JP2008042143A5 - - Google Patents
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- JP2008042143A5 JP2008042143A5 JP2006218463A JP2006218463A JP2008042143A5 JP 2008042143 A5 JP2008042143 A5 JP 2008042143A5 JP 2006218463 A JP2006218463 A JP 2006218463A JP 2006218463 A JP2006218463 A JP 2006218463A JP 2008042143 A5 JP2008042143 A5 JP 2008042143A5
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- Prior art keywords
- compound semiconductor
- nitride compound
- group iii
- iii nitride
- substrate
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- 239000000758 substrate Substances 0.000 claims 18
- 239000010410 layer Substances 0.000 claims 17
- -1 nitride compound Chemical class 0.000 claims 14
- 239000004065 semiconductor Substances 0.000 claims 14
- 238000004519 manufacturing process Methods 0.000 claims 6
- 239000002184 metal Substances 0.000 claims 6
- 239000012790 adhesive layer Substances 0.000 claims 4
- 239000011368 organic material Substances 0.000 claims 4
- 238000000059 patterning Methods 0.000 claims 2
- 238000000926 separation method Methods 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 238000001039 wet etching Methods 0.000 claims 1
Claims (5)
エピタキシャル成長用基板に、少なくともn型のIII族窒化物系化合物半導体層と、最上層のp型のIII族窒化物系化合物半導体層までの所望の積層構造を形成するエピタキシャル成長工程と、
最上層である前記p型のIII族窒化物系化合物半導体層の上面に透光性電極を形成する透光性電極形成工程と、
透光性電極側に、主として有機材料から成る接着剤から成る接着層により一時保持用の保持基板を接着する保持基板接着工程と、
前記エピタキシャル成長用基板を除く成長基板除去工程と、
露出した前記n型のIII族窒化物系化合物半導体層裏面に高反射性金属層を形成する反射金属形成工程と、
前記高反射性金属層に覆われた前記n型のIII族窒化物系化合物半導体層裏面側に、導体による接続層を表面に形成した導電性基板を接合する導電性基板接合工程と、
前記保持基板と前記有機材料から成る接着層とを除去する保持基板除去工程と
を少なくとも有することを特徴とするIII族窒化物系化合物半導体発光素子の製造方法。 In the method for producing a group III nitride compound semiconductor light emitting device,
An epitaxial growth step of forming a desired laminated structure on at least an n-type group III nitride compound semiconductor layer and an uppermost p-type group III nitride compound semiconductor layer on an epitaxial growth substrate;
A translucent electrode forming step of forming a translucent electrode on the upper surface of the p-type group III nitride compound semiconductor layer which is the uppermost layer;
A holding substrate bonding step in which a holding substrate for temporary holding is bonded to the translucent electrode side by an adhesive layer made mainly of an organic material ;
A growth substrate removing step excluding the epitaxial growth substrate;
A reflective metal forming step of forming a highly reflective metal layer on the back surface of the exposed n-type group III nitride compound semiconductor layer;
A conductive substrate bonding step of bonding a conductive substrate having a conductive connection layer formed on the back side of the n-type Group III nitride compound semiconductor layer covered with the highly reflective metal layer;
A method of manufacturing a group III nitride compound semiconductor light emitting device, comprising at least a holding substrate removing step of removing the holding substrate and the adhesive layer made of the organic material.
前記保持基板除去工程においては、前記金属から成る犠牲層を分解又は除去した後に前記保持基板と前記有機材料から成る接着層とを除去するものであることを特徴とする請求項1に記載のIII族窒化物系化合物半導体発光素子の製造方法。 In the holding substrate bonding step, the holding substrate is bonded to the translucent electrode side with an adhesive layer made of the organic material through a sacrificial layer made of metal,
3. The III of claim 1, wherein in the holding substrate removing step, the holding substrate and the adhesive layer made of the organic material are removed after the sacrificial layer made of the metal is decomposed or removed. A method for manufacturing a group nitride compound semiconductor light emitting device.
当該透光性電極をパターニングする工程と、
パターニング後の当該透光性電極を覆う耐ウエットエッチング層を設ける工程とを有することを特徴とする請求項2に記載のIII族窒化物系化合物半導体発光素子の製造方法。 After the translucent electrode forming step,
Patterning the translucent electrode;
The method for producing a Group III nitride compound semiconductor light-emitting device according to claim 2, further comprising a step of providing a wet etching-resistant layer that covers the translucent electrode after patterning.
前記導電性基板上に形成された積層構造を、最上層の前記p型のIII族窒化物系化合物半導体層側から、前記n型のIII族窒化物系化合物半導体層に達し、且つ前記高反射性金属層には達しないように、第1のダイシングブレードにより、分離用の第1の溝を形成するハーフカット工程と、
前記第1のダイシングブレードよりも厚さの薄い第2のダイシングブレードにより、前記導電性基板まで達する分離用の第2の溝を形成するフルカット工程と
を有することを特徴とする請求項1乃至請求項3のいずれか1項に記載のIII族窒化物系化合物半導体発光素子の製造方法。 Following the holding substrate removal step,
The stacked structure formed on the conductive substrate reaches the n-type Group III nitride compound semiconductor layer from the p-type Group III nitride compound semiconductor layer side of the uppermost layer and is highly reflective. A half-cut step of forming a first groove for separation by a first dicing blade so as not to reach the conductive metal layer;
2. A full cut step of forming a second groove for separation reaching the conductive substrate by a second dicing blade having a thickness smaller than that of the first dicing blade. The manufacturing method of the group III nitride compound semiconductor light-emitting device of any one of Claim 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006218463A JP2008042143A (en) | 2006-08-10 | 2006-08-10 | Group iii nitride compound semiconductor light emitting element, and its manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006218463A JP2008042143A (en) | 2006-08-10 | 2006-08-10 | Group iii nitride compound semiconductor light emitting element, and its manufacturing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008042143A JP2008042143A (en) | 2008-02-21 |
JP2008042143A5 true JP2008042143A5 (en) | 2010-09-16 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2006218463A Withdrawn JP2008042143A (en) | 2006-08-10 | 2006-08-10 | Group iii nitride compound semiconductor light emitting element, and its manufacturing method |
Country Status (1)
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JP (1) | JP2008042143A (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101470020B1 (en) * | 2008-03-18 | 2014-12-10 | 엘지이노텍 주식회사 | epitaxial semiconductor thin-film transfer using sandwich-structured wafer bonding and photon-beam |
JP2009231549A (en) * | 2008-03-24 | 2009-10-08 | Toyoda Gosei Co Ltd | Nitride-based semiconductor light-emitting device |
WO2009148253A2 (en) | 2008-06-02 | 2009-12-10 | 고려대학교 산학협력단 | Supporting substrate for fabrication of semiconductor light emitting device and semiconductor light emitting device using the same |
JP5237764B2 (en) * | 2008-11-10 | 2013-07-17 | スタンレー電気株式会社 | Manufacturing method of semiconductor device |
JP5237763B2 (en) * | 2008-11-10 | 2013-07-17 | スタンレー電気株式会社 | Manufacturing method of semiconductor device |
JP5237765B2 (en) * | 2008-11-10 | 2013-07-17 | スタンレー電気株式会社 | Manufacturing method of semiconductor device |
KR101608868B1 (en) * | 2009-10-22 | 2016-04-04 | 삼성전자주식회사 | Light emitting diode array integrated with apertures, line printer head, and method of fabricating the light emitting diode array |
JPWO2011118489A1 (en) * | 2010-03-24 | 2013-07-04 | 住友ベークライト株式会社 | LIGHT EMITTING DEVICE MANUFACTURING METHOD AND LIGHT EMITTING DEVICE USING THE SAME |
WO2013030690A1 (en) | 2011-08-30 | 2013-03-07 | Koninklijke Philips Electronics N.V. | Method of bonding a substrate to a semiconductor light emitting device |
DE102012111358A1 (en) | 2012-11-23 | 2014-05-28 | Osram Opto Semiconductors Gmbh | Method for separating a composite into semiconductor chips and semiconductor chip |
DE102013108583A1 (en) | 2013-08-08 | 2015-03-05 | Osram Opto Semiconductors Gmbh | Method for separating a composite into semiconductor chips and semiconductor chip |
JP6312552B2 (en) * | 2014-08-07 | 2018-04-18 | シャープ株式会社 | Semiconductor light emitting device manufacturing method and semiconductor light emitting device |
DE102016124646A1 (en) | 2016-12-16 | 2018-06-21 | Osram Opto Semiconductors Gmbh | Method for producing a semiconductor component |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005210066A (en) * | 2003-12-25 | 2005-08-04 | Kyocera Corp | Thin film light emitting device and manufacturing method of the same |
JP4868709B2 (en) * | 2004-03-09 | 2012-02-01 | 三洋電機株式会社 | Light emitting element |
JP2005276900A (en) * | 2004-03-23 | 2005-10-06 | Shin Etsu Handotai Co Ltd | Light-emitting element |
JP4817629B2 (en) * | 2004-09-15 | 2011-11-16 | 京セラ株式会社 | LIGHT EMITTING ELEMENT AND LIGHTING DEVICE USING THE LIGHT EMITTING ELEMENT |
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2006
- 2006-08-10 JP JP2006218463A patent/JP2008042143A/en not_active Withdrawn
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