JP2009150807A - Continuity inspection device - Google Patents

Continuity inspection device Download PDF

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JP2009150807A
JP2009150807A JP2007329810A JP2007329810A JP2009150807A JP 2009150807 A JP2009150807 A JP 2009150807A JP 2007329810 A JP2007329810 A JP 2007329810A JP 2007329810 A JP2007329810 A JP 2007329810A JP 2009150807 A JP2009150807 A JP 2009150807A
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lid
inspected
cam
substrate
contact probe
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Japanese (ja)
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Kazumitsu Oikawa
一光 及川
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Saxa Inc
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Saxa Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent a contact probe from being bent or damaged, in a continuity inspection device, even if a lid is closed by mistake. <P>SOLUTION: A table 3 on which a substrate 2 to be inspected is placed is moved up and down, and a lid 9 with a contact probe 8 is turnably supported through a hinge member 6 openably/closably. A regulation lever 23 is turnably supported around a turning center pin 24, and a cam pin 25 planted in the regulation lever 23 is fitted into a cam groove 21a on the table 3. When the table 3 is lifted, the regulation lever 23 is turned in the counterclockwise direction by a cam action by the cam groove 21a and the cam pin 25, and a regulation part 23a advances between upper and lower side distance rods 16, 15. The turning center pin 24 is fitted into a loose hole 20b formed to have a long hole shape extending slantingly in the vertical direction on a support member 20, and biased downward by a tensile coil spring 27. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、プリント基板に配線された回路の導通状態を検査する導通検査装置に関するものである。   The present invention relates to a continuity inspection apparatus that inspects a continuity state of a circuit wired on a printed circuit board.

従来の導通検査装置としては、図5ないし図8に示すものがある。図5および図6に全体を符号101で示す従来の導通検査装置は、被検査基板2が載置されエアシリンダ12を駆動することによって昇降するテーブル3と、ベース板4に立設された背面板5の上端部にヒンジ部材6を介して枢軸7を回動中心として回動自在に支持され、上記被検査基板2を検査するコンタクトプローブ8が弾持された蓋9とを備えている。テーブル3はベース板4に設けられた一対のリニアガイド11,11によって上下動自在に支持されており、このテーブル3に固定ブロック13を介して固定された載置台14の上端面には、被検査基板2を載置する載置用凹部14aが設けられている。15,15はベース板4の前部の左右端部に立設された一対の下側間隔保持用ロッドであって、蓋9を閉じたときに蓋9の前部の左右端部に設けられた一対の上側間隔保持用ロッド16,16が対接する。   Conventional continuity testing devices include those shown in FIGS. 5 and FIG. 6, the conventional continuity testing apparatus shown as a whole by reference numeral 101 has a table 3 that is moved up and down by driving the air cylinder 12 on which the substrate 2 to be inspected is mounted, and a back mounted on the base plate 4. A lid 9 is provided at the upper end of the face plate 5 via a hinge member 6 so as to be pivotable about a pivot 7 and a contact probe 8 for inspecting the substrate 2 to be inspected. The table 3 is supported by a pair of linear guides 11, 11 provided on the base plate 4 so as to be movable up and down, and an upper end surface of a mounting table 14 fixed to the table 3 via a fixed block 13 is covered with a cover. A mounting recess 14a for mounting the inspection substrate 2 is provided. Reference numerals 15 and 15 denote a pair of lower spacing holding rods erected on the left and right ends of the front portion of the base plate 4, which are provided on the left and right ends of the front portion of the lid 9 when the lid 9 is closed. The pair of upper spacing rods 16 and 16 come into contact with each other.

このような構成において、被検査基板2の導通検査を行うには、蓋9を枢軸7を回動中心として図6中時計方向に回動させて蓋9を開いた状態とし、被検査基板2を載置台14の載置用凹部14aに載置する。被検査基板2を載置したら、枢軸7を回動中心として蓋9を図6中反時計方向に回動させて蓋9を閉じた状態とする。しかる後、エアシリンダ12を駆動しロッド12aを前進させ、テーブル3を上昇させることにより、図7に示すように、コンタクトプローブ8の先端を被検査基板2の被検査部位に接触させ、コンタクトプローブ8を介して被検査基板2の導通検査を行っている。   In such a configuration, in order to inspect the continuity of the substrate 2 to be inspected, the lid 9 is rotated in the clockwise direction in FIG. Is mounted in the mounting recess 14a of the mounting table 14. When the substrate 2 to be inspected is placed, the lid 9 is rotated counterclockwise in FIG. 6 with the pivot 7 as the rotation center to close the lid 9. Thereafter, the air cylinder 12 is driven to advance the rod 12a, and the table 3 is raised to bring the tip of the contact probe 8 into contact with the part to be inspected of the inspected substrate 2 as shown in FIG. The continuity inspection of the substrate 2 to be inspected is performed via 8.

上述した従来の導通検査装置においては、テーブル3を下降させずに上昇させたままの状態で誤って蓋9を閉じてしまうと、図8に示すようにコンタクトプローブ8が傾斜した状態で被検査基板2に接触するため、コンタクトプローブ8が折れ曲がったり破損し易いという問題があった。   In the conventional continuity testing apparatus described above, if the lid 9 is accidentally closed while the table 3 is raised without being lowered, the contact probe 8 is tilted as shown in FIG. There is a problem that the contact probe 8 is easily bent or damaged because of contact with the substrate 2.

本発明は上記した従来の問題に鑑みなされたものであり、その目的とするところは、誤って蓋を閉じる操作をしてもコンタクトプローブが折れ曲がったり破損してしまうというようなことがない導通検査装置を提供するところにある。   The present invention has been made in view of the above-described conventional problems, and the object of the present invention is to conduct a continuity test in which the contact probe does not bend or break even if the lid is accidentally closed. The device is in place.

この目的を達成するために、本発明は、被検査基板が載置され昇降するテーブルと、閉じた状態と開いた状態とするように回動自在に支持され被検査基板を検査するコンタクトプローブが設けられた蓋とを備え、前記蓋を閉じた状態で前記テーブルを上昇させ、前記コンタクトプローブの先端に前記被検査基板を接触させることにより検査を行う導通検査装置において、前記テーブルの昇降にともない蓋の閉じを規制する規制位置と退避位置との間を回動する規制部材を備え、この規制部材と前記テーブルとの間に、規制部材を前記規制位置と前記退避位置との間で回動させるカム手段を設けたものである。   In order to achieve this object, the present invention includes a table on which a substrate to be inspected is placed and raised and lowered, and a contact probe that is rotatably supported so as to be in a closed state and an open state, and inspects the substrate to be inspected. In a continuity inspection apparatus that includes a lid provided, raises the table with the lid closed, and makes an inspection by bringing the substrate to be inspected into contact with the tip of the contact probe. A restricting member that rotates between a restricting position that restricts closing of the lid and a retracted position is provided, and the restricting member is rotated between the restricting position and the retracted position between the restricting member and the table. Cam means is provided.

本発明は、前記発明において、前記規制部材に、装置固定部に設けた遊動孔に上下方向に遊動可能に係入される回動中心ピンを設け、この回動中心ピンを下方に付勢する付勢手段と、前記テーブルが下降し蓋が閉じられた状態からテーブルを上昇させることにより、前記規制部材の前記規制位置への移動を阻止する阻止部材とを備えたものである。   According to the present invention, in the invention described above, the regulating member is provided with a rotation center pin that is movably engaged in a vertical direction in a floating hole provided in the device fixing portion, and biases the rotation center pin downward. An urging means and a blocking member that prevents the movement of the restriction member to the restriction position by raising the table from a state where the table is lowered and the lid is closed.

本発明によれば、テーブルを上昇させた状態では、誤って蓋を閉じる操作を行っても規制部材によって蓋を閉じることができないため、コンタクトプローブが傾いた状態で被検査基板に接触するようなことがなくなるから、コンタクトプローブが折れ曲がったり破損してしまうというようなことがない。   According to the present invention, when the table is raised, the lid cannot be closed by the restricting member even if the lid is accidentally closed, so that the contact probe is in contact with the substrate to be inspected in a tilted state. Therefore, the contact probe is not bent or damaged.

以下、本発明の実施の形態を図に基づいて説明する。図1は本発明に係る導通検査装置の正面図、図2は同じく側面図、図3は同じく蓋を閉じてテーブルを上昇させて検査を行っている状態を示す側面図、図4は同じく蓋が開いた状態でテーブルが上昇している状態を示す側面図である。これらの図において、上述した図5ないし図8に示す従来技術において説明した同一または同等の部材については、同一の符号を付し詳細な説明は適宜省略する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a front view of a continuity testing apparatus according to the present invention, FIG. 2 is a side view of the same, FIG. 3 is a side view of a state in which the lid is closed and the table is raised, and FIG. It is a side view which shows the state which has raised the table in the state which opened. In these drawings, the same or equivalent members described in the prior art shown in FIGS. 5 to 8 described above are denoted by the same reference numerals, and detailed description thereof is omitted as appropriate.

図1および図2において、導通検査装置1は、ベース板4の左右の両端部に立設された装置固定部として機能する支承部材20,20を備えており、この支承部材20の上部20aは、図1および図2に示すように前後と上方に開口する溝20cが形成されている。また、この支承部材20の上部20aには、図2に示すように側面視において上下方向に傾斜した状態で延在する長孔状に形成された遊動孔20bが、支承部材20を左右に貫通するように形成されている。この遊動孔20bは、図3に示すように、後述する阻止部材として機能する上側間隔保持用ロッド16のA点を中心とした円弧の軌跡B上に形成されている。   1 and 2, the continuity test apparatus 1 includes support members 20 and 20 that function as device fixing portions erected on both left and right ends of the base plate 4, and an upper portion 20 a of the support member 20 is As shown in FIGS. 1 and 2, a groove 20c is formed that opens in the front-rear direction and the upper direction. Further, as shown in FIG. 2, a floating hole 20b formed in the shape of a long hole extending in a vertically inclined state in a side view penetrates the support member 20 left and right in the upper portion 20a of the support member 20. It is formed to do. As shown in FIG. 3, the floating hole 20 b is formed on an arc locus B centering on the point A of the upper distance holding rod 16 that functions as a blocking member described later.

テーブル3の左右の両端のそれぞれには、カムブロック21が固定されており、このカムブロック21には水平方向に延在する長孔状に形成されたカム溝21aが設けられている。23は側面視が略三角形に形成された規制レバーであって、三つの角部のうちの一つに上、下側間隔保持用ロッド16,15間に進出して、蓋9が不用意に閉じられることを規制する規制部23aが突設されている。また、この規制レバー23の他の二つの角部のそれぞれには、支承部材20の遊動孔20bに係入される回動中心ピン24とカムブロック21のカム溝21aに係入されるカムピン25とが植設されており、この規制レバー23は支承部材20の上部20aに挟持され、後述するように回動中心ピン24を回動中心として回動自在に支持されている。   A cam block 21 is fixed to each of the left and right ends of the table 3, and the cam block 21 is provided with a cam groove 21 a formed in a long hole shape extending in the horizontal direction. Reference numeral 23 denotes a regulating lever formed in a substantially triangular shape when viewed from the side. The regulating lever 23 is advanced into one of the three corners and between the lower spacing rods 16 and 15, and the lid 9 is inadvertently moved. A restricting portion 23a for restricting the closing is projected. Further, at each of the other two corners of the restricting lever 23, a rotation center pin 24 engaged with the idler hole 20 b of the support member 20 and a cam pin 25 engaged with the cam groove 21 a of the cam block 21. The restriction lever 23 is sandwiched between the upper portions 20a of the support members 20, and is supported rotatably about a rotation center pin 24 as described later.

27,27は前記回動中心ピン24の両端部と支承部材20との間に懸架された引張りコイルばねであって、この引張りコイルばね27の引張力によって回動中心ピン24が遊動孔20bの下端に位置付けられており、規制レバー23はこの回動中心ピン24を回動中心として支承部材20に回動自在に支持されている。すなわち、カムピン25は、回動中心ピン24を中心とした円弧の軌跡C上を回動可能となる。   Reference numerals 27 and 27 denote tension coil springs suspended between both ends of the rotation center pin 24 and the support member 20, and the rotation center pin 24 is connected to the floating hole 20b by the tensile force of the tension coil spring 27. The regulating lever 23 is positioned at the lower end, and is supported rotatably on the support member 20 with the rotation center pin 24 as a rotation center. That is, the cam pin 25 can rotate on a circular arc locus C around the rotation center pin 24.

このような構成において、テーブル3が下降した図2に示す状態から、テーブル3が上昇すると、軌跡C上を回動可能なカムピン25はカム溝21aに沿って図中左方向へ移動するため、規制レバー23は回動中心ピン24を回動中心として反時計方向へ回動し、図4に示すように規制部23aが上、下側間隔保持用ロッド16,15間に進出する。この規制部23aが上、下側間隔保持用ロッド16,15間に進出する位置を、以下規制位置という。   In such a configuration, when the table 3 is lifted from the state shown in FIG. 2 where the table 3 is lowered, the cam pin 25 that can rotate on the locus C moves in the left direction in the drawing along the cam groove 21a. The regulating lever 23 pivots counterclockwise about the pivot center pin 24 as a pivot center, and the regulating portion 23a advances between the upper and lower spacing rods 16 and 15 as shown in FIG. The position where the restricting portion 23a advances between the upper and lower spacing rods 16 and 15 is hereinafter referred to as a restricting position.

一方、この規制位置から、テーブル3が下降すると、軌跡C上を回動可能なカムピン25はカム溝21aに沿って図中右方向へ移動するため、規制レバー23は回動中心ピン24を回動中心として時計方向へ回動し、図2に示すように規制部23aが上、下側間隔保持用ロッド16,15間から離間する。この規制部23aが上、下側間隔保持用ロッド16,15間から離間した位置を、以下退避位置という。これらカム溝21aとカムピン25とが、テーブル3の昇降にともなって規制レバー23を反時計方向または時計方向へ(前記規制位置と前記退避位置との間で)回動させるカム手段を構成している。   On the other hand, when the table 3 is lowered from this restricting position, the cam pin 25 that can turn on the locus C moves in the right direction in the drawing along the cam groove 21a, so that the restricting lever 23 rotates the turning center pin 24. As shown in FIG. 2, the restricting portion 23 a is separated from the upper and lower spacing rods 16 and 15. The position where the restricting portion 23a is separated from the upper and lower spacing rods 16 and 15 is hereinafter referred to as a retreat position. The cam groove 21a and the cam pin 25 constitute cam means for rotating the regulating lever 23 counterclockwise or clockwise (between the regulating position and the retracted position) as the table 3 moves up and down. Yes.

次に、このように構成された導通検査装置1によって、被検査基板2の導通を検査する方法について説明する。先ず、エアシリンダ12を駆動しロッド12aを後退させることにより、図2に示すようにテーブル3を下降させる。枢軸7を回動中心として蓋9を図中時計方向へ回動させることにより蓋9を開き、被検査基板2を載置台14の載置用凹部14a上に載置する。   Next, a method for inspecting the continuity of the substrate 2 to be inspected by the continuity inspection apparatus 1 configured as described above will be described. First, the air cylinder 12 is driven and the rod 12a is moved backward to lower the table 3 as shown in FIG. The lid 9 is opened by rotating the lid 9 in the clockwise direction in the drawing with the pivot 7 as the center of rotation, and the substrate 2 to be inspected is placed on the placement recess 14 a of the placement table 14.

しかる後、枢軸7を回動中心として蓋9を図中反時計方向へ回動させることにより、上側間隔保持用ロッド16の下端を下側間隔保持用ロッド15の上端に対接させ蓋9を閉じる。この状態で、コンタクトプローブ8は傾くことなく鉛直方向を指向している。次いで、エアシリンダ12を駆動しロッド12aを前進させることにより、テーブル3を上昇させると、カム溝21aとカムピン25とのカム作用により、規制レバー23が回動中心ピン24を回動中心として反時計方向にわずかに回動し、規制部23aの先端が上側間隔保持用ロッド16のA点に当接する。   Thereafter, the lid 9 is rotated counterclockwise in the figure with the pivot 7 as the center of rotation, so that the lower end of the upper spacing rod 16 is brought into contact with the upper end of the lower spacing rod 15 and the lid 9 is moved. close. In this state, the contact probe 8 is directed in the vertical direction without being inclined. Next, when the table 3 is lifted by driving the air cylinder 12 and moving the rod 12a forward, the regulating lever 23 reacts with the rotation center pin 24 as the rotation center by the cam action of the cam groove 21a and the cam pin 25. It slightly turns clockwise, and the tip of the restricting portion 23 a comes into contact with the point A of the upper spacing rod 16.

この当接により、規制レバー23の回動中心ピン24を回動中心とした反時計方向への回動が阻止される。このため、さらにテーブル3が上昇すると、回動中心ピン24が引張りコイルばね27の引張力に抗してA点を中心とした円弧の軌跡B上に設けられている遊動孔20bに沿って上方へ移動するので、規制レバー23がA点を回動中心として反時計方向へ回動する。このように、回動中心ピン24が遊動孔20b内を遊動可能に係入されているため、規制レバー23が不動作状態になるようなことがないから、テーブル3が円滑に上昇する。テーブル3が上昇限に達すると、エアシリンダ12の駆動が停止し、図3に示すようにコンタクトプローブ8の先端に被検査基板2の検査部位が当接するので、被検査基板2の導通検査が行われる。   By this contact, the counter lever 23 is prevented from rotating counterclockwise around the rotation center pin 24 as the rotation center. Therefore, when the table 3 is further raised, the rotation center pin 24 moves upward along the floating hole 20b provided on the locus B of the arc centered on the point A against the tensile force of the tension coil spring 27. Therefore, the regulating lever 23 rotates counterclockwise around the point A as the rotation center. Thus, since the rotation center pin 24 is movably engaged in the floating hole 20b, the regulation lever 23 does not become inoperative, so that the table 3 rises smoothly. When the table 3 reaches the upper limit, the driving of the air cylinder 12 is stopped, and the inspection portion of the substrate 2 to be inspected contacts the tip of the contact probe 8 as shown in FIG. Done.

次に、図4を用いて、テーブル3を上昇させたままの状態で蓋3が開けられている状態から閉じる動作について説明する。テーブル3が上昇し蓋3が開けられている状態では、上側間隔保持用ロッド16の下端が下側間隔保持用ロッド15の上端から離間している。テーブル3が上昇していることにより、カムブロック21のカム溝21aと規制レバー23のカムピン25とのカム作用により、規制レバー23は回動中心ピン24を回動中心として図中反時計方向に回動し、規制部23aが上側間隔保持用ロッド16の下端と下側間隔保持用ロッド15の上端との間に進出し、規制レバー23が規制位置に位置付けられている。したがって、この規制レバー23によって蓋3を閉じることが規制されるから、テーブル3を上昇させた状態では、蓋3を閉じることができなくなる。このため、コンタクトプローブ8が傾いた状態で被検査基板2に接触するようなことがなくなるから、コンタクトプローブ8が折れ曲がったり破損してしまうというようなことがない。   Next, the operation of closing the table 3 from the state in which the lid 3 is opened while the table 3 is raised will be described with reference to FIG. When the table 3 is raised and the lid 3 is opened, the lower end of the upper spacing rod 16 is separated from the upper end of the lower spacing rod 15. When the table 3 is raised, the regulating lever 23 rotates counterclockwise in the figure with the pivoting center pin 24 as the pivoting center due to the cam action of the cam groove 21a of the cam block 21 and the cam pin 25 of the regulating lever 23. The restricting portion 23a advances between the lower end of the upper interval holding rod 16 and the upper end of the lower interval holding rod 15, and the restricting lever 23 is positioned at the restricting position. Therefore, since the closing of the lid 3 is restricted by the restriction lever 23, the lid 3 cannot be closed when the table 3 is raised. For this reason, since the contact probe 8 does not come into contact with the substrate 2 to be inspected in a tilted state, the contact probe 8 is not bent or damaged.

本発明に係る導通検査装置の正面図である。It is a front view of the continuity test apparatus according to the present invention. 本発明に係る導通検査装置の側面図である。It is a side view of the continuity test apparatus according to the present invention. 本発明に係る導通検査装置において、蓋を閉じてテーブルを上昇させて検査を行っている状態を示す側面図である。In the continuity test apparatus according to the present invention, it is a side view showing a state in which a test is performed by closing a lid and raising a table. 本発明に係る導通検査装置において、蓋が開いた状態でテーブルが上昇している状態を示す側面図である。In the continuity test apparatus according to the present invention, it is a side view showing a state where the table is raised with the lid open. 従来の導通検査装置の正面図である。It is a front view of the conventional continuity inspection apparatus. 従来の導通検査装置の側面図である。It is a side view of the conventional continuity inspection apparatus. 従来の導通検査装置において、検査を行っている状態を示す側面図である。It is a side view which shows the state which is test | inspecting in the conventional continuity inspection apparatus. 従来の導通検査装置において、テーブルを上昇させた状態で誤って蓋を閉じている状態を示す側面図である。It is a side view which shows the state which closed the lid accidentally in the state which raised the table in the conventional continuity inspection apparatus.

符号の説明Explanation of symbols

1…導通検査装置、2…被検査基板、3…テーブル、6…ヒンジ部材、8…コンタクトプローブ、9…蓋、12…エアシリンダ、16…上側間隔保持用ロッド(阻止部材)、20a…遊動孔、21a…カム溝、23…規制レバー、24…回動中心ピン、25…カムピン、27…引張りコイルばね。   DESCRIPTION OF SYMBOLS 1 ... Continuity test apparatus, 2 ... Board to be inspected, 3 ... Table, 6 ... Hinge member, 8 ... Contact probe, 9 ... Lid, 12 ... Air cylinder, 16 ... Upper space | interval holding rod (blocking member), 20a ... Sliding A hole, 21a ... a cam groove, 23 ... a control lever, 24 ... a rotation center pin, 25 ... a cam pin, 27 ... a tension coil spring.

Claims (2)

被検査基板が載置され昇降するテーブルと、
閉じた状態と開いた状態とするように回動自在に支持され被検査基板を検査するコンタクトプローブが設けられた蓋とを備え、
前記蓋を閉じた状態で前記テーブルを上昇させ、前記コンタクトプローブの先端に前記被検査基板を接触させることにより検査を行う導通検査装置において、
前記テーブルの昇降にともない蓋の閉じを規制する規制位置と退避位置との間を回動する規制部材を備え、
この規制部材と前記テーブルとの間に、規制部材を前記規制位置と前記退避位置との間で回動させるカム手段を設けたことを特徴とする導通検査装置。
A table on which the substrate to be inspected is placed and raised and lowered;
A lid provided with a contact probe that is rotatably supported so as to be in a closed state and an open state and inspects a substrate to be inspected,
In the continuity inspection apparatus that performs the inspection by raising the table with the lid closed and bringing the substrate to be inspected into contact with the tip of the contact probe,
A regulating member that rotates between a regulating position that regulates closing of the lid and a retracted position as the table is raised and lowered;
A continuity inspection apparatus characterized in that cam means for rotating the regulating member between the regulating position and the retracted position is provided between the regulating member and the table.
前記規制部材に、装置固定部に設けた遊動孔に上下方向に遊動可能に係入される回動中心ピンを設け、
この回動中心ピンを下方に付勢する付勢手段と、
前記テーブルが下降し蓋が閉じられた状態からテーブルを上昇させることにより、前記規制部材の前記規制位置への移動を阻止する阻止部材とを備えたことを特徴とする請求項1記載の導通検査装置。
The regulating member is provided with a rotation center pin that is movably engaged in the up and down direction in a floating hole provided in the device fixing portion,
An urging means for urging the rotation center pin downward;
The continuity test according to claim 1, further comprising: a blocking member that prevents the movement of the restriction member to the restriction position by raising the table from a state where the table is lowered and the lid is closed. apparatus.
JP2007329810A 2007-12-21 2007-12-21 Continuity inspection device Pending JP2009150807A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007329810A JP2009150807A (en) 2007-12-21 2007-12-21 Continuity inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007329810A JP2009150807A (en) 2007-12-21 2007-12-21 Continuity inspection device

Publications (1)

Publication Number Publication Date
JP2009150807A true JP2009150807A (en) 2009-07-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007329810A Pending JP2009150807A (en) 2007-12-21 2007-12-21 Continuity inspection device

Country Status (1)

Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105093574A (en) * 2015-06-05 2015-11-25 京东方科技集团股份有限公司 Display panel test bench

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105093574A (en) * 2015-06-05 2015-11-25 京东方科技集团股份有限公司 Display panel test bench
CN105093574B (en) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 Display panel monitor station

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