JP2008033306A5 - - Google Patents

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Publication number
JP2008033306A5
JP2008033306A5 JP2007175161A JP2007175161A JP2008033306A5 JP 2008033306 A5 JP2008033306 A5 JP 2008033306A5 JP 2007175161 A JP2007175161 A JP 2007175161A JP 2007175161 A JP2007175161 A JP 2007175161A JP 2008033306 A5 JP2008033306 A5 JP 2008033306A5
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JP
Japan
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defect
unit
image
corrected
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Pending
Application number
JP2007175161A
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English (en)
Japanese (ja)
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JP2008033306A (ja
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Priority to JP2007175161A priority Critical patent/JP2008033306A/ja
Priority claimed from JP2007175161A external-priority patent/JP2008033306A/ja
Publication of JP2008033306A publication Critical patent/JP2008033306A/ja
Publication of JP2008033306A5 publication Critical patent/JP2008033306A5/ja
Pending legal-status Critical Current

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JP2007175161A 2006-07-03 2007-07-03 欠陥修正装置 Pending JP2008033306A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007175161A JP2008033306A (ja) 2006-07-03 2007-07-03 欠陥修正装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006183111 2006-07-03
JP2007175161A JP2008033306A (ja) 2006-07-03 2007-07-03 欠陥修正装置

Publications (2)

Publication Number Publication Date
JP2008033306A JP2008033306A (ja) 2008-02-14
JP2008033306A5 true JP2008033306A5 (zh) 2010-07-22

Family

ID=39122729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007175161A Pending JP2008033306A (ja) 2006-07-03 2007-07-03 欠陥修正装置

Country Status (1)

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JP (1) JP2008033306A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5158365B2 (ja) * 2008-11-14 2013-03-06 オムロン株式会社 基板の欠陥検査装置
CN103978306B (zh) * 2014-04-23 2016-10-05 成都精密光学工程研究中心 熔石英光学元件激光修复装置及修复方法
TW202134634A (zh) * 2020-03-13 2021-09-16 由田新技股份有限公司 共生式複檢系統、及共生式複檢方法
CN112018000B (zh) * 2020-08-06 2021-07-20 武汉大学 一种具有晶体结构检测及原位修复功能的装置
WO2024029048A1 (ja) * 2022-08-04 2024-02-08 株式会社Fuji 画像出力装置および画像出力システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000206480A (ja) * 1999-01-14 2000-07-28 Advanced Display Inc 液晶表示装置の修復支援装置およびその方法
JP2002196257A (ja) * 2000-12-25 2002-07-12 Nikon Corp 画像処理装置、コンピュータ読取可能な記録媒体、及び顕微鏡システム。
JP2004257824A (ja) * 2003-02-25 2004-09-16 Shimadzu Corp 液晶基板管理装置
JP4079841B2 (ja) * 2003-06-30 2008-04-23 オリンパス株式会社 欠陥表示装置

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