JP2008217232A - Analysis device, analysis method, and analysis program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an analysis processing technology using a finite element method for reducing a processing load in analysis processing, and for improving analysis precision. <P>SOLUTION: This analysis device for executing the finite element analysis of a finite element model is provided with: an attribute information acquisition means for acquiring attribute information of elements composing the finite element model from the finite element model; a distortion information setting means for acquiring distortion information corresponding to the attribute information acquired by the attribute information acquisition means from a distortion information storage means in which the distortion information related to a distortion value preliminarily calculated for each piece of attribute information is stored so as to correspond to the attribute information, and for setting the acquired distortion information as the distortion information of the elements whose attribute information has been acquired; and an analyzing means for executing the finite element analysis processing of the finite element model on the basis of the distortion information set by the distortion information setting means. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to an analysis apparatus that executes finite element analysis of a finite element model, an analysis method of a finite element model, and an analysis program that causes an analysis apparatus to execute finite element analysis of a finite element model.

For example, in vehicle development, it is known to apply static and dynamic loads to parts (analysis objects) and analyze displacement and stress using a finite element method (for example, see Patent Document 1). .)
JP 2006-163625 A JP 2004-101228 A

  In the conventional analysis technique using the finite element method, it is necessary to divide the analysis object into predetermined regions and change settings such as a limit strain value according to the size of the divided elements. That is, even when there is only one analysis object, if the element sizes are different, it is necessary to set a limit strain value for each different element size. This is because the occurrence of stress concentration and the elongation for each element differ depending on the size of the element, and unless the limit strain value is set for each element, the error in analysis accuracy becomes large. For example, a case where the element size is 5 mm square and a case where the element size is 1 mm square will be compared in the case where the entire analysis object is extended (displaced) by 1 mm. When the element size is 5 mm, the strain is ε = 6/5, and the value is small. When the element size is 1 mm, the strain is ε = 2/1, and the value is 5 mm. It will be considerably larger than This is because the value of the distortion generated varies depending on the size of the element. However, performing the analysis by resetting the limit strain value for each element having a different size has a large burden on the analysis processing. Although the analysis accuracy can be improved by reducing the size of the divided elements, this increases the amount of analysis processing and increases the processing load.

  In view of the above problems, an object of the present invention is to provide an analysis processing technique using a finite element method capable of reducing the processing load in the analysis processing and improving the analysis accuracy.

  In the present invention, in order to solve the above-described problem, distortion information corresponding to the element attribute information is obtained in advance as a database, distortion information suitable for the target element is acquired from the database, and the acquired distortion information is used. The analysis object was analyzed.

  Specifically, the present invention is an analysis apparatus for performing a finite element analysis of a finite element model, the attribute information acquisition means for acquiring attribute information of elements constituting the finite element model from the finite element model, The distortion information corresponding to the attribute information acquired by the attribute information acquisition means is acquired from the distortion information storage means in which distortion information relating to the distortion value obtained in advance for each attribute information so as to correspond to the attribute information is acquired. A strain information setting unit that sets the acquired strain information as strain information of the element from which the attribute information has been acquired, and executes a finite element analysis process of the finite element model based on the strain information set by the strain information setting unit Analyzing means.

In the present invention, distortion information related to the distortion value corresponding to the attribute information of the element is obtained in advance by experiments or the like, stored as distortion information in the distortion information storage means, and distortion information suitable for the target element is acquired from the distortion information storage means. And is set as element distortion information. As a result, it is possible to reduce the processing load related to the setting of the distortion value that has been reset according to the element size in the conventional technique. As a result, it is possible to reduce the analysis processing load in the entire analysis processing.

  The finite element model is composed of a plurality of elements obtained by dividing the analysis object into predetermined regions. An element is formed by a node and a side, but the size of the element, the number of nodes, and the like are not particularly limited. Note that the finite element model can be stored in a storage device, and can be displayed using display means such as a display. The finite element model can be generated based on, for example, CAD shape data generated by a known CAD device.

  The attribute information acquisition unit acquires element attribute information. The attribute information may be any information that can identify the element, and for example, information on the size of the element is exemplified. In the present invention, distortion information is calculated in advance by experiments or the like so as to correspond to the attribute information, and the calculated distortion information is stored in advance in the distortion information storage means. The distortion information is information related to a distortion value necessary for analysis, and a correction limit distortion value set for each element is exemplified. The strain information setting unit acquires strain information suitable for the target element from the strain information storage unit, and sets the acquired strain information as the strain information of the element to be analyzed.

  The analysis unit executes a finite element analysis of the finite element model based on the strain information set by the strain information setting unit. The finite element analysis processing is processing conventionally performed in finite element analysis, and can be executed by causing a computer to execute an existing analysis program.

  According to the analysis apparatus according to the present invention described above, strain information corresponding to element attribute information is acquired from the strain information storage means, and the finite element analysis processing is performed using the acquired strain information. The processing load in the analysis process can be reduced. Moreover, since the acquired distortion information is set for each attribute information, the analysis accuracy is sufficiently maintained.

  Here, in the present invention, the attribute information includes at least one of element size information and relative angle information between adjacent elements, and the distortion information setting means includes the size information and the size information. The distortion information corresponding to at least one of the relative angle information is acquired from the distortion information storage unit, and the correction limit distortion value included in the acquired distortion information may be set as the limit distortion value of the element Good.

  In the present invention, the distortion information stored in advance in the distortion information storage means is obtained in advance so as to correspond to at least one of element size information and relative angle information between adjacent elements. . In addition, it is preferable that distortion information is calculated | required based on both size information and relative angle information. This is because more accurate distortion values can be obtained by corresponding to both the size information and the relative angle information. According to the present invention, such strain information is acquired from the strain information storage means and set as the strain information of the element, thereby reducing the analysis processing load. Note that the stress of the analysis object changes not only by the size of the element but also by the relationship between the elements. Therefore, not only the size of the element but also the relative angle information with the adjacent element is taken into consideration, so that the analysis accuracy in this apparatus can be further improved. And this invention is especially suitable for the finite element analysis of the analysis target object provided with hole parts, such as a screw hole, for example. This is because fracture is likely to occur around the hole due to stress concentration, and the influence on the strain value due to the relationship between adjacent elements is larger than that of the flat end. According to the present invention, distortion information considering the relative angle between adjacent elements is obtained in advance and stored in the distortion information storage means, and the finite element analysis is executed based on this distortion information, so the system is higher than the conventional system. Analysis can be performed.

  The size information is the length information of the sides constituting the element, in other words, the distance information between the nodes. The relative angle information is information related to the relative angle between adjacent elements. For example, the relative angle information can be represented by an angle formed between a side of a certain element and a side of an element adjacent to the element.

  Here, in the present invention, it is determined whether or not an edge constituting the element of the finite element model is shared with an edge constituting another adjacent element, and if the edge is not shared, the edge is an edge. The attribute information acquisition unit may acquire attribute information of an element having an edge determined to be an edge by the edge determination unit.

  As described above, an analysis target having a hole is likely to break because stress concentrates around the hole. Therefore, the present invention specifies the elements that are particularly prone to stress concentration, and executes the above-described processing for the analysis of elements having edges that tend to cause stress concentration. As a result, stress concentration is likely to occur, and analysis of elements in the vicinity of the edge, which is conventionally considered to have a large processing load, can be performed with a processing load that is less than that in the past. Also, by considering the relative angle information described above, the relationship between adjacent elements is also taken into consideration, so that the analysis accuracy is further improved.

  Note that the present invention may be a method or a program for realizing any of the functions described above. Furthermore, the present invention may be a computer-readable recording medium that records such a program. In this case, the function can be provided by causing a computer or the like to read and execute the program of the recording medium. Note that a computer-readable recording medium is a recording medium that accumulates information such as data and programs by electrical, magnetic, optical, mechanical, or chemical action and can be read from a computer or the like. Say. Examples of such a recording medium that can be removed from a computer or the like include a flexible disk, a magneto-optical disk, a CD-ROM, a CD-R / W, a DVD, a DAT, an 8 mm tape, and a memory card.

  ADVANTAGE OF THE INVENTION According to this invention, the analysis processing technique using the finite element method which can aim at the reduction of the processing burden in an analysis process and can improve an analysis precision can be provided.

  Next, an embodiment of an analysis apparatus according to the present invention will be described with reference to the drawings. In addition, the structure which concerns on the following embodiment is an illustration, and this invention is not limited to the structure of embodiment.

  FIG. 1 is a schematic configuration diagram illustrating a configuration of an analysis apparatus according to the present embodiment. As shown in the figure, the analysis apparatus 1 includes a CPU (central processing unit) 11, a storage unit 12, a ROM 13, a RAM 14, a display unit 15, an input unit 16, an interface unit 17, and the like.

  The CPU 11 is connected to each hardware such as the storage unit 12 and the ROM 13 described above via the bus 18. The CPU 11 controls hardware such as the storage unit 12 and executes predetermined processing according to a control program stored in the ROM 13, for example.

The storage unit 12 can be configured by a hard disk drive (HDD), and can store data necessary for processing in addition to a control program. Therefore, information relating to the finite element model in the present invention, distortion information, and the like may be stored in the storage unit 12. The ROM (Read Only Memory) 13 includes a flash memory and an EPROM (Erasable Programma).
A rewritable semiconductor memory such as a ble read-only memory (EEPROM) or an EEPROM (electrically erasable programmable read-only memory) is included. The RAM (Random Access Memory) 14 is exemplified by a volatile semiconductor memory.

  The display unit 15 is, for example, a liquid crystal display device, a plasma display panel, a CRT (Cathode Ray Tube), an electroluminescence panel, or the like. The display unit 15 can display CAD shape data of an analysis object, a finite element model generated from the CAD shape data, an analysis result, and the like. The input unit 16 is a keyboard, a pointing device, or the like, for example. There are no particular limitations on the type of pointing device, mouse, trackball, dial-type operation unit, device that moves the pointer on the display in a stick format, device that detects the operation of the user's finger by capacitance, touch panel, joystick For example, an appropriate one may be used according to the needs of the user.

  The interface unit 17 is a serial interface such as a USB, PCI (Peripheral Component Interconnect), ISA (Industry Standard Architecture), EISA (Extended ISA), ATA (AT Attachment), IDE (Integrated Drive Electronics), IEEE 1394, SCSI ( Any of parallel interfaces such as Small Computer System Interface may be used.

  Here, FIG. 2 shows a functional block diagram of the analysis apparatus 1 according to the present embodiment. As shown in the figure, the analysis apparatus 1 includes a control unit 10, which includes an attribute information acquisition unit 21 (corresponding to attribute information acquisition means of the present invention), and a distortion information setting unit 22 ( An analysis unit 23 (corresponding to the analysis unit of the present invention) and an edge determination unit 24 (corresponding to the edge determination unit of the present invention) are provided. The processing in each unit such as the attribute information acquisition unit 21 can be realized by a computer including the CPU 11 and the ROM 13 and a program executed on the computer.

  The attribute information acquisition unit 21 acquires element attribute information. That is, the attribute information acquisition unit 21 obtains attribute information for each element from the finite element model 30 corresponding to the analysis target (for example, vehicle part), that is, element side length information, and relative angle information with an adjacent element. To get. Here, the finite element model will be described. FIG. 3 shows a part of the finite element model 30 to be analyzed in the present embodiment. As shown in the figure, the finite element model 30 is formed by a plurality of elements (1), (2), etc. divided into a predetermined size. For example, the element (1) is formed by four nodes A, B, C, and D and sides AB, BC, CD, and DA. The element (2) is formed by four nodes E, A, D, and F and sides EA, AD, DF, and FE. The symbol H corresponds to the hole of the analysis object, and the sides AB and EA correspond to edges. The angle formed by the element (1) and the element (2), in other words, the angle formed by the side AB and the side EA is θ. The attribute information acquisition unit 21 obtains edge side length information (for example, lengths of sides AB and EA) and neighboring element relative angle information (for example, the length of sides AB) as attribute information for each element from the finite element model 30. , An angle θ) between the side AB and the side EA is acquired.

  The finite element model 30 can be generated from CAD shape data of the analysis object. The CAD shape data can be generated by a known CAD device (not shown) or the analysis device 1. When using CAD shape data generated externally, it may be acquired by, for example, the CAD shape data acquisition unit 26 via the interface unit 17 or the like. The generated CAD shape data can be stored in the storage unit 12. Then, the CAD shape data is divided into elements of a predetermined size, so that a finite element model 30 is generated. The generation of the finite element model 30 can be realized by the finite element model generation unit 25 executing a known finite element analysis program, for example.

  The strain information setting unit 22 acquires a correction limit strain value optimal for the element to be analyzed from the correction limit strain value database, and sets the acquired correction limit strain value as the limit strain value of the element to be analyzed. That is, the strain information setting unit 22 replaces the limit strain value set for each analysis object as initial input information with the correction limit strain value acquired from the correction limit strain value database. Here, FIG. 4 shows an example of a table constituting the correction limit distortion value database. As shown in the figure, the correction limit distortion value corresponding to the length of the side and the relative angle between adjacent elements is recorded in this table. The length of the side and the relative angle correspond to the attribute information of the present invention, and the limit strain value is calculated in advance for each attribute information. For example, when the side length is 0.1 mm and the relative angle is 150 degrees, the correction limit strain value is 4. On the other hand, even if the side length is 0.1 mm, the correction limit strain value is 5 when the relative angle is 180 degrees. Thus, not only the length of the side but also the relative angle between the elements can be taken into consideration to further improve the analysis accuracy. Note that such a correction limit distortion value can be calculated by experiments or the like. Such a table is preferably provided for each material of the analysis object. This is because the analysis processing burden can be reduced and the analysis accuracy can be improved.

  The analysis unit 23 executes analysis processing necessary for the finite element analysis of the finite element model 30 based on the correction limit strain value εcr set by the strain information setting unit 22. That is, the analysis unit 23 executes analysis processing based on predetermined input values such as Young's modulus, Poisson's ratio, material, number of nodes, and number of elements. At this time, the limit strain value is analyzed after the correction limit strain value εcr set by the strain information setting unit 22 is replaced with the initially input limit strain value. As a result, it is possible to reduce the processing time in the analysis process and improve the analysis accuracy as compared with the conventional technique.

  The edge determination unit 24 determines whether or not a side that constitutes an element is shared with a side that constitutes another adjacent element. Therefore, for example, it is determined that the side AB and the side EA are not shared with the sides of other elements. As a result, the side AB and the side EA are determined to be edges. On the other hand, for example, the side DA is determined to be supplied between the element (1) and the element (2). As a result, the side DA is determined not to be an edge.

  Next, analysis processing in the analysis apparatus 1 will be described. In the present embodiment, a case where the finite element model 30 shown in FIG. 3 is analyzed will be described as an example. Note that the following analysis processing is an example, and the present invention is not limited to this.

  In the analysis apparatus 1 of the present embodiment, an element having an edge is specified, a correction limit strain value εcr to be compared with the strain value ε is calculated in advance and tabulated, and the correction limit strain value εcr is acquired from the table and set in advance. A process for replacing the limit strain value that has been replaced (hereinafter referred to as a limit strain value correction process) is performed, and a finite element analysis process is performed based on the replaced corrected limit strain value εcr. Hereinafter, processing performed by the analysis apparatus 1 of the present embodiment will be described. Note that the processing described below is realized by a computer executing an analysis program.

  When executing the processing described below, it is necessary to input predetermined data. Accordingly, first, predetermined data necessary for the analysis of the finite element model 30 is input via the input unit 16. Specifically, analysis object identification information, node identification information (number, etc.), coordinates of each node (X coordinate, Y coordinate, Z coordinate), Young's modulus E, Poisson's ratio, yield point stress, initial setting For the limit strain value and stress-strain, load conditions, constraint conditions, and the like are input. In executing the analysis process, the coordinates of the nodes need to be set for each of the nodes A, B, C, and the like. On the other hand, the Young's modulus, Poisson's ratio, yield point stress, limit strain value, and post-plastic stress-strain diagram may be set in units of analysis objects. By inputting the predetermined data described above, each element (1), (2), etc. has Young's modulus, Poisson's ratio, limit strain value, stress-strain, etc., respectively.

  FIG. 5 is a diagram illustrating a processing flow of the limit distortion value correction processing. In step S <b> 11, an element having an edge is specified from the finite element model 30. Specifically, the edge determination unit 24 determines whether or not a side that constitutes an element is shared with a side that constitutes another adjacent element. For example, since the side AB is not shared with the sides of other elements, it is determined to be an edge. The same applies to the side EA. On the other hand, for example, the side DA is determined to be supplied between the element (1) and the element (2). As a result, the side DA is determined not to be an edge. When the identification of the element having the edge is completed, the process proceeds to the next step. The finite element model 30 may be generated from CAD shape data of the analysis target. The CAD shape data may be generated by a known CAD device (not shown) or may be generated by the analysis device 1. The generated CAD shape data can be stored in the storage unit 12.

  In step S12, the length of the edge of the target element identified as having an edge is acquired. That is, for example, regarding the element (1), the length of the side AB that is an edge is acquired from the finite element model 30. When the acquisition of the edge length of the target element is completed, the process proceeds to the next step.

  In step S13, the element adjacent to the element identified as having an edge in step S11 is identified, and the edge connected to the edge whose length is acquired in step S12 among the sides of the element identified as adjacent Is identified. That is, for example, the element (2) is specified as an element adjacent to the element (1), and the side EA of the element (2) is specified as an edge connected to the side AB that is an edge. When the process of step S13 ends, the process proceeds to the next step.

  In step S14, an angle θ formed by the edge whose length is acquired in step S12 and the edge specified to be connected to the edge in step S13 is acquired. That is, for example, the angle θ formed by the side AB and the side EA is acquired from the finite element model 30. When the acquisition of the formed angle θ is completed, the process proceeds to the next step. Note that the processing from step S12 to step S14 can be performed by the attribute information acquisition unit 21.

In step S15, the correction limit strain value εcr corresponding to the relationship between the edge length acquired in step S12 and the angle θ acquired in step S14 is acquired from the correction limit strain value database. In the present embodiment, the correction limit strain value εcr is obtained from the table (see FIG. 4) of the relationship between the angle θ and the side length formed as described above. However, the present invention is not limited to this. Absent. Instead of the angle θ formed, for example, a curvature radius passing through the side EAB may be calculated, and a table of the relationship between the curvature radius and the side may be provided. In addition, a curvature radius can be calculated | required with the following procedures. FIG. 8 is an image diagram showing the side AB, the side EA, and the curvature radius R. The radius of curvature R shown in FIG.
R = L ₁ / cos θ ₁ (Formula 2)
Here, it is _{θ = θ 1 + θ 2,} L 1 = Rcosθ 1, L 2 = Rcosθ 2, R = L 1 / cosθ 1 = L 2 / cosθ 2. When the acquisition of the correction limit strain value εcr is completed, the process proceeds to the next step.

In step S16, the corrected limit strain value εcr obtained in step S15 is replaced with the limit strain value set in advance for the target element. That is, the strain information setting unit 22 replaces the limit strain value set for each analysis object as initial input information for the element (1) with the correction limit strain value εcr acquired from the correction limit strain value database. In step S17, it is determined whether or not the replacement of the correction limit distortion value εcr for the elements having all the edges has been completed. If it is determined that the replacement has been completed, the limit distortion value correction processing ends. Is done. On the other hand, if it is not determined that the replacement has been completed, the process of step S12 is executed again.

Through the above processing, the replacement of the correction limit distortion value εcr suitable for the target element is completed. Next, an analysis process using the corrected limit strain value εcr replaced by the above-described limit strain value correction process will be described. Note that the process described below is merely an example of a finite element analysis process, and the analysis process of the present invention is not limited to this. FIG. 6 is a flowchart showing an element processing procedure of the finite element method. In step S21, the displacement σ of each node is calculated. Specifically, the data of the finite element model 30 is acquired, and for each node of the acquired finite element model 30, the equation of motion (Equation 1) of Equation 1 is solved, so that the speed and displacement σ for each contact are obtained. Calculated. Here, Fext is an external force acting on the node, Fel is a force acting on the node from an element connected to the node, and M is a node mass. The acceleration a is calculated from the equation of motion of Equation 1, the velocity of the node is calculated by integrating the calculated acceleration a once, and the displacement of the node is calculated by integrating the acceleration a twice. When calculation of speed and displacement for each node is completed, the process proceeds to the next step.
Ma = ΣFext + ΣFel (Formula 1)

  In step S22, the stress σ and strain ε of each element are calculated based on the displacement calculated in step S21. The stress σ and strain ε are calculated at the integration point of each element. Here, the integration point will be described. FIG. 7 is an image diagram showing the set position of the integration point. As shown in the figure, four integration points (A1, B1, C1, D1) are provided in the element (1). More specifically, an integration point is provided at approximately the center position of each quadrangle obtained by dividing the substantially quadrangle element (1) into four. At the integration points provided for each element, the stress σ and the strain ε are calculated based on the input predetermined data and the displacement σ calculated in step S21. Predetermined data is allocated to the integration points, and the stress σ and strain ε are calculated at the integration points, so that the analysis accuracy can be further improved. When the calculation of the stress σ and strain ε at the integration point is completed, the process proceeds to the next step.

  In step S23, the calculation result calculated for each integration point is transmitted to the node, and the force Fel acting on the node is calculated from the element connected to the node. Next, in step S24, it is determined whether the strain ε exceeds the limit strain value εcr based on the force Fel acting on the node, in other words, whether the element is broken. When it is determined that the strain ε exceeds the limit strain value, the process proceeds to step S25. On the other hand, if it is not determined that the strain ε exceeds the limit strain value, the process proceeds to step S26. In the present embodiment, the limit strain value to be compared with the strain ε is replaced with a corrected limit strain value εer that is more suitable for the target element. Accordingly, it is possible to perform processing with higher accuracy than in the past.

  In step S25, when it is determined that the strain ε exceeds the limit strain value, the target element is deleted. If the strain ε exceeds the limit strain value, it means that the element is broken, and therefore, no force is exchanged between the broken element and the adjacent element. Therefore, when the strain ε exceeds the limit strain value, this element is deleted. At this time, each data when the element is erased, that is, when the analysis target is broken is recorded in the storage unit 12 or the like, for example. When the deletion of the element is completed, the process proceeds to the next step.

  In step S26, it is determined whether or not the process needs to be continued. That is, it is determined whether or not a required processing time set in advance is satisfied when executing the processing. When it is necessary to continue the process (when the necessary processing time is not satisfied), the process of step S01 is executed again. On the other hand, when it is not necessary to continue the processing (when the necessary processing time is satisfied), the processing is terminated.

As described above, according to the analysis device 1 according to the present embodiment, by executing the limit strain value correction processing, the analysis processing of the analysis object based on the replaced corrected limit strain value εcr is executed. . Then, according to the analysis process by the analysis apparatus 1 according to the present embodiment, since the finite element analysis process using the correction limit strain value εcr stored in the database is performed, the burden of the analysis process can be reduced as compared with the conventional case. .

  The correction limit strain value εcr calculated in advance and stored in the database takes into account not only the length of the edge but also the relative angle between adjacent elements. Here, in the edge part around the hole part, not only the size of the element but also the influence of the relative angle between the elements is not small, but in the past, the relative angle between the elements in the edge part is sufficiently considered. I couldn't say. On the other hand, in this embodiment, since the relative angle between elements is also taken into consideration, the analysis accuracy of the target analyte can be further improved.

  The preferred embodiments of the present invention have been described above, but the analysis processing apparatus 1 according to the present invention is not limited to these, and can include combinations thereof as much as possible.

It is a schematic block diagram which shows the structure of an analyzer. It is a functional block diagram of an analyzer. It is a figure which shows a part of finite element model. An example of the table which comprises the correction | amendment limit distortion value database is shown. It is a figure which shows the processing flow of a limit distortion value correction process. It is a flowchart which shows the element processing procedure of a finite element method. It is an image figure which shows the setting position of an integration point. It is an image figure which shows a side and a curvature radius.

Explanation of symbols

1 ... Analyzer 11 ... CPU
12 ... Storage unit 13 ... ROM
14 ... RAM
DESCRIPTION OF SYMBOLS 15 ... Display part 16 ... Input part 17 ... Interface part 18 ... Bus 21 ... Attribute information acquisition part 22 ... Strain information setting part 23 ... Analysis part 24 ... Edge Judgment unit 25 ... Finite element model generation unit

Claims (9)

An analysis device for performing a finite element analysis of a finite element model,
Attribute information acquisition means for acquiring attribute information of elements constituting the finite element model from the finite element model;
Acquire distortion information corresponding to the attribute information acquired by the attribute information acquisition means from distortion information storage means in which distortion information relating to the distortion value obtained in advance for each attribute information so as to correspond to the attribute information is stored. And distortion information setting means for setting the acquired distortion information as distortion information of the element from which the attribute information has been acquired,
Analysis means for executing a finite element analysis process of the finite element model based on the strain information set by the strain information setting means;
An analysis device comprising: The attribute information includes at least one of element size information and relative angle information between adjacent elements,
The distortion information setting means acquires distortion information corresponding to at least one of the size information and the relative angle information from the distortion information storage means, and a correction limit distortion value included in the acquired distortion information. Is set as the critical strain value of the element,
The analysis device according to claim 1. Edge judging means for judging whether or not a side constituting an element of the finite element model is shared with a side constituting another adjacent element, and judging that the side is an edge when not shared In addition,
The attribute information acquisition unit acquires attribute information of an element having a side determined to be an edge by the edge determination unit;
The analysis device according to claim 1 or claim 2. An analysis method of a finite element model,
Computer
An attribute information acquisition step of acquiring attribute information of elements constituting the finite element model from the finite element model;
Acquire distortion information corresponding to the attribute information acquired in the attribute information acquisition step from a distortion information storage unit in which distortion information relating to a distortion value obtained in advance for each attribute information so as to correspond to the attribute information is stored. A distortion information setting step for setting the acquired distortion information as the distortion information of the element from which the attribute information has been acquired;
An analysis step for performing a finite element analysis process of the finite element model based on the strain information set by the strain information setting step;
Execute the analysis method. The attribute information includes at least one of element size information and relative angle information between adjacent elements,
In the strain information setting step, the computer acquires strain information corresponding to at least one of the size information and the relative angle information from the strain information storage unit, and is included in the acquired strain information. Set the corrected limit strain value to be the limit strain value of the element,
The analysis method according to claim 4. An edge determination step of determining whether an edge constituting an element of the finite element model is shared with an edge constituting another adjacent element, and determining that the edge is an edge when the edge is not shared Perform further,
The computer acquires attribute information of an element having a side determined to be an edge by the edge determination step in the attribute information acquisition step.
The analysis method according to claim 5 or 6. An analysis program for causing an analysis device to execute a finite element analysis of a finite element model,
An attribute information acquisition step of acquiring attribute information of elements constituting the finite element model from the finite element model;
Acquire distortion information corresponding to the attribute information acquired in the attribute information acquisition step from a distortion information storage unit in which distortion information relating to a distortion value obtained in advance for each attribute information so as to correspond to the attribute information is stored. A distortion information setting step for setting the acquired distortion information as the distortion information of the element from which the attribute information has been acquired;
An analysis step for performing a finite element analysis process of the finite element model based on the strain information set by the strain information setting step;
Analysis program that causes a computer to execute. The attribute information includes at least one of element size information and relative angle information between adjacent elements,
In the distortion information setting step, the computer is caused to acquire distortion information corresponding to at least one of the size information and the relative angle information from the distortion information storage unit, and the acquired distortion information The correction limit strain value included is set as the limit strain value of the element,
The analysis program according to claim 7. An edge determination step of determining whether an edge constituting an element of the finite element model is shared with an edge constituting another adjacent element, and determining that the edge is an edge when the edge is not shared Let it run further,
The analysis program according to claim 7 or 8, wherein the attribute information acquisition step causes the attribute information acquisition step to acquire attribute information of an element having a side determined to be an edge by the edge determination step.

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