JP2007176761A - Manufacturing method and manufacturing device for silicon single crystal - Google Patents

Manufacturing method and manufacturing device for silicon single crystal Download PDF

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JP2007176761A
JP2007176761A JP2005378618A JP2005378618A JP2007176761A JP 2007176761 A JP2007176761 A JP 2007176761A JP 2005378618 A JP2005378618 A JP 2005378618A JP 2005378618 A JP2005378618 A JP 2005378618A JP 2007176761 A JP2007176761 A JP 2007176761A
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single crystal
silicon single
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material melt
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JP4986452B2 (en
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Shinichi Kubu
真一 久府
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Siltronic Japan Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a manufacturing method productively manufacturing a silicon single crystal while eliminating the formation of a tail portion. <P>SOLUTION: The pulling of the silicon single crystal S is substantially stopped without extremely changing the thermal history of the silicon single crystal S by raising a crucible 4 filled with a raw material melt liquid M at the same speed as that of the pulling speed of the silicon single crystal S after growing a straight barrel portion S1 of the silicon single crystal S. The silicon single crystal S is separated from the raw material melt liquid M in the state of nontransition in a state where a shape of a growing face of the silicon single crystal S is a protruded shape facing downward by separating the silicon single crystal S from the raw material melt liquid M. As a result, the silicon single crystal wherein the formation of the tail portion is eliminated can be carried out by reproductively performing the nontransition separation of the silicon single crystal S from the raw material melt liquid M. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、チョクラルスキ法(以下、CZ法と記す。)によるシリコン単結晶製造技術に関し、特に、テール部の形成を省略して生産性良くシリコン単結晶を製造する技術に関する。   The present invention relates to a silicon single crystal manufacturing technique using the Czochralski method (hereinafter referred to as CZ method), and more particularly to a technique for manufacturing a silicon single crystal with high productivity by omitting the formation of a tail portion.

CZ法では、シリコン多結晶原料を坩堝内で加熱し融解させて原料融液を生成し、その原料融液の液面に種結晶を浸漬した後、種結晶を保持している引上ワイヤを徐々に巻き取ることにより、シリコン単結晶の引き上げを行う。その際、先ず、種結晶との接触部をから徐々に拡経したコーン部(拡径部)を成長させ、結晶径が目標の径に達したら直径が一定の直胴部(定径部)を成長させる。そして、直胴部の長さが所定の長さに到達したら、シリコン単結晶を原料融液から切り離す。   In the CZ method, a polycrystalline silicon raw material is heated and melted in a crucible to produce a raw material melt, a seed crystal is immersed in the liquid surface of the raw material melt, and then a pulling wire holding the seed crystal is used. The silicon single crystal is pulled up by gradually winding up. At that time, first, a cone part (diameter enlarged part) gradually expanded from the contact part with the seed crystal is grown, and when the crystal diameter reaches a target diameter, a straight body part (constant diameter part) having a constant diameter. Grow. Then, when the length of the straight body part reaches a predetermined length, the silicon single crystal is separated from the raw material melt.

シリコン単結晶を原料融液から切り離す際、単に切り離しを行ったのでは、切り離し部位であるシリコン単結晶の下端部に急激な温度低下が起こる。その結果、引き上げられたシリコン単結晶内にスリップ転移が発生し、単結晶化率を大きく低下させてしまう。   When the silicon single crystal is separated from the raw material melt, if the separation is simply performed, a rapid temperature drop occurs at the lower end of the silicon single crystal, which is the separation site. As a result, slip transition occurs in the pulled silicon single crystal, and the single crystallization rate is greatly reduced.

そこで、通常は、シリコン単結晶の直胴部の成長後、徐々に直径を細く絞っていき、シリコン単結晶と原料融液との接触面積を十分に小さくした状態で、シリコン単結晶を原料融液から切り離すことにより、スリップ転移の発生を防止している。この細く絞られた縮径部位はテール部と呼ばれる。   Therefore, normally, after the growth of the straight body portion of the silicon single crystal, the diameter is gradually narrowed and the silicon single crystal is melted in the raw material in a state where the contact area between the silicon single crystal and the raw material melt is sufficiently small. By separating from the liquid, the occurrence of slip transition is prevented. This narrowed portion with a reduced diameter is called a tail portion.

しかし、テール部は、その直径が一定でないという理由から、ウエハ加工時には切り落とされてしまう不要の部位となる。したがって、シリコン単結晶の生産性を高める上でテール部の形成工程を短縮または省略することが望ましい。   However, the tail portion is an unnecessary portion that is cut off during wafer processing because the diameter is not constant. Therefore, it is desirable to shorten or omit the tail forming process in order to increase the productivity of the silicon single crystal.

シリコン単結晶のテール部の形成工程を短縮または省略する技術は既に幾つか存在し、その一つとして、シリコン単結晶を融液につけ込み、その後、当該シリコン単結晶を融液から切り離す方法が知られている(特許文献1)。   There are already several techniques for shortening or omitting the process of forming the tail portion of a silicon single crystal, and one of them is a method of putting a silicon single crystal into a melt and then separating the silicon single crystal from the melt. (Patent Document 1).

しかし、上記文献記載の従来技術では、シリコン単結晶を融液につけ込む時に異物の巻き込み等が起こり易く、歩留を低下させてしまうという問題がある。
特開平11−335197号公報
However, the prior art described in the above-mentioned document has a problem in that foreign matter is likely to be involved when the silicon single crystal is put into the melt, resulting in a decrease in yield.
JP 11-335197 A

本発明が解決しようとする課題は、テール部の形成を省略して生産性良くシリコン単結晶を製造することができるシリコン単結晶の製造方法および製造装置、更には、当該製造装置用のプログラムおよび当該プログラムを記録した記録媒体提供することにある。   The problem to be solved by the present invention is that a silicon single crystal manufacturing method and manufacturing apparatus capable of manufacturing a silicon single crystal with high productivity by omitting the formation of the tail portion, and a program for the manufacturing apparatus and To provide a recording medium on which the program is recorded.

上記課題を解決するために、本発明の製造方法は、シリコン単結晶の直胴部を成長させた後、当該シリコン単結晶の引き上げ速度と同速度で当該シリコン単結晶の原料融液の入った坩堝を上昇させ、その後、当該原料融液から当該シリコン単結晶を切り離すようにした。   In order to solve the above-mentioned problems, the manufacturing method of the present invention has grown the straight body portion of the silicon single crystal and then entered the raw material melt of the silicon single crystal at the same speed as the pulling speed of the silicon single crystal. The crucible was raised, and then the silicon single crystal was separated from the raw material melt.

この製造方法によれば、シリコン単結晶の直胴部を成長させた後、原料融液の入った坩堝を育成中のシリコン単結晶の引き上げ速度と同じ速度で上昇させることにより、シリコン単結晶の熱履歴を大きく変化させることなくシリコン単結晶の引き上げを実質的に停止させ、その状態で、原料融液からのシリコン単結晶の切り離しを行うことにより、シリコン単結晶の下端面すなわち原料融液との界面の形状を下向きの凸形状にして、シリコン単結晶を無転移状態のまま原料融液から切り離すことが可能となる。   According to this manufacturing method, after growing the straight body portion of the silicon single crystal, the crucible containing the raw material melt is increased at the same speed as the pulling speed of the silicon single crystal that is being grown. By substantially stopping the pulling of the silicon single crystal without greatly changing the thermal history, and separating the silicon single crystal from the raw material melt in that state, the lower end surface of the silicon single crystal, that is, the raw material melt Thus, it becomes possible to separate the silicon single crystal from the raw material melt in a non-transitional state.

本発明の製造装置は、原料融液の入った坩堝を昇降移動させる坩堝駆動機構と、前記坩堝内の原料融液からシリコン単結晶を成長させつつ引き上げるための単結晶引き上げ機構と、シリコン単結晶の直胴部を成長させた後、当該シリコン単結晶の引き上げ速度と同速度で前記坩堝を上昇させ、その後、前記原料融液から当該シリコン単結晶を切り離すように前記坩堝駆動機構および前記単結晶引き上げ機構の動作を制御する制御装置と、を備えたものである。   The manufacturing apparatus of the present invention includes a crucible driving mechanism for moving up and down a crucible containing a raw material melt, a single crystal pulling mechanism for pulling a silicon single crystal while growing it from the raw material melt in the crucible, and a silicon single crystal The crucible drive mechanism and the single crystal so that the silicon single crystal is separated from the raw material melt. And a control device that controls the operation of the pulling mechanism.

この製造装置によれば、本発明の製造方法を容易に実施することができる。すなわち、シリコン単結晶の直胴部を成長させた後、原料融液の入った坩堝を育成中のシリコン単結晶の引き上げ速度と同じ速度で上昇させて、シリコン単結晶の熱履歴を大きく変化させることなくシリコン単結晶の引き上げを実質的に停止させ、その状態で、原料融液からのシリコン単結晶の切り離しを行うことにより、シリコン単結晶の下端面の形状を下向きの凸形状にして、シリコン単結晶を無転移状態のまま原料融液から切り離すことが可能となる。   According to this manufacturing apparatus, the manufacturing method of the present invention can be easily implemented. That is, after growing the straight body of the silicon single crystal, the crucible containing the raw material melt is increased at the same rate as the pulling speed of the silicon single crystal being grown to greatly change the thermal history of the silicon single crystal. In this state, the pulling of the silicon single crystal is substantially stopped, and in this state, the silicon single crystal is separated from the raw material melt, so that the shape of the lower end surface of the silicon single crystal becomes a downward convex shape. The single crystal can be separated from the raw material melt in a non-transitional state.

本発明のプログラムは、本発明の製造装置が備える前記制御装置をコンピュータを用いて実現するためのプログラムである。   The program of this invention is a program for implement | achieving the said control apparatus with which the manufacturing apparatus of this invention is provided using a computer.

本発明の記録媒体は、本発明のプログラムを記録したコンピュータ読み取り可能な記録媒体である。   The recording medium of the present invention is a computer-readable recording medium that records the program of the present invention.

本発明にかかる製造方法および製造装置によれば、シリコン単結晶の直胴部を成長させた後、原料融液の入った坩堝を育成中のシリコン単結晶の引き上げ速度と同じ速度で上昇させることにより、シリコン単結晶の熱履歴を大きく変化させることなくシリコン単結晶の引き上げを実質的に停止させ、その状態で、原料融液からのシリコン単結晶の切り離しを行うことにより、シリコン単結晶の下端面すなわち原料融液との界面の形状を下向きの凸形状にして、シリコン単結晶を無転移状態のまま原料融液から切り離すことが可能となるので、テール部の形成を省略して生産性良くシリコン単結晶を製造することができる。   According to the manufacturing method and the manufacturing apparatus of the present invention, after the straight body portion of the silicon single crystal is grown, the crucible containing the raw material melt is increased at the same speed as the pulling speed of the growing silicon single crystal. Accordingly, the pulling of the silicon single crystal is substantially stopped without significantly changing the thermal history of the silicon single crystal, and in this state, the silicon single crystal is separated from the raw material melt, thereby The shape of the end face, that is, the interface with the raw material melt, has a downward convex shape, so that the silicon single crystal can be separated from the raw material melt in a non-transitional state, so the tail portion is omitted and the productivity is high. A silicon single crystal can be manufactured.

本発明のプログラムによれば、これをコンピュータにインストールすることにより、本発明の製造装置が備える制御装置を容易に実現することができる。   According to the program of the present invention, the control device provided in the manufacturing apparatus of the present invention can be easily realized by installing the program in a computer.

本発明の記録媒体によれば、これに記録されているプログラムをコンピュータにインストールすることにより、本発明の製造装置が備える制御装置を容易に実現することができる。   According to the recording medium of the present invention, the control device provided in the manufacturing apparatus of the present invention can be easily realized by installing the program recorded on the computer.

以下、本発明を実施するための最良の形態について説明する。   Hereinafter, the best mode for carrying out the present invention will be described.

図1〜図6は本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置(本発明の製造装置)の形態例を示す概略断面図である。また、図1〜図6は本発明の製造方法における製造工程を示す一連の工程図でもある。   1 to 6 are schematic cross-sectional views showing an example of a manufacturing apparatus (manufacturing apparatus of the present invention) used when manufacturing a silicon single crystal by the manufacturing method of the present invention. Moreover, FIGS. 1-6 is also a series of process drawings which show the manufacturing process in the manufacturing method of this invention.

この製造装置1は、引上炉2と、引上炉2の底部中央を貫通して設けられた坩堝支持軸3と、坩堝支持軸3の上端部に装填された石英製の坩堝4と、坩堝4とその周辺を周囲から加熱するべく引上炉2のメイン水冷チャンバ2bの内側に同心円状に配されたヒータ5と、坩堝支持軸3を昇降及び回転させる坩堝支持軸駆動機構(坩堝駆動機構)6と、種結晶7を保持するシードチャック8と、シードチャック8を釣支する引上ワイヤ9と、引上ワイヤ9を巻き取るワイヤ巻取り機構(単結晶引き上げ機構)10と、坩堝支持軸駆動機構6およびワイヤ巻取り機構10の動作を制御する制御装置11と、を備えている。   The manufacturing apparatus 1 includes a pulling furnace 2, a crucible support shaft 3 provided through the center of the bottom of the pulling furnace 2, a quartz crucible 4 loaded on the upper end of the crucible support shaft 3, A heater 5 arranged concentrically inside the main water-cooling chamber 2b of the pulling furnace 2 to heat the crucible 4 and its periphery from the surroundings, and a crucible support shaft drive mechanism (crucible drive) that moves the crucible support shaft 3 up and down Mechanism) 6, a seed chuck 8 holding the seed crystal 7, a pulling wire 9 for supporting the seed chuck 8, a wire winding mechanism (single crystal pulling mechanism) 10 for winding the pulling wire 9, and a crucible And a control device 11 that controls the operation of the support shaft drive mechanism 6 and the wire winding mechanism 10.

制御装置11は、CPU(Central Processing Unit)、ROM(Read Only Memory)、RAM(Random Access Memory)、および入出力インタフェースといったコンピュータの基本要素を全て備えている。ROMには、本発明にかかる制御プログラムがインストールされている。CPUは、ROMにインストールされた制御プログラムに従ってRAMを作業領域に使用しつつ演算処理を実行することにより各種制御信号を生成する。この制御装置11が坩堝支持軸駆動機構6とワイヤ巻取り機構10の動作、更にはヒータ5や真空ポンプ(図示せず)、Arガス供給系(図示せず)などの動作を制御することにより、製造装置1によるシリコン単結晶の製造が実施される。   The control device 11 has all the basic elements of a computer such as a CPU (Central Processing Unit), a ROM (Read Only Memory), a RAM (Random Access Memory), and an input / output interface. A control program according to the present invention is installed in the ROM. The CPU generates various control signals by executing arithmetic processing while using the RAM as a work area in accordance with a control program installed in the ROM. This control device 11 controls the operations of the crucible support shaft drive mechanism 6 and the wire winding mechanism 10, and further the operations of the heater 5, vacuum pump (not shown), Ar gas supply system (not shown), and the like. A silicon single crystal is manufactured by the manufacturing apparatus 1.

この製造装置1によりシリコン単結晶を製造する際、まず図1に示すように、シリコン単結晶の原料となるシリコン多結晶原料Pを坩堝4側に充填する。   When a silicon single crystal is manufactured by the manufacturing apparatus 1, first, as shown in FIG. 1, a silicon polycrystal raw material P, which is a silicon single crystal raw material, is filled into the crucible 4 side.

つぎに、図2に示すように、引上炉2のメイン水冷チャンバ2bの上部を上部水冷チャンバ2aで密閉した後、真空ポンプ(図示せず)を稼働させて底部水冷チャンバ2cの排ガス管12より排気をしながら上部水冷チャンバ2aのポートよりArガスを供給して、引上炉2内をAr雰囲気に置換する。その後、ヒータ5を作動させて坩堝4内に充填されたシリコン多結晶原料Pを融解させ、原料融液Mを得る。   Next, as shown in FIG. 2, after the upper part of the main water cooling chamber 2b of the pulling furnace 2 is sealed with the upper water cooling chamber 2a, a vacuum pump (not shown) is operated to exhaust gas pipe 12 of the bottom water cooling chamber 2c. Ar gas is supplied from the port of the upper water cooling chamber 2a while exhausting more, and the inside of the pulling furnace 2 is replaced with an Ar atmosphere. Thereafter, the heater 5 is operated to melt the silicon polycrystalline raw material P filled in the crucible 4 to obtain a raw material melt M.

つぎに、ワイヤ巻取り機構10により引上ワイヤ9を繰り出すことにより、図3に示すように、シードチャック8に取り付けた種結晶8をシリコン融液Mの表面まで降下させて浸漬する。その後、ワイヤ巻取り機構10により引上ワイヤ9を徐々に巻き取ることにより、図4に示すようにシリコン単結晶Sの引き上げを行い、シリコン単結晶Sがコーン部(拡径部)S0の成長を経て目標の直径に到達したら、直胴部(定径部)S1を成長させていく。   Next, by pulling up the pulling wire 9 by the wire winding mechanism 10, the seed crystal 8 attached to the seed chuck 8 is lowered to the surface of the silicon melt M and immersed as shown in FIG. Thereafter, the pulling wire 9 is gradually wound by the wire winding mechanism 10 to pull up the silicon single crystal S as shown in FIG. 4, and the silicon single crystal S grows into a cone portion (expanded portion) S0. When the target diameter is reached through the process, the straight body part (constant diameter part) S1 is grown.

そして、直胴部S1が設定長さに到達したら、坩堝支持軸駆動機構6による坩堝支持軸3の上昇を開始することにより、図5に示すように、シリコン単結晶Sの引き上げ速度と同速度で坩堝4を上昇させていく。   When the straight body portion S1 reaches the set length, the crucible support shaft drive mechanism 6 starts to raise the crucible support shaft 3, thereby speeding up the silicon single crystal S as shown in FIG. Then the crucible 4 is raised.

そして、坩堝4が所定の高さまで上昇したら、坩堝支持軸駆動機構6による坩堝支持軸3の上昇およびワイヤ巻取り機構10による引上ワイヤ9の巻き取りを停止させる。その後、坩堝支持軸駆動機構6により坩堝支持軸3を下降させることにより坩堝4を下降させ、図6に示すように原料融液Mからシリコン単結晶Sを切り離す。   When the crucible 4 rises to a predetermined height, the crucible support shaft drive mechanism 6 raises the crucible support shaft 3 and the wire take-up mechanism 10 winds the pull-up wire 9. Thereafter, the crucible support shaft 3 is lowered by the crucible support shaft drive mechanism 6 to lower the crucible 4, and the silicon single crystal S is separated from the raw material melt M as shown in FIG.

図7(a)〜(d)は、シリコン単結晶Sの成長面(原料融液との界面)の形状変化の過程を示している。直胴部S1を育成している時のシリコン単結晶Sの成長面すなわち原料融液Mとの界面の形状は、図7(a)に示すように上向きの凸形状になっているが、坩堝4をシリコン単結晶Sの引き上げ速度と同じ速度で上昇させ始めると、シリコン単結晶Sの引き上げが実質的に停止(坩堝4とシリコン単結晶Sとが上下方向に関して相対移動停止)するため、シリコン単結晶Sの成長面の上向きの凸形状が図7(b)に示すように徐々に緩和されていく。そして、この実質的停止状態が所定時間維持されると、シリコン単結晶Sの成長面の形状が図7(c)に示すように徐々に下向きの凸形状に変化していく。そして、シリコン単結晶Sの成長面の形状が下向きの凸形状の状態で、シリコン単結晶Sの成長面を原料融液Mから切り離すことにより、原料融液Mの波立ちを極力小さく抑えつつ切り離しがなされる。シリコン単結晶Sの切り離しに伴う原料融液Mの波立ちが小さいため、シリコン単結晶Sを無転移に保ったまま、原料融液Mからシリコン単結晶Sを切り離すことができる。   FIGS. 7A to 7D show the process of changing the shape of the growth surface (interface with the raw material melt) of the silicon single crystal S. FIG. The growth surface of the silicon single crystal S when growing the straight body portion S1, that is, the shape of the interface with the raw material melt M is an upward convex shape as shown in FIG. 4 starts to increase at the same speed as the pulling speed of the silicon single crystal S, the pulling of the silicon single crystal S substantially stops (the crucible 4 and the silicon single crystal S stop moving relative to each other in the vertical direction). The upward convex shape of the growth surface of the single crystal S is gradually relaxed as shown in FIG. When this substantially stopped state is maintained for a predetermined time, the shape of the growth surface of the silicon single crystal S gradually changes to a downward convex shape as shown in FIG. Then, the growth surface of the silicon single crystal S is separated from the raw material melt M in a state in which the shape of the growth surface of the silicon single crystal S is a downward convex shape, so that the undulation of the raw material melt M is suppressed as much as possible. Made. Since the undulation of the raw material melt M associated with the separation of the silicon single crystal S is small, the silicon single crystal S can be separated from the raw material melt M while the silicon single crystal S is kept in a transitionless state.

上記のように、この製造方法によれば、シリコン単結晶Sの直胴部S1を成長させた後、原料融液Mの入った坩堝4を育成中のシリコン単結晶Sの引き上げ速度と同じ速度で上昇させることにより、シリコン単結晶Sの熱履歴を大きく変化させることなくシリコン単結晶Sの引き上げを実質的に停止させることができ、その状態で、原料融液Mからのシリコン単結晶Sの切り離しを行うことにより、シリコン単結晶Sの成長面(下端面)の形状を下向きの凸形状にして、シリコン単結晶Sを無転移状態のまま原料融液Mから切り離すことができ、且つ、シリコン単結晶Sの原料融液Mからの無転移切り離しを再現性良く実施できる。   As described above, according to this manufacturing method, after growing the straight body portion S1 of the silicon single crystal S, the same speed as the pulling speed of the silicon single crystal S in which the crucible 4 containing the raw material melt M is grown is grown. , The pulling up of the silicon single crystal S can be substantially stopped without significantly changing the thermal history of the silicon single crystal S. In this state, the silicon single crystal S from the raw material melt M can be stopped. By performing the separation, the shape of the growth surface (lower end surface) of the silicon single crystal S can be made a downward convex shape, so that the silicon single crystal S can be separated from the raw material melt M in a non-transitional state, and silicon Transfer-free separation of the single crystal S from the raw material melt M can be performed with good reproducibility.

なお、上記の例では坩堝4とシリコン単結晶Sの上昇を停止させた後、坩堝4を下降させることによりシリコン単結晶Sを原料融液Mから切り離すようにしたが、坩堝4の上昇停止後、シリコン単結晶Sをさらに上昇させることにより切り離しを行うようにしてもよい。   In the above example, the rise of the crucible 4 and the silicon single crystal S is stopped, and then the crucible 4 is lowered to separate the silicon single crystal S from the raw material melt M. Alternatively, the silicon single crystal S may be further lifted to separate it.

本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention 本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention 本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention 本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention 本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention 本発明の製造方法でシリコン単結晶を製造する際に用いる製造装置の形態例を示す断面図Sectional drawing which shows the example of the form of the manufacturing apparatus used when manufacturing a silicon single crystal with the manufacturing method of this invention (a)〜(d)はシリコン単結晶の成長面の形状変化の過程を示す説明図(A)-(d) is explanatory drawing which shows the process of the shape change of the growth surface of a silicon single crystal.

符号の説明Explanation of symbols

1 製造装置
2 引上炉
3 坩堝支持軸
4 坩堝
5 ヒータ
6 坩堝支持軸駆動機構(坩堝駆動機構)
7 種結晶
8 シードチャック
9 引上ワイヤ
10 ワイヤ巻取り機構(単結晶引き上げ機構)
11 制御装置
M シリコン融液
S シリコン単結晶
S1 直胴部
DESCRIPTION OF SYMBOLS 1 Manufacturing apparatus 2 Pulling furnace 3 Crucible support shaft 4 Crucible 5 Heater 6 Crucible support shaft drive mechanism (crucible drive mechanism)
7 Seed crystal 8 Seed chuck 9 Pulling wire 10 Wire winding mechanism (single crystal pulling mechanism)
11 Controller M Silicon melt S Silicon single crystal S1 Straight body

Claims (4)

チョクラルスキ法によるシリコン単結晶の製造方法であって、
シリコン単結晶の直胴部を成長させた後、当該シリコン単結晶の引き上げ速度と同速度で当該シリコン単結晶の原料融液の入った坩堝を上昇させ、その後、当該原料融液から当該シリコン単結晶を切り離すようにしたことを特徴とするシリコン単結晶の製造方法。
A method for producing a silicon single crystal by the Czochralski method,
After growing the straight body portion of the silicon single crystal, the crucible containing the raw material melt of the silicon single crystal is raised at the same speed as the pulling speed of the silicon single crystal, and then the silicon single crystal is extracted from the raw material melt. A method for producing a silicon single crystal, wherein the crystal is separated.
チョクラルスキ法によるシリコン単結晶の製造装置であって、
原料融液の入った坩堝を昇降移動させる坩堝駆動機構と、
前記坩堝内の原料融液からシリコン単結晶を成長させつつ引き上げるための単結晶引き上げ機構と、
シリコン単結晶の直胴部を成長させた後、当該シリコン単結晶の引き上げ速度と同速度で前記坩堝を上昇させ、その後、前記原料融液から当該シリコン単結晶を切り離すように前記坩堝駆動機構および前記単結晶引き上げ機構の動作を制御する制御装置と、
を備えたことを特徴とするシリコン単結晶の製造装置。
An apparatus for producing a silicon single crystal by the Czochralski method,
A crucible drive mechanism for moving the crucible containing the raw material melt up and down;
A single crystal pulling mechanism for pulling up while growing a silicon single crystal from the raw material melt in the crucible;
After growing the straight body portion of the silicon single crystal, the crucible drive mechanism and A control device for controlling the operation of the single crystal pulling mechanism;
An apparatus for producing a silicon single crystal, comprising:
請求項2の製造装置が備える前記制御装置をコンピュータを用いて実現するためのプログラム。   The program for implement | achieving the said control apparatus with which the manufacturing apparatus of Claim 2 is provided using a computer. 請求項3のプログラムを記録したコンピュータ読み取り可能な記録媒体。   A computer-readable recording medium on which the program according to claim 3 is recorded.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2415910A1 (en) 2010-08-06 2012-02-08 Siltronic AG Silicon single crystal production method
WO2013097953A1 (en) * 2011-12-26 2013-07-04 Siltronic Ag Method for manufacturing single-crystal silicon
CN105040099A (en) * 2014-04-21 2015-11-11 环球晶圆日本股份有限公司 Single crystal extraction method
US9611566B2 (en) 2011-12-26 2017-04-04 Siltronic Ag Method for manufacturing single-crystal silicon

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09208376A (en) * 1996-01-26 1997-08-12 Sumitomo Sitix Corp Pulling up of single crystal
JPH09208379A (en) * 1996-01-26 1997-08-12 Sumitomo Sitix Corp Pulling up of single crystal
JPH1095689A (en) * 1996-09-17 1998-04-14 Sumitomo Sitix Corp Method for growing single crystal

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09208376A (en) * 1996-01-26 1997-08-12 Sumitomo Sitix Corp Pulling up of single crystal
JPH09208379A (en) * 1996-01-26 1997-08-12 Sumitomo Sitix Corp Pulling up of single crystal
JPH1095689A (en) * 1996-09-17 1998-04-14 Sumitomo Sitix Corp Method for growing single crystal

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2415910A1 (en) 2010-08-06 2012-02-08 Siltronic AG Silicon single crystal production method
CN102373504A (en) * 2010-08-06 2012-03-14 硅电子股份公司 Silicon single crystal production method
KR101289961B1 (en) 2010-08-06 2013-07-26 실트로닉 아게 Silicon single crystal production method
TWI424104B (en) * 2010-08-06 2014-01-21 Siltronic Ag Silicon single crystal production method
US9051661B2 (en) 2010-08-06 2015-06-09 Siltronic Ag Silicon single crystal production method
WO2013097953A1 (en) * 2011-12-26 2013-07-04 Siltronic Ag Method for manufacturing single-crystal silicon
JP2013133243A (en) * 2011-12-26 2013-07-08 Siltronic Ag Method for producing single crystal silicon
CN104011271A (en) * 2011-12-26 2014-08-27 硅电子股份公司 Method for manufacturing single-crystal silicon
US9611566B2 (en) 2011-12-26 2017-04-04 Siltronic Ag Method for manufacturing single-crystal silicon
US9702055B2 (en) 2011-12-26 2017-07-11 Siltronic Ag Method for manufacturing single-crystal silicon
CN104011271B (en) * 2011-12-26 2017-11-07 硅电子股份公司 The method for manufacturing monocrystalline silicon
CN105040099A (en) * 2014-04-21 2015-11-11 环球晶圆日本股份有限公司 Single crystal extraction method

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