JP2008125610A - Radiographic x-ray equipment - Google Patents

Radiographic x-ray equipment Download PDF

Info

Publication number
JP2008125610A
JP2008125610A JP2006311580A JP2006311580A JP2008125610A JP 2008125610 A JP2008125610 A JP 2008125610A JP 2006311580 A JP2006311580 A JP 2006311580A JP 2006311580 A JP2006311580 A JP 2006311580A JP 2008125610 A JP2008125610 A JP 2008125610A
Authority
JP
Japan
Prior art keywords
ray
ray intensity
irradiation
intensity
measurement area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006311580A
Other languages
Japanese (ja)
Inventor
Ayumi Baba
歩 馬場
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2006311580A priority Critical patent/JP2008125610A/en
Publication of JP2008125610A publication Critical patent/JP2008125610A/en
Pending legal-status Critical Current

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To easily obtain the appropriate X-ray intensity during the radiography while reducing the X-ray dose. <P>SOLUTION: The radiographic X-ray equipment comprises an X-ray tube for irradiating a subject with X rays; an FPD 4 for detecting X rays emitted from the X-ray tube; an image processing means 10 for processing the X rays detected by the FPD 4 and generating and outputting image data; an image display monitor 8 for displaying the image data output from the image processing means 10; and an X-ray condition setting means 6 for setting a condition for the X rays to be emitted from the X-ray tube. The X-ray intensity of each pixel detected by the FPD 4 during the radiography is stored in an X-ray intensity storing means 11. The X-ray intensity of pixels within an X-ray intensity measuring region set by an X-ray intensity measurement region setting means 9 is extracted from the X-ray intensity storing means 11 and the maximum X-ray intensity is selected. The maximum X-ray intensity and a necessary X-ray intensity are compared with each other and the X-ray intensity to be emitted is computed by an emission X-ray intensity computing means 14. Then, the X-ray intensity to be emitted set by the X-ray condition setting means 6 is controlled so that the intensity becomes the computed X-ray intensity. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

この発明は、被検体にＸ線を照射するＸ線管などのＸ線照射手段と、Ｘ線照射手段から照射されて被検体を透過したＸ線を検出するフラットパネル型Ｘ線検出器などのＸ線検出手段と、そのＸ線検出手段で検出したＸ線を処理して画像データを生成出力する画像処理手段と、画像処理手段から出力される画像データを表示する画像表示モニタなどの画像表示手段と、Ｘ線照射手段から照射するＸ線の条件を設定するＸ線条件設定手段とを備えたＸ線透視撮影装置に関する。   The present invention relates to an X-ray irradiation means such as an X-ray tube that irradiates a subject with X-rays, and a flat panel X-ray detector that detects X-rays irradiated from the X-ray irradiation means and transmitted through the subject. Image display such as X-ray detection means, image processing means for processing and generating X-rays detected by the X-ray detection means, and an image display monitor for displaying image data output from the image processing means The present invention relates to an X-ray fluoroscopic apparatus comprising: a means, and an X-ray condition setting means for setting an X-ray condition irradiated from the X-ray irradiation means.

Ｘ線透視撮影装置としては、従来、次のようなものが知られている。
被検体（被検者）を間にして、Ｘ線を照射するＸ線管と、Ｘ線管からのＸ線を検出する自動露出制御用Ｘ線検出器とが設けられている。Ｘ線管には高電圧ケーブルを介して高電圧変圧器が接続されている。高電圧変圧器には、撮影電圧・電流などのＸ線の条件を設定する高電圧装置の制御回路が接続されている。 The following are known as X-ray fluoroscopic apparatuses.
An X-ray tube that emits X-rays and an automatic exposure control X-ray detector that detects X-rays from the X-ray tube are provided with a subject (subject) in between. A high voltage transformer is connected to the X-ray tube via a high voltage cable. The high-voltage transformer is connected to a control circuit for a high-voltage device that sets X-ray conditions such as imaging voltage and current.

この種の装置でＸ線透視を行う場合、一般的に、その検査目的に応じて予めＸ線強度測定領域をプリセットしておき、被検体に対して連続的にＸ線透視を行いながら、Ｘ線検出器においてＸ線強度測定領域内の画素のＸ線強度を測定し、その測定されたＸ線強度が設定Ｘ線強度になるようにフィードバック制御を行い、透視時において適切なＸ線強度が得られるようにしている（特許文献１参照）。
特開２０００−３０８９１号公報 When performing X-ray fluoroscopy with this type of apparatus, generally, an X-ray intensity measurement region is preset in advance according to the inspection purpose, and X-ray fluoroscopy is continuously performed on a subject while performing X-ray fluoroscopy. The X-ray intensity of the pixels in the X-ray intensity measurement region is measured by the line detector, and feedback control is performed so that the measured X-ray intensity becomes the set X-ray intensity. (See Patent Document 1).
JP 2000-30891 A

しかしながら、上述従来例の場合、次のような欠点があった。
被検体が予め透視画像中の想定された位置に位置していることを前提にしてＸ線強度測定領域をプリセットしているものであり、被検体が想定された位置からズレている場合、適切なＸ線強度を得ることができない問題があった。
また、透視画像を見ながら適切なＸ線強度を得ようとする場合、透視のためのＸ線照射時間が長くなり被検体に対するＸ線照射量が多くなる不都合があった。 However, the conventional example described above has the following drawbacks.
The X-ray intensity measurement region is preset on the assumption that the subject is located at the assumed position in the fluoroscopic image in advance, and it is appropriate if the subject is displaced from the assumed position. There was a problem that a high X-ray intensity could not be obtained.
In addition, when trying to obtain an appropriate X-ray intensity while viewing a fluoroscopic image, there is a disadvantage that the X-ray irradiation time for fluoroscopy becomes longer and the X-ray irradiation amount on the subject increases.

この発明は、上述のような事情に鑑みてなされたものであって、Ｘ線照射量を少なくしながら透視時における適切なＸ線強度を容易に得ることができるようにすることを目的とする。   The present invention has been made in view of the above-described circumstances, and an object thereof is to easily obtain an appropriate X-ray intensity at the time of fluoroscopy while reducing the amount of X-ray irradiation. .

請求項１に係る発明は、上述のような目的を達成するために、次のような構成をとる。
すなわち、被検体にＸ線を照射するＸ線照射手段と、前記Ｘ線照射手段から照射されて被検体を透過したＸ線を検出するＸ線検出手段と、前記Ｘ線検出手段で検出したＸ線を処理して画像データを生成出力する画像処理手段と、前記画像処理手段から出力される画像データを表示する画像表示手段と、前記Ｘ線照射手段から照射するＸ線の条件を設定するＸ線条件設定手段とを備えたＸ線透視撮影装置であって、
透視時において前記Ｘ線検出手段で検出された各画素のＸ線強度を記憶するＸ線強度記憶手段と、前記画像表示手段で表示された画像面上でＸ線強度測定領域を移動可能に設定するＸ線強度測定領域設定手段と、前記Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度を前記Ｘ線強度記憶手段から抽出しその抽出した画素のＸ線強度に基づいて照射Ｘ線強度を算出する照射Ｘ線強度算出手段と、Ｘ線条件設定手段で設定される照射Ｘ線強度が前記照射Ｘ線強度算出手段で算出されるＸ線強度になるように制御するＸ線強度制御手段とを備えたことを特徴としている。 In order to achieve the above object, the invention according to claim 1 has the following configuration.
That is, X-ray irradiation means for irradiating the subject with X-rays, X-ray detection means for detecting X-rays irradiated from the X-ray irradiation means and transmitted through the subject, and X detected by the X-ray detection means An image processing means for generating and outputting image data by processing a line; an image display means for displaying image data output from the image processing means; and an X-ray condition for irradiating from the X-ray irradiation means An X-ray fluoroscopic apparatus comprising a line condition setting means,
X-ray intensity storage means for storing the X-ray intensity of each pixel detected by the X-ray detection means at the time of fluoroscopy, and an X-ray intensity measurement area is set to be movable on the image surface displayed by the image display means X-ray intensity measurement area setting means for extracting, and the X-ray intensity of pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means are extracted from the X-ray intensity storage means, and the X of the extracted pixels The irradiation X-ray intensity calculation means for calculating the irradiation X-ray intensity based on the ray intensity, and the irradiation X-ray intensity set by the X-ray condition setting means become the X-ray intensity calculated by the irradiation X-ray intensity calculation means. And X-ray intensity control means for controlling as described above.

（作用・効果）
請求項１に係る発明のＸ線透視撮影装置の構成によれば、先ず一時的に透視を行い、その透視によって得られた被検体の透視画像に基づき、得ようとする箇所をＸ線強度測定領域として設定し、そのＸ線強度測定領域内の画素のＸ線強度に基づいて、適切な照射Ｘ線強度を算出し、その照射Ｘ線強度が得られるようにＸ線条件設定手段での照射Ｘ線強度を自動的に設定して次の透視を行うことができる。
したがって、一時的な透視で得た透視画像に基づいて照射Ｘ線強度を算出するから、連続的に透視しながら適切なＸ線強度を得るようにする場合に比べて、Ｘ線照射量を減少できて被検体に対する負担を軽減でき、しかも、Ｘ線強度記憶手段に記憶させたＸ線強度測定領域内の各画素のＸ線強度に基づいて照射Ｘ線強度を算出するから、被検体の位置に影響されず、Ｘ線照射量を少なくしながら次の透視時における適切なＸ線強度を容易に得ることができる。 (Action / Effect)
According to the configuration of the X-ray fluoroscopic apparatus according to the first aspect of the present invention, first, a fluoroscopy is temporarily performed, and a location to be obtained is measured based on a fluoroscopic image of the subject obtained by the fluoroscopy. Set as an area, calculate an appropriate irradiation X-ray intensity based on the X-ray intensity of the pixels in the X-ray intensity measurement area, and perform irradiation by the X-ray condition setting means so as to obtain the irradiation X-ray intensity. The next fluoroscopy can be performed by automatically setting the X-ray intensity.
Therefore, since the irradiation X-ray intensity is calculated based on the fluoroscopic image obtained by temporary fluoroscopy, the X-ray irradiation dose is reduced compared to the case of obtaining an appropriate X-ray intensity while continuously fluoroscopying. The irradiation X-ray intensity is calculated based on the X-ray intensity of each pixel in the X-ray intensity measurement area stored in the X-ray intensity storage means. Therefore, an appropriate X-ray intensity at the next fluoroscopy can be easily obtained while reducing the X-ray irradiation amount.

また、請求項２に係る発明は、請求項１に記載のＸ線透視撮影装置において、
Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度をＸ線強度記憶手段から抽出して最低または最高Ｘ線強度を選出するＸ線強度選出手段を備え、照射Ｘ線強度算出手段を、前記Ｘ線強度選出手段で選出された最低または最高Ｘ線強度と予め設定されている必要Ｘ線強度とを比較して照射Ｘ線強度を算出するように構成する。 The invention according to claim 2 is the X-ray fluoroscopic apparatus according to claim 1,
X-ray intensity selection means for extracting the X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means from the X-ray intensity storage means and selecting the lowest or highest X-ray intensity; The irradiation X-ray intensity calculation means is configured to calculate the irradiation X-ray intensity by comparing the minimum or maximum X-ray intensity selected by the X-ray intensity selection means with a preset required X-ray intensity. .

（作用・効果）
請求項２に係る発明のＸ線透視撮影装置の構成によれば、Ｘ線強度測定領域内の画素の最低または最高Ｘ線強度に基づいて、必要Ｘ線強度との比較に基づいて適切な照射Ｘ線強度を算出し、その照射Ｘ線強度が得られるようにＸ線条件設定手段での照射Ｘ線強度を自動的に設定して次の透視を行うことができる。
したがって、観察しようとする部位での必要Ｘ線強度を確保し、不測に暗い透視画像になったり、あるいは逆に不測に明るい透視画像になったりすることを回避して適切なＸ線強度を容易に得ることができる。 (Action / Effect)
According to the configuration of the X-ray fluoroscopic apparatus according to the second aspect of the present invention, an appropriate irradiation is performed based on the comparison with the required X-ray intensity based on the minimum or maximum X-ray intensity of the pixels in the X-ray intensity measurement region. The X-ray intensity is calculated, and the next fluoroscopy can be performed by automatically setting the irradiation X-ray intensity in the X-ray condition setting means so as to obtain the irradiation X-ray intensity.
Therefore, the necessary X-ray intensity at the site to be observed is ensured, and it is possible to easily obtain an appropriate X-ray intensity by avoiding an unexpectedly dark fluoroscopic image or conversely an unexpectedly bright fluoroscopic image. Can get to.

また、請求項３に係る発明は、請求項１または２に記載のＸ線透視撮影装置において、
Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度を前記Ｘ線強度記憶手段から抽出してＸ線強度測定領域内の画素のＸ線強度の平均値を算出する平均Ｘ線強度算出手段を備え、照射Ｘ線強度算出手段を、前記平均Ｘ線強度算出手段で算出されたＸ線強度と予め設定されている標準Ｘ線強度とを比較して照射Ｘ線強度を算出するように構成する。 The invention according to claim 3 is the X-ray fluoroscopic apparatus according to claim 1 or 2,
The X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means is extracted from the X-ray intensity storage means, and the average value of the X-ray intensities of the pixels in the X-ray intensity measurement area is obtained. An average X-ray intensity calculation means for calculating is provided, and the irradiation X-ray intensity calculation means compares the X-ray intensity calculated by the average X-ray intensity calculation means with a standard X-ray intensity set in advance. The line strength is calculated.

（作用・効果）
請求項３に係る発明のＸ線透視撮影装置の構成によれば、Ｘ線強度測定領域内の画素のＸ線強度の平均値に基づいて、標準Ｘ線強度との比較に基づいて適切な照射Ｘ線強度を算出し、その照射Ｘ線強度が得られるようにＸ線条件設定手段での照射Ｘ線強度を自動的に設定して次の透視を行うことができる。
したがって、画像全体として標準Ｘ線強度を確保し、全体として良好なコントラストを持った適切なＸ線強度を容易に得ることができる。 (Action / Effect)
According to the configuration of the X-ray fluoroscopic apparatus according to the third aspect of the present invention, an appropriate irradiation is performed based on the comparison with the standard X-ray intensity based on the average value of the X-ray intensity of the pixels in the X-ray intensity measurement region. The X-ray intensity is calculated, and the next fluoroscopy can be performed by automatically setting the irradiation X-ray intensity in the X-ray condition setting means so as to obtain the irradiation X-ray intensity.
Therefore, the standard X-ray intensity can be ensured for the entire image, and an appropriate X-ray intensity with good contrast as a whole can be easily obtained.

請求項１に係る発明のＸ線透視撮影装置の構成によれば、先ず一時的に透視を行い、その透視によって得られた被検体の透視画像に基づき、得ようとする箇所をＸ線強度測定領域として設定し、そのＸ線強度測定領域内の画素のＸ線強度に基づいて、適切な照射Ｘ線強度を算出し、その照射Ｘ線強度が得られるようにＸ線条件設定手段での照射Ｘ線強度を自動的に設定して次の透視を行うことができる。
したがって、一時的な透視で得た透視画像に基づいて照射Ｘ線強度を算出するから、連続的に透視しながら適切なＸ線強度を得るようにする場合に比べて、Ｘ線照射量を減少できて被検体に対する負担を軽減でき、しかも、Ｘ線強度記憶手段に記憶させたＸ線強度測定領域内の各画素のＸ線強度に基づいて照射Ｘ線強度を算出するから、被検体の位置に影響されず、Ｘ線照射量を少なくしながら次の透視時における適切なＸ線強度を容易に得ることができる。 According to the configuration of the X-ray fluoroscopic apparatus according to the first aspect of the present invention, first, a fluoroscopy is temporarily performed, and a location to be obtained is measured based on a fluoroscopic image of the subject obtained by the fluoroscopy. Set as an area, calculate an appropriate irradiation X-ray intensity based on the X-ray intensity of the pixels in the X-ray intensity measurement area, and perform irradiation by the X-ray condition setting means so as to obtain the irradiation X-ray intensity. The next fluoroscopy can be performed by automatically setting the X-ray intensity.
Therefore, since the irradiation X-ray intensity is calculated based on the fluoroscopic image obtained by temporary fluoroscopy, the X-ray irradiation dose is reduced compared to the case of obtaining an appropriate X-ray intensity while continuously fluoroscopying. The irradiation X-ray intensity is calculated based on the X-ray intensity of each pixel in the X-ray intensity measurement area stored in the X-ray intensity storage means. Therefore, an appropriate X-ray intensity at the next fluoroscopy can be easily obtained while reducing the X-ray irradiation amount.

次に、この発明の実施例について、図面に基づいて詳細に説明する。   Next, embodiments of the present invention will be described in detail with reference to the drawings.

図１は、この発明に係る実施例のＸ線透視撮影装置を示す全体構成図であり、被検体Ｈを載置する撮影台１の上方に、被検体ＨにＸ線を照射するＸ線照射手段としてのＸ線管２がＸ線管保持装置３を介して設けられている。撮影台１の下面に、Ｘ線管２から照射されて被検体Ｈを透過したＸ線を検出するＸ線検出手段としてのフラットパネル型Ｘ線検出器４が設けられている。   FIG. 1 is an overall configuration diagram showing an X-ray fluoroscopic apparatus according to an embodiment of the present invention. X-ray irradiation for irradiating a subject H with X-rays above an imaging table 1 on which the subject H is placed. An X-ray tube 2 as means is provided via an X-ray tube holding device 3. A flat panel X-ray detector 4 is provided on the lower surface of the imaging table 1 as X-ray detection means for detecting X-rays irradiated from the X-ray tube 2 and transmitted through the subject H.

Ｘ線管２には、Ｘ線発生装置５が接続され、そのＸ線発生装置５には、Ｘ線強度を調整するために管電圧や管電流などのＸ線管２から照射するＸ線の条件を設定するＸ線条件設定手段６が接続されている。   An X-ray generator 5 is connected to the X-ray tube 2, and the X-ray generator 5 receives X-rays irradiated from the X-ray tube 2 such as tube voltage and tube current in order to adjust the X-ray intensity. An X-ray condition setting means 6 for setting conditions is connected.

Ｘ線条件設定手段６に、Ｘ線強度制御手段としてのコントローラ７が接続され、そのコントローラ７に、フラットパネル型Ｘ線検出器４と、画像データを表示する画像表示手段としての画像表示モニタ８と、その画像表示モニタ８で表示された画像面上でＸ線強度測定領域を移動可能に設定するＸ線強度測定領域設定手段９とが接続されている。Ｘ線強度測定領域設定手段９としては、マウスや後述する領域移動（図３参照）ボタンなどが含まれる。   A controller 7 as an X-ray intensity control means is connected to the X-ray condition setting means 6, and a flat panel X-ray detector 4 and an image display monitor 8 as an image display means for displaying image data are connected to the controller 7. And an X-ray intensity measurement area setting means 9 for setting the X-ray intensity measurement area to be movable on the image surface displayed on the image display monitor 8 is connected. The X-ray intensity measurement area setting means 9 includes a mouse and an area movement (see FIG. 3) button described later.

コントローラ７には、図２の制御系のブロック図に示すように、画像処理手段１０、Ｘ線強度記憶手段１１、測定領域決定手段１２、Ｘ線強度選出手段１３および照射Ｘ線強度算出手段１４が備えられている。図２において、フラットパネル型Ｘ線検出器４をＦＰＤと表示する。   As shown in the block diagram of the control system in FIG. 2, the controller 7 includes an image processing unit 10, an X-ray intensity storage unit 11, a measurement region determination unit 12, an X-ray intensity selection unit 13, and an irradiation X-ray intensity calculation unit 14. Is provided. In FIG. 2, the flat panel X-ray detector 4 is indicated as FPD.

画像処理手段１０では、フラットパネル型Ｘ線検出器４で検出したＸ線を処理して画像データを生成出力し、画像表示モニタ８に表示できるようになっている。
Ｘ線強度記憶手段１１では、透視時においてフラットパネル型Ｘ線検出器４で検出された各画素のＸ線強度を記憶するようになっている。
測定領域決定手段１２では、Ｘ線強度測定領域設定手段９による操作設定に伴ってＸ線強度の測定領域を決定するようになっている。
Ｘ線強度選出手段１３では、Ｘ線強度測定領域設定手段１２で設定されたＸ線強度測定領域内の画素のＸ線強度をＸ線強度記憶手段１１から抽出して最高Ｘ線強度を選出するようになっている。このＸ線強度選出手段１３では、観察しようとする部位などに応じて、最低Ｘ線強度を選出するように構成しても良い。 The image processing means 10 can process X-rays detected by the flat panel X-ray detector 4 to generate and output image data and display it on the image display monitor 8.
The X-ray intensity storage means 11 stores the X-ray intensity of each pixel detected by the flat panel X-ray detector 4 during fluoroscopy.
The measurement region determining means 12 determines the X-ray intensity measurement region in accordance with the operation setting by the X-ray intensity measurement region setting means 9.
The X-ray intensity selection means 13 extracts the X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means 12 from the X-ray intensity storage means 11 and selects the maximum X-ray intensity. It is like that. The X-ray intensity selection means 13 may be configured to select the minimum X-ray intensity according to the site to be observed.

照射Ｘ線強度算出手段１４では、Ｘ線強度選出手段１３で選出された最高Ｘ線強度と予め設定されている必要Ｘ線強度とを比較し、その差分を無くすに足る照射Ｘ線強度を算出し、算出された照射Ｘ線強度をＸ線条件設定手段６に出力するようになっている。
すなわち、最高Ｘ線強度が必要Ｘ線強度よりも大きいときには、その差分だけ減少させた状態となる照射Ｘ線強度を算出し、一方、最高Ｘ線強度が必要Ｘ線強度よりも小さいときには、その差分だけ増加させた状態となる照射Ｘ線強度を算出するようになっている。
これにより、Ｘ線条件設定手段６で設定される照射Ｘ線強度が照射Ｘ線強度算出手段１４で算出されるＸ線強度になるように制御できる。 The irradiation X-ray intensity calculation means 14 compares the maximum X-ray intensity selected by the X-ray intensity selection means 13 with the necessary X-ray intensity set in advance, and calculates the irradiation X-ray intensity sufficient to eliminate the difference. Then, the calculated irradiation X-ray intensity is output to the X-ray condition setting means 6.
That is, when the maximum X-ray intensity is greater than the required X-ray intensity, the irradiation X-ray intensity that is reduced by the difference is calculated, while when the maximum X-ray intensity is less than the required X-ray intensity, The irradiation X-ray intensity that is increased by the difference is calculated.
Thereby, the irradiation X-ray intensity set by the X-ray condition setting means 6 can be controlled to be the X-ray intensity calculated by the irradiation X-ray intensity calculation means 14.

次に、使用状態につき、図３の透視画像を表示した画像表示モニタの正面図を用いて説明する。
画像表示モニタ８の表示画面の横側に、Ｘ線強度測定領域設定手段を構成する、Ｘ線強度測定領域を左右上下に移動する４個の領域移動ボタン１５と、その領域移動ボタン１５による操作が可能な状態に切り替える移動モードボタン１６と、Ｘ線強度測定領域を表示するための領域表示ボタン１７とが備えられている。 Next, the usage state will be described with reference to the front view of the image display monitor displaying the perspective image of FIG.
On the side of the display screen of the image display monitor 8, there are four area movement buttons 15 for moving the X-ray intensity measurement area left and right and up and down, constituting the X-ray intensity measurement area setting means, and operations by the area movement button 15 Are provided with a movement mode button 16 for switching to a state in which the X-ray can be measured and an area display button 17 for displaying an X-ray intensity measurement area.

操作者がＸ線透視用の足踏みペダル（図示せず）を操作することによって、Ｘ線管２から透視用Ｘ線を照射し、その透視画像を画像表示モニタ８の画面に表示させる〔図３の（ａ）〕。
その後、領域表示ボタン１７をＯＮの状態にすることにより、予め大きさが特定されたＸ線強度測定領域の枠Ｗを透視画像に重ねて表示させる〔図３の（ｂ）〕。
次いで、移動モードボタン１６をＯＮの状態にしてから、透視画像を見ながら領域移動ボタン１５を操作し、枠Ｗを観察しようとする部位に合う所定の位置に移動させ、Ｘ線強度測定領域を設定する。この枠Ｗの移動は、マウス（図示せず）により、カーソルＣを枠Ｗに合わせてドラッグすることによっても行うことができる。 When an operator operates a foot pedal (not shown) for X-ray fluoroscopy, X-rays for fluoroscopy are emitted from the X-ray tube 2 and the fluoroscopic image is displayed on the screen of the image display monitor 8 [FIG. (A)].
Thereafter, the area display button 17 is turned on to display the frame W of the X-ray intensity measurement area whose size is specified in advance so as to overlap the fluoroscopic image [(b) of FIG. 3].
Next, after the movement mode button 16 is turned on, the area movement button 15 is operated while viewing the fluoroscopic image to move the frame W to a predetermined position that matches the part to be observed, and the X-ray intensity measurement area is set. Set. This movement of the frame W can also be performed by dragging the cursor C to the frame W with a mouse (not shown).

しかる後、領域表示ボタン１７をＯＦＦの状態にすることにより、測定領域決定手段１２で、Ｘ線強度の測定領域を決定し、その決定されたＸ線強度測定領域内の画素を対象として、照射Ｘ線強度算出手段１４で、次の透視時における照射Ｘ線強度を算出し、算出された照射Ｘ線強度をＸ線条件設定手段６に出力する。
その後、足踏みペダル（図示せず）を操作して、Ｘ線管２から透視用Ｘ線を照射することにより、照射Ｘ線強度算出手段１４で算出されたＸ線強度でＸ線管２からＸ線を照射し、適切な透視画像を得ることができる。 Thereafter, the region display button 17 is turned off, so that the measurement region determination means 12 determines the measurement region of the X-ray intensity, and irradiation is performed on the pixels in the determined X-ray intensity measurement region. The X-ray intensity calculation means 14 calculates the irradiation X-ray intensity at the next fluoroscopy, and outputs the calculated irradiation X-ray intensity to the X-ray condition setting means 6.
Thereafter, by operating a stepping pedal (not shown) and irradiating fluoroscopic X-rays from the X-ray tube 2, X-ray intensity from the X-ray tube 2 is calculated with the X-ray intensity calculated by the irradiation X-ray intensity calculating means 14. A suitable fluoroscopic image can be obtained by irradiating a line.

図４は、この発明に係るＸ線透視撮影装置の実施例２の制御系を示すブロック図であり、実施例１と異なるところは、次の通りである。
すなわち、実施例１のＸ線強度選出手段１３に代えて平均Ｘ線強度算出手段２１が備えられ、その平均Ｘ線強度算出手段２１に照射Ｘ線強度算出手段２２が接続されている。 FIG. 4 is a block diagram showing a control system of the second embodiment of the X-ray fluoroscopic apparatus according to the present invention. The differences from the first embodiment are as follows.
That is, instead of the X-ray intensity selection means 13 of the first embodiment, an average X-ray intensity calculation means 21 is provided, and an irradiation X-ray intensity calculation means 22 is connected to the average X-ray intensity calculation means 21.

平均Ｘ線強度算出手段２１では、Ｘ線強度測定領域設定手段９で設定されて測定領域決定手段１２で決定されたＸ線強度測定領域内の画素のＸ線強度をＸ線強度記憶手段１１から抽出してＸ線強度測定領域内の画素のＸ線強度の平均値を算出するようになっている。
照射Ｘ線強度算出手段２２では平均Ｘ線強度算出手段１１で算出されたＸ線強度と予め設定されている標準Ｘ線強度とを比較して照射Ｘ線強度を算出し、算出された照射Ｘ線強度をＸ線条件設定手段６に出力するようになっている。
すなわち、平均Ｘ線強度が標準Ｘ線強度よりも大きいときには、その差分だけ減少させた状態となる照射Ｘ線強度を算出し、一方、平均Ｘ線強度が標準Ｘ線強度よりも小さいときには、その差分だけ増加させた状態となる照射Ｘ線強度を算出するようになっている。
これにより、Ｘ線条件設定手段６で設定される照射Ｘ線強度が照射Ｘ線強度算出手段１４で算出されるＸ線強度になるように制御できる。他の構成は、実施例１と同じであり、同一図番を付すことにより、その説明は省略する。 In the average X-ray intensity calculation means 21, the X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means 9 and determined by the measurement area determination means 12 is read from the X-ray intensity storage means 11. The average value of the X-ray intensities of the pixels in the X-ray intensity measurement area is extracted and calculated.
The irradiation X-ray intensity calculation means 22 calculates the irradiation X-ray intensity by comparing the X-ray intensity calculated by the average X-ray intensity calculation means 11 with a preset standard X-ray intensity, and calculates the calculated irradiation X The line intensity is output to the X-ray condition setting means 6.
That is, when the average X-ray intensity is larger than the standard X-ray intensity, the irradiation X-ray intensity that is reduced by the difference is calculated. On the other hand, when the average X-ray intensity is smaller than the standard X-ray intensity, The irradiation X-ray intensity that is increased by the difference is calculated.
Thereby, the irradiation X-ray intensity set by the X-ray condition setting means 6 can be controlled to be the X-ray intensity calculated by the irradiation X-ray intensity calculation means 14. Other configurations are the same as those of the first embodiment, and the description is omitted by giving the same reference numerals.

この実施例２による場合、図５の（ａ）の実施例２の透視画像を表示した画像表示モニタの正面図に示すように、Ｘ線強度測定領域として左右の肺野それぞれに対応するように枠Ｗ１，Ｗ２が設定され、その枠Ｗ１，Ｗ２に対応するＸ線強度測定領域内の画素のＸ線強度の平均値を平均Ｘ線強度算出手段２１で算出し、照射Ｘ線強度算出手段２２で、平均Ｘ線強度算出手段１１で算出されたＸ線強度と標準Ｘ線強度とを比較して次の透視時の照射Ｘ線強度を算出し、算出された照射Ｘ線強度をＸ線条件設定手段６に出力する。
その後、足踏みペダル（図示せず）を操作して、Ｘ線管２から透視用Ｘ線を照射することにより、照射Ｘ線強度算出手段２２で算出されたＸ線強度でＸ線管２からＸ線を照射し、適切な透視画像を得ることができる。 In the case of the second embodiment, as shown in the front view of the image display monitor displaying the fluoroscopic image of the second embodiment in FIG. 5A, the X-ray intensity measurement region corresponds to each of the left and right lung fields. Frames W1 and W2 are set, the average value of the X-ray intensities of the pixels in the X-ray intensity measurement region corresponding to the frames W1 and W2 is calculated by the average X-ray intensity calculating unit 21, and the irradiation X-ray intensity calculating unit 22 Then, the X-ray intensity calculated by the average X-ray intensity calculation means 11 is compared with the standard X-ray intensity to calculate the irradiation X-ray intensity at the next fluoroscopy, and the calculated irradiation X-ray intensity is set as the X-ray condition. Output to setting means 6.
Thereafter, by operating a stepping pedal (not shown) and irradiating fluoroscopic X-rays from the X-ray tube 2, X-ray intensity from the X-ray tube 2 is calculated with the X-ray intensity calculated by the irradiation X-ray intensity calculating means 22. A suitable fluoroscopic image can be obtained by irradiating a line.

図６は、この発明に係るＸ線透視撮影装置の実施例３の制御系を示すブロック図であり、実施例１および実施例２を組み合わせた構成となっている。
すなわち、Ｘ線強度測定領域として、図５の（ｂ）の実施例３の透視画像を表示した画像表示モニタの正面図に示すように、実施例２と同様に左右の肺野それぞれに対応するように枠Ｗ１，Ｗ２が設定され、その枠Ｗ１，Ｗ２間に実施例１に類似する枠Ｗが設定され、カーソルのＣのドラッグや領域移動ボタン１５の移動によって枠Ｗ，Ｗ１，Ｗ２を一体的に移動できるように構成されている。 FIG. 6 is a block diagram showing a control system of the third embodiment of the X-ray fluoroscopic apparatus according to the present invention, which is a combination of the first and second embodiments.
That is, as shown in the front view of the image display monitor displaying the fluoroscopic image of Example 3 in FIG. 5B as the X-ray intensity measurement region, it corresponds to each of the left and right lung fields as in Example 2. The frames W1 and W2 are set as described above, and a frame W similar to the first embodiment is set between the frames W1 and W2, and the frames W, W1 and W2 are integrated by dragging the cursor C or moving the area movement button 15. It is configured to be movable.

枠Ｗ，Ｗ１，Ｗ２を所定位置に移動した後に領域表示ボタン１７をＯＦＦの状態に切り替えるに伴い、第１の測定領域決定手段１２ａ（実施例１の測定領域決定手段１２と同じである）で、枠Ｗに対応したＸ線強度の測定領域を決定し、一方、第２の測定領域決定手段１２ｂ（実施例２の測定領域決定手段１２と同じである）で、枠Ｗ１．Ｗ２に対応したＸ線強度の測定領域を決定するようになっている。   As the area display button 17 is switched to the OFF state after the frames W, W1, and W2 have been moved to predetermined positions, the first measurement area determination means 12a (same as the measurement area determination means 12 of the first embodiment). , The measurement region of the X-ray intensity corresponding to the frame W is determined, while the second measurement region determination unit 12b (same as the measurement region determination unit 12 of the second embodiment) is used to determine the frame W1. An X-ray intensity measurement region corresponding to W2 is determined.

画像処理手段１０およびＸ線強度記憶手段１１は、実施例１および実施例２と同じである。
また、Ｘ線強度選出手段１３は実施例１と同じであり、かつ、第１の照射Ｘ線強度算出手段１４は実施例１の照射Ｘ線強度算出手段１４と同じである。
同様に、平均Ｘ線強度選出手段２１は実施例２と同じであり、かつ、第２の照射Ｘ線強度算出手段２２は実施例２の照射Ｘ線強度算出手段２２と同じである。 The image processing means 10 and the X-ray intensity storage means 11 are the same as those in the first and second embodiments.
The X-ray intensity selection means 13 is the same as that in the first embodiment, and the first irradiation X-ray intensity calculation means 14 is the same as the irradiation X-ray intensity calculation means 14 in the first embodiment.
Similarly, the average X-ray intensity selection means 21 is the same as that in the second embodiment, and the second irradiation X-ray intensity calculation means 22 is the same as the irradiation X-ray intensity calculation means 22 in the second embodiment.

コントローラ７において、比較手段３１が備えられ、第１の照射Ｘ線強度算出手段１４で算出された照射Ｘ線強度と、第２の照射Ｘ線強度算出手段２２で算出された照射Ｘ線強度とが比較され、両者のうちの低い方の照射Ｘ線強度が比較出力としてＸ線条件設定手段６に出力されるように構成されている。
これにより、Ｘ線条件設定手段６で設定される照射Ｘ線強度が比較手段３１で選択された方のＸ線強度になるように制御できる。 The controller 7 includes a comparison unit 31, and the irradiation X-ray intensity calculated by the first irradiation X-ray intensity calculation unit 14 and the irradiation X-ray intensity calculated by the second irradiation X-ray intensity calculation unit 22. And the lower irradiation X-ray intensity of the two is output to the X-ray condition setting means 6 as a comparison output.
Thereby, the irradiation X-ray intensity set by the X-ray condition setting means 6 can be controlled to be the X-ray intensity selected by the comparison means 31.

上記実施例では、Ｘ線管２から照射されるＸ線を検出するのに、フラットパネル型Ｘ線検出器４を用いているが、この発明としては、イメージインテンシファイアを用いるものでも良い。   In the above embodiment, the flat panel X-ray detector 4 is used to detect X-rays emitted from the X-ray tube 2, but an image intensifier may be used as the present invention.

また、上記実施例では、マウスや画像表示モニタ８に設けた領域移動ボタン１５によってＸ線強度測定領域を設定するようにしているが、メカニカルなボタンを撮影台１あるいはその近傍などに設けてＸ線強度測定領域を設定できるように構成するものでも良い。   In the above embodiment, the X-ray intensity measurement region is set by the region moving button 15 provided on the mouse or the image display monitor 8. However, a mechanical button is provided on the imaging table 1 or in the vicinity thereof, for example. It may be configured such that the line intensity measurement region can be set.

この発明に係る実施例のＸ線透視撮影装置を示す全体構成図である。1 is an overall configuration diagram showing an X-ray fluoroscopic apparatus according to an embodiment of the present invention. 実施例１の制御系を示すブロック図である。FIG. 3 is a block diagram illustrating a control system according to the first embodiment. 透視画像を表示した画像表示モニタの正面図であり、（ａ）は透視画像を示し、（ｂ）は実施例１のＸ線強度測定領域を表した透視画像を示している。It is a front view of the image display monitor which displayed the fluoroscopic image, (a) shows a fluoroscopic image, (b) has shown the fluoroscopic image showing the X-ray intensity measurement area | region of Example 1. FIG. 実施例２の制御系を示すブロック図である。FIG. 6 is a block diagram illustrating a control system according to a second embodiment. 透視画像を表示した画像表示モニタの正面図であり、（ａ）は実施例２のＸ線強度測定領域を表した透視画像を示し、（ｂ）は実施例３のＸ線強度測定領域を表した透視画像を示している。It is a front view of the image display monitor which displayed the fluoroscopic image, (a) shows the fluoroscopic image showing the X-ray intensity measurement area | region of Example 2, (b) shows the X-ray intensity measurement area | region of Example 3. FIG. A perspective image is shown. 実施例３の制御系を示すブロック図である。FIG. 10 is a block diagram illustrating a control system according to a third embodiment.

符号の説明Explanation of symbols

２…Ｘ線管（Ｘ線照射手段）
４…フラットパネル型Ｘ線検出器（Ｘ線検出手段）
６…Ｘ線条件設定手段
７…コントローラ（Ｘ線強度制御手段）
８…画像表示モニタ（画像表示手段）
９…Ｘ線強度測定領域設定手段
１０…画像処理手段
１１…Ｘ線強度記憶手段
１３…Ｘ線強度選出手段
１４…照射Ｘ線強度算出手段、第１の照射Ｘ線強度算出手段
２１…平均Ｘ線強度算出手段
２２…照射Ｘ線強度算出手段、第２の照射Ｘ線強度算出手段
Ｈ…被検体 2 ... X-ray tube (X-ray irradiation means)
4. Flat panel X-ray detector (X-ray detection means)
6 ... X-ray condition setting means 7 ... Controller (X-ray intensity control means)
8. Image display monitor (image display means)
DESCRIPTION OF SYMBOLS 9 ... X-ray intensity measurement area | region setting means 10 ... Image processing means 11 ... X-ray intensity memory | storage means 13 ... X-ray intensity selection means 14 ... Irradiation X-ray intensity calculation means, 1st irradiation X-ray intensity calculation means 21 ... Average X Line intensity calculation means 22 ... Irradiation X-ray intensity calculation means, second irradiation X-ray intensity calculation means H ... Subject

Claims (3)

被検体にＸ線を照射するＸ線照射手段と、前記Ｘ線照射手段から照射されて被検体を透過したＸ線を検出するＸ線検出手段と、前記Ｘ線検出手段で検出したＸ線を処理して画像データを生成出力する画像処理手段と、前記画像処理手段から出力される画像データを表示する画像表示手段と、前記Ｘ線照射手段から照射するＸ線の条件を設定するＸ線条件設定手段とを備えたＸ線透視撮影装置であって、
透視時において前記Ｘ線検出手段で検出された各画素のＸ線強度を記憶するＸ線強度記憶手段と、前記画像表示手段で表示された画像面上でＸ線強度測定領域を移動可能に設定するＸ線強度測定領域設定手段と、前記Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度を前記Ｘ線強度記憶手段から抽出しその抽出した画素のＸ線強度に基づいて照射Ｘ線強度を算出する照射Ｘ線強度算出手段と、Ｘ線条件設定手段で設定される照射Ｘ線強度が前記照射Ｘ線強度算出手段で算出されるＸ線強度になるように制御するＸ線強度制御手段とを備えたことを特徴とするＸ線透視撮影装置。 X-ray irradiation means for irradiating the subject with X-rays, X-ray detection means for detecting X-rays irradiated from the X-ray irradiation means and transmitted through the subject, and X-rays detected by the X-ray detection means Image processing means for processing to generate and output image data, image display means for displaying image data output from the image processing means, and X-ray conditions for setting conditions for X-rays emitted from the X-ray irradiation means An X-ray fluoroscopic apparatus comprising setting means,
X-ray intensity storage means for storing the X-ray intensity of each pixel detected by the X-ray detection means at the time of fluoroscopy, and an X-ray intensity measurement area is set to be movable on the image surface displayed by the image display means X-ray intensity measurement area setting means for extracting, and the X-ray intensity of pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means are extracted from the X-ray intensity storage means, and the X of the extracted pixels The irradiation X-ray intensity calculation means for calculating the irradiation X-ray intensity based on the ray intensity, and the irradiation X-ray intensity set by the X-ray condition setting means become the X-ray intensity calculated by the irradiation X-ray intensity calculation means. An X-ray fluoroscopic apparatus comprising X-ray intensity control means for controlling in such a manner. 請求項１に記載のＸ線透視撮影装置において、
Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度をＸ線強度記憶手段から抽出して最低または最高Ｘ線強度を選出するＸ線強度選出手段を備え、照射Ｘ線強度算出手段を、前記Ｘ線強度選出手段で選出された最低または最高Ｘ線強度と予め設定されている必要Ｘ線強度とを比較して照射Ｘ線強度を算出するように構成してあるＸ線透視撮影装置。 The X-ray fluoroscopic apparatus according to claim 1,
X-ray intensity selection means for extracting the X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means from the X-ray intensity storage means and selecting the lowest or highest X-ray intensity; The irradiation X-ray intensity calculation means is configured to calculate the irradiation X-ray intensity by comparing the minimum or maximum X-ray intensity selected by the X-ray intensity selection means with a preset required X-ray intensity. X-ray fluoroscopic apparatus. 請求項１または２に記載のＸ線透視撮影装置において、
Ｘ線強度測定領域設定手段で設定されたＸ線強度測定領域内の画素のＸ線強度を前記Ｘ線強度記憶手段から抽出してＸ線強度測定領域内の画素のＸ線強度の平均値を算出する平均Ｘ線強度算出手段を備え、照射Ｘ線強度算出手段を、前記平均Ｘ線強度算出手段で算出されたＸ線強度と予め設定されている標準Ｘ線強度とを比較して照射Ｘ線強度を算出するように構成してあるＸ線透視撮影装置。 The X-ray fluoroscopic apparatus according to claim 1 or 2,
The X-ray intensity of the pixels in the X-ray intensity measurement area set by the X-ray intensity measurement area setting means is extracted from the X-ray intensity storage means, and the average value of the X-ray intensities of the pixels in the X-ray intensity measurement area is obtained. An average X-ray intensity calculation means for calculating is provided, and the irradiation X-ray intensity calculation means compares the X-ray intensity calculated by the average X-ray intensity calculation means with a standard X-ray intensity set in advance. An X-ray fluoroscopic apparatus configured to calculate a line intensity.
JP2006311580A 2006-11-17 2006-11-17 Radiographic x-ray equipment Pending JP2008125610A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006311580A JP2008125610A (en) 2006-11-17 2006-11-17 Radiographic x-ray equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006311580A JP2008125610A (en) 2006-11-17 2006-11-17 Radiographic x-ray equipment

Publications (1)

Publication Number Publication Date
JP2008125610A true JP2008125610A (en) 2008-06-05

Family

ID=39552058

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006311580A Pending JP2008125610A (en) 2006-11-17 2006-11-17 Radiographic x-ray equipment

Country Status (1)

Country Link
JP (1) JP2008125610A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013027816A1 (en) * 2011-08-25 2013-02-28 富士フイルム株式会社 Radiographic imaging system, radiographic imaging method and radiographic imaging system error-processing method
WO2013042413A1 (en) * 2011-09-21 2013-03-28 富士フイルム株式会社 Radiographic moving image processing device, radiographic moving image shooting device, radiographic moving image shooting system, radiographic moving image shooting method, and radiographic moving image shooting program
WO2013154179A1 (en) * 2012-04-13 2013-10-17 富士フイルム株式会社 Radiographic system and method for operating same
WO2015059795A1 (en) * 2013-10-24 2015-04-30 株式会社島津製作所 Radioscopic apparatus

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH039600B2 (en) * 1982-02-26 1991-02-08 Shimadzu Corp
JPH05292402A (en) * 1992-04-14 1993-11-05 Toshiba Corp X-ray diagnostic device
JPH06154198A (en) * 1992-11-27 1994-06-03 Toshiba Corp X-ray diagnostic device
JPH10234714A (en) * 1997-02-21 1998-09-08 Toshiba Iyou Syst Eng Kk X-ray radiographic device
JPH119581A (en) * 1997-06-20 1999-01-19 Toshiba Corp X-ray diagnostic apparatus
JPH11311673A (en) * 1998-04-28 1999-11-09 Shimadzu Corp Radiation image-pickup device
JP2002000590A (en) * 2000-06-23 2002-01-08 Shimadzu Corp Radiograph
JP2004364336A (en) * 1998-01-08 2004-12-24 Canon Inc Radiation image processing apparatus and radiation image processing method
JP2005000369A (en) * 2003-06-11 2005-01-06 Canon Inc X-ray irradiating condition controller

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH039600B2 (en) * 1982-02-26 1991-02-08 Shimadzu Corp
JPH05292402A (en) * 1992-04-14 1993-11-05 Toshiba Corp X-ray diagnostic device
JPH06154198A (en) * 1992-11-27 1994-06-03 Toshiba Corp X-ray diagnostic device
JPH10234714A (en) * 1997-02-21 1998-09-08 Toshiba Iyou Syst Eng Kk X-ray radiographic device
JPH119581A (en) * 1997-06-20 1999-01-19 Toshiba Corp X-ray diagnostic apparatus
JP2004364336A (en) * 1998-01-08 2004-12-24 Canon Inc Radiation image processing apparatus and radiation image processing method
JPH11311673A (en) * 1998-04-28 1999-11-09 Shimadzu Corp Radiation image-pickup device
JP2002000590A (en) * 2000-06-23 2002-01-08 Shimadzu Corp Radiograph
JP2005000369A (en) * 2003-06-11 2005-01-06 Canon Inc X-ray irradiating condition controller

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013027816A1 (en) * 2011-08-25 2013-02-28 富士フイルム株式会社 Radiographic imaging system, radiographic imaging method and radiographic imaging system error-processing method
WO2013042413A1 (en) * 2011-09-21 2013-03-28 富士フイルム株式会社 Radiographic moving image processing device, radiographic moving image shooting device, radiographic moving image shooting system, radiographic moving image shooting method, and radiographic moving image shooting program
WO2013154179A1 (en) * 2012-04-13 2013-10-17 富士フイルム株式会社 Radiographic system and method for operating same
JPWO2013154179A1 (en) * 2012-04-13 2015-12-21 富士フイルム株式会社 Radiation imaging system and operating method thereof
US9521987B2 (en) 2012-04-13 2016-12-20 Fujifilm Corporation Radiation imaging system and operating method thereof
WO2015059795A1 (en) * 2013-10-24 2015-04-30 株式会社島津製作所 Radioscopic apparatus

Similar Documents

Publication Publication Date Title
JP6342437B2 (en) Radiation tomography system and control program therefor
US9125619B2 (en) Radiographic examination apparatus and method for the same
JP4699167B2 (en) X-ray diagnostic imaging equipment
US9724064B2 (en) Radiographic apparatus
US20130077750A1 (en) X-ray apparatus
JP2009153589A (en) X-ray imaging apparatus
JP2008125610A (en) Radiographic x-ray equipment
JP5573688B2 (en) Radiography equipment
JP2009297284A (en) Radiation image photographing apparatus and method
JP6397659B2 (en) X-ray image diagnostic apparatus and X-ray control method
US10506997B2 (en) X-ray diagnostic apparatus
JP2007222311A (en) X-ray imaging apparatus
JP2003230555A (en) X-ray fluoroscopic imaging diagnostic equipment
US11324461B2 (en) X-ray imaging apparatus
JP2011098009A (en) X-ray diagnostic apparatus
JP3491563B2 (en) X-ray equipment
JP2010075555A (en) X-ray diagnostic imaging apparatus
JP5392111B2 (en) X-ray fluoroscopic equipment
JP5640690B2 (en) X-ray inspection equipment
JP2007213979A (en) X-ray diagnostic apparatus
JP2007244484A (en) X-ray diagnostic equipment
JP7392478B2 (en) Magnification calculation device, long-length photographing system, program, and magnification calculation method
JP5581704B2 (en) X-ray equipment
JP2018191983A (en) X-ray fluoroscopic device
JP2007097666A (en) X-ray diagnostic apparatus and x-ray diagnostic apparatus control program

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20091008

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110915

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110927

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20111125

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120717

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20130108