JP2009133874A - Method for observing cross-section - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide jigs for holding samples in microscopic observation and, in particular, an observation jig that makes it possible to highly precisely observe a cross-sectional structure of a sample whose cross-section has been exposed by a cross-sectional cutting device. <P>SOLUTION: A microscopic observation holding jig, employed for microscopically observing a cross-section of a sample held by a cross-sectional cutting device sample holder, whose cross-section has been exposed by a cross-sectional cutting device without removing the sample from the cross-sectional cutting device sample holder, is in the shape of a flat plate and has a hole into which at least a part of a fixed part of the cross-sectional cutting device sample holder to the cross-sectional cutting device can be inserted and which allows the cross-sectional cutting device sample holder inserted thereinto to rotate while keeping a cross-sectional cut surface of the sample held by the cross-sectional cutting device sample holder parallel to the microscopic observation holding jig. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a jig for fixing a cross-sectional observation sample when performing microscopic observation. In particular, the present invention relates to an observation jig capable of observing a cross-sectional structure of a cross-sectional sample that has been subjected to a cross-section with a cross-section cutting apparatus with high accuracy.

  Conventionally, when observing a cross section of a sample, particularly a sheet-like or film-like sample with a microscope, and measuring the layer configuration and film thickness of the sample, the cross-section is often used with a cross-section cutting device (Patent Literature). 1). At this time, when observing the cross-sectional structure of the sample with a microscope, the sample flakes obtained by cutting the sample with a cross-section cutting device are held on a slide glass and observed with a microscope.

  Also, remove the cross-section sample cut by the cross-section cutting device from the cross-section cutting sample holder and fix it on the slide glass with clay or the like, or leave the cross-section sample mounted on the cross-section cutting sample holder on the slide glass. Microscopic observation is performed.

  However, the sample flakes cut and sliced from the sample by the cross-section cutting device are prone to warpage due to the internal stress of the flakes themselves and uneven thickness due to the layer structure of the sample, making it difficult to observe with high accuracy. is there.

  In addition, maintaining the cutting surface of the sample block removed from the cross-section cutting sample holder horizontally with respect to the slide glass requires a technique, and high-precision observation is difficult.

  Further, the cutting surface of the sample as it is mounted on the cutting sample holder can be kept horizontal with respect to the slide glass, but there is a problem that stability is poor and handling with respect to visual field movement and rotation during microscope observation is poor.

JP 2001-59801 A

  The present invention has been made in view of the above-described conventional problems, and the problem is that the cross-section cutting of the cross-section cutting holder is performed without removing the sample cross-section cut by the cross-section cutting apparatus from the cutting sample holder. By inserting a part of the fixed part to the device into the hole for the microscope observation fixture, the cutting surface of the sample can be kept horizontal with respect to the microscope observation fixture, and can be rotated to improve handling. An object of the present invention is to provide a fixing jig for microscopic observation.

In order to solve the above problems, the invention according to claim 1 of the present invention provides:
This is a microscope observation jig for observing the sample cross section with a microscope without removing the sample fixed to the cross section cutting apparatus sample holder from which the cross section has been extracted by the cross section cutting apparatus. And
The microscope observation fixing jig has a flat plate shape, and at least a part of a fixing portion of the cross section cutting sample holder to the cross section cutting apparatus can be inserted, and the cross section cutting sample holder is inserted. Microscopic observation characterized by having a hole for enabling rotation while keeping the cross-sectional cutting surface of the sample fixed to the cross-section cutting sample holder horizontal with respect to the microscope observation fixing jig. Fixing jig.

Next, the invention according to claim 2 of the present invention is as follows.
The microscope observation fixture for enabling rotation of the cross-section cutting sample holder has a hole having an inner diameter of 10 to 100 um larger than the outer diameter of the fixing portion of the cross-section cutting sample holder. The microscope observation fixing jig according to claim 1, wherein:

Next, the invention according to claim 3 of the present invention is
The scale for confirming the rotation angle of the sample holder for cross-sectional cutting is provided in the peripheral part of the hole for enabling rotation of the sample holder for cross-sectional cutting. The fixing jig for microscopic observation described in 1.

Next, the invention according to claim 4 of the present invention is
The microscope according to any one of claims 1 to 3, wherein the microscope observation fixture has a thickness of 1 to 20 mm, and is a rectangular flat plate having a length of 70 to 80 mm and a width of 20 to 30 mm. This is an observation fixture.

  Since the microscope observation fixture of the present invention has the above-described configuration, the sample fixed to the cross-section cutting device sample holder can be removed from the cross-section cutting device sample holder without using a flat plate-like microscope observation fixture. At least a part of the fixing portion of the cross-section cutting sample holder to the cross-section cutting apparatus is inserted. Then, the cross-section cutting surface of the sample fixed to the cross-section cutting sample holder can be rotated while being kept horizontal with respect to the microscope observation fixing jig to perform high-precision microscopic observation.

  In addition, since the microscope observation fixture of the present invention has a hole having an inner diameter that is 10 to 100 μm larger than the outer diameter of the fixing portion of the cross-section cutting sample holder, the sample can be rotated with high handling properties. . Furthermore, escape of the sample from the observation field during sample rotation can be prevented.

  In addition, a scale for checking the rotation angle of the cross-section cutting sample holder is provided at the periphery of the hole for enabling the cross-section cutting sample holder to be rotated, so that the observation visual field can be positioned efficiently. Can be

  Further, it is possible to fix the microscope observation fixture on the sample stage of an existing microscope. And the handling property of sample fine movement can be enhanced.

It is the schematic which shows the outline of one Example of the use condition of the fixing jig for microscope observation of this invention. It is a perspective view which shows the outline of one Example of the sample holder for cross-section cutting apparatuses of the fixing jig for microscope observation of this invention. It is a perspective view for demonstrating the outline of the fixing jig for microscope observation of this invention. It is the schematic which shows the state which observes the cutting surface of the cross-sectional observation sample 3 with the microscope 14 in which the fixing jig 11 for microscope observation of this invention is used.

  A microscope observation fixture according to the present invention will be described in detail below in accordance with an embodiment with reference to the drawings. FIG. 1 is a schematic view showing an outline of one embodiment of a usage state of the microscope observation fixing jig of the present invention.

  As a sample fixed to the sample holder 1 for a cross-section cutting apparatus shown in FIG. 1, a sheet or film sample can be used. And as a sheet | seat thru | or film-like sample, the decorative sheet for building materials, the laminate film for packaging materials, a barrier film, the optical film for displays, etc. are mentioned.

  The sheet or film-like sample has a multilayer structure, and it is necessary to observe a cross section with a microscope in order to observe these layer structures. When the sheet or film sample does not have a sufficient thickness and does not have sufficient strength for cutting a cross section, the sample can be embedded in an adhesive, an ultraviolet curable resin, or the like.

  Examples of the cross-section cutting device include an ultramicrotome. In this apparatus, as shown in FIG. 1, the sample is held on the cross-section cutting sample holder 1, and then the fixing portion 2 of the cross-section sample holder 1 is fixed to the sample holder fixing arm 6 of the cross-section cutting apparatus 5.

  Next, the cross-section of the sample is performed with a cutting knife 4 fixed to the cross-section cutting device 5. Examples of the cutting knife 4 used in the microscope observation fixing jig of the present invention include a diamond knife, a glass knife, and a metal knife.

  Usually, when cutting a section, the section is processed with an inexpensive glass knife or the like. And when the obtained cross section does not have sufficient smoothness, it can process a cross section with an expensive diamond knife etc., and it can be set as the cross-section observation sample which has a smoother mirror surface.

  Moreover, the movement of the sample holder 1 for a cross-section cutting device and the sample holder fixing arm 6 is indicated by arrows in FIG. When the sample holder fixing arm 6 moves from top to bottom, the tip of the sample comes into contact with the cutting knife 4 and cuts out a cross section. Thereafter, the sample holder fixing arm 6 moves backward from the lower side to the upper side so that the cutting knife 4 does not come into contact with the sample.

  Then, the sample holder fixing arm 6 moves forward by the cutting thickness set by the cross-section cutting device 5, and again moves from the top to the bottom to cross-section the sample. The cross-section of the sample is performed by repeating this process, and a cross-section observation sample having a smooth cross-section closer to a mirror surface can be obtained by performing cutting a plurality of times.

  Next, FIG. 2 is a perspective view showing an outline of an embodiment of a sample holder for a cross-section cutting device of a fixing jig for microscopic observation according to the present invention.

  As the sample holder 1 for cutting a cross section shown in FIG. 2, an ultramicrotome sample holder or a holder having a function of fixing the sample between the fixed plate 9 and the movable plate 10 by tightening the sample fixing screw 8 is mentioned. It is done. The cross section cutting sample holder 1 has a fixing portion 2 attached to a fixed arm 6 of the cross section cutting apparatus. And the fixing | fixed part 2 of the sample holder 1 for cross-section cutting and the fixed arm 6 of a cross-section cutting apparatus are normally fixed by inserting a screw | thread from the side part of the fixed arm 6. FIG.

  Next, FIG. 3 is a perspective view for explaining the outline of the microscope observation fixing jig of the present invention. As shown in FIG. 3, the microscope observation fixing jig 11 of the present invention is formed in a flat plate shape, and at least a part of a fixing portion of the cross section cutting sample holder 1 to the cross section cutting apparatus can be inserted. it can. Then, the cross-section cutting surface of the sample fixed to the cross-section cutting sample holder with the cross-section cutting sample holder 1 inserted can be rotated while being kept horizontal with respect to the microscope observation fixing jig. It has a hole.

  Further, in the microscope observation fixing jig 11 of FIG. 3, a through hole 12 is provided at the center thereof. And the fixing | fixed part 2 of the sample holder 1 for cross-section cutting apparatuses can be inserted. Furthermore, as shown in FIG. 3, although the through hole 12 is shown as the hole 12 of the microscope observation fixing jig 11 of the present invention, the microscope observation fixing jig of the present invention may be a hole that does not penetrate. good. However, if the hole does not have a sufficient depth, it is difficult to rotate while keeping the sample holder 1 for a cross-section cutting device stably horizontal, so care must be taken.

  Moreover, it is preferable that the through hole 12 of the fixing jig for microscope observation of the present invention has a diameter that is 10 to 100 μm larger than the outer diameter of the fixing part 2 of the sample holder 1 for a cross-section cutting apparatus. Further, when the difference between the diameter of the fixing jig for microscope observation and the outer diameter of the fixing part 2 of the sample holder for cross-section cutting apparatus is less than 10 μm, the fixing part 2 of the sample holder for cross-section cutting apparatus 1 is fixed for microscope observation. It becomes difficult to easily insert the jig 11 into the hole.

  Further, when the difference between the diameter of the microscope observation fixture 11 and the outer diameter of the fixing portion 2 of the sample holder 1 for a cross-section cutting apparatus exceeds 100 μm, the microscope observation fixture 11 is used during microscope observation. When the sample holder 1 for a cross-section cutting apparatus provided with the cross-section observation sample 3 is rotated while being inserted into the cross-section, the cross-section observation sample 3 is greatly deviated from the field of view of the microscope, and the working efficiency is reduced.

  The material for forming the microscope observation fixture 11 of the present invention may be any known material. For example, an easily processable material such as stainless steel, aluminum, or plastic can be used.

  Moreover, it is preferable that the microscope observation fixing jig 11 is a rectangle having a length of 70 to 80 mm, a width of 20 to 30 mm, and a thickness of 1 to 20 mm. The above size is almost the same as the size of the glass plate.

  Moreover, in the case of an optical microscope among microscopes, a stopper for fixing is provided on a microscope sample stage in order to observe an observation sample on a glass plate. The stopper has a sample moving mechanism capable of moving the observation location with a dial.

  A minute movement of the observation location can be easily performed by the dial operation. That is, in the present invention, the microscope observation fixing jig 11 can be easily fixed to the stopper on the microscope stage by making the microscope observation fixing jig 11 substantially the same as the size of the glass plate.

  A positioning scale 13 is provided around the through-hole 12 on the upper surface of the microscope observation fixture 11. By providing the scale 13, it is possible to easily check the rotation angle of the cross-section cutting apparatus sample holder 1 to which the microscopic observation fixing jig 11 and the cross-section observation sample 3 are fixed during microscopic observation.

  FIG. 4 is a schematic view showing a state in which the cut surface of the cross-sectional observation sample 3 is observed with the microscope 14 using the microscope observation fixing jig 11 of the present invention. Examples of the microscope using the microscope observation fixing jig 11 of the present invention include an optical microscope and a stereomicroscope. As shown in FIG. 4, the microscope 14 irradiates the observation object mounted on the microscope sample stage 16 with the incident light 17 or the transmitted light 18, and selects an arbitrary magnification of the objective lens 15. Images of several thousand times can be obtained.

  Further, the incident light 17 is mainly used to observe the cutting surface using the microscope observation fixing jig 11 of the present invention. The section observation sample 3 is rotated along the microscope observation fixing jig 11. Further, the observation image is moved vertically and horizontally using the dial operation of the microscope sample stage 16. When the microscope sample stage 16 of the microscope 14 is not operated by dialing, the observation image is moved manually up and down and left and right.

  The microscope observation fixture of the present invention is a wonderful invention that can be used for research and development of laminated pharmaceutical members as well as easily and with high accuracy when observing a sheet or film-like sample cross section with a microscope. It is.

DESCRIPTION OF SYMBOLS 1 ... Sample holder for cross-sectional cutting devices 2 ... Fixed part of sample holder for cross-sectional cutting devices 3 ... Cross-section observation sample 4 ... Cutting knife 5 ... Cross-section cutting device 6 ... Sample holder fixing arm 7 ... Scale of sample holder 8 ... Sample fixing Screw 9 ... Fixed plate 10 ... Moving plate 11 ... Fixing jig for microscope observation 12 ... Through hole 13 ... Scale 14 ... Microscope main body 15 ... Objective lens 16 ... Microscope sample stage 17 ... Incident light 18 ... Transmitted light

Claims (4)

This is a microscope observation jig for observing the sample cross section with a microscope without removing the sample fixed to the cross section cutting apparatus sample holder from which the cross section has been extracted by the cross section cutting apparatus. And
The microscope observation fixing jig has a flat plate shape, and at least a part of a fixing portion of the cross section cutting sample holder to the cross section cutting apparatus can be inserted, and the cross section cutting sample holder is inserted. Microscopic observation characterized by having a hole for enabling rotation while keeping the cross-sectional cutting surface of the sample fixed to the cross-section cutting sample holder horizontal with respect to the microscope observation fixing jig. Fixing jig.   The microscope observation fixture for enabling rotation of the cross-section cutting sample holder has a hole having an inner diameter of 10 to 100 um larger than the outer diameter of the fixing portion of the cross-section cutting sample holder. The fixing jig for microscopic observation according to claim 1, wherein:   The scale for confirming the rotation angle of the sample holder for cross-sectional cutting is provided in the peripheral part of the hole for enabling rotation of the sample holder for cross-sectional cutting. Fixing jig for microscopic observation as described in 2.   The microscope according to any one of claims 1 to 3, wherein the microscope observation fixture has a thickness of 1 to 20 mm, and is a rectangular flat plate having a length of 70 to 80 mm and a width of 20 to 30 mm. Observation fixture.

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