JP2007194947A - Lamination type dielectric resonator - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a compact low-loss lamination type dielectric resonator which costs low and has a high Q value without causing cracking and delamination of an element body after baking. <P>SOLUTION: The lamination type dielectric resonator has a plurality of internal electrode layers laminated across dielectric layers and also has a capacitor part and an inductor part formed by the pattern and lamination structure of those internal electrode layers. At least the inductor part has a center layer 20a which contains a relatively small amount of conductive particles and a relatively large amount of glass components and a coating layer 20b which is formed covering a periphery of the center layer 20a and contains more conductive particles than the center layer 20a. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a laminated dielectric resonator used as a bandpass filter or the like.

  With the diversification of wireless communication systems such as terrestrial digital TV broadcasting, mobile phones, and mobile phones with televisions, multilayer dielectrics that form resonant circuits in the microwave band of several hundred MHz to several GHz, such as bandpass filters and duplexers As for the body resonator, a small-sized and low-loss resonator is desired.

  In order to reduce the loss of the multilayer dielectric resonator, it is necessary to improve the Q value (= 1 / tan δ). The Q value of the resonance circuit is mainly determined by the loss due to the dielectric of the dielectric substrate (dielectric loss) and the loss due to the internal electrodes constituting the resonance circuit (conductor loss). In general, in a low frequency band below the microwave band, the conductor loss is more dominant than the dielectric loss than the dielectric loss.

  Therefore, in order to realize a reduction in loss of the multilayer dielectric resonator and improve the Q value, it is necessary to reduce the specific resistance of the conductor material forming the internal electrode constituting the resonance circuit, and to reduce the width of the internal electrode. It is conceivable to increase the thickness.

  Therefore, as means for improving the Q value without increasing the size of the multilayer dielectric resonator, a plurality of internal electrodes (longitudinal patterns) are formed on the surface as shown in Patent Documents 1 and 2 below. It has been proposed to stack a large number of dielectric layers.

  However, the conventional laminated dielectric resonator has a structure in which the longitudinal pattern that is laminated and becomes the inductor portion is connected only at the portion of the external terminal electrode and separated through the dielectric layer. When the type dielectric resonator is downsized, there is a problem that the Q value becomes insufficient.

Therefore, in order to increase the Q value, it is conceivable to increase the thickness of the silver high-purity electrode layer having a high conductivity by forming a multilayer structure. However, the thermal expansion coefficient of the silver high-purity electrode layer is significantly different from that of the dielectric layer, and forming the silver high-purity electrode layer in a thick film may cause cracks and delamination in the element body after firing. It becomes a factor. Moreover, it is disadvantageous in terms of cost to form the silver high-purity layer in a thick film.
JP-A-4-43703 JP 2001-237619 A

  The present invention has been made in view of such a situation, and an object of the present invention is to provide a low-cost, high-Q value, small size and low-loss laminate without causing cracks or delamination in the element body after firing. Type dielectric resonator.

In order to achieve the above object, a laminated dielectric resonator according to the present invention includes:
A multilayer dielectric resonator in which a plurality of internal electrode layers are laminated via a dielectric layer, and a capacitor part and an inductor part are formed by a pattern and a laminated structure of these internal electrode layers,
The inductor section is
A central layer containing relatively few conductive particles and a relatively large amount of glass component;
It is formed so that the circumference | surroundings of the said center layer may be covered, and it has a coating layer which contains more electroconductive particles than the said center layer.

  According to the experiments by the present inventors, it was found that a current mainly flows through the surface layer of the conductive layer constituting the internal electrode layer, particularly in the microwave band of several hundred MHz to several GHz. Therefore, in the present invention, the internal electrode layer covering layer that constitutes the inductor portion is formed of a layer containing a large amount of conductive particles, so that the electrical resistance is greatly reduced, and the resonator has a low loss and a high Q value. A structure can be realized. That is, in the present invention, it is possible to pass a larger amount of current and the insertion loss is smaller than in the conventional structure. Therefore, according to the present invention, it is possible to realize a multilayer dielectric resonator having a high Q value and low loss even when the size is reduced.

  In addition, in the present invention, the layer containing a large amount of conductive particles is not thickened, but the layer containing a large amount of conductive particles is a coating layer, and the central layer has a relatively small amount of conductive particles and a glass component. Is composed of a layer containing a relatively large amount. A layer containing a relatively small amount of conductive particles and a relatively large amount of glass component has a higher electrical resistance than a layer containing a large amount of conductive particles, but has a thermal expansion coefficient close to that of the dielectric layer. It is possible to effectively prevent cracks and delamination at the interface between the electrode and the internal electrode layer. In addition, in the microwave band, current mainly flows through the surface layer of the conductive layer constituting the internal electrode layer. Therefore, the relatively high electric resistance of the center layer does not cause the Q value to decrease so much.

  Therefore, according to the present invention, there is provided a multilayer dielectric resonator that does not cause cracks or delamination in a fired element body, is low in cost, has a high Q value, is small, and has low loss. Can do.

  Preferably, the coating layer includes a lower conductive layer and an upper conductive layer that covers the central layer formed on the lower conductive layer. Preferably, the lateral width of the central layer is narrower than the lateral widths of the lower conductive layer and the upper conductive layer. In such a configuration, the periphery of the center layer can be satisfactorily covered with the coating layer. In the present invention, the internal electrode layer constituting the inductor section may be composed of four or more conductive layers in addition to the upper conductive layer, the central layer, and the lower conductive layer.

  Preferably, the thickness of the coating layer is 2 μm or more. If the thickness of the coating layer is too thin, it tends to be difficult to increase the Q value.

  Preferably, the thickness of the center layer is equal to or greater than the thickness of the covering layer. The thickness of the center layer can be increased to such an extent that it does not violate the demand for miniaturization of the element.

  Preferably, the conductive particles contained in the coating layer are 90% by weight or more, more preferably 95% by weight or more, more preferably 98% by weight or more, particularly close to 100% by weight with respect to 100% by weight of the entire coating layer. included. As the blending amount of the conductive particles contained in the coating layer increases, the electrical resistance decreases and the Q value can be increased.

  Preferably, the conductive particles included in the central layer are included in an amount of 99.8% by weight or less based on 100% by weight of the entire central layer. If the amount of the conductive particles contained in the center layer is too large, the effect of preventing cracks and preventing delamination at the interface between the internal electrode layer and the dielectric layer tends to be reduced.

  Preferably, the glass component contained in the center layer is contained in an amount of 0.2% by weight or more based on 100% by weight of the entire center layer. If the added amount of the glass component is too small, the effect of preventing cracks and preventing delamination at the interface between the internal electrode layer and the dielectric layer tends to be reduced.

  The conductive particles are not particularly limited, and examples thereof include nickel, copper, silver, gold, and alloys thereof. Preferably, the conductive particles are silver or a silver alloy.

  The multilayer dielectric resonator according to the present invention can be used as a band-pass filter or a duplexer, but is preferably used as a band-pass filter.

Hereinafter, the present invention will be described based on embodiments shown in the drawings.
FIG. 1 is an overall perspective view of a multilayer bandpass filter (multilayer dielectric resonator) according to an embodiment of the present invention.
2 is an exploded perspective view of the multilayer bandpass filter shown in FIG.
FIG. 3 is a cross-sectional view of an essential part along the line III-III shown in FIG.
4 is an equivalent circuit diagram of the multilayer bandpass filter shown in FIG. 1 and FIG.
5 and 6 are exploded perspective views showing a manufacturing process of the multilayer bandpass filter shown in FIG.
FIG. 7 is a cross-sectional view of an essential part taken along line VII-VII shown in FIG.

  As shown in FIGS. 1 to 3, the multilayer bandpass filter 2 as an example of the multilayer dielectric resonator according to the present embodiment includes an element body 4. Inside the element body 4, a plurality of internal electrode layers 500 to 504 are laminated via dielectric layers 400 to 408. Capacitor parts C11 to C16 and inductor parts Q1, Q2 and Q3 shown in FIG. 4 are formed by the pattern and laminated structure of these internal electrode layers 500 to 504, and constitute a band-pass filter circuit.

  As shown in FIG. 1, the element body 4 has a rectangular parallelepiped shape, and the size thereof is not particularly limited, but is vertical (X-axis direction) 1.0 to 3.0 mm, horizontal (Y-axis direction) 0. The height is about 5 to 2.5 mm and the height (corresponding to the stacking direction Z) is about 0.6 to 1.0 mm.

  Ground terminal electrodes 8 and 9 are formed on the two side surfaces 4c and 4d facing the Y-axis direction of the element body 4, and the input terminal electrode 6 and the two side surfaces 4a and 4b facing the X-axis direction are formed. An output terminal electrode 7 is formed. Although the material of these terminal electrodes 6-9 is not specifically limited, For example, Au, Ag, Cu, the alloy which has them as a main component, etc. are used.

As shown in FIGS. 2 and 3, internal electrode layers 500 to 504 are laminated on the element body 4 from below in the lamination direction Z through dielectric layers 400 to 408. The dielectric layers 400 to 408 are obtained, for example, by firing dielectric green sheets GS0 to GS8 (green sheets GS5 to GS8 are not shown) shown in FIGS. The material of the dielectric layers 400 to 408 is not particularly limited, and for example, a dielectric material such as a BaTiO ₃ system, a BaZrO ₃ system, a BaNdTi system, or a BaSnTi system is used. The thickness of each dielectric layer 400-408 is not specifically limited, It is 10-200 micrometers.

  The internal electrode layers 500 to 504 formed on the dielectric layers 400 to 408 are formed on the surface of the dielectric green sheet to be the dielectric layers 400 to 408 by a printing method or the like, and are fired together with the green sheets. It becomes an internal electrode. The metal constituting the internal electrode layers 500 to 504 is not particularly limited, and examples thereof include Au, Ag, Cu, and alloys containing them as main components.

  Note that dielectric layers 401, 405, and 406 in which an electrode pattern constituting the internal electrode layer is not formed are laminated between the internal electrode layers 500 and 501 and between the internal electrode layers 503 and 504.

  The internal electrode layer 500 located on the lowermost side in the stacking direction Z-axis of the element body 4 is a rectangular pattern extending in the Y-axis direction, as shown in FIGS. 2 and 5, and the width of the dielectric layer 400 in the X-axis direction. It has a slightly narrower width. This internal electrode layer 500 is an electrode pattern that is axisymmetric with respect to a center line extending in the Y-axis direction, extends so as to connect the side surfaces 4c and 4b, and is connected to the terminal electrodes 8 and 9 shown in FIG. It is electrically connected.

  As shown in FIG. 5, the internal electrode layer 501 located above the internal electrode layer 500 through the dielectric layers 401 and 402 is formed in one capacitor electrode pattern for forming the capacitor portion C11 shown in FIG. Has been. As shown in FIG. 5, the internal electrode layer 501 has an isolated pattern that is not exposed on any of the side surfaces 4a to 4d, and serves as a floating electrode of the capacitor portion C11 shown in FIG. The internal electrode layer 501 is formed on the surface of the dielectric layer 402 at a central position in the X-axis direction at a position close to the side surface 4d, and with respect to a center line extending in the Y-axis direction when viewed from the plane arrow side. This is a line-symmetric electrode pattern.

  As shown in FIGS. 5 and 6, the internal electrode layer 502 located above the internal electrode layer 501 via the dielectric layer 403 is branched into three from the common ground lead pattern 21 exposed on the side surface 4c. Three inductor conductive patterns 20 extending parallel to the Y-axis direction are provided. In this embodiment, the inductor conductive pattern 20 is a linear pattern (one type of longitudinal pattern), and each part of the inductor portions Q1 to Q3 shown in FIG.

  Capacitor electrode patterns 24 mainly constituting the electrodes of the capacitor portions C11 to C16 shown in FIG. 4 are integrally formed on the heads of the respective conductor patterns 20 for inductors.

  The capacitor electrode patterns 24 located on both sides in the X-axis direction are integrally formed with lead patterns 22 and 23 extending in the X-axis direction at the center in the Y-axis direction. The lead pattern 22 is exposed on the side surface 4a and connected to the input terminal electrode 6 shown in FIG. The lead pattern 23 is exposed on the side surface 4b and connected to the output terminal electrode 6 shown in FIG. As shown in FIGS. 5 and 6, the internal electrode layer 502 is an electrode pattern that is line-symmetric with respect to a center line extending in the Y-axis direction when viewed from the plane arrow side.

  As shown in FIGS. 2 and 3, each inductor conductive pattern 20 has a center layer 20a and a covering layer 20b covering the center layer 20a. The center layer 20a is composed of a layer containing relatively few conductive particles and a relatively large amount of glass component. The coating layer 20b contains more conductive particles than the center layer 20a.

  The conductive particles contained in the coating layer 20b are contained in an amount of 90% by weight or more, more preferably 95% by weight or more, more preferably 98% by weight or more, particularly close to 100% by weight with respect to 100% by weight of the entire coating layer. As the blending amount of the conductive particles contained in the coating layer 20b increases, the electrical resistance decreases and the Q value can be increased.

  The conductive particles contained in the center layer 20a are contained in 99.8% by weight or less with respect to 100% by weight of the entire center layer. If the amount of the conductive particles contained in the center layer 20a is too large, the effect of preventing cracks and delamination at the interface between the conductor pattern 20 and the dielectric layers 403 and 404 tends to be reduced. In addition, even if the compounding quantity of the electroconductive particle contained in the center layer 20a is zero, since electricity flows through the coating layer 20b, there is no problem, but it is preferably 70 to 99.8% by weight.

  The glass component contained in the center layer 20a is contained in an amount of 0.2% by weight or more based on 100% by weight of the entire center layer. If the added amount of the glass component is too small, the effect of preventing cracks and preventing delamination at the interface between the internal electrode layer and the dielectric layer tends to be reduced. Since the center layer 20a does not necessarily have conductivity, there may be a center layer 20a having a glass component of 100% by weight or a center layer 20a composed of the same components as the dielectric layers 400 to 408. . However, the glass component contained in the center layer 20a is preferably 0.2 to 30% by weight with respect to 100% by weight of the entire center layer.

  The conductive particles contained in the center layer 20a and the covering layer 20b are not particularly limited, and examples thereof include nickel, copper, silver, gold, and alloys thereof. Preferably, the conductive particles are silver or silver. It is an alloy. Silver or a silver alloy is preferable because it has a low electrical resistance, can be co-fired with a dielectric glass ceramic at a low temperature, and can be fired in the air.

  The cross-sectional shape of the center layer 20a is not particularly limited, and examples thereof include an elliptical shape, a circular shape, a quadrangular shape, and other shapes as shown in FIG. 3, but are preferably an elliptical shape and a circular shape. The shape of the covering layer 20b is preferably a shape that covers the periphery of the center layer 20a with a uniform thickness.

  The thickness of the coating layer 20b is 2 μm or more. If the thickness of the coating layer 20b is too thin, it tends to be difficult to increase the Q value. In addition, the upper limit of the thickness of the coating layer 20b is preferably 10 μm or less. If the thickness of the coating layer 20b is too thick, the possibility of generating cracks and delamination increases, and the amount of conductive particles used increases, resulting in an increase in manufacturing cost. Moreover, it is contrary to the demand for miniaturization of the element.

  The thickness of the center layer 20a (the maximum thickness in the stacking direction Z) is equal to or greater than the thickness of the coating layer 20b. The thickness of the center layer 20a can be increased to such an extent that it does not violate the demand for device miniaturization. The upper limit of the thickness of the center layer 20a is preferably 10 μm or less. If the center layer 20a is too thick, it is against the demand for smaller elements.

  For example, as shown in FIG. 7, the elliptical center layer 20a and the covering layer 20b are a lower conductive layer 20b1 before firing, a center layer 20a1 before firing formed on the lower conductive layer 20b1, and a top layer thereof. It is formed by baking the upper conductive layer 20b2 before baking to coat. In this case, the lateral width W1 of the center layer 20a1 is narrower than the lateral width W2 of the lower conductive layer 20b1 and the upper conductive layer 20b2. In such a configuration, as shown in FIG. 3, the periphery of the center layer 20a can be satisfactorily covered with the covering layer 20b. The lateral width W1 of the center layer 20a1 is not particularly limited, but is preferably 20 to 300 μm, and the lateral width difference (W2−W1) is preferably 5 to 15 μm.

  In the present invention, the inductor conductive pattern 20 may be composed of four or more conductive layers in addition to the upper conductive layer 20b2, the central layer 20a1, and the lower conductive layer 20b1. In the illustrated embodiment, in the internal electrode layer 502, only the inductor conductive pattern 20 is constituted by the center layer 20a and the covering layer 20b. However, in the present invention, the common ground lead pattern 21 and the capacitor electrode pattern are formed. 24, the entire internal electrode layer 502 including the lead patterns 22 and 23 may be composed of the center layer 20a and the covering layer 20b.

  As shown in FIG. 6, the internal electrode layer 503 located above the internal electrode layer 502 via the dielectric layer 404 is located at a position corresponding to the capacitor electrode pattern 24 in the internal electrode layer 502. Have Each capacitor electrode pattern 31 is paired with the capacitor electrode pattern 24 via the dielectric layer 404 to constitute the capacitor portions C12, C14, and C16 shown in FIG.

  Further, capacitor portions C13 and C15 shown in FIG. 4 are formed between the capacitor electrode patterns 24 and 31 which are adjacent in the same plane. The three capacitor electrode patterns 31 are connected to the common ground lead pattern 32 on the side surface 4 d of the element body 4. The common ground lead pattern 32 is exposed on the side surface 4d and connected to the terminal electrode 9 shown in FIG.

  As shown in FIG. 2, the internal electrode layer 504 located above the dielectric layers 405, 406, and 407 is a rectangular pattern extending in the Y-axis direction and is slightly narrower than the X-axis direction width of the dielectric layer 407. Have The internal electrode layer 504 has the same pattern as the internal electrode layer 500, extends so as to connect the side surfaces 4c and 4b, and is electrically connected to the terminal electrodes 8 and 9 shown in FIG.

  In the present embodiment, the inductor portions Q1 to Q3 shown in FIG. 4 are each composed of a center layer 20a and a covering layer 20b as shown in FIG. In the present embodiment, the coating layer 20b of the inductor conductive pattern 20 constituting the inductor portions Q1 to Q3 is formed of a layer containing a large amount of conductive particles, thereby greatly reducing the electrical resistance and reducing the Q loss with a low loss. A resonator structure having a high value can be realized. That is, in this embodiment, it is possible to pass a larger amount of current and the insertion loss is smaller than in the conventional structure. Therefore, in the present embodiment, it is possible to realize a multilayer dielectric resonator having a high Q value and low loss even when the size is reduced.

  In addition, in this embodiment, the layer containing a large amount of conductive particles is not thickened, but the layer containing a large amount of conductive particles is a coating layer, and the central layer is made of glass with relatively few conductive particles. It is composed of a layer containing a relatively large amount of components. A layer containing a relatively small amount of conductive particles and a relatively large amount of glass component has a higher electrical resistance than a layer containing a large amount of conductive particles, but has a thermal expansion coefficient close to that of the dielectric layer. It is possible to effectively prevent cracks and delamination at the interface between the electrode and the internal electrode layer. In addition, in the microwave band, current mainly flows through the surface layer of the conductive layer constituting the internal electrode layer. Therefore, the relatively high electrical resistance of the center layer 20a is a factor that lowers the Q value so much. It does not become.

  Therefore, according to the present embodiment, it is possible to provide a bandpass filter 2 that is low in cost, high in Q value, small in size and low in loss without causing cracks or delamination in the element body after firing. it can.

  The present invention is not limited to the above-described embodiment, and can be variously modified within the scope of the present invention.

  For example, the multilayer dielectric resonator according to the present invention can be used not only as a band-pass filter but also as a resonator for other purposes.

FIG. 1 is an overall perspective view of a multilayer bandpass filter (multilayer dielectric resonator) according to an embodiment of the present invention. FIG. 2 is an exploded perspective view of the multilayer bandpass filter shown in FIG. FIG. 3 is a cross-sectional view of an essential part taken along line III-III shown in FIG. FIG. 4 is an equivalent circuit diagram of the multilayer bandpass filter shown in FIGS. FIG. 5 is an exploded perspective view showing a manufacturing process of the multilayer bandpass filter shown in FIG. FIG. 6 is an exploded perspective view showing a step subsequent to FIG. FIG. 7 is a cross-sectional view of an essential part taken along line VII-VII shown in FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 2 ... Laminated band pass filter 4 ... Element main body 6 ... Input terminal electrode 7 ... Output terminal electrode 8, 9 ... Grounding terminal electrode 20 ... Conductor pattern for inductor 20a ... Center layer 20b ... Cover layer 20b1 ... Lower conductive layer 20b2 ... Upper conductive layer 24 ... Capacitor electrode pattern 400-408 ... Dielectric layer 500-504 ... Internal electrode layer

Claims (9)

A multilayer dielectric resonator in which a plurality of internal electrode layers are laminated via a dielectric layer, and a capacitor part and an inductor part are formed by a pattern and a laminated structure of these internal electrode layers,
At least the inductor section is
A central layer containing relatively few conductive particles and a relatively large amount of glass component;
A laminated dielectric resonator comprising: a covering layer that is formed so as to cover the periphery of the center layer and contains more conductive particles than the center layer.   2. The multilayer dielectric resonator according to claim 1, wherein the covering layer includes a lower conductive layer and an upper conductive layer covering the central layer formed on the lower conductive layer. .   3. The stacked dielectric resonator according to claim 1, wherein a lateral width of the center layer is narrower than lateral widths of the lower conductive layer and the upper conductive layer.   The multilayer dielectric resonator according to claim 1, wherein the coating layer has a thickness of 2 μm or more.   The multilayer dielectric resonator according to claim 1, wherein a thickness of the center layer is equal to or greater than a thickness of the covering layer.   6. The multilayer dielectric resonator according to claim 1, wherein the conductive particles contained in the coating layer are contained in an amount of 90% by weight or more with respect to 100% by weight of the entire coating layer.   7. The multilayer dielectric resonance according to claim 1, wherein the conductive particles contained in the center layer are contained in an amount of 99.8% by weight or less with respect to 100% by weight of the entire center layer. vessel.   The laminated dielectric resonator according to claim 1, wherein the glass component contained in the center layer is contained in an amount of 0.2% by weight or more based on 100% by weight of the entire center layer. .   The multilayer dielectric resonator according to claim 1, wherein the conductive particles are silver or a silver alloy.

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