JP2007230728A - Control device of elevator - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To predict the life of a semiconductor module which is hard to be affected by dispersion. <P>SOLUTION: A control device of an elevator comprises an inverter 9 driving the car 15 of the elevator by a motor 11 and converting a DC to an AC, the semiconductor module 50 forming the inverter 9 and having a base 61 fitted to a semiconductor device 60 with an insulated substrate 65 interposed therebetween, a first temperature sensor 72 detecting the first temperature value of the semiconductor device 60, a second temperature sensor 74 detecting the second temperature value of the base 61, and a determination device 90 determining the deterioration of the semiconductor module 50 based on the temperature difference between the first temperature value and the second temperature value. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

The present invention relates to an elevator control device, and relates to semiconductor module deterioration determination.

As described in Patent Document 1 below, a conventional elevator control device is a converter that converts commercial AC power into DC, an inverter that converts the output of the converter into AC and supplies power to an induction motor for driving the elevator, In an elevator control device comprising a converter and a control means for controlling the inverter, a means for measuring the operating status of each component constituting the device and a weighting set in advance to the measured value to obtain a life prediction reference value Means and means for predicting the life of each component based on the reference value.
According to such a control device, it is possible to perform life prediction with high accuracy even for parts whose load varies and parts whose life characteristics are not linear.
Japanese Patent Laid-Open No. 9-290970

However, in the elevator control device, means for measuring the operating status of each component constituting the device, means for obtaining a life prediction reference value by weighting the measured value in advance, and each component based on the reference value Since the life of parts is predicted by means for predicting the life, there is a problem that the influence of individual variations of parts cannot be taken into account and the temperature rise of each part is not accurately captured.

  The present invention has been made to solve the above problems, and provides an elevator control device that can take into account the effects of individual variations of components and accurately estimate the temperature rise of each component to predict the life of a semiconductor module. The purpose is to do.

According to a first aspect of the present invention, there is provided an elevator control apparatus that drives an elevator car by a motor, converts an direct current into an alternating current, and constitutes the inverter, and includes a base provided via a semiconductor element and an insulating substrate. A first temperature detecting means for detecting a first temperature value of the semiconductor element, a second temperature detecting means for detecting a second temperature value of the base, the first temperature value and the second temperature value. First determination means for determining deterioration of the semiconductor module based on a temperature difference from a temperature value.

The first determination means in the elevator control device according to the second invention determines deterioration of the semiconductor module by estimating a thermal resistance based on a temperature difference between the first temperature value and the second temperature value. It is characterized by.

According to a third aspect of the present invention, there is provided an elevator control device that drives an elevator car with a motor, converts an direct current into an alternating current, constitutes the inverter, and is provided via a semiconductor element and an insulating substrate. A semiconductor module having a base; first temperature detecting means for detecting a first temperature value of the semiconductor element; second temperature detecting means for detecting a second temperature value of the base; and a predetermined operation of the car. An operation mode means for driving the car according to a mode; a second determination means for determining deterioration of the semiconductor module based on an incremental value from an initial value of a temperature difference between the first temperature value and the second temperature value; , Provided.

According to the first invention, it is possible to consider the influence due to the variation in the semiconductor modules, and to predict the lifetime of the semiconductor module by accurately grasping the temperature rise of each part.

According to the second aspect of the invention, since the lifetime of the semiconductor module is predicted by estimating the thermal resistance based on the temperature difference between the first temperature value and the second temperature value, it is possible to perform an accurate prediction. There is.

According to the third invention, the first temperature detecting means for detecting the first temperature value of the semiconductor element, the second temperature detecting means for detecting the second temperature value of the base, and the car according to a predetermined operation mode. Since the operation mode means for driving the car, and the second determination means for determining the deterioration of the semiconductor module based on the temperature difference between the first temperature value and the second temperature value from the initial value, There is an effect that the lifetime of the semiconductor module can be predicted in consideration of the variation of the semiconductor module.

Embodiment 1 FIG.
An embodiment of the present invention will be described with reference to FIGS. FIG. 1 is an overall configuration diagram of an elevator control device according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view of the semiconductor module shown in FIG.
1 and 2, an elevator 1 includes a converter 5 as a DC power source conversion unit that converts an AC voltage into a DC voltage from an AC power source 3 via a main breaker 4, and a capacitor that smoothes the pulsating voltage of the converter 5. 7, an inverter 9 serving as a means for converting a DC voltage into a variable voltage / variable frequency AC power source according to a speed command signal from the control unit 20, and a motor 11 for rotating the sheave 13 by the inverter 9.
A rope 17 is hung on the sheave 13, a car 15 is fixed to one end of the rope 17, and a counterweight 19 is fixed to the other end of the rope 17. The car 15 is provided with a load detector 16 that detects a load in the car 15.
Further, the control unit 20 includes a test command unit 22 as an operation mode means for generating an instruction of an unloaded each floor operation mode for causing the car 15 to operate on each floor when the detection result of the load detector 15 is no load. Have.

The inverter 9 has a semiconductor module 50 having a power transistor 60 as a semiconductor element. The semiconductor module 50 includes a metal base 61, an insulating substrate 65 provided via a first soldering part 62a mounted on the metal base 61, and a power transistor 50 provided via a second soldering part 62c. It has been.
A first base layer 64a is provided between the insulating substrate 65 and the first soldering portion 62a to improve the adhesion between the insulating substrate 65 and the first soldering portion 62a. Between the soldering part 62c, the 2nd base layer 64c which improves the adhesiveness of the insulating substrate 65 and the 2nd soldering part 62c is provided.
Note that heat radiating fins 80 are fixed to the metal base 61 of the semiconductor module 50.

For cooling the semiconductor module 50, heat generated in the power transistor 60 is conducted to the metal base 61 through the first and second soldering portions 62a and 62c, the first and second underlayers 64a and 64c, and the insulating substrate 12. Then, the heat is dissipated by the radiation fins 80 attached to the metal base 61, and the temperature rise of the power transistor 60 is suppressed.
The semiconductor module 50 includes a first temperature sensor 72 as a first temperature detecting means for detecting a first temperature value T 1 of the power transistor 60 and a second temperature detecting means for detecting a second temperature value T 2 of the metal base 61. The second temperature sensor 74 is provided.

An output signal from the first temperature sensor 72 and the second temperature sensor 74 is input to the determiner 90, and a calculation unit 92 that calculates the following equation when the difference ΔT between the first temperature value T1 and the second temperature value T2 is set. Is provided. The output of the determination device 90 is provided with a display device 100 for displaying that the life of the semiconductor module 50 will soon be exhausted and for reporting.
R = ΔT / Q
Here, R: Thermal resistance between the metal base 61 and the power transistor 60 Q: Amount of heat generated by the power transistor 60 Here, when the car 15 is run in a no-load operation on each floor according to a command from the test command unit 22 Is measured and stored in the storage unit 94. The storage unit 94 stores a thermal resistance threshold value Rr of the thermal resistance R.
Thereby, the thermal resistance R can be obtained from the above equation. Then, the determiner 90 determines whether the obtained thermal resistance R exceeds the threshold value Rr, and determines that it is abnormal if it exceeds.

The operation of the elevator control apparatus configured as described above will be described with reference to FIGS. FIG. 3 is a flowchart showing the operation of the elevator control apparatus according to FIG. The AC power source 3 is converted to DC by the converter 5, the DC is smoothed by the capacitor 7, and an AC voltage having a variable voltage and a variable frequency is applied to the motor 11 via the inverter 9.
Now, the control unit 20 determines whether or not the elevator 1 is used for a specific time (step S101). When the specific time is reached, whether or not the load of the car 15 is no load is determined by the output of the load detector 16. Judgment (step S103), in the case of no load, it is determined whether or not the car 15 has been run for a predetermined time in the no-load operation of each floor by a command from the test command unit 22 (step S105). The first temperature value T1 and the second temperature value T2 are detected from the first temperature sensor 72 and the second temperature sensor 74 (step S107).

The calculation unit 92 obtains a difference ΔT between the first temperature value T1 and the second temperature value T2, reads the heat generation amount Q from the storage unit 94, and obtains the thermal resistance R (step S109). The computing unit 72 determines whether or not the thermal resistance R exceeds the thermal resistance threshold value Rr read from the storage unit 94 (step S111). If it exceeds, an abnormality is notified to the display device 100, and a message to that effect is displayed, and the car 15 is stopped (step S113).

Embodiment 2. FIG.
Another embodiment of the present invention will be described with reference to FIG. The storage unit 94 of the determiner 90 stores an initial value ΔT0 that is the difference between the first temperature value T1 and the second temperature value T2 after the car 15 has been run for a predetermined time in the no-load operation of each floor in the initial stage of installation. Is stored, and an increment threshold Tr that is an increment allowable value that is an increment from the initial value ΔT0 is stored in the same operation mode after the next time.

The operation of the elevator control apparatus configured as described above will be described with reference to FIGS. 1, 2, and 4. FIG. 4 is a flowchart showing the operation of the elevator control apparatus according to the present embodiment.
The operation of the present embodiment is the same as the operation of the first embodiment, that is, steps S101 to S107 shown in FIG. 3, and will be described from step S209 shown in FIG. 4 different from the first embodiment.
The second calculator 92 of the determiner 90 obtains a temperature difference ΔT between the first temperature value T1 and the second temperature value T2 (step S209). The calculation unit 92 obtains an increment value ΔTa between the temperature difference ΔT and the initial value ΔT0, and determines whether the increment value ΔTa exceeds the increment threshold Tr read from the storage unit 94 (step S211). If it exceeds, an abnormality is notified to the display device 100 and a message to that effect is displayed, and the car 15 is stopped (step S113).

  The present invention can be applied to the life determination of a semiconductor module of an inverter used in an elevator.

1 is an overall configuration diagram of an elevator control device showing an embodiment of the present invention. It is sectional drawing of the semiconductor module shown in FIG. It is a flowchart which shows operation | movement of the control apparatus of the elevator by FIG. It is a flowchart which shows operation | movement of the control apparatus of the elevator by other embodiment of this invention.

Explanation of symbols

  9 Inverter, 11 Motor, 15 Car, 22 Test command section, 50 Semiconductor module, 60 Power transistor (semiconductor element), 61 Base, 65 Insulating substrate, 72 First temperature sensor, 74 Second temperature sensor, 90 Determinator.

Claims (3)

An inverter that drives the elevator car by a motor and converts direct current to alternating current;
A semiconductor module comprising the inverter and having a base provided via a semiconductor element and an insulating substrate;
First temperature detecting means for detecting a first temperature value of the semiconductor element;
Second temperature detecting means for detecting a second temperature value of the base;
First determination means for determining deterioration of the semiconductor module based on a temperature difference between the first temperature value and the second temperature value;
An elevator control device comprising: The first determination means determines deterioration of the semiconductor module by estimating a thermal resistance based on the temperature difference;
The elevator control device according to claim 1. An inverter that drives the elevator car by a motor and converts direct current to alternating current;
A semiconductor module comprising the inverter and having a base provided via a semiconductor element and an insulating substrate;
First temperature detecting means for detecting a first temperature value of the semiconductor element;
Second temperature detecting means for detecting a second temperature value of the base;
An operation mode means for driving the car according to a predetermined operation mode;
Second determination means for determining deterioration of the semiconductor module based on an incremental value from an initial value of a temperature difference between the first temperature value and the second temperature value;
An elevator control device comprising:

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