JP2009097979A - Apparatus for measuring waveform - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an apparatus for measuring waveform that can measure accurately and efficiently and analyze the measured waveforms. <P>SOLUTION: This invention relates to an improved apparatus for waveform measurement that measures waveform and displays the waveform on a display screen mounted on the apparatus. The apparatus comprises a display processing section, which generates image data equivalent to the plurality of screens to be displayed on the display screen; a display memory, which stores each of image data equivalent to the plurality of screens in the display processing section; and a plurality of video output terminals for outputting each of image data in the display memory, to an external display. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a waveform measuring apparatus that measures a waveform to be measured and displays the waveform on a display screen attached to the apparatus, and more specifically, waveform measurement that can accurately and efficiently measure and analyze the waveform to be measured. This is related to the device.

  Waveform measuring devices are, for example, digital oscilloscopes, etc. In recent years, products that have not only analog input terminals but also logic input terminals to monitor multiple signals of mixed analog / logic circuits with one measuring device are products. (For example, refer to Patent Document 1).

  In such a device, an analog signal is AD converted and stored in a memory, and a binary (“0” (L level) or “1” (H level)) logic signal is sampled by a sampler and stored in the memory. . Then, data is read from the memory and a logic signal or an analog signal is displayed in a waveform on the display screen of the display unit.

  Furthermore, not only a display screen provided in the waveform measuring device itself, but also a video output terminal is provided so that an external display device can display the same waveform as the image displayed on the waveform measuring device (for example, a patent) Reference 2). Thereby, it can be displayed on an external display device having a display screen larger than the display screen provided in the waveform measuring device itself.

  FIG. 3 is a diagram showing an example of the front surface of a conventional waveform measuring apparatus. As an example, an analog signal input terminal with 4 channels and a logic signal input terminal with 8 bits are shown.

  In FIG. 3, an analog signal input terminal is provided at the lowermost stage on the front surface of the apparatus, and a probe (not shown) is connected thereto. As an example, a 4-channel input is shown. A display screen D1 is provided on the left side of the front of the apparatus, and an operation panel Pa is provided on the right side of the front of the apparatus.

  The display screen D1 shows an example in which the waveform of the analog signal and the waveform of the logic signal are displayed simultaneously. Of course, only one waveform of an analog signal or a logic signal may be displayed.

  In addition, the operation panel Pa on the right side of the front side of the apparatus is provided with a plurality of keys. By operating these keys, setting of display conditions for the display screen, setting of measurement conditions, setting of waveform analysis, setting of arithmetic expressions Etc. are performed.

  Further, on the back or side of the apparatus, there are input terminals for logic signals, video output terminals for outputting the same image data as the image displayed on the display screen D1, and for communication for communication with a personal computer or other measuring equipment. Terminals and the like are provided.

JP-A-7-294558 JP-A-8-327666

  However, the waveform measuring apparatus that can measure both analog signals and logic signals simultaneously has a very large number of waveforms to be displayed. It is necessary to observe the waveform of each signal. For example, when the waveform of an analog signal is displayed with the horizontal axis (time axis) enlarged, or when the waveform of a logic signal is displayed with the vertical axis (amplitude) and the horizontal axis reduced to display the waveform of all bits There is.

  In such a case, the horizontal axis is set by changing the waveform display from all channels and all bits to displaying only analog signals. Subsequently, it is necessary to perform operations such as selecting and displaying only the logic signal and further setting each axis. For this reason, there is a problem that it is difficult to accurately and efficiently measure waveforms.

  Further, due to the recent demand for miniaturization of the waveform measuring apparatus itself, it is difficult to enlarge the display screen itself of the waveform measuring apparatus, and the displayed waveform is also reduced. Even if the zoom function is used, the waveform display becomes small, and there is a problem that it is difficult to measure the waveform accurately and efficiently.

  For waveform analysis as well as waveform display, there are analysis functions common to analog signals and logic signals, analysis functions for logic signals, analysis functions for analog signals, etc. Yes. For this reason, it is practically difficult to display all the functions on the display screen at once, and the functions are displayed in layers. In such a case, the state of the waveform is confirmed by displaying an analog signal or a logic signal, and then a hierarchical menu screen is displayed, and waveform analysis is selected from the menu screen to perform setting. After setting, the analysis result is displayed. In particular, when the number of analysis result lines is large (for example, FFT analysis, list display of analysis results of waveforms acquired multiple times, etc.), the waveform display and the analysis result cannot be displayed at the same time. There is also a problem that it is difficult to measure the waveform to be measured accurately and efficiently because it is necessary to switch and display the waveform display.

  Accordingly, an object of the present invention is to realize a waveform measuring apparatus capable of measuring and analyzing a measured waveform accurately and efficiently.

The invention described in claim 1
In the waveform measuring device that measures the waveform to be measured and displays the waveform on the display screen attached to the device,
A display processing unit for generating image data for a plurality of screens to be displayed on the display screen;
A display memory for storing image data for a plurality of screens of the display processing unit;
A plurality of video output terminals for outputting each image data of the display memory to an external display device are provided.
The invention according to claim 2 is the invention according to claim 1,
A selection unit for selecting one of the image data output from each of the plurality of video output terminals;
An operation unit that can perform setting based on the image data selected by the selection unit is provided.
The invention according to claim 3 is the invention according to claim 2,
The image data selected by the selection unit is displayed on the display screen.

The present invention has the following effects.
Since the display processing unit generates image data for a plurality of screens having different display target signals and the like, and outputs each of the generated image data to an external display device via a plurality of video output terminals, the waveform measurement device itself There is no need to display various image data on a small display screen (compared to an external display device) by overlapping or arranging them in a small window. Thereby, the waveform display and analysis result of each image data can be displayed under optimum display conditions, and the waveform measurement and analysis can be performed accurately and efficiently.

Embodiments of the present invention will be described below with reference to the drawings.
1 and 2 are block diagrams showing an embodiment of the present invention.
1 and 2, a plurality of analog signal input terminals Ain are provided (four channels as an example in FIG. 1), and a plurality of binarized logic signal input terminals Din (for example, 32 bits) are provided. Provided. A probe (not shown) that acquires a signal from the measurement target is connected to the input terminals Ain and Din. Further, a comparator is provided in the probe connected to the logic input terminal Din, and a signal from the measurement target is binarized and output to the logic input terminal Din. Further, for the sake of explanation, “channel” is used as the unit for measuring the number of analog signals and “bit” is used as the unit for measuring the number of logic signals.

  The AD converter 1 is provided for each input terminal Ain, performs analog-to-digital conversion on an analog signal from the input terminal Ain, and outputs the converted digital data.

  The sampler 2 is provided for each input terminal Din, samples a logic signal from the input terminal Din, and outputs binarized data.

  The trigger circuit 3 receives an analog signal from a desired input terminal Ain, and outputs a trigger signal when a waveform that satisfies a predetermined condition is detected.

  The AD converter 1 and the sampler 2 are supplied with the same clock signal (a signal obtained by frequency-converting the clock signal as necessary), and not only between each channel and each bit, but also between the analog signal and the logic signal. Relationships are ensured. Further, both the analog signal and the logic signal are signals under measurement (waveforms under measurement).

  The data processing unit 4 stores the digital data from the AD converter 1 and the binarized data from the sampler 2 in the acquisition memory 5 as waveform data in accordance with the trigger signal from the trigger circuit 3. Here, the waveform data is composed of data for a desired time before and after the trigger signal serving as a reference, using the trigger signal as a reference. In the apparatus shown in FIG. 1, analog signal waveform data for up to four channels and logic signal waveform data for 32 bits are acquired for each trigger signal. The operation of acquiring the waveform data of each channel and each bit by one trigger signal is called one acquisition.

  The acquisition memory 5 is a storage unit and stores waveform data of each channel and each bit acquired for each trigger signal. The acquisition memory 5 stores waveform data for a plurality of acquisitions, and stores the waveform data in association with the number of times the trigger signal is acquired. The analysis unit 6 performs waveform analysis of the waveform data in the acquisition memory 5.

  The display processing unit 7 generates image data for displaying the waveform data of the acquisition memory 5, the analysis result of the analysis unit 6, and the like on the display screen D 1 of the display unit 8. Further, the display processing unit 7 generates image data for a plurality of screens. These image data display different waveforms, analysis results, and the like. The display processing unit 7 is mutually connected with the display memories 9 (1) to 9 (n), writes image data such as waveform data and analysis results, and follows the predetermined update rate of the display screen of the display unit 8. The image data in the memories 9 (1) to 9 (n) is read and output to the video output terminals Vo (1) to Vo (n) and the display unit 8.

  The display unit 8 has a display screen D1 attached to the waveform measuring device. Each of the display memories 9 (1) to 9 (n) stores image data for one screen. Although FIG. 1 shows a plurality of memories, a single large-capacity memory may be physically used.

  The plurality of video output terminals Vo (1) to Vo (n) are connected to an external display device, and the image data from the display processing unit 7 is externally displayed via the terminals Vo (1) to Vo (n). Output to the device.

  The operation unit 10 is an operation panel or the like provided on the front surface of the apparatus, and sets an analysis function and display conditions for the analysis unit 6 and the display processing unit 7.

  The selection unit 11 selects desired image data from the image data stored in the display memories 9 (1) to 9 (n) and output from the plurality of video output terminals Vo (1) to Vo (n). Select one. Then, the selection unit 11 instructs the operation unit 10 to perform setting based on the selected image data, and instructs the display processing unit 7 to display the selected image data on the display screen D1.

  Each of the external display devices Disp (1) to Disp (n) is connected to video output terminals Vo (1) to Vo (n) of the waveform measuring device.

The operation of such an apparatus will be described.
The AD converter 1 converts the analog signal input to the input terminal Ain into digital data and outputs it to the data processing unit 4, and the sampler 2 converts the logic signal input to the input terminal Din into binary data. To the data processing unit 4. On the other hand, when the trigger circuit 3 detects a waveform that is a predetermined trigger condition, it outputs a trigger signal to the data processing unit 4.

  Then, the data processing unit 4 stores the digital data of each channel and the binarized data of each bit for a desired time before and after the trigger signal as a reference in the acquisition memory 5 as waveform data with the trigger signal as a reference. Then, the acquisition operation is performed again with the next trigger signal.

  Then, the analysis unit 6 reads the waveform data from the acquisition memory 5 and performs a desired analysis according to the setting from the operation unit 10. For example, FFT analysis and peak detection are performed.

  Further, the display processing unit 7 reads the waveform data from the acquisition memory 5, and the analysis result is input from the analysis unit 6. Then, a plurality of types of image data are generated according to the settings from the operation unit 10 and stored in the display memories 9 (1) to 9 (n).

  For example, the display processing unit 7 generates image data of the main screen (analog waveform and logic waveform waveform display), stores the image data in the display memory 9 (1), and enlarges the area specified on the main screen. Data is generated and stored in the display memory 9 (2), image data for only analog waveform display is generated and stored in the display memory 9 (3), and image data for only logic waveform display is generated and displayed in the display memory 9 (4). The image data of the analysis results (FFT analysis, XY analysis, detection result list display, etc.) is generated and stored in the display memory 9 (5), and the other image data is displayed in the display memories 9 (6) -9. Store in (n).

  Then, the display processing unit 7 reads out the image data from each of the image memories 9 (1) to 9 (n) at a predetermined rate, and the image data in the image memory 9 (1) is sent via the video output terminal Vo (1). Are output to the external display device Disp (1), and the image data of the image memory 9 (2) are output to the external display device Disp (2) via the video output terminal Vo (2). The image data of the image memories 9 (3) to 9 (n) are output to the external display devices Disp (3) to Disp (n) via the video output terminals Vo (3) to V (n), and the waveform is displayed. Display analysis results.

  When desired image data is selected by the selection unit 11, the display processing unit 7 stores an image memory 9 (the image data being displayed on the external display devices Disp (1) to Disp (n) ( The image data of the image memory selected by the selection unit 11 among 1) to 9 (n) is displayed on the display screen D1 of the display unit 8 of the waveform measuring device itself.

  Furthermore, each key, knob, and the like are assigned so that the operation unit 10 performs settings based on the image data selected by the selection unit 11. For example, the keys and knobs of the operation unit 10 are used for setting display conditions such as a vertical axis and a horizontal axis when image data for analog waveform display is selected, and image data for setting an analysis function is selected. When the image data for displaying the analysis result is selected, the analysis result is scrolled and displayed.

  In this way, the display processing unit 7 generates image data for a plurality of different types of screens, and each of the generated image data is connected to an external display device via a plurality of video output terminals Vo (1) to Vo (n). Since it is output to Disp (1) to Disp (n), various image data are overlapped or arranged in a small window on the small display screen D1 of the waveform measuring device itself (compared to an external display device). There is no need to display. As a result, the waveform display and analysis result of each image data can be displayed under optimal display conditions, and the waveform measurement and analysis can be performed accurately and efficiently.

  Further, the selection unit 11 selects one of the image data output from the video output terminals Vo (1) to Vo (n), and various types of image data selected by the selection unit 11 on the display screen D1. The keys and knobs of the operation unit 10 are assigned to perform setting and operation. As a result, waveform display, measurement, analysis, and the like can be performed under desired conditions, and analysis result display operation and the like can be performed independently of the waveform display setting and the like. Therefore, there is no need to switch between the analysis result and the waveform display, and the measured waveform can be measured and analyzed accurately and efficiently.

The present invention is not limited to this, and may be as shown below.
Although the configuration of the waveform measuring device capable of simultaneously measuring the analog waveform and the logic waveform has been shown, only one of the measurements may be performed.

  In addition, although the configuration in which the analog signal is 4 channels and the logic signal is 32 bits is shown, any number of channels and bits may be used. Any waveform analysis may be performed.

  And although the structure which applies this invention to a waveform measuring device was shown, it is applicable to the electronic device which displays the signal which differs in a kind as a several window. That is, image data for each window may be output from the video output terminals Vo (1) to Vo (n).

It is the block diagram which showed one Example of this invention. It is the figure which showed an example which connected the external display apparatus to the apparatus shown in FIG. It is the figure which showed an example of the front surface of the conventional waveform measuring apparatus.

Explanation of symbols

7 Display processing unit 9 (1) to 9 (n) Display memory 10 Operation unit 11 Selection unit D1 Display screen Vo (1) to Vo (n) Video output terminal

Claims (3)

In the waveform measuring device that measures the waveform to be measured and displays the waveform on the display screen attached to the device,
A display processing unit for generating image data for a plurality of screens to be displayed on the display screen;
A display memory for storing image data for a plurality of screens of the display processing unit;
A waveform measuring apparatus comprising a plurality of video output terminals for outputting each image data of the display memory to an external display device. A selection unit for selecting one of the image data output from each of the plurality of video output terminals;
The waveform measuring apparatus according to claim 1, further comprising an operation unit configured to perform setting based on the image data selected by the selection unit.   The waveform measurement apparatus according to claim 2, wherein the image data selected by the selection unit is displayed on the display screen.

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