JP2008010893A5 - - Google Patents

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Publication number
JP2008010893A5
JP2008010893A5 JP2007248076A JP2007248076A JP2008010893A5 JP 2008010893 A5 JP2008010893 A5 JP 2008010893A5 JP 2007248076 A JP2007248076 A JP 2007248076A JP 2007248076 A JP2007248076 A JP 2007248076A JP 2008010893 A5 JP2008010893 A5 JP 2008010893A5
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JP
Japan
Prior art keywords
substrate
exposure apparatus
optical system
projection optical
stage
Prior art date
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Application number
JP2007248076A
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Japanese (ja)
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JP4533416B2 (en
JP2008010893A (en
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Publication date
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Priority to JP2007248076A priority Critical patent/JP4533416B2/en
Priority claimed from JP2007248076A external-priority patent/JP4533416B2/en
Publication of JP2008010893A publication Critical patent/JP2008010893A/en
Publication of JP2008010893A5 publication Critical patent/JP2008010893A5/ja
Application granted granted Critical
Publication of JP4533416B2 publication Critical patent/JP4533416B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Claims (7)

影光学系を有し、該投影光学系の最終面と基板との間隙に満たされた液体と該投影光学系と原版とを介して該基板を露光する露光装置であって、
前記基板を保持し移動するステージと、
前記投影光学系の最終面の周囲に配置され、前記ステージに保持された前記基板の表面に対向する第1の面と、前記ステージに保持された前記基板の表面に対向し且つ前記第1の面より外側に配置されて前記第1の面の前記表面からの距離とは異なる前記表面からの距離を有する第2の面と、前記間隙に液体を供給する供給口と、前記第2の面に且つ前記供給口の外側に配置されて前記間隙から液体を回収する回収口とを含む部材と、
を有することを特徴とする露光装置。
It has a projecting projection optical system, an exposure apparatus that exposes a substrate through a final surface and gaps filled liquid and the projection optical system and the precursor of the substrate of the projection optical system,
A stage that moves while holding the substrate,
A first surface disposed around the final surface of the projection optical system, facing the surface of the substrate held on the stage, facing the surface of the substrate held on the stage, and the first surface A second surface disposed outside the surface and having a distance from the surface different from a distance from the surface of the first surface; a supply port for supplying a liquid to the gap; and the second surface And a member that is disposed outside the supply port and collects the liquid from the gap, and
An exposure apparatus comprising:
投影光学系を有し、該投影光学系の最終面と基板との間隙に満たされた液体と該投影光学系と原版とを介して該基板を露光する露光装置であって、An exposure apparatus that has a projection optical system and exposes the substrate through the liquid filled in the gap between the final surface of the projection optical system and the substrate, the projection optical system, and the original plate,
前記基板を保持して移動するステージと、  A stage that holds and moves the substrate;
前記投影光学系の最終面の周囲に配置され、前記ステージに保持された前記基板の表面に対向する第1の面と、前記ステージに保持された前記基板の表面に対向し且つ前記第1の面より外側に配置されて前記第1の面の前記表面からの距離とは異なる前記表面からの距離を有する第2の面と、前記間隙に液体を供給する供給口と、前記第1の面に且つ前記供給口の外側に配置されて前記間隙から液体を回収する回収口とを含む部材と、  A first surface disposed around the final surface of the projection optical system, facing the surface of the substrate held on the stage, facing the surface of the substrate held on the stage and the first surface A second surface disposed outside the surface and having a distance from the surface that is different from a distance from the surface of the first surface; a supply port for supplying liquid to the gap; and the first surface And a member that is disposed outside the supply port and collects the liquid from the gap, and
を有することを特徴とする露光装置。An exposure apparatus comprising:
前記第2の面は、前記第1の面の前記表面からの距離より小さい前記表面からの距離を有する、ことを特徴とする請求項1または2に記載の露光装置。The exposure apparatus according to claim 1, wherein the second surface has a distance from the surface that is smaller than a distance from the surface of the first surface. 前記第2の面は、前記最終面を取り囲むように配置されている、ことを特徴とする請求項1乃至3のいずれか一項に記載の露光装置。The exposure apparatus according to claim 1, wherein the second surface is disposed so as to surround the final surface. 前記供給口は、前記第1の面に配置されている、ことを特徴とする請求項1乃至4のいずれか一項に記載の露光装置。The exposure apparatus according to claim 1, wherein the supply port is disposed on the first surface. 前記第2の面に配置されてガスを吹き出す吹き出し口を有する、ことを特徴とする請求項2に記載の露光装置。The exposure apparatus according to claim 2, further comprising a blowout port disposed on the second surface and configured to blow out gas. 請求項1乃至6のいずれか一項に記載の露光装置を用いて基板を露光する工程と、A step of exposing a substrate using the exposure apparatus according to claim 1;
前記工程で露光された基板を現像する工程と、  Developing the substrate exposed in the step;
を有することを特徴とするデバイス製造方法。A device manufacturing method comprising:
JP2007248076A 2007-09-25 2007-09-25 Exposure apparatus and device manufacturing method Expired - Fee Related JP4533416B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007248076A JP4533416B2 (en) 2007-09-25 2007-09-25 Exposure apparatus and device manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007248076A JP4533416B2 (en) 2007-09-25 2007-09-25 Exposure apparatus and device manufacturing method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2005291809A Division JP4164508B2 (en) 2005-10-04 2005-10-04 Exposure apparatus and device manufacturing method

Publications (3)

Publication Number Publication Date
JP2008010893A JP2008010893A (en) 2008-01-17
JP2008010893A5 true JP2008010893A5 (en) 2009-11-19
JP4533416B2 JP4533416B2 (en) 2010-09-01

Family

ID=39068748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007248076A Expired - Fee Related JP4533416B2 (en) 2007-09-25 2007-09-25 Exposure apparatus and device manufacturing method

Country Status (1)

Country Link
JP (1) JP4533416B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2005951A (en) 2010-02-02 2011-08-03 Asml Netherlands Bv Lithographic apparatus and a device manufacturing method.
WO2013100114A1 (en) * 2011-12-28 2013-07-04 株式会社ニコン Exposure device, exposure method, device manufacturing method, liquid collection method, program and recording medium

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI232357B (en) * 2002-11-12 2005-05-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
KR20130010039A (en) * 2002-12-10 2013-01-24 가부시키가이샤 니콘 Exposure system and device producing method
JP4184346B2 (en) * 2002-12-13 2008-11-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Liquid removal in a method and apparatus for irradiating a spot on a layer
JP4352930B2 (en) * 2003-02-26 2009-10-28 株式会社ニコン Exposure apparatus, exposure method, and device manufacturing method
KR101177331B1 (en) * 2003-04-09 2012-08-30 가부시키가이샤 니콘 Immersion lithography fluid control system
SG10201604762UA (en) * 2003-04-10 2016-08-30 Nikon Corp Environmental system including vacuum scavange for an immersion lithography apparatus
KR101409565B1 (en) * 2003-04-10 2014-06-19 가부시키가이샤 니콘 Environmental system including a transport region for an immersion lithography apparatus
JP2004320016A (en) * 2003-04-11 2004-11-11 Nikon Corp Liquid immersion lithography system
US7213963B2 (en) * 2003-06-09 2007-05-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
KR101520591B1 (en) * 2003-06-13 2015-05-14 가부시키가이샤 니콘 Exposure method, substrate stage, exposure apparatus and method for manufacturing device
CN101436003B (en) * 2003-06-19 2011-08-17 株式会社尼康 Exposure apparatus and device manufacturing method
US6867844B2 (en) * 2003-06-19 2005-03-15 Asml Holding N.V. Immersion photolithography system and method using microchannel nozzles

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