JP2008236100A - Delay signal generating circuit - Google Patents

Delay signal generating circuit Download PDF

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JP2008236100A
JP2008236100A JP2007069805A JP2007069805A JP2008236100A JP 2008236100 A JP2008236100 A JP 2008236100A JP 2007069805 A JP2007069805 A JP 2007069805A JP 2007069805 A JP2007069805 A JP 2007069805A JP 2008236100 A JP2008236100 A JP 2008236100A
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delay
clock
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JP5092475B2 (en
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Manabu Noriyasu
学 則安
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Yokogawa Electric Corp
横河電機株式会社
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Abstract

PROBLEM TO BE SOLVED: To sequentially load delay data into a plurality of counters, down-count these counters with a reference clock, and enable the counter output at the timing when the count value reaches a predetermined value. In a delay signal generation circuit that generates a delay signal by synthesizing outputs, the number of counters must be increased in order to increase the upper limit of delay data that can continuously provide a delay trigger signal, and the number of registers. Solves the problem of a large increase in
A variable stage number shift register capable of changing the number of shift stages according to delay data is used, and the output of a counter is shifted by the variable stage number shift register. When increasing the upper limit of the delay data for which the delay trigger signal can be continuously given, the increase in registers can be greatly suppressed as compared with the conventional case.

[Selection] Figure 3

Description

  The present invention relates to a delay signal generation circuit capable of continuously generating a delay signal that is an integral multiple of a reference clock, and more particularly to a delay signal generation circuit suitable for use in a timing generator used in a semiconductor test apparatus or an arbitrary signal generation apparatus. It is.

  FIG. 4 shows a configuration of a timing generator capable of generating a delay signal that is an integral multiple of the reference clock. In FIG. 4, delay data having a width of k bits is input to the data terminals data of the counters 10a to 10n, and a reference clock is input to the clock terminals. A load signal is input from the interleave control unit 11 to the load terminal load. Usually, the value of k is 20 to 30, and the number of counters 10a to 10n (= the number of outputs of the interleave control unit 11) N is 4 to 5.

  The interleave control unit 11 receives a delay trigger signal and a reference clock, and outputs N load signals from lda to ldn. lda to ldn are signals that sequentially become high in this order. The interleave control unit 11 refers to the delay trigger signal at the falling timing of the reference clock, and when the delay trigger signal is at a high level (valid), the corresponding load signal is set to a high level (valid) for one cycle of the reference clock. To. This operation makes a round with N reference clocks.

  Upon receiving the load signal, the counters 10a to 10n take in the delay data at that time, and start down-counting at the timing of the reference clock. Then, in the next cycle where the count value is 1, or when the delay data is 0, the output end for one cycle of the reference clock is set to high level (valid) in the next cycle when the load signal becomes high level. The outputs end of the counters 10a to 10n are input to the OR gate 12. The OR gate 12 outputs a logical sum of these inputs. The delay data represents the time in units of the period of the reference clock from when the output of the interleave control unit 11 becomes high level until the delay signal is output.

  Next, the operation of this timing generator will be described based on the timing chart of FIG. FIG. 4A shows a reference clock, FIG. 3B shows delay data, and FIG. 3C shows a delay trigger signal. The delay data is initially 4 and changes to 5 at time t1, and this value is maintained. The delayed trigger signal is initially at a high level and changes to a low level at time t3.

  (D), (F), and (H) are the first to third load signals lda to ldc output from the interleave control unit 11, and are input to the counters 10a, 10b, and 10c (not shown), respectively. Since the delay trigger signal is high from the beginning to time t3, lda is high from the beginning to t1, ldb is high from t1 to t2, and ldc is high from t2 to t3. After ldd (not shown), there is no high level.

  (E), (G), and (I) are the count values of the counter 10a, the counter 10b, and the counter 10c, respectively. The counter 10a captures 4 of the delayed data at the rising edge of the reference clock while the load signal lda is at a high level, and counts down in synchronization with the rising edge of the reference clock. Similarly, the counter 10b and the counter 10c take in the delay data 5 at the rising edge of the reference clock while the load signal ldb and the load signal ldc are at the high level, respectively, and down-count in synchronization with the rising edge of the reference clock.

  (J) to (L) are the outputs of the counters 10a to 10c, respectively. Since the count value of the counter 10a changes from 1 to 0 at time t4, its output becomes high for one reference clock period from time t4 as shown in (J). Similarly, the count values of the counters 10b and 10c change from 1 to 0 at times t5 and t6, respectively, and thus become high for one reference clock period from time t5 and t6. The logical sum of the signals (J) to (L) is taken by the OR gate 12 to obtain the delayed signal (M).

  In this timing generator, assuming that the number of counters 10a to 10n is N, the cycle of the output of the interleave control unit 11 makes a round of N in units of the cycle of the reference clock. If delay data ≦ N, the count values of the counters 10a to 10n are always 0 within N hours (reference clock cycle unit), so that delay trigger signals can be continuously given. That is, the delay trigger signal can be constantly maintained at a high level. However, if the delay data> N, the counters 10a to 10n do not become 0 within the time N, so there is a restriction that the delay trigger signal cannot be applied for N hours or more (maintain a high level).

  Patent Document 1 describes an invention of a timing generator used in a semiconductor test apparatus. In the present invention, the circuit scale is reduced by using many registers instead of counters. The present invention will be described below with reference to FIGS. FIG. 6 is a block diagram of the timing generator. In FIG. 6, a counter 20 is a k-bit counter and is incremented by a reference clock. The count value of the counter 20 and the delay data are added by the adder 21. Reference numerals 22a, 22b,... 22n are registers, which are vertically connected. That is, the output of the adder 21 is input to the register 22a, and the output of the register 22a is input to the register 22b. Similarly, the output of the register 22n-1 is input to the register 22n.

  A delay trigger signal and a reference clock are input to the AND gate 23, and an output thereof is input to clock terminals of the registers 22a to 22n. For this reason, when the delay trigger signal is at a high level, the output of the adder 21 shifts the registers 22a to 22n at the timing of the reference clock.

  Reference numerals 24a to 24n denote k-bit EXNOR gates, to which the outputs of the registers 22a to 22n and the output of the counter 20 are input, respectively. The EXNOR gates 24a to 24n check whether or not the two input values are coincident with each other, and if they coincide with each other, the output is set to a high level. The outputs of the EXNOR gates 24 a to 24 n are input to the OR gate 25. The OR gate 25 outputs a logical sum of these inputs as a delay signal.

  Next, the operation of this timing generator will be described with reference to the timing chart of FIG. In FIG. 7, (A) to (C) are a reference clock, delay data, and a delay trigger signal, respectively. (D) is an output (count value) of the counter 20 and is incremented in synchronization with the reference clock.

  (E) to (G) are outputs of registers 22a, 22b, and 22c (not shown), respectively. Since the registers 22a to 22n shift the output of the adder 21 while the delay trigger signal is at a high level, the outputs of the registers 22a to 22n at the same time are shifted by one value. Since the delay trigger signal becomes low level at time t10, the outputs of the registers 22a to 22c after time t10 are fixed at 7, 6, and 5, respectively.

  (H) to (J) are outputs of EXNOR gates 24a, 24b, and 24c (not shown), respectively. Since these outputs become high level when the output of the counter 20 and the outputs of the registers 22a, 22b, and 22c coincide, they become high level for one reference clock period from time t13, t12, and t11, respectively. (K) is the output of the OR gate 25, and the same delayed signal as in FIG. 5 is obtained.

Since this timing generator compares the count value of the counter 20 with the value obtained by adding the count value and the delay data, the number of the registers 22a to 22n is N, and the delay trigger signal is expressed in units of the reference clock period ( If N + 1) or more are given continuously (always set to high level), these values will not match. Therefore, there is a restriction that the delay data ≦ N must be satisfied in order to continuously apply the delay trigger signal.
Japanese Utility Model Publication No. 7-26787

  However, in order to continuously provide the delay trigger signal, such a timing generator has a restriction that the delay data must be equal to or less than the number of the counters 10a to 10n or the registers 22a to 22n. In order to set N to N + 1, the number of counters in the timing generator of FIG. 4 must be increased, and the number of registers and EXNOR gates in the timing generator of FIG. 6 must be increased by one. This corresponds to an increase of k 1-bit registers. Increasing the number of registers increases the circuit scale, which in turn increases the cost of inspection and the power consumption of the circuit.

  In the conventional example of FIG. 6, the circuit scale is reduced by suppressing the increase of the counter, but since the increase of the register cannot be suppressed, there is still a problem that the circuit scale becomes large.

  Accordingly, an object of the present invention is to provide a delay signal generation circuit capable of increasing the range of delay data that can continuously provide a delay trigger signal with a smaller number of registers, based on the timing generator of FIG. It is to provide.

In order to solve such a problem, the invention according to claim 1 of the present invention,
A delay that receives delay data, a delay trigger signal, and a reference clock, generates a maximum of N (N> 0) signals based on these data and signals, and synthesizes these N signals to generate a delay signal In the signal generation circuit,
A second selection unit that receives the delay data and outputs data not greater than the delay data and not greater than m (m>0);
A first selection unit that receives the delay data and outputs data of (delayed data−output of the second selection unit);
An interleave control unit for sequentially outputting a maximum of N load signals synchronized with the reference clock during a period in which the delayed trigger signal and the reference clock are input;
One of the outputs of the first and second selectors, the reference clock, and the N load signals is input,
A counter that captures the output of the first selection unit during a period when the input load signal is valid, counts down in synchronization with the reference clock, and outputs a signal that becomes valid at a predetermined timing;
A shift control register that captures the output of the second selector during a period in which the load signal is valid, and holds the captured data;
Variable stage shift that receives the output of the shift control register, the output of the counter, and the reference clock, changes the number of shift stages according to the output of the shift control register, and shifts the output of the counter in synchronization with the reference clock Registers,
N delayed signal generators comprising:
A first OR gate that receives inputs of the N delay signal generation units and outputs a logical sum of these outputs;
Is provided. By suppressing the increase in the number of registers, it is possible to expand the delay data that can continuously provide the delay trigger signal to (N + m).

The invention according to claim 2 is the invention according to claim 1,
The first selection unit outputs (delay data-m) when the input delay data is greater than 1, otherwise outputs 0, and the second selection unit receives the input delay data of 1. When it is larger, m is output, and when it is not, input delay data is output. The configuration of the variable stage shift register can be simplified.

The invention according to claim 3 is the invention according to claim 1 or claim 2,
The counter is the next reference clock cycle in which the count value is 1 when the value fetched from the first selection unit is 1 or more, and the next reference clock cycle when the fetched value is 0 The output is enabled with. The same counter as before can be used.

The invention according to claim 4 is the invention according to any one of claims 1 to 3,
In the variable stage number shift register, the number of shift stages is changed from m to 0 by the output of the shift control register. The same counter as before can be used.

The invention according to claim 5 is the invention according to any one of claims 1 to 4,
The variable stage number shift register is:
An encoder having (m + 1) outputs to which the output of the shift control register is input, and one output is enabled by the input value;
A first AND gate to which the output of the counter and the most significant output of the encoder are input;
A first register for holding the output of the first AND gate in synchronization with a reference clock;
A second AND gate to which the output of the counter and the output of the encoder are input, and a second AND gate to which the output of the second AND gate and the output of the preceding block (the first register in the initial block) are input An (m-1) block composed of an OR gate and a second register that holds the output of the second OR gate in synchronization with the reference clock, and outputs the output of the second register; ,
A third AND gate to which the output of the counter and the lowest output of the encoder are input;
A third OR gate to which the output of the last block (the first register when m = 1) of the third AND gate and the block is input;
It is made up of. The configuration of the variable stage shift register can be simplified.

The invention according to claim 6 is the invention according to any one of claims 1 to 5,
The shift control register delays the output of the second selection unit by one reference clock when the output of the first selection unit is not 0 or when the output of the input interleave control unit is not valid. It is a thing. Even if the data loaded into the counter is N continuously, no malfunction occurs.

The invention according to claim 7 is the invention according to any one of claims 1 to 6,
The value of m is 1. Delay data for which a delay trigger signal can be continuously given can be expanded by one.

As is apparent from the above description, the present invention has the following effects.
According to the first, second, third, fourth, fifth, sixth and seventh aspects of the present invention, delay data, a delay trigger signal, and a reference clock are input, and a maximum N (N> 0) based on these data and signals. In a delay signal generation circuit that generates a number of signals and generates a delay signal by synthesizing these N signals, the output of the counter that generates the signal is a variable stage number shift register in which the number of shift stages varies depending on the value of the delay data The counter output is shifted by this variable stage shift register.

  When increasing the upper limit of the delay data to which the delay trigger signal can be continuously given, there is an effect that the number of registers can be greatly suppressed as compared with the conventional example of FIG. Therefore, an increase in circuit scale is reduced, and manufacturing costs and inspection costs can be reduced. In addition, it is easy to generate a delay signal at a high frequency, and there is also an effect that it is possible to easily cope with an increase in the speed of the semiconductor test apparatus.

  Hereinafter, the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of a delayed signal generating circuit according to the present invention. The same elements as those in FIG. 4 are denoted by the same reference numerals, and description thereof is omitted. In this embodiment, the upper limit of the delay data that can be continuously given can be increased by 1 compared to the conventional example of FIG. Note that the delay trigger signal, the interleave control unit 11, the counter 31, and the encoder 33d output are valid at a high level.

  In FIG. 1, reference numerals 20 and 21 denote selection units, to which delay data having a bit width of k bits is input. The selection unit 20 outputs (delay data-1) when the input delay data is greater than 1, and outputs 0 in other cases. The selector 21 outputs 1 when the input delay data is greater than 1, and outputs the delay data itself in other cases. The output width of the selection unit 20 is k bits, and the output width of the selection unit 21 is 1 bit. The selection units 20 and 21 can be realized by a combinational circuit, and do not include a register inside.

  Reference numerals 30a to 30n denote delay signal generation units, which are used in the number N and have the same configuration. The delayed signal generators 30a to 30n receive lda to ldn as outputs of the interleave controller 11, the outputs of the selectors 20 and 21, and the reference clock, respectively, and output signals enda to endn. The signals enda to endn are input to the OR gate 12. The OR gate 12 outputs a logical sum of the input signals. Hereinafter, the delay signal generation unit 30a will be described, and description of the delay signal generation units 30b to 30n will be omitted.

  The delay signal generation unit 30 a includes a counter 31, a shift control register 32, and a variable stage number shift register 33. The counter 31 is a k-bit counter. The output of the selection unit 20 is input to the data terminal data, lda which is one of the outputs of the interleave control unit 11 is input to the load terminal load, and the reference clock is input to the clock terminal. The output end is input to the hold terminal. The counter 31 performs the same operation as the counters 10a to 10n of the conventional example of FIG. That is, when lda is at a high level, the output of the selection unit 20 is captured in synchronization with the rising edge of the reference clock, and the count down is performed in synchronization with the reference clock. Then, in the next cycle where the count value is 1, or when the output of the selection unit 20 is 0, the output end for one period of the reference clock is set to the high level in the next cycle when lda becomes the high level.

  The shift control register 32 includes registers 32a and 32c and a selector 32b. The load signal lda is input to the enable terminal EN of the register 32a, the output of the selection unit 21 is input to the data terminal D, the reference clock is input to the clock terminal, and the output Q is input to the input terminal IN2 of the selector 32b. The output of the selection unit 21 is input to the input terminal IN1. The output of the selection unit 20 is input to the select terminal S1 of the selector 32b, and the load signal lda is input to the select terminal S2. The output Q of the selector 32b is input to the data terminal D of the register 32c, the reference clock is input to the clock terminal, and the output Q becomes the output of the shift control register 32.

  The register 32a holds the output of the selection unit 21 at the rising edge of the reference clock when the load signal lda is at a high level. The selector 32b selects and outputs the output of the selector 21 when the output of the selector 20 is 0 and the load signal lda is at a high level, and the output of the register 32a otherwise. The register 32c holds the output of the selector 32b at the rising edge of the reference clock. That is, the shift control register 32 has a function of holding the output of the selection unit 21 when the load signal lda is at a high level and delaying one reference clock when the output of the selection unit 20 is not zero.

  The variable stage shift register 33 includes an AND gate 33a, a register 33b, an ANDOR gate 33c, and an encoder 33d. The AND gate 33a receives the output end of the counter 31 and the output e1 of the encoder 33d, and the output is input to the data terminal D of the register 33b. The reference clock is input to the clock terminal of the register 33b.

  The ANDOR gate 33c is a gate combining an AND gate and an OR gate, and has a configuration in which the output of the AND gate is input to one of the inputs of the OR gate. The output Q of the register 33b is input to the OR gate of the ANDOR gate 33c, and the output end of the counter 31 and the output e0 of the encoder 33d are input to the AND gate. The output of the ANDOR gate 33c is the output of the variable stage number register 33, and becomes the output enda of the delay signal generation unit 30a.

  The output of the shift control register 32 is input to the encoder 33d. The encoder 33d sets the output e1 to the high level and the output e0 to the low level when the output of the shift control register 32 is 1, and sets the output e1 to the low level and the output e0 to the high level when the output is 0. The variable stage number shift register 33 functions as a one-stage or zero-stage shift register.

  Next, the operation of this embodiment will be described with reference to the time chart of FIG. In FIG. 2, (A) is a reference clock, and (B) is delay data input to the selection units 20 and 21. The delay data is set to N + 1 (N> 0). (C) is a delay trigger signal input to the interleave control unit 11, and maintains a high level. That is, a constant delay trigger signal is given. (D) and (E) are the outputs of the selection units 20 and 21, respectively. Since the delay data is greater than 1, the output of the selection unit 1 is N and the output of the selection unit 2 is 1.

  (F) is lda output from the interleave control unit 11 and is input to the load terminal load of the counter 31. The counter 31 takes in the output (N) of the selection unit 20 at the rising edge of the reference clock (time t20, t21) when the lda is at a high level, and then counts down in synchronization with the rising edge of the reference clock. (G) is the count value of the counter 31, and (H) is the output of the counter 31. (H) becomes 1 at the next reference clock cycle with a count value of 1. As shown in (G), since the output of the selection unit 20 is loaded again at this time, the count value of the counter 31 becomes N.

  (I) is the register 32a output, and (J) is the register 32c output. Since the delay data is greater than 1, the output of the selector 21 is 1. The register 32a takes in this 1 at time t20. Since the selector 32b selects the output of the register 32a, the register 32c takes in the output of the register 32a at the next rising edge of the reference clock.

  When the output of the selection unit 20 is N, the data shifted by the variable stage number shift register 33 is the data of the previous cycle of the interleave control unit 11. Therefore, the output of the selection unit 21 in the previous cycle must be saved. Since the output of the register 32a changes only when the load signal lda is at a high level, the register 32c delays the output of the selection unit 21 by one reference clock cycle, so that the data of the previous cycle can be stored.

  (K) is the output of the register 33b. Since the output of the register 32c is 1, the output e1 of the encoder 33d is high and e0 is low. Since the output end of the counter 31 is input to the data terminal D of the register 33b, the register 33b takes in the output end at the rising edge of the reference clock. Since e0 is at a low level, the output end is blocked by the ANDOR gate 33c, the output of the register 33b becomes the output enda of the delay signal generation unit 30a, and this enda is input to the OR gate 12. That is, the variable stage number shift register 33 operates as a one-stage shift register.

  Similarly, the outputs endb and endc of the delay signal generation units 30 b and 30 c are generated and input to the OR gate 12. The OR gate 12 outputs a logical sum of these inputs as a delay signal. (N) is a delay signal. Since the N outputs of the interleave control unit 11 are output with a shift of one reference clock, the delay signal generation units 30a to 30n operate with a shift of one reference clock cycle.

  The time chart in FIG. 2 is for the case where the delay data is N + 1, but the same applies even if the delay data is N or less. When the delay data is 0, the output of the selection unit 21 is 0. The variable stage number shift register 33 operates as a zero stage shift register. Further, when the output of the selection unit 20 is 0 (delay data ≦ 1), if the output of the selection unit 21 is delayed by one reference clock by the shift control register 32, the operation may be hindered. Therefore, the register 32a is skipped by the selector 32b.

  In this embodiment, the same counter as the conventional example in FIG. 4 is used as the counter 31. However, the timing at which the output end of the counter 31 becomes 1 can be changed by adjusting the number of shift stages of the variable stage shift register 33. . For example, when the timing at which the output end becomes 1 is advanced by one reference clock cycle and a counter whose output end becomes 1 when the count value becomes 1 is used, the shift stage number of the variable stage shift register 33 is increased by one stage. Just do it.

  In this embodiment, the output of the counter 31 is delayed using the variable stage number shift register 33. Therefore, even if it is delay data N + 1, a delay trigger signal can be given continuously. Since one delay signal generation unit can be composed of (k + 3) registers, the entire delay signal generation unit requires (k + 3) × N registers. In the conventional example shown in FIG. 4, in order to continuously provide the (N + 1) delay trigger signal, the counter must be incremented by one, so that k × (N + 1) registers are required. Therefore, if k = 20 and N = 4, the number of registers can be reduced by eight.

  FIG. 3 shows another embodiment of the present invention. In this embodiment, the upper limit of the delay data that can continuously give the delay trigger signal is extended to (N + m). In addition, the same code | symbol is attached | subjected to the same element as FIG. 1, and description is abbreviate | omitted. It is assumed that the delay trigger signal, the interleave control unit 11, the counter 31, and the encoder 52q output are valid at a high level.

  In FIG. 3, reference numerals 40 and 41 denote selection units, to which k-bit delay data is input, respectively. The selector 40 outputs (delay data−m) when the input delay data is larger than m (m> 0), and outputs 0 when it is equal to m or smaller than m. The selection unit 41 outputs m when the input delay data is larger than m, and outputs the delay data itself when equal or smaller. The bit width of the output of the selection unit 40 is k, and the bit width of the output of the selection unit 41 is a width that can be expressed by m (= k2).

  Reference numerals 50a to 50n denote delay signal generation units, which receive the outputs of the selection units 40 and 41, the outputs lda to ldn of the interleave control unit 11 and the reference clock, and the outputs thereof are input to the OR gate 12. Lda is input to the delay signal generation unit 50a, ldb is input to 50b, and ldn is input to 50n. Since the delay signal generation units 50a to 50n have the same configuration, only the delay signal generation unit 50a will be described, and description of the other delay signal generation units will be omitted.

  The delay signal generation unit 50 a includes a counter 31, a shift control register 51, and a variable stage number shift register 52. The output of the selection unit 40 is input to the data terminal data of the counter 31, and lda that is the output of the interleave control unit 11 is input to the load terminal load. The reference clock is input to the clock terminal, and the output end is input to the hold terminal hold. The operation of the counter 31 is the same as that in the embodiment of FIG.

  Reference numeral 51 denotes a k2 bit shift control register, which is an extension of the shift control register 32 of FIG. 1 to k2 bits. The description is omitted because it is the same as the shift control register 32 except that the number of bits is k2.

  The variable stage number shift register 52 is composed of an AND gate 52a, a register 52b, m-1 blocks 52c to 52n, an ANDOR gate 52p, and an encoder 52q, which are connected in series and configured by ANDOR gates and registers.

  The output of the shift control register 51 is input to the encoder 52q. The encoder 52q outputs m + 1 signals em to e0. When the input value is m, only the output em is at a high level. Similarly, when the input values are m-1 to 0, only the outputs em-1 to e0 are at a high level, respectively.

  The AND gate 52a receives the counter 31 output end and the encoder 52q output em. The output of the AND gate 52a is input to the data terminal D of the register 52b, the reference clock is input to the clock terminal, and the output is input to the OR gate of the ANDOR gate in the block 52c.

  Outputs end of the counter 31 are input to one input terminal of the AND gates constituting the ANDOR gates in the blocks 52c to 52n, and outputs em-1 to e0 of the encoder 52q are input to the other input terminals, respectively. Further, the register output in the preceding block (the register 52b output in the block 52c) is input to the OR gate of the ANDOR gate in these blocks.

  The output of the ANDOR gate of the same block is input to the data terminal D of the registers in the blocks 52c to 52n, and the reference clock is input to the clock terminal. The output end of the counter 31 is input to one input terminal of the AND gate constituting the ANDOR gate 52p, the output e0 of the encoder 52q is input to the other input terminal, and the register e in the block 52n is input to the OR gate input terminal. Output is input.

  The output of the ANDOR gate 52p becomes the output enda of the delay signal generator 50a. The variable stage number shift register 52 delays the output end of the counter 31 by m to 0 cycles of the reference clock according to the output of the shift control register 51. The outputs enda to endn of the delay signal generators 50 a to 50 n are input to the OR gate 12. The OR gate 12 outputs a logical sum signal of the input signals.

  In this embodiment, the maximum value of the delay data to which the delay trigger signal can be continuously given is (N + m), which is increased by m. In the conventional example of FIG. 4, in order to increase m, m counters must be increased, so the number of registers increases by k × m (k is the number of bits of delayed data). In the embodiment of FIG. 3, the number of register increases in one delay signal generation unit is k2 × 2 in the shift control register and m in the variable stage shift register. Since the number of delay signal generation units is N, the increase in registers is (k2 × 2 + m) × N. If k = 20, N = 4, and m = 4, the increase in the conventional example is 20 × 4 = 80, whereas in the embodiment of FIG. 3, the increase is (2 × 2 + 4) × 4 = 32. Thus, the increase can be reduced to 40%.

  In this embodiment, the timing at which the output end of the counter 31 becomes 1 can also be changed by adjusting the number of shift stages of the variable stage shift register 52. For example, when the timing at which the output end becomes 1 is advanced by one reference clock cycle and a counter whose output end becomes 1 when the count value becomes 1 is used, the shift stage number of the variable stage shift register 52 is increased by one stage. Just do it.

It is a block diagram which shows one Example of this invention. It is a time chart for demonstrating operation | movement of the Example of this invention. It is a block diagram which shows the other Example of this invention. It is a block diagram of the conventional timing generator. 4 is a time chart for explaining the operation of the conventional example. It is a block diagram of the conventional timing generator. 6 is a time chart for explaining the operation of the conventional example.

Explanation of symbols

11 Interleave control unit 12 OR gates 20, 21, 40, 41 Selection units 30a-30n, 50a-50n Delay signal generation unit 31 Counter 32, 51 Shift control registers 33a, 52a AND gates 32a, 32c, 33b, 51a, 51c, 52b Register 32b, 51b Selector 33c, 52p ANDOR gate 33d, 52q Encoder 52c to 52n Block lda to ldn Output of interleave control unit 11 Enda to endn Output of delay signal generation unit

Claims (7)

  1. A delay that receives delay data, a delay trigger signal, and a reference clock, generates a maximum of N (N> 0) signals based on these data and signals, and synthesizes these N signals to generate a delay signal In the signal generation circuit,
    A second selection unit that receives the delay data and outputs data not greater than the delay data and not greater than m (m>0);
    A first selection unit that receives the delay data and outputs data of (delayed data−output of the second selection unit);
    An interleave control unit for sequentially outputting a maximum of N load signals synchronized with the reference clock during a period in which the delayed trigger signal and the reference clock are input;
    One of the outputs of the first and second selectors, the reference clock, and the N load signals is input,
    A counter that captures the output of the first selection unit during a period when the input load signal is valid, counts down in synchronization with the reference clock, and outputs a signal that becomes valid at a predetermined timing;
    A shift control register that captures the output of the second selector during a period in which the load signal is valid, and holds the captured data;
    Variable stage shift that receives the output of the shift control register, the output of the counter, and the reference clock, changes the number of shift stages according to the output of the shift control register, and shifts the output of the counter in synchronization with the reference clock Registers,
    N delayed signal generators comprising:
    A first OR gate that receives inputs of the N delay signal generation units and outputs a logical sum of these outputs;
    A delay signal generating circuit comprising:
  2.   The first selection unit outputs (delay data-m) when the input delay data is greater than 1, otherwise outputs 0, and the second selection unit receives the input delay data of 1. 2. The delay signal generation circuit according to claim 1, wherein m is output when larger, and the input delay data is output otherwise.
  3.   The counter is the next reference clock cycle in which the count value is 1 when the value fetched from the first selection unit is 1 or more, and the next reference clock cycle when the fetched value is 0 3. The delay signal generation circuit according to claim 1, wherein the output is made effective at the time.
  4.   4. The delay signal generating circuit according to claim 1, wherein the variable stage number shift register changes the number of shift stages from m stages to 0 stages according to an output of the shift control register.
  5. The variable stage number shift register is:
    An encoder having (m + 1) outputs to which the output of the shift control register is input, and one output is enabled by the input value;
    A first AND gate to which the output of the counter and the most significant output of the encoder are input;
    A first register for holding the output of the first AND gate in synchronization with a reference clock;
    A second AND gate to which the output of the counter and the output of the encoder are input, and a second AND gate to which the output of the second AND gate and the output of the preceding block (the first register in the initial block) are input An (m-1) block composed of an OR gate and a second register that holds the output of the second OR gate in synchronization with the reference clock, and outputs the output of the second register; ,
    A third AND gate to which the output of the counter and the lowest output of the encoder are input;
    A third OR gate to which the output of the last block (the first register when m = 1) of the third AND gate and the block is input;
    5. The delay signal generation circuit according to claim 1, wherein the delay signal generation circuit is configured as follows.
  6.   The shift control register delays the output of the second selection unit by one reference clock when the output of the first selection unit is not 0 or when the output of the input interleave control unit is not valid. 6. The delay signal generation circuit according to claim 1, wherein the delay signal generation circuit is configured as described above.
  7.   7. The delay signal generation circuit according to claim 1, wherein the value of m is 1.
JP2007069805A 2007-03-19 2007-03-19 Delay signal generation circuit Expired - Fee Related JP5092475B2 (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09145798A (en) * 1995-11-24 1997-06-06 Yokogawa Electric Corp Timing signal generator
JPH09184877A (en) * 1995-12-28 1997-07-15 Ando Electric Co Ltd Timing generator circuit
JPH11304888A (en) * 1998-04-17 1999-11-05 Advantest Corp Semiconductor testing device
JP2003345457A (en) * 2002-05-30 2003-12-05 Sony Corp Timing generator circuit, display device and portable terminal

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09145798A (en) * 1995-11-24 1997-06-06 Yokogawa Electric Corp Timing signal generator
JPH09184877A (en) * 1995-12-28 1997-07-15 Ando Electric Co Ltd Timing generator circuit
JPH11304888A (en) * 1998-04-17 1999-11-05 Advantest Corp Semiconductor testing device
JP2003345457A (en) * 2002-05-30 2003-12-05 Sony Corp Timing generator circuit, display device and portable terminal

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