JP2009038902A - Testing device for test plugs - Google Patents

Testing device for test plugs Download PDF

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JP2009038902A
JP2009038902A JP2007201298A JP2007201298A JP2009038902A JP 2009038902 A JP2009038902 A JP 2009038902A JP 2007201298 A JP2007201298 A JP 2007201298A JP 2007201298 A JP2007201298 A JP 2007201298A JP 2009038902 A JP2009038902 A JP 2009038902A
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hot
test
live
test plug
side contact
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JP5159201B2 (en
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Koji Yamamoto
耕司 山本
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Chugoku Electric Power Co Inc
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Chugoku Electric Power Co Inc
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<P>PROBLEM TO BE SOLVED: To provide a testing device for test plugs, having a display portion that allows the result of testing on a test plug to be recognized at a glance. <P>SOLUTION: The testing device includes: a test plug connecting portion 1; a display portion 2 having first light-emitting portions 2A, second light-emitting portions 2B, third light-emitting portions 2C, and fourth light-emitting portions 2D; an insulation detection portion 3; and a light emission control portion 4 that controls the state of light emission of the first to fourth light-emitting portions 2A to 2D of the display portion 2. The first light-emitting portions 2A are disposed in correspondence with hot-line-side contact portions 1R to 1N and non-hot-line-side contact portions 1'R to 1'N. The second light-emitting portions 2B are so constructed as to indicate the state of the area between a hot-line-side contact portion and a non-hot-line-side contact portion of the same phase. The third light-emitting portions 2C are so constructed as to indicate the state of hot-line-side contact portions adjoining between phases on the power supply side. The fourth light-emitting portions 2D are so constructed as to indicate the state of the area between non-hot-line-side contact portions adjoining between phases on the load side. The insulation detection portion 3 detects the insulation resistances between phases and between poles by measurement with a test plug connected to the test plug connecting portion 1 and sends out an abnormal insulation signal if they are abnormal. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明はテストプラグの試験装置に関し、特に電力系統の保護機器である継電器の動作確認等を行うテストプラグの性能判定、すなわちこのテストプラグの各相間の導通試験や各相間の絶縁性能検査を行う場合に適用して有用なものである。   The present invention relates to a test plug test apparatus, and in particular, performs performance determination of a test plug for confirming the operation of a relay, which is a protective device of a power system, that is, conducts a continuity test between phases of the test plug and an insulation performance test between phases. It is useful to apply to cases.

電力系統の保護システムとして、例えば、図7に示すようなものがある。この保護システムでは、線路50R,50W,50Bの各相に変流器(CT)51R,51W,51Bが設けられ、その一端側が中性点N(以下、変流器51R乃至51Bのそれぞれの相をR,W,B相,中性点Nに接続される相をN相と称す。)に接続されるとともに、他端側がそれぞれ過電流継電器53R,53W,53Bに接続されている。ここで、各過電流継電器53R,53W,53Bと中性点Nとの間には地絡過電流継電器55が設けられ、事故時の異常電流に基づき、例えば地絡過電流継電器55が動作することで送出される信号に基づいて、線路50R,50W,50Bと変圧器57との間に設けられた遮断器59を遮断制御するようになっている。   An example of a power system protection system is shown in FIG. In this protection system, current transformers (CT) 51R, 51W, 51B are provided in the respective phases of the lines 50R, 50W, 50B, one end of which is a neutral point N (hereinafter referred to as each phase of the current transformers 51R to 51B). Are connected to the R, W, B phase, and the phase connected to the neutral point N is called the N phase.), And the other end is connected to the overcurrent relays 53R, 53W, 53B, respectively. Here, a ground fault overcurrent relay 55 is provided between each of the overcurrent relays 53R, 53W, 53B and the neutral point N, and for example, the ground fault overcurrent relay 55 is operated based on the abnormal current at the time of the accident. Based on the transmitted signal, the circuit breaker 59 provided between the lines 50R, 50W, 50B and the transformer 57 is controlled to be cut off.

かかる保護システムでは、過電流継電器53R乃至53B、地絡過電流継電器55と各変流器51R乃至51Bの間で配電盤にテストターミナル5を配設し、変流器側を短絡したテストプラグ30をテストターミナル5に挿入後、計器、電流発生器等を備えた試験装置を接続して、線路50R乃至50Bを活線状態のまま、各過電流継電器53R乃至53Bと地絡過電流継電器55の試験を行っている。   In such a protection system, the test terminal 5 is arranged on the switchboard between the overcurrent relays 53R to 53B, the ground fault overcurrent relay 55 and the current transformers 51R to 51B, and the test plug 30 in which the current transformer side is short-circuited is tested. After inserting into the terminal 5, a test device equipped with a meter, a current generator, etc. is connected, and the overcurrent relays 53R to 53B and the ground fault overcurrent relay 55 are tested while the lines 50R to 50B are in a live state. ing.

テストターミナル5は、その縦断面図である図8に示すように、開口部であるプラグ挿入口7を形成した箱体6を有しており、この箱体6内には、4組の接点装置10が上記R,W,B相およびN相の各相に対応して並設されている。各接点装置10は、各相に対応する上下一対の可動接触板である電源側導体11及び負荷側導体21で構成されている。   As shown in FIG. 8 which is a longitudinal sectional view of the test terminal 5, the test terminal 5 has a box body 6 in which a plug insertion port 7 which is an opening is formed. The apparatus 10 is arranged in parallel corresponding to each of the R, W, B, and N phases. Each contact device 10 includes a power supply side conductor 11 and a load side conductor 21 which are a pair of upper and lower movable contact plates corresponding to each phase.

一方、試験時においてテストターミナル5に挿入されるテストプラグ30は、図9に示すように、絶縁支持体31から突出した絶縁板32に、各相に対応するとともに、上下に相互に絶縁された各一対の活線側導体35R乃至35N及び非活線側導体45R乃至45Nが並設されており、それらの基端部は、同軸状に配設された4組の端子37,47にそれぞれ接続されている。   On the other hand, the test plug 30 inserted into the test terminal 5 at the time of the test corresponds to each phase and is insulated from each other on the insulating plate 32 protruding from the insulating support 31 as shown in FIG. Each pair of live wire side conductors 35R to 35N and non-live wire side conductors 45R to 45N are juxtaposed, and their base ends are connected to four sets of terminals 37 and 47 arranged coaxially, respectively. Has been.

このテストプラグ30は、変流器51R乃至51Bの2次側が開放されるのを避けるため、例えば複数の短絡片38により4個の端子37間を連結接続して各活線側導体35R乃至35N間を短絡するとともに、他の端子47に試験装置60を接続して所定の試験に供している。   In order to avoid the secondary side of the current transformers 51R to 51B being opened, the test plug 30 is connected to the four terminals 37 by a plurality of short-circuit pieces 38, for example, and connected to the live conductors 35R to 35N. In addition to short-circuiting, a test device 60 is connected to another terminal 47 for a predetermined test.

テストターミナル5にテストプラグ30が挿入されていない状態において、テストターミナル5の電源側の端子17と負荷側の端子27間は、電源側導体11及び負荷側導体21が接触することにより閉路状態にあり、例えば、図7に示す変流器51Rは、過電流継電器53R及び地絡過電流継電器55と閉回路を形成している。   In a state where the test plug 30 is not inserted into the test terminal 5, the power supply side conductor 11 and the load side conductor 21 are in a closed state between the power supply side terminal 17 and the load side terminal 27 of the test terminal 5. For example, the current transformer 51R shown in FIG. 7 forms a closed circuit with the overcurrent relay 53R and the ground fault overcurrent relay 55.

一方、過電流継電器53R乃至53B、地絡過電流継電器55の試験に際しては、プラグ挿入口7を介してテストターミナル5にテストプラグ30が挿入されると、各接点装置10の電源側導体11及び負荷側導体21の間が開離される。この結果、例えば、変流器51R、過電流継電器53R間の接続が遮断されるとともに、短絡片38により変流器51R,51W,51Bの両端が短絡され、過電流継電器53R,53W,53Bおよび地絡過電流継電器55が試験装置60に接続される。   On the other hand, when testing the overcurrent relays 53R to 53B and the ground fault overcurrent relay 55, when the test plug 30 is inserted into the test terminal 5 via the plug insertion port 7, the power supply side conductor 11 and the load of each contact device 10 are loaded. The side conductors 21 are separated. As a result, for example, the connection between the current transformer 51R and the overcurrent relay 53R is cut off, and both ends of the current transformers 51R, 51W, 51B are short-circuited by the short-circuit piece 38, and the overcurrent relays 53R, 53W, 53B and A ground fault overcurrent relay 55 is connected to the test apparatus 60.

かかる保護システムは、図示はしないが、事故時における線路50R乃至50Bの異常な電圧降下を検出するための計器用変圧器(PT)も通常有しており、かかる計器用変圧器も、変流器51R乃至51Bの場合と同様に、配電盤に配設したテストターミナルを介して所定の継電器等に接続してある。かくして、線路50R乃至50Bの異常電圧降下が検出された場合に、遮断器59を遮断制御する。   Although not shown, such a protection system usually also has an instrument transformer (PT) for detecting an abnormal voltage drop in the lines 50R to 50B at the time of an accident, and such an instrument transformer is also a current transformer. Similarly to the case of the devices 51R to 51B, it is connected to a predetermined relay or the like through a test terminal disposed on the switchboard. Thus, when an abnormal voltage drop in the lines 50R to 50B is detected, the circuit breaker 59 is controlled to be cut off.

そこで、前記計器用変圧器のテストターミナルに挿入して前記継電器の動作試験等を行うためのテストプラグも存在する。これは、間違ってCT用のテストターミナル5に挿入するのを防止し得るような構造となっているが、図9に示すテストプラグ30と同様に、上下に相互に絶縁された各一対の活線側導体35R乃至35N及び非活線側導体45R乃至45Nが並設される等、基本的な構成はテストプラグ30と同様である。   Therefore, there is also a test plug that is inserted into a test terminal of the instrument transformer to perform an operation test of the relay. This has a structure that can prevent erroneous insertion into the test terminal 5 for CT. However, like the test plug 30 shown in FIG. The basic configuration is the same as that of the test plug 30 such that the line-side conductors 35R to 35N and the non-live line-side conductors 45R to 45N are arranged in parallel.

上述の如きテストプラグ30は、テストターミナル5等に挿入する前提としてその健全性が保証されていなければならない。例えば活線側導体35R乃至35N及び非活線側導体45R乃至45N間の所定の導通が取れていない場合には正確な動作試験ができず、短絡片38により活線側導体35R乃至35N間が短絡されていない場合には、変流器51R乃至51Bの2次側が開放されてしまうという不都合を生起するからである。   The soundness of the test plug 30 as described above must be guaranteed as a premise to be inserted into the test terminal 5 or the like. For example, when the predetermined conduction between the live wire side conductors 35R to 35N and the non-live wire side conductors 45R to 45N is not obtained, an accurate operation test cannot be performed. This is because, when not short-circuited, the secondary side of the current transformers 51R to 51B is opened.

また、テストプラグ30の相間絶縁抵抗乃至極間絶縁抵抗の値が十分でない場合には短絡事故を生起するという不都合を生起する。ここで、テストプラグ30の相間絶縁抵抗とは、電源側乃至負荷側で隣接する異なる相の活線側導体35R乃至35N及び非活線側導体45R乃至45Nの間の絶縁部材33による絶縁抵抗(以下同じ)をいい、極間絶縁抵抗とは、同一の相における活線側導体35R乃至35Nと非活線側導体45R乃至45Nとの間の絶縁部材32による絶縁抵抗(以下同じ)をいう。   In addition, when the value of the interphase insulation resistance or the interpolar insulation resistance of the test plug 30 is not sufficient, a short circuit accident occurs. Here, the interphase insulation resistance of the test plug 30 refers to the insulation resistance by the insulation member 33 between the active line side conductors 35R to 35N and the non-active line side conductors 45R to 45N of different phases adjacent on the power source side or the load side. The same applies hereinafter, and the inter-electrode insulation resistance refers to the insulation resistance (hereinafter the same) by the insulating member 32 between the live wire side conductors 35R to 35N and the non-live wire side conductors 45R to 45N in the same phase.

そこで、所定の試験に先立ちテストプラグ30の健全性を確認するための試験装置が、従来より種々提案されている(特許文献1乃至特許文献4参照)。   Therefore, various test apparatuses for confirming the soundness of the test plug 30 prior to a predetermined test have been proposed (see Patent Documents 1 to 4).

特開2001−231153号公報JP 2001-231153 A 特開平10−19961号公報Japanese Patent Laid-Open No. 10-19961 特開平09−113570号公報Japanese Patent Laid-Open No. 09-113570 実開平05−17577号公報Japanese Utility Model Publication No. 05-17777

上記従来技術に係るテストプラグの試験装置は、試験結果を視覚的に表示する表示部を備えていないか、又は備えていても不十分なものである。すなわち、導通状態乃至絶縁状態を表示する機能を有する場合でも、何れの部分の導通状態が不十分であるのかを一目で視認できるような構造となっていないので、試験結果の迅速な確認という点で難がある。   The test device for a test plug according to the above prior art does not have or does not have a display unit for visually displaying a test result. In other words, even if it has a function to display the conduction state or the insulation state, it is not structured so that it can be seen at a glance which part of the conduction state is insufficient. There are difficulties.

本発明は、上記従来技術に鑑み、上述の如きテストプラグの試験結果を一見して視認し得る表示部を有するテストプラグの試験装置を提供することを目的とする。   An object of the present invention is to provide a test plug test apparatus having a display unit that allows the test results of the test plug as described above to be viewed at a glance.

上記目的を達成する本発明の第1の態様は、
電源側の各相に接続されたテストターミナルの複数の電源側導体にそれぞれ接触する活線側導体と、負荷側の各相に接続された前記テストターミナルの同数の負荷側導体にそれぞれ接触する非活線側導体とが各相毎に絶縁部材の相対向する面にそれぞれ配設されているテストプラグの試験装置であって、
前記各活線側導体に接触させ得る活線側接触部及び各非活線側導体に接触させ得る非活線側接触部を有するテストプラグ接続部と、
前記活線側接触部及び非活線側接触部にそれぞれ対応させて配設した第1の発光部、前記電源側及び負荷側で対応する同相の前記各活線側接触部及び非活線側接触部間の状態を表すように構成した第2の発光部、前記電源側の相間で隣接する前記活線側接触部間の状態を表すように構成した第3の発光部及び前記負荷側の相間で隣接する前記非活線側接触部間の状態を表すように構成した第4の発光部を有する表示手段と、
前記テストプラグ接続部に前記テストプラグを接続した状態で、前記各活線側導体と前記各非活線側導体との間の絶縁抵抗である相間絶縁抵抗、並びに前記各活線側導体の間及び前記各非活線側導体の間の絶縁抵抗である極間絶縁抵抗を検出し、これらが異常であった場合に絶縁異常信号を送出する絶縁検出手段と、
前記絶縁異常信号を入力した場合、絶縁異常であることを表示するように前記表示手段の発光状態を制御するとともに、前記テストプラグ接続部に前記テストプラグを接続した状態で、同一相の前記各活線側導体と前記各非活線側導体との間、前記電源側で隣接する各活線側導体の間及び前記負荷側で隣接する各非活線側導体の間に電流を供給してそれぞれの導通状態を検出し、この検出状態を表示するように前記表示手段の発光状態を制御する発光制御手段とを有することを特徴とするテストプラグの試験装置にある。
The first aspect of the present invention for achieving the above object is as follows:
A live conductor that contacts each of a plurality of power supply side conductors of the test terminal connected to each phase on the power supply side and a non-contact that contacts each of the same number of load side conductors of the test terminal connected to each phase on the load side A test device for a test plug in which a live wire side conductor is disposed on each surface of the insulating member facing each other for each phase,
A test plug connection portion having a live wire side contact portion that can be brought into contact with each of the live wire side conductors and a non-hot wire side contact portion that can be brought into contact with each non-live wire side conductor;
The first light-emitting part disposed corresponding to the live-line-side contact part and the non-hot-line-side contact part, the respective live-line-side contact parts and the non-hot-line side corresponding to the same phase on the power supply side and the load side A second light emitting unit configured to represent a state between the contact parts, a third light emitting unit configured to represent a state between the adjacent live line side contact units between the phases on the power supply side, and the load side Display means having a fourth light emitting portion configured to represent a state between the non-hot-wire side contact portions adjacent to each other;
In a state where the test plug is connected to the test plug connecting portion, an interphase insulation resistance that is an insulation resistance between each of the live wire side conductors and each of the non-live wire side conductors, and between each of the live wire side conductors And an insulation detection means for detecting an insulation resistance between the electrodes, which is an insulation resistance between the non-live conductors, and sending an insulation abnormality signal when these are abnormal,
When the insulation abnormality signal is input, the light emission state of the display means is controlled so as to display that the insulation abnormality is present, and the test plug is connected to the test plug connection portion, and the respective phases of the same phase are displayed. Supply current between a live wire side conductor and each non-live wire side conductor, between each live wire side conductor adjacent on the power supply side, and between each non-live wire side conductor adjacent on the load side. The test plug testing apparatus includes: a light emission control unit configured to detect each conduction state and control a light emission state of the display unit so as to display the detection state.

本発明の第2の態様は、
上記第1の態様に記載するテストプラグの試験装置において、
前記テストプラグ接続部は、
前記各相の活線側導体又は非活線側導体にそれぞれ接触するよう筐体である本体から前方に伸ばして屈曲させた先端面に前記活線側接触部又は非活線側接触部をそれぞれ有する第1の爪部材と、
前記各相の非活線側導体又は活線側導体にそれぞれ接触するよう前記本体に基端部を回動可能に支持されるとともに前方に伸ばして屈曲させた先端面に前記非活線側接触部又は活線側接触部をそれぞれ有する第2の爪部材とを有するものであることを特徴とするテストプラグの試験装置にある。
The second aspect of the present invention is:
In the test plug test apparatus described in the first aspect,
The test plug connection part is
The hot-wire-side contact portion or the non-hot-wire-side contact portion is respectively formed on the front end surface that is bent forward and bent from the main body, which is a housing, so as to come into contact with the live-wire-side conductor or non-hot-wire-side conductor of each phase, respectively. A first claw member having
The non-hot-wire side contact is made to the front end surface that is pivotally supported by the main body so as to be in contact with the non-hot-wire-side conductor or the hot-wire-side conductor of each phase and is extended and bent forward. And a second claw member each having a hot wire side contact portion.

本発明の第3の態様は、
上記第1又は第2の態様に記載するテストプラグの試験装置において、
前記表示手段における前記第1乃至第4の発光部は液晶で構成したことを特徴とするテストプラグの試験装置にある。
The third aspect of the present invention is:
In the test plug test apparatus described in the first or second aspect,
In the test plug test apparatus, the first to fourth light emitting portions in the display means are composed of liquid crystals.

本発明の第4の態様は
上記第1乃至第3態様の何れか一つに記載するテストプラグの試験装置において、
前記絶縁検出手段は、
隣接する異なる相間における前記活線側接触部同士と前記負荷側導体同士とがそれぞれ異なる極になると同時に、同一相で相対向している前記活線側接触部と前記負荷側導体とがそれぞれ異なる極となるように前記電源側接触部及び負荷側接触部にそれぞれ接続されている一対の測定端子を有することを特徴とするテストプラグの試験装置にある。
According to a fourth aspect of the present invention, there is provided the test plug test apparatus according to any one of the first to third aspects.
The insulation detection means includes
The live wire side contact portions and the load side conductors in adjacent different phases become different poles, and at the same time, the live wire side contact portions and the load side conductors facing each other in the same phase are different. A test plug testing apparatus having a pair of measurement terminals respectively connected to the power supply side contact portion and the load side contact portion so as to be poles.

上記構成の本発明によれば、実際のテストプラグの活線側導体に接触する活線側接触部及び非活線側導体に接触する非活線側接触部とともに、これらの間の部分を位置的に模擬した第1乃至第4の発光部を表示手段が備えており、しかも第1乃至第4の発光部では発光制御手段の制御により所定の導通乃至絶縁状態を視覚的に反映させることができる。この結果、所定の試験結果を容易且つ迅速に視認し得る。   According to the present invention having the above-described configuration, the live wire side contact portion that contacts the live wire side conductor of the actual test plug and the non-hot wire side contact portion that contacts the non-live wire side conductor, and the portion between them are positioned. The display unit includes first to fourth light emitting units that are simulated in model, and the first to fourth light emitting units visually reflect a predetermined conduction or insulation state under the control of the light emission control unit. it can. As a result, the predetermined test result can be easily and quickly visually recognized.

以下本発明の実施の形態を図面に基づき詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

図1は本発明の実施の形態に係るテストプラグの試験装置の全体を示すブロック線図である。同図に示すように、テストプラグ接続部1は、図8に示すテストターミナル5の機能、すなわちテストプラグ30(図9参照;以下同じ)の活線側導体35R乃至35N(図9参照;以下同じ)及び非活線側導体45R乃至45N(図9参照;以下同じ)とそれぞれ接触して、各活線側導体35R乃至35N及び非活線側導体45R乃至45Nに試験用の電圧/電流を供給し得るように構成してある。このため、テストプラグ接続部1は、各相の活線側導体11に接触させ得る活線側接触部1R,1W,1B,1N及び各非活線側導体21に接触させ得る非活線側接触部1´R,1´W,1´B,1´Nを有している。   FIG. 1 is a block diagram showing an entire test plug testing apparatus according to an embodiment of the present invention. As shown in the figure, the test plug connecting portion 1 has the function of the test terminal 5 shown in FIG. 8, that is, the hot wire side conductors 35R to 35N (see FIG. 9; see below) of the test plug 30 (see FIG. 9; the same applies hereinafter). The same) and non-live wire side conductors 45R to 45N (see FIG. 9; the same shall apply hereinafter), respectively, and a test voltage / current is applied to each of the live wire side conductors 35R to 35N and the non-live wire side conductors 45R to 45N. It is configured so that it can be supplied. For this reason, the test plug connection part 1 is in contact with the hot-wire side contact parts 1R, 1W, 1B, 1N and the non-hot-wire side conductors 21 that can be brought into contact with the live-line conductors 11 of the respective phases. It has contact parts 1'R, 1'W, 1'B, 1'N.

表示部2は、第1の発光部2A、第2の発光部2B、第3の発光部2C及び第4の発光部2Dを有している。これらのうち、第1の発光部2Aは、活線側接触部1R,1W,1B、1N及び非活線側接触部1´R,1´W,1´B,1´Nにそれぞれ対応させて配設したものである。第2の発光部2Bは、電源側及び負荷側で対応する同相の各活線側接触部1R,1W,1B,1N及び非活線側接触部1´R,1´W,1´B,1´N間の状態を表すように構成したものである。第3の発光部2Cは、電源側の相間で隣接する活線側接触部1R,1W,1B,1N間の状態を表すように構成したものである。第4の発光部2Dは、負荷側の相間で隣接する非活線側接触部1´R,1´W,1´B,1´Nの状態を表すように構成したものである。また、第1乃至第4の発光部2A乃至2Dは液晶で好適に構成することができる。   The display unit 2 includes a first light emitting unit 2A, a second light emitting unit 2B, a third light emitting unit 2C, and a fourth light emitting unit 2D. Among these, the 1st light emission part 2A is made to respond | correspond to hot wire side contact part 1R, 1W, 1B, 1N and non hot line side contact part 1'R, 1'W, 1'B, 1'N, respectively. Arranged. The second light emitting unit 2B includes the corresponding in-phase live line side contact portions 1R, 1W, 1B, 1N and non-live line side contact portions 1′R, 1′W, 1′B, corresponding to the power supply side and the load side. It is configured to represent the state between 1′N. The 3rd light emission part 2C is comprised so that the state between the hot wire side contact parts 1R, 1W, 1B, and 1N adjacent between the phases by the side of a power supply may be represented. The 4th light emission part 2D is comprised so that the state of non-hot-wire side contact part 1'R, 1'W, 1'B, 1'N which adjoins between the phases by the side of a load may be represented. Further, the first to fourth light emitting portions 2A to 2D can be preferably configured with liquid crystals.

絶縁検出部3は、テストプラグ接続部1にテストプラグ30を接続した状態で、各活線側導体35R乃至35Nと各非活線側導体45R乃至45Nとの間の絶縁抵抗である相間絶縁抵抗、並びに各活線側導体35R乃至35Nの間及び各非活線側導体45R乃至45Nの間の絶縁抵抗である極間絶縁抵抗を検出し、これらが異常であった場合に絶縁異常信号S4を送出する。かかる絶縁検出部3の具体的な構成は後で説明する。   The insulation detection unit 3 is an interphase insulation resistance that is an insulation resistance between each of the live wire side conductors 35R to 35N and each of the non-live wire side conductors 45R to 45N in a state where the test plug 30 is connected to the test plug connection unit 1. In addition, an insulation resistance signal S4 is detected when the inter-pole insulation resistance, which is the insulation resistance between the live wire side conductors 35R to 35N and between the non-live wire side conductors 45R to 45N, is detected. Send it out. A specific configuration of the insulation detection unit 3 will be described later.

発光制御部4は、絶縁異常信号S4を入力した場合、絶縁異常であることを表示するように表示部2の発光状態を制御する。同時に、この発光制御部4は、後述する各試験モードに基づきテストプラグ接続部1にテストプラグ30を接続した状態で、同一相の各活線側導体35R乃至35Nと各非活線側導体45R乃至45Nとの間、電源側で隣接する各活線側導体35R乃至35Nの間及び負荷側で隣接する各非活線側導体45R乃至45Nの間に電流を供給してそれぞれの導通状態を検出し、この検出状態を表示するように表示部2の発光状態を制御する。   When the insulation abnormality signal S4 is input, the light emission control unit 4 controls the light emission state of the display unit 2 so as to display the insulation abnormality. At the same time, the light emission control unit 4 is connected to the test plug connection unit 1 based on each test mode to be described later, and the hot wire side conductors 35R to 35N and the non-hot wire side conductors 45R of the same phase. To 45N, between the live conductors 35R to 35N adjacent on the power supply side, and between the non-hot live conductors 45R to 45N adjacent on the load side to detect the respective conduction states. Then, the light emission state of the display unit 2 is controlled so as to display this detection state.

ここで、図2に基づき試験モードに関して説明しておく。図2(a)乃至図2(d)は第1乃至第4のモードにそれぞれ対応する正常な状態の表示部2の表示態様である。同図中、網点部分が点灯されていることを表している。   Here, the test mode will be described with reference to FIG. FIGS. 2A to 2D show display modes of the display unit 2 in a normal state corresponding to the first to fourth modes, respectively. In the figure, the halftone dot portion is lit.

図2(a)に示す第1のモードは、所定の試験に先立ち、表示部2の健全性を確認するためのモードであり、非活線側接触部1´R乃至1´N及び各活線側接触部1R,1W,1B,1Nを所定の治具(例えば図3に示す短絡キャップ16)で短絡した状態で電源釦スイッチ8を押すことにより選択される。電源釦スイッチ8を押すことにより、第1乃至第4の発光部2Aが全て点灯された場合、表示部2は健全であると判断することができ、点灯しない部分が存在する場合は、その部分が不良であると判断することができるように構成してある。   The first mode shown in FIG. 2A is a mode for confirming the soundness of the display unit 2 prior to a predetermined test. The non-live line side contact parts 1′R to 1′N and each active part are displayed. The line side contact portions 1R, 1W, 1B, and 1N are selected by pressing the power button switch 8 in a state where the line side contact portions 1R, 1W, 1B, and 1N are short-circuited by a predetermined jig (for example, the short-circuit cap 16 shown in FIG. 3). When all of the first to fourth light emitting units 2A are turned on by pressing the power button switch 8, it can be determined that the display unit 2 is healthy. Is configured to be determined to be defective.

図2(b)に示す第2のモードは、モード選択釦9を押すことにより第2のモード選択信号S2により選択される。この第2のモードは、同一相の各活線側導体35R乃至35Nと各非活線側導体45R乃至45Nとの間の導通を検出するモードであり、テストプラグ30の各端子37,47間(図9参照;以下同じ)をコ字状の導通アングル(図示せず)で接続した状態で当該テストプラグ30をテストターミナル5(図8参照;以下同じ)に挿入してPT回路の電圧を測定する場合等に先立って行なう試験である。この第2のモードでは、図2(b)に示すように、各第1の発光部2Aと各第2の発光部2Bとが点灯された場合に、各活線側導体35R乃至35Nと各非活線側導体45R乃至45Nとの間の導通が正常に確保されていると判断でき、点灯しない第2の発光部2Bが存在する場合は、その部分が不良であると判断することができる。   The second mode shown in FIG. 2B is selected by the second mode selection signal S2 by pressing the mode selection button 9. This second mode is a mode for detecting continuity between each of the live-line conductors 35R to 35N and the non-live-line conductors 45R to 45N of the same phase, and between the terminals 37 and 47 of the test plug 30. The test plug 30 is inserted into the test terminal 5 (see FIG. 8; the same applies hereinafter) with the U-shaped conduction angle (not shown) connected (see FIG. 9; the same applies hereinafter), and the voltage of the PT circuit is set. This is a test performed prior to measurement. In this second mode, as shown in FIG. 2B, when each first light emitting unit 2A and each second light emitting unit 2B are turned on, each of the live wire side conductors 35R to 35N and each It can be determined that conduction between the non-hot-wire-side conductors 45R to 45N is normally ensured, and when there is the second light emitting unit 2B that does not light up, it can be determined that the portion is defective. .

図2(c)に示す第3のモードは、モード選択釦9を押すことにより第3のモード選択信号S3により選択される。この第3のモードは、隣接する活線側導体35R乃至35N間の導通を検出するモードであり、変流器51R乃至51B(図7参照)の2次側が開放されるのを防止してテストプラグ30の各活線側導体35R乃至35N間を短絡片38(図9参照;以下同じ)で短絡し、非活線側導体45R乃至45Nを介して負荷に電流を供給する場合に先立って行なう試験である。この第3のモードでは、図2(c)に示すように、各第1の発光部2Aと各第3の発光部2Cとが点灯された場合に、各活線側導体35R乃至35N間が正常に導通されていると判断でき、点灯しない第3の発光部2Cが存在する場合は、その部分が不良であると判断することができる。   The third mode shown in FIG. 2C is selected by pressing the mode selection button 9 by the third mode selection signal S3. This third mode is a mode for detecting continuity between adjacent live wire side conductors 35R to 35N, and prevents the secondary side of current transformers 51R to 51B (see FIG. 7) from being opened. Prior to the case where the live wire side conductors 35R to 35N of the plug 30 are short-circuited by a short-circuit piece 38 (see FIG. 9; the same applies hereinafter) and current is supplied to the load via the non-live wire side conductors 45R to 45N. It is a test. In this third mode, as shown in FIG. 2 (c), when the first light emitting units 2A and the third light emitting units 2C are lit, there is a gap between the live conductors 35R to 35N. If the third light emitting unit 2C that does not light up can be determined to be normally conducted, it can be determined that the portion is defective.

図2(d)に示す第4のモードは、相間及び極間絶縁抵抗を検出するモードで、前記相間及び極間絶縁抵抗の健全性を検出するための試験を行うモードである。この第4のモードでは、図2(d)に示すように、第1乃至第4の全ての発光部2A乃至2Dが点灯されない場合に、テストプラグ30の相間及び極間絶縁抵抗が正常であると判断でき、何れかの部分の絶縁抵抗が不良の場合には第1乃至第4の発光部4A乃至4Dの全てが点灯されるようになっており、このことにより何れかの部分における絶縁抵抗が不良であると判断することができる。ここで、第4のモードにおいて絶縁抵抗の不良が検出されると第1乃至第4の全ての発光部4A乃至4Dが発光するので、第1のモードで正常である場合(この場合も全ての発光部4A乃至4Dが発光する)と区別する必要がある。かかる区別は、第4のモードにおいて絶縁不良が検出された場合、発光部4A乃至4Dを点滅させることにより容易に実現し得る。   The fourth mode shown in FIG. 2D is a mode for detecting interphase and interelectrode insulation resistance, and is a mode for performing a test for detecting the soundness of the interphase and interelectrode insulation resistance. In the fourth mode, as shown in FIG. 2D, when all the first to fourth light emitting units 2A to 2D are not turned on, the interphase and interpolar insulation resistance of the test plug 30 is normal. If any part of the insulation resistance is defective, all of the first to fourth light emitting units 4A to 4D are turned on. Can be determined to be defective. Here, when a defect in insulation resistance is detected in the fourth mode, all of the first to fourth light emitting units 4A to 4D emit light. It is necessary to distinguish from the light emitting units 4A to 4D. Such distinction can be easily realized by blinking the light emitting units 4A to 4D when an insulation failure is detected in the fourth mode.

図3は本形態に係る試験装置の外観をテストプラグとともに示す斜視図である。同図に示すように、本形態におけるテストプラグ接続部1は、筐体である本体12から前方に伸ばして屈曲させた第1の爪部材13と、ヒンジ部15を介して本体12に基端部を回動可能に支持されるとともに前方に伸ばして屈曲させた第2の爪部材14とを有する。ここで、第1の爪部材13は、全体は絶縁部材で構成してあるが、それぞれの先端面には導電部である非活線側接触部1´R乃至1´N(図3には図示せず)が固着されているおり、各非活線側接触部1´R乃至1´Nを介して各相の非活線側導体45R乃至45Nにそれぞれ接触するようになっている。同様に、第2の爪部材14も、全体は絶縁部材で構成してあるが、それぞれの先端面には導電部である活線側接触部1R乃至1Nが固着されており、各活線側接触部1R乃至1Nを介して各相の活線側導体35R乃至35Nにそれぞれ接触するようになっている。   FIG. 3 is a perspective view showing the appearance of the test apparatus according to this embodiment together with a test plug. As shown in the figure, the test plug connecting portion 1 in this embodiment has a first claw member 13 that extends forward from a main body 12 that is a casing and is bent, and a base end on the main body 12 via a hinge portion 15. And a second claw member 14 that is supported so as to be rotatable and is extended and bent forward. Here, the first claw member 13 is entirely composed of an insulating member, but each tip end surface has a non-live line side contact portion 1′R to 1′N (a conductive portion) (see FIG. 3). (Not shown) is fixed, and is in contact with the non-live line side conductors 45R to 45N of the respective phases via the non-live line side contact portions 1′R to 1′N. Similarly, the second claw member 14 is also made of an insulating member as a whole, but the live wire side contact portions 1R to 1N, which are conductive portions, are fixed to the respective front end surfaces, and each live wire side. Each phase contacts the hot wire conductors 35R to 35N via the contact portions 1R to 1N.

表示部2、電源釦スイッチ8及びモード選択釦9は本体12の表面に配設してある。また、第1の爪部材13及び第2の爪部材14の間には、非活線側接触部1´R乃至1´N及び活線側接触部1R乃至1Nに接触して全体を短絡するための導電部材16aで形成した短絡キャップ16を噛ませてある。かかる状態で、電源釦スイッチ8を押せば表示部2の健全性を調べることができる。なお、導電部材16aの周囲には感電防止のための絶縁物で周囲を囲んだ絶縁壁16bが設けられている。   The display unit 2, the power button switch 8 and the mode selection button 9 are arranged on the surface of the main body 12. Moreover, between the 1st nail | claw member 13 and the 2nd nail | claw member 14, it contacts the non-hot-wire side contact part 1'R thru | or 1'N and the live-line side contact part 1R thru | or 1N, and short-circuits the whole. A short-circuit cap 16 formed of a conductive member 16a is engaged. In this state, if the power button switch 8 is pressed, the soundness of the display unit 2 can be checked. In addition, an insulating wall 16b is provided around the conductive member 16a so as to surround the periphery with an insulator for preventing electric shock.

かかる本形態においては、ヒンジ部15を回動中心として第2の爪部材14を、図中に一点鎖線で示すように回動することによりその先端部を開き、かかる状態でテストプラグ30の非活線側導体45R乃至45N及び活線側導体35R乃至35Nを第1の爪部材13と第2の爪部材14との間で把持することによりテストプラグ30の所定の検査の準備が完了する。   In this embodiment, the second claw member 14 is rotated as indicated by the alternate long and short dash line in the drawing with the hinge portion 15 as the rotation center, and the tip portion is opened. By holding the live wire side conductors 45R to 45N and the live wire side conductors 35R to 35N between the first claw member 13 and the second claw member 14, preparation for a predetermined inspection of the test plug 30 is completed.

図4は本形態に係る試験装置の表示部の詳細な構成を示す回路図である。図4中において各発光部2A,2B,2C,2Dは網点を付して示した部分で、液晶で形成してある。ここで、第1の発光部2Aは、図4中で上段の左側から順に非活線側接触部1´R乃至1´N側のR相,W相,B相,N相をそれぞれ表わしており、下段の左側から順に活線側接触部1R乃至1N側のR相,W相,B相,N相をそれぞれ表わしている。第2の発光部2Bは左側から順にR相,W相,B相,N相の非活線側接触部1´R,1´W,1´B,1´Nと活線側接触部1R,1W,1B,1Nとの間のものであることを表している。同様に、第3の発光部2C及び第4の発光部2Dは、左側から順に活線側接触部1R乃至1N側におけるR相−W相間,W−B相間,B−N相間及び非活線側接触部1´R乃至1´N側におけるR相−W相間,W−B相間,B−N相間のものであることを表している。   FIG. 4 is a circuit diagram showing a detailed configuration of the display unit of the test apparatus according to the present embodiment. In FIG. 4, each light emitting part 2A, 2B, 2C, 2D is a part shown with a halftone dot, and is formed of liquid crystal. Here, the first light emitting part 2A represents the R phase, W phase, B phase, and N phase on the non-live line side contact parts 1′R to 1′N side in order from the left side of the upper stage in FIG. The R-phase, W-phase, B-phase, and N-phase on the hot wire side contact portions 1R to 1N are shown in order from the left side of the lower stage. The second light-emitting portion 2B includes R-phase, W-phase, B-phase, and N-phase non-hot-wire side contact portions 1′R, 1′W, 1′B, 1′N and a live-wire-side contact portion 1R in order from the left side. , 1W, 1B, 1N. Similarly, the third light emitting unit 2C and the fourth light emitting unit 2D are arranged in order from the left side on the live side contact portions 1R to 1N side between the R phase and the W phase, between the WB phase, between the BN phase, and the non-live line. It represents that it is between the R phase-W phase, the WB phase, and the BN phase on the side contact portions 1′R to 1′N side.

第1乃至第4の発光部2A乃至2Dはa接点a1乃至a18の閉成により選択的に点灯される。したがって、a接点a1乃至a18の開閉を発光制御部4の接点制御部(図示せず)で適宜制御すれば、図2に示すような各モードにおける表示部2の表示状態を構築することができる。   The first to fourth light emitting units 2A to 2D are selectively turned on by closing the a contacts a1 to a18. Therefore, the display state of the display unit 2 in each mode as shown in FIG. 2 can be constructed by appropriately controlling the opening and closing of the a contacts a1 to a18 by a contact control unit (not shown) of the light emission control unit 4. .

図5は本形態に係る試験装置における発光制御部の詳細な構成を示す回路図である。図2(a)に示す第1のモードにおいては、電源釦スイッチ8を押すが、このことによりリレーR0が電源18に接続される結果、このリレーR0が付勢される。この場合には、接点制御部(図示せず)を介して図4の全てのa接点a1乃至a18を閉成するように構成してある。したがって、正常時には図2(a)に示すような表示となる。一方、点灯されない発光部2A乃至2Dがあればその部分で表示部2の不良を生起していることを視認し得る。   FIG. 5 is a circuit diagram showing a detailed configuration of the light emission control unit in the test apparatus according to the present embodiment. In the first mode shown in FIG. 2 (a), the power button switch 8 is pressed. As a result, the relay R0 is connected to the power source 18, and as a result, the relay R0 is energized. In this case, all a contacts a1 to a18 in FIG. 4 are closed via a contact control unit (not shown). Therefore, the display is as shown in FIG. On the other hand, if there is a light emitting part 2A to 2D that is not lit, it can be visually recognized that a defect of the display part 2 occurs in that part.

図2(b)に示す第2のモードでは、第1の爪部材13と第2の爪部材14との間にテストプラグ30の活線側導体35R乃至35N及び非活線側導体45R乃至45Nを把持した状態でモード選択釦9の操作により第2のモード選択信号S2を送出する。ここで、テストプラグ30の端子37,47間はコ字状金属で電源側と負荷側とが接続されているので、第2のモード選択信号S2により接点a20が閉成されると同時に、他からの制御により接点a21乃至a24が閉成されると、所定通り同相の電源側と負荷側とが接続されている場合には、リレーR1乃至R4が動作する。この結果、接点制御部を介してa接点a1乃至a18が選択的に閉成されて、正常時には図2(b)に示すような表示となる。一方、電源側と負荷側とが何らかの原因で接続されていない場合には、対応する相のリレーR1乃至R4は動作しない。そこで、この状態を反映すべく何れかの発光部2Bを発光させないことで不良部分を視認し得る。   In the second mode shown in FIG. 2B, the live wire side conductors 35R to 35N and the non-live wire side conductors 45R to 45N of the test plug 30 are provided between the first claw member 13 and the second claw member 14. The second mode selection signal S2 is sent by operating the mode selection button 9 while holding the button. Here, since the power source side and the load side are connected by the U-shaped metal between the terminals 37 and 47 of the test plug 30, the contact point a20 is closed by the second mode selection signal S2 and the other. When the contacts a21 to a24 are closed by the control from, the relays R1 to R4 operate when the in-phase power supply side and the load side are connected as prescribed. As a result, the a contacts a1 to a18 are selectively closed via the contact control unit, and a display as shown in FIG. On the other hand, when the power supply side and the load side are not connected for some reason, the corresponding phase relays R1 to R4 do not operate. Therefore, the defective portion can be visually recognized by not causing any of the light emitting portions 2B to emit light in order to reflect this state.

図2(c)に示す第3のモードでは、第1の爪部材13と第2の爪部材14との間にテストプラグ30の活線側導体35R乃至35Nを把持した状態でモード選択釦9の操作により第3のモード選択信号S3を送出する。第3のモードでは、テストプラグ30の電源側の端子47間が短絡片38により短絡されている。そこで、第3のモード選択信号S3により接点a30を閉成するとともに、他からの次のような制御により各接点の開閉を制御する。   In the third mode shown in FIG. 2C, the mode selection button 9 is in a state where the live conductors 35R to 35N of the test plug 30 are held between the first claw member 13 and the second claw member 14. The third mode selection signal S3 is sent out by the above operation. In the third mode, the terminals 47 on the power supply side of the test plug 30 are short-circuited by the short-circuit piece 38. Therefore, the contact a30 is closed by the third mode selection signal S3, and the opening and closing of each contact is controlled by the following control from others.

1) 接点a24を閉成する。このとき、リレーR4が動作すれば、正常であるので、表示部2は図2(c)に示すように点灯される。
2) 1)でリレーR4が動作しなかった場合には、接点a22を閉成する。この結果、リレーR2が動作すれば活線側接触部1R,1W間は正常である。
3) 2)でリレーR2が動作した後、接点a23を閉成する。この結果、リレーR3が動作すれば活線側接触部1W,1B間は正常である。したがって、活線側接触部1B,1N間が異常ということになる。
4) 2)でリレーR2が動作しなかった場合には、活線側接触部1R,1W間が異常である反面、活線側接触部1W,1B及び活線側接触部1B,1N間の正常乃至異常は不明である。そこで、次の2つの手順により活線側接触部1W,1B及び活線側接触部1B,1N間の状態を検出する。
5) 接点a31,a23を閉成したとき、リレーR3が動作すれば、活線側接触部1W,1Bは正常であり、そうでなければ異常である。
6) 接点a31,a32及びa24を閉成したとき、リレーR4が動作すれば、活線側接触部1B,1Nは正常であり、そうでなければ異常である。
7) 以上の1)乃至6)の処理結果に基づいて接点制御部が発光部2A,2Cの点灯を制御する。この結果、全てが正常な場合には、図2(c)のような表示となる。一方、不良箇所に対応する発光部2Cは点灯されないので、不良箇所を視認し得る。
1) The contact a24 is closed. At this time, if the relay R4 operates, it is normal and the display unit 2 is lit as shown in FIG.
2) When the relay R4 does not operate in 1), the contact a22 is closed. As a result, if the relay R2 operates, the contact between the hot wire side contact portions 1R and 1W is normal.
3) After the relay R2 is operated in 2), the contact a23 is closed. As a result, if the relay R3 is operated, the contact between the live wire side contact portions 1W and 1B is normal. Therefore, the hot wire side contact portions 1B and 1N are abnormal.
4) When the relay R2 does not operate in 2), between the live wire side contact portions 1R and 1W is abnormal, but between the live wire side contact portions 1W and 1B and the live wire side contact portions 1B and 1N Normal or abnormal is unknown. Therefore, the state between the live wire side contact portions 1W and 1B and the live wire side contact portions 1B and 1N is detected by the following two procedures.
5) When the contacts a31 and a23 are closed, if the relay R3 operates, the hot-wire side contact portions 1W and 1B are normal, and otherwise are abnormal.
6) When the contacts a31, a32, and a24 are closed, if the relay R4 operates, the hot-wire side contact portions 1B, 1N are normal, otherwise they are abnormal.
7) The contact point control unit controls the lighting of the light emitting units 2A and 2C based on the processing results of 1) to 6). As a result, when everything is normal, the display is as shown in FIG. On the other hand, since the light emitting unit 2C corresponding to the defective portion is not turned on, the defective portion can be visually recognized.

図2(d)に示す第4のモードでは、第1の爪部材13と第2の爪部材14との間にテストプラグ30の活線側導体35R乃至35Nを把持した状態で相間及び極間の絶縁抵抗を測定し、絶縁抵抗が設定値よりも小さい場合には絶縁異常信号S4で接点a40を閉成する。このとき接点a40をフリッカリレーの接点で形成すればリレーR0をフリッカ動作させることができる。この結果、全発光部2A乃至2Dが点滅して、絶縁不良部分があることを警告することができる。一方、十分な絶縁抵抗が確保されている場合には発光部2A乃至2Dの全てが発光しない。   In the fourth mode shown in FIG. 2 (d), the hot-wire side conductors 35R to 35N of the test plug 30 are held between the first claw member 13 and the second claw member 14. When the insulation resistance is smaller than the set value, the contact a40 is closed by the insulation abnormality signal S4. At this time, if the contact a40 is formed of a contact of a flicker relay, the relay R0 can be flickered. As a result, all the light emitting portions 2A to 2D blink, and it is possible to warn that there is a defective insulation portion. On the other hand, when sufficient insulation resistance is ensured, all of the light emitting portions 2A to 2D do not emit light.

ここで、第2のモード乃至第4のモードは自動的に遷移する。したがって、表示部2の状態が実施している試験に対応する図2(b)乃至図2(d)に示すような、健全な表示部2となっているか否かを視認すれば良い。   Here, the second mode to the fourth mode automatically transition. Therefore, it is only necessary to visually check whether the state of the display unit 2 is a healthy display unit 2 as shown in FIGS. 2B to 2D corresponding to the test being performed.

図6は本形態に係る試験装置における絶縁検出部の具体的な構成例を概念的に示す説明図である。本形態における絶縁検出部3は、隣接する異なる相間における活線側接触部1R,1W,1B,1N同士と非活線側接触部1´R,1´W,1´B,1´N同士とがそれぞれ異なる極になると同時に、同一相で相対向している活線側接触部1R,1W,1B,1Nと非活線側接触部1´R,1´W,1´B,1´Nとがそれぞれ異なる極となるように活線側接触部1R,1W,1B,1N及び非活線側導体45R,45W,45B,45Nにそれぞれ接続されている一対の測定端子19,20を有している。かかる接続状態は、図示はしないがスイッチ手段の切り替えにより実現できる構造となっている。   FIG. 6 is an explanatory diagram conceptually illustrating a specific configuration example of the insulation detection unit in the test apparatus according to the present embodiment. Insulation detection unit 3 in this embodiment includes hot-wire side contact portions 1R, 1W, 1B, and 1N and non-hot-wire side contact portions 1′R, 1′W, 1′B, and 1′N between adjacent different phases. Are different poles, and at the same time, the hot-wire side contact portions 1R, 1W, 1B, 1N and the non-hot-wire side contact portions 1'R, 1'W, 1'B, 1 'facing each other in the same phase N has a pair of measuring terminals 19 and 20 connected to the hot wire side contact portions 1R, 1W, 1B, and 1N and the non-hot wire side conductors 45R, 45W, 45B, and 45N so that N is a different pole. is doing. Such a connection state has a structure that can be realized by switching of the switch means (not shown).

さらに詳言すると、+極となる測定端子19には、活線側接触部1W,1Nと非活線側接触部1´R,1´Bとがそれぞれ接続してあり、−極となる測定端子20には活線側接触部1R,1Bと非活線側接触部1´W,1´Nとがそれぞれ接続してある。この結果、隣接する異なる相間における活線側接触部1R,1W,1B,1N同士と非活線側接触部1´R,1´W,1´B,1´N同士とがそれぞれ異なる極になると同時に、同一相で相対向している活線側接触部1Rと非活線側接触部1´R、活線側接触部1Wと非活線側接触部1´W、活線側接触部1Bと非活線側接触部1´B、活線側接触部1Nと非活線側接触部1´Nとがそれぞれ異なる極となる。すなわち、+極となる活線側接触部1W,1N及び非活線側接触部1´R,1´Bと、−極となる活線側接触部1R,1B及び非活線側接触部1´W,1´Nとは電源側と負荷側とで千鳥状になるように配設してある。   More specifically, the measurement terminal 19 serving as the positive electrode is connected to the live-line-side contact portions 1W and 1N and the non-hot-wire-side contact units 1′R and 1′B, respectively. The terminal 20 is connected to the hot wire side contact portions 1R, 1B and the non-hot wire side contact portions 1'W, 1'N, respectively. As a result, the hot-wire side contact portions 1R, 1W, 1B, and 1N and the non-hot-wire side contact portions 1′R, 1′W, 1′B, and 1′N between different adjacent phases are different poles. At the same time, the hot-wire-side contact portion 1R and the non-hot-wire-side contact portion 1′R, the hot-wire-side contact portion 1W and the non-hot-wire-side contact portion 1′W, and the hot-wire-side contact portion that face each other in the same phase. 1B and the non-hot-wire side contact portion 1′B, and the live-wire-side contact portion 1N and the non-hot-wire side contact portion 1′N are different poles. That is, the hot-wire side contact portions 1W and 1N and the non-hot-wire side contact portions 1′R and 1′B that become the positive poles, and the live-wire-side contact portions 1R and 1B and the non-hot-wire side contact portions 1 that become the negative poles. 'W and 1'N are arranged in a staggered pattern on the power supply side and the load side.

この結果、測定端子19,20間にメガーで所定の高電圧を印加すれば、図中に点線で接続したように、異なる相間であれ、同一相間であれ、第1乃至第2の爪部材13,14間に把持するテストプラグ30の活線側導体35R,35W,35B,35N間及び非活線側導体45R,45W,45B,45N間並びに相対向する活線側導体35R,35W,35B,35Nと非活線側導体45R,45W,45B,45N間には、所定の高電圧が印加される。この結果、所定の絶縁抵抗を一度に測定することができる。この結果、絶縁抵抗に異常がなければ図5の接点a40が開放されたままであるので、表示部2が発光することはない。異常時のみ接点a40の閉成により発光部2A乃至2Dが点滅する。   As a result, when a predetermined high voltage is applied between the measurement terminals 19 and 20 with a mega, the first and second claw members 13 are connected between different phases or the same phase as shown by the dotted line in the figure. , 14 between the live wire side conductors 35R, 35W, 35B, 35N of the test plug 30 and between the non-live wire side conductors 45R, 45W, 45B, 45N and the opposed live wire side conductors 35R, 35W, 35B, A predetermined high voltage is applied between 35N and the non-live wire side conductors 45R, 45W, 45B, 45N. As a result, a predetermined insulation resistance can be measured at a time. As a result, if there is no abnormality in the insulation resistance, the contact point a40 in FIG. 5 remains open, and the display unit 2 does not emit light. The light emitting units 2A to 2D blink only when the contact a40 is closed only when an abnormality occurs.

なお、かかる絶縁測定は、第1のモードのセルフチェックが終了した直後に、第2乃至第3のモードの検査に先立って行なう。   The insulation measurement is performed immediately after the first mode self-check is completed and prior to the second to third mode inspections.

本発明は電力機器を製造販売する産業分野や、電力設備を保守・点検する産業分野で利用することができる。   INDUSTRIAL APPLICABILITY The present invention can be used in an industrial field in which electric power equipment is manufactured and sold, and an industrial field in which electric power equipment is maintained and inspected.

本発明の実施の形態に係るテストプラグの試験装置の全体を示すブロック線図である。1 is a block diagram showing an entire test plug testing apparatus according to an embodiment of the present invention. 図1に示す試験装置の表示部の表示態様を各モード毎に示す説明図である。It is explanatory drawing which shows the display mode of the display part of the test apparatus shown in FIG. 1 for every mode. 図1に示す試験装置の外観をテストプラグとともに示す斜視図である。It is a perspective view which shows the external appearance of the test apparatus shown in FIG. 1 with a test plug. 図1に示す試験装置の表示部の詳細な構成を示す回路図である。It is a circuit diagram which shows the detailed structure of the display part of the test apparatus shown in FIG. 図1に示す試験装置における発光制御部の詳細な構成を示す回路図である。It is a circuit diagram which shows the detailed structure of the light emission control part in the test apparatus shown in FIG. 図1に示す試験装置における絶縁検出部の具体的な構成例を概念的に示す説明図である。It is explanatory drawing which shows notionally the specific structural example of the insulation detection part in the test apparatus shown in FIG. 挿入式のテストプラグ及びテストターミナルを有する電力系統の保護システムを示す回路図である。It is a circuit diagram which shows the protection system of the electric power system which has an insertion type test plug and a test terminal. テストターミナルを示す縦断面図である。It is a longitudinal cross-sectional view which shows a test terminal. テストプラグを示す斜視図である。It is a perspective view which shows a test plug.

符号の説明Explanation of symbols

1 テストプラグ接続部
1R,1W,1B,1N 活線側接触部
1´R,1´W,1´B,1´N 非活線側接触部
2 表示部
2A乃至2D 発光部
3 絶縁検出部
4 発光制御部
8 電源釦スイッチ
9 モード選択釦
12 本体
13 第1の爪部材
14 第2の爪部材
15 ヒンジ部
DESCRIPTION OF SYMBOLS 1 Test plug connection part 1R, 1W, 1B, 1N Hot wire side contact part 1'R, 1'W, 1'B, 1'N Non hot line side contact part 2 Display part 2A thru | or 2D Light emission part 3 Insulation detection part 4 Light emission control unit 8 Power button switch 9 Mode selection button 12 Main body 13 First claw member 14 Second claw member 15 Hinge unit

Claims (4)

電源側の各相に接続されたテストターミナルの複数の電源側導体にそれぞれ接触する活線側導体と、負荷側の各相に接続された前記テストターミナルの同数の負荷側導体にそれぞれ接触する非活線側導体とが各相毎に絶縁部材の相対向する面にそれぞれ配設されているテストプラグの試験装置であって、
前記各活線側導体に接触させ得る活線側接触部及び各非活線側導体に接触させ得る非活線側接触部を有するテストプラグ接続部と、
前記活線側接触部及び非活線側接触部にそれぞれ対応させて配設した第1の発光部、前記電源側及び負荷側で対応する同相の前記各活線側接触部及び非活線側接触部間の状態を表すように構成した第2の発光部、前記電源側の相間で隣接する前記活線側接触部間の状態を表すように構成した第3の発光部及び前記負荷側の相間で隣接する前記非活線側接触部間の状態を表すように構成した第4の発光部を有する表示手段と、
前記テストプラグ接続部に前記テストプラグを接続した状態で、前記各活線側導体と前記各非活線側導体との間の絶縁抵抗である相間絶縁抵抗、並びに前記各活線側導体の間及び前記各非活線側導体の間の絶縁抵抗である極間絶縁抵抗を検出し、これらが異常であった場合に絶縁異常信号を送出する絶縁検出手段と、
前記絶縁異常信号を入力した場合、絶縁異常であることを表示するように前記表示手段の発光状態を制御するとともに、前記テストプラグ接続部に前記テストプラグを接続した状態で、同一相の前記各活線側導体と前記各非活線側導体との間、前記電源側で隣接する各活線側導体の間及び前記負荷側で隣接する各非活線側導体の間に電流を供給してそれぞれの導通状態を検出し、この検出状態を表示するように前記表示手段の発光状態を制御する発光制御手段とを有することを特徴とするテストプラグの試験装置。
A live conductor that contacts each of a plurality of power supply side conductors of the test terminal connected to each phase on the power supply side and a non-contact that contacts each of the same number of load side conductors of the test terminal connected to each phase on the load side A test device for a test plug in which a live wire side conductor is disposed on each surface of the insulating member facing each other for each phase,
A test plug connection portion having a live wire side contact portion that can be brought into contact with each of the live wire side conductors and a non-hot wire side contact portion that can be brought into contact with each non-live wire side conductor;
The first light-emitting part disposed corresponding to the live-line-side contact part and the non-hot-line-side contact part, the respective live-line-side contact parts and the non-hot-line side corresponding to the same phase on the power supply side and the load side A second light emitting unit configured to represent a state between the contact parts, a third light emitting unit configured to represent a state between the adjacent live line side contact units between the phases on the power supply side, and the load side Display means having a fourth light emitting portion configured to represent a state between the non-hot-wire side contact portions adjacent to each other;
In a state where the test plug is connected to the test plug connecting portion, an interphase insulation resistance that is an insulation resistance between each of the live wire side conductors and each of the non-live wire side conductors, and between each of the live wire side conductors And an insulation detection means for detecting an insulation resistance between the electrodes, which is an insulation resistance between the non-live conductors, and sending an insulation abnormality signal when these are abnormal,
When the insulation abnormality signal is input, the light emission state of the display means is controlled so as to display that the insulation abnormality is present, and the test plug is connected to the test plug connection portion, and the respective phases of the same phase are displayed. Supply current between a live wire side conductor and each non-live wire side conductor, between each live wire side conductor adjacent on the power supply side, and between each non-live wire side conductor adjacent on the load side. A test plug testing apparatus comprising: a light emission control means for detecting each conduction state and controlling the light emission state of the display means so as to display the detection state.
請求項1に記載するテストプラグの試験装置において、
前記テストプラグ接続部は、
前記各相の活線側導体又は非活線側導体にそれぞれ接触するよう筐体である本体から前方に伸ばして屈曲させた先端面に前記活線側接触部又は非活線側接触部をそれぞれ有する第1の爪部材と、
前記各相の非活線側導体又は活線側導体にそれぞれ接触するよう前記本体に基端部を回動可能に支持されるとともに前方に伸ばして屈曲させた先端面に前記非活線側接触部又は活線側接触部をそれぞれ有する第2の爪部材とを有するものであることを特徴とするテストプラグの試験装置。
The test plug test apparatus according to claim 1,
The test plug connection part is
The hot-wire-side contact portion or the non-hot-wire-side contact portion is respectively formed on the front end surface that is bent forward and bent from the main body, which is a housing, so as to come into contact with the live-wire-side conductor or non-hot-wire-side conductor of each phase, respectively. A first claw member having
The non-hot-wire side contact is made to the front end surface that is pivotally supported by the main body so as to be in contact with the non-hot-wire-side conductor or the hot-wire-side conductor of each phase and is extended and bent forward. And a second claw member each having a hot wire side contact portion.
請求項1又は請求項2に記載するテストプラグの試験装置において、
前記表示手段における前記第1乃至第4の発光部は液晶で構成したことを特徴とするテストプラグの試験装置。
In the test plug test apparatus according to claim 1 or 2,
A test plug testing apparatus, wherein the first to fourth light emitting portions in the display means are composed of liquid crystals.
請求項1乃至請求項3の何れか一つに記載するテストプラグの試験装置において、
前記絶縁検出手段は、
隣接する異なる相間における前記活線側接触部同士と前記負荷側導体同士とがそれぞれ異なる極になると同時に、同一相で相対向している前記活線側接触部と前記負荷側導体とがそれぞれ異なる極となるように前記電源側接触部及び負荷側接触部にそれぞれ接続されている一対の測定端子を有することを特徴とするテストプラグの試験装置。
In the test plug test apparatus according to any one of claims 1 to 3,
The insulation detection means includes
The live wire side contact portions and the load side conductors in adjacent different phases become different poles, and at the same time, the live wire side contact portions and the load side conductors facing each other in the same phase are different. A test plug testing apparatus comprising a pair of measurement terminals respectively connected to the power supply side contact portion and the load side contact portion so as to be poles.
JP2007201298A 2007-08-01 2007-08-01 Test plug testing equipment Expired - Fee Related JP5159201B2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010133878A (en) * 2008-12-05 2010-06-17 Chugoku Electric Power Co Inc:The Apparatus for determining performance of test plug
KR20160132542A (en) * 2015-05-11 2016-11-21 한국수력원자력 주식회사 The Automatic Test Equipment for Switchgear Breakers
KR102048278B1 (en) * 2018-05-19 2019-11-25 주식회사 성창사 Circuit testing device and controlling method of the same

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KR101894031B1 (en) * 2018-05-18 2018-08-31 주식회사 성창사 Circuit testing device

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JPH0815315A (en) * 1994-06-24 1996-01-19 Masaki Tsutsumi Decision unit for ct test circuit plug
JPH09113570A (en) * 1995-10-18 1997-05-02 Katsu Denki Koji Kk Continuity inspecting device for test plug for instrument current/voltage transformer
JP2001231153A (en) * 2000-02-16 2001-08-24 Kansai Electric Power Co Inc:The Ct test plug-testing device for protection relay board and pt test plug-testing device for protection relay board
JP2008216056A (en) * 2007-03-05 2008-09-18 Tokyo Electric Power Co Inc:The Apparatus for testing test plug
JP2008216058A (en) * 2007-03-05 2008-09-18 Kobe Steel Ltd Surface inspection method of magnesium containing material

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JPH0815315A (en) * 1994-06-24 1996-01-19 Masaki Tsutsumi Decision unit for ct test circuit plug
JPH09113570A (en) * 1995-10-18 1997-05-02 Katsu Denki Koji Kk Continuity inspecting device for test plug for instrument current/voltage transformer
JP2001231153A (en) * 2000-02-16 2001-08-24 Kansai Electric Power Co Inc:The Ct test plug-testing device for protection relay board and pt test plug-testing device for protection relay board
JP2008216056A (en) * 2007-03-05 2008-09-18 Tokyo Electric Power Co Inc:The Apparatus for testing test plug
JP2008216058A (en) * 2007-03-05 2008-09-18 Kobe Steel Ltd Surface inspection method of magnesium containing material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010133878A (en) * 2008-12-05 2010-06-17 Chugoku Electric Power Co Inc:The Apparatus for determining performance of test plug
KR20160132542A (en) * 2015-05-11 2016-11-21 한국수력원자력 주식회사 The Automatic Test Equipment for Switchgear Breakers
KR101697178B1 (en) 2015-05-11 2017-01-17 한국수력원자력 주식회사 The Automatic Test Equipment for Switchgear Breakers
KR102048278B1 (en) * 2018-05-19 2019-11-25 주식회사 성창사 Circuit testing device and controlling method of the same

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