JP2009075069A5 - - Google Patents

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JP2009075069A5
JP2009075069A5 JP2008159315A JP2008159315A JP2009075069A5 JP 2009075069 A5 JP2009075069 A5 JP 2009075069A5 JP 2008159315 A JP2008159315 A JP 2008159315A JP 2008159315 A JP2008159315 A JP 2008159315A JP 2009075069 A5 JP2009075069 A5 JP 2009075069A5
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terahertz wave
reflected
transmitted
sample
unit
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JP2008159315A
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JP2009075069A (en
JP5371293B2 (en
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Priority claimed from JP2008159315A external-priority patent/JP5371293B2/en
Priority to JP2008159315A priority Critical patent/JP5371293B2/en
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Priority to EP08162232A priority patent/EP2031374B1/en
Priority to US12/193,121 priority patent/US7551269B2/en
Priority to CN2008102124643A priority patent/CN101377406B/en
Publication of JP2009075069A publication Critical patent/JP2009075069A/en
Priority to US12/426,979 priority patent/US7852466B2/en
Publication of JP2009075069A5 publication Critical patent/JP2009075069A5/ja
Publication of JP5371293B2 publication Critical patent/JP5371293B2/en
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Claims (12)

サンプルを透過あるいは反射したテラヘルツ波に関する情報を取得するための装置であって、
テラヘルツ波を発生させるための発生部と、
前記発生部が発生させたテラヘルツ波がサンプルを透過あるいは反射したテラヘルツ波を検出するための検出部と、
前記検出部が検出するタイミングを変化させるための遅延部と、
サンプルに関する情報を記憶する記憶部と、
前記記憶部が記憶しているサンプルに関する情報に基づいて前記遅延部を調整する遅延時間調整部と、
前記遅延部を用いて得る、前記透過あるいは反射したテラヘルツ波の時間波形を取得するための波形取得部と、を有し、
前記遅延時間調整部は、前記記憶部が記憶しているサンプルに関する情報に基づいて設定される前記時間波形に関する領域で、前記検出部が前記テラヘルツ波を検出するように、前記遅延部を調整し、
前記波形取得部は、前記領域における前記透過あるいは反射したテラヘルツ波の時間波形を取得することを特徴とする装置。 An apparatus for acquiring information about a terahertz wave transmitted or reflected from a sample,
A generator for generating terahertz waves;
A detection unit for detecting a terahertz wave in which the terahertz wave generated by the generation unit is transmitted or reflected by the sample;
A delay unit for changing the timing detected by the detection unit;
A storage unit for storing information about the sample;
A delay time adjusting unit that adjusts the delay unit based on information about the sample stored in the storage unit;
A waveform acquisition unit for acquiring a time waveform of the transmitted or reflected terahertz wave obtained using the delay unit;
The delay time adjustment unit adjusts the delay unit so that the detection unit detects the terahertz wave in a region related to the time waveform set based on information about the sample stored in the storage unit. ,
The said waveform acquisition part acquires the time waveform of the said transmitted or reflected terahertz wave in the said area | region. 前記透過あるいは反射したテラヘルツ波は、第１のパルスと第２のパルスとを含み、The transmitted or reflected terahertz wave includes a first pulse and a second pulse,
前記遅延時間調整部は、前記記憶部が記憶している前記第１及び第２のパルスに関する情報に基づいて、前記遅延部を非連続的に調整し、The delay time adjustment unit adjusts the delay unit discontinuously based on information on the first and second pulses stored in the storage unit,
前記波形取得部は、前記第１のパルスと前記第２のパルスとの間に時間間隔を与えて前記時間波形を取得することを特徴とする請求項１に記載の装置。The apparatus according to claim 1, wherein the waveform acquisition unit acquires the time waveform by giving a time interval between the first pulse and the second pulse. 前記記憶部が予め記憶しているサンプルに関する情報は、予め前記波形取得部が取得したサンプルを透過あるいは反射したテラヘルツ波の時間波形であることを特徴とする請求項１または２に記載の装置。 3. The apparatus according to claim 1, wherein the information about the sample stored in advance in the storage unit is a time waveform of a terahertz wave transmitted or reflected from the sample acquired in advance by the waveform acquisition unit. 前記波形取得部は、前記検出部が検出したテラヘルツ波を、前記遅延部が変化させる前記タイミングに基づいてサンプリングすることにより、前記透過あるいは反射したテラヘルツ波の時間波形を取得することを特徴とする請求項１から３のいずれか１項に記載の装置。   The waveform acquisition unit acquires a time waveform of the transmitted or reflected terahertz wave by sampling the terahertz wave detected by the detection unit based on the timing changed by the delay unit. The apparatus according to any one of claims 1 to 3. 前記遅延部は、前記テラヘルツ波を発生させるタイミングあるいは検出するタイミングの少なくとも一方を変化させることを特徴とする請求項１から４のいずれか１項に記載の装置。   5. The apparatus according to claim 1, wherein the delay unit changes at least one of a timing for generating the terahertz wave and a timing for detecting the terahertz wave. 6. 前記領域における前記透過あるいは反射したテラヘルツ波の時間波形から、サンプルに関する情報を取得することを特徴とする請求項１から５のいずれか１項に記載の装置。   6. The apparatus according to claim 1, wherein information related to a sample is acquired from a time waveform of the transmitted or reflected terahertz wave in the region. 前記領域における前記透過あるいは反射したテラヘルツ波の時間波形と、前記記憶部が予め記憶している情報とを比較し、サンプルの状態を導出することを特徴とする請求項１から５のいずれか１項に記載の装置。   6. The sample state is derived by comparing a time waveform of the transmitted or reflected terahertz wave in the region with information stored in the storage unit in advance. The device according to item. サンプルを測定した回数を計数し、前記測定した前記検出部が検出したテラヘルツ波を積算し、前記積算した値と前記回数とを用いて前記テラヘルツ波の平均的な強度を求めることを特徴とする請求項１から７のいずれか１項に記載の装置。   Counting the number of times the sample is measured, integrating the measured terahertz waves detected by the detection unit, and using the integrated value and the number of times to determine an average intensity of the terahertz waves The device according to any one of claims 1 to 7. パルスレーザを発生するためのファイバレーザを有し、
前記発生部が、前記パルスレーザを照射することによりテラヘルツ波を発生するための光伝導素子で、
前記検出部が、前記パルスレーザを照射することによりテラヘルツ波を検出するための光伝導素子であることを特徴とする請求項１から８のいずれか１項に記載の装置。 Having a fiber laser for generating a pulsed laser;
The generator is a photoconductive element for generating a terahertz wave by irradiating the pulse laser,
The apparatus according to claim 1, wherein the detection unit is a photoconductive element for detecting a terahertz wave by irradiating the pulse laser. サンプルを透過或いは反射したテラヘルツ波に関する情報を取得するための方法であって、
テラヘルツ波を発生し、
前記テラヘルツ波がサンプルを透過あるいは反射したテラヘルツ波を検出し、
前記検出するタイミングを変化させることにより、前記透過あるいは反射したテラヘルツ波の時間波形を取得し、
予め取得したサンプルを透過あるいは反射したテラヘルツ波の時間波形に基づいて設定される前記時間波形に関する領域で、前記透過あるいは反射したテラヘルツ波を検出するように、前記タイミングを変化し、
前記領域における前記透過あるいは反射したテラヘルツ波の時間波形を取得することを特徴とする方法。 A method for obtaining information about a terahertz wave transmitted or reflected from a sample,
Generate terahertz waves,
Detecting the terahertz wave transmitted or reflected by the terahertz wave,
By changing the timing to detect, to acquire the time waveform of the transmitted or reflected terahertz wave,
In the region related to the time waveform set based on the time waveform of the terahertz wave that has been transmitted or reflected from the sample acquired in advance, the timing is changed so as to detect the transmitted or reflected terahertz wave,
A method of obtaining a time waveform of the transmitted or reflected terahertz wave in the region. 前記領域で検出したテラヘルツ波が有するパルスと、予め取得したサンプルを透過あるいは反射したテラヘルツ波の時間波形が有するパルスとを比較し、サンプルの状態を導出することを特徴とする請求項１０に記載の方法。   11. The sample state is derived by comparing a pulse included in the terahertz wave detected in the region with a pulse included in a time waveform of the terahertz wave that is transmitted or reflected through a sample acquired in advance. the method of. 前記反射したテラヘルツ波が、コーティング膜で被膜されたサンプルの屈折率界面で反射したパルスであることを特徴とする請求項１０あるいは１１に記載の方法。   The method according to claim 10 or 11, wherein the reflected terahertz wave is a pulse reflected at a refractive index interface of a sample coated with a coating film.
JP2008159315A 2007-08-31 2008-06-18 Apparatus and method for obtaining information about terahertz waves Expired - Fee Related JP5371293B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008159315A JP5371293B2 (en) 2007-08-31 2008-06-18 Apparatus and method for obtaining information about terahertz waves
EP08162232A EP2031374B1 (en) 2007-08-31 2008-08-12 Apparatus and method for obtaining information related to terahertz waves
US12/193,121 US7551269B2 (en) 2007-08-31 2008-08-18 Apparatus and method for obtaining information related to terahertz waves
CN2008102124643A CN101377406B (en) 2007-08-31 2008-08-29 Apparatus and method for obtaining information related to terahertz waves
US12/426,979 US7852466B2 (en) 2007-08-31 2009-04-21 Apparatus and method for obtaining information related to terahertz waves

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