JP2007237080A - Plasma cleaning apparatus - Google Patents

Plasma cleaning apparatus Download PDF

Info

Publication number
JP2007237080A
JP2007237080A JP2006063097A JP2006063097A JP2007237080A JP 2007237080 A JP2007237080 A JP 2007237080A JP 2006063097 A JP2006063097 A JP 2006063097A JP 2006063097 A JP2006063097 A JP 2006063097A JP 2007237080 A JP2007237080 A JP 2007237080A
Authority
JP
Japan
Prior art keywords
electric field
electrode
plasma
vertical
field applying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006063097A
Other languages
Japanese (ja)
Inventor
Eiji Komine
栄治 小峰
Hiroshi Okawa
博司 大川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamato Scientific Co Ltd
Original Assignee
Yamato Scientific Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamato Scientific Co Ltd filed Critical Yamato Scientific Co Ltd
Priority to JP2006063097A priority Critical patent/JP2007237080A/en
Publication of JP2007237080A publication Critical patent/JP2007237080A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning In General (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To carry out a quick surface treatment for any object to be treated. <P>SOLUTION: The apparatus comprises an electric field applying electrode 3 having a vertical face 9 and a horizontal down face 11 and an earth electrode 5 having a vertical face 15 facing the vertical face of the electric field applying electrode 3 and a horizontal down face 17. A process gas is flowed to the respective vertical faces 9 and 15 and the respective down faces 11 and 17 from a plasma supply port 23 and on the other hand, the vertical face 9 and the horizontal down face 11 of the electric field applying electrode 3 to which high-frequency voltage is to be applied are made to serve as planar electric discharge electrode faces for producing a plasma generation region and the generated plasma is made to hit in plane-state against the top face of an object 27 to be treated. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は生成されたプラズマを被処理物の表面にあてて表面処理を行なうプラズマ洗浄処理装置に関する。   The present invention relates to a plasma cleaning apparatus for performing surface treatment by applying generated plasma to a surface of an object to be processed.

一般にプラズマ洗浄は、地球に悪影響を与えるとされるフロンを用いたフロン洗浄処理にかわって近年にわかに脚光を浴びるようになっているもので、エレクトロニクス分野を始め多くの分野にわたって用いられるようになっている。   In general, plasma cleaning has recently gained a lot of attention in place of CFC cleaning processing that uses CFC, which is said to have an adverse effect on the earth. It has been used in many fields including the electronics field. Yes.

例えば、被処理物の表面に存在する有機物等の異物のクリーニング、レジストの剥離やエッチングを始めとして、有機フィルムの密着性の改善、金属酸化物の還元、成膜、めっき前処理、コーティング前処理、各種材料、部品の表面改質などの表面処理に用いられる。   For example, cleaning of foreign substances such as organic substances existing on the surface of the object to be processed, peeling of resist and etching, improvement of adhesion of organic film, reduction of metal oxide, film formation, plating pretreatment, coating pretreatment Used for surface treatment such as surface modification of various materials and parts.

プラズマ洗浄処理としては、対向し合う電極によって生成されるプラズマガス生成通路内に被処理物を通過させることで表面処理を行なう外に、生成されたプラズマを噴射口から被処理物の表面に噴射させることで表面処理を行なうタイプがある。   In the plasma cleaning process, in addition to performing the surface treatment by passing the object to be processed through the plasma gas generation passage generated by the opposing electrodes, the generated plasma is injected from the injection port onto the surface of the object to be processed. There is a type that performs surface treatment by making it.

プラズマ中にはイオン、電子、ラジカル、紫外線が存在し、これらが被処理物の表面に作用することで表面処理が行なわれる。
特開2002−72497号公報
Ions, electrons, radicals, and ultraviolet rays exist in the plasma, and surface treatment is performed by these ions acting on the surface of the workpiece.
JP 2002-72497 A

被処理物の表面にプラズマをあてて表面処理を行なうタイプにあっては、プラズマガス生成通路内を通過させて表面処理を行なうタイプに比べて、必要な部分のみを表面処理できるメリットを有し、生成されたプラズマは幅の狭い長孔状に吹き出される。処理面積も幅の狭い長孔領域となる。   The type that performs surface treatment by applying plasma to the surface of the object to be processed has the merit that only the necessary part can be surface treated compared to the type that performs surface treatment by passing through the plasma gas generation passage. The generated plasma is blown out into a narrow hole shape. The processing area is also a narrow hole region with a narrow width.

これは、プラズマを生成する一対の電極を対向させる構造からきているもので、例えば、一定の表面積を備えたウエハ等の被処理物の表面処理を行なう場合、例えば、幅の狭い長孔状に吹き出されるプラズマの下を通過させることで表面処理が行なわれる。   This is made up of a structure in which a pair of electrodes that generate plasma are opposed to each other. For example, when performing surface treatment of an object to be processed such as a wafer having a certain surface area, Surface treatment is performed by passing under the blown-out plasma.

この時の具体的な処理動作は、被処理物の端部にプラズマを一定時間(秒単位)で当てた後、続いて長孔の幅分、わずかに移動しプラズマを一定時間当てる。続いて長孔の幅分、わずかに移動しプラズマを一時間当てる動作を繰返すことで、端から順々に表面処理を行なっていくため、例えば、表面積の広い被処理物にあっては多大の時間を必要とし、処理能率の面で問題があった。   The specific processing operation at this time is that plasma is applied to the end portion of the object to be processed for a certain time (second unit), and then moved slightly by the width of the long hole and plasma is applied for a certain time. Subsequently, the surface treatment is performed sequentially from the end by repeating the operation of moving slightly by the width of the long hole and applying the plasma for 1 hour. Time was required and there was a problem in terms of processing efficiency.

この場合、プラズマを当てる1回当りの噴射時間を短くすることで、ある程度の処理速度をあげることができるが、そのためには短時間で表面処理を完了させる必要があるため強い出力のプラズマが要求される。   In this case, it is possible to increase the processing speed to some extent by shortening the injection time per one time to which the plasma is applied, but in order to do so, it is necessary to complete the surface treatment in a short time, so a strong output plasma is required. Is done.

強い出力のプラズマは、例えば、電子部品が装着されている被処理物の場合、その電子部品にダメージを与える恐れがある等、被処理物によって使用できない不具合をかかえる。   For example, in the case of an object to be processed on which an electronic component is mounted, the high-power plasma has a problem that it cannot be used depending on the object to be processed, such as the possibility of damaging the electronic component.

そこで、本発明にあっては、処理速度の向上が図れると共にいずれの被処理物であっても表面処理の可能な汎用性を備えたプラズマ洗浄処理装置を提供することを目的とする。   Accordingly, an object of the present invention is to provide a plasma cleaning apparatus capable of improving the processing speed and having versatility capable of performing surface treatment on any object to be processed.

前記目的を達成するために、本発明にあっては、垂直面及び水平な下面とを備えた電界印加電極と、その電界印加電極の垂直面と対向し合う垂直面及び水平な下面とを備えた接地電極と、対応し合う電界印加電極の垂直面と接地電極の垂直面とによって作られるガス流路に設けられたプロセスガス供給口と、ガス流路から下方の搬送体へ向けてプロセスガスを流すガス流出口とを有し、前記一方の電界印加電極の垂直面及び下面を、その垂直面から下面にかけて面状のプラズマ生成領域を作る面状の放電電極面としたことを特徴とする。   To achieve the above object, the present invention includes an electric field applying electrode having a vertical surface and a horizontal lower surface, and a vertical surface and a horizontal lower surface facing the vertical surface of the electric field applying electrode. Process gas supply port provided in the gas flow path formed by the vertical surface of the corresponding ground electrode, the vertical surface of the corresponding electric field applying electrode and the vertical surface of the ground electrode, and the process gas from the gas flow path toward the lower carrier And the vertical surface and the bottom surface of the one electric field application electrode are planar discharge electrode surfaces that form a planar plasma generation region from the vertical surface to the bottom surface. .

本発明によれば、電界印加電極の垂直面と下面とに連続した面状のプラズマ生成領域を作ることができるため、被処理物の上面に生成されたプラズマが面状に作用する結果、1回でできる処理面積は大幅に拡大し、広い面積を備えた被処理物であっても迅速に表面処理作業を完了することができる。   According to the present invention, since a continuous plasma generation region can be formed on the vertical surface and the lower surface of the electric field applying electrode, the plasma generated on the upper surface of the object to be processed acts as a surface. The processing area that can be processed in a single operation is greatly expanded, and even a workpiece having a large area can quickly complete the surface processing operation.

また、1回当りの処理面積が大きい面状処理が行なえるため、ダメージを与えない弱い出力のプラズマを使用しても大きく処理時間をとられることがなくなると共に、制約を受けることなくいずれの種類の被処理物であっても処理できる。   In addition, since a planar processing with a large processing area per time can be performed, it is possible to take a long processing time even if a weak power plasma that does not cause damage is used, and any type without any restriction. Even the object to be processed can be processed.

本発明によれば、第1に、前記面状の放電電極面となる電界印加電極の下面とその下面の下に配置される被処理物上面までの距離を、0.5mm〜4mmの寸法に設定し、電界印加電極の下面に安定した面状のプラズマ生成領域を作る。   According to the present invention, firstly, the distance between the lower surface of the electric field application electrode serving as the planar discharge electrode surface and the upper surface of the workpiece disposed below the lower surface is set to a dimension of 0.5 mm to 4 mm. A stable planar plasma generation region is created on the lower surface of the electric field application electrode.

第2に、前記対向し合う一対の電界印加電極と接地電極を、被処理物の搬送方向に沿って直列に複数配置し、面状処理する処理面積の拡大を図ることで、連続した速い流れの流れ作業を可能とする。   Secondly, a plurality of the pair of electric field application electrodes and ground electrodes facing each other are arranged in series along the conveyance direction of the object to be processed, and a continuous fast flow is achieved by enlarging the processing area for surface processing. The flow work is possible.

以下、図1と図2の図面を参照しながら本発明の実施形態について具体的に説明する。   Hereinafter, embodiments of the present invention will be specifically described with reference to FIGS. 1 and 2.

図1は本発明にかかるプラズマ洗浄処理装置全体の概要切断面図を示している。プラズマ洗浄処理装置1は、電界印加電極3とその電界印加電極3と対向し合う接地電極5とプロセスガス供給手段7とを有している。   FIG. 1 is a schematic sectional view of the entire plasma cleaning apparatus according to the present invention. The plasma cleaning apparatus 1 includes an electric field application electrode 3, a ground electrode 5 facing the electric field application electrode 3, and a process gas supply unit 7.

電界印加電極3はアルミ等の材質により垂直面9と水平な下面11とを備えた断面矩形状に形成され、図2に示す如く正面からみた時に左右に長い角筒状に作られている。   The electric field applying electrode 3 is formed of a material such as aluminum into a rectangular cross section having a vertical surface 9 and a horizontal lower surface 11 and is formed in a rectangular tube shape that is long to the left and right when viewed from the front as shown in FIG.

電界印加電極3の垂直面9及び下面11はそれぞれ連続し合う面状の放電電極面となっていて、プラズマ発生電源13によって高周波電圧が印加される。高周波としては50kMz〜27.12Mzのサイン波が好ましいがパルス波であってもよい。   The vertical surface 9 and the lower surface 11 of the electric field application electrode 3 are respectively continuous planar discharge electrode surfaces, and a high frequency voltage is applied by the plasma generation power source 13. As the high frequency, a sine wave of 50 kMz to 27.12 Mz is preferable, but a pulse wave may be used.

接地電極5は、アルミ等の材質により垂直面15と水平な下面17とを備えた断面矩形状に形成されている。接地電極5の長さ及び幅は前記電界印加電極3の形状と同一形状に作られ、絶縁製の支持部材19によって前記電界印加電極3と並列配置された状態で固定支持されている。   The ground electrode 5 is formed in a rectangular cross section having a vertical surface 15 and a horizontal lower surface 17 made of a material such as aluminum. The length and width of the ground electrode 5 are formed in the same shape as that of the electric field applying electrode 3, and are fixedly supported by the insulating support member 19 while being arranged in parallel with the electric field applying electrode 3.

接地電極5の垂直面15は前記電界印加電極3の垂直面9と対向し合うと共に、対向し合う各垂直面9,15によって上下方向の面状のガス通路21が形成されている。   The vertical surface 15 of the ground electrode 5 faces the vertical surface 9 of the electric field applying electrode 3, and a vertical gas path 21 is formed by the vertical surfaces 9, 15 facing each other.

ガス通路21は、上部にプロセスガス供給口23が、下部にガス流出口25がそれぞれ設けられている。   The gas passage 21 is provided with a process gas supply port 23 in the upper part and a gas outlet 25 in the lower part.

ガス通路21を構成する垂直面9の面状の放電電極面と下面11の面状の放電電極面は図2、正面から見た時に、前記支持部材19の一方の側壁19aから他方の側壁19bまでの幅Dを有し、この幅Dは被処理物27を表面処理するための最大の処理幅となっている。また、両サイドの側壁19a,19bはプロセスガスが両サイドから外へ逃げるのを阻止する阻止壁として機能している。   The planar discharge electrode surface of the vertical surface 9 and the planar discharge electrode surface of the lower surface 11 constituting the gas passage 21 are viewed from the front in FIG. 2, from one side wall 19a to the other side wall 19b of the support member 19. The width D is the maximum processing width for surface-treating the workpiece 27. Further, the side walls 19a and 19b on both sides function as blocking walls that prevent the process gas from escaping from both sides.

電界印加電極3と接地電極5は、中心部位を冷却水が流れる冷却路29がそれぞれ設けられた水冷式となっている。電界印加電極3及び接地電極5の各垂直面9,15と各下面11,17には材質が石英ガラス又はセラミック等で作られたプレート状の誘電体31a,31bがそれぞれ設けられている。各垂直面9,15に対向して設けられた誘電体31aと誘電体31aの間は平面からみた時に幅の狭い長孔状のガス通路21が形成されることで、プロセスガス供給口23からのプロセスガスはガス通路21を通り、ガス流出口25から各下面11,17へ向け面状に拡がる流れが得られるようになっている。   The electric field applying electrode 3 and the ground electrode 5 are of a water cooling type in which cooling paths 29 through which cooling water flows are provided in the central portion. Plate-shaped dielectrics 31 a and 31 b made of quartz glass or ceramic are provided on the vertical surfaces 9 and 15 and the lower surfaces 11 and 17 of the electric field applying electrode 3 and the ground electrode 5, respectively. Between the dielectric 31a and the dielectric 31a provided so as to oppose each of the vertical surfaces 9 and 15, a long hole-like gas passage 21 having a narrow width when viewed from the plane is formed, so that the process gas supply port 23 The process gas passes through the gas passage 21 to obtain a flow extending in a plane from the gas outlet 25 toward the lower surfaces 11 and 17.

なお、誘電体31a,31bは、安定した放電を確保するために設けられているものであって必ずしも必要としない。   The dielectrics 31a and 31b are provided to ensure stable discharge and are not necessarily required.

一方、誘電体31a,31bがそれぞれ設けられた電界印加電極3の下面11と接地電極5の下面17の下部は、図1矢印イの如く搬送する搬送体33が配置されている。   On the other hand, on the lower surface 11 of the electric field applying electrode 3 provided with the dielectrics 31a and 31b and the lower portion of the lower surface 17 of the ground electrode 5, a conveying body 33 is disposed as shown by an arrow A in FIG.

搬送体33は、駆動輪と従動輪(いずれも図示していない)とにエンドレスに掛け回されたチェーン等の搬送部材35に被処理物27を1つずつセットするセットプレート37が一定の間隔でエンドレスに回動するよう設けられている。   The conveyance body 33 has a set plate 37 for setting the workpieces 27 one by one on a conveyance member 35 such as a chain that is wound endlessly around a driving wheel and a driven wheel (both not shown). It is provided to rotate endlessly.

搬送体33は前記した如く下面11と対向し合う構造となることで、電界印加電極3に高周波電圧が印加されると、電界印加電極3の垂直面9を始めとして下面11にも面状のプラズマ生成領域が作られるようになる。   Since the carrier 33 has a structure facing the lower surface 11 as described above, when a high frequency voltage is applied to the electric field applying electrode 3, the lower surface 11 including the vertical surface 9 of the electric field applying electrode 3 is also planar. A plasma generation region is created.

電界印加電極3の下面11に作られる面状のプラズマ生成領域は、実験でわかったもので、垂直面9のように対向し合う接地電極5のない下面11にどのようにしてプラズマ生成領域が作られるのかは理論的には解明されていないが、電界印加電極3の下面11を垂直面9と同様に面状の放電電極面としたことと、下方にアース電極として機能する搬送体33が対向して配置されることで、放電が起こりプラズマが生成されるものと推測される。   The planar plasma generation region formed on the lower surface 11 of the electric field application electrode 3 has been found by experiment. How the plasma generation region is formed on the lower surface 11 without the ground electrode 5 facing each other like the vertical surface 9. Although it is not theoretically elucidated whether it is made or not, the lower surface 11 of the electric field applying electrode 3 is a planar discharge electrode surface like the vertical surface 9, and the carrier 33 that functions as a ground electrode is provided below. It is presumed that discharge is caused and plasma is generated by arranging them facing each other.

この場合、電界印加電極3の下面11から搬送体33の上面にセットされる被処理物27の上面までの距離hは0.5mm〜4mmの間が望ましい。好ましくは1.5mmである。これにより、実績結果でも誘電体31bの組合せと相俟って安定したプラズマ生成が得られるようになる。   In this case, the distance h from the lower surface 11 of the electric field applying electrode 3 to the upper surface of the workpiece 27 set on the upper surface of the carrier 33 is preferably between 0.5 mm and 4 mm. Preferably it is 1.5 mm. As a result, even in the actual result, stable plasma generation can be obtained in combination with the combination of the dielectrics 31b.

一方、プラズマ供給口23は、供給管37を介してボンベ等のプロセスガス供給手段7と接続連通し、供給管37の途中に設けられた制御バルブ39の開又は閉によってプロセスガスの供給及び遮断制御が可能となっている。   On the other hand, the plasma supply port 23 is connected to and communicated with a process gas supply means 7 such as a cylinder through a supply pipe 37, and the process gas is supplied and cut off by opening or closing a control valve 39 provided in the supply pipe 37. Control is possible.

プロセスガスとしては、ヘリウム又はアルゴンガスがあり、それらを単独で使用したり、あるいは、組合せた混合ガスとして用いることも可能である。   Examples of the process gas include helium or argon gas, which can be used alone or as a mixed gas in combination.

この場合、ヘリウム又はアルゴンガスの外に酸素、水素等の反応ガスを組合せる手段とすることが望ましい。   In this case, it is desirable to use means for combining a reaction gas such as oxygen or hydrogen in addition to helium or argon gas.

このように構成されたプラズマ洗浄処理装置1によれば、プロセスガス供給口23からプロセスガスを送り込みガス通路21及び下面11,17にプロセスガスが満たされた状態で電界印加電極3に高周波電圧を印加することで電界印加電極3の垂直面9及び下面11側とに面状のプラズマ生成領域が作られる。   According to the plasma cleaning processing apparatus 1 configured as described above, the process gas is fed from the process gas supply port 23, and a high-frequency voltage is applied to the electric field application electrode 3 in a state where the process gas is filled in the gas passage 21 and the lower surfaces 11 and 17. By applying, a planar plasma generation region is formed on the vertical surface 9 and the lower surface 11 side of the electric field application electrode 3.

この結果、被処理物27の上面は1回あたりの処理面積が大きい面状処理となるため、広い面積を備えた被処理物27であっても迅速に表面処理を完了することができる。また、処理面積が大きい面状処理によって、大きく処理時間がとられることがなくなるため、弱い出力のプラズマでも処理が可能となり、いずれの種類の被処理物であっても、ダメージを与えることなく表面処理を行なうことができる。   As a result, the upper surface of the object to be processed 27 is a surface treatment having a large processing area per time, and thus the surface treatment can be completed quickly even for the object to be processed 27 having a large area. In addition, because surface processing with a large processing area does not take a long processing time, it is possible to process even with low-power plasma, and any type of workpiece can be processed without damage. Processing can be performed.

この場合、プラズマ洗浄処理装置1を構成する一対の電界印加電極3と接地電極5とを搬送方向に沿って直列に複数配置する手段としてもよい。   In this case, a plurality of pairs of electric field applying electrodes 3 and ground electrodes 5 constituting the plasma cleaning apparatus 1 may be arranged in series along the transport direction.

これにより、面状処理する処理面積が搬送方向に沿って拡大するため、連続した流れの速い流れ作業を可能とし、処理能力の大幅な向上が図れる。   As a result, the processing area for the surface processing increases along the transport direction, so that a continuous work with a fast flow can be performed, and the processing capability can be greatly improved.

本発明にかかるプラズマ洗浄装置の図2のA−A線拡大概要説明図。The AA line expansion outline explanatory drawing of FIG. 2 of the plasma cleaning apparatus concerning this invention. プラズマ洗浄装置の概要正面図。The outline front view of a plasma cleaning device.

符号の説明Explanation of symbols

3 電界印加電極
5 接地電極
7 プロセスガス供給手段
9 電界印加電極の垂直面
11 電界印加電極の下面
15 接地電極の垂直面
17 接地電極の下面
21 ガス通路
23 プロセスガス供給口
25 ガス流出口
27 被処理物
31a,31b 誘電体
33 搬送体
DESCRIPTION OF SYMBOLS 3 Electric field application electrode 5 Ground electrode 7 Process gas supply means 9 Vertical surface of electric field application electrode 11 Lower surface of electric field application electrode 15 Vertical surface of ground electrode 17 Lower surface of ground electrode 21 Gas passage 23 Process gas supply port 25 Gas outlet 27 Covered Processed product 31a, 31b Dielectric 33 Transporter

Claims (3)

垂直面及び水平な下面とを備えた電界印加電極と、その電界印加電極の垂直面と対向し合う垂直面及び水平な下面とを備えた接地電極と、対応し合う電界印加電極の垂直面と接地電極の垂直面とによって作られるガス流路に設けられたプロセスガス供給口と、前記ガス流路から下方の搬送体へ向けてプロセスガスを流すガス流出口とを有し、前記一方の電界印加電極の垂直面及び下面を、その垂直面から下面にかけて面状のプラズマ生成領域を作る面状の放電電極面としたことを特徴とするプラズマ洗浄処理装置。   An electric field applying electrode having a vertical surface and a horizontal lower surface; a ground electrode having a vertical surface and a horizontal lower surface facing the vertical surface of the electric field applying electrode; and a vertical surface of the corresponding electric field applying electrode. A process gas supply port provided in a gas flow path formed by a vertical surface of the ground electrode, and a gas outlet for flowing a process gas from the gas flow path toward a lower carrier, the one electric field A plasma cleaning apparatus characterized in that the vertical surface and the lower surface of the application electrode are planar discharge electrode surfaces that form a planar plasma generation region from the vertical surface to the lower surface. 前記面状の放電電極面となる電界印加電極の下面とその下面の下に配置される被処理物上面までの距離は、0.5mm〜4mmの寸法に設定されていることを特徴とする請求項1記載のプラズマ洗浄処理装置。   The distance between the lower surface of the electric field application electrode serving as the planar discharge electrode surface and the upper surface of the workpiece to be disposed under the lower surface is set to a size of 0.5 mm to 4 mm. Item 2. The plasma cleaning apparatus according to Item 1. 前記垂直面が対向し合う一対の電界印加電極と接地電極は、被処理物の搬送方向に沿って直列に複数配置されていることを特徴とする請求項1記載のプラズマ洗浄処理装置。   2. The plasma cleaning apparatus according to claim 1, wherein a plurality of a pair of electric field applying electrodes and ground electrodes facing each other in the vertical plane are arranged in series along a conveyance direction of the object to be processed.
JP2006063097A 2006-03-08 2006-03-08 Plasma cleaning apparatus Pending JP2007237080A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006063097A JP2007237080A (en) 2006-03-08 2006-03-08 Plasma cleaning apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006063097A JP2007237080A (en) 2006-03-08 2006-03-08 Plasma cleaning apparatus

Publications (1)

Publication Number Publication Date
JP2007237080A true JP2007237080A (en) 2007-09-20

Family

ID=38583150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006063097A Pending JP2007237080A (en) 2006-03-08 2006-03-08 Plasma cleaning apparatus

Country Status (1)

Country Link
JP (1) JP2007237080A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010093075A (en) * 2008-10-08 2010-04-22 Nikon Corp Exposure apparatus, maintenance method, exposure method, and device method for manufacturing

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338398A (en) * 2002-05-17 2003-11-28 Sekisui Chem Co Ltd Discharge plasma processing method and apparatus therefor
JP2004241656A (en) * 2003-02-06 2004-08-26 Sekisui Chem Co Ltd Resist peeling method and apparatus therefor
JP2004259987A (en) * 2003-02-26 2004-09-16 Seiko Epson Corp Device and method for surface treatment
JP2005302525A (en) * 2004-04-12 2005-10-27 Sekisui Chem Co Ltd Electric discharge plasma treatment device and its treatment method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338398A (en) * 2002-05-17 2003-11-28 Sekisui Chem Co Ltd Discharge plasma processing method and apparatus therefor
JP2004241656A (en) * 2003-02-06 2004-08-26 Sekisui Chem Co Ltd Resist peeling method and apparatus therefor
JP2004259987A (en) * 2003-02-26 2004-09-16 Seiko Epson Corp Device and method for surface treatment
JP2005302525A (en) * 2004-04-12 2005-10-27 Sekisui Chem Co Ltd Electric discharge plasma treatment device and its treatment method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010093075A (en) * 2008-10-08 2010-04-22 Nikon Corp Exposure apparatus, maintenance method, exposure method, and device method for manufacturing

Similar Documents

Publication Publication Date Title
TWI631877B (en) Plasma processing device
JP5510437B2 (en) Plasma processing apparatus and plasma processing method
WO2004107394A2 (en) Plasma processing apparatus, method for producing reaction vessel for plasma generation, and plasma processing method
JP2005123159A (en) Plasma processing apparatus, method for manufacturing reaction vessel for plasma generation, and plasma processing method
KR100872682B1 (en) Apparatus for uniformly generating atmospheric pressure plasma
JP2003303814A (en) Plasma treatment apparatus and method therefor
JP2004526276A (en) Atmospheric pressure plasma assembly
US11533801B2 (en) Atmospheric pressure linear rf plasma source for surface modification and treatment
JP2010539336A (en) Apparatus and method for ultra-high frequency plasma assisted CVD under atmospheric pressure and its application
JP4579522B2 (en) Plasma surface treatment equipment
JP2007280641A (en) Plasma treatment device and plasma treatment method
US9363881B2 (en) Plasma device and operation method of plasma device
JP2007237080A (en) Plasma cleaning apparatus
CN202841676U (en) Linear array type atmospheric pressure cold plasma jet generating device
JP2010218801A (en) Atmospheric-pressure plasma generator
JP2005129323A (en) Plasma generation apparatus and plasma treatment apparatus
Sukhinin et al. Development of a distributed ferromagnetic enhanced inductively coupled plasma source for plasma processing
KR101557147B1 (en) Plasma electrode
JP2014212302A (en) Nozzle type plasma etching device
KR101829318B1 (en) A apparatus for processing a matter with plasma
KR100485816B1 (en) High pressure plasma discharge device
JP2009099361A (en) Plasma processing device and plasma processing method
JP2007266522A (en) Plasma treatment device and processing method employing it
JP4620322B2 (en) Plasma surface treatment equipment
JP2005026167A (en) Plasma surface treatment device and its treatment method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20090306

A977 Report on retrieval

Effective date: 20101217

Free format text: JAPANESE INTERMEDIATE CODE: A971007

A131 Notification of reasons for refusal

Effective date: 20110104

Free format text: JAPANESE INTERMEDIATE CODE: A131

A02 Decision of refusal

Effective date: 20110426

Free format text: JAPANESE INTERMEDIATE CODE: A02