JP2008026093A5 - - Google Patents

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JP2008026093A5
JP2008026093A5 JP2006197590A JP2006197590A JP2008026093A5 JP 2008026093 A5 JP2008026093 A5 JP 2008026093A5 JP 2006197590 A JP2006197590 A JP 2006197590A JP 2006197590 A JP2006197590 A JP 2006197590A JP 2008026093 A5 JP2008026093 A5 JP 2008026093A5
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Japan
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thin film
film
amorphous
layer
multilayer
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JP2006197590A
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Japanese (ja)
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JP2008026093A (en
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Priority to JP2006197590A priority Critical patent/JP2008026093A/en
Priority claimed from JP2006197590A external-priority patent/JP2008026093A/en
Publication of JP2008026093A publication Critical patent/JP2008026093A/en
Publication of JP2008026093A5 publication Critical patent/JP2008026093A5/ja
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本発明の多層膜反射鏡の製造方法は、基板上に、Mo薄膜からなる第1層と、Si薄膜からなる第2層を交互に積層した反射多層膜を有する多層膜反射鏡の製造方法であって、前記第1層の成膜工程において非晶質のMo薄膜を成膜する工程と、非晶質のMo薄膜にイオンビームを照射る工程と、イオンビームを照射した前記非晶質のMo薄膜上に前記第2層を成膜する工程と、を有することを特徴とする。 The manufacturing method of the multilayer-film reflective mirror of this invention is a manufacturing method of the multilayer-film reflective mirror which has the reflective multilayer film which laminated | stacked the 1st layer which consists of Mo thin films, and the 2nd layer which consists of Si thin films on a board | substrate alternately. there are the steps of forming an amorphous Mo thin in the film forming process of the first layer, the steps you an ion beam is irradiated on the Mo thin film of amorphous, the amorphous irradiated with ion beams And depositing the second layer on the Mo thin film.

Claims (3)

基板上に、Mo薄膜からなる第1層と、Si薄膜からなる第2層を交互に積層した反射多層膜を有し、前記第1層が、膜厚が2nm以上13nm以下である非晶質のMo薄膜であることを特徴とする多層膜反射鏡。   On the substrate, there is a reflective multilayer film in which a first layer made of Mo thin film and a second layer made of Si thin film are alternately laminated, and the first layer has an amorphous film thickness of 2 nm or more and 13 nm or less A multilayer film reflecting mirror characterized by being a Mo thin film. 前記Mo薄膜中にRu、Rh、Pd、Y、Be、Sr、Rb、P、C、Pr、Si、Zrの元素よりなる群から選択された少なくとも1種の元素が、0.5原子%以上10原子%以下の割合で含有されたことを特徴とする請求項1記載の多層膜反射鏡。   In the Mo thin film, at least one element selected from the group consisting of Ru, Rh, Pd, Y, Be, Sr, Rb, P, C, Pr, Si, and Zr is 0.5 atomic% or more. 2. The multilayer film reflector according to claim 1, wherein the multilayer film reflector is contained at a ratio of 10 atomic% or less. 基板上に、Mo薄膜からなる第1層と、Si薄膜からなる第2層を交互に積層した反射多層膜を有する多層膜反射鏡の製造方法であって、
前記第1層の成膜工程において非晶質のMo薄膜を成膜する工程と、
非晶質のMo薄膜にイオンビームを照射る工程と、
イオンビームを照射した前記非晶質のMo薄膜上に前記第2層を成膜する工程と、を有することを特徴とする多層膜反射鏡の製造方法。
A method of manufacturing a multilayer reflector having a reflective multilayer film in which a first layer made of Mo thin film and a second layer made of Si thin film are alternately laminated on a substrate,
A step of forming an amorphous Mo thin film in the step of forming the first layer;
A step you an ion beam is irradiated on the Mo thin film of amorphous
And a step of forming the second layer on the amorphous Mo thin film irradiated with an ion beam .
JP2006197590A 2006-07-20 2006-07-20 Multilayer film reflection mirror and method for manufacturing it Pending JP2008026093A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006197590A JP2008026093A (en) 2006-07-20 2006-07-20 Multilayer film reflection mirror and method for manufacturing it

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006197590A JP2008026093A (en) 2006-07-20 2006-07-20 Multilayer film reflection mirror and method for manufacturing it

Publications (2)

Publication Number Publication Date
JP2008026093A JP2008026093A (en) 2008-02-07
JP2008026093A5 true JP2008026093A5 (en) 2009-09-03

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Family Applications (1)

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JP2006197590A Pending JP2008026093A (en) 2006-07-20 2006-07-20 Multilayer film reflection mirror and method for manufacturing it

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5716038B2 (en) * 2009-12-15 2015-05-13 カール・ツァイス・エスエムティー・ゲーエムベーハー Reflective optical element for EUV lithography
KR20130059384A (en) * 2010-06-25 2013-06-05 캐논 아네르바 가부시키가이샤 Sputtering device, deposition method, and control device
KR102051730B1 (en) * 2018-01-12 2019-12-04 한양대학교 산학협력단 Phase shifter mask that comprising spacer pattern and phase shift pattern, and fabricating method of the same
US11275300B2 (en) 2018-07-06 2022-03-15 Applied Materials Inc. Extreme ultraviolet mask blank defect reduction
TWI818151B (en) 2019-03-01 2023-10-11 美商應用材料股份有限公司 Physical vapor deposition chamber and method of operation thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001027700A (en) * 1999-07-14 2001-01-30 Nikon Corp Multi-layer film reflecting mirror, manufacture of it, control method for stress of multi-layer film reflecting mirror, and exposure device
US6228512B1 (en) * 1999-05-26 2001-05-08 The Regents Of The University Of California MoRu/Be multilayers for extreme ultraviolet applications
JP4461652B2 (en) * 2001-07-31 2010-05-12 株式会社ニコン Multilayer film reflector and method for producing multilayer film mirror
EP3389056A1 (en) * 2003-06-02 2018-10-17 Nikon Corporation Multilayer film reflector and x-ray exposure system
JP2005049122A (en) * 2003-07-30 2005-02-24 Nikon Corp Multilayer-film reflector and exposure device

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