JP2008218758A5 - - Google Patents

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Publication number
JP2008218758A5
JP2008218758A5 JP2007054957A JP2007054957A JP2008218758A5 JP 2008218758 A5 JP2008218758 A5 JP 2008218758A5 JP 2007054957 A JP2007054957 A JP 2007054957A JP 2007054957 A JP2007054957 A JP 2007054957A JP 2008218758 A5 JP2008218758 A5 JP 2008218758A5
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Japan
Prior art keywords
bumps
semiconductor elements
substrate
rows
resin adhesive
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JP2007054957A
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Japanese (ja)
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JP2008218758A (en
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Priority to JP2007054957A priority Critical patent/JP2008218758A/en
Priority claimed from JP2007054957A external-priority patent/JP2008218758A/en
Publication of JP2008218758A publication Critical patent/JP2008218758A/en
Publication of JP2008218758A5 publication Critical patent/JP2008218758A5/ja
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Claims (9)

主面の周縁部を構成する各辺部にそれぞれ1列以上の配列構成で形成されたバンプを有し、前記各辺部のうちの少なくとも1つの所定の辺部に形成された前記バンプが、前記各辺部のうちの他の辺部に形成された前記バンプの列数よりも多い列数で設けられた複数個の半導体素子と、
前記各半導体素子の前記バンプに対応する位置に設けられた電極端子を有する基板と、
前記半導体素子ごとに設けられ、前記各半導体素子の前記バンプと前記基板の前記電極端子とを電気的に接続した状態で前記各半導体素子を前記基板上に接着する各樹脂接着層と、を備え、
前記各樹脂接着層は、前記各半導体素子の前記所定の辺部からのはみ出し量が、前記他の辺部からのはみ出し量よりも小さく、
前記各半導体素子は、前記樹脂接着層のはみ出し量が小さい前記所定の辺部同士が隣接する配置で実装されている
ことを特徴とする電子回路実装構造体。
It has bumps formed in an array configuration of one or more rows on each side part constituting the peripheral part of the main surface, and the bumps formed on at least one predetermined side part of each of the side parts, a plurality of semiconductor element and the were found provided with more columns than columns of the bumps formed on the other side portion of the respective side portions,
A substrate having electrode terminals provided at positions corresponding to the bumps of the semiconductor elements;
A resin adhesive layer that is provided for each of the semiconductor elements and that bonds the semiconductor elements onto the substrate in a state where the bumps of the semiconductor elements and the electrode terminals of the substrate are electrically connected to each other; ,
Each of the resin adhesive layers has an amount of protrusion from the predetermined side of each semiconductor element smaller than an amount of protrusion from the other side,
Each of the semiconductor elements is mounted in an arrangement in which the predetermined side portions where the protruding amount of the resin adhesive layer is small are adjacent to each other.
主面の周縁部を構成する各辺部にそれぞれ1列以上の配列構成で形成されたバンプを有し、前記各辺部のうちの少なくとも1つの所定の辺部に形成された前記バンプが、前記各辺部のうちの他の辺部に形成された前記バンプの配列ピッチよりも短い配列ピッチで設けられた複数個の半導体素子と、
前記各半導体素子の前記バンプに対応する位置に設けられた電極端子を有する基板と、
前記半導体素子ごとに設けられ、前記各半導体素子の前記バンプと前記基板の前記電極端子とを電気的に接続した状態で前記各半導体素子を前記基板上に接着する各樹脂接着層と、を備え、
前記各樹脂接着層は、前記各半導体素子の前記所定の辺部からのはみ出し量が、前記他の辺部からのはみ出し量よりも小さく、
前記各半導体素子は、前記樹脂接着層のはみ出し量が小さい前記所定の辺部同士が隣接する配置で実装されている
ことを特徴とする電子回路実装構造体。
It has bumps formed in an array configuration of one or more rows on each side part constituting the peripheral part of the main surface, and the bumps formed on at least one predetermined side part of each of the side parts, A plurality of semiconductor elements provided at an arrangement pitch shorter than the arrangement pitch of the bumps formed on the other side of each of the sides;
A substrate having electrode terminals provided at positions corresponding to the bumps of the semiconductor elements;
A resin adhesive layer that is provided for each of the semiconductor elements and that bonds the semiconductor elements onto the substrate in a state where the bumps of the semiconductor elements and the electrode terminals of the substrate are electrically connected to each other; ,
Each of the resin adhesive layers has an amount of protrusion from the predetermined side of each semiconductor element smaller than an amount of protrusion from the other side,
Wherein each of the semiconductor element, the resin adhesive layer in the outside electricity quantity is less the predetermined side portions you wherein <br/> that are mounted in an arrangement that neighboring sub-circuit mounting structure.
前記半導体素子の少なくとも1個においては、前記樹脂接着層のはみ出し量が小さい前記所定の辺部に形成された前記バンプにダミーバンプが含まれ、且つ前記ダミーバンプを含む前記バンプが2列以上で、かつ千鳥状に配置されており、
前記基板の前記電極端子は、前記ダミーバンプ以外の前記バンプに対応する位置に設けられている
ことを特徴とする請求項1もしくは2のいずれかに記載の電子回路実装構造体。
In at least one of the semiconductor elements, a dummy bump is included in the bump formed on the predetermined side where the protruding amount of the resin adhesive layer is small, and the bump including the dummy bump is in two or more rows, and Arranged in a staggered pattern,
The electronic circuit mounting structure according to any one of claims 1 and 2 , wherein the electrode terminal of the substrate is provided at a position corresponding to the bump other than the dummy bump .
前記樹脂接着層は、その材料が絶縁性の熱硬化型樹脂または異方導電性樹脂からなることを特徴とする請求項1ないし3のいずれかに記載の電子回路実装構造体。4. The electronic circuit mounting structure according to claim 1, wherein the resin adhesive layer is made of an insulating thermosetting resin or anisotropic conductive resin. 主面の周縁部を構成する各辺部にそれぞれ1列以上の配列構成で形成されたバンプを有し、前記各辺部のうちの少なくとも1つの所定の辺部に形成された前記バンプが、前記各辺部のうちの他の辺部に形成された前記バンプの列数よりも多い列数で設けられた複数個の半導体素子と、
前記各半導体素子の前記バンプに対応する位置に設けられた電極端子を有する基板と、
前記半導体素子ごとに設けられ、前記各半導体素子の前記バンプと前記基板の前記電極端子とを電気的に接続した状態で前記各半導体素子を前記基板上に接着する各樹脂接着層と、を備え、
前記各半導体素子は、前記バンプが他の辺部よりも多い列数で設けられた辺部同士が隣接する配置で実装されている
ことを特徴とする電子回路実装構造体。
It has bumps formed in an array configuration of one or more rows on each side part constituting the peripheral part of the main surface, and the bumps formed on at least one predetermined side part of each of the side parts, A plurality of semiconductor elements provided with a larger number of rows than the number of rows of the bumps formed on the other sides of the sides;
A substrate having electrode terminals provided at positions corresponding to the bumps of the semiconductor elements;
A resin adhesive layer that is provided for each of the semiconductor elements and that bonds the semiconductor elements onto the substrate in a state where the bumps of the semiconductor elements and the electrode terminals of the substrate are electrically connected to each other; ,
Each of the semiconductor elements is mounted in an arrangement in which the side portions where the bumps are provided in more rows than the other side portions are adjacent to each other.
An electronic circuit mounting structure characterized by that.
前記半導体素子の少なくとも1個においては、前記バンプが他の辺部よりも多い列数で設けられた辺部の前記バンプにダミーバンプが含まれ、且つ前記ダミーバンプを含む前記バンプが2列以上で、かつ千鳥状に配置されており、In at least one of the semiconductor elements, the bumps on the side portions where the bumps are provided in more rows than the other side portions include dummy bumps, and the bumps including the dummy bumps are in two or more rows, And it is arranged in a staggered pattern,
前記基板の前記電極端子は、前記ダミーバンプ以外の前記バンプに対応する位置に設けられているThe electrode terminal of the substrate is provided at a position corresponding to the bump other than the dummy bump.
ことを特徴とする請求項5記載の電子回路実装構造体。6. An electronic circuit mounting structure according to claim 5, wherein
主面の周縁部を構成する各辺部にそれぞれ1列以上の配列構成で形成されたバンプを有し、前記各辺部のうちの少なくとも1つの所定の辺部に形成された前記バンプが、前記各辺部のうちの他の辺部に形成された前記バンプの配列ピッチよりも短い配列ピッチで設けられた複数個の半導体素子と、
前記各半導体素子の前記バンプに対応する位置に設けられた電極端子を有する基板と、
前記半導体素子ごとに設けられ、前記各半導体素子の前記バンプと前記基板の前記電極端子とを電気的に接続した状態で前記各半導体素子を前記基板上に接着する各樹脂接着層と、を備え、
前記各半導体素子は、前記バンプが他の辺部よりも短い配列ピッチで設けられた辺部同士が隣接する配置で実装されている
ことを特徴とする電子回路実装構造体。
It has bumps formed in an array configuration of one or more rows on each side part constituting the peripheral part of the main surface, and the bumps formed on at least one predetermined side part of each of the side parts, A plurality of semiconductor elements provided at an arrangement pitch shorter than the arrangement pitch of the bumps formed on the other side of each of the sides;
A substrate having electrode terminals provided at positions corresponding to the bumps of the semiconductor elements;
A resin adhesive layer that is provided for each of the semiconductor elements and that bonds the semiconductor elements onto the substrate in a state where the bumps of the semiconductor elements and the electrode terminals of the substrate are electrically connected to each other; ,
Each of the semiconductor elements is mounted in such a manner that the side portions where the bumps are provided at an arrangement pitch shorter than the other side portions are adjacent to each other.
An electronic circuit mounting structure characterized by that.
前記半導体素子の少なくとも1個においては、前記バンプが他の辺部よりも短い配列ピッチで設けられた辺部の前記バンプにダミーバンプが含まれ、且つ前記ダミーバンプを含む前記バンプが2列以上で、かつ千鳥状に配置されており、In at least one of the semiconductor elements, dummy bumps are included in the bumps on the sides where the bumps are provided at an arrangement pitch shorter than the other sides, and the bumps including the dummy bumps are in two or more rows, And it is arranged in a staggered pattern,
前記基板の前記電極端子は、前記ダミーバンプ以外の前記バンプに対応する位置に設けられているThe electrode terminal of the substrate is provided at a position corresponding to the bump other than the dummy bump.
ことを特徴とする請求項7記載の電子回路実装構造体。The electronic circuit mounting structure according to claim 7.
前記樹脂接着層は、その材料が絶縁性の熱硬化型樹脂または異方導電性樹脂からなることを特徴とする請求項5ないし8のいずれかに記載の電子回路実装構造体。9. The electronic circuit packaging structure according to claim 5, wherein the resin adhesive layer is made of an insulating thermosetting resin or anisotropic conductive resin.
JP2007054957A 2007-03-06 2007-03-06 Electronic circuit mounting structure Withdrawn JP2008218758A (en)

Priority Applications (1)

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JP2007054957A JP2008218758A (en) 2007-03-06 2007-03-06 Electronic circuit mounting structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007054957A JP2008218758A (en) 2007-03-06 2007-03-06 Electronic circuit mounting structure

Publications (2)

Publication Number Publication Date
JP2008218758A JP2008218758A (en) 2008-09-18
JP2008218758A5 true JP2008218758A5 (en) 2009-11-12

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010278318A (en) 2009-05-29 2010-12-09 Renesas Electronics Corp Semiconductor device
WO2015056430A1 (en) * 2013-10-16 2015-04-23 パナソニック株式会社 Semiconductor device
JP5770258B2 (en) * 2013-12-20 2015-08-26 ルネサスエレクトロニクス株式会社 Manufacturing method of semiconductor device
JP6394021B2 (en) * 2014-03-20 2018-09-26 富士通株式会社 Electronic device, method for manufacturing electronic device, and method for manufacturing electronic component
KR20210051535A (en) 2019-10-30 2021-05-10 삼성전자주식회사 Semiconductor package and method for fabricating the same

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