JP2009054768A - Jig for bga package - Google Patents

Jig for bga package Download PDF

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JP2009054768A
JP2009054768A JP2007219683A JP2007219683A JP2009054768A JP 2009054768 A JP2009054768 A JP 2009054768A JP 2007219683 A JP2007219683 A JP 2007219683A JP 2007219683 A JP2007219683 A JP 2007219683A JP 2009054768 A JP2009054768 A JP 2009054768A
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jig
bga
net
positioning
bga package
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JP4607926B2 (en
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明▲彦▼ ▲呉▼
Ming-Yen Wu
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Powertech Technology Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a jig for positioning a BGA package waiting for measurement. <P>SOLUTION: The general-purpose jig for positioning the BGA (Ball Grid Array) waiting for measurement mainly includes: a net-type substrate 110, a latch 120 and a plurality of pins 130. The net-type substrate 110 has an element storing hole 111 and a pressurizing/measuring surface 112. A plurality of positioning holes arranged in a matrix and at equal intervals are disposed in the element storing hole 111. The latch 120 holds the BGA package for arranging it in the net-type substrate 110 and adjusting a solder ball group to a part of or whole positioning hole groups by one to one. The pins elastically project to a periphery of the pressuring/measuring surface 112 of the net-type substrate 110. Thus, the general-purpose jig positions the BGA packages of various specifications irrespective of a substrate size, and the number and arrangement of solder balls. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、BGAパッケージ用治具に関し、特に測定待ちのBGAパッケージを位置決めする治具に関する。   The present invention relates to a jig for a BGA package, and more particularly to a jig for positioning a BGA package waiting for measurement.

近年、装置の小型化に伴い、益々多くなる集積回路実装製品はBGA型(ボールグリッドアレイ型)の半導体パッケージにされる。BGA型パッケージは、同一表面に位置する複数の半田ボールや球状端子を介して外部に表面接合を行って多ピン数とサイズ微小化等の利点を得る。例えば、RAM(Random Access Memory)やフラッシュメモリ(Flash Memory)等のBGA型パッケージは半田ボール隙間に共通の規格を有するが、基板サイズ、半田ボール数量、半田ボール配置等の規格が異なるので、製品測定の前に各製品に対応する専用規格を有する測定治具を時々入れ替えなければいけないことにより、測定速度の低下、測定治具の種類が多すぎる等の問題がある。   In recent years, with the miniaturization of devices, more and more integrated circuit mounted products are made into BGA type (ball grid array type) semiconductor packages. The BGA type package obtains advantages such as the number of pins and miniaturization by performing surface bonding to the outside via a plurality of solder balls and spherical terminals located on the same surface. For example, BGA type packages such as RAM (Random Access Memory) and Flash Memory (Flash Memory) have a common standard for the gap between solder balls, but products such as board size, number of solder balls, solder ball arrangement, etc. are different. There are problems such as a decrease in measurement speed and too many types of measurement jigs because it is necessary to occasionally replace measurement jigs having a dedicated standard corresponding to each product before measurement.

図1に示すように、従来の測定待ちのBGAパッケージを位置決めする一般型嵌合治具200は、主にウインドーオープン(Window open)型基盤210を有する。ウインドーオープン型基盤210の素子収容溝の内には位置決め板211を有し、図2に示すように、その位置決め板211サイズを測定待ちのBGA型パッケージ10の基板サイズ(即ち側辺13)に照準させる。位置決め板211における内壁は位置限定枠212となり、BGA型パッケージ10の側辺13を制限する役割を伴い、BGA型パッケージ10のボール植入表面11に位置する複数の半田ボール14全数を単一の位置決め板211に露出させる。   As shown in FIG. 1, a conventional fitting jig 200 for positioning a conventional BGA package waiting for measurement mainly has a window open base 210. A positioning plate 211 is provided in the element receiving groove of the window open base 210, and as shown in FIG. 2, the size of the positioning plate 211 is the substrate size of the BGA type package 10 waiting for measurement (that is, the side 13). Aim at. The inner wall of the positioning plate 211 serves as a position limiting frame 212, which serves to limit the side 13 of the BGA type package 10, and the total number of the plurality of solder balls 14 positioned on the ball implantation surface 11 of the BGA type package 10 is a single unit. It is exposed to the positioning plate 211.

この位置限定枠212の上縁はBGA型パッケージ10を誘導しまたは位置決めすることを容易にするためガイド面となっている。位置決め板211の内には複数の支持フィンガー214が形成され、これらの支持フィンガー214により、BGA型パッケージ10の支持且つ脱出防止をすることができる。他に、搭載板(図に示していない)と結合するようにウインドーオープン型基盤210の両端にそれぞれ結合部215は形成される。故に、同一種類のBGA型パッケージ10製品にしても、基板サイズは一致しないと、同一の一般型嵌合治具200は通用することができない。一方、異なる種類のBGA型パッケージ10には、基板サイズが一致しないことを除き、半田ボール数量と半田ボール配置とも異なれば、一般型嵌合治具200の再購入若しくは再開発をしなければならなくなる。   The upper edge of the position limiting frame 212 is a guide surface for facilitating guiding or positioning the BGA type package 10. A plurality of support fingers 214 are formed in the positioning plate 211, and the support fingers 214 can support and prevent the BGA type package 10 from escaping. In addition, coupling portions 215 are formed at both ends of the window open base 210 so as to be coupled to a mounting plate (not shown). Therefore, even if the BGA type package 10 products of the same type are used, the same general-type fitting jig 200 cannot be used unless the board sizes match. On the other hand, for different types of BGA type packages 10, the general type fitting jig 200 must be repurchased or redeveloped if the number of solder balls and the arrangement of the solder balls are different, except that the board sizes do not match. Disappear.

本発明者は特許文献1に一種の治具を開示した。このような治具には、ウインドーオープン型基盤の素子収容溝の内に位置決め板が設置され、この位置決め板サイズは測定待ちのBGAパッケージの半田ボール群の配置区外縁に照準されるが、基板サイズよりも小さくなる。この治具は、同一種類のBGA型パッケージ製品を位置決めすることが可能であり、基板サイズに限らず且つ支持フィンガーが省略されることができる。しかしながら、異なる種類のBGA型パッケージ製品には、半田ボール数量と半田ボール配置に差異があるため、上述の治具を用いて位置決めと支持固定を行うことが不可能であって通用性が未だ不充分である。   The present inventor disclosed a kind of jig in Patent Document 1. In such a jig, a positioning plate is installed in the element receiving groove of the window open type base, and this positioning plate size is aimed at the outer edge of the arrangement area of the solder balls of the BGA package waiting for measurement. It becomes smaller than the substrate size. This jig can position the same type of BGA type package product, and is not limited to the substrate size, and support fingers can be omitted. However, since different types of BGA type package products have differences in the number of solder balls and the arrangement of solder balls, it is impossible to position and support and fix them using the above-mentioned jigs, and the versatility is still unsatisfactory. It is enough.

中華民国特許I253705号Chinese Patent No. I253705

本発明の主な目的は、測定待ちのBGAパッケージを位置決めする治具を提供することである。
本発明のもう1つの目的は、BGA型パッケージの封止体の偏りを許容し、測定待ちのBGAパッケージを基盤の底面に緊密させることが可能なBGAパッケージ用治具を提供することにある。
The main object of the present invention is to provide a jig for positioning a BGA package awaiting measurement.
Another object of the present invention is to provide a jig for a BGA package that allows a BGA type package sealing body to be biased and allows a BGA package waiting for measurement to be tightly attached to the bottom surface of a substrate.

上述目的を達成するための本発明によるBGAパッケージ用治具は、ネット型基盤、少なくとも一つのラッチ及び複数のピンを有する。このネット型基盤は素子収容穴と加圧測定表面を有する。この素子収容穴の内にマトリックス且つ等間隔に配列する複数の位置決め孔を形成する。一部若しくは全部の位置決め孔群は、接触ピンで測定を実行するためBGA型パッケージの複数の半田ボールに一対一に位置決めされ、加圧測定表面と連通している。ラッチはネット型基盤の内に設置されてBGA型パッケージを押圧している。それらのピンは伸縮自在にネット型基盤の加圧測定表面の周辺に突出できるように設けられている。。
このBGAパッケージ用治具は、汎用型治具として、集積回路を測定する際、基板サイズと半田ボール端子数が一致しないBGAパッケージを保持することができる。
このような治具は、BGA型パッケージの基板サイズ、半田ボール数量及び半田ボール配置に限らず、多種な規格と均等な半田ボール間隔とを有するBGA型パッケージを位置決めすることができる。更に、集積回路の測定装置を入れ替える過程で治具の入れ替わり回数を減らすことが可能となり、測定効率を向上し且つ嵌合治具の品名種類を簡略する利点がある。
In order to achieve the above object, a jig for a BGA package according to the present invention has a net-type substrate, at least one latch, and a plurality of pins. This net-type substrate has an element receiving hole and a pressure measurement surface. A plurality of positioning holes arranged in a matrix and at equal intervals are formed in the element receiving holes. Some or all of the positioning hole groups are positioned one-to-one with the plurality of solder balls of the BGA type package to perform measurement with the contact pins, and communicate with the pressure measurement surface. The latch is installed in the net-type substrate and presses the BGA package. These pins are provided so as to be able to project freely around the pressure measurement surface of the net-type base. .
This BGA package jig can hold a BGA package whose board size and the number of solder ball terminals do not match when measuring an integrated circuit as a general-purpose jig.
Such a jig is not limited to the substrate size, the number of solder balls, and the solder ball arrangement of the BGA type package, and can position a BGA type package having various standards and uniform solder ball intervals. Furthermore, it is possible to reduce the number of times the jig is replaced in the process of replacing the integrated circuit measuring device, which has the advantage of improving the measurement efficiency and simplifying the type of fitting jig.

上述目的を達するために本発明では、更に他の技術的手段を採用して説明する。
上述汎用型治具において、それらの位置決め孔は更に複数の第1位置決め孔と複数の第2位置決め孔とに分けられ、第2位置決め孔群の深度は第1位置決め孔群の深度よりも浅くなる。
上述汎用型治具において、加圧測定表面と対応する素子収容穴の底面に少なくとも一つの凹部が形成され、第2位置決め孔群はその凹部内に配列されている。
In order to achieve the above-mentioned object, the present invention will be described by employing other technical means.
In the general-purpose jig described above, these positioning holes are further divided into a plurality of first positioning holes and a plurality of second positioning holes, and the depth of the second positioning hole group is shallower than the depth of the first positioning hole group. .
In the general-purpose jig described above, at least one recess is formed in the bottom surface of the element receiving hole corresponding to the pressure measurement surface, and the second positioning hole group is arranged in the recess.

上述汎用型治具において、その凹部は帯状にしてもよい。
上述汎用型治具において、その凹部は素子収容穴の底面の側辺に位置してもよい。
上述汎用型治具において、第2位置決め孔群の口径は第1位置決め孔群の口径よりも大きくなってもよい。
上述汎用型治具において、更に基盤蓋を有し、その基盤蓋はネット型基盤に設置されて素子収容穴を被覆しない。
In the general-purpose jig described above, the concave portion may be formed in a band shape.
In the general-purpose jig described above, the recess may be located on the side of the bottom surface of the element accommodation hole.
In the general-purpose jig described above, the diameter of the second positioning hole group may be larger than the diameter of the first positioning hole group.
The general-purpose jig described above further includes a base cover, and the base cover is installed on the net-type base and does not cover the element accommodation hole.

上述汎用型治具において、基盤蓋とネット型基盤との間に更に複数の作動ばねが設置されている。
上述汎用型治具において、素子収容穴の内に更に中央孔を形成し、この中央孔は位置決め孔群の配置領域の中央に位置している。
上述汎用型治具において、ネット型基盤は電気的に絶縁されている。
In the general-purpose jig described above, a plurality of operating springs are further provided between the base lid and the net-type base.
In the general-purpose jig described above, a central hole is further formed in the element accommodation hole, and this central hole is located at the center of the arrangement region of the positioning hole group.
In the general-purpose jig described above, the net-type substrate is electrically insulated.

本発明の一実施例を図3から図8までを参照して説明する。図7及び図8に示すように、BGA型パッケージ10はボール植入表面11、ボール植入表面11と反対方向の背面12及びボール植入表面11と背面12との間にある側辺13を有する。複数の半田ボール14若しくは球状端子は、BGA型パッケージ10の内に位置する集積回路チップの外部との接続用としてボール植入表面11に設置される。異なる実装細部構造によれば、BGA型パッケージ10のボール植入表面11の中央或いは周辺に少なくとも一つの突起状の封止体15が形成される。   An embodiment of the present invention will be described with reference to FIGS. As shown in FIGS. 7 and 8, the BGA type package 10 has a ball implantation surface 11, a back surface 12 opposite to the ball implantation surface 11, and a side 13 between the ball implantation surface 11 and the back surface 12. Have. A plurality of solder balls 14 or spherical terminals are installed on the ball implantation surface 11 for connection to the outside of the integrated circuit chip located in the BGA type package 10. According to a different mounting detail structure, at least one protruding sealing body 15 is formed at the center or the periphery of the ball implantation surface 11 of the BGA type package 10.

図3、図4及び図5を参照する。汎用型治具100は、ネット型基盤110、少なくとも一つのラッチ120及び複数のピン130を有する。そのネット型基盤110は素子収容穴111と加圧測定表面112とを有し、図7に示すように、その素子収容穴111は測定待ちのBGA型パッケージ10を収納するようにしている。集積回路を測定する際に、加圧測定表面112は複数の接触ピン21を有する測定槽20に加圧接触する。それらの接触ピン21もポゴピン(POGO pin 登録商標)と称される。   Please refer to FIG. 3, FIG. 4 and FIG. The general-purpose jig 100 includes a net-type substrate 110, at least one latch 120, and a plurality of pins 130. The net-type substrate 110 has an element accommodation hole 111 and a pressure measurement surface 112, and the element accommodation hole 111 accommodates the BGA type package 10 waiting for measurement, as shown in FIG. When measuring an integrated circuit, the pressure measurement surface 112 is in pressure contact with the measurement tank 20 having a plurality of contact pins 21. These contact pins 21 are also referred to as POGO pin (registered trademark).

図6に示すように、素子収容穴111の内にマトリックス且つ等間隔に配列する複数の位置決め孔113、114を有している。本実施例では、それらの位置決め孔113、114は13×29のマトリックス配列である。「等間隔に配列する」とは、各位置決め孔113、114は隣同士の間の中心点から中心点の間隔距離が皆一致して約0.85mmである。図7及び図8に示すように、一部若しくは全部の位置決め孔113、114群は、接触ピン21で測定を実行するため測定待ちのBGA型パッケージ10の複数の半田ボール14に一対一に位置決めされ、加圧測定表面と連通している。   As shown in FIG. 6, a plurality of positioning holes 113 and 114 arranged in a matrix and at equal intervals are provided in the element accommodation holes 111. In the present embodiment, the positioning holes 113 and 114 have a 13 × 29 matrix arrangement. “Arranged at equal intervals” means that each of the positioning holes 113 and 114 is approximately 0.85 mm in which the distance from the center point to the center point between the adjacent holes coincides. As shown in FIGS. 7 and 8, some or all of the positioning holes 113 and 114 are positioned one-to-one on the plurality of solder balls 14 of the BGA type package 10 waiting for measurement in order to perform measurement with the contact pins 21. And in communication with the pressure measurement surface.

具体的に言えば、位置決め孔群は更に複数の第1位置決め孔113と複数の第2位置決め孔114に分けることができ、第2位置決め孔群114の深度は第1位置決め孔群113の深度よりも浅くなる。加圧測定表面112と対応する素子収容穴111の底面に少なくとも凹部115を形成することができれば好ましくなり、封止体15は凹部115へ偏移することにより、BGA型パッケージ10のボール植入表面11は押圧されて素子収容穴111の底面と緊密になっている。そして、凹部115の内に第2位置決め孔群114が配列されている。   Specifically, the positioning hole group can be further divided into a plurality of first positioning holes 113 and a plurality of second positioning holes 114, and the depth of the second positioning hole group 114 is greater than the depth of the first positioning hole group 113. Will also become shallower. It is preferable that at least the recess 115 can be formed on the bottom surface of the element receiving hole 111 corresponding to the pressure measurement surface 112, and the sealing body 15 shifts to the recess 115, so that the ball implantation surface of the BGA type package 10 is obtained. 11 is pressed to be tight with the bottom surface of the element receiving hole 111. A second positioning hole group 114 is arranged in the recess 115.

本実施例では、その凹部115は帯状のようにし、素子収容穴111の底面の側辺若しくは中央に位置することができる。再び図7に示すように、第1位置決め孔群113は第1孔径D1を有し、第2位置決め孔群114も第2孔径D2を有し、第2孔径D2は第1孔径D1よりも大きくするのが好ましい。それ故に、素子収容穴111の底面の側辺により大きな誤差許容を持たせて、ネット型基盤110と測定待ちのBGA型パッケージ10との間に生じた熱膨張差異により第2位置決め孔群114と周辺の半田ボール群14は位置偏移になってお互いに照準ができず嵌合不可能となる問題を避けられる。一方、ある程度大きな反り量を許容するBGA型パッケージ10の回路測定も実行可能である。   In this embodiment, the concave portion 115 is shaped like a band and can be located on the side or center of the bottom surface of the element receiving hole 111. As shown in FIG. 7 again, the first positioning hole group 113 has a first hole diameter D1, the second positioning hole group 114 also has a second hole diameter D2, and the second hole diameter D2 is larger than the first hole diameter D1. It is preferable to do this. Therefore, a large error tolerance is given to the side of the bottom surface of the element receiving hole 111, and the second positioning hole group 114 and the second positioning hole group 114 are caused by a difference in thermal expansion generated between the net type substrate 110 and the BGA type package 10 waiting for measurement. The peripheral solder ball group 14 is shifted in position so that it is not possible to aim at each other and the problem of being unable to fit is avoided. On the other hand, circuit measurement of the BGA type package 10 that allows a certain amount of warpage can be performed.

図2及び図6に示すように、素子収容穴111の内に更に中央孔116を設置しても好ましいことであり、この中央孔116は位置決め孔群113、114の配置区中央に位置してBGA型パッケージ10の位置決めが正確かを確認することができる。
一般に、ネット型基盤110は電気絶縁となり、若しくは絶縁層に被覆されることにより、半田ボール群14は位置決め孔群113、114と接触してネット型基盤110に電気ショートが起きる問題を避ける。
As shown in FIGS. 2 and 6, it is preferable to further install a central hole 116 in the element receiving hole 111, and this central hole 116 is located at the center of the arrangement area of the positioning hole groups 113 and 114. It is possible to confirm whether the positioning of the BGA type package 10 is accurate.
In general, the net-type substrate 110 is electrically insulated or is covered with an insulating layer, so that the solder ball group 14 comes into contact with the positioning hole groups 113 and 114 to avoid the problem that the net-type substrate 110 is short-circuited.

図5に示すように、ラッチ120は、ネット型基盤110の内に設置され、素子収容穴111に突入する押し柄121(図6に示すよう)を有し、且つラッチばね122と連結することで押圧弾力を提供している。また、図7に示すように、ラッチ120は、BGA型パッケージ10の半田ボール群14が対応する位置決め孔群113、114から脱出することをさせないようにBGA型パッケージ10の背面12を押圧している。   As shown in FIG. 5, the latch 120 is installed in the net-type base 110, has a push handle 121 (as shown in FIG. 6) that enters the element receiving hole 111, and is connected to the latch spring 122. Provides pressing elasticity. Further, as shown in FIG. 7, the latch 120 presses the back surface 12 of the BGA type package 10 so that the solder ball group 14 of the BGA type package 10 does not escape from the corresponding positioning hole groups 113, 114. Yes.

図4、図5及び図7を参照して、それらのピン130は、伸縮ばねからの突出弾力を介して伸縮自在にネット型基盤110の加圧測定表面112の周辺まで突出することができる。再び図7を参照して、集積回路の測定過程において、それらのピン130は測定槽20の位置決め孔群と嵌合することより、測定槽20の接触ピン群21は精確にネット型基盤110の位置決め孔群113、114と照準し得る。   4, 5, and 7, these pins 130 can project to the periphery of the pressurization measurement surface 112 of the net-type substrate 110 in a telescopic manner through the projecting elasticity of the telescopic spring. Referring to FIG. 7 again, in the measurement process of the integrated circuit, the pins 130 are fitted into the positioning hole groups of the measurement tank 20, so that the contact pin group 21 of the measurement tank 20 is accurately connected to the net-type substrate 110. The positioning hole groups 113 and 114 can be aimed.

図5及び図6に示すように、本実施例には、その汎用型治具100は更に基盤蓋140を有し、その基盤蓋140はネット型基盤110に嵌合されて素子収容穴111を覆わない。基盤蓋140とネット型基盤110との間に更に複数の作動ばね141を有し、それらの作動ばね群141によってその汎用型治具100は伸縮可能で測定装置と結合している。結合方式は、汎用型治具100の両端にそれぞれ耳状な結合部117を形成すればよい、このような結合部117は結合用孔118を有する。   As shown in FIGS. 5 and 6, in this embodiment, the general-purpose jig 100 further includes a base lid 140, and the base lid 140 is fitted to the net base 110 to form the element receiving hole 111. Do not cover. A plurality of operating springs 141 are further provided between the base lid 140 and the net-type base 110, and the general-purpose jig 100 can be expanded and contracted by the operating spring group 141 and coupled to the measuring device. As a coupling method, it is only necessary to form ear-shaped coupling portions 117 at both ends of the general-purpose jig 100, and such a coupling portion 117 has a coupling hole 118.

以上説明したように、本実施例の汎用型治具100は、位置決め孔群113、114を一対一に半田ボール群に位置決めする方式で測定待ちのBGA型パッケージを位置決めしている。半田ボール群14の間隔距離は等しくなると、基板サイズ、半田ボール数量及び半田ボール配置に限らず、異なる種類のBGA型パッケージ製品の位置決めや固定をすることができ、治具の汎用性を大幅に増加させ、更に集積回路の測定装置を入れ替わる過程に治具の入れ替わり回数を減ることも可能になり、測定効率の向上且つ嵌合治具の品名種類の簡略をし得る。
以上、本発明をその好適な実施例に基づいて説明したが、本発明の保護範囲は特許請求範囲で限定され、この保護範囲を基準として、本発明の要旨と特許請求の範囲内に属するどんな変更や修正も本発明の保護範囲に属する。
As described above, the general-purpose jig 100 of this embodiment positions the BGA type package waiting for measurement by a method in which the positioning hole groups 113 and 114 are positioned on the solder ball group one-on-one. If the distance between the solder ball groups 14 is equal, not only the board size, the number of solder balls, and the solder ball arrangement, but also different types of BGA type package products can be positioned and fixed, greatly increasing the versatility of the jig. In addition, it is possible to reduce the number of times the jig is replaced in the process of replacing the integrated circuit measuring device, thereby improving the measurement efficiency and simplifying the type of the fitting jig.
Although the present invention has been described based on the preferred embodiments thereof, the scope of protection of the present invention is limited by the scope of claims, and on the basis of this scope of protection, whatever falls within the gist of the present invention and the scope of the claims. Changes and modifications are also within the protection scope of the present invention.

従来の一般型嵌合治具を示す平面図である。It is a top view which shows the conventional general type fitting jig. 従来の一般型嵌合治具の使用状態を示す断面図である。It is sectional drawing which shows the use condition of the conventional general type fitting jig. 本発明の一実施例による汎用型治具を示す斜視図である。It is a perspective view which shows the general purpose type | mold jig | tool by one Example of this invention. 本発明の一実施例による汎用型治具を示す斜視図である。It is a perspective view which shows the general purpose type | mold jig | tool by one Example of this invention. 本発明の一実施例による汎用型治具を示す斜視図である。It is a perspective view which shows the general purpose type | mold jig | tool by one Example of this invention. 本発明の一実施例による汎用型治具を示す平面図である。It is a top view which shows the general purpose type | mold jig | tool by one Example of this invention. 本発明の一実施例による汎用型治具の使用状態を示す断面図である。It is sectional drawing which shows the use condition of the general purpose jig | tool by one Example of this invention. 本発明の一実施例による汎用型治具の使用状態を示す平面図である。It is a top view which shows the use condition of the general purpose jig | tool by one Example of this invention.

符号の説明Explanation of symbols

10:BGA型パッケージ、11:ボール植入表面、12:背面、13:側辺、14:半田ボール、15:封止体、20:測定槽、21:接触ピン、100:汎用型治具、110:ネット型基盤、111:素子収容穴、112:加圧測定表面、113:第1位置決め孔、114:第2位置決め孔、115:凹部、116:中央孔、117:結合部、118:結合孔、120:ラッチ、121:押し柄、122:ラッチばね、130:ピン、131:伸縮ばね、140:基盤蓋、141:作動ばね、D1:第1孔径、D2:第2孔径   10: BGA type package, 11: Ball implantation surface, 12: Back surface, 13: Side, 14: Solder ball, 15: Sealing body, 20: Measuring tank, 21: Contact pin, 100: General-purpose type jig, 110: Net type substrate, 111: Element receiving hole, 112: Pressure measurement surface, 113: First positioning hole, 114: Second positioning hole, 115: Recess, 116: Center hole, 117: Coupling part, 118: Coupling Hole: 120: Latch, 121: Push handle, 122: Latch spring, 130: Pin, 131: Extension spring, 140: Base cover, 141: Actuating spring, D1: First hole diameter, D2: Second hole diameter

Claims (10)

素子収容穴と加圧測定表面とを有し、前記素子収容穴の内に行列状に且つ等間隔に配列する複数の位置決め孔を形成し、一部若しくは全部の位置決め孔群は、接触ピンで測定を実行するためBGA型パッケージの複数の半田ボールに一対一に位置決めされ、加圧測定表面と連通しているネット型基盤と、
ネット型基盤の内に設置されてBGA型パッケージを押圧している少なくとも一つのラッチと、
ネット型基盤の加圧測定表面の周辺に伸縮自在に突出可能な複数のピンと、
を有することを特徴とするBGAパッケージ用治具。
A plurality of positioning holes arranged in a matrix and at equal intervals are formed in the element receiving holes, and a part or all of the positioning hole groups are contact pins. A net-type substrate that is positioned one-to-one on a plurality of solder balls of a BGA-type package to communicate with the pressure measurement surface;
At least one latch installed in the net-type substrate and pressing the BGA-type package;
A plurality of pins that can extend and retract around the pressure measurement surface of the net-type substrate,
A jig for a BGA package, comprising:
前記位置決め孔は更に複数の第1位置決め孔と複数の第2位置決め孔とに分けられ、第2位置決め孔群の深度は第1位置決め孔群の深度よりも浅くなることを特徴とする請求項1に記載のBGAパッケージ用治具。   The positioning hole is further divided into a plurality of first positioning holes and a plurality of second positioning holes, and the depth of the second positioning hole group is shallower than the depth of the first positioning hole group. The jig for BGA packages described in 1. 加圧測定表面と対応する素子収容穴の底面に少なくとも一つの凹部が形成され、第2位置決め孔群は前記凹部内に配列されていることを特徴とする請求項2に記載のBGAパッケージ用治具。   The treatment for a BGA package according to claim 2, wherein at least one recess is formed in the bottom surface of the element receiving hole corresponding to the pressure measurement surface, and the second positioning hole group is arranged in the recess. Ingredients. 前記凹部は帯状になっていることを特徴とする請求項3に記載のBGAパッケージ用治具。   The jig for a BGA package according to claim 3, wherein the concave portion has a band shape. 前記凹部は素子収容穴の底面の側辺に位置していることを特徴とする請求項3に記載のBGAパッケージ用治具。   4. The jig for a BGA package according to claim 3, wherein the recess is located on a side of the bottom surface of the element accommodation hole. 第2位置決め孔群の口径は第1位置決め孔群の口径よりも大きくなっていることを特徴とする請求項5に記載のBGAパッケージ用治具。   6. The jig for a BGA package according to claim 5, wherein the diameter of the second positioning hole group is larger than the diameter of the first positioning hole group. 更に基盤蓋を有し、前記基盤蓋はネット型基盤に設置されて素子収容穴を露出することを特徴とする請求項1に記載のBGAパッケージ用治具。   The jig for a BGA package according to claim 1, further comprising a base cover, wherein the base cover is installed on a net-type base to expose an element accommodation hole. 更に基盤蓋とネット型基盤との間に複数の作動ばねが設置されていることを特徴とする請求項7に記載のBGAパッケージ用治具。   8. The jig for a BGA package according to claim 7, wherein a plurality of operating springs are installed between the base lid and the net type base. 更に素子収容穴の内に中央孔を設置し、前記中央孔は位置決め孔群の配置区の中央に位置していることを特徴とする請求項1に記載のBGAパッケージ用治具。   The BGA package jig according to claim 1, further comprising a central hole in the element accommodation hole, wherein the central hole is located at a center of the arrangement area of the positioning hole group. ネット型基盤は電気絶縁となっていることを特徴とする請求項1に記載のBGAパッケージ用治具。   The jig for a BGA package according to claim 1, wherein the net-type substrate is electrically insulated.
JP2007219683A 2007-08-27 2007-08-27 BGA package jig Expired - Fee Related JP4607926B2 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113270756A (en) * 2020-02-14 2021-08-17 山一电机株式会社 Housing of high-speed transmission connector and high-speed transmission connector

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08273782A (en) * 1995-03-31 1996-10-18 Enplas Corp Ic socket
JP2004006169A (en) * 2002-06-03 2004-01-08 Tokyo Cosmos Electric Co Ltd Ic socket

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08273782A (en) * 1995-03-31 1996-10-18 Enplas Corp Ic socket
JP2004006169A (en) * 2002-06-03 2004-01-08 Tokyo Cosmos Electric Co Ltd Ic socket

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113270756A (en) * 2020-02-14 2021-08-17 山一电机株式会社 Housing of high-speed transmission connector and high-speed transmission connector
CN113270756B (en) * 2020-02-14 2023-05-23 山一电机株式会社 Housing of high-speed transmission connector and high-speed transmission connector

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