JP2009005169A - Imaging device - Google Patents

Imaging device Download PDF

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JP2009005169A
JP2009005169A JP2007165222A JP2007165222A JP2009005169A JP 2009005169 A JP2009005169 A JP 2009005169A JP 2007165222 A JP2007165222 A JP 2007165222A JP 2007165222 A JP2007165222 A JP 2007165222A JP 2009005169 A JP2009005169 A JP 2009005169A
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time constant
clamp time
imaging apparatus
cmos sensor
horizontal
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JP2007165222A
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Japanese (ja)
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Koji Kubota
耕司 久保田
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Canon Inc
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Canon Inc
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Priority to JP2007165222A priority Critical patent/JP2009005169A/en
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Abstract

<P>PROBLEM TO BE SOLVED: To suppress a horizontal band generated in a case of a high luminance object by a CMOS sensor. <P>SOLUTION: The imaging device having a black correction circuit capable of varying a clamping time constant by a CMOS sensor imaging element and an HD unit, controls the clamping time constant to be small when the high luminance object is detected. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、撮像装置の黒レベル補正回路に関するものである。   The present invention relates to a black level correction circuit of an imaging apparatus.

CCDの代わりにCMOSセンサを用いた撮像装置の実用化が進んでいる。CMOSセンサは構造上CCDで問題となる高輝度被写体時の垂直方向のスミアは発生しないが、替わりに同一ラインの横方向に帯状のレベル変動をおこすことが問題となる。これを本明細書ではこの現象を横スミアと呼ぶ。   An image pickup apparatus using a CMOS sensor instead of a CCD has been put into practical use. The CMOS sensor does not generate vertical smear in the case of a high-brightness object, which is a problem with a CCD because of its structure, but instead causes a band-like level fluctuation in the horizontal direction of the same line. In the present specification, this phenomenon is called lateral smear.

本発明はこの横スミアを黒補正回路のOBクランプ時定数を変化させ緩和させるものであるが、OBクランプ時定数の制御の従来技術は、AGCの変化に応じてクランプ時定数を変化させるものがある(例えば特許文献1参照)。
特開平11−205667号公報
In the present invention, the lateral smear is reduced by changing the OB clamp time constant of the black correction circuit. However, the conventional technique for controlling the OB clamp time constant is to change the clamp time constant in accordance with the change of AGC. Yes (see, for example, Patent Document 1).
Japanese Patent Laid-Open No. 11-205667

しかしながら、上記従来技術ではOBクランプ時定数の制御はVD(垂直同期信号)単位であり、本発明で解決しようとする横スミアのようなHD(水平同期信号)単位の変動には効果を発揮しない。   However, in the above prior art, the control of the OB clamp time constant is in units of VD (vertical sync signal), and is not effective for fluctuations in HD (horizontal sync signal) units such as lateral smear to be solved by the present invention. .

本発明ではOBクランプの時定数制御をHD単位で行うことで、横スミア変動を抑圧可能とする。   In the present invention, the time constant control of the OB clamp is performed in HD units so that the lateral smear fluctuation can be suppressed.

本発明の撮像装置は、CMOSセンサ撮像素子及びHD単位でクランプ時定数を可変可能な黒補正回路を有した撮像装置において、高輝度被写体検出時にクランプ時定数を小さくする制御を行うことを特徴としている。   An image pickup apparatus according to the present invention is characterized in that in an image pickup apparatus having a CMOS sensor image pickup device and a black correction circuit capable of changing a clamp time constant in HD units, the clamp time constant is controlled to be small when a high-luminance subject is detected. Yes.

以上説明したように、本発明によれば、CMOS撮像素子を用いた撮像装置において、高輝度被写体撮影時の横帯(横スミア)を、被写体レベルに応じてOBクランプ時定数を制御することで抑制する。   As described above, according to the present invention, in an image pickup apparatus using a CMOS image sensor, the horizontal band (lateral smear) at the time of shooting a high-luminance subject is controlled by controlling the OB clamp time constant according to the subject level. Suppress.

(実施例1)
以下に、図面を参照して本発明の実施の形態の具体例を示す。
Example 1
Hereinafter, specific examples of embodiments of the present invention will be described with reference to the drawings.

本発明は例えば、図1に示すような撮像装置に適用される。本実施の形態の撮像装置はCMOSセンサ101aから得られた画像をAFE110aに入力し、AGC102a後に水平OBを用いて黒レベル補正104aを行う。その後ADC103aでデジタル変換された信号は、信号処理回路106aを通してビデオ信号として出力される。   The present invention is applied to, for example, an imaging apparatus as shown in FIG. The image pickup apparatus according to the present embodiment inputs an image obtained from the CMOS sensor 101a to the AFE 110a, and performs black level correction 104a using the horizontal OB after the AGC 102a. Thereafter, the signal digitally converted by the ADC 103a is output as a video signal through the signal processing circuit 106a.

次にCMOSセンサの横スミア現象について図2を用いて述べる。   Next, the lateral smear phenomenon of the CMOS sensor will be described with reference to FIG.

高輝度被写体204が写った場合、CMOSセンサは同一ラインのGNDレベル変動等により、横方向に帯203(横スミア)を引く。   When the high-brightness subject 204 is captured, the CMOS sensor draws a band 203 (lateral smear) in the horizontal direction due to the GND level fluctuation of the same line.

この横スミア現象は水平OB部も同様に変動(201)するため、高輝度検出回路107aで高輝度部を検出したラインについてクランプ時定数を小さくすることで、横スミア変動を抑圧できる。   Since the horizontal smear phenomenon also varies (201) in the horizontal OB portion, the lateral smear variation can be suppressed by reducing the clamp time constant for the line where the high luminance detection circuit 107a detects the high luminance portion.

高輝度検出時(206)はクランプ時定数を小さくすることにより、OB変動をすばやく吸収できるが、画面に横引きノイズが発生するため、高輝度部検出以外(205,207)は、充分に大きな時定数を用いることで、画面全体の品位を損なうことはない。   When high brightness is detected (206), the OB fluctuation can be absorbed quickly by reducing the clamp time constant. However, since horizontal noise is generated on the screen, it is sufficiently large except for detection of high brightness (205, 207). By using the time constant, the quality of the entire screen is not impaired.

また横スミアは図3に示すように高輝度被写体のレベル及び横幅に依存するため、高輝度検出には高輝度被写体のレベル及び横幅を検出方法が効果的である。   Further, as shown in FIG. 3, since the horizontal smear depends on the level and width of a high-brightness subject, the method for detecting the level and width of a high-brightness subject is effective for high-brightness detection.

図4は高輝度部検出回路の例である。1画素遅延素子401及びそれらの和を閾値検波404することで、高輝度被写体の幅及びレベルの検波に用いることが可能である。   FIG. 4 shows an example of a high luminance portion detection circuit. By performing threshold detection 404 on the one-pixel delay element 401 and the sum thereof, it can be used for detection of the width and level of a high-luminance subject.

また横スミアはAGCゲインが高い(低照度)ほど影響が大きいため、AGCゲインが低い充分照度の撮影時はクランプ時定数制御を行わないものとする。   In addition, since the lateral smear has a larger influence as the AGC gain is higher (low illuminance), the clamp time constant control is not performed when photographing with sufficient illuminance with a low AGC gain.

図5に制御のフローチャートを示す。
S101a:本制御は1H毎に制御を行う。
S102a:AGCゲインが所定の値より高いときにのみ、クランプ時定数制御を行う。AGCゲインが所定の値より低い場合は通常のクランプ時定数制御とする。
S103a:高輝度被写体のレベル及び横幅を検出する。閾値を超えていればクランプ時定数小を設定。閾値を超えていなければ、通常のクランプ時定数設定とする。
S104a:通常のクランプ時定数を設定する。
FIG. 5 shows a control flowchart.
S101a: This control is performed every 1H.
S102a: Clamp time constant control is performed only when the AGC gain is higher than a predetermined value. When the AGC gain is lower than a predetermined value, normal clamping time constant control is performed.
S103a: The level and width of a high-luminance subject are detected. If the threshold is exceeded, set a small clamp time constant. If the threshold is not exceeded, the normal clamping time constant is set.
S104a: A normal clamping time constant is set.

(実施例2)
実施例1では高輝度部検出をトリガーとしてクランプ時定数制御を実施したが、実施例2では、OB部の変動をクランプ時定数制御のトリガーとする。
(Example 2)
In the first embodiment, the clamp time constant control is performed using the detection of the high luminance portion as a trigger. In the second embodiment, the fluctuation of the OB portion is used as a trigger for the clamp time constant control.

本発明は例えば、図6に示すような撮像装置に適用される。
CMOSセンサ101aから得られた画像をAFEに入力し、AGC110b後に水平OBを用いて黒レベル補正104bを行う。その後ADC103bでデジタル変換された信号は、信号処理回路106bを通してビデオ信号として出力される。
The present invention is applied to, for example, an imaging apparatus as shown in FIG.
An image obtained from the CMOS sensor 101a is input to the AFE, and black level correction 104b is performed using the horizontal OB after the AGC 110b. Thereafter, the signal digitally converted by the ADC 103b is output as a video signal through the signal processing circuit 106b.

OB変動検出回路107bは、図2に示すOB変動201を検出し、変動があった時、横スミアが発生したものとし、クランプ時定数小を設定する。実施例1同様に、横スミアはAGCゲインが高い(低照度)ほど影響が大きいため、AGCゲインが低い充分照度の撮影時はクランプ時定数制御を行わないものとする。   The OB fluctuation detection circuit 107b detects the OB fluctuation 201 shown in FIG. 2, and when there is a fluctuation, it is assumed that a lateral smear has occurred and sets a small clamping time constant. As in the first embodiment, the lateral smear has a larger effect as the AGC gain is higher (low illuminance), and therefore, the clamp time constant control is not performed when photographing with sufficient illuminance with a low AGC gain.

本実施例では、CMOSセンサ撮像素子及びHD単位でクランプ時定数を可変可能な黒補正回路を有した撮像装置において、高輝度被写体検出時にクランプ時定数を小さくする制御を行うことを特徴とした撮像装置を特徴とする。また、上記撮像装置は、AGCゲインに応じてクランプ時定数制御を行うか否かを判断することを特徴とする。また、上記撮像装置は、OB領域の変動を検出して、クランプ時定数を制御することを特徴とする。   In this embodiment, in an imaging apparatus having a CMOS sensor imaging device and a black correction circuit capable of changing a clamp time constant in HD units, an image pickup is characterized in that control is performed to reduce the clamp time constant when a high-luminance subject is detected. Features the device. Further, the imaging apparatus determines whether to perform clamp time constant control according to the AGC gain. Further, the imaging apparatus is characterized by detecting a change in an OB region and controlling a clamp time constant.

以上説明したように、本実施例によれば、CMOS撮像素子を用いた撮像装置において、高輝度被写体撮影時の横帯(横スミア)を、被写体レベルに応じてOBクランプ時定数を制御することで抑制する。   As described above, according to the present embodiment, in the image pickup apparatus using the CMOS image pickup device, the horizontal band (lateral smear) at the time of photographing a high brightness subject is controlled according to the subject level. Suppress with.

第1の実施の形態において、本発明を適用した撮像装置の構成を示すブロック図である。1 is a block diagram illustrating a configuration of an imaging apparatus to which the present invention is applied in a first embodiment. 横スミア及びクランプ時定数制御を示した概念図である。It is the conceptual diagram which showed the horizontal smear and clamp time constant control. 高輝度被写体の横幅と横スミアレベルの関係を示した図である。It is the figure which showed the relationship between the horizontal width of a high-intensity subject and a horizontal smear level. 高輝度検出部の回路例である。It is an example of a circuit of a high-intensity detection part. 第1の実施形態の動作を説明するためのフローチャートである。It is a flowchart for demonstrating operation | movement of 1st Embodiment. 第2の実施の形態において、本発明を適用した撮像装置の構成を示すブロック図である。In 2nd Embodiment, it is a block diagram which shows the structure of the imaging device to which this invention is applied. 第2の実施形態の動作を説明するためのフローチャートである。It is a flowchart for demonstrating operation | movement of 2nd Embodiment.

符号の説明Explanation of symbols

201 OB部変動
202 OB領域
203 横スミア
204 高輝度被写体
401 1画素遅延素子
402 高輝度被写体の横幅指定
403 足し算回路
404 閾値検波回路
201 OB section change 202 OB area 203 horizontal smear 204 high brightness subject 401 1 pixel delay element 402 horizontal width designation of high brightness subject 403 addition circuit 404 threshold detection circuit

Claims (3)

CMOSセンサ撮像素子及びHD単位でクランプ時定数を可変可能な黒補正回路を有した撮像装置において、高輝度被写体検出時にクランプ時定数を小さくする制御を行うことを特徴とした撮像装置。   An image pickup apparatus having a CMOS sensor image pickup element and a black correction circuit capable of changing a clamp time constant in HD units, wherein control for reducing the clamp time constant is performed when a high-luminance subject is detected. 上記撮像装置は、AGCゲインに応じてクランプ時定数制御を行うか否かを判断することを特徴とする請求項1に記載の撮像装置。   The imaging apparatus according to claim 1, wherein the imaging apparatus determines whether to perform clamp time constant control according to an AGC gain. 上記撮像装置は、OB領域の変動を検出して、クランプ時定数を制御することを特徴とする請求項1に記載の撮像装置。   The imaging apparatus according to claim 1, wherein the imaging apparatus detects a change in an OB region and controls a clamp time constant.
JP2007165222A 2007-06-22 2007-06-22 Imaging device Pending JP2009005169A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013098845A (en) * 2011-11-02 2013-05-20 Olympus Corp Imaging apparatus and streaking correction method
JP2013102288A (en) * 2011-11-07 2013-05-23 Canon Inc Imaging apparatus and control method of the same
US10212370B2 (en) 2014-07-04 2019-02-19 Sharp Kabushiki Kaisha Solid-state image sensor and electronic information device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013098845A (en) * 2011-11-02 2013-05-20 Olympus Corp Imaging apparatus and streaking correction method
JP2013102288A (en) * 2011-11-07 2013-05-23 Canon Inc Imaging apparatus and control method of the same
US10212370B2 (en) 2014-07-04 2019-02-19 Sharp Kabushiki Kaisha Solid-state image sensor and electronic information device

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