JP2009243929A - Testing device of film load bearing insulation and testing method of film load bearing insulation - Google Patents

Testing device of film load bearing insulation and testing method of film load bearing insulation Download PDF

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JP2009243929A
JP2009243929A JP2008087842A JP2008087842A JP2009243929A JP 2009243929 A JP2009243929 A JP 2009243929A JP 2008087842 A JP2008087842 A JP 2008087842A JP 2008087842 A JP2008087842 A JP 2008087842A JP 2009243929 A JP2009243929 A JP 2009243929A
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film
load
contact terminal
separator
mounting table
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JP5090230B2 (en
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Yukie Emura
雪絵 江村
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Asahi Kasei Corp
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Asahi Kasei E Materials Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a testing device and a testing method for easily and safely evaluating the load bearing insulation characteristics of a film. <P>SOLUTION: A device 1 for testing the insulation of a separator with respect to load includes: a mounting base 10 mounting a separator A; a contact terminal 11 for contacting the surface of the separator A on the mounting base 10 to apply load on it; a moving mechanism 12 for varying the load to the separator A by moving up and down the contact terminal 11; and an electric resistance measuring device 13 measuring the electric resistance of the separator A between the mounting base 10 and the contact terminal 11. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、荷重に対するフィルムの絶縁性試験装置と、その絶縁性試験方法に関する。   The present invention relates to an insulation test apparatus for a film against a load and an insulation test method thereof.

従来、JIS規格やUL規格やSBA規格において、電池安全性評価の為の種々規格が用意されている。特許文献1には、JIS規格で規定されている測定を、より簡便な方法で行う例が記載されている。   Conventionally, various standards for battery safety evaluation have been prepared in JIS, UL, and SBA standards. Patent Document 1 describes an example in which the measurement specified by the JIS standard is performed by a simpler method.

特開2003−14600号公報Japanese Patent Laid-Open No. 2003-14600

本発明は、フィルムの耐荷重絶縁特性を簡易かつ安全に評価し得る試験装置、並びに試験方法を提供することをその目的とする。   An object of the present invention is to provide a test apparatus and a test method that can easily and safely evaluate the load-bearing insulation characteristics of a film.

上記目的を達成するための本発明は、荷重下でのフィルムの絶縁性の試験を行う装置であって、
フィルムを載置する載置台と、
前記載置台上のフィルムの表面に接触して荷重をかけるための接触端子と、
前記接触端子を上下動させ、前記フィルムに対する荷重を変動できる移動機構と、
前記載置台と前記接触端子の間のフィルムの電気抵抗を測定する電気抵抗測定器と、
を有することを特徴とする。
ここで、前記接触端子の先端部は、球状に形成されていてもよい。その接触端子の先端部は、0.05mm〜4.0mmの曲率半径を有していてもよい。
また、前記フィルムは、1μm〜50μmのフィルムの厚みを有していても良い。
更に、前記載置台の表面は、♯100〜♯10000の研磨剤で研磨されたものであってもよい。
The present invention for achieving the above object is an apparatus for testing the insulation of a film under load,
A mounting table on which the film is mounted;
Contact terminals for applying a load by contacting the surface of the film on the mounting table,
A moving mechanism capable of moving the contact terminal up and down to vary the load on the film;
An electrical resistance measuring instrument for measuring the electrical resistance of the film between the mounting table and the contact terminal;
It is characterized by having.
Here, the tip of the contact terminal may be formed in a spherical shape. The tip of the contact terminal may have a radius of curvature of 0.05 mm to 4.0 mm.
The film may have a film thickness of 1 μm to 50 μm.
Further, the surface of the mounting table may be polished with an abrasive of # 100 to # 10000.

一方、本発明の試験方法は、荷重下でのフィルムの絶縁性の試験を行う方法であって、
載置台上に載置されたフィルムの表面に接触端子を接触させてフィルムに荷重をかけ、その荷重を次第に増加させながら、電気抵抗測定器により前記載置台と前記接触端子の間の前記フィルムの電気抵抗を測定し、前記フィルムが短絡するときの荷重を検出することを特徴とする。
ここで、前記接触端子を前記フィルム表面に接触させてフィルムに荷重をかける際の前記接触端子の下降速度は、5μm/min〜100μm/minとすることができる。
また、前記フィルムと電池の正極部材又は負極部材を重ねた状態で、前記接触端子と前記載置台との間に挟んで、前記フィルムの電気抵抗を測定することができる。
On the other hand, the test method of the present invention is a method for performing an insulation test of a film under load,
A contact terminal is brought into contact with the surface of the film placed on the placing table, a load is applied to the film, and the load is gradually increased while the film is placed between the placing table and the contact terminal by an electric resistance measuring instrument. The electrical resistance is measured, and a load when the film is short-circuited is detected.
Here, when the load is applied to the film by bringing the contact terminal into contact with the film surface, the descending speed of the contact terminal can be set to 5 μm / min to 100 μm / min.
Further, the electrical resistance of the film can be measured by sandwiching the film and the positive electrode member or the negative electrode member of the battery between the contact terminal and the mounting table.

本発明によれば、フィルムの耐荷重絶縁特性を簡易かつ安全に評価し得る試験装置、並びに試験方法が提供される。   ADVANTAGE OF THE INVENTION According to this invention, the test apparatus and test method which can evaluate the load bearing insulation characteristic of a film simply and safely are provided.

以下、図面を参照して、本発明の好ましい実施の形態について説明する。図1は、本実施の形態に係る耐荷重絶縁性試験装置1の構成の概略を示す模式図である。   Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram showing an outline of the configuration of a load-bearing insulation test apparatus 1 according to the present embodiment.

耐荷重絶縁性試験装置1は、例えば試験対象のフィルムとしての電池のセパレータAを載置する載置台10と、載置台10上のセパレータAの表面に接触して荷重をかける接触端子11と、接触端子11を上下動して前記荷重を変動できる移動機構12と、載置台10と接触端子11の間に電圧を印加して載置台10と接触端子11に挟まれたセパレータAの電気抵抗を測定する電気抵抗測定器13とを有している。   The load-bearing insulation test apparatus 1 includes, for example, a mounting table 10 on which a battery separator A as a film to be tested is mounted, a contact terminal 11 that contacts the surface of the separator A on the mounting table 10 and applies a load, The electric resistance of the separator A sandwiched between the mounting table 10 and the contact terminal 11 by applying a voltage between the mounting table 10 and the contact terminal 11 by moving the contact terminal 11 up and down to change the load. And an electric resistance measuring device 13 for measuring.

載置台10は、例えば良導電体のアルミニウムやステンレス鋼などの金属で形成される。載置台10の素材としては、導電性が高く、かつ変形・磨耗しにくいものが好ましい。
また、載置台10は、例えば図2に示すように厚みのある円盤状に形成されるが、角盤状であってもよい。
The mounting table 10 is made of, for example, a good conductor such as aluminum or stainless steel. As a material for the mounting table 10, a material having high conductivity and being difficult to be deformed or worn is preferable.
Further, the mounting table 10 is formed in a thick disk shape as shown in FIG. 2, for example, but may be a square disk shape.

載置台10の載置面の表面粗さは、例えば、セパレータAに表面形状が転写するような凹凸の無い程度の表面粗さが好ましく、セパレータAの表面粗さよりも小さな表面粗さを有することが好ましい。このような表面粗さとすることは、セパレータAと載置台10との間の接触抵抗の影響を低減し、セパレータA自体の電気抵抗をより正確に測定し得、この結果、セパレータAの電気抵抗に基づく短絡荷重をより正確に検出し得て好適である。
具体的には、♯100〜♯10000、好ましくは♯500〜♯4000の研磨剤で研磨した鏡面レベルの平滑性であることが好ましい。
更に、算術平均粗さ(Ra)としては、好ましくは100μm以下、より好ましくは0.01μm〜30μmである。
The surface roughness of the mounting surface of the mounting table 10 is preferably, for example, a surface roughness that does not have unevenness such that the surface shape is transferred to the separator A, and has a surface roughness that is smaller than the surface roughness of the separator A. Is preferred. Such surface roughness reduces the influence of the contact resistance between the separator A and the mounting table 10 and can more accurately measure the electrical resistance of the separator A itself. As a result, the electrical resistance of the separator A can be measured. It is preferable that the short-circuit load based on can be detected more accurately.
Specifically, it is preferable to have a smoothness of a mirror surface level polished with an abrasive of # 100 to # 10000, preferably # 500 to # 4000.
Further, the arithmetic average roughness (Ra) is preferably 100 μm or less, more preferably 0.01 μm to 30 μm.

なお、載置台10は、例えば図1に示すように水平の基台20に設置されている。載置台10と基台20との間には、厚みのある絶縁板21が介在され、載置台10は基台20と絶縁されている。従って、載置台10から漏電したり、また外部の電流が載置台10に流れ込んだりする虞が低減され、電気抵抗測定器13によるセパレータAの電気抵抗の測定をより正確に行ない得る。   The mounting table 10 is installed on a horizontal base 20, for example, as shown in FIG. A thick insulating plate 21 is interposed between the mounting table 10 and the base 20, and the mounting table 10 is insulated from the base 20. Therefore, the possibility of leakage of electricity from the mounting table 10 or an external current flowing into the mounting table 10 is reduced, and the electric resistance of the separator A can be measured more accurately by the electric resistance measuring device 13.

接触端子11は、例えば硬質で良導電体のステンレス鋼や超硬と呼ばれるWC(炭化タングステン・タングステンカーバイト)とCo(コバルト)とから構成される 複合材料(合金)などの金属で形成されている。素材としては、変形・磨耗しにくく、繰り返し操作の簡便性及び再現性が高いものが、簡便に信頼性高く評価できる観点から好ましい。
接触端子11は、例えば図3に示すように球状の先端部11aと、その先端部11aの上部に接続され、先端部11aから上方に向けて次第に径が大きくなるテーパ部11bと、テーパ部11bの上部に接続され、径が一定の円柱部11cとを有している。円柱部11cの一部には、径の大きい大径部11dが形成されている。
ここで、先端部11aの形状としては、球状、乃至略球状であることが好ましい。このような形状を採用することにより、例えばセパレータAと接触する際に、初めは点で接触し、その後球面に沿って徐々に接触面積を増やしていくことができる。このため、接触端子11とセパレータAとの接触が緩やかに徐々に行われる。また、セパレータAに接触端子11の角があたることがない。この結果、接触端子11の接触時にセパレータAの表面が損傷するおそれが低減され、セパレータAの電気抵抗を精度よく測定し得る。この結果、セパレータAの短絡荷重を精度よく検出し得る傾向となる。
The contact terminal 11 is made of, for example, a metal such as a composite material (alloy) composed of WC (tungsten carbide / tungsten carbide) and Co (cobalt), which is called hard and good-conducting stainless steel or carbide. Yes. As a raw material, a material that is difficult to be deformed and worn, and has high ease of repetitive operation and high reproducibility is preferable from the viewpoint of simple and reliable evaluation.
For example, as shown in FIG. 3, the contact terminal 11 is connected to a spherical tip portion 11a, a tapered portion 11b that is connected to an upper portion of the tip portion 11a, and gradually increases in diameter upward from the tip portion 11a, and a tapered portion 11b. And a cylindrical portion 11c having a constant diameter. A large diameter portion 11d having a large diameter is formed in a part of the cylindrical portion 11c.
Here, the shape of the tip end portion 11a is preferably spherical or substantially spherical. By adopting such a shape, for example, when contacting the separator A, it is possible to first contact with a point and then gradually increase the contact area along the spherical surface. For this reason, the contact between the contact terminal 11 and the separator A is gradually and gradually performed. Further, the corners of the contact terminals 11 do not hit the separator A. As a result, the possibility that the surface of the separator A is damaged when the contact terminal 11 is in contact is reduced, and the electrical resistance of the separator A can be measured with high accuracy. As a result, the short-circuit load of the separator A tends to be detected with high accuracy.

先端部11aは、例えば曲率半径が0.05mm〜4.0mmの範囲、より好ましくは1.1mm〜1.3mm、又は0.3mm〜0.5mmの範囲の球状に形成されている。円柱部11cの上端部は、後述のロードセル30に固定されている。
ここで、先端部11aの曲率半径は、測定対象であるセパレータAの電気絶縁性に応じ、適宜選択することができる。
即ち、例えばセパレータAの厚みや目付けが大きい等により絶縁性が高い場合には、再現性を確保しつつ接触端子に過大な荷重を印加する状況を避ける観点から、曲率半径をより小さな領域(例えば、0.3mm〜0.5mm)に設定することができる。一方、セパレータAの厚みや目付けが小さい等により絶縁性が小さい場合には、再現性を確保しつつ測定対象毎の対比を良好に行なう観点から、曲率半径をより大きな領域(例えば、1.1mm〜1.3mm)に設定することができる。
なお、セパレータAの厚みとしては、耐荷重絶縁性試験装置1により測定対象の相対比較を再現性良く行なう観点、あるいは接触端子11の耐久性を向上させる観点から、好ましくは1μm〜100μm、より好ましくは 5μm〜 30μmである。
For example, the tip 11a is formed in a spherical shape with a radius of curvature of 0.05 mm to 4.0 mm, more preferably 1.1 mm to 1.3 mm, or 0.3 mm to 0.5 mm. The upper end portion of the cylindrical portion 11c is fixed to a load cell 30 described later.
Here, the radius of curvature of the tip portion 11a can be appropriately selected according to the electrical insulation of the separator A to be measured.
That is, for example, when the insulation is high due to, for example, the separator A having a large thickness or basis weight, the curvature radius is set to a smaller region (for example, from the viewpoint of avoiding an excessive load applied to the contact terminal while ensuring reproducibility , 0.3 mm to 0.5 mm). On the other hand, when the insulation property is small due to the small thickness or basis weight of the separator A, the curvature radius is set to a larger region (for example, 1.1 mm) from the viewpoint of satisfactorily comparing each measurement object while ensuring reproducibility. To 1.3 mm).
The thickness of the separator A is preferably 1 μm to 100 μm, more preferably from the viewpoint of performing relative comparison of measurement objects with good reproducibility by the load-bearing insulation test apparatus 1 or improving the durability of the contact terminals 11. Is 5 μm to 30 μm.

移動機構12は、例えば図1に示すように接触端子11を支持し、付与された荷重を検出して電気信号に変換可能なロードセル30と、ロードセル30を支持する水平支持板31と、水平支持板31を両持ちで支持し上下動させる一対の支柱32と、水平支持板31の上下動を制御する制御部33を有している。支柱32には、モータ等の駆動源が内蔵されており、この駆動源により水平支持板31を上下動できる。   For example, as shown in FIG. 1, the moving mechanism 12 supports the contact terminal 11, detects the applied load, and converts the load cell 30 into an electrical signal, a horizontal support plate 31 that supports the load cell 30, and a horizontal support A pair of support columns 32 that support the plate 31 by both ends and move up and down, and a control unit 33 that controls the vertical movement of the horizontal support plate 31 are provided. The support 32 has a built-in drive source such as a motor, and the horizontal support plate 31 can be moved up and down by this drive source.

ロードセル30で検出された荷重の電気信号は、制御部33に出力できる。制御部33は、荷重を表示するモニタ機能を有する。また、制御部33は、荷重に基づいて水平支持板31(ロードセル30、接触端子11)の上下動を制御できる。   The electrical signal of the load detected by the load cell 30 can be output to the control unit 33. The control unit 33 has a monitor function for displaying a load. Further, the control unit 33 can control the vertical movement of the horizontal support plate 31 (load cell 30, contact terminal 11) based on the load.

電気抵抗測定器13は、例えば本体13aと、2本の電線13bを有している。一の電線13bは、本体13aから載置台10に接続され、他の電線13bは、本体13aから接触端子11に接続されている。本体13aは、電線13bを介して載置台10と接触端子11の間に挟まれたセパレータAの電気抵抗を測定できる。本体13aは、モニタを有し、測定した電気抵抗の値を表示できる。電線13bは、例えば柔軟性に優れ、幅のある薄い帯状の金属で形成されている。なお、電線13bは、載置台10や大径部11dの側面に捲回接続されていても良い。   The electrical resistance measuring instrument 13 has, for example, a main body 13a and two electric wires 13b. One electric wire 13b is connected to the mounting table 10 from the main body 13a, and the other electric wire 13b is connected to the contact terminal 11 from the main body 13a. The main body 13a can measure the electrical resistance of the separator A sandwiched between the mounting table 10 and the contact terminal 11 via the electric wire 13b. The main body 13a has a monitor and can display the measured value of electrical resistance. The electric wire 13b is made of, for example, a metal strip having excellent flexibility and width. The electric wire 13b may be wound-connected to the side surface of the mounting table 10 or the large diameter portion 11d.

次に、以上のように構成された耐荷重絶縁性試験装置1を用いたセパレータAの耐荷重絶縁性試験方法について説明する。   Next, a load-bearing insulation test method for the separator A using the load-bearing insulation test apparatus 1 configured as described above will be described.

先ず、図1に示すようにセパレータAが載置台10上に載置される。次に、図4に示すように移動機構12により接触端子11が下降され、接触端子11の先端部11aがセパレータAの表面に接触され、セパレータAに荷重が付加される。この時に、セパレータAの電気抵抗の測定が開始され、以降、セパレータに荷重をかけつつ測定が続行される。
ここで、前記接触端子を前記フィルム表面に接触させてフィルムに荷重をかける際の(接触端子11の先端部11aがセパレータAの表面に接触した後の)前記接触端子の下降速度は、特に、セパレータAの素材に多孔質材料や柔軟性の材料を用いた場合等において測定の再現性をより向上させる観点から、好ましくは5μm/min〜100μm/min、より好ましくは5μm/min〜50μm/minである。
なお、セパレータAの電気抵抗の数値は、電気抵抗測定器13の本体13aのモニタに表示される。また、セパレータAにかかる荷重は、ロードセル30により検出され、制御部33のモニタに表示される。
First, as shown in FIG. 1, the separator A is placed on the placing table 10. Next, as shown in FIG. 4, the contact terminal 11 is lowered by the moving mechanism 12, the tip portion 11 a of the contact terminal 11 is brought into contact with the surface of the separator A, and a load is applied to the separator A. At this time, the measurement of the electrical resistance of the separator A is started, and thereafter the measurement is continued while applying a load to the separator.
Here, when the contact terminal is brought into contact with the film surface and a load is applied to the film (after the tip portion 11a of the contact terminal 11 contacts the surface of the separator A), the descending speed of the contact terminal is, in particular, From the viewpoint of further improving the reproducibility of measurement when a porous material or a flexible material is used as the material of the separator A, preferably 5 μm / min to 100 μm / min, more preferably 5 μm / min to 50 μm / min. It is.
The numerical value of the electrical resistance of the separator A is displayed on the monitor of the main body 13a of the electrical resistance measuring device 13. The load applied to the separator A is detected by the load cell 30 and displayed on the monitor of the control unit 33.

そして、本体13aに表示されるセパレータAの電気抵抗値を確認しながら、セパレータAにかかる荷重を徐々に上げ、セパレータAが短絡した時、つまり急激に絶縁性が破壊される(絶縁性を喪失する)荷重、例えば電気抵抗測定装置AD−5518T(エー・アンド・デイ社製)の場合、セパレータAの電気抵抗値が40MΩ以下になった時の荷重を短絡荷重として検出することができる。これにより、セパレータAの短絡荷重が検出され、荷重下でのセパレータAの絶縁性能を確認できる。   Then, while confirming the electrical resistance value of the separator A displayed on the main body 13a, the load applied to the separator A is gradually increased, and when the separator A is short-circuited, that is, the insulating property is suddenly broken (insulating property is lost). In the case of an electrical resistance measuring device AD-5518T (manufactured by A & D), the load when the electrical resistance value of the separator A becomes 40 MΩ or less can be detected as a short-circuit load. Thereby, the short circuit load of the separator A is detected, and the insulation performance of the separator A under the load can be confirmed.

なお、セパレータAと、接触端子11又は載置台10との間に、電池の正極部材又は負極部材を介挿し、セパレータAと電池の正極部材又は負極部材を重ねた状態で、接触端子11と載置台10との間に挟んでセパレータAの電気抵抗を測定することも可能である。
即ち、正極あるいは、負極の電極部材の少なくとも一方を、活物質がセパレータAに対向する方向に重ね、それらを載置台10と接触端子11との間に載置して評価することは、電極材のフィルム絶縁性評価への影響を反映する観点(電極との相性を含めたセパレータの絶縁性の評価を行う観点)で有効である。
A battery positive electrode member or negative electrode member is interposed between the separator A and the contact terminal 11 or the mounting table 10, and the separator A and the battery positive electrode member or negative electrode member are stacked with the contact terminal 11 mounted thereon. It is also possible to measure the electrical resistance of the separator A sandwiched between the table 10.
That is, at least one of the positive electrode member and the negative electrode member is overlapped in the direction in which the active material faces the separator A, and placed between the mounting table 10 and the contact terminal 11 for evaluation. It is effective from the viewpoint of reflecting the influence on the film insulation evaluation (perspective of evaluating the insulation of the separator including compatibility with the electrode).

以上、添付図面を参照しながら本発明の好適な実施の形態について説明したが、本発明はかかる例に限定されない。当業者であれば、特許請求の範囲に記載された思想の範疇内において、各種の変更例または修正例に相到し得ることは明らかであり、それらについても当然に本発明の技術的範囲に属するものと了解される。例えば以上の実施の形態では、試験対象がセパレータAであったが、他のフィルムの絶縁性試験にも本発明は適用できる。また、以上の実施の形態では、接触端子11の先端部11aの形状が球状であったが、他の形状であってもよい。例えば接触端子11の先端部11aは、セパレータAに点接触する形状、線接触する形状、または面接触する形状であってもよい。線接触する形状の場合、先端部11aは、例えば先端に直線状の稜を形成する多面体形状であってもよい。   The preferred embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to such examples. It will be apparent to those skilled in the art that various changes and modifications can be made within the scope of the ideas described in the claims, and these are naturally within the technical scope of the present invention. It is understood that it belongs. For example, in the above embodiment, the test object is the separator A, but the present invention can also be applied to an insulation test of other films. Moreover, in the above embodiment, although the shape of the front-end | tip part 11a of the contact terminal 11 was spherical shape, another shape may be sufficient. For example, the tip 11a of the contact terminal 11 may have a shape that makes point contact with the separator A, a shape that makes line contact, or a shape that makes surface contact. In the case of a shape that makes line contact, the distal end portion 11a may have a polyhedral shape that forms a linear ridge at the distal end, for example.

次に、実施例及び比較例を挙げて本実施の形態をより具体的に説明するが、本実施の形態はその要旨を超えない限り、以下の実施例に限定されるものではない。   Next, the present embodiment will be described more specifically with reference to examples and comparative examples. However, the present embodiment is not limited to the following examples unless it exceeds the gist.

[実施例1〜4]
先端部11aとして下表1に示す曲率半径を有する接触端子11を用いて図1に示す耐荷重絶縁性試験装置1を構成した。
セパレータAとして下表1に示すセパレータを用い、耐荷重絶縁性試験を行なった。なお、セパレータAの透気度は、JIS P−8117準拠のガーレー式透気度計(東洋精機製G−B2(商標))を用い、空気100mlが通過する時間として測定したものである。また、気孔率は、10cm×10cm角の試料を切り取り、その体積(cm)と質量(g)を求め、それらと素材のバルク密度(g/cm)より算出したものである。
接触端子11の素材は超硬であり、接触端子11をセパレータAの表面に接触させた後の接触端子11の下降速度は10μm/minであった。各実施例において測定したサンプル数は20個である。
電気抵抗測定装置AD−5518T(エー・アンド・デイ社製)を用い、下表1に示す荷重下でセパレータAの電気抵抗値が40MΩ以下となったサンプルの個数を下表1に併記した。
[Examples 1 to 4]
The load resistance insulation test apparatus 1 shown in FIG. 1 was configured using the contact terminal 11 having the radius of curvature shown in Table 1 below as the front end portion 11a.
Using the separator shown in Table 1 below as the separator A, a load resistance insulation test was conducted. In addition, the air permeability of the separator A is measured as the time required for 100 ml of air to pass using a Gurley type air permeability meter (G-B2 (trademark) manufactured by Toyo Seiki Co., Ltd.) according to JIS P-8117. The porosity is calculated by cutting a 10 cm × 10 cm square sample, determining its volume (cm 3 ) and mass (g), and the bulk density (g / cm 3 ) of the material.
The material of the contact terminal 11 was cemented carbide, and the descending speed of the contact terminal 11 after the contact terminal 11 was brought into contact with the surface of the separator A was 10 μm / min. The number of samples measured in each example is 20.
The number of samples in which the electrical resistance value of the separator A is 40 MΩ or less under the load shown in Table 1 below is also shown in Table 1 below using an electrical resistance measuring device AD-5518T (manufactured by A & D).

Figure 2009243929
Figure 2009243929

表1の結果から、セパレータAとして薄膜(厚み10μm程度)を用いる場合、曲率半径が大きな先端部11aを用いた方が、測定再現性を確保しつつ、サンプル間の相対比較を行ない易いことが読み取れる。   From the results of Table 1, when a thin film (thickness of about 10 μm) is used as the separator A, it is easier to perform relative comparison between samples while ensuring measurement reproducibility when using the tip 11a having a large curvature radius. I can read.

[実施例5〜8]
先端部11aとして下表2と表3に示す曲率半径を有する接触端子11を用いて図1に示す耐荷重絶縁性試験装置1を構成した。
セパレータAとして下表2に示すセパレータを用い、耐荷重絶縁性試験を行なった。なお、接触端子11の素材や接触端子11の下降速度、各実施例において測定したサンプル数、電気抵抗測定装置、等については実施例1と同様の条件で行なった。結果を下表2と表3に併記した。
[Examples 5 to 8]
The load-bearing insulation test apparatus 1 shown in FIG. 1 was configured using the contact terminal 11 having the radius of curvature shown in Tables 2 and 3 as the tip 11a.
The separator shown in Table 2 below was used as the separator A, and a load resistance insulation test was performed. In addition, about the raw material of the contact terminal 11, the descent | fall speed of the contact terminal 11, the number of samples measured in each Example, an electrical resistance measuring apparatus, etc. were performed on the conditions similar to Example 1. FIG. The results are shown in Tables 2 and 3 below.

Figure 2009243929
Figure 2009243929

Figure 2009243929
Figure 2009243929

表2と表3の結果から、セパレータAとして厚膜(厚み20μm程度)を用いる場合、曲率半径が小さな先端部11aを用いた方が、測定再現性を確保しつつ、先端部11aに印加される荷重を低減可能である(接触端子11の寿命を向上させ得る)ことが読み取れる。   From the results of Tables 2 and 3, when using a thick film (thickness of about 20 μm) as the separator A, the tip 11a having a smaller radius of curvature is applied to the tip 11a while ensuring measurement reproducibility. It can be read that the load of the contact terminal 11 can be reduced (the life of the contact terminal 11 can be improved).

耐荷重絶縁性試験装置の構成の概略を示す模式図である。It is a schematic diagram which shows the outline of a structure of a load-bearing insulation test apparatus. 載置台の斜視図である。It is a perspective view of a mounting base. 接触端子の斜視図である。It is a perspective view of a contact terminal. 接触端子がセパレータに接触した状態を示す説明図である。It is explanatory drawing which shows the state which the contact terminal contacted the separator.

符号の説明Explanation of symbols

1 耐荷重絶縁性試験装置
10 載置台
11 接触端子
11a 先端部
12 移動機構
13 電気抵抗測定器
A セパレータ
DESCRIPTION OF SYMBOLS 1 Load-resistant insulation test apparatus 10 Mounting stand 11 Contact terminal 11a Tip part 12 Moving mechanism 13 Electrical resistance measuring device A Separator

Claims (8)

荷重下でのフィルムの絶縁性の試験を行う装置であって、
フィルムを載置する載置台と、
前記載置台上のフィルムの表面に接触して荷重をかけるための接触端子と、
前記接触端子を上下動させ、前記フィルムに対する荷重を変動できる移動機構と、
前記載置台と前記接触端子の間のフィルムの電気抵抗を測定する電気抵抗測定器と、
を有することを特徴とする、フィルムの耐荷重絶縁性試験装置。
An apparatus for testing insulation of a film under load,
A mounting table on which the film is mounted;
Contact terminals for applying a load by contacting the surface of the film on the mounting table,
A moving mechanism capable of moving the contact terminal up and down to vary the load on the film;
An electrical resistance measuring instrument for measuring the electrical resistance of the film between the mounting table and the contact terminal;
A load-bearing insulation test apparatus for a film, comprising:
前記接触端子の先端部は、球状に形成されていることを特徴とする、請求項1に記載のフィルムの耐荷重絶縁性試験装置。   The load resistance insulation test apparatus for a film according to claim 1, wherein a tip end portion of the contact terminal is formed in a spherical shape. 前記接触端子の先端部は、0.05mm〜4.0mmの曲率半径を有することを特徴とする、請求項2に記載のフィルムの耐荷重絶縁性試験装置。   The load resistance insulation test apparatus for a film according to claim 2, wherein the tip of the contact terminal has a curvature radius of 0.05 mm to 4.0 mm. 前記フィルムの厚みは、1μm〜100μmであることを特徴とする、請求項1〜3のいずれかに記載のフィルムの耐荷重絶縁性試験装置。   The film load resistance insulation test apparatus according to claim 1, wherein the film has a thickness of 1 μm to 100 μm. 前記載置台の表面は、♯100〜♯10000の研磨剤で研磨されたものであることを特徴とする、請求項1〜4のいずれかに記載のフィルムの耐荷重絶縁性試験装置。   5. The film load resistance insulation test apparatus according to claim 1, wherein the surface of the mounting table is polished with an abrasive of # 100 to # 10000. 荷重下でのフィルムの絶縁性の試験を行う方法であって、
載置台上に載置されたフィルムの表面に接触端子を接触させてフィルムに荷重をかけ、その荷重を次第に増加させながら、電気抵抗測定器により前記載置台と前記接触端子の間の前記フィルムの電気抵抗を測定し、前記フィルムが短絡するときの荷重を検出することを特徴とする、フィルムの耐荷重絶縁性試験方法。
A method for testing insulation of a film under load,
A contact terminal is brought into contact with the surface of the film placed on the placing table, a load is applied to the film, and the load is gradually increased while the film is placed between the placing table and the contact terminal by an electric resistance measuring instrument. A load resistance insulation test method for a film, comprising measuring an electrical resistance and detecting a load when the film is short-circuited.
前記接触端子を前記フィルム表面に接触させてフィルムに荷重をかける際の前記接触端子の下降速度は、5μm/min〜100μm/minであることを特徴とする、請求項6に記載のフィルムの耐荷重絶縁性試験方法。   The resistance of the film according to claim 6, wherein the contact terminal is brought into contact with the surface of the film and a descending speed of the contact terminal when a load is applied to the film is 5 μm / min to 100 μm / min. Load insulation test method. 前記フィルムと電池の正極部材又は負極部材を重ねた状態で、前記接触端子と前記載置台との間に挟んで、前記フィルムの電気抵抗を測定することを特徴とする、請求項6又は7に記載のフィルムの耐荷重絶縁性試験方法。   The electric resistance of the film is measured by sandwiching the film and the positive electrode member or the negative electrode member of the battery between the contact terminal and the mounting table, according to claim 6 or 7. The load-bearing insulation test method of the described film.
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JP5909022B2 (en) * 2013-03-22 2016-04-26 オートモーティブエナジーサプライ株式会社 Inspection method for film-clad battery
CN105823684A (en) * 2015-12-09 2016-08-03 西安科技大学 Apparatus used for research on mechanical and electrical properties of conductive rubber
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CN107219118A (en) * 2017-05-26 2017-09-29 上海研微电子科技有限公司 A kind of performance test fixture of flexible display material under the conditions of specific curvature
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JP2020136074A (en) * 2019-02-20 2020-08-31 三洋電機株式会社 Separator inspection method and non-aqueous electrolyte secondary battery
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CN113039446A (en) * 2019-10-23 2021-06-25 株式会社Lg化学 Device and method for measuring the resistance of a pressurized separator
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CN111337353A (en) * 2020-04-03 2020-06-26 安徽猛牛彩印包装有限公司 Plastic film tension test detection device

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