JP2009283062A - Testing/diagnosing method and testing/diagnosing device for storage device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To test and diagnose a storage device, more precisely to provide a testing/diagnosing method and a testing/diagnosing device for testing the storage device and performing diagnosis for specifying a repair location for the storage device which is determined as being a failure. <P>SOLUTION: The testing/diagnosing method of the storage device includes: the testing step of executing testing for a test target storage device under predetermined environmental conditions; and the diagnosing step of performing, for a storage device determined to be a failure in the testing step, diagnosis to specify a repair place for the failure under environmental conditions identical to the predetermined environmental conditions, after the testing step, and executes the testing step and the diagnosing step, by changing the predetermined environmental conditions. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a test and diagnosis of a storage device, and more specifically, a test / diagnosis method and a test / diagnosis device for testing a storage device and performing a diagnosis for specifying a repair location for a storage device determined to be defective. It is about.

  A storage device using a magnetic disk or an optical disk as a storage medium is indispensable for a computer system. These storage devices undergo a test based on a predetermined test specification through an assembly process, and devices that pass this test are shipped. In general, a device that has failed in a test is investigated by examining the cause of the defect, repairing the defective portion, and performing the test again.

  FIG. 7 shows these states, and the storage device 10 that has completed the assembly process 20 performs a test in a test process 30 based on predetermined test items. Those that pass this test will be packaged and shipped, but those that have become defective will be diagnosed, including data measurement, in the diagnostic step 40 to identify the repair location. The storage device that has identified the repaired part is sent to the repairing process 50, repaired, for example, by replacing a defective part based on the diagnosis result, and sent to the testing process 30 again.

  The test result data obtained in the test step 30 is stored in the storage unit of the test apparatus, and the diagnosis step 40 makes a diagnosis with reference to this data. The thick arrows in FIG. 7 indicate the flow of the storage device 10 to be tested. The numbers in parentheses drawn on the thick arrows are determined to be defective in the test process 30 after assembly, and pass in the test process 30 after repair. The order of the flow of the storage device 10 is shown. Thin arrows indicate the flow of data.

  A flow example of the test process 30 and the diagnosis process 40 shown in FIG. 7 will be described with reference to FIGS. Here, an example of a magnetic storage device will be described as the storage device 10 to be tested.

  FIG. 8 shows an example of the flow of the test process 30. A plurality (for example, several tens) of storage devices 10 to be tested are placed in a thermostatic chamber capable of changing the environmental temperature. Connected to the test equipment control board. Each storage device 10 is attached with a bar code label that describes the manufacturing number. The bar code reader reads the manufacturing number prior to the test, and the testing device stores this information.

  First, the thermostat is set to the environmental temperature “t1”, and tests of test items 1-1 to 1-h are performed at this temperature. Each storage device 10 exchanges information necessary for the test via the control board. For example, test data is sent to the storage device 10 and the data is recorded on the magnetic recording medium, and a test is performed to determine whether the recorded data has been recorded without error.

  Subsequently, the environmental temperature is set to “t2”, and tests of test items 2-1 to 2-i are similarly performed. Furthermore, the environmental temperature is set to “t3”, and the test items 3-1 to 3-j are performed. When each test item is executed and it is determined that the test item is defective, the error code of the test item is stored corresponding to the serial number (S100-S150).

  Next, referring to the test result data stored in the storage unit of the test apparatus, if there is a defect (NG) in each test item, it is sent to the diagnostic process, and the test results are those of the magnetic recording medium. It is sent to the shipping process after carrying out a shipping process for initialization, setting of parameters for the system area of the magnetic recording medium, and the like (S160, S170).

  Next, the flow of the diagnostic process 40 will be described with reference to FIG. The diagnostic device is connected to the test device, reads and displays the test result from the test device, and the operator can specify the repair location by looking at the displayed error code and the repair location cannot be specified. The correct storage device 10 is determined. The storage device 10 in which the diagnosis location can be specified is sent to the repair process (S300, S310).

  The storage devices 10 in which the repair location cannot be specified are installed in a thermostat and individually connected to the control board. Prior to diagnosis, the serial number is read by a bar code reader, and the diagnosis apparatus stores this information in the storage unit. The operator looks at the corresponding diagnostic item from the error code and instructs the diagnostic item at the same environmental temperature and the storage device 10 to be diagnosed to make a diagnosis. First, if there is a diagnosis of a diagnostic item for the environmental temperature t1, the thermostat is set to this temperature, and when the set temperature is reached, the diagnostic device diagnoses the designated storage device 10 for the designated diagnostic item. To do. The diagnosis result is stored in the storage unit of the diagnostic device. If there is no diagnosis of the environmental temperature t1, the process proceeds to the next diagnosis of the environmental temperature t2 (S320-S360).

  The diagnosis items are similarly applied to the environmental temperatures “t2” and “t3”. After all the diagnosis is completed, the diagnosis result for each serial number is displayed, and the operator identifies the diagnosis location by referring to this result. (S370-S430).

  In the above, the content of the test process and the diagnostic process currently performed was demonstrated.

In connection with the inspection of the storage device, a magnetic disk device evaluation method (Patent Document 1), an electronic device test chamber (Patent Document 2), and a magnetic disk device inspection at the time of shipping (Patent Document 3) have been proposed and reported. Yes.
Japanese Patent Laid-Open No. 08-297614 JP 2006-308368 A JP 2001-325779 A

  As described above, the storage device that has been assembled undergoes an operation test under different environmental conditions before shipping (testing process), and in order to identify a repair location for those that are determined to be defective in the test (Diagnosis process) Repair work is performed to repair defects. The time required for the test process and the diagnostic process is shown in FIG. 10, for example. FIG. 10 is determined by first carrying out a plurality of test items at room temperature (for example, 25 ° C.), then setting the thermostat to a low temperature (for example, 0 ° C.) and confirming that the temperature has been reached. The test items are performed, and the test is performed at a higher temperature (for example, 60 ° C.). It shows the transition of time when diagnosis was performed under the same environmental temperature after these tests were completed. That is, since the test is first performed at room temperature, the test time (T1) is required first, and since the next test is a low-temperature test, it is set to 0 ° C. and a waiting time (t1) until the temperature is reached is required. The In this way, a further low temperature test (T2), a waiting time until the temperature set to 60 ° C. as a high temperature test (t2), a high temperature test (T3), a waiting time until the temperature reaches room temperature (t3) ) To complete the test. Assuming that the temperature rise / fall time is 15 ° C./hour, and the times T1 to T3 are 2H, 4H, and 6H, respectively, the time required for the test process is 20H.

  After the test, the room temperature diagnosis is performed after the storage device removal time (H) (D1), the waiting time until the temperature becomes low (t1), the low temperature diagnosis time (D2), the high temperature waiting time (t2), and the high temperature diagnosis time. (D3) After the room temperature waiting time (t3), the diagnosis ends. The same time for temperature rise and fall as described above is required, and if H is 1H and each time from D1 to D3 is 0.5H, the time required for the diagnostic process is 10H.

  The total time required for testing and diagnosis is 30H, which requires a great deal of time, and therefore it is required to reduce the time.

  It is an object of the present invention to provide a test / diagnosis method and a test / diagnosis device that reduce the diagnosis time of a storage device.

The storage device test / diagnosis method and test / diagnosis device of the present invention are configured as follows.
(1) First invention
The storage device test / diagnosis method of the first invention is a storage device test / diagnosis method for performing a test on a storage device that has been assembled, and performing a diagnosis for specifying a repair location when repair is required. There is a test process for performing a test for determining whether or not an operation based on a predetermined specification under a predetermined environmental condition is performed on a storage device, and a storage device determined to be defective in the test process. On the other hand, following the test process, there is a diagnostic process for carrying out a diagnosis for specifying a repair location for the defect under the same environmental condition as the environmental condition. And a predetermined environmental condition is changed and a test process and a diagnostic process are implemented.

  The memory device test / diagnosis method of the second invention is implemented based on a diagnosis item corresponding to a test result in which the diagnosis in the diagnosis process of the first invention is judged to be defective, and corresponds to the result of the diagnosis. Then, the repair location is specified by a predetermined logic.

  According to a third aspect of the present invention, there is provided a memory device test / diagnosis method for accumulating information on the test results of the test process of the first or second invention and the diagnosis result of the diagnostic process, and statistically processing the accumulated information. To report.

  According to a fourth aspect of the present invention, there is provided a storage device test / diagnostic method for shipping, including a recording medium initialization process, for a storage device determined to be a non-defective product in the test steps of the first to third inventions. It is characterized by implementing.

  A storage device test / diagnosis device according to a fifth aspect of the present invention is a storage device test / diagnosis device that performs a test on a storage device that has been assembled, and performs a diagnosis that identifies a repair location when repair is required. Yes, a test unit that performs a test for determining whether an operation based on a predetermined specification is performed under a predetermined environmental condition for the storage device, and a storage device that is determined to be defective by the test unit, Subsequent to the test means, there is a diagnostic means for carrying out a diagnosis for identifying a repair location under the same environmental conditions as the environmental conditions. Then, the test means and the diagnosis means are implemented by changing predetermined environmental conditions.

  As described above, according to the present invention, the following effects can be obtained.

  According to the first invention, the test and the diagnosis are continuously performed under the same environmental condition, so that it is possible to eliminate the waiting time until the environmental condition in the conventional diagnostic process is reached, and to shorten the diagnosis time. Providing testing and diagnosis methods.

  According to the second aspect of the invention, the repair location can be automatically specified based on the diagnosis result, so that the time for specifying the repair location can be shortened in addition to the reduction of the diagnosis time of the first invention.

  According to the third invention, statistical processing is performed based on information accumulated in test results and diagnostic results. Therefore, the manufacturing process can be improved based on these statistical information.

  According to the fourth aspect of the invention, since the storage device having a non-defective test result is subsequently subjected to processing for shipping, no time is required for setting again for shipping processing, and the efficiency from manufacturing to shipping of the storage device is eliminated. Improvement can be achieved.

  According to the fifth aspect, it is possible to provide a test / diagnosis apparatus that exhibits the same effect as the first aspect.

  Embodiments of a storage device test / diagnosis method and a test / diagnosis device according to the present invention will be described with reference to FIGS. In this embodiment, a magnetic disk device is described as an example of a storage device to be tested, but a magneto-optical disk device or an optical disk device may be used.

  FIG. 1 shows the concept of the present invention and is drawn in correspondence with FIG. 7 (the same parts as those in FIG. 7 are given the same reference numerals). In FIG. 1, the storage device 10 that has completed the assembly process 20 performs a predetermined test in a test / diagnosis process 60, and subsequently performs a predetermined diagnosis on a defective test item. The test and diagnosis at this time are performed under the same environmental condition, and then the test and diagnosis are performed while changing the environmental condition. And a repair location is specified based on the logic predetermined based on the result of a test and a diagnosis. More specifically, the test is performed based on the test items determined under the first environmental condition, and the diagnosis is performed based on the diagnostic items that are determined after the test for those determined to be defective. The results of the test and diagnosis are stored in the storage unit as needed (test / diagnosis data 61 in FIG. 1). Next, the test and diagnosis are performed in the same manner while changing the environmental conditions. When all the tests and diagnosis are completed, the repair location is specified with reference to the diagnosis table 62 based on the test / diagnosis data 61. . The diagnosis table describes logic for specifying a repair location corresponding to the test and diagnosis results. The storage device 10 in which the repair location is specified is repaired in the repair process 50, and the test and diagnosis are performed again in the test / diagnosis process 60.

  Next, a configuration example of the test / diagnosis apparatus according to the present invention will be described with reference to FIG. The test / diagnosis device 100 is roughly divided into a processing device 200 for performing test and diagnosis processing, and various types of control (command control, test for the magnetic disk device 500 to be tested) based on commands from the processing device 200. A temperature control device (not shown) via a control IF 270 that houses a control device 300 that performs data exchange and data measurement, and a plurality of magnetic disk devices 500 and that maintains an environmental temperature during testing and diagnosis. Temperature is controlled by

  The processing device 200 includes a CPU 210 that performs overall control, a main memory 220 that executes a test / diagnosis program 230, a display 241 and a printer 242, which serve as an interface with an operator, a keyboard 243, and an input / output IF 240 that controls a barcode reader 244, A test / diagnosis data storage unit 250 for storing test and diagnosis result data, and a diagnosis table describing logic for specifying diagnosis items and repair points to be executed with respect to an error code given when a test fails. It consists of a diagnostic table storage unit 250 that stores data and a control IF 270 that commands the control device 300 based on the test / diagnosis program 230.

  The test / diagnosis program 230 further includes a test unit 231, a diagnosis unit 232, and a statistical processing unit 233. The main functions of each program will be described.

  The test unit 231 is a program in which contents for performing a predetermined test are described, and instructs the test target magnetic disk device 500 through the control IF 270. Further, the test result is received to determine good / failure, and in the case of failure, an error code for identifying the failure is stored in the test / diagnosis data storage unit 250 in association with the manufacturing number (note that the magnetic disk device) Prior to the 500 test, it is assumed that the serial number of the magnetic disk device 500 is read using the barcode reader 244 and stored in the test / diagnosis data storage unit 250).

  The diagnosis unit 232 is a program in which contents for performing a predetermined diagnosis are described, and refers to the diagnosis table to execute a diagnosis item corresponding to the error code on the magnetic disk device 500 via the control IF 270. In addition, the diagnostic result is received and the quality is determined by referring to the diagnostic table, and the repair location is specified based on the logic described in the diagnostic table. Information on the diagnosis result and the identified repair location is stored in the test / diagnosis data storage unit 250.

  The test unit 231 and the diagnosis unit 232 described above are called at any time in the test / diagnosis program 230 of the main program to perform a test or diagnosis process. The test process is performed by grouping test items performed at the same test temperature, and the diagnosis process performed when a test item becomes defective is scheduled to be performed at the test temperature. When the diagnosis temperature is not the same as the test temperature, if the diagnosis temperature and the test temperature are the same in the subsequent tests, the diagnosis is performed at that time. However, for example, the test temperature is scheduled so as to advance from t1 to t2, and a test failure occurs at the temperature of t2, so that the diagnosis temperature does not return to t1.

  The statistical processing unit 233 is a program that statistically processes, for example, a manufacturing lot, a defective rate for each period, a defective content, and the like based on data accumulated in the test / diagnosis data storage unit 250. Data statistically processed based on the operator's instruction is graphed and output from the display 241 or the printer 242.

  Next, data examples of the test / diagnosis data storage unit 250 and the diagnosis table storage unit 260 will be described.

  FIG. 3 shows an example of data stored in the test / diagnosis data storage unit 250. When a defect occurs in the test and diagnosis following the manufacturing number (Serial No.) of the magnetic disk device, the contents are recorded. Like to do. For example, the first line is a data example of the manufacturing number “ABC0000000001” of the magnetic disk device, and the second to tenth lines are data examples of the manufacturing number “ABC0000000002”. As shown here, in the data example “ABC0000000001”, there is no record of information indicating failure, indicating that it was determined as “pass” in the test. The data example of “ABC0000000002” is the head of the cylinder (Err Cylinder) “20111” in the test item (Err Test No.) “TEST1-1” at the test execution date (Err Date / Time) “2008.04.30 17:02” (Err Head) `` 01 '', sector (Err Sector) `` 525 '', temperature (Err Temp) `` RT (room temperature) '', error code (Err Code) `` E0002 '' failed, diagnosis result diagnosis item code (Err Diagnostic Code) “D02” indicates that it is determined as defective.

  FIG. 4 shows a description example of the diagnosis table storage unit 260, which is composed of fields including “error code”, “diagnostic item code”, “environment temperature”, “judgment criterion”, and “repair location specifying logical formula”. is doing. For example, the error code “E0001” does not require diagnosis and the repair location is “A”. For the error code “E0002”, diagnosis of the diagnosis item codes “D01” and “D02” is performed. The environmental temperature in each diagnosis at this time is “RT (room temperature)”, and the criterion is shown in FIG. The repair location is specified according to the description of the “repair location specifying logical formula”. For example, the serial number “ABC0000000002” shown in FIG. 3 is determined to be “D01”, and “D02” is determined to be good, so that the repair location is identified as “D” from the “repair location identification logical formula” shown in FIG. ("T" represents "good" and "F" represents "bad" in the repair location specifying logical formula).

  Next, a flow example of processing by the test / diagnosis apparatus 100 shown in FIG. 2 will be described with reference to FIG. This flow is executed by the test / diagnosis program 230, and the magnetic disk device 500 to be tested is read by the barcode reader 244 and stored in the test / diagnosis data storage unit 250 before entering the test in the same manner as described above. It is assumed that Further, the test / diagnosis program 230 assumes that the temperature is changed from “t1” to “t2” and “t3”.

  In FIG. 5, first, the first test item group (test items 1-1 to 1-h) is executed by the program of the test unit 231. If the test temperature of this group is “t1”, the temperature of the thermostatic bath 400 is set to “t1” before entering the test, and there is a waiting time until the temperature is reached (if t1 is room temperature, immediately Will enter the exam). When it is confirmed that the temperature of the thermostatic bath 400 has reached “t1”, the tests of the test items 1-1 to 1-h are performed. If a failure occurs in each test item, the error code corresponding to the failure is recorded in the test / diagnosis data storage unit 250 in correspondence with the manufacturing number. When the test items 1-1 to 1-h are completed, the test / diagnosis data storage unit 250 is referred to, and it is checked whether an error code is recorded for the manufacturing number. For example, referring to the diagnosis table storage unit 260, the diagnosis is performed by the program of the diagnosis unit 232 on the corresponding diagnosis item. If the diagnosis result is defective, the diagnosis item code is stored in correspondence with the manufacturing number (S500-S530).

  The same processing is performed with the set temperature of the thermostat 400 set to “t2”. When the process is completed, the set temperature is set to “t3” and the same process is performed (S540-S610).

  With the above, all the tests programmed in the test / diagnosis program 230 are completed, and the error code of the serial number and the diagnostic item code of the defect where the failure occurred in the test with reference to the test / diagnosis data storage unit 250 Based on the diagnosis table storage unit 260, the repair location is specified. A list is displayed on the display 241 by associating the serial number with the repair location. The list may be printed out from the printer 242 as necessary. The list-displayed magnetic disk device 500 is taken out of the thermostatic bath 400 and sent to the repair process. In addition, the above-described shipping process is applied to the magnetic disk device 500 in which no defect has occurred in the test, and is sent to the shipping process.

  In the above, the specific embodiment example of this invention was demonstrated. Next, FIG. 6 shows an example of the time required for testing and diagnosis according to the present invention. FIG. 6 is drawn in correspondence with FIG. 10 showing the conventional required time, and is the required time under the same conditions. As shown in FIG. 6, since the test process and the diagnostic process at the same temperature are continuously performed, the waiting time for temperature rise and fall can be halved, and the total time is 22H. I was able to. It was confirmed that the time was shortened to about 2/3 compared with the conventional case. Here, the diagnosis time is shown as the same time as in FIG. Actually, the diagnosis time of FIG. 10 is shorter than this because the manual operation by the operator is included.

4 is a flow of testing and diagnosis of a storage device according to the present invention. It is an example of composition of a test and diagnostic device of the present invention. It is an example of test and diagnostic data. It is a description example of a diagnostic table. It is an example of a test / diagnosis flow according to the present invention. It is an example of the test time and diagnosis time by this invention. This is a flow of testing and diagnosis of a conventional storage device. It is an example of the flow of the conventional test process. It is an example of the flow of the conventional diagnostic process. It is an example of conventional test time and diagnosis time.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 (Test object) Storage device 20 Assembly process 30 Test process 31 Test data 40 Diagnosis process 41 Diagnosis data 50 Repair process 60 Test / diagnosis process 61 Test / diagnosis data 62 Diagnosis table 100 Test / diagnosis apparatus 200 Processing apparatus 210 CPU
220 Main memory 230 Test / diagnosis program 231 Test unit 232 Diagnostic unit 233 Statistical processing unit 240 Input / output IF
241 Display 242 Printer 243 Keyboard 244 Bar code reader 250 Test / diagnosis data storage unit 260 Diagnostic table storage unit 270 Control IF
300 Control device 400 Constant temperature bath 500 Magnetic disk device (to be tested)

Claims (5)

A test / diagnosis method for a storage device that performs a test on a storage device that has been assembled and performs a diagnosis that identifies a repair location when repair is required,
A test process for performing a test for determining whether or not an operation based on a predetermined specification is performed on the storage device under a predetermined environmental condition;
A diagnostic process for performing a diagnosis for identifying a repair location for the defect under the same environmental condition as the environmental condition subsequent to the test process for the storage device determined to be defective in the test process;
A test / diagnosis method for a storage device, wherein the test step and the diagnosis step are performed by changing the predetermined environmental condition. The diagnosis in the diagnosis step is performed based on a diagnosis item corresponding to a test result determined to be defective in the test, and the repair location is specified by a predetermined logic corresponding to the diagnosis result. A test / diagnosis method for a storage device according to claim 1. The storage device test according to claim 1, wherein information on a test result of the test process and a diagnosis result of the diagnosis process is accumulated, and the accumulated information is statistically processed and reported.・ Diagnosis method. The storage device test / storage device according to any one of claims 1 to 3, wherein a shipping process including a recording medium initialization process is performed on the storage device determined to be a non-defective product in the test process. Diagnosis method. A test / diagnosis device for a storage device that performs a test on a storage device that has been assembled and performs a diagnosis that identifies a repair location when repair is required,
The test / diagnosis device
Test means for performing a test for determining whether or not an operation based on a predetermined specification is performed under a predetermined environmental condition for the storage device;
For the storage device determined to be defective by the test means, diagnostic means for carrying out a diagnosis for specifying a repair location under the same environmental conditions as the environmental conditions following the test means,
A test / diagnosis device for a storage device, wherein the test unit and the diagnosis unit are implemented by changing the predetermined environmental condition.

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