JP2009210519A - Apparatus for supporting visual inspection of substrate - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To make visual inspection efficient by efficiently supporting visual inspection of substrates by a simple constitution. <P>SOLUTION: A visual inspection supporting apparatus 1 includes an imaging means (50) for imaging parts on a substrate P; a storage means (67) for storing images acquired by previously imaging parts in a satisfactorily mounted state as conforming images G2; and a display means (4) for collectively displaying a pair of an image G1 of a plurality of parts imaged by the imaging means (50) and a conforming image G2 corresponding to each part on one screen. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a visual inspection support device for supporting visual inspection of a substrate having a plurality of components mounted on the surface.

  Conventionally, various devices have been developed for inspecting the appearance of a substrate after component mounting. For example, Patent Document 1 below discloses a desktop inspection apparatus that can automatically determine the quality of a substrate and display the result.

Specifically, the inspection apparatus disclosed in Patent Document 1 has, as its main component, a test unit that captures an image of a substrate, and by comparing the captured image with a reference image that is stored in advance. And a main unit that checks the quality of the board by checking the positional deviation of the parts on the board, missing parts, etc. (component mounting state). Then, when an operator sets a substrate in the test unit and gives an instruction to start an inspection, an image of the substrate surface is captured by the scanning unit mounted on the unit, and the image data is transferred to the main unit. At the same time, the main unit performs processing such as determining the quality of the component mounting state based on the image data and the like.
JP 2002-181730 A

  According to the configuration of the above-mentioned Patent Document 1, when a board is set in the test unit, the quality of the board is automatically determined thereafter, and thus there is an advantage that the burden on the operator can be effectively reduced. However, in such an apparatus capable of automatically determining whether a board is good or bad, as a preparatory work before actually using the apparatus, various state quantities relating to components mounted on the board (for example, position of the parts) (E.g., deviation amount, solder amount, etc.) is used as a pass / fail judgment parameter, and the value of the pass / fail judgment threshold is set for each board or component type. In addition, there is a problem that the apparatus is considerably expensive. In particular, when the number of boards to be produced is small, even if it takes a lot of time to perform the above-mentioned data input operations, etc., after all, it is better for humans to visually inspect each board one by one. The time required can be short.

  On the other hand, visual inspection of the substrates one by one still has a problem that the burden on the operator is large. For example, in order to stabilize the inspection accuracy, it is conceivable to perform a visual inspection while comparing a substrate to be inspected (substrate to be inspected) with a non-defective substrate. It is necessary to repeatedly perform an operation that easily causes eye fatigue, such as comparing the state of a large number of components mounted on the non-defective substrate while moving the line of sight to the non-defective substrate. Therefore, it has been demanded to reduce the burden on the worker who performs such a visual inspection and to improve the efficiency of the visual inspection.

  The present invention has been made in view of the above circumstances, and provides a visual inspection support device for a substrate capable of effectively supporting visual inspection of a substrate with a simple configuration and improving the efficiency of the visual inspection. The purpose is to provide.

  In order to solve the above problems, the present invention is a visual inspection support apparatus for supporting visual inspection of a substrate having a plurality of components mounted on the surface thereof, and imaging means for imaging the components on the substrate And a storage means for storing an image captured in advance for a component with a good mounting state as a non-defective image, and a pair of non-defective images corresponding to the respective components imaged by the imaging means. It is characterized by comprising display means for collectively displaying on one screen (claim 1).

  According to the present invention, the picked-up images of a plurality of parts obtained by picking up an image of the substrate by the image pickup means are displayed together on a single screen of the display means in pairs with non-defective images corresponding to the respective parts. The operator can efficiently perform a visual inspection while sequentially comparing a captured image of a component to be inspected and a non-defective image adjacent thereto, and only displays a plurality of pairs of two types of images on the display means. With such a relatively simple structure, there is an advantage that the visual inspection of the substrate can be effectively supported and the working efficiency can be further improved.

  The visual inspection support apparatus according to the present invention includes an input unit for inputting a result of pass / fail judgment performed based on an image of a component displayed on the display unit, and a predetermined result relating to an inspection result based on input information from the input unit. It is preferable to further comprise a test result storage means for storing the above information (claim 2).

  According to this configuration, the operator can read various information including the result of the visual inspection input by himself using the input unit from the storage unit storing the information at an appropriate timing, and Using the information read from the storage means, it is possible to more efficiently perform inspection result confirmation work and substrate repair work.

  Further, in the present invention, it is preferable that a part selected once by the input means is stored as a defective product in the inspection result storage means, and other parts not selected are stored as non-defective products. Item 3).

  According to this configuration, since the operator only has to select a component when a defective product is found, the time required to input the quality of the component can be effectively shortened, and the board can be quickly There is an advantage that visual inspection can be performed.

  It is also preferable that the part selected and operated once by the input means is stored as a non-defective product in the inspection result storage means, and the part selected and operated twice is stored as a defective product.

  According to this configuration, since the operator must always perform some selection operation regardless of whether the part is a non-defective product or a defective product, the inspection missing component (in the plurality of components displayed on the display unit ( There is an advantage that it is possible to surely avoid the occurrence of parts that are overlooked without being visually inspected) and to perform visual inspection of the substrate with more stable accuracy.

  As described above, according to the visual inspection support device for a substrate of the present invention, visual inspection of the substrate can be effectively supported with a simple configuration to improve the efficiency of the visual inspection.

  1 and 2 schematically show a visual inspection support apparatus 1 for a substrate according to an embodiment of the present invention. As shown in these drawings, the visual inspection support device 1 includes a substantially rectangular box-shaped rear portion 2A and a front side portion 2B that protrudes forward from the lower front surface of the rear portion 2A. It has an external shape. The outer wall of such a visual inspection support device 1 is configured by a casing Ca that covers internal components such as an imaging unit 50 described later. Note that the upper surface cover Ca1 of the casing Ca is removable, and maintenance of the internal components can be performed with the upper surface cover Ca1 removed.

  The front portion 2B of the visual inspection support device 1 is provided with a loading / unloading port 6 for loading / unloading a printed circuit board P (hereinafter simply referred to as a substrate P) to be inspected. Further, a liquid crystal monitor 4 is disposed above the entrance / exit 6 and in front of the rear portion 2A. The liquid crystal monitor 4 is formed of a so-called touch panel type liquid crystal display. Images of components mounted on the substrate P are displayed on the liquid crystal monitor 4, and an operator touches the display on the monitor with a fingertip. As a result, various input operations can be performed.

  As shown in FIG. 1, the casing Ca is provided with handle portions 3 made of recesses on both left and right sides of the rear portion 2 </ b> A, and a visual inspection support device with the handle portion 3 held on the hand. 1 can be carried around. In FIGS. 1 and 2, reference numeral 8 denotes an emergency stop button.

  3 and 4 are diagrams for illustrating a specific internal configuration of the visual inspection support device 1. FIG. As shown in these figures, a base frame 10 is provided inside the visual inspection support apparatus 1, and the base frame 10 holds the substrate P supplied through the loading / unloading port 6, and supports the base frame 10. A substrate holding unit 24 that moves in the direction and an imaging unit 50 (corresponding to the imaging means according to the present invention) that images the substrate P held by the substrate holding unit 24 from above are assembled.

  The base frame 10 includes a base portion 12 having a front-falling inclined surface 12a whose height decreases toward the front side (side where the liquid crystal monitor 4 is installed), and both left and right ends of the base portion 12 Are integrally provided with a side wall portion 14 that rises from each other, and is made of a cast product such as aluminum die-casting.

  The substrate holding unit 24 includes a driving device 20 composed of a linear motor type single-axis robot or the like installed so as to extend in the front-rear direction along the inclined surface 12 a of the base portion 12, and a slider 22 of the driving device 20. It is comprised from the board | substrate support table 30 supported so that the movement to the front-back direction was possible. In the following description, the direction in which the slider 22 and the substrate support table 30 move (front-rear direction) is defined as the Y-axis direction, and the direction orthogonal to the Y-axis direction (horizontal direction) on the horizontal plane is defined as the X-axis direction. To do.

  The substrate support table 30 holds the substrate P in a detachable manner, and is driven in the Y-axis direction by the driving device 20 so as to face the entrance / exit 6 (shown by a solid line in FIG. 3). Position) and an imaging position (position indicated by a two-dot chain line in FIG. 3) facing the imaging unit 50. When the substrate instruction table 30 is at the home position, the substrate P is attached to and detached from the substrate support table 30 by manual operation of the operator, and the substrate support table 30 is moved from there to the imaging position. The substrate P is imaged by the imaging unit 50.

  The substrate support table 30 is fixed to the upper surface portion of the slider 22 and extends in the Y-axis direction (front-rear direction), and a pair that is assembled to the front-rear position of the plate 32 and extends in the X-axis direction (left-right direction). Front and rear frames 36 and 38. Of these, the rear frame 38 is provided with a movable portion 39 that is displaceable in the Y-axis direction and is urged forward by an elastic member such as a compression coil spring. The substrate P is elastically sandwiched between the corresponding portions of the front frame 36 and positioned and fixed.

  The distance between the front and rear frames 36 and 38 can be changed according to the substrate size. Specifically, an end plate 34 is fixed to the rear end of the plate 32, and a pair of guide bars 35 extending in the Y-axis direction are fixed between the end plate 34 and the front frame 36. . The rear frame 38 is slidably mounted along the pair of guide bars 35, and is locked at an arbitrary front and rear position by a lock means (not shown). The distance between the frames 36 and 38 can be freely changed by sliding the rear frame 38 along the guide bar 35 and locking the rear frame 38 at a desired position by the locking means. It is configured.

  The imaging unit 50 is attached via a slider 42 to a driving device 40 composed of a linear motor type single-axis robot or the like that is laid across the left and right side wall portions 14 of the base frame 10. It is configured to move in the X-axis direction together with the slider 42 according to the operation of 40. In FIG. 4, the positions of the imaging unit 50 drawn with solid lines and two-dot chain lines indicate both ends of the movable range.

  The imaging unit 50 includes a camera body 52 formed of an area sensor such as a CCD or CMOS image sensor, and an illumination device 54 that irradiates illumination light onto a substrate P that is a subject, and is held by the substrate support table 30. The upper surface (surface to be inspected) of the substrate P is imaged by the camera body 52 installed so as to face the substrate P from a direction orthogonal to the surface (that is, obliquely upward).

  Above the base frame 10, a beam 19 extending in the Y-axis direction is provided along the upper wall of the rear portion 2A. The beam 19 is fixed to the base frame 10 via subframes 16 and 18 extending in the vertical direction, and the liquid crystal monitor 4 is supported at the front end of the beam 19 so as to be tiltable. Specifically, a joint 46 is connected to the front end of the beam 19 with a pivot 45 extending in the X-axis direction as a fulcrum, and the liquid crystal monitor 4 is assembled to the joint 46. The liquid crystal monitor 4 is supported in a state where the tilt angle (tilt angle with respect to the vertical axis) can be freely changed.

  FIG. 7 is a block diagram showing a control system of the visual inspection support apparatus 1. As shown in the figure, the visual inspection support apparatus 1 includes a control unit 60 for comprehensively controlling the operation of each part. The control unit 60 includes a well-known CPU, various memories (RAM and ROM), and the main functional elements include a main control unit 62, a driver 63, an imaging control unit 64, an image processing unit 65, a monitor. A control unit 66 and a storage unit 67 are included.

  The driver 63 controls the operation of the driving devices 20 and 40 for the substrate holding unit 24 and the imaging unit 50.

  The imaging control unit 64 controls the imaging operation of the camera body 52 in the imaging unit 50 and controls the operation of the lighting device 54 such as turning on and off.

  The image processing unit 52 takes in image data captured by the camera body 52 and performs predetermined image processing on the image.

  The monitor control unit 66 outputs an image signal to the liquid crystal monitor 4 to control the display content, and receives an operation signal input from the liquid crystal monitor 4 by an operator's touch operation.

  The storage unit 67 stores various data including image data taken by the camera body 52.

  The main control unit 62 is responsible for the central function of the control unit 60, and performs various calculations while exchanging various data with other functional elements (63 to 67). The operation of each part of the visual inspection support device 1 is comprehensively controlled.

  In the visual inspection support device 1 configured as described above, for example, operations such as imaging of the substrate P are performed as follows.

  When the visual inspection support device 1 is activated, the device 1 is kept in a standby state until the inspection is started. In this standby state, the substrate support table 30 of the substrate holding unit 24 is set at the home position, and a predetermined menu screen is displayed on the liquid crystal monitor 4.

  In this state, when an operator manually sets the substrate P on the substrate support table 30 at the home position and further touches the liquid crystal monitor 4 to select an item such as “Start” from the menu screen, In the inspection support apparatus 1, a series of operations for imaging and displaying the substrate P is started. The substrate P is set on the substrate support table 30 by inserting the substrate P between the substrate holding frames 36 and 38 with the surface to be inspected (the surface on which components are mounted) facing upward. Can be done.

  When the start of an imaging operation or the like is instructed by an operator's touch operation as described above, the substrate support table 30 is moved in the Y-axis direction and positioned at the imaging position by the operation of the driving device 20 of the substrate holding unit 24. At the same time, the imaging unit 50 is moved in the X-axis direction by the operation of the driving device 40, and the camera body 52 of the imaging unit 50 is positioned at a position facing the substrate P according to this. In this state, illumination light is irradiated from the illumination device 54 of the imaging unit 50, and a plurality of components (parts to be inspected) mounted on the substrate P are imaged by the camera body 52 under the illumination light. . In addition, here, a predetermined display for specifying the board P and each component mounted thereon, for example, a board ID number given on the board P or each mounting point on the board P is given. The image numbers are also recognized simultaneously by the imaging unit 50.

  Specifically, the imaging of the board P by the imaging unit 50 is performed for each of a plurality of imaging areas set in advance based on various conditions such as the size of the board P, the number of components to be inspected, and the mounting density of components. . That is, a plurality of imaging areas set in advance with respect to the surface to be inspected of the substrate P are sequentially imaged by the imaging unit 50 that can be moved relative to the substrate P in the XY directions, so that a plurality of parts to be inspected can be obtained. All images are acquired. When the size of the substrate P is small and the number of parts to be inspected is limited, it is also possible to acquire images of all parts to be inspected by one imaging process.

  The imaging of the substrate P by the imaging unit 50 is performed based on an inspection library stored in the storage unit 67 in advance. Here, the inspection library is composed of various data necessary for imaging the substrate P by the imaging unit 50. For example, data such as the size of the substrate P and the arrangement of components mounted thereon ( These are acquired from CAD data of the substrate P) and various data such as an imaging field of view and illumination intensity. Further, which part of all the parts mounted on the board P is to be imaged (that is, the object of visual inspection) is specified in advance by the operator and stored in the storage unit 67 as a part of the inspection library. Has been. That is, the operator basically specifies what parts on the board P are to be subjected to visual inspection in addition to preparing CAD data of the board P as work for creating the inspection library. It ’s enough. It should be noted that which component is subject to visual inspection may be appropriately determined according to the high possibility of mounting failure and the importance of the component.

  When the imaging of the substrate P by the imaging unit 50 is completed as described above, captured images of a plurality of components to be inspected are displayed on the liquid crystal monitor 4. FIG. 6 is a diagram specifically showing a display mode of the component image by the liquid crystal monitor 4. As shown in the figure, the screen of the liquid crystal monitor 4 is divided into a plurality of display sections 70, 70... (Total 20 sections of 4 rows × 5 columns in the illustrated example). The image (component captured image) G1 of each component imaged by the imaging unit 50 and the non-defective image G2 corresponding to the component are displayed in parallel. That is, in this embodiment, the liquid crystal monitor 4 includes display means for displaying a plurality of component captured images G1 captured by the imaging unit 50 in pairs with non-defective images G2 corresponding to the respective components. Yes. In FIG. 6, items such as “R102” displayed in the lower part of each display section 70 are circuit numbers given to each mounting point on the substrate P. By looking at the circuit numbers, In addition, it is possible to determine which mounting point the component displayed as an image in each display section 70 is.

  Here, the non-defective product image G2 is an image captured in advance for a component with a good mounting state. Such a non-defective product image G2 is prepared in advance before the operator performs a visual inspection and is stored in the storage unit 67. Is remembered. Specifically, a non-defective substrate P prepared in advance by trial production or the like is set in advance in the visual inspection support device 1 and imaged by the imaging unit 50, and the captured images of the respective inspection target components obtained thereby are the above-described images. It is stored in the storage unit 67 as a non-defective image G2. In other words, in this embodiment, the storage unit 67 of the control unit 60 includes storage means for storing, as a non-defective image G2, an image captured in advance for a component with a good mounting state.

  Further, as described above, in the liquid crystal monitor 4 that displays a pair of the plurality of component captured images G1 and the non-defective product images G2 corresponding thereto, the number of components to be inspected is larger than the number of display sections 70 (20 in the illustrated example). If all the component images cannot be displayed at once, the liquid crystal monitor 4 displays the screen in a plurality of times. The items “BACK” and “NEXT” displayed at the bottom of the screen of the liquid crystal monitor 4 are selection items that are touch-operated when moving between a plurality of screens. When “NEXT” is touched, the next screen is displayed. Move and touch “BACK” to return to the previous screen.

  Then, an operator who has viewed the display screen of the liquid crystal monitor 4 mounts each component (component to be inspected) mounted on the substrate P based on the component captured image G1 and the non-defective image G2 displayed on the screen. The work of judging whether the state is good and inputting the result is performed. Specifically, the liquid crystal monitor 4 is input by touching the display section 70 of the component determined to be defective with a fingertip once, that the component is defective. In other words, in the present embodiment, the touch panel type liquid crystal monitor 4 constitutes an input means for inputting the result of the visual determination performed based on the component captured image G1 and the like. In the example of FIG. 6, in the display section 70 in the second row and third column where the component with the circuit number “R221” is displayed, the position of the component in the component captured image G1 is greatly shifted from the non-defective product image G2. The component having the circuit number “R221” can be recognized as a defective product (component with a poor mounting state). Therefore, an operator who wants to input that the component is defectively mounted may touch the display section 70 in the second row and third column on which the component is displayed with a single fingertip.

  When a specific display section 70 is touched once in this manner, the display section 70 that has been touched is displayed in a different color from the other sections as shown in FIG. It is displayed in an easy-to-understand manner that the part inside is selected as a defective product. On the other hand, all the components in the display section 70 that are not touch-operated (parts in the display section 70 that are not colored) are selected as non-defective products having a good mounting state. That is, in the liquid crystal monitor 4, a part in the display section 70 that has been touched once is selected as a defective product, and a part in the display section 70 that has not been touched is selected as a non-defective product. In addition, when the display section 70 on which a component having a good mounting state is displayed is touched by mistake, the selected display section 70 is canceled by touching the same display section 70 again. That's fine. Thereafter, by repeating the touch operation in the manner of a toggle switch, the selection state of the components in the display section 70 can be switched appropriately between the non-defective product and the defective product.

  Then, when all the check of the component mounting state by the touch operation as described above is completed, the operator uses the liquid crystal monitor 4 to input that the visual inspection has been completed for the board P to be inspected this time. Touch the “OK” item displayed at the bottom of the screen. As a result, the control unit 60 recognizes that the visual inspection by the operator has been completed, and the predetermined inspection result information is stored in the storage unit 67 accordingly. When the parts are displayed on the liquid crystal monitor 4 in a plurality of times, the operator checks all the parts to be inspected while switching the display screen, and when the check on the final screen is completed. , Touch the item “OK”.

  Specifically, when “OK” is touched on the liquid crystal monitor 4, the storage unit 67 determines whether each component is input as the inspection result information by the operator's touch operation on the liquid crystal monitor 4. The result is stored in association with predetermined information (specifically, information such as the above-described circuit number or board ID number) for specifying the component and the board P. If the determination result of the component input from the liquid crystal monitor 4 is NG (defective product), in addition to the determination result, the captured image G1 of the component is also stored in the storage unit 67. Yes.

  At this time, according to the liquid crystal monitor 4 having the above-described operation format, the components in the display section 70 (display section 70 colored and displayed in FIG. 7) touched once by the operator are defective. While being stored in the storage unit 67, the parts in the other display section 70 not touched are stored as non-defective products. Then, the pass / fail judgment result of each component input from the liquid crystal monitor 4 in this way (if the result is NG, the component captured image G1 is further added), and the corresponding circuit number and board Various types of information such as ID numbers are collected in a predetermined format such as a table format and stored in the storage unit 67. That is, in the present embodiment, the storage unit 67 includes inspection result storage means for storing predetermined information related to inspection results based on input information from the touch panel type liquid crystal monitor 4.

  Next, the control operation in the visual inspection support apparatus 1 configured as described above will be described based on the flowchart shown in FIG. When this control operation is started, the control unit 60 waits for the substrate P to be set on the substrate support table 30 of the substrate holding unit 24 and the operation start instruction to be input to the liquid crystal monitor 4 (steps S1, S3). ), Control for moving the substrate P to the imaging position is executed (step S5). Specifically, the substrate P is set on the substrate support table 30 (see the solid line in FIG. 3) in the home position through the loading / unloading port 6, and the liquid crystal monitor 4 is touch-operated. When the selection is confirmed, the driving device 20 is operated to move the substrate support table 30 in the Y-axis direction, and the substrate P is moved to the imaging position indicated by the two-dot chain line in FIG. Let

  Next, the control unit 60 executes control for imaging the substrate P by the imaging unit 50 (step S7). Specifically, the driving device 40 is operated to move the imaging unit 50 above the substrate P in the imaging position, and the illumination device 54 emits illumination light to illuminate the substrate P, and then the camera body. The image of the plurality of components mounted on the board P is acquired by causing the board 52 to image the board P. As described above, this imaging is performed for each of a plurality of imaging areas as necessary.

  Then, the control unit 60 determines whether or not all the parts that are the targets of the visual inspection have been imaged (step S9), and it is determined as YES here and it is confirmed that all the parts to be inspected have been imaged. In such a case, the captured images of the components to be inspected, that is, the captured images of all components G1 (see FIG. 6) to be displayed on the liquid crystal monitor 4 in the subsequent step S13 are subjected to predetermined image processing. Control to be temporarily stored in the storage unit 67 is executed (step S11). On the other hand, if it is determined NO in step S9 and it is confirmed that there are still parts to be inspected to be imaged, the imaging operation by the imaging unit 50 is continued until all the remaining parts are imaged. .

  When the operation of step S11 is completed and the captured images G1 of all the parts to be inspected are temporarily stored in the storage unit 67, the control unit 60 performs control to display the component captured images G1 on the liquid crystal monitor 4. (Step S13). Specifically, as shown in FIG. 6, each component captured image G1 is displayed on each display section 70 on the liquid crystal monitor 4 as a pair with a non-defective product image G2 corresponding to each component.

  Next, the control unit 60 waits for the inspection result to be input by an operator who performs a visual inspection while looking at the display screen of the liquid crystal monitor 4 (step S15), and then inspection result information based on the input information. Is stored in the storage unit 67 (step S17). That is, an operator who conducts a visual inspection while sequentially comparing the component captured images G1 and the non-defective images G2 displayed in the display sections 70 of the liquid crystal monitor 4 finishes checking all the components and finally displays “ When the “OK” item is touch-operated, it is determined that the visual inspection by the operator has been completed, and at that time, the parts input by the operator touching the liquid crystal monitor 4 during the visual inspection. Are stored in the storage unit 67 as inspection result information. Note that the inspection result information is stored in the storage unit 67 in a systematic format for each of the substrates P and components mounted thereon, as described above.

  Then, when the result of the visual inspection is stored in the storage unit 67 as described above, the control unit 60 operates the driving device 20 to move the substrate support table 30 in the Y-axis direction. Control for returning the upper substrate P to the home position where the operator can attach and detach the substrate P is executed (step S19).

  In the visual inspection support apparatus 1 for supporting the visual inspection of the substrate P on which a plurality of components are mounted on the surface as described above, the image of the component mounted on the substrate P is picked up as a component captured image. An imaging unit 50 (imaging unit) acquired as G1, a storage unit 67 (storage unit) that stores, as a non-defective image G2, an image captured in advance for a component with a good mounting state, and a plurality of images captured by the imaging unit 50 According to the configuration of the above embodiment in which the liquid crystal monitor 4 (display means) that displays the image G1 of the parts in a single screen in pairs with the non-defective image G2 corresponding to each part is provided. There is an advantage that the visual inspection can be effectively supported by a simple configuration to improve the efficiency of the visual inspection.

  That is, in the above-described embodiment, the captured images G1 of a plurality of components obtained by imaging the substrate P by the imaging unit 50 are combined with the non-defective image G2 corresponding to each component, respectively, on one screen of the liquid crystal monitor 4. Therefore, the operator can efficiently perform visual inspection while sequentially comparing the captured image G1 of the component to be inspected and the non-defective product image G2 adjacent thereto. With a relatively simple configuration that only displays a plurality of signals on the liquid crystal monitor 4, there is an advantage that the visual inspection of the substrate P can be effectively supported and the work efficiency can be further improved.

  For example, as a mode different from the configuration of the present invention, the screen of the liquid crystal monitor 4 is roughly divided into two areas, and a plurality of component captured images G1 are displayed together in one area, while the other area is displayed. It is conceivable to display a plurality of non-defective images G2 together, but in this case, when the operator tries to compare the two images G1 and G2 for each component, Since it is necessary to move the line of sight several times between the two display areas, there is a problem that the work load of visual inspection increases and the inspection efficiency decreases.

  On the other hand, when the captured images G1 of a plurality of parts and the corresponding non-defective images G2 are paired and displayed together on one screen on the liquid crystal monitor 4 as in the above embodiment, that is, As shown in FIG. 6, when a plurality of display sections 70 are set on the liquid crystal monitor 4 and the pair of the two images G1 and G2 is displayed on each section 70, these images G1 are displayed. , G2 in order along the arrangement of the display sections 70, the images G1 and G2 can be easily compared without moving the line of sight, and the visual inspection of the substrate P is compared. There is an advantage that it can be performed more efficiently with a light work load.

  Further, in the above configuration, even when it is necessary to visually inspect a number of parts that cannot be displayed on one screen, the images G1 and G2 of each part are compared and checked while sequentially switching the screen of the liquid crystal monitor 4. A large number of parts can be visually inspected efficiently. Specifically, in the present embodiment, 20 pairs of the component captured image G1 and the non-defective product image G2 are displayed on one screen. For example, even when a total of 100 components need to be visually inspected. By simply switching the screen five times, it is possible to efficiently visually inspect 100 parts.

  Furthermore, in the visual inspection support apparatus 1 according to the above-described embodiment in which the component mounted on the substrate P is only captured and displayed as an image, for example, a device (substrate inspection apparatus) that can automatically determine whether the component is mounted properly. In contrast, it is possible to reduce the cost of the equipment and to prepare for the actual use of the equipment because it eliminates the need for complicated programming work and data entry work to automatically execute the pass / fail judgment of parts. There is also an advantage that the work can be simplified.

  Moreover, in the said embodiment, the liquid crystal monitor 4 is comprised as an input means which consists of a touch-panel-type liquid crystal display, and with respect to the liquid crystal monitor 4 as this input means, image G1, G2 of each component displayed on the screen. When the result of the visual inspection based on is input, predetermined information (inspection result information) regarding the inspection result based on the input information from the liquid crystal monitor 4 is stored in the storage unit 67 as the inspection result storage means. Therefore, the operator can read out various types of information including the results of the visual inspection input by himself / herself using the liquid crystal monitor 4 from the storage unit 67 storing the information at an appropriate timing. At the same time, using the information read from the storage unit 67, the inspection result confirmation work and the substrate P repair work can be performed more efficiently.

  In the above embodiment, a part in the display section 70 that has been selected once (touched) on the liquid crystal monitor 4 is stored as a defective product in the storage unit 67 and is not selected in the other display section 70. However, by changing the operation format of the liquid crystal monitor 4, for example, the part in the display section 70 that has been selected once is stored in the storage unit 67 as a non-defective product. The components in the display section 70 that have been selected and operated twice may be configured to be stored as non-defective products. In this way, since the operator must always perform some selection operation regardless of whether the part is a non-defective product or a defective product, the inspection missing component among the plurality of components displayed on the liquid crystal monitor 4 It is possible to surely avoid the occurrence of (a component that is overlooked without being visually inspected), and there is an advantage that the visual inspection of the substrate P can be performed with more stable accuracy.

  On the other hand, as in the above-described embodiment, when a part that has been selected and operated once is regarded as a defective product and other parts that are not selected and operated are regarded as non-defective products, Therefore, there is an advantage that the time required for inputting the quality of the component can be effectively shortened and the visual inspection of the substrate P can be performed more quickly.

  In the above embodiment, a pair of a captured image G1 of a single component and a corresponding non-defective image G2 of a single component corresponding to each display section 70 of the liquid crystal monitor 4 is displayed. For small components, a pair of images including a component captured image G1 composed of images obtained by capturing a plurality of components collectively and a non-defective product image G2 corresponding to the plurality of components is displayed in one display section 70. May be.

  In the above embodiment, the liquid crystal monitor 4 is a touch panel type liquid crystal display, and the display means for displaying an image and the input means for accepting the operation of the operator are configured by the same liquid crystal monitor 4. While a display device having only an image display function is provided as 4, another input device and display device may be configured separately by providing another keyboard, mouse, or the like as the input device. In this case, the input operation of the visual determination result by the operator who has viewed the component images (G1, G2) on the liquid crystal monitor 4 is performed by a predetermined key input operation or click operation using the keyboard, mouse, or the like. It is possible.

  In the visual inspection support device 1 of the above embodiment, the picked-up images G1 of a plurality of components mounted on the substrate P are displayed on the liquid crystal monitor 4 as a pair with the non-defective image G2, thereby allowing the operator to check the substrate P. Although the visual inspection is effectively supported, such a visual inspection support function is supplementarily added to the substrate inspection apparatus that can image the substrate P and automatically determine its quality. It is also possible. For example, when there is a part that has been judged as defective by the automatic inspection of such a board inspection apparatus, it is conceivable to leave the final quality determination of the part to visual inspection by an operator. When the captured image of the component is displayed on the liquid crystal monitor 4 with the same configuration as in the above embodiment, the visual inspection by the operator for the final determination is effectively supported and the inspection of the board P is performed. Can be made more efficient.

1 is a perspective view schematically showing a visual inspection support device for a substrate according to an embodiment of the present invention. It is a top view of the said visual inspection assistance apparatus. It is side surface sectional drawing which shows the internal structure of the said visual inspection assistance apparatus. It is plane sectional drawing which shows the internal structure of the said visual inspection assistance apparatus. It is a block diagram which shows the control system of the said visual inspection assistance apparatus. It is explanatory drawing which shows concretely the display mode of the component image by a liquid crystal monitor. It is explanatory drawing which shows the state by which selection display operation of the display area of the components judged to be inferior goods was carried out by the operator. It is a flowchart which shows the content of the control action of the said visual inspection assistance apparatus.

Explanation of symbols

1 Visual inspection support device 4 LCD monitor (display means, input means)
50 Imaging unit (imaging means)
67 Storage section (storage means, inspection result storage means)
G1 Component image G2 Non-defective image P Printed circuit board (board)

Claims (4)

A visual inspection support device for supporting visual inspection of a substrate having a plurality of components mounted on a surface,
Imaging means for imaging the component on the substrate;
Storage means for storing an image captured in advance as a non-defective image for a component in a good mounting state;
A visual inspection support device for a board, comprising: a display means for displaying a plurality of parts images picked up by the image pickup means in pairs with non-defective images corresponding to the parts and displaying them on a single screen. . In the visual inspection support device for a substrate according to claim 1,
An input means for inputting a result of pass / fail judgment performed based on the image of the component displayed on the display means;
A visual inspection support apparatus for a substrate, further comprising inspection result storage means for storing predetermined information relating to an inspection result based on input information from the input means. The visual inspection support device for a substrate according to claim 2,
A visual inspection support apparatus for a substrate, wherein a part selected and operated once by the input means is stored in the inspection result storage means as a defective product, and other parts not selected are stored as non-defective products. The visual inspection support device for a substrate according to claim 2,
A visual inspection support device for a substrate, wherein a part selected and operated once by the input means is stored as a non-defective product in the inspection result storage means, and a part selected and operated twice is stored as a defective product.

Images