JP2009300185A - Circuit group, its test method, and test device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a circuit group, its test method and a test device. <P>SOLUTION: The test method includes: a step of regulating a first voltage of a first circuit into a second voltage neared to a reference voltage rather than the first voltage based on a first regulation signal; a step of regulating a third voltage of a second circuit into a fourth voltage neared to the reference voltage rather than the third voltage based on a second regulation signal; and a step of regulating margin ranges of the second voltage and the fourth voltage together based on a margin regulation signal. Thereby, test times of the first circuit and the second circuit are shortened to save a cost. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a circuit group test technique, and more particularly to a test technique for a margin voltage (Margin Voltage) of a plurality of circuits.

  For many integrated circuits (ICs), a DC voltage generator is usually disposed therein. If the voltage provided to the IC by the DC voltage generator is inappropriate, the IC may not be able to operate normally. Therefore, after the IC is manufactured, the yield of the IC is usually secured by testing the IC. Hereinafter, a conventional circuit test technique will be described in detail with reference to the accompanying drawings.

  FIG. 1 is a diagram illustrating a circuit that includes adjusting the voltage of a DC voltage generator by fuse technology. Please refer to FIG. The circuit 11 includes a DC voltage generator 101 and a test mode adjustment unit (Test Mode Trim Unit) 102. The DC voltage generator 101 is used to provide a DC voltage V1. The test mode adjustment unit 102 tests whether the circuit 11 can operate normally by adjusting the DC voltage V1 to various different test voltages Vout.

一般的に言えば、回路のテストは、２段階に分けられ、第一段階は、最適な動作電圧に最も近いテスト電圧を回路１１へ提供し、これにより、回路１１が正常に動作できるかをテストする。第二の階段は、マージン電圧を回路１１へ提供し、また、回路１１が正常に動作できるかをテストし、これにより、回路１１の品質を確保する。 First, it is assumed that the optimum operating voltage of the circuit 11 is 2.5V and the margin voltage is 2.3V to 2.7V. Further, as shown in Table 1, it is assumed that the test mode adjustment unit 102 has eight types of test modes.

Generally speaking, circuit testing is divided into two stages, where the first stage provides the test voltage closest to the optimum operating voltage to the circuit 11 to determine whether the circuit 11 can operate normally. Testing. The second step provides a margin voltage to the circuit 11 and tests whether the circuit 11 can operate normally, thereby ensuring the quality of the circuit 11.

  Assume that the DC voltage V1 generated by the DC voltage generator 101 is 2.65V. In the first stage of the circuit test, in order to simulate whether the circuit 11 can operate normally under the optimum operating voltage, first, the test mode of the test mode adjustment unit 102 is set to “0, 1, 0”. As a result, a voltage deviation of −0.1 V is generated in the DC voltage V1, a test voltage of 2.55 V is output to the circuit 11, and subsequently whether the circuit 11 can operate normally under the margin voltage. Testing. If the circuit 11 can operate normally, it means that the circuit 11 can be repaired by the fuse technology, and if the circuit 11 cannot operate normally, this means that the circuit 11 has a defect and cannot be shipped. Can avoid buying a circuit that can not work properly.

  Also, in the second stage of the circuit test, in order to simulate whether the circuit 11 can operate normally under the margin voltage, first, the test mode of the test mode adjustment unit 102 is changed to “1, 0, 0”. As a result, a voltage deviation of +0.05 V is generated in the DC voltage V1, and a test voltage Vout of 2.7 V is output to the circuit 11. In this way, by using the test voltage Vout of 2.7V, it is possible to simulate whether the circuit 11 can operate normally under the margin voltage 2.7V.

  Further, the test mode of the test mode adjustment unit 102 is changed to “0, 1, 1”, thereby generating a voltage deviation of −0.2 V in the DC voltage V1, and causing the circuit 11 to have a test voltage of 2.45V. Can be output. In this way, by using the test voltage Vout of 2.45V, it is possible to simulate whether the circuit 11 can operate normally under the margin voltage 2.3V. Note that due to the limitation of the test mode adjustment unit 102, the test mode adjustment unit 102 may provide a test voltage of 2.3V for simulating whether the circuit 11 can operate normally under a margin voltage of 2.3V. Can not. In other words, the above operation cannot ensure that the circuit 11 operates normally under 2.3V to 2.45V.

  Moreover, assume that there are 100 circuits 11 that need to be tested. Since the DC voltage V1 generated by the DC voltage generator 101 of each circuit 11 is somewhat different from each other, when testing the circuit, the test mode adjustment unit 102 of the 100 circuits 11 is set one by one, An appropriate test voltage must be generated. More specifically, according to the conventional method described above, assuming that the test time required for each circuit 11 in the first and second stages of the circuit test is T1 and T2, respectively, The total time required for the test is 100 × (T1 + T2). Therefore, in the conventional method, a considerable time is required and the cost is wasted.

Refer to FIG. 1 again. As before, assume that there are 100 circuits 11 that need to be tested. In order to reduce the total time required for circuit testing, other test methods have been proposed in the prior art. In this method, in the first stage of circuit test, first, a test apparatus (not shown)
Is used to simultaneously provide a test voltage V1 of 2.5V to the 100 circuits 11, thereby testing in parallel whether the 100 circuits 11 can operate normally.

  Also, in the second stage of the circuit test, first, a test voltage V1 of 2.3 V is simultaneously provided to 100 circuits 11 using a test device, so that the 100 circuits 11 can operate normally. Are tested in parallel. Subsequently, by using the test apparatus again, a test voltage V1 of 2.7 V is simultaneously provided to the 100 circuits 11, thereby testing in parallel whether the 100 circuits 11 can operate normally. Although this method can reduce the total time required for circuit testing, it cannot ensure that all the DC voltage generators 101 of the 100 circuits 11 operate normally. In other words, if the DC voltage generator 101 of the circuit 11 has a defect, it is still possible to cause the circuit 11 to be unable to operate normally. However, the conventional method cannot detect whether the DC voltage generator 101 has a defect.

  In addition, since the test voltage V1 provided by the test apparatus is fairly stable and has a strong driving capability, even if a current leak or the like occurs in the circuit 11, the test voltage V1 cannot be shifted. In other words, when the circuit 11 has a fault such as current leakage, even if the DC voltage generator 101 of the circuit 11 provides an operating voltage of 2.5 V to the circuit 11, the circuit 11 has a fault such as current leakage. This causes a shift in the operating voltage provided by the DC voltage generator 101 (for example, shifts to 2.0 V), and in this way, the circuit 11 may not operate normally. . However, the conventional method cannot detect such a defect.

  An object of the present invention is to provide a circuit group capable of improving circuit test yield.

  Another object of the present invention is to provide a circuit group testing method capable of testing a plurality of circuits in parallel and saving the test cost.

  Another object of the present invention is to provide a test apparatus capable of testing a plurality of circuits in a circuit group in parallel, reducing the test time, and reducing the cost.

  In order to achieve the above-described object, the circuit group according to the present invention includes a small number of first circuits and second circuits. The test method according to the present invention includes a step of adjusting the first voltage of the first circuit based on the first adjustment signal to a second voltage that is closer to the reference voltage than the first voltage, and a second step based on the second adjustment signal. Adjusting a third voltage of the two circuits to a fourth voltage that is closer to the reference voltage than the third voltage; and adjusting a margin range of the second voltage and the fourth voltage together based on a margin adjustment signal; ,including.

  The present invention relates to a circuit group capable of improving circuit test yield, a circuit group test method capable of saving test cost by testing a plurality of circuits in parallel, and a plurality of circuits in the circuit group in parallel. By providing a test device, the test time can be shortened and the cost can be reduced.

  Next, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

  FIG. 2 is a diagram illustrating a circuit group and a test apparatus thereof according to an embodiment of the present invention. Please refer to FIG. In this embodiment, the circuit group includes circuits 21 to 24. On the other hand, the test apparatus 25 includes control units 211 and 212. In the present embodiment, the circuits 21 to 24 include a DC voltage generator 201 and voltage adjustment modules 202 and 203, respectively.

  In the circuit 21, the DC voltage generator 201 can receive the operating voltage Vw, thereby generating the voltage Vin1. The voltage adjustment module 202 of the circuit 21 can adjust the voltage Vin1 to the voltage Vref1 approaching the reference voltage based on the adjustment signal S1 provided by the control unit 211. The voltage adjustment module 203 of the circuit 21 adjusts the margin range of the voltage Vref1 based on the margin adjustment signal Sma provided by the control unit 212. More specifically, the voltage adjustment module 203 of the circuit 21 can adjust the voltage Vref1 to the voltage Vref1 ± ΔV based on the margin adjustment signal Sma.

  Similarly, in the circuit 22, the DC voltage generator 201 can receive the operating voltage Vw, thereby generating the voltage Vin2. The voltage adjustment module 202 of the circuit 22 can adjust the voltage Vin2 to the voltage Vref2 approaching the reference voltage based on the adjustment signal S2 provided by the control unit 211. The voltage adjustment module 203 of the circuit 22 can adjust the margin range of the voltage Vref2 based on the margin adjustment signal Sma provided by the control unit 212. More specifically, the voltage adjustment module 203 of the circuit 22 can adjust the voltage Vref2 to the voltage Vref2 ± ΔV based on the margin adjustment signal Sma. The same applies to the circuits 23 and 24, and the description thereof is omitted here.

  In the prior art, since the DC voltage generator 201 cannot generate an accurate voltage, the voltages Vin1 to Vin4 generated by the DC voltage generator 201 of the circuits 21 to 24 are slightly different from each other. Vref1 to Vref4 and voltages Vref1 ± ΔV to Vref4 ± ΔV are also slightly different from each other.

  When viewed from another angle, the control unit 211 in the test apparatus 25 is coupled to the voltage adjustment module 202 of the circuits 21 to 24, respectively. The control unit 211 can generate the adjustment signals S1 to S4 based on the voltages Vin1 to Vin4 of the circuits 21 to 24, respectively, thereby controlling the voltage adjustment modules 202 of the control circuits 21 to 24, respectively. Further, the control unit 212 in the test unit 25 is coupled to the voltage adjustment module 203 of the circuits 21 to 24, respectively. The control unit 212 controls the voltage adjustment module 203 of the circuits 21 to 24 while generating the margin adjustment signal Sma.

本実施例において、回路群の回路２１〜２４のテストは、２段階に分けられる。第一段階は、回路２１〜２４が最適な動作電圧の下で正常に動作できるかをシミュレーションする。第二階段は、回路２１〜２４がマージン電圧の下で正常に動作できるかをシミュレーションする。以下、まず、第一段階について説明を行う。 FIG. 3 is a flowchart of a circuit group test method according to an embodiment of the present invention. Please refer to FIG. 2 and FIG. In the present embodiment, it is assumed that the optimum operating voltage of the circuits 21 to 24 is 2.5V and the margin voltage is 2.3V to 2.7V. Further, as shown in Table 2, it is assumed that the voltage adjustment module 202 has eight types of adjustment modes. Furthermore, as shown in FIG. 3, it is assumed that the voltage adjustment module 203 also has eight types of adjustment modes.

In the present embodiment, the tests of the circuits 21 to 24 in the circuit group are divided into two stages. The first stage simulates whether the circuits 21 to 24 can operate normally under an optimum operating voltage. The second step simulates whether the circuits 21-24 can operate normally under the margin voltage. Hereinafter, the first stage will be described first.

First Stage First, the test apparatus 25 provides the operating voltage Vw to the DC voltage generator 201 of the circuits 21 to 24, thereby causing the DC voltage generator 201 of the circuits 21 to 24 to generate voltages Vin1 to Vin4, respectively. In this embodiment, the voltages Vin1 to Vin4 are described as examples of 2.65V, 2.53V, 2.33V, and 2.15V, respectively. However, the present invention is not limited to this. Subsequently, the control unit 211 of the test apparatus 25 generates the adjustment signals S1 to S4 based on the voltages Vin1 to Vin4, respectively, thereby controlling the voltage adjustment modules 202 of the circuits 21 to 24, respectively.

  Further, when viewed from the angle of the circuit group, the voltage adjustment module 202 of the circuit 21 can adjust the voltage Vin1 to the voltage Vref1 approaching the reference voltage based on the adjustment signal S1 (step S301). In the present embodiment, the case where the reference voltage is the optimum operating voltage of 2.5 V will be described as an example, but the present invention is not limited to this. In other embodiments, the reference voltage may be other voltage values. More specifically, in step S301, the voltage adjustment module 202 of the circuit 21 adjusts the adjustment mode to “0, 1, 0” based on the adjustment signal S1, and sets the voltage Vin1 of 2.65 V to 2. It can be adjusted to a voltage Vref1 of 55V.

  Similarly, the voltage adjustment module 202 of the circuits 22 to 24 can adjust the voltages Vin2 to Vin4 to voltages Vref2 to Vref4 approaching the reference voltage based on the adjustment signals S2 to S4, respectively (step S302). More specifically, in step S302, the voltage adjustment module 202 of the circuit 22 sets its adjustment mode to “0, 0, 0” based on the adjustment signal S2, and sets the voltage Vin2 of 2.53 V to 2. The voltage Vref2 of 53V can be maintained. Also, the voltage adjustment module 202 of the circuit 23 can set the adjustment mode to “1, 1, 0” based on the adjustment signal S3, and adjust the voltage Vin3 of 2.33V to the voltage Vref3 of 2.48V. it can. Further, the voltage adjustment module 202 of the circuit 24 can set the adjustment mode to “1, 1, 1” based on the adjustment signal S4 and adjust the voltage Vin4 of 2.15V to the voltage Vref4 of 2.35V. it can.

  Subsequently, the voltage adjustment module 203 of the circuits 21 to 24 outputs the voltages 2.55V, 2.53V, 2.48V and 2.35V by using the preset adjustment mode “0, 0, 0”, respectively. can do. In this way, the circuit 21 can simulate whether the circuit 21 can operate normally under the optimum operating voltage by using the voltage 2.55V. If the circuit 21 can operate normally, it means that the circuit 21 can be repaired by the fuse technology, and if the circuit 21 cannot operate normally, this means that the circuit 21 has a defect and cannot be shipped. Can avoid buying a circuit that can not work properly. The same applies to the circuits 22 to 24, and the description thereof is omitted here.

  An advantage of the above-described method is that the voltage used after the circuits 21 to 24 are packaged can be correctly simulated. Therefore, it is possible to correctly indicate whether the circuits 21 to 24 can be normally operated when actually used, thereby improving the test quality.

第二段階
続いて、第二段階において、回路２１〜２４がマージン電圧の下で正常に動作できるかをシミュレーションする。第二段階において、回路２１〜２４の電圧調整モジュール２０２の調整モードが第一段階と同様に維持されても良い。本実施例において、回路２１〜２４がマージン電圧の下で正常に動作できるかをシミュレーションするために、制御ユニット２１２がマージン調整信号Ｓｍａを生成することのみにより、回路２１〜２４の電圧調整モジュール２０３の調整モードを同時に制御する必要がある。他の角度から見ると、回路２１〜２４は、マージン調整信号Ｓｍａに基づいて電圧Ｖｒｅｆ１〜Ｖｒｅｆ４のマージン範囲を同時に調整することができる（ステップＳ３０３）。 In order to more clearly represent the output / input voltages of the voltage regulation module 202 of the circuits 21-24, they are summarized in Table 4 here. Here, Table 5 summarizes the output / input voltages of the voltage adjustment module 203 of the circuits 21 to 24.

Following the second stage , in the second stage, it is simulated whether the circuits 21 to 24 can operate normally under the margin voltage. In the second stage, the adjustment mode of the voltage adjustment module 202 of the circuits 21 to 24 may be maintained as in the first stage. In this embodiment, in order to simulate whether the circuits 21 to 24 can operate normally under the margin voltage, the voltage adjustment module 203 of the circuits 21 to 24 is only generated by the control unit 212 generating the margin adjustment signal Sma. It is necessary to control the adjustment modes simultaneously. Viewed from another angle, the circuits 21 to 24 can simultaneously adjust the margin ranges of the voltages Vref1 to Vref4 based on the margin adjustment signal Sma (step S303).

  For example, in order to simulate whether the circuits 21 to 24 can normally operate under the margin voltage 2.3 V, first, the margin adjustment signal Sma is generated by the control unit 212 while the voltage adjustment module 203 of the circuits 21 to 24 is configured. The adjustment mode is set to “1, 0, 1”, thereby causing the voltage adjustment module 203 of the circuits 21 to 24 to output voltages 2.35V, 2.33V, 2.28V and 2.15V, respectively. In this way, the circuits 21 to 24 can operate normally under a margin voltage of 2.3 V by using 2.35 V, 2.33 V, 2.28 V, and 2.15 V, respectively. Can be simulated.

  Further, for example, in order to simulate whether the circuits 21 to 24 can normally operate under the margin voltage 2.7 V, first, the control unit 212 generates the margin adjustment signal Sma and the voltage adjustment modules of the circuits 21 to 24. The adjustment mode 203 is set to “0, 1, 0”, thereby causing the voltage adjustment module 203 of the circuits 21 to 24 to output voltages 2.75V, 2.73V, 2.68V, and 2.55V, respectively. In this way, the circuits 21 to 24 can operate normally under a margin voltage of 2.7 V by using 2.75 V, 2.73 V, 2.68 V, and 2.55 V, respectively. Can be simulated.

  The advantage of the above-described method is that the test time of the circuit group can be greatly saved. More specifically, in the second stage of the present embodiment, the circuits 21 to 24 can be tested in parallel at the same time, so that the test time of the circuit group can be greatly saved. In addition, since the margin voltage to be used after the circuits 21 to 24 are packaged can be correctly simulated, it is possible to correctly represent whether the circuits 21 to 24 can operate normally when the circuits 21 to 24 are actually used, thereby improving the test quality. be able to. In order to more clearly show the test time saved by the present embodiment, the technology according to the present embodiment is compared with the conventional technology.

  Refer to FIG. 1 again. According to the prior art, the total time required for testing 100 circuits 11 is 100 × (T1 + T2). However, if the technique of the present embodiment is applied to the above-described example, the total time required for testing 100 circuits 11 becomes (100 × T1) + T2. Therefore, according to the present embodiment, the total time required for the circuit test can be surely shortened, and the test quality can be maintained. For example, the defect of the DC voltage generator 101 can be detected. it can. Therefore, the technique according to the present embodiment can solve the problems existing in the conventional technique for a long time.

  Refer to FIG. 2 again. In the embodiment described above, the circuit group is described based on only the circuits 21 to 24, but the present invention is not limited to this. In other embodiments, the number of circuits in the circuit group may be other values.

  In addition, although the embodiment of the circuit group and its test method and test apparatus has been described in the above-described embodiment, as those skilled in the art know, the circuit group and test method and test apparatus adopted by each manufacturer are described. Since the design is different, the application of the present invention is not limited to such an embodiment. In other words, the first voltage of the first circuit is adjusted to the second voltage based on the first control signal, and the third voltage of the second circuit is adjusted to the fourth voltage based on the second adjustment signal. If the margin ranges of the second voltage and the fourth voltage are adjusted together based on the adjustment signal, they belong to the scope of the present invention. Hereinafter, other embodiments of the voltage regulation module will be described.

  Hereinafter, another embodiment of the voltage regulation module 202 in FIG. 2 will be provided. FIG. 4 is a circuit diagram of the voltage regulation module of FIG. Please refer to FIG. 2 and FIG. In this embodiment, since the voltage adjustment modules 202 of the circuits 21 to 24 are similar to each other, only the voltage adjustment module 202 of the circuit 21 will be described here, but an embodiment of the voltage adjustment module 202 of the circuits 22 to 24 will be described. Is the same.

  For convenience of explanation, here, three types of adjustment mode embodiments of the voltage adjustment module 202 are listed. This allows one skilled in the art to infer embodiments of different numbers of adjustment modes of the voltage adjustment module 202. The voltage regulation module 202 of the circuit 21 includes an amplifier 41, a transistor 42, and a variable voltage dividing module 43. The variable voltage dividing module 43 includes a switch unit and fuse units 401 to 406 and resistors 411 to 414. The variable voltage dividing module 43 can change the connection relationship of the internal circuits of the variable voltage dividing module 43 by determining the conduction states of the switch unit and the fuse units 401 to 406 based on the adjustment signal S1. . The purpose of this approach is to output the voltage Vref1 at the third end of the variable voltage divider module 43 by adjusting the resistance ratio between the ends of the variable voltage divider module 43.

  For example, when the switch unit and the fuse units 401, 405, and 406 are conducted and the switch unit and the fuse units 402 to 404 are not conducted, the variable voltage dividing module 43 is set to the first adjustment mode. When the switch unit and the fuse units 401, 404, and 406 are conducted and the switch unit and the fuse units 402, 403, and 405 are not conducted, the variable voltage dividing module 43 is set to the second adjustment mode. When the switch unit and the fuse units 402 and 403 are conductive and the switch unit and the fuse units 401 and 404 to 406 are not conductive, the variable voltage dividing module 43 is set to the third adjustment mode. In this way, the voltage Vref1 can have three kinds of voltage changes. In addition, those skilled in the art may change the resistance values of the resistors 411 to 414 according to the actual situation, and thereby the voltage Vref1 having various voltage values can be generated.

  On the other hand, since the switch unit and the fuse units 401 to 406 include a switch (not shown) and a fuse (not shown), respectively, the switch unit and the fuse units 401 to 406 have their conduction states based on the adjustment signal S1. Determined and used for testing. Further, after the test of the circuit 21 is completed, the voltage Vref1 is fixed by fusing the fuses of the switch unit and the fuse units 401 to 406 by laser technology. Thereby, the error of the voltage generated by the DC voltage generator 201 is reduced.

  Those skilled in the art can vary the embodiments of the voltage regulation module 202 depending on the actual situation. For example, a switch unit may be used instead of the switch unit of the variable voltage dividing module 43 and the fuse units 401 to 406 in FIG. FIG. 5 is another circuit diagram of the voltage regulation module in FIG. Please refer to FIG. 2, FIG. 4 and FIG. The variable voltage dividing module 44 in FIG. 5 is similar to the variable voltage dividing module 43 in FIG. 4 except that the variable voltage dividing module 44 in FIG. 5 includes switch units 421 to 426 and resistors 411 to 414. There is to include.

  2 is similar to the voltage adjustment module 202, the voltage adjustment module 203 of the circuits 21 to 24 may be referred to the embodiment of FIGS. 4 and 5, and the description thereof will be given here. Omitted.

  Therefore, the present invention adjusts the first voltage of the first circuit to the second voltage based on the first adjustment signal, and the second voltage is closer to the reference voltage than the first voltage. Further, the third voltage of the second circuit is adjusted to the fourth voltage based on the second adjustment signal, and the fourth voltage is closer to the reference voltage than the third voltage. Further, the margin range of the second voltage and the fourth voltage is adjusted based on the margin adjustment signal. Thereby, the test time of a 1st circuit and a 2nd circuit can be shortened, and cost can be saved.

  The present invention has at least the following advantages.

  1. In the second stage of circuit test (margin voltage test), cost can be saved by significantly reducing test time using parallel test technology.

  2. By performing the test using the DC voltage generator in the circuit, it is possible to reliably detect the defects of the DC voltage generator and to correctly simulate the actual operation state of the circuit. As a result, circuit yield and test quality can be improved.

  3. By arranging a fuse unit in the voltage regulation module and repairing an error in the voltage generated by the DC voltage generator by the fuse technology, the circuit yield can be improved.

  The preferred embodiment of the present invention has been described above, but the present invention is not limited to this embodiment, and all modifications to the present invention are within the scope of the present invention unless departing from the spirit of the present invention.

It is a figure which shows the conventional circuit which adjusts the voltage of a DC voltage generator by fuse technique. It is a figure which shows the circuit group and its test device by the Example of this invention. 5 is a flowchart of a circuit group testing method according to an embodiment of the present invention. FIG. 3 is a circuit diagram of the voltage adjustment module in FIG. 2. It is another circuit diagram of the voltage adjustment module in FIG.

Explanation of symbols

11, 21-24 Circuit 25 Test device 41 Amplifier 42 Transistor 43 Variable voltage dividing module 101, 201 DC voltage generator 102 Test mode adjustment unit 202, 203 Voltage adjustment module 211, 212 Control unit 401-406 Switch unit and fuse unit 411 to 414 Resistors 421 to 426 Switch unit V1, Vout, Vw, Vin1 to Vin4, Vref1 to Vref4, Vref1 ± ΔV to Vref4 ± ΔV, VCC, GND voltage S1 to S4, Sma adjustment signal S301 to S303 Each step of the test method

Claims (10)

A circuit group including a first circuit and a second circuit,
The first circuit is:
Adjusting a first voltage of the first circuit to a second voltage based on a first adjustment signal, the second voltage being closer to a reference voltage than the first voltage;
A second voltage adjustment module connected to the first voltage adjustment module and adjusting a margin range of the second voltage based on a margin adjustment signal;
Including
The second circuit is:
Adjusting a third voltage of the second circuit to a fourth voltage based on a second adjustment signal, wherein the fourth voltage is closer to a reference voltage than the third voltage;
A fourth voltage adjustment module connected to the third voltage adjustment module and adjusting a margin range of the fourth voltage based on the margin adjustment signal;
including,
Circuit group. The circuit group further includes a third circuit,
The third circuit is:
Adjusting a fifth voltage of the third circuit to a sixth voltage based on a third adjustment signal, wherein the sixth voltage is closer to a reference voltage than the fifth voltage;
A sixth voltage adjustment module connected to the fifth voltage adjustment module and adjusting a margin range of the sixth voltage based on the margin adjustment signal;
including,
The circuit group according to claim 1. The first voltage regulation module includes:
An amplifier having a first input for receiving the first voltage;
A variable voltage division module having a first end and a second end connected to a second input end of the amplifier and a reference voltage, respectively, wherein the variable voltage division module is based on the first adjustment signal. Adjusting the ratio of the resistance value from the first end to the third end of the variable voltage dividing module and the resistance value from the second end to the third end of the variable voltage dividing module. A variable voltage dividing module for outputting the second voltage to the third end;
A transistor having a gate end and a first end connected to an output end of the amplifier and an external voltage, respectively, and a second end of the transistor is connected to a fourth end of the variable voltage dividing module. A transistor,
including,
The circuit group according to claim 1. The second voltage regulation module is
An amplifier having a first input for receiving the second voltage;
A variable voltage dividing module having a first end and a second end connected to a second input end of the amplifier and a reference voltage, respectively, the variable voltage dividing module based on the margin adjustment signal Adjusting the ratio between the resistance value from the first end to the third end of the variable voltage dividing module and the resistance value from the second end to the third end, and the margin range of the second voltage is adjusted. A variable voltage divider module to adjust,
A transistor having a gate end and a first end connected to an output end of the amplifier and an external voltage, respectively, and a second end of the transistor is connected to a fourth end of the variable voltage dividing module. A transistor,
including,
The circuit group according to claim 1. The first circuit further includes:
A first DC voltage generator connected to the first voltage regulation module and receiving an operating voltage to generate the first voltage;
The circuit group according to claim 1. The second circuit further includes:
A second DC voltage generator connected to the third voltage regulation module and receiving the operating voltage to generate the third voltage;
The circuit group according to claim 5. The first voltage regulation module further includes:
Including a fuse unit for fixing the first voltage to the second voltage;
The circuit group according to claim 1. The first circuit and the second circuit have the same components,
The circuit group according to claim 1. A test method for a circuit group including at least a first circuit and a second circuit,
Adjusting the first voltage of the first circuit based on a first adjustment signal to a second voltage that is closer to the reference voltage than the first voltage;
Adjusting the third voltage of the second circuit based on a second adjustment signal to a fourth voltage that is closer to the reference voltage than the third voltage;
Adjusting the margin range of the second voltage and the fourth voltage together based on a margin adjustment signal;
including,
Test method. A test apparatus for testing a circuit group including at least a first circuit and a second circuit,
The first circuit and the second circuit are connected to generate a first adjustment signal based on the first voltage of the first circuit, and the first circuit generates the first voltage based on the first adjustment signal. Adjusting the second voltage closer to the reference voltage than the first voltage, and generating a second adjustment signal based on the third voltage of the second circuit, wherein the second circuit is based on the second adjustment signal A first control unit that adjusts the third voltage to a fourth voltage that is closer to the reference voltage than the third voltage;
A second control unit connected to the first circuit and the second circuit to generate a margin adjustment signal and adjust a margin range of the second voltage and the fourth voltage together;
including,
Test equipment.

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