 are regulated.

  In addition, although the insulating layer 11 and the flange 12 were demonstrated in the example which carried out 2 color molding of the synthetic resin, it can be integrally injection-formed by the single material of a synthetic resin on the outer periphery of the plunger 10. FIG. Moreover, although demonstrated by the example which consists of a coil spring as the spring 14, when implementing this invention, the spring 14 is not limited to a coil spring, It can also be set as the spring of another structure.

  That is, the end on the one output end 10b side of the cover body 13 is a contact portion 13a of a through hole that contacts the insulating layer 11 of the plunger 10, and one end of the spring 14 is provided there. It is arranged. The outer periphery of the flange 12 on the large diameter side is slidable on the inner surface of the cover body 13. A spiral is formed on the outer periphery of the end portion of the flange 12, and the stopper 15 is screwed to restrict the flange 12 from being removed from the cover body 13. On the large diameter portion side of the flange 12 of the cover body 13, a spiral is formed on the outside, the stopper 15 is screwed and the stopper 15 restricts the flange 12 from being removed from the cover body 13.

The cover body 13 and the stopper 15 may be formed of an insulating material such as synthetic resin, or may be formed of an electric conductor such as metal. In the case of forming with an electric conductor, it is desirable to introduce a ground potential.
A connection terminal 10c that outputs a signal obtained from the signal terminal 2 of the electronic device 1 to be inspected to the measuring device 3 side is formed on the output end 10b side of the plunger 10. In the connection terminal 10c, a crimp terminal 16a is attached to the end of the signal line 16, and the crimp terminal 16a is screwed with a screw 16b. The output end 10b side of the plunger 10 for carrying out the present invention only needs to be electrically and mechanically connected to the signal line 16.

  As described above, the probe for an automatic inspection apparatus for an electronic device according to the first embodiment has the detection end portion 10a that elastically contacts the signal terminal 2 of the electronic device 1 to be inspected, and inspects from the output end portion 10b on the opposite side. A signal obtained from the signal terminal 2 of the target electronic device 1 is output to the measuring device 3 side, and both the ends of the detection end portion 10a and the output end portion 10b are excluded, and the length direction of the outer periphery is formed by the insulating layer 11. And a cover body 13 that covers the plunger 10 and is slidably disposed in the length direction of the plunger 10, and is disposed between the plunger 10 and the cover body 13. And a spring 14 that is non-conductive with the plunger 10 and obtains an elastic contact force with the signal terminal 2 of the electronic device 1 to be inspected. Here, the plunger 10, the insulating layer 11, the flange 12, the cover body 13, the spring 14, and the stopper 15 constitute the probes A and B. Here, the probe A detects the signal of the electronic device 1 to be inspected, and the probe B detects the ground potential.

  In addition, the signal terminal and the ground terminal in the present invention do not simply mean a terminal having a predetermined voltage, but also include a signal terminal whose output is a ground potential. The case 1a of the electronic device 1 (see FIG. 6), the ground wire, and the like are also used as a signal terminal and a ground terminal.

  The probe for an automatic inspection apparatus for an electronic device according to the present embodiment has a detection end portion 10a that elastically contacts the signal terminal 2 of the electronic device 1 to be inspected, and the electronic device 1 to be inspected from an output end portion 10b on the opposite side. The signal obtained from the signal terminal 2 is output to the measuring device 3 side, and the length direction of the outer periphery thereof is formed by an insulating layer 11 made of an insulating material except for the detection end 10a and the output end 10b at both ends. The plunger 10 is slidable only in the length direction by the cover body 13, and the signal of the electronic device 1 to be inspected by the spring 14 disposed between the plunger 10 and the cover body 13. The detection end 10a of the plunger 10 is elastically contacted with the terminal 2, and an electric signal is output to the measuring device 3 side only through the plunger 10.

  Thus, since the length direction of the outer periphery of the plunger 10 is coated with an insulator, other than the plunger 10 has no electrical conductivity, and the signal obtained from the signal terminal 2 of the electronic device 1 to be inspected Signals entering from other parts can be eliminated, and noise can be prevented from entering. Moreover, since the length direction of the outer periphery of the plunger 10 is formed by the insulating layer 11 made of an insulating material, components such as the spring 14 are energized with the plunger 10 and no resonance frequency is generated. Therefore, noise does not appear on the measurement signal.

[Embodiment 2]
FIG. 2 is a configuration diagram of a probe for an automatic inspection apparatus for an electronic device according to Embodiment 2 of the present invention, and shows a front view (a) and a plan view (b). FIG. 3 is a front view (a) and a plan view (b) of a first modification of the probe for an automatic inspection device for an electronic device according to the second embodiment of the present invention, and FIG. 4 is a diagram of the embodiment of the present invention. They are the front view (a) and the top view (b) with the block diagram of the modification 2 of the probe for automatic inspection apparatuses of the electronic device in 2. FIG.

2 to 4, the configuration of the plunger 10, the insulating layer 11, the flange 12, the spring 14, the stopper 15, etc. as a probe for an automatic inspection device for electronic equipment is basically the same as that of the first embodiment. The description is omitted.
Each of the cover bodies 13 of the present embodiment has an independent structure and accommodates two independent plungers 10, but the cover bodies 13 are connected to each other on the main body attachment portion 13b side, It may be integrated. The cylinder chuck 51 is a tip of a hand of the multi-axis robot 5 (see FIGS. 5 and 6), and a main body attachment portion 13b of the cover body 13 is attached thereto by a bolt.
A long hole 13c for derivation of a signal line is formed in the cover body 13, and the signal line 16 connected to the output end 10b side of the plunger 10 is taken out from the cover body 13 to the outside.

The signal line 16 includes a probe A for detecting a signal of the electronic device 1 to be inspected and a probe B for detecting a ground potential, both of which are connected to the output end 10 b side of the plunger 10. It is taken out from the hole 13c. The signal lines 16 from the probe A and the probe B to the measuring device 3 have substantially the same length from each probe, and the shape of the signal line 16 is geometrically substantially symmetric. It is Needless to say, the pair of signal lines 16 may be bound with an insulating wire harness binding tape to be substantially symmetrical. In the embodiment of FIG. 2, at the position of the cylinder chuck 51 of the multi-axis robot 5, the pair of signal lines 16 are fixed by an insulating saddle 13d. However, in order to obtain the geometrical symmetry of the pair of signal lines 16, a margin of one turn is provided so that the pair of signal lines 16 is not distorted.
Therefore, the change of the signal line 16 due to the expansion and contraction of the plunger 10 is performed from the output end portion 10b of the plunger 10 to the position of the saddle 13d, but the distortion caused by the reciprocation of the plunger 10 is a pair of signal lines. It avoids joining 16 specific locations.

  In the embodiment shown in FIG. 2, even if the plunger 10 has a large variation, the long hole 13c for deriving the signal line can cope with it. However, in reality, the detection end 10a of the plunger 10 imparts an elastic force by a variation of about 10 [mm] at the signal terminal 2 of the electronic device 1 to be inspected. As in the first modification of the embodiment, the signal line 16 connected to the output end 10b side of the plunger 10 from the small hole 13e formed of a circle can be taken out from the cover body 13.

  In the second modification of the embodiment shown in FIG. 4, as in the embodiment shown in FIG. 2, at the position of the cylinder chuck 51 of the multi-axis robot 5, the pair of signal wires 16 are fixed by an insulating saddle 13d. However, in order to obtain the approximate symmetry of the pair of signal lines 16, no allowance for one turn is provided. That is, the change of the signal line 16 due to the expansion and contraction of the plunger 10 is performed from the output end 10b of the plunger 10 to the position of the saddle 13d, but the distortion is not applied to a specific place of the pair of signal lines 16. Therefore, it is wired with a little clearance. The long hole 13f for deriving the signal line prevents stress from entering a specific location of the pair of signal lines 16. The long hole 13g is for internal confirmation.

  A phase adjustment circuit, that is, a parallel circuit of a resistor and a trimmer capacitor may be connected in series to the probe A that detects the signal of the electronic device 1 to be inspected. This phase adjustment circuit is calibrated so that waveform distortion does not occur depending on the detected frequency, and is usually adjusted by changing the capacitance of the trimmer capacitor. Of course, an electronic circuit with a high internal impedance can also be used for this purpose.

  The probe for an automatic inspection device for an electronic device according to the second embodiment has a detection end portion 10a that elastically contacts a signal terminal 2 of the electronic device 1 to be inspected and a ground terminal obtained from the case 1a side of the electronic device 1, and the opposite side. A signal obtained from the signal terminal 2 of the electronic device 1 to be inspected is output from the output end 10b to the measuring device 3 side, and both the ends of the detection end 10a and the output end 10b are excluded, and the length direction of the outer periphery thereof A pair of plungers 10 covered with an insulating layer 11 made of an insulating material, and a cover formed by covering the plunger 10 and the plunger 10 being slidably disposed in the length direction of the plunger 10. A pair of body 13 and a pair of plungers 10 and cover body 13, which is non-conductive between plungers 10 and obtains elastic contact force with signal terminal 2 of electronic device 1 to be inspected. Spring 14 and inspection The signal terminal 2 of the target electronic device 1 is connected to the other end of the pair of plungers 10 that are elastically contacted with the ground terminal, and has a pair of signal lines 16 that are substantially symmetrical and have substantially the same length. is there.

  The probe for an automatic inspection device for an electronic device according to the second embodiment has a detection end portion 10a that elastically contacts the signal terminal 2 of the electronic device 1 to be inspected and the ground terminal on the case 1a side, and an output end portion 10b on the opposite side. A signal obtained from the signal terminal 2 of the electronic device 1 to be inspected is output to the measuring device 3 side, and the detection terminal 10a and the output end 10b are output to the signal terminal 2 and the grounding end and measuring device 3 side. Except for the above, the pair of plungers 10 in which the outer peripheral length direction is insulated by the insulating layer 11 are slidable only in the length direction by the cover body 13, and the pair of plungers 10 and the cover body 13 One end of the plunger 10 is elastically brought into contact with the signal terminal 2 of the electronic device 1 to be inspected by a pair of springs 14 disposed between them, and the electric signal from the signal terminal 2 of the electronic device 1 to be inspected is plunged. And outputs to the measuring unit 3 side through only -10. The output on the measuring device 3 side from the plunger 10 is output from the pair of plungers 10 via the signal terminal 2 of the electronic device 1 to be inspected and the detection end 10a elastically contacting the case 1a side (earth terminal). The signal is output by the signal line 16 connected to the end 10b.

  In this way, since the insulating layer 11 is formed of the insulator in the length direction of the outer periphery of the plunger 10, the parts other than the plunger 10 have no electrical conductivity and are obtained from the signal terminal 2 of the electronic device 1 to be inspected. Therefore, it is possible to eliminate a signal that enters the received signal from another part, and to prevent noise from entering from the probe A. Moreover, since the length direction of the outer periphery of the plunger 10 is formed by the insulating layer 11 made of an insulating material, components such as the spring 14 are energized with the plunger 10 and no resonance frequency is generated. Further, the output on the measuring device 3 side from the plunger 10 is connected to the signal terminal 2 of the electronic device 1 to be inspected and the other end of the pair of plungers 10 that are in elastic contact with the case 1a side (ground terminal), and is substantially symmetrical. Therefore, even if external noise enters the pair of signal lines 16, they are canceled out and do not appear as outputs. . Therefore, noise does not enter the measurement signal between the probes A and B and the probes A and B and the measuring device.

Further, in the embodiment shown in FIGS. 2 to 4, the signal terminal 2 of the electronic device 1 to be inspected and the measuring device 3 connected to the other end of the pair of plungers 10 elastically contacting the case 1a side (ground terminal) are reached. In the case of using a shielded wire with its covering side shielded for the pair of signal lines 16, the shielding of the signal of the electronic device 1 to be inspected eliminates the intrusion of noise from the outside, and the measured value includes noise. No error due to.
Then, the signal line 16 reaching the measuring device 3 connected to the output end 10b of the other end of the pair of plungers 10 elastically contacting the signal terminal 2 of the electronic device 1 to be inspected is phase-shifted to the one signal line 16. In the case where the adjustment circuit is connected, phase disturbance due to the difference in frequency of the signal obtained from the signal terminal 2 of the electronic device 1 to be inspected does not occur, and the frequency band that can be measured in a range with less noise is widened. be able to.

The probe for an automatic inspection device for an electronic device configured as described above is installed as follows.
FIG. 5 is an overall configuration diagram of an electronic apparatus automatic inspection apparatus using the electronic apparatus automatic inspection apparatus probe according to Embodiment 3 of the present invention. FIG. 6 is a multi-axis robot (a) of the electronic device automatic inspection apparatus according to Embodiment 3 of the present invention, an explanatory view (b) of front alignment, and an explanatory view (c) of alignment in the front-rear direction.

  In FIG. 5, a shield room 30 is an electromagnetically sealed dead room that is magnetically and electrically shielded so that electromagnetic waves do not enter from the outside, and has an electric field strength of a predetermined value or less. Similarly, the shield box 31 is an electromagnetically sealed dead room, and is connected to a robot control circuit (not shown) for controlling the teaching of the multi-axis robot 5 and / or an output end 10b of the pair of plungers 10 of the probe. Thus, an electrical / optical conversion circuit (not shown) that performs electrical / optical conversion of a signal reaching the measuring device 3 side is accommodated.

  In the multi-axis robot 5, each joint is controlled by a fluid such as hydraulic pressure controlled by a robot control circuit. The work table 32 is a table on which the electronic device 1 to be inspected is placed, has a predetermined weight, and specifies at least a two-dimensional position or a three-dimensional position of the electronic device 1 to be inspected. Specifically, as shown in FIG. 6C, the front surface of the electronic device 1 to be inspected is positioned by the front reference piece 32c formed on the upper surface of the work table 32, and then shown in FIG. 6B. As described above, one side surface of the electronic device 1 is aligned with the left and right reference pieces 32a that specify the front reference position of the work table 32, the movable reference piece 32b is pressed from the other side surface, and the movable reference piece 32b is specified there. The electronic device 1 is fixed. The positioning of the front surface of the electronic device 1 to be inspected by the front reference piece 32c shown in FIG. 6C may be the positioning of the back surface of the electronic device 1. The positioning of the electronic device 1 may be performed manually or may be performed by the multi-axis robot 5.

  When the electronic device 1 to be inspected is thus positioned, the position of the signal terminal 2 on the back surface of the electronic device 1 is specified. Here, the case where the signal terminal 2 is the screw signal terminal 2a, 2b,... 2j will be described, but even in the case of the connector, the basic operation is the same as the shape of the tip of the plunger 10 is different. Since the case 1a of the electronic device 1 is normally on the ground side, the plunger 10 on the probe A side sequentially contacts the screw signal terminals 2a, 2b,... 2j, and the probe B side is on the case 1a side. The position is controlled so as to be elastic. Specifically, in the embodiment, the probe A is in elastic contact with the screw signal terminals 2a to 2e and the probe B, and the probe A is in contact with the screw signal terminals 2f to 2j and the probe B. The signal is detected by elastic contact with the case.

  The shield box 31 of the present embodiment accommodates a robot control circuit (not shown) that controls the multi-axis robot 5 therein. In addition, an electrical / optical conversion circuit (not shown) that performs electrical / optical conversion is also accommodated as a signal output that is connected to the output ends 10b of the pair of plungers 10 of the probe A and the probe B and reaches the measuring device 3. And between the measuring device 3 installed outside the shield room 30, the optical cable 40 leads to the outside of the shield room 30. Further, the robot controller 4 installed outside the shield room 30 is led out of the shield room 30 through a shielded pipeline.

  Here, between the probe A and the probe B of the measuring device 3 and the multi-axis robot 5, the output of each terminal is output during the measurement time in order to confirm the signal of the electronic device 1 to be inspected in real time. In order to prevent noise from appearing, the outputs of the probe A and the probe B are subjected to electrical / optical conversion by an electrical / optical conversion circuit in the middle to cope with noise. Of course, when the present invention is carried out, the signal line 16 may be guided directly to the outside of the shield room 30 through the shielded pipeline and connected to the measuring apparatus 3.

The robot control device 4 teaches the screw signal terminals 2a, 2b,..., 2j of the signal terminal 2 of the electronic device 1 to be inspected, and sequentially turns the screw signal terminals 2a, 2b,. Therefore, there is no need to instruct it from the outside of the shield room 30, and it may be controlled in the shield box 31. At this time, the circuit between the robot controller 4 and the shield box 31 can be dropped to the ground potential.
In the case of controlling each joint of the multi-axis robot 5 with a fluid, the fluid control can be performed outside the shield room 30.

  As described above, the automatic inspection device for an electronic device according to the present embodiment includes the detection end portion 10a elastically contacting the screw signal terminals 2a, 2b,..., 2j of the signal terminal 2 of the electronic device 1 to be inspected, and the signal. It has a detection end 10a that elastically contacts the case 1a of the terminal 2, and is obtained from the screw signal terminals 2a, 2b,..., 2j of the signal terminal 2 of the electronic device 1 to be inspected from the opposite output end 10b. Probe A and probe B having a plunger 10 that outputs the signal obtained from the case 1a and the signal obtained from the case 1a to the measuring device 3 side, and the probe A and the case 1a (grounding terminal) elastically contacting the signal terminal 2 of the electronic device 1 to be inspected The optical cable 40 for outputting a signal reaching the measuring device 3 connected to the other end of the pair of plungers 10 of the probe B that is elastically contacted with a) as an electrical / optical conversion signal, and the probe A and the probe B in a two-dimensional space or A multi-axis robot 5 that moves in a three-dimensional space, and an electric / optical conversion circuit (not shown) that is connected to the other end of the pair of plungers 10 of the probe A and the probe B and that converts the signal reaching the measuring device 3 side. A shield box 31 that houses a part of the optical cable 40 that outputs the electrical / optical conversion signal and a robot control circuit (not shown) of the multi-axis robot 5, and the multi-axis robot 5, probe A, probe B, and shield. A shield room 30 that accommodates the box 31 and a measuring device 3 that is installed outside the shield room 30 and connected to the other end of the optical cable 40 are provided.

In addition, the automatic inspection apparatus for an electronic device according to the present embodiment is connected to the multi-axis robot 5, the probe A and the probe B, and the output end 10b of the pair of plungers 10 of the probe A and the probe B, and the measuring apparatus. A shield box 31 that houses an electrical / optical conversion circuit (not shown) that converts the signal reaching the 3 side, an optical cable 40 that outputs the electrical / optical conversion signal, and a robot control circuit (not shown) of the multi-axis robot 5. Is placed in the shield room 30 and the control device 4 installed outside the shield room 30 for controlling the multi-axis robot 5 and the measuring device 3 connected to the other end of the optical cable 40 are arranged outside the shield room 30. The multi-axis robot 5, the probes A and B, and the robot control circuit (not shown) of the multi-axis robot 5. Since one end of the electrical / optical conversion circuit and the optical cable 40 (not shown) is put in the shield box 31, the noise generation source is confined by the shield box 31 in the shield room 30, and the shield room 30 is externally connected. Since the configuration is such that noise does not enter, there is almost no radiation noise generated in the shield room, and measurement without noise is possible. Further, the use of the multi-axis robot 5 can cope with a change in the shape of the electronic device 1 to be inspected. In addition, the use of an optical cable prevents electromagnetic waves from being added as noise.
Therefore, the control signal of the robot and the signal at the time of signal conversion of the electrical / optical conversion circuit when moving the device to be inspected for moving the probe A and the probe B do not enter the electronic device 1 as noise.

  The automatic inspection apparatus for electronic devices according to the above-described embodiments has a detection end 10a that elastically contacts the signal terminal 2 of the electronic device 1 to be inspected, and the electronic device 1 to be inspected from the output end 10b on the opposite side. The probe A and probe B having a plunger 10 for outputting a signal obtained from the signal terminal 2 and ground to the measuring device 3 side, and the probe A and probe B elastically contacting the signal terminal 2 and ground of the electronic device 1 to be inspected An optical cable 40 that outputs a signal reaching the measuring device 3 connected to the output end 10b of the pair of plungers 10 as an electrical / optical conversion signal, and a probe that moves the probe A and probe B in a two-dimensional space or a three-dimensional space. Connects to the output end 10b of the pair of plungers 10 of the axis robot 5 and the probe A and probe B, and converts the signal reaching the measuring device 3 side to electricity / light (not shown) A shield box 31 that houses a part of the optical / optical conversion circuit and the optical cable 40 that outputs the electrical / optical conversion signal; a shield room 30 that houses the multi-axis robot 5, probe A, probe B, and shield box 31; The measuring device 3 installed outside the shield room 30 and connected to the other end of the optical cable 40 and the probe A and the probe B attached to the multi-axis robot 5 can move freely in a two-dimensional space or a three-dimensional space. The robot control circuit 4 is provided outside the shield room 30 controlled by a fluid.

  The automatic inspection apparatus for electronic equipment according to the present embodiment is connected to the output end 10b of the multi-axis robot 5, the probe A and the probe B, and the pair of plungers 10 of the probe A and the probe B, and the measuring apparatus 3 side. An electric / optical conversion circuit for converting the signal to the electric / optical signal and a shield box 31 for accommodating a part of the optical cable 40 for outputting the electric / optical conversion signal are accommodated in the shield room 30, and the optical cable is provided outside the shield room 30. The measuring device 3 and the robot control device 4 connected to the other end side of 40 are arranged. One end of the multi-axis robot 5, the probe A and the probe B, the electric / optical conversion circuit and the optical cable 40 is used as the shield box 31. The noise generation source is confined by the shield box 31 in the shield room 30, and Since the noise from outside the shielded room 30 is configured not to enter, it is possible to measure not enter noise.

Further, the use of the multi-axis robot 5 can cope with a change in the shape of the electronic device 1 to be inspected. Furthermore, the multi-axis robot 5 can control the two-dimensional space or the three-dimensional space to move freely between the robot control device 4 installed outside the shield room 30 via a fluid. At this time, when the electronic device 1 to be inspected for moving the probe A and the probe B is moved, the operation signal of the multi-axis robot 5 does not enter the electronic device 1 as noise.
Therefore, the control signal of the multi-axis robot 5 when the electronic device 1 to be inspected that moves the probe A and the probe B is moved, and the signal at the time of signal conversion of the electrical / optical conversion circuit enters as noise of the electronic device. There is no.
Then, the robot controller 4 is turned on / off via a fluid between the multi-axis robot 5 in the shield room 30 and the robot controller 4 installed outside the multi-axis robot 5. Such control can control between the multi-axis robot 5 in the shield room 30 and the robot controller 4 installed outside the room with an optical signal.

FIG. 1 is a configuration diagram of an automatic detection input detection apparatus according to Embodiment 1 of the present invention. FIG. 2 is a configuration diagram of the automatic inspection input detection apparatus according to the second embodiment of the present invention, and shows a front view (a) and a plan view (b). FIG. 3 is a front view (a) and a plan view (b) of a configuration diagram of Modification Example 1 of the automatic inspection input detection apparatus according to Embodiment 2 of the present invention. FIG. 4 is a front view (a) and a plan view (b) of a configuration diagram of a second modification of the automatic inspection input detection device according to the second embodiment of the present invention. FIG. 5 is an overall configuration diagram of an electronic apparatus automatic inspection apparatus using the automatic inspection input detection apparatus according to Embodiment 3 of the present invention. FIG. 6 is a multi-axis robot (a) of the electronic device automatic inspection apparatus according to Embodiment 3 of the present invention, an explanatory view (b) of front alignment, and an explanatory view (c) of alignment in the front-rear direction.

Explanation of symbols

A, B Probe 1 Electronic device 1a to be inspected Case 3 Measuring device 4 Robot controller 10 Plunger 10a Detection end 10b Output end 11 Insulating layer 13 Cover body 14 Spring 16 Signal line 30 Shield room 31 Shield box

Claims (5)

It has a detection end that elastically contacts the signal terminal of the electronic device to be inspected, and outputs the signal obtained from the signal terminal of the electronic device to be inspected from the opposite output end to the measuring device side and also detects both ends A plunger formed by forming an insulating layer in the length direction of the outer periphery, excluding the end and the output end,
A cover body that covers the plunger and in which the plunger is slidably disposed in its length direction;
A spring that is disposed between the plunger and the cover body, is non-conductive between the plunger, and obtains an elastic contact force with a signal terminal of the electronic device to be inspected. Probe for automatic inspection equipment of electronic equipment. It has a detection end that elastically contacts the signal terminal and the ground terminal of the electronic device to be inspected, and outputs the signal obtained from the signal terminal of the electronic device to be inspected from the opposite output end to the measuring device side, A pair of plungers formed by forming an insulating layer in the length direction of the outer periphery, excluding the detection ends and output ends at both ends,
A single or a pair of cover bodies covering the plunger, the plunger being slidably disposed in its length direction;
A pair of springs disposed between the pair of plungers and the cover body, non-conducting between the plungers, and obtaining an elastic contact force with the inspection object;
A probe for an automatic inspection device for an electronic device, comprising: a pair of signal lines connected to output ends of the pair of plungers and geometrically substantially symmetrical and having substantially the same length .   3. The probe for an automatic inspection device for an electronic device according to claim 2, wherein a shield wire is used for the pair of signal lines reaching the measuring device connected to the output ends of the pair of plungers. A probe having a detection end that elastically contacts a signal terminal of an electronic device to be inspected, and a plunger that outputs a signal obtained from the signal terminal of the electronic device to be inspected to the measuring device side from an output end on the opposite side When,
A multi-axis robot that moves the probe in a two-dimensional space or a three-dimensional space;
A shield box containing a robot control circuit for controlling the posture of the multi-axis robot;
A shield room that houses the multi-axis robot, the probe, and the shield box;
A measuring device connected to the output ends of a pair of plungers of the probe and installed outside the shield room;
An automatic inspection apparatus for electronic equipment, comprising: a robot control device installed outside the shield room for controlling the posture of the multi-axis robot.   The automatic inspection apparatus for an electronic device according to claim 4, wherein the robot control device installed outside the shield room controls the multi-axis robot installed in the shield room with a fluid. .

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