JP2007292723A - Automatic test system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an automatic test system capable of widening a testable range when testing a plurality of test samples simultaneously by a plurality of control devices, and executing a test efficiently. <P>SOLUTION: A measurement processing part 1b of a control PC 1 in the plurality of control devices performs test item determination 23 and detailed test determination 24 so that general-purpose measuring devices are not used competitively on reference to a detailed test item data table 21. Furthermore, after performing determination 25 of a usable measuring device and processing 26 of the measuring device, the measurement processing part 1b of the control PC 1 sets exclusively a measuring device used by itself in a measuring device data table 22, and extracts and secures the measuring device to be used from inside a general-purpose measuring device group 12 through a communication interface 1e. Then, the measurement processing part 1b of the control PC 1 performs acquisition processing 27 of a test result to the test sample, and displays the test result on a display part 1c, and after finish of the test, sets the measuring device in an unused state relative to a pertinent column of the measuring device data table 22. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  In the present invention, a plurality of measuring devices are used to simultaneously test a desired test item on a device under test (hereinafter also referred to as a test device), and an automatic measurement test is performed on the test device. More particularly, the present invention relates to an automatic test system that simultaneously tests a plurality of test devices while controlling a plurality of measuring devices using a control device (personal computer: PC).

  For example, when various tests are performed on a communication system such as a mobile phone system or a navigation system, a plurality of measuring devices corresponding to each test item are required. When performing such a test, it is necessary to immediately grasp the measuring instruments necessary for performing the test of each test item in order to shorten the test time. Therefore, in order to realize this, a test management system technology is disclosed in which a test of a single test item is efficiently performed using a plurality of measuring devices having different measurement functions (see, for example, Patent Document 1). ). According to this technology, a measuring device for performing a desired measurement, comprising a storage means for storing a measuring function necessary for each test item and a measuring instrument having each measuring function, a test item table, and a measuring instrument model table. If there is a shortage, information to that effect can be displayed immediately. As a result, it is possible to immediately grasp the measuring instrument necessary for performing the test regardless of the skill level of the test operator, so that the test of each test item can be performed smoothly without fail.

An automatic test system that simultaneously tests a plurality of test devices by controlling a plurality of measuring devices using a plurality of control devices (PCs) is also known. In such an automatic test system using a control device, the use of measuring instruments competes between each test equipment based on information on which measuring equipment is used in a plurality of tests performed for each test equipment. Therefore, it is determined whether or not a desired test can be performed by checking the presence or absence of a measuring instrument that can be used for each EUT. Therefore, according to this automatic test system, a plurality of measuring devices can be controlled by a plurality of control devices to automatically measure a plurality of EUTs at the same time, thereby reducing the operator's work and reducing the test time. It becomes possible to do.
JP 2003-283446 A

  However, the conventional automatic test system that tests multiple EUTs at the same time while controlling multiple measuring instruments using multiple controllers is a general-purpose measurement that is different for each test item to test each EUT. When multiple test devices are tested at the same time under the control of multiple control devices, the measurement device used for a test item is the same between the two test devices. Because the use of the measuring device is competing, the test of the other tester (referred to as tester B) is performed while the test of one tester (referred to as tester A) is being performed. I can't. For this reason, while the test of one tester (tester A) is being performed, the test of the other tester (tester B) must be interrupted. May decrease. In the technique of Patent Document 1 above, since it is not determined whether or not the same measuring device is used in competition between the respective test instruments, under the situation where the measuring device is used in competition. The operating efficiency of the test may be reduced.

  In addition, the conventional automatic test system that controls using a plurality of control devices registers the type of measuring instrument used in the test of each EUT in each control device, and performs the test on each control device. In doing so, the control device (referred to as “test device A”) which is the object of the test currently being conducted by another control device is determined, and the test device (referred to as “test device B”) to be implemented from now on. It is determined whether or not the test can be realized, and the operator is notified whether or not the test of the EUT B is possible. That is, the control device determines whether or not the test can be performed for each EUT.

  On the other hand, general-purpose measuring instruments use many types of measuring instruments in tests of any of the EUTs (for example, EUT A and EUT B). For this reason, when each control device conducts tests on multiple EUTs at the same time, each control device must determine the presence or absence of contention between EUTs for many types of measuring instruments. Therefore, it is considerably complicated to determine whether or not a test can be performed for each EUT. Furthermore, since each EUT uses many types of measuring instruments, the probability of using the same measuring instrument increases, so that each control device is not allowed to perform tests on multiple EUTs at the same time. More cases are possible.

  The present invention has been made in view of the above-described problems, and expands the testable range when a plurality of test devices are simultaneously tested by a plurality of control devices, and a plurality of controls are provided by a plurality of control devices. An object of the present invention is to provide an automatic test system that can efficiently and automatically test a tester.

  In order to solve the above-described problems, an automatic test system according to the present invention is an automatic test system that simultaneously tests a plurality of devices under test (test devices) while controlling a plurality of measuring devices using a plurality of control devices. It is a test system, and displays a measuring instrument data table that displays the used state and unused state for each measuring instrument, and a detailed test item for each EUT and a measuring instrument used for each detailed test. A detailed test item data table is provided, and the test of the detailed item selected from the detailed test item data table is performed by referring to the measuring device data table and the detailed test item data table to check whether or not the measuring device is competingly used. The structure which determines whether or not is adopted.

  That is, according to the automatic test system of the present invention, when each control device performs a test on the EUT at the same time, the test items of each EUT are subdivided to determine the measuring instrument to be used in each detailed test. And the desired measuring instrument is used exclusively. As a result, even if a plurality of control devices perform tests simultaneously, the probability that the detailed test items performed by each control device will differ increases, so the probability that the measuring instrument will be used in a competitive manner decreases. Therefore, the width (implementation width) in which simultaneous testing can be performed while using measuring instruments exclusively by a plurality of control devices can be increased, and as a result, the test time can be made more efficient.

  According to the automatic test system of the present invention, when a plurality of control devices automatically measure a plurality of EUTs at the same time (automatic test), a detailed test is performed from the unit of each EUT. The item unit has been changed. As a result, when a plurality of control devices perform tests simultaneously, the probability that the detailed test items are different in each control device increases, so the probability that the plurality of control devices exclusively use the same measuring device also increases. Therefore, since the implementation range in which a plurality of control devices can simultaneously perform a test can be expanded, the time efficiency of the test can be improved.

  The automatic test system of the present invention is an automatic test system for simultaneously testing a plurality of EUTs while controlling a plurality of measuring instruments using a plurality of control devices, wherein each measuring instrument is used and unused. And a detailed test item data table showing detailed test items of each EUT (device under test) and measuring instruments used in each detailed test. As a result, each control device controls a plurality of measuring instruments and performs detailed tests on each EUT, referring to the measuring instrument data table and the detailed test item data table. The presence or absence can be confirmed, and it can be determined whether or not it is possible to carry out the test of each EUT in a state where the respective measuring instruments are not used competitively. With such a test method, each control device can expand the scope of simultaneous testing, and as a result, it becomes possible to shorten the test time of each EUT and increase the efficiency of the test. .

  In other words, the conventional automatic test system performs testing by checking whether each measuring device is used or not based on information about which measuring device is used in multiple tests performed for each EUT. Was determined whether or not. However, the automatic test system of the present invention does not check whether or not the measuring instrument is used for each EUT as in the conventional automatic test system, and determines whether or not the simultaneous test can be performed. Since it is determined whether or not the simultaneous test can be performed for each detailed test item, the test of each EUT can be performed efficiently.

(Embodiment 1)
Next, an embodiment of an automatic test system according to the present invention will be described in detail with reference to the drawings. FIG. 1 is a system configuration diagram for realizing an automatic test system according to an embodiment of the present invention. In the automatic test system of the present embodiment, a plurality of control devices (control PC1, control PC2,... Control PCX) are connected to the LAN 11, and a plurality of control devices (control PC1, control PC2,. The general-purpose measuring instrument group 12 and the dedicated tester group 13 are connected by a communication line 14 such as GP-IB, RS-232C, or LAN. Further, a plurality of test devices (test device 15-1, test device 15-2,..., Test device 15-n) are connected to a plurality of control devices (control PC1, control PC2, control PC2 through the connection BOX 16). ... connected to control PCX).

  The general-purpose measuring instrument group 12 is composed of various general-purpose measuring instruments such as a standard signal generator 12a that generates a standard signal (reference signal) and a phase detector 12b that detects a phase. The dedicated tester group 13 includes a dedicated tester AAA13a or a dedicated tester which is a tester unique to each tester (tester 15-1, tester 15-2, ... tester 15-n). It is constituted by a tester BBB13b and the like.

  Next, the operation of the automatic test system shown in FIG. 1 will be described. First, in order to facilitate understanding of the present invention, a plurality of control devices (control PC1, control PC2,... Control PCX) have been performed conventionally. A description will be given of the exclusive control processing of the test execution. When the control PC1, which is a control device, controls the standard signal generator 12a of the general-purpose measuring instrument group 12 and the dedicated tester AAA13a of the dedicated tester group 13 to perform the test of the EUT 15-1, The control PC2 is based on the information on which measuring instrument the control PC1 uses, and the phase detector 12b of the general-purpose measuring instrument group 12 and the dedicated tester group 13 as measuring instruments not used by the control PC1. The tester 15-2 is tested by controlling the dedicated tester BBB13b. As a result, the control PC1 and the control PC2 that are the control devices perform the tests of the respective test devices (that is, the test device 15-1 and the test device 15-2) exclusively at the same time without competing for the measuring devices. It can be carried out.

  As described above, the conventional automatic test system uses each test device (for example, a test device) in advance as an exclusive control process of the measuring device when a plurality of control devices (for example, the control PC 1 and the control PC 2) simultaneously perform a test. In the test of the tester 15-1 and the tester 15-2), the control PC1 and the control PC2 respectively hold measuring instrument usage information indicating which measuring instrument is used, and each tester (tester) It is determined whether or not the test can be performed simultaneously in the test units of the tester 15-1 and the tester 15-2).

  At this time, when each control device (for example, control PC1 and control PC2) determines whether or not simultaneous testing is possible for each unit of test equipment (for example, test equipment 15-1 and test equipment 15-2). In many cases, many general-purpose measuring instruments are used in the test of each EUT (EUT 15-1 and EUT 15-2). As a result, the probability that each EUT (EUT 15-1 and EUT 15-2) uses the same general-purpose measuring instrument (for example, the phase detector 12b) is increased. In many cases, it becomes impossible to test the tester 15-1 and the tester 15-2 at the same time, and as a result, the test efficiency may be lowered.

  Therefore, in the automatic test system of the present invention, when each control device (for example, control PC1 and control PC2) tests each EUT (for example, EUT 15-1 and EUT 15-2) at the same time. Therefore, we decided to make the usage status of general-purpose measuring instruments information-based in more detailed test item units.

  That is, if the unit is a detailed test item, the types of general-purpose measuring instruments used by the respective EUTs (for example, EUT 15-1 and EUT 15-2) are limited. When (for example, control PC1 and control PC2) perform exclusive control of general-purpose measuring instruments in units of test items, the same general-purpose measuring instrument (for example, phase detector 12b) is simultaneously used by control PC1 and control PC2. Since the probability is lower, the number of cases in which the simultaneous test by the control PC 1 and the control PC 2 can be performed can be increased as compared with the conventional automatic test system, and as a result, the test efficiency can be improved.

  Therefore, as a method for realizing the simultaneous test with a plurality of control devices (for example, control PC1 and control PC2) by the automatic test system of the present invention, each general-purpose measuring device (standard signal generation) in the general-purpose measuring device group 12 is used. A data table (that is, a measuring instrument data table) indicating a used / unused state with respect to the detector 12a, the phase detector 12b, etc.) is created, and each control device (control PC1, control PC2,... Control PCX) Share the instrument data table.

  Further, which general-purpose measuring device is used when each test device (test device 15-1, test device 15-2,..., Test device 15-n) performs each test of detailed test items. An understandable data table (that is, a detailed test item data table) is created so that each control device (control PC1, control PC2,... Control PCX) can share and refer to the detailed test item data table.

  At this time, each control device (control PC1, control PC2,... Control PCX) is a detailed test item of each test device (test device 15-1, test device 15-2,..., Test device 15-n). Check the detailed test item data table to see what general-purpose measuring instrument is used in the detailed test item to be performed at the stage of performing the test, and refer to the measuring instrument data table to determine whether the general-purpose measuring instrument is used. The information can be obtained and the test can be carried out without a general-purpose measuring device competing between the test devices (test device 15-1, test device 15-2,..., Test device 15-n). Judge whether there is. At this time, if even one general-purpose measuring instrument included in the detailed test item data table is in use, the other control device determines that the test cannot be performed.

  Further, since there is no general-purpose measuring device competing among the control devices (control PC1, control PC2,... Control PCX), each test device (test device 15-1, test device 15-2,. If it is possible to carry out the test in the tester 15-n), each control device (control PC1, control PC2,... Control PCX) measures information that the general-purpose measuring instrument used by itself is in use. Perform the desired test after setting the instrument data table. In addition, after the test is completed, the general-purpose measuring device is set to the unused state in the measuring device data table.

  Hereinafter, with reference to the drawings, a process in which the control device performs a simultaneous test on each EUT under exclusive control in the automatic test system of the present invention will be described in more detail.

  FIG. 2 is a hardware configuration diagram of a control device for realizing the automatic test system of the present invention. That is, the hardware configuration of the control device shown in FIG. 2 is developed for one control device (for example, control PC1) among the control devices (control PC1, control PC2,... Control PCX) of FIG. All the control devices have the same hardware configuration.

  As shown in FIG. 2, the control PC 1 that is a control device includes a detailed test item for each EUT and a detailed test item data table 21 indicating a measuring instrument to be used in each detailed test, and whether the general-purpose measuring instrument is used / not used. A database 1a for storing a measuring instrument data table 22 indicating a use state, a test item determination 23, a detailed test determination 24, a measuring instrument determination 25, a measuring instrument processing 26, and a measurement processing section 1b for performing a result acquisition process 27, and a result The display unit 1c that displays the acquisition result of the measuring instrument by the acquisition process 27, the operation unit 1d that performs various operations on the measurement processing unit 1b, and the external general-purpose measuring instrument group 12 and the dedicated tester group 13 are connected. The communication interface 1e serving as an interface is provided.

  FIG. 3 is a diagram showing an example of the measuring instrument data table 22 held by the control PC 1 shown in FIG. As shown in the measuring instrument data table in FIG. 3, the plurality of control devices are a control PC 1, a control PC 2, and a control PC 3. The dedicated tester group 13 is a dedicated tester AAA and the dedicated tester BBB, and the general-purpose measuring instrument group 12 is a power meter, phase detector, spectrum analyzer, standard signal generator, low frequency analyzer, error rate. Measuring instrument, digital voltmeter, etc.

  As shown in the measuring instrument data table of FIG. 3, when the measuring instrument is in use, “1” is set to secure the measuring instrument. On the other hand, when the measuring instrument is not used, “0” is set to open the measuring instrument so that it can be used freely. The example of the measuring instrument data table in FIG. 3 shows a state where the control PC 1 secures a power meter and a phase detector, and the control PC 2 secures a spectrum analyzer. Note that the control PC 3 is set to “0” for all measuring instruments because the test is not performed.

  In this way, a measuring instrument data table as shown in FIG. 3 is created, and each control device (that is, control PC1, control PC2, and control PC3) makes each general-purpose measuring instrument (power meter, phase detector, spectrum analyzer). Etc.) is displayed whether it is in use or unused. As a result, each control device (control PC1, control PC2, and control PC3) can share the use state data of each general-purpose measuring instrument, so that each control device (control PC1, control PC2, and control PC3) Each general purpose measuring instrument can be used exclusively according to the contents of the measuring instrument data table.

  FIG. 4 is a diagram showing an example of the detailed test item data table 21 held by the control PC 1 shown in FIG. As shown in the detailed test item data table of FIG. 4, necessary measuring instruments are registered in advance for each test item. For example, a power meter is registered for use in the antenna power transmission output test, a spectrum analyzer is registered for use in the occupied frequency bandwidth test, a phase detector is registered in the transmission frequency accuracy test, and transmission is further performed. As shown in the detailed test item data table of FIG. 4, each general-purpose measuring device is registered for use for each item of the detailed test, such as using the spectrum analyzer in the spurious intensity test. In the example of FIG. 4, the dedicated tester group is only the dedicated tester AAA, and the dedicated tester AAA is registered for use in the case of the reception sensitivity test, the TONE transmission test, and the side tone output test.

  In this way, a detailed test item data table as shown in FIG. 4 is created so that each tester can know which general-purpose measuring instrument is used to perform each detailed test item. The devices (control PC1, control PC2, and control PC3) can share and refer to the detailed test item data table.

  Therefore, when each control device performs a test on each EUT, the measuring instrument to be used is determined with reference to the detailed test item data table of FIG. 4, and then the measuring instrument data table of FIG. Refer to determine whether the test can be performed.

  For example, when the control PC 1 performs the detailed test items of each EUT, the general-purpose measuring instrument used in the transmission output test is a power meter among the detailed test items to be performed, and the general-purpose meter used in the transmission frequency accuracy test. It is confirmed from the detailed test item data table of FIG. 4 that the measuring instrument is a phase detector.

  Then, the control PC 1 confirms that the power meter and the phase detector are not used by other control devices (the control PC 2 and the control PC 3) with reference to the measuring instrument data table of FIG. It is possible to set the power meter and phase detector column to “1” to ensure exclusive use of those general-purpose measuring instruments (ie, power meter and phase detector) Conduct a test on Then, when the test is completed, “0” is set in the columns of the wattmeter and the phase detector to set it to an unused state so that it can be used by other control devices (control PC 2 and control PC 3).

  Similarly, when the control PC 2 executes the detailed test items of each EUT, the general-purpose measuring instrument used in the occupied frequency bandwidth test among the detailed test items to be executed is a spectrum analyzer. Confirm with the detailed test item data table.

  The control PC 2 can check that the spectrum analyzer is not used by other control devices (the control PC 1 and the control PC 3) by referring to the measuring instrument data table of FIG. Therefore, “1” is set in the column of the spectrum analyzer to ensure exclusive use of the general-purpose measuring instrument (that is, the spectrum analyzer), and the test is performed on the corresponding EUT. When the test is completed, “0” is set in the spectrum analyzer column to set it to an unused state so that it can be used by other control devices (control PC1 and control PC3). In this way, each control device (control PC1, control PC2, and control PC3) can efficiently perform a test on each EUT without competingly using each general-purpose measuring instrument.

  Next, a flow of processing in which a plurality of control devices use a general-purpose measuring device exclusively and simultaneously test a plurality of EUTs using the automatic test system of the present invention will be described using a flowchart.

  FIG. 5 is a flowchart showing a processing flow when the control device shown in FIG. 2 performs a simultaneous test on a plurality of EUTs. Therefore, referring to FIG. 2, the flow of processing in which the control PC 1 performs simultaneous tests on a plurality of EUTs by exclusive control according to the flowchart of FIG. 5 will be described.

  First, when the control PC 1 starts a test program for the EUT, the control PC 1 selects a test target substrate to be the EUT and starts performing the test (step S1). At this time, the control PC 1 selects detailed test items for the test to be performed (step S2). Then, the measurement processing unit 1b of the control PC 1 refers to the detailed test item data table 21 stored in the database 1a to determine whether or not the general-purpose measuring instrument used for the selected detailed test item is already in use. Is determined (step S3). That is, according to the processing flow in the system configuration of FIG. 2, the measurement processing unit 1b of the control PC 1 refers to the detailed test item data table 21 to test item determination 23 so that the general-purpose measuring instrument is not used in competition. And detailed test determination 24 is performed.

  If the general-purpose measuring device is in the unused state in the determination in step S3, the process waits until the general-purpose measuring device is in the unused state. If the general-purpose measuring device is in the unused state, the measurement processing unit 1b of the control PC 1 In order to use the general-purpose measuring instrument to be used by the control PC 1 from now on, a flag “1” is set in the column of the corresponding general-purpose measuring instrument (for example, wattmeter and phase detector) in the measuring instrument data table 22. Then, the general-purpose measuring instrument is set to a use state (step S4). That is, according to the processing flow in the system configuration of FIG. 2, the measurement processing unit 1 b of the control PC 1 performs usable measuring device determination 25 and measuring device processing 26, and the corresponding general-purpose measuring device in the measuring device data table 22. Is set to “1”, and the measuring instrument to be used is extracted and secured from the general-purpose measuring instrument group 12 and the dedicated tester group 13 via the communication interface 1e.

  Next, the control PC 1 performs a test on the EUT in accordance with the selected detailed test item (step S5), and when the test of the detailed test item is completed, the corresponding general-purpose measuring device (for example, the power) A flag of “0” is set in the column of “meter and phase detector”, and the general-purpose measuring device (for example, power meter and phase detector) is set to an unused state (step S6). That is, according to the process flow in the system configuration of FIG. 2, the measurement processing unit 1b of the control PC 1 performs the test result acquisition process 27 for the EUT and displays the test result on the display unit 1c.

  In this way, the control PC 1 determines whether or not the test has been completed for all selected detailed test items (step S7), and if there are tests for other detailed test items, the control PC 1 returns to step S2 and described above. Repeat the process. On the other hand, if it is determined in step S7 that the test is completed for all selected detailed test items, the control PC 1 ends the test program for the EUT.

(Embodiment 2)
In this embodiment, when the detailed test items executed by each control device (control PC1, control PC2,..., Control PCX) compete, the detailed test items are stacked as pending, and other detailed test items to be executed are displayed. If it is present, the test time efficiency is further increased as compared with the first embodiment. This embodiment will be described with reference to the flowcharts shown in FIGS. 2 and 6.

  First, when starting the test program for the tester, the control PC 1 selects a test target base material to be the tester and starts the test (step S8). At this time, the control PC 1 selects detailed test items for the test to be performed (step S9). Then, the measurement processing unit 1b of the control PC 1 refers to the detailed test item data table 21 stored in the database 1a to determine whether or not the general-purpose measuring instrument used for the selected detailed test item is already in use. Is determined (step S10). That is, according to the processing flow of FIG. 6 in the system configuration of FIG. 2, the measurement processing unit 1b of the control PC 1 refers to the detailed test item data table 21 and performs a test so that the general-purpose measuring instrument is not used in competition. Item determination 23 and detailed test determination 24 are performed.

  Here, if the general-purpose measuring instrument is in use in the determination in step S10, the control PC 1 stacks the detailed test item as a pending state (step S11), and other details to be implemented besides the detailed test item. If there is a test item, it is executed first (return from step S11 to step S9). In this way, detailed test items (detailed test items that can be performed by the control PC 1 at this time) that are not performed by other control devices are first performed, and the detailed test items that have been put on hold are performed at a timing that can be performed. As a result, the efficiency of the test execution time can be increased.

  On the other hand, after the execution of the detailed test item (step S13) of the other control device that has performed the detailed test item, the corresponding general-purpose measuring device (for example, a power meter and the like) in the measuring device data table 22 is completed. A flag of “0” is set in the “phase detector” column, the general-purpose measuring instrument (for example, wattmeter and phase detector) is set to an unused state, and the detailed test item is ended (step S14). .

  The control PC 1 processes the subsequent detailed test items in the same manner (steps S9 to S15). When all the detailed test items have no pending state or unfinished state, the control PC 1 ends the test program for the EUT. . The details of each process from step S9 to step S15 are the same as in the first embodiment.

1 is a system configuration diagram for realizing an automatic test system of the present invention. It is a hardware block diagram of the control apparatus for implement | achieving the automatic test system of this invention. It is a figure which shows an example of the measuring device data table 22 which control PC1 shown in FIG. 2 hold | maintains. It is a figure which shows an example of the detailed test item data table 21 which control PC1 shown in FIG. 2 hold | maintains. It is a flowchart which shows the flow of a process when the control apparatus shown in FIG. 2 implements a simultaneous test with respect to several EUT. FIG. 3 is a flowchart of processing when the control device shown in FIG. 2 performs a simultaneous test on a plurality of EUTs, and is a flowchart considering a pending state.

Explanation of symbols

1 control PC1, 1a database, 1b measurement processing unit, 1c display unit, 1d operation unit, 1e communication interface, 2 control PC2, X control PCX, 11 LAN, 12 general-purpose measuring instrument group, 12a standard signal generator, 12b phase detection , 13 Dedicated tester group, 13a Dedicated tester AAA, 13b Dedicated tester BBB, 14 Communication line, 15-1, 15-2, ... 15-n EUT (device under test), 16 BOX, 21 Details Test item data table, 22 measuring instrument data table, 23 test item determination, 24 detailed test determination, 25 measuring instrument determination, 26 measuring instrument processing, 27 result acquisition processing

Claims (1)

An automatic test system for simultaneously testing a plurality of devices under test while controlling a plurality of measuring devices using a plurality of control devices,
A measuring instrument data table for displaying the used state and the unused state for each measuring instrument;
A detailed test item data table for displaying the detailed test items for each device under test in association with the measuring instruments used in each detailed test,
Referring to the measuring instrument data table and the detailed test item data table, it is checked whether or not the measuring instrument is competitively used, and it is determined whether to test the detailed item selected from the detailed test item data table. An automatic test system characterized by

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