JP2007240246A - Inspection device using microchip - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection device using a microchip, wherein the constitution of a photodetection part is simple, and the device has a small size and low cost, and installation thereof is easy. <P>SOLUTION: This device is characterized by being equipped with: a microchip storage part capable of storing the microchip having a plurality of parts to be detected; a light source for irradiating light toward the plurality of parts to be detected of the microchip stored in the microchip storage part; and the photodetection part having an optical path branching means for branching the optical path of the light source relative to each of the plurality of parts to be detected and a light receiving part for receiving the light from the light source irradiated toward the plurality of parts to be detected. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an inspection apparatus using a microchip.

  In recent years, a micro total analysis system (μTAS) that performs analysis by mixing and reacting a plurality of solutions on a microchip in which microchannels are integrated and processed is drawing attention. Has been.

  μTAS has advantages such as a small amount of sample, a short reaction time, and a small amount of waste. When used in the medical field, the burden on the patient can be reduced by reducing the amount of specimen (blood, urine, wiping liquid, etc.), and the cost of the test can be reduced by reducing the amount of reagent. In addition, since the amount of sample and reagent is small, the reaction time is greatly shortened, and the efficiency of the test can be improved. Furthermore, since the device is small, it can be installed in a small medical institution, and a test can be performed quickly regardless of location.

  In particular, in μTAS, a reaction result between a reagent and a specimen is used as, for example, an examination result by determining the concentration in a plurality of detected parts provided in advance in a microchip. In addition, a plurality of density data are detected from a plurality of detected parts by the light detection unit.

  Patent Document 1 relates to a chemical analyzer that analyzes a sample solution and a reagent solution to be analyzed in a light absorption channel provided in advance and analyzes them according to the degree of light absorption, and applies light emitted from a light source to a reflecting surface. In order to guide the reflected light along the light absorption flow path, a chemical analyzer is described in which a prism is rotated to finely adjust the light path.

In Patent Document 2, an output from an area sensor that receives a reflected light amount from a specimen can be converted into an appropriate electrical signal corresponding to the amount of received light by adjusting the intensity of light emitted from a light source by a light variable unit. Thus, a measuring apparatus is described in which the measurement accuracy of the content of components contained in a specimen is improved.
JP-A-9-243642 JP 2005-3000528 A

  However, the chemical analyzer of Patent Document 1 finely adjusts the optical path of light from the light source by rotating the prism, and is not for projecting light onto a plurality of detection target portions. Therefore, when the prisms of Patent Document 1 are provided for each optical path in the optical path for projecting light to a plurality of detected parts in the microchip, the accuracy of the optical path is expected to be greatly improved. There are problems that it becomes extremely complicated and expensive, and that the apparatus cannot be miniaturized.

  In addition, the measuring device of Patent Document 2 is such that the light variable unit adjusts the intensity of light emitted from the light source so that the output from the area sensor can be converted into an appropriate electrical signal. It is not provided in order to obtain outputs from a plurality of detected parts. Therefore, when projecting light onto a plurality of detected parts, if the light variable part and area sensor of Patent Document 2 are provided, the accuracy of the detection signal is expected to be significantly improved. Similarly, there is a problem in that the configuration of the apparatus becomes extremely complicated and costs increase, and the apparatus cannot be reduced in size.

  In view of the above problems, an object of the present invention is to provide an inspection apparatus using a microchip, which has a simple configuration of a light detection unit, a small apparatus, is inexpensive, and can be easily installed.

This invention can achieve the said objective by taking the following structure.
1.
A microchip accommodating portion capable of accommodating a microchip having a plurality of detected portions;
A light source for irradiating the plurality of detected parts of the microchip accommodated in the microchip accommodating part, an optical path branching unit for branching an optical path of the light source with respect to each of the plurality of detected parts, and the plurality An inspection apparatus using a microchip, comprising: a light detection section having a light receiving section that receives light from the light source irradiated to the detected section.
2.
The light detection unit is
For each of the plurality of detected parts by the optical path branching means,
2. The inspection apparatus using the microchip according to 1, wherein the light from the light source is irradiated at the same angle.
3.
The optical path branching means is
A reflective member that reflects light;
3. The inspection apparatus using the microchip according to 1 or 2, further comprising an operating unit that operates the reflecting member to branch the optical path of the light source.
4).
The operating means is
4. The inspection apparatus using a microchip according to 3, wherein the reflecting member is moved or rotated with respect to the optical path of the light source.
5).
5. The inspection apparatus using a microchip according to any one of claims 1 to 4, wherein the light receiving portion is provided with a single light receiving element corresponding to the plurality of detected portions of the microchip.

  In the present invention, since the optical path branching means for branching the optical path of the light source with respect to each of the plurality of detected parts of the microchip is provided, a plurality of detected parts can be detected with a single light source. Therefore, it is possible to provide an inspection apparatus using a microchip that is small, inexpensive, and easy to install.

  In addition, by irradiating the light from the light source at the same angle, it is not necessary to consider the influence of the transmittance, reflectance, etc. at the interface of the detected part of the microchip for each detected part. Since it can be made constant, highly accurate detection can be performed, and the configuration of the optical system of the light detection unit can be simplified, so that an inspection apparatus using a microchip that is small, inexpensive, and easy to install can be provided.

  In addition, since the light path can be easily branched at an appropriate timing by providing an operating means for operating the reflecting member to branch the optical path of the light source, it is possible to detect a plurality of detected parts efficiently and quickly with high accuracy. Since the configuration of the optical system of the light detection unit can be simplified, it is possible to provide an inspection apparatus using a microchip that is small, inexpensive, and easy to install.

  In addition, by providing a single light-receiving element corresponding to a plurality of detected parts as the light-receiving element of the light-receiving part, the measurement conditions can be made constant by a single light source and a single light-receiving element, so highly accurate detection In addition, since the configuration of the optical system of the light detection unit can be simplified, it is possible to provide an inspection device using a microchip that is small, inexpensive, and easy to install.

  Hereinafter, the present invention will be described in detail with reference to the drawings, but the present invention is not limited thereto. In addition, in each drawing, the thing of the same code | symbol shall show the same thing, and shall be demonstrated in detail suitably with reference to other related drawings.

  In the present embodiment, as an example, a case where a specimen and a reagent are reacted on a microchip is shown, but the present invention is not limited to this, and can be applied to a case where at least two types of fluids are mixed on a microchip.

  FIG. 1 is an external view of an inspection apparatus 80 using the microchip according to the present embodiment. The inspection device 80 is a device that automatically reacts a sample and a reagent previously injected into the microchip 1 and automatically outputs a reaction result.

  The casing 82 of the inspection device 80 is provided with an insertion port 83 for inserting the microchip 1 into the device, a display unit 84, a memory card slot 85, a print output port 86, an operation panel 87, and an external input / output terminal 88. It has been.

  The person in charge of inspection inserts the microchip 1 in the direction of the arrow in FIG. 1 and operates the operation panel 87 to start the inspection. Inside the inspection device 80, the reaction in the microchip 1 is automatically inspected, and when the inspection is completed, the result is displayed on the display unit 84. The inspection result can be output from the print output port 86 or stored in a memory card inserted into the memory card slot 85 by operating the operation panel 87. Further, data can be stored in the personal computer or the like from the external input / output terminal 88 using, for example, a LAN cable. After completion of the inspection, the inspection person takes out the microchip 1 from the insertion port 83.

  FIG. 2 is a configuration diagram of an inspection apparatus 80 using the microchip according to the present embodiment. FIG. 2 shows a state where the microchip is inserted from the insertion port 83 shown in FIG. 1 and the setting is completed.

  The inspection apparatus 80 includes a driving liquid tank 10 that stores a driving liquid 11 for feeding a sample and a reagent previously injected into the microchip 1, a pump 5 for supplying the driving liquid 11 to the microchip 1, and a pump 5. Packing 6 that connects the microchip 1 and the microchip 1 without leakage, a temperature control unit 3 that controls the temperature of a necessary part of the microchip 1, a chip pressing plate 2 that makes the microchip 1 adhere to the packing 6 so as not to be displaced, and chip pressing A pressing plate drive unit 32 for raising and lowering the plate 2, a regulating member 31 for accurately positioning the microchip 1 with respect to the pump 5, and a light detection unit 4 for detecting a reaction state between the specimen and the reagent in the microchip 1. (Light emitting unit 4a, light receiving unit 4b) and the like. The light receiving portion 4b is provided inside the chip pressing plate 2 and has an integral structure.

  In the initial state, the chip pressing plate 2 is retracted upward from the state of FIG. Thereby, the microchip 1 can be inserted / removed in the direction of the arrow X, and the person inspecting inserts the microchip 1 from the insertion port 83 (see FIG. 1) until it comes into contact with the regulating member 31. Thereafter, the chip pressing plate 2 is moved downward by the pressing plate driving unit 32 and comes into contact with the microchip 1, and the lower surface of the microchip 1 is in close contact with the temperature control unit 3 and the packing 6.

  The temperature control unit 3 controls the temperature of a necessary part of the microchip 1. For example, the part containing the reagent is cooled so that the reagent is not denatured, or the part where the sample and the reagent react is heated. And has a function of promoting the reaction.

  The pump 5 includes a pump chamber 52, a piezoelectric element 51 that changes the volume of the pump chamber 52, a first throttle channel 53 that is located on the microchip 1 side of the pump chamber 52, and a first that is located on the drive fluid tank 10 side of the pump chamber. It is composed of two throttle channels 54 and the like. The first throttle channel 53 and the second throttle channel 54 are narrow and narrow channels, and the first throttle channel 53 is longer than the second throttle channel 54.

  In the case where the driving liquid 11 is fed in the forward direction (direction toward the microchip 1), first, the piezoelectric element 51 is driven so as to rapidly reduce the volume of the pump chamber 52. Then, a turbulent flow is generated in the second throttle channel 54 that is a short throttle channel, and the channel resistance in the second throttle channel 54 is relatively larger than that of the first throttle channel 53 that is a throttle channel. growing. As a result, the driving liquid 11 in the pump chamber 52 is predominantly pushed toward the first throttle channel 53 and fed. Next, the piezoelectric element 51 is driven so that the volume of the pump chamber 52 is gradually increased. Then, the driving liquid 11 flows from the first throttle channel 53 and the second throttle channel 54 as the volume in the pump chamber 52 increases. At this time, since the length of the second throttle channel 54 is shorter than that of the first throttle channel 53, the channel resistance of the second throttle channel 54 is smaller than that of the first throttle channel 53. Thus, the driving liquid 11 flows predominantly from the second throttle channel 54 into the pump chamber 52. When the piezoelectric element 51 repeats the above operation, the driving liquid 11 is fed in the forward direction.

  On the other hand, when the driving liquid 11 is fed in the reverse direction (direction toward the driving liquid tank 10), first, the piezoelectric element 51 is driven so that the volume of the pump chamber 52 is gradually reduced. Then, since the length of the second throttle channel 54 is shorter than that of the first throttle channel 53, the channel resistance of the second throttle channel 54 is smaller than that of the first throttle channel 53. . As a result, the driving liquid 11 in the pump chamber 52 is predominantly pushed out toward the second throttle channel 54 and fed. Next, the piezoelectric element 51 is driven so that the volume of the pump chamber 52 is rapidly increased. Then, the driving liquid 11 flows from the first throttle channel 53 and the second throttle channel 54 as the volume in the pump chamber 52 increases. At this time, turbulent flow is generated in the second throttle channel 54, which is a short throttle channel, and the channel resistance in the second throttle channel 54 is relatively larger than that of the first throttle channel 53, which is a throttle channel. Become bigger. As a result, the driving liquid 11 flows into the pump chamber 52 predominantly from the first throttle channel 53. When the piezoelectric element 51 repeats the above operation, the driving liquid 11 is fed in the reverse direction.

  FIG. 3 is a configuration diagram of the microchip 1 according to the present embodiment. An example configuration is shown, and the present invention is not limited to this.

  In FIG. 3A, an arrow indicates an insertion direction in which the microchip 1 is inserted into an inspection apparatus 80 to be described later, and FIG. 3A illustrates a surface that becomes the lower surface of the microchip 1 at the time of insertion. FIG. 3B is a side view of the microchip 1.

  As shown in FIG. 3B, the microchip 1 includes a groove forming substrate 108 and a covering substrate 109 that covers the groove forming substrate 108.

  The microchip 1 according to the present embodiment includes a minute groove-like channel (microchannel) and a functional component (channel element) for performing chemical analysis, various inspections, sample processing / separation, chemical synthesis, and the like. ) Are arranged in an appropriate manner according to the application. An example of processing performed in the microchip 1 by these fine flow paths and flow path elements will be described with reference to FIG. FIG. 3C shows a state where the coated substrate 109 is removed in FIG.

  The fine channel is provided with a sample storage unit 121 that stores a sample liquid, a reagent storage unit 120 that stores a reagent, a positive control storage unit 122 that stores a positive control, a negative control storage unit 123 that stores a negative control, and the like. ing. Reagents, positive controls, and negative controls are stored in advance in the storage units. The positive control reacts with the reagent and shows positive, and the negative control reacts with the reagent and shows negative, and is used to confirm whether or not an accurate test has been performed.

  The sample injection unit 113 is an injection unit for injecting the sample into the microchip 1, and the driving liquid injection units 110 a to 110 d are injection units for injecting the driving liquid 11 into the microchip 1.

  First, prior to performing a test using the microchip 1, the person in charge of the test injects a sample from the sample injection unit 113 using a syringe or the like. As shown in FIG. 3C, the sample injected from the sample injection unit 113 is stored in the sample storage unit 121 through the communicating fine channel.

  Next, the microchip 1 into which the sample is injected is inserted into the insertion port 83 of the inspection apparatus 80 shown in FIG. 1 by the inspection person, and set as shown in FIG.

  Next, the pump 5 shown in FIG. 2 is driven in the forward direction, and the driving liquid 11 is injected from the driving liquid injection units 110a to 110d. The driving liquid 11 injected from the driving liquid injection unit 110 a pushes out the sample stored in the sample storage unit 121 through the communicating fine flow path, and sends the sample to the junction unit 124. The driving liquid 11 injected from the driving liquid injection section 110 b pushes out the positive control stored in the positive control storage section 122 through the communicating fine flow path, and sends the positive control to the junction section 125. The driving liquid 11 injected from the driving liquid injection section 110 c pushes out the negative control stored in the negative control storage section 123 through the communicating fine flow path, and sends the negative control to the junction section 126. The driving liquid 11 injected from the driving liquid injection part 110d pushes out the reagent stored in the reagent storage part 120 through the communicating fine flow path, and sends the reagent into the merging parts 124 to 126.

  In this way, the sample and the reagent merge at the junction 124, the positive control and the reagent merge at the junction 125, and the negative control and the reagent merge at the junction 126.

  Thereafter, a part of the mixed liquid of the specimen and the reagent merged at the merging portion 124 is sent to the detected portion 111a. A part of the mixed liquid of the specimen and the reagent joined at the joining part 124 and a part of the mixed liquid of the positive control and the reagent joined at the joining part 125 are sent to the detected part 111b. A part of the mixed liquid of the positive control and the reagent merged in the merge unit 125 is sent to the detected unit 111c. The liquid mixture of the negative control and the reagent merged at the merge unit 126 is sent to the detected unit 111d.

  The detected part window 111e and the detected parts 111a to 111d are provided for optically detecting the reaction of each liquid mixture, and are made of a transparent member such as glass or resin.

  FIG. 4 is a schematic diagram showing the configuration of the optical system of the light detection unit according to the present embodiment. As the optical path branching means, there are, for example, a first operating system that linearly operates a reflecting mirror for branching the optical path and a second operating system that rotates the reflecting mirror. Further, there are a transmitted light type that detects transmitted light of light irradiated to the detected part and a reflected light type that detects reflected light reflected.

  FIG. 4 (a) relates to the transmitted light type of the first operation method. A plurality of reflecting members are inserted into and removed from the optical path of one light source, the light is branched, and light is supplied to a plurality of detected parts. The structure of the optical system to irradiate is shown. Assume that the microchip 1 is provided with 111a, 111b, and 111c as detected portions.

  In addition, the to-be-detected parts 111a, 111b, and 111c in this embodiment communicate with the fine flow path in the microchip 1, and, for example, the driving liquid and the reagent, the mixed state of several reagents, or the reaction between the reagent and the specimen A state or the like is appropriately provided at a place where the light detection unit 4 needs to detect the state. Further, in order to simplify the description, in the present embodiment, the detected portions 111a, 111b, and 111c are provided in three places, but the number is not limited to this.

  Reference numeral 4 a denotes a light emitting unit as a light source of the light detection unit 4. The light emitting unit 4a emits light along the optical path L in order to irradiate the detected portions 111a, 111b, and 111c with light.

  M1, M2, and M3 indicate three reflecting mirrors M as reflecting members of the optical path branching means. The reflecting mirrors M1, M2, and M3 branch the optical path L of the light emitted from the light emitting section 4a into the optical paths L1, L2, and L3, and irradiate the detected sections 111a, 111b, and 111c.

  The light receiving elements 4b1, 4b2, 4b3 are provided corresponding to the detected parts 111a, 111b, 111c. In the light receiving elements 4b1, 4b2, and 4b3, the light of the light emitting unit 4a is branched into the optical paths L1, L2, and L3 by the reflecting mirrors M1, M2, and M3, and irradiates the detected units 111a, 111b, and 111c and receives the transmitted light. It is like that.

  Here, the operation of the light detection unit shown in FIG. 4A will be briefly described.

  First, a control unit (not shown) of the inspection apparatus 80 is activated to fix the microchip 1 at a predetermined position so that the light detection unit 4 can detect it.

  When detecting the detected portion 111a of the microchip 1, the reflecting mirror M1 enters the optical path L as indicated by the arrow from the initial position M12 indicated by a broken line and stops at the M1 position by an operating means (not shown). Is done.

  Subsequently, when the light emitting unit 4a emits light along the optical path L, the light branched into the optical path L1 by the reflecting mirror M1 irradiates the detected part 111a. The light irradiated to the detected portion 111a passes through the detected portion 111a of the microchip 1 and is received by the light receiving element 4b1. The light received by the light receiving element 4b1 is photoelectrically converted by a control circuit (not shown), and after predetermined processing, inspection data relating to the detected portion 111a is stored in a storage means (not shown) as an electrical signal. When the detection operation is completed, the reflecting mirror M1 is operated so as to leave the optical path L to the initial position M12.

  The same applies to the detection of the detected parts 111b and 111c. The light of the light emitting part 4a enters the optical path L from the initial positions M22 and M32 to the positions of the reflecting mirrors M2 and M3 at an appropriate timing, so that the light of the light emitting part 4a is detected. , 111c and transmitted through the detected parts 111b, 111c are received by the light receiving elements 4b2, 4b3, and the states of the detected parts 111b, 111c are detected. When inspection data relating to the detected portions 111b and 111c based on the light received by the light receiving elements 4b2 and 4b3 is stored in the storage means and the detection operation is finished, the reflecting mirrors M2 and M3 are withdrawn from the optical path L, and the initial position M22. , M32.

  In the light detection unit shown in FIG. 4A, the light of one light emitting unit 4a as a light source is reflected at the same angle with respect to the detected portions 111a, 111b, and 111c by the reflecting mirrors M1, M2, and M3. Irradiated and incident on the light receiving elements 4b1, 4b2, 4b3 at the same angle to receive light.

  Therefore, the characteristics of one light source and the angle at which the light from the light source irradiates the detected portions 111a, 111b, and 111c are the same, and the light receiving elements 4b1, 4b2, and 4b3 receive light through the detected portions 111a, 111b, and 111c. Since the angles are the same, conditions such as transmittance and reflectance at the interfaces of the detected portions 111a, 111b, and 111c are substantially constant.

  Therefore, the light receiving elements 4b1, 4b2, and 4b3 are almost unaffected by variations in characteristics for each light source and variations in transmittance and reflectance at the interface of the detection target portion, and can be detected with high accuracy.

  FIG. 4B relates to the transmitted light type of the second operation method, and the light is branched by rotating one reflecting member with respect to the optical path of one light source, and the light is transmitted to a plurality of detected parts. The structure of the optical system which irradiates is shown.

  In FIG. 4B, the light receiving elements 4b1, 4b2, and 4b3 are installed such that the light receiving surfaces are perpendicular to the optical paths L1, L2, and L3 as the respective incident optical paths.

  The actuating means rotates the reflecting mirror M around an O point where it intersects the optical path L of the light emitting section 4a. When the reflecting mirror M is at the position (Ma), the light from the light emitting section 4a is branched from the optical path L to the optical path L1 to be detected. The part 111a is irradiated. When the reflecting mirror M is at the (Mb) position, the light from the light emitting section 4a is branched from the optical path L to the optical path L2, and irradiates the detected section 111b. When the reflecting mirror M is in the (Mc) position, the light of the light emitting unit 4a is branched from the optical path L to the optical path L3 and irradiates the detected unit 111c. Light transmitted through the detected parts 111a, 111b, and 111c is received by the light receiving elements 4b1, 4b2, and 4b3.

  In the light detection unit shown in FIG. 4B, the light of one light emitting unit 4a as a light source is rotated by one reflecting mirror M to branch the optical path. As the detected parts are located at both ends as described above, the irradiated light may be reflected by the light emitting part 4a such as L1R and L3R at the interface of the microchip 1.

  Therefore, in the case of the second operating method in which the light is branched by rotating the reflecting member, it is necessary to use a detection circuit that can perform detection in consideration of the reflectance and transmittance of the interface corresponding to each detected part in advance. There is. However, since it is only necessary to rotate one reflecting mirror, there is an advantage that a small-sized operating means can be configured relatively easily and inexpensively compared with an operating means for operating the reflecting mirror linearly.

  FIG. 5 is a schematic view showing another embodiment of the transmitted light type of the first operation method of the light detection unit according to the present embodiment. FIG. 5 (c) shows that a single reflecting member is moved along the optical path of one light source to a position corresponding to the detected part to diverge the optical path and irradiate a plurality of detected parts with light. 1 shows the configuration of an optical system. The configuration related to the light emitting unit 4a, the microchip 1, and the light receiving elements 4b1, 4b2, and 4b3 as the light source is the same as the configuration of the photodetecting unit shown in FIG.

  The reflecting mirror M as a reflecting member reciprocates from the (Ma) position corresponding to the detected parts 111a, 111b, and 111c to the (Mb) and (Mc) positions along the optical path L of the light emitting part 4a. For example, when the reflecting mirror M whose angle is fixed at 45 degrees is fixed at the (Ma) position, the optical path L of the light emitting unit 4a is branched to the optical path L1 to irradiate the detected part 111a, and the reflecting mirror M When fixed at the (Mb) position, the optical path L of the light emitting section 4a is branched to the optical path L2 to irradiate the detected section 111b, and when the reflecting mirror M is fixed at the (Mc) position, the optical path of the light emitting section 4a. L branches to the optical path L3 and irradiates the detected part 111c. Light transmitted through the detected parts 111a, 111b, and 111c is received by the light receiving elements 4b1, 4b2, and 4b3.

  The light detection unit shown in FIG. 5 (c) can be composed of one light emitting unit 4a as a light source and one reflecting mirror fixed at a predetermined angle, so that it is fixed at a predetermined angle with the light source. The conditions such as the characteristics of the reflecting mirror can be made constant, and similarly to FIG. 4A, since the light of the light source transmitted through the detected portion at the same angle is incident on the light receiving element and received. Highly accurate detection can be performed without being affected by variations in the characteristics of the light source and the reflector, and variations in the transmittance and reflectance at the interface of the detected part.

  As shown in FIG. 5D, in order to detect the detected portions 111a, 111b, and 111c of the microchip 1 with high accuracy, the reflecting mirror M that irradiates light from the light source in the inspection apparatus 80 should be large. It is necessary not to become too small.

  In the present embodiment, when the width d of the reflecting mirror M facing the microchip 1, the interval D between the detected portions 111a, 111b, and 111c, and the width of each of the detected portions 111a, 111b, and 111c are set as W. , It is preferable to set the width d of the reflecting mirror M so as to satisfy the relationship of W ≦ d ≦ D. Further, as shown in FIG. 5 (d), in consideration of the distance between the detected portions 111a, 111b, and 111c, the light receiving element receives light for a plurality of detected portions within a range where the light receiving element does not become extremely large. It is also possible to form one light receiving element without providing each element. In other words, it can be taken into account when configuring the detection circuit in advance so as not to be affected by variations in the light receiving elements, but in order not to place a burden on the detection circuit, the same light receiving element may be used. preferable.

  FIG. 6 is a schematic diagram showing a reflected light type embodiment of the first operation method of the light detection unit according to the present embodiment.

  In FIG. 6E, one half mirror MR as a reflecting mirror and one light receiving element 4b are configured as a pair, and move along the optical path L of one light emitting portion 4a as a light source. The structure of the optical system of the comprised photon detection part is shown.

  For example, when the half mirror MR is at the (Ma) position, the light from the light emitting unit 4a is branched from the optical path L to the optical path L1 by the half mirror MR. The light branched into the optical path L1 irradiates the detected part 111a, the light reflected by the detected part 111a passes through the half mirror MR and travels along the optical path LR1, and the light receiving element 4b passes through the half mirror MR. Is received and detected.

Similarly, when the half mirror MR is at the (Mb) position, the light from the light emitting section 4a is branched from the optical path L to the optical path L2 by the half mirror MR, irradiates the detected section 111b, and the light reflected by the detected section 111b is half. The light receiving element 4b is configured to receive and detect the light transmitted through the half mirror MR through the mirror MR and travel along the optical path LR1. When the half mirror MR is at the (Mc) position, the light emitting unit The light 4a is branched from the optical path L to the optical path L3 by the half mirror MR, irradiates the detected portion 111c, and the light reflected by the detected portion 111c passes through the half mirror MR and travels along the optical path LR1. 4b is configured to receive and detect the light transmitted through the half mirror MR. In the light detection unit shown in FIG. 6E, the light source, the half mirror MR, and the light receiving element. The conditions can be made constant, and similarly to FIG. 4 (a), the light receiving element receives the light reflected from the light to be detected by the light source, and the light receiving element receives the reflected light. High-precision detection can be achieved without being affected by variations in the characteristics of the above and variations such as transmittance and reflectance at the interface of the detected part. Further, if the reflected light type is movable along the optical path L with respect to the detected part, only one half mirror MR and one light receiving element are required, and there is an advantage that the size can be reduced. Further, there is an advantage that the half mirror MR and the light receiving element can be configured as a pair of high-precision optical units.

  FIG. 6F shows a pair of half mirrors MR fixed between one light emitting portion 4a as a light source shown in FIG. 4B and a reflecting mirror M moving along the optical path L. And the configuration of the optical system of the light detection unit to which the light receiving element 4b is fixed.

  Therefore, when the reflecting mirror M is in the (Ma) position, the light from the light emitting unit 4a is transmitted through the half mirror MR and branched from the optical path L to the optical path L1 by the reflecting mirror M. The branched light irradiates the detected portion 111a, and the light reflected by the detected portion 111a returns from the optical path L1 to the optical path L by the reflecting mirror M, is reflected by the half mirror MR, and travels along the optical path LR. The light reflected by the 4b half mirror MR is received and detected.

  Similarly, when the reflecting mirror M is in the (Mb) position, the light of the light emitting unit 4a is branched from the optical path L to the optical path L2 by the reflecting mirror M, and the light reflected by the detected unit 111b is reflected from the optical path L2 by the reflecting mirror M. Then, the light further proceeds along the optical path LR via the half mirror MR, and the light receiving element 4b is configured to receive and detect the light reflected by the half mirror MR.

  When the reflecting mirror M is in the (Mc) position, the light of the light emitting unit 4a is branched from the optical path L to the optical path L3 by the reflecting mirror M, and the light reflected by the detected unit 111c is returned from the optical path L3 to the optical path L by the reflecting mirror M. Further, the light receiving element 4b travels along the optical path LR via the half mirror MR, and is configured to receive and detect light reflected by the half mirror MR.

  In the light detection section shown in FIG. 6 (F), the conditions of the light source, the half mirror MR, and the light receiving element can be made constant, and the light from the light source is detected at the same angle as in FIG. 4 (a). Because the light receiving element receives the light reflected from the light source and reflected, it is not affected by variations in the characteristics of the light source, the half mirror MR and the light receiving element, and variations in the transmittance and reflectance at the interface of the detected part. Can be detected.

  In addition, since the light source, the half mirror MR, and the light receiving element can be fixed as compared with the light detection unit shown in FIG. 6 (E), these optical systems can be configured as a high-precision optical unit. Since it only needs to be moved, there is an advantage that the moving mechanism of the reflecting mirror M can be simplified.

  As the operating means in the configuration of the optical system of the light detection section shown in (a) to (F) described above, when the reflecting mirror M is rotated, for example, a gear mechanism using a DC motor as a drive source, an encoder or the like A device for quickly rotating and stopping the reflecting mirror M at each rotational position easily at an appropriate timing by performing rotational position control or performing pulse drive control by a stepping motor, etc. Can be considered.

  Further, when the optical unit including the reflecting mirror M or the pair of half mirrors MR and the light receiving element 4b is reciprocated, for example, the reflecting mirror is provided by a gear mechanism or a belt mechanism along a linear guide member provided in advance. Can be operated by using a linear motor that can move linearly, etc., and further equipped with position detecting means such as an encoder, so that it is possible to perform linearly accurate position control. .

  Therefore, it is important for the operating means to select an appropriate operating mechanism according to the functional performance of the light branching means of the optical system of the light detection unit determined based on the specifications of the inspection apparatus. And it is desired to construct a small, inexpensive and easy-to-install inspection apparatus.

1 is an external view of an inspection apparatus using a microchip according to an embodiment. The block diagram of the test | inspection apparatus using the microchip which concerns on this embodiment. The block diagram of the microchip which concerns on this embodiment. The schematic diagram which shows the structure of the optical system of the photon detection part which concerns on this embodiment. The schematic diagram which shows other embodiment of the transmitted light type of the 1st operation system of the photon detection part which concerns on this embodiment. The schematic diagram which shows embodiment of the reflected light type of the 1st operation system of the photon detection part which concerns on this embodiment.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Microchip 2 Chip press plate 3 Temperature adjustment unit 4 Light detection part 5 Pump 6 Packing 10 Drive liquid tank 11 Drive liquid 80 Inspection apparatus 82 Case 83 Insertion port 84 Display part

Claims (5)

A microchip accommodating portion capable of accommodating a microchip having a plurality of detected portions;
A light source for irradiating the plurality of detected parts of the microchip accommodated in the microchip accommodating part, an optical path branching unit for branching an optical path of the light source with respect to each of the plurality of detected parts, and the plurality An inspection apparatus using a microchip, comprising: a light detection section having a light receiving section that receives light from the light source irradiated to the detected section. The light detection unit is
For each of the plurality of detected parts by the optical path branching means,
2. The inspection apparatus using a microchip according to claim 1, wherein the light from the light source is irradiated at the same angle. The optical path branching means is
A reflective member that reflects light;
The inspection apparatus using the microchip according to claim 1, further comprising an operating unit that operates the reflecting member to branch an optical path of the light source. The operating means is
The inspection apparatus using a microchip according to claim 3, wherein the reflecting member is moved or rotated with respect to an optical path of the light source. The inspection apparatus using a microchip according to claim 1, wherein the light receiving section is provided with a single light receiving element corresponding to the plurality of detected parts of the microchip.

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