JP2007147371A - Optical element measuring tool, optical element shape measuring device, and method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical element measuring tool capable of holding highly accurately an optical element which is a measuring object, and performing decentering measurement in a shape measuring device. <P>SOLUTION: In this optical element measuring tool 10, since three spherical parts 30 are biased onto a fringe part PA of the optical element OE on a substrate 20 and allowed to abut thereon by an outer shape reference detection means 40, the outer shape reference of the optical element OE can be measured accurately. In this case, since the abutting portion which is constituted of the spherical parts has a shape processable easily with high accuracy, measurement accuracy can be heightened furthermore. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an optical element measurement jig used when measuring the surface shape of an optical element, and relates to an optical element shape measurement apparatus and method using such an optical element measurement jig.

  As a technique for measuring the three-dimensional surface shape of an optical element with high accuracy, there is a contact measurement method in which a stylus is brought into contact with a workpiece and the amount of displacement is measured.

In this type of contact measurement method, it is sometimes necessary not only to measure the surface shape of the optical element, but also to measure the positional deviation of the optical surface relative to the external reference of the optical element, that is, the eccentricity. As a device that can measure such eccentricity, for example, a shape measuring device has been developed that measures the optical axis misalignment with respect to the outer shape by positioning the optical element by placing a positioning jig on the jig. (See Patent Document 1).
JP 2002-71344 A

  However, in the shape measuring apparatus as described above, the positioning jig is fixedly mounted on the jig holder, and the positioning jig does not stably contact the outer shape of the optical element. Therefore, there is a possibility that the measurement accuracy of the center of the optical element calculated from the outer shape reference of the optical element calculated by the positioning jig contact, that is, the outer shape of the optical element may be lowered. In addition, since this positioning jig has a columnar outer shape, it is difficult to increase the processing accuracy and is not suitable for accurate measurement. Furthermore, since the horizontal movement of the optical element is only limited by the columnar positioning jig, there is a risk that the optical element may fall off when the jig is reversed to measure both sides of the optical element. is there.

  For this reason, in order to measure both sides of the optical element, a step of removing the optical element and inverting and measuring each time is necessary, and efficient measurement cannot be performed. Furthermore, since the optical element itself is once removed, the eccentricity of both optical surfaces of the optical element may not be accurately measured.

  SUMMARY OF THE INVENTION An object of the present invention is to provide an optical element measuring jig that can measure an outer shape reference of an optical element, which is an object to be measured, in a shape measuring apparatus with high accuracy and is excellent in processing accuracy. .

  Another object of the present invention is to provide an optical element measuring jig that does not drop off even when inverted.

  It is another object of the present invention to provide an optical element surface shape measuring apparatus and method using the optical element measuring jig as described above.

  In order to solve the above problems, (a) a substrate having a first surface on which an optical element to be measured is placed and a second surface corresponding to the back surface of the first surface; An optical element measurement jig comprising: an external reference detecting means supported on a substrate and provided with a spherical surface portion having a known spherical shape so as to be able to contact the side surface portion of the optical element from a direction perpendicular to the optical axis. (C) The outer shape reference detection means is arranged at a plurality of positions of the substrate so that the outer shape reference of the optical element can be grasped by measuring the spherical surface portion in contact, and at least one of the plurality of outer shape reference detection means. One is configured to be able to come into contact with an urging force that presses the optical element. Here, the “known spherical shape” for the spherical surface means that it is a spherical surface, that is, a shape in which it is possible to grasp in advance that the center of curvature is obtained by shape measurement.

  In the optical element measuring jig, at least one of the plurality of external reference detecting means contact means can be brought into contact with the outer edge portion of the optical element on the substrate with a biasing force. The spherical surface portion of the outer shape reference detection means can be stably held or arranged with respect to the portion. Therefore, it is possible to accurately obtain the outer shape reference, that is, the center of the optical element from the outer edge portion of the optical element. Further, since the abutting portion is constituted by a spherical portion, there is a merit that it is easy to process with high accuracy compared to other shapes.

  In a specific aspect or aspect of the present invention, each spherical surface portion of the plurality of outer shape reference detection means is disposed so as to abut on the optical element at a position where the outer periphery of the optical element is equally divided. . In this case, the optical element can be more stably supported by the spherical portion, and the accuracy of the eccentricity measurement using the spherical portion can be further increased.

  In still another aspect of the present invention, of the plurality of outer shape reference detection means, the outer shape reference detection means that contacts with an urging force that presses the optical element includes a support portion supported by the substrate. An elastic member is provided between the spherical portion and the biasing force between the elastic member and the spherical portion (including between the part of the elastic member and the spherical portion) against the optical element by the elastic member. It has an adjustment means which can adjust. In this case, measurement of optical elements having different outline sizes and shapes of the outer edge portions can be performed with high accuracy. Note that the adjustment means “between the elastic member and the spherical surface portion” is not limited to the case where the adjustment means is provided at the end of the spring as shown in the embodiment. Adjustment means for adjusting the urging force by may be used.

  In still another aspect of the present invention, the optical element is in contact with a surface perpendicular to the optical axis at a plurality of locations, and the optical element is sandwiched between the substrate and the optical element in the optical axis direction is regulated. A plurality of clamping means are provided. In this case, the optical element can be reliably fixed on the substrate also in the optical axis direction, and measurement with the substrate turned upside down is also possible. “Abutting on a surface perpendicular to the optical axis” means not only a flat surface corresponding to the flange of the optical element as shown in the embodiment but also a surface perpendicular to some optical axis. In other words, the surface may be formed so as to be inclined with respect to the surface. In short, it may be any surface as long as it is in contact with a surface that has a maximum or substantially equivalent pressing force in the optical axis direction.

  In still another aspect of the invention, the spherical portion of two of the plurality of outer shape reference detection means corresponds to one side of the outer shape of the optical element placed on the substrate viewed from the optical axis direction. It is comprised so that it may contact | abut to the side part of the position to perform. In this case, even an optical element having an outer shape having at least one side when the optical element is viewed from the optical axis direction, such as an optical element having a rectangular outline, is stably held and accurate. External reference measurement is possible.

  In still another aspect of the present invention, the projection of the optical element is arranged between the contact portions of the side surface portions of the spherical surface portions of the two outer shape reference detection devices of the plurality of outer shape reference detection devices. It is configured as follows. In this case, it is possible to perform measurement while avoiding protrusions such as gate cut marks formed during molding.

In still another aspect of the present invention, the clamping means that clamps the optical element with an urging force to press the optical element has the following range when the pressing force pressing the optical element is F (N): .1 <F <10
Satisfied. If the lower limit is not reached, the outer edge portion of the optical element cannot be pressed against the substrate with a sufficient force, so that the optical element is moved carelessly. If the upper limit is exceeded, the outer edge of the optical element is pressed with an excessive force, so that the optical element is distorted and the measurement result is adversely affected.

In still another aspect of the present invention, when the outer shape reference detection that abuts with an urging force to press the optical element is F ′ (N) as a pressing force for pressing the optical element,
The following range: 0.01 <F ′ <1
Satisfied. If the lower limit is not reached, the degree of adhesion between the outer shape reference detecting means and the outer peripheral portion of the optical element cannot be sufficiently secured, and the outer shape cannot be measured accurately. If the upper limit value is exceeded, the optical element is distorted, and the outer shape cannot be measured accurately.

  In still another aspect of the present invention, the substrate includes an opening capable of measuring the placed optical element from either the first surface or the second surface. In this case, measurement can be performed not only from the front surface side but also from the back surface side through the opening while the optical element is placed on the substrate. This makes it possible to measure the deviation between the center of the surface shape and the center of the back surface shape, that is, the relative eccentricity between the front surface and the back surface. .

  In still another aspect of the present invention, the clamping means includes at least three. In this case, the optical element can be stably and reliably fixed on the substrate.

  In still another aspect of the present invention, the contact portion where the clamping means comes into contact with the optical element is formed in a spherical shape. That the contact portion is spherical means having a shape that can be contacted by a convex curved surface such as a hemisphere. In this case, since the contact portion is in a state close to a point contact, the tilt of the optical element can be prevented as compared with the planar contact even at a plurality of contact points, and the measurement accuracy can be further improved.

  In still another aspect of the invention, the positions where the outer shape reference detection unit and the clamping unit abut on the optical element are alternately arranged at different positions when viewed from the optical axis direction of the optical element. It is configured to be. In this case, both the outer shape reference detection means and the sandwiching means can perform contact or clamping of the outer periphery at a position where the outer periphery is substantially equally divided, so that the measurement by the outer shape reference detection means is easy and highly accurate. The fixing of the optical element can be ensured.

  Moreover, in this invention, the optical element shape measuring apparatus provided with the jig | tool for optical element measurement as mentioned above can be provided. In this case, it is possible to provide a measuring apparatus capable of measuring a highly accurate external reference using a highly accurate jig.

  In addition, by the optical element shape measuring method using the optical element measuring jig described above, it is possible to perform highly accurate external reference measurement.

  Further, in another aspect of the optical element shape measuring method of the present invention described above, the optical element having an outer shape having a gate cut portion includes the contact position of the clamping means and the gate cut portion as viewed from the optical axis direction of the optical element. And are arranged at positions where they overlap. In this case, not only can the periphery of the optical element be securely fixed, but also a pinching member such as a gate mark generated during molding of the optical element can be used to hold the pin, and the outer shape reference detection means can avoid the protrusion. Placement is possible.

  In another form of the shape measuring apparatus, the first and second surfaces of the substrate are provided with a holding unit that can be reversed so that the front and back surfaces can be measured while the optical element is placed. This makes it possible to measure the deviation between the center of the surface shape and the center of the back surface shape, that is, the relative eccentricity between the front surface and the back surface.

  Further, the optical element shape measuring method using the shape measuring apparatus having such a holding unit enables measurement of the front surface and the back surface while the optical element is placed, and the center of the front surface shape and the center of the back surface shape can be measured. Deviation, that is, relative eccentricity between the front surface and the back surface can be measured.

[First Embodiment]
Hereinafter, an optical element measuring jig according to a first embodiment of the present invention will be described with reference to the drawings. FIG. 1A is a plan view of an optical element measurement jig for measuring a surface shape, and FIG. 1B is a cross-sectional view of the optical element measurement jig of FIG. is there. 2 (a) is a partially enlarged plan view of the central portion of the jig shown in FIG. 1 (a), and FIG. 2 (b) is a partially enlarged sectional view corresponding to FIG. 2 (a). .

  The optical element measuring jig 10 is for holding the optical element OE to be measured and setting it on a holding part of a surface shape measuring device (not shown). In such a surface shape measuring device, the optical element OE is used. The shape of the optical surface can be measured from the front side and the back side, and the eccentricity of the optical element OE can be measured. For the above purpose, the optical element measuring jig 10 is described in detail below, and includes a substrate 20, an outer shape reference detecting means 40 having a spherical surface portion 30, a clamping device 50, a spherical measured member 60, and a rotation limiter. Member 70.

  The substrate 20 has an appearance on a rectangular thick plate, and has a first surface and a second surface on the back surface. A circular stage 21 for mounting the optical element OE is provided at the center. The circular stage 21 has an opening 22 at the center, and supports the outer edge PA of the optical element OE at the edge of the opening 22. Thereby, the optical element OE supported on the circular stage 21, that is, the substrate 20 can be observed from the back side and both sides opposite to the front side shown in FIG. 1A, and is used for measurement by a surface shape measuring apparatus (described later). The stylus can be lowered onto both optical surfaces OS1 and OS2 of the optical element OE shown in FIGS. 2 (a) and 2 (b). The substrate 20 also functions as a support for supporting the outer shape reference detection means 40, the clamping device 50, and the spherical member to be measured 60 at appropriate positions around the holding position of the optical element OE.

  The spherical portion 30 is a sphere having substantially the same shape arranged on the substrate 20 and is fixed to the tip as a part of an outer shape reference detection means 40 described later. Each spherical portion 30 has a known spherical shape, and comes into contact with the side surface of the outer edge portion PA of the optical element OE as shown in FIG. The position where each spherical portion 30 abuts on the side surface of the optical element OE corresponds to an equal position obtained by dividing the outer edge PA into three equal parts, and is in three directions (around the optical axis OA) that are 120 ° different from the center of the optical element OE. Are arranged in the same direction. Here, the equally divided positions include not only strictly equal positions but also substantially equal positions. Each spherical portion 30 is urged to abut against the side surface of the outer edge portion PA of the optical element OE, and presses the side surface of the outer edge portion PA from a direction perpendicular thereto with a pressing force having an appropriate magnitude. The pressing force applied to each spherical portion 30 depends on the material and size of the optical element OE, but is set to such an extent that the shape of the optical element OE is not distorted, and the side surface of the spherical portion 30 and the outer edge PA. The degree of close contact with can be secured sufficiently. Specifically, when this pressing force is F ′ (N), the relationship is about 0.01 <F ′ <1. In this way, the three spherical portions 30 having a known spherical shape are appropriately brought into close contact with the appropriate position of the outer edge portion PA, whereby the center of the outer edge portion PA can be obtained, and the optical axis OA of the optical element OE can be obtained. It is also possible to calculate the eccentricity that is the amount of displacement.

Here, it is not necessary for each spherical surface portion 30 in the plurality of outer shape reference detection means to be configured to abut against the side surface of the optical element with an urging force, and at least one of them is applied as such. It only has to be in contact. In this case, the other external shape reference detection means 40 may be fixedly arranged with respect to the substrate.

  The external reference detecting means 40 incorporates a rod 41 having a spherical portion 30 fixed to the tip, a sliding mechanism 42 that smoothly moves the rod 41 in the axial direction, and a spring 43a that biases the rod 41 toward the tip. And an urging member 43 that adjusts the root position of the spring. As shown in FIG. 2A, the rod 41 reciprocates along the groove 21 a while being guided by the groove 21 a carved in the circular stage 21. The sliding mechanism 42 is a guide fixedly provided on the upper surface of the substrate 20, and the base side of the rod 41 is fitted therein, and enables smooth movement along the axial direction of the rod 41. The urging member 43 is a mechanism that is detachably attached to the upper surface of the substrate 20. The urging member 43 urges the rod 41 in the distal direction by a pin 43 b that is urged by a spring 43 a that is an elastic member. In addition, the spherical portion 30 can be pressed against the side surface of the outer edge PA of the optical element OE with a predetermined force. Here, the urging member 43 is provided with an adjuster 43c that houses the spring 43a and the pin 43b and has a screw formed on the outer periphery as an adjusting means, and the base position of the spring 43a is adjusted by adjusting the screwing amount of the adjuster 43c. Fine adjustments can be made. With this adjuster portion 43c, the standard position of the rod 41 and the urging force against the rod 41 can be adjusted as appropriate. Further, even when the size of the optical element OE to be measured is changed by adjusting the adjuster 43c, it is possible to cope with a certain range.

  The clamping device 50 includes three leaf spring-shaped clamping members 51 and a support frame 52 that supports each clamping member 51. As shown in FIG. 2B and the like, a contact portion 51a that contacts the upper surface of the outer edge portion PA of the optical element OE is formed on the back surface of the front end portion of each clamping member 51. Each contact portion 51 a has a hemispherical outer shape, abuts against the outer edge portion PA and urges the optical element OE in the direction of the optical axis OA perpendicular to the plate surface of the substrate 20, and the outer edge portion PA between the substrate 20 and the contact portion 51 a. Pinch. The pressing force to be applied to each contact portion 51a depends on the material and size of the optical element OE, but should not be distorted in the shape of the optical element OE, and is caused by the biasing force of the contact portion 51a. The movement of the optical element OE is hindered by the frictional force. Specifically, when this pressing force is F (N), the condition is about 0.1 <F <10. The contact portion 51 a can be formed by processing the tip of the support frame 52 into a hemispherical shape, forming a plate having an arcuate tip, or attaching a steel ball to the tip of the support frame 52. On the other hand, the support frame 52 supports the base side of the clamping member 51 from the periphery of the optical element OE, and each clamping member 51 extends from a direction different by 120 ° toward the center of the optical element OE. That is, the positions of the three contact portions 51a provided at the tips of the three clamping members 51 correspond to an equal position obtained by dividing the outer edge portion PA into three equal parts. In this way, by uniformly supporting the outer edge PA by point contact by the three contact portions 51a, the optical element OE can be stably supported with high accuracy.

  Each clamping member 51 is detachable from the support frame 52 and can be exchanged according to the size and shape of the optical element OE. When the clamping member 51 is replaced, the urging force applied to each contact portion 51a can be adjusted by adjusting the degree of warpage according to the shape of the optical element OE. Further, as a spring material for forming the holding member 51, beryllium alloy, phosphor bronze, stainless steel, or the like can be used.

  The spherical member 60 to be measured is a spherical body having substantially the same shape arranged on the substrate 20, and is firmly fixed to the substrate 20 by a fixing member 25 provided on the substrate 20. In addition, the opening 23 is formed in the position which fixed the spherical to-be-measured member 60 on the board | substrate 20, and the spherical to-be-measured member 60 fixed to the fixing member 25 is opposite to the front side shown to Fig.1 (a). It can be observed from both sides of the back side, and the stylus of a surface shape measuring device (described later) can be moved so that it touches the upper and lower surfaces of the spherical member 60 and traces the upper and lower surfaces.

  The rotation limiting member 70 has a fan-shaped outer shape as a whole, is a part of the circular stage 21 attached to the center of the substrate 20, and is fixed below one clamping member 51. The rotation limiting member 70 has a concave portion 71 on the optical element OE side, and the concave portion 71 and the flat portion FP formed in the optical element OE engage with each other to engage the optical axis OA of the optical element OE. The rotation position around is adjusted. The flat part FP and the protrusion part PP described above are irregular parts different from the adjacent part with respect to the outline of the outer edge part PA, and are inevitably formed by the injection molding of the optical element OE. It is called a gate cut part. The position of the concave portion 71 is below the one clamping member 51, and the flat portion FP and the projecting portion PP are prevented from contacting the three spherical surface portions 30. Thus, by preventing the spherical portion 30 from coming into contact with the flat portion FP and the protrusion PP, it is possible to prevent the detection accuracy of the outer edge portion PA from being lowered. In the above description, the irregular portion is an uneven portion present on a part of a curved surface, such as a gate cut portion of an optical element, or a linear shape in a D-cut optical element obtained by cutting a part of a circle. This means an outer shape portion that is different from most of the contour shape.

  3A is a partially enlarged view of the rotation limiting member 70, and FIG. 3B shows a modification of the rotation limiting member 70 of FIG. 3A. As shown in FIG. 3A, when the linear flat part FP and the rectangular protrusion part PP are formed on the outer periphery of the optical element OE, the concave part 71 provided in the rotation restricting member 70 has the flat part FP. And a groove portion 71b that fits with the protrusion PP. As shown in FIG. 3B, when a simple protrusion PP having a gate cut portion at the tip is formed on the outer periphery of the optical element OE, the recess 171 provided in the rotation limiting member 170 is It has a groove portion 171a that fits into the protrusion PP.

  In the optical element measurement jig 10 described above, the three spherical surface portions 30 and the three contact portions 51a are alternately arranged at equal intervals along the outer edge portion PA of the optical element OE. As a result, both can be efficiently arranged while preventing interference between the spherical portion 30 and the contact portion 51a, and the measurement of the optical surface OS1 of the spherical portion 30 and the optical element OE can be ensured. Can be increased.

  FIGS. 4A and 4B are a front view and a side view for explaining the structure of the surface shape measuring apparatus 100 using the optical element measuring jig 10 shown in FIG. The surface shape measuring apparatus 100 has a structure in which an XY stage device 82 and a Z driving device 84 are fixed on a surface plate 81. The operations of the XY stage device 82 and the Z drive device 84 are controlled by the control device 99.

  The XY stage device 82 operates by being driven by a driving mechanism that is not described, and the optical element measuring jig 10 that is detachably fixed on a mounting table 82 a provided on the XY stage device 82 is attached to the XY plane. Can be smoothly moved to an arbitrary position two-dimensionally. The position of the optical element measurement jig 10 is detected using an X mirror 83a and a Y mirror 83b provided on the mounting table 82a. That is, the position of the mounting table 82a in the X-axis direction can be determined by using the laser interferometer 83d mounted on the surface plate 81 so as to face the X mirror 83a. Further, the position of the mounting table 82a in the Y-axis direction can be determined using a laser interferometer 83e mounted on the surface plate 81 so as to face the Y mirror 83b.

  The Z drive device 84 has a lifting mechanism 86 fixed on a frame 85. The lifting mechanism 86 is fixed to the upper portion of the frame 85 and extends in the Z direction, and is supported by the support shaft 86a to be in the Z axis direction. Elevating member 86b that moves up and down, elevating drive means (not shown) that elevates and lowers elevating member 86b, stylus holding portion 86d supported by elevating member 86b, and touch supported by elevating member holding portion 86d so that it can be raised and lowered A needle PR.

  The elevating mechanism 86 moves up and down smoothly with the elevating member 86b supported by the support shaft 86a in a non-contact manner. The elevating / lowering holding portion 86d holds the stylus PR, and smoothly moves up and down accordingly. The stylus PR operates feedback driving means (not shown) by applying feedback so that the tip can be smoothly moved up and down with high accuracy in a state where a constant load is applied to the tip. As a result, if the XY stage device 82 is appropriately operated while moving the stylus PR up and down with low stress to move the optical element OE placed on the optical element measurement jig so as to scan two-dimensionally, The tip of the stylus PR can be moved two-dimensionally along the optical surface of the optical element OE fixed to the optical element measuring jig 10. At this time, the tip position of the stylus PR is detected by using a Z mirror 91a provided at the upper end of a member that moves up and down together with the stylus PR. That is, the position of the lower end of the stylus PR in the Z-axis direction can be determined using the laser interferometer 91b mounted on the frame 85 so as to face the Z mirror 91a.

  FIG. 5 is a flowchart for explaining the procedure of the measuring method using the surface shape measuring apparatus shown in FIG.

  First, the optical element OE is set in the surface shape measuring apparatus 100 of FIG. 4 (step S10). This step can be performed by a robot, but is usually performed by an operator. More specifically, the optical element OS is mounted on the optical element measuring jig 10 with the optical surface OS1 on the front side of the optical element OE facing upward (see FIG. 1). That is, the optical element OE is placed on the circular stage 21 with the three outer reference detecting means 40 in the released state with the three leaf spring-like holding members 51 removed. Thereafter, the three external reference detecting means 40 are attached so as to be locked, and the three spherical surface portions 30 are held from the periphery of the optical element OE, and the three leaf spring-like holding members 51 are fixed. Attach to. Thereby, fixation of the optical element OE is completed. Also in this case, the outer edge portion PA of the optical element OE is held from the periphery by the three spherical surface portions 30 and is sandwiched and fixed between the substrate 20 by the three leaf spring-like sandwiching members 51. At this time, the outer edge portion PA of the optical element OE is urged from the periphery by the three spherical surface portions 30 with an appropriate force, and is urged and fixed to the front side of the substrate 20 by the three leaf spring-like holding members 51. . Thereafter, the optical element measuring jig 10 to which the optical element OE is thus fixed is fixed to the mounting table 82 a on the XY stage device 82.

  Next, the surface vertex coordinate system on the front side is measured by measuring the surface shapes of the three spherical members 60 arranged on the periphery of the substrate 20 (step S11). Specifically, in a state where the stylus PR is arranged near the apex of each spherical member to be measured 60, the XY stage device 82 is operated to move the stylus PR to the surface of the spherical member to be measured 60, for example, in a cross shape. Then, the drive device 84 is operated to move the tip of the stylus PR so as not to leave the surface of the spherical portion 30. Thereby, the center of each spherical measured member 60 is calculated.

  Next, the surface vertex coordinates are measured by measuring the surface shapes of the three spherical portions 30 arranged around the optical element OE (step S12). Specifically, in a state where the stylus PR is disposed in the vicinity of the apex of each spherical surface portion 30, the XY stage device 82 is operated to drive the stylus PR while performing a cross movement with respect to the surface of the spherical surface portion 30. The device 84 is operated to move the tip of the stylus PR so as not to leave the surface of the spherical portion 30. Thereby, the center of each spherical part 30 is calculated.

  Next, a surface contour reference position corresponding to the center of the outer edge PA of the optical element OE is calculated (step S13). Here, the surface contour reference position is a coordinate obtained by calculating the center of a circle through which the centers of the three spherical portions 30 pass, assuming that the side surface of the outer edge PA is a perfect circle. Note that the calculation method of the outer shape reference position is not limited to a method for obtaining a circle through which the centers of the three spherical portions 30 pass, and various geometric calculation methods can be used.

  Next, the surface shape of the optical surface OS1 on the front side of the optical element OE is measured (step S14). Specifically, while the stylus PR is disposed above the optical surface OS1 of the optical element OE, the XY stage device 82 is operated to scan and move the stylus PR two-dimensionally with respect to the optical element OE. The drive device 84 is operated to move the tip of the stylus PR so as not to leave the optical surface OS1. Thereby, two-dimensional surface shape data is obtained.

  Next, coordinate transformation for fitting the surface shape data obtained in step S14 with design values is performed (step S15). Specifically, the surface shape data is Z, the design value is Z0, and coordinate conversion is performed so that the least mean square value (RMS) of Zd = Z0−Z that is the difference between these is minimized. At this time, data necessary for coordinate conversion is stored as coordinate conversion data.

  Next, the surface contour eccentricity of the optical element OE is calculated (step S16). Here, the surface outer shape eccentricity of the optical element OE is the amount by which the outer shape reference position corresponding to the center of the outer edge PA is shifted from the optical axis OA obtained from the measured value of the surface shape of the optical surface OS1 related to the optical element OE. To do. The surface shape of the optical element OE corresponds to the surface shape data after coordinate conversion obtained in step S15.

  Next, the optical element measuring jig 10 is turned upside down and set in a holding part of a surface shape measuring apparatus (not shown) (step S17). This step can be performed by a robot, but may or may preferably be performed by an ordinary operator. More specifically, the optical element measurement jig 10 to which the optical element OE is fixed is removed from the mounting table 82a on the XY stage device 82, and the optical element measurement jig 10 is turned upside down and left again. It fixes to the mounting base 82a.

Next, the surface vertex coordinates on the back side are measured by measuring the surface shapes of the three spherical members to be measured 60 arranged in the peripheral portion of the substrate 20 (step S18). Specifically, in a state where the stylus PR is arranged in the vicinity of the apex of each spherical member to be measured 60, the XY stage device 82 is operated to move the stylus PR to, for example, a cross with respect to the back surface of the spherical member to be measured 60. Then, the drive device 84 is operated to move the tip of the stylus PR so as not to leave the surface of the spherical portion 30. Thereby, the center of each spherical measured member 60 is calculated.
Next, the front side surface vertex coordinate system obtained in step S11 and the front side surface vertex coordinate system obtained in step S18 are compared to calculate the relationship between the front side coordinate system and the back side coordinate system (step S19). . When the measurement result of the spherical member 60 is used, the relationship between the front side coordinate system and the back side coordinate system of the substrate 20 is obtained.
Next, a back surface outer shape reference position corresponding to the center of the outer edge PA of the optical element OE is calculated (step S20). Here, the back surface external reference position is obtained by coordinate-transforming the front surface external reference position obtained in step S13 using the relationship between the front side coordinate system and the back side coordinate system obtained in step S19.

  Next, the surface shape of the optical surface OS2 on the back side of the optical element OE is measured (step S21). Specifically, while the stylus PR is disposed above the optical surface OS2 of the optical element OE, the XY stage device 82 is operated to scan the stylus PR two-dimensionally with respect to the optical element OE. The drive device 84 is operated to move the tip of the stylus PR so as not to leave the optical surface OS2. Thereby, two-dimensional back surface shape data can be obtained.

  Next, coordinate transformation for fitting the surface shape data obtained in step S21 with design values is performed (step S22). Since the specific method is the same as that in step S15 on the front side, description thereof is omitted.

  Next, the coordinate transformation data obtained in step S15 and the coordinate transformation data obtained in step S22 are compared using the relationship obtained in step S19, and the relative of both optical surfaces OS1 and OS2 of the optical element OE is compared. The eccentricity is calculated (step S23).

  Next, the back surface outer shape eccentricity of the optical element OE is calculated (step S24). Here, the back surface outer shape eccentricity of the optical element OE is the amount by which the outer shape reference position corresponding to the center of the outer edge PA is shifted from the optical axis OA obtained from the measured value of the surface shape of the optical surface OS2 of the optical element OE. To do.

  The measurement method described above is merely an example, and various modifications can be made. For example, the measurement of steps S11, S12, S14, S18, and S21 can be performed first, and the remaining calculations can be performed collectively.

[Second Embodiment]
The optical element measuring jig according to the second embodiment will be described below. The optical element measuring jig of the second embodiment is a modification of the jig of the first embodiment, and parts not specifically described are common to the apparatus of the first embodiment and are common in the drawings. The same reference numerals are given to the parts to be described, and the duplicate description will be omitted.

  6A is a plan view of the optical element measurement jig according to the second embodiment, and FIG. 6B is a cross-sectional view taken along the line AA of the optical element measurement jig in FIG. 6A. is there. FIG. 7 is a partially enlarged plan view of the central portion of the jig shown in FIG.

  The optical element measuring jig 210 of the present embodiment also measures the shape of the optical surface of the optical element OE from the front side and the back side by holding the optical element OE and setting it in the surface shape measuring device (see FIG. 4). The eccentricity of the optical element OE can be measured. For this reason, the spherical portion 30, the first outer shape reference detection means 240, the second outer shape reference detection means 246, the clamping device 250, and the spherical measured member 60 are provided on the substrate 220. The optical element OE fixed to the optical element measuring jig 210 has a rectangular outline.

  The substrate 220 has an appearance on a rectangular thick plate, has an opening 22 in the center, and supports the outer edge PA of the optical element OE at the edge of the opening 22. Thereby, the optical element OE supported on the substrate 220 can be measured from both the front and back sides.

  The three first outer shape reference detection means 240 respectively bring the spherical surface portion 30 into contact with the side surface of the outer edge portion PA of the optical element OE and press the side surface of the outer edge portion PA with an appropriate force through each spherical surface portion 30. Have a role. Here, the first outer shape reference detection means 240 includes a sliding mechanism 242 that smoothly moves the rod 41 with the spherical portion 30 fixed to the tip in the axial direction, and a leaf spring-like attachment that biases the rod 41 toward the tip. A biasing member 243.

  The second outer shape reference detection means 246 is a plate-like member that fixes the three spherical portions 30 on the substrate 220 in an appropriate arrangement, and the spherical portions 30 are bonded to the corners of the plurality of contour step portions 246a and 246b. It is fixed by. At this time, the shape of the second outer shape reference detection means 246 can avoid interference with the outer edge PA of the optical element OE.

  By the first outer shape reference detection means 240 and the second outer shape reference detection means 246 described above, a total of six spherical surface portions 30 for eccentricity measurement can be arranged on the side surface of the outer edge portion PA of the optical element OE at substantially intervals. The force applied to the side surface of the outer edge PA can be made substantially uniform and in a desired size.

  Each clamping device 250 includes two leaf spring-shaped clamping members 51 and a support body 252 that supports both the clamping members 51. As shown in FIG. 7, a contact portion 51 a that abuts on the upper surface of the outer edge portion PA of the optical element OE is formed on the back surface of the front end portion of each clamping member 51. By each clamping member 51, the outer edge PA of the optical element OE can be uniformly supported by point contact, and the optical element OE can be stably supported with high accuracy.

  The outer edge PA of the optical element OE has a rectangular outline, and a protrusion PP is formed on one side as a gate cut. If the spherical portion 30 is brought into contact with the protruding portion PP, the eccentricity measurement accuracy cannot be obtained. Therefore, the second portion on the substrate 220 is arranged so that the protruding portion PP is arranged at the exact center of the two adjacent spherical portions 30. 1 The arrangement of the outer shape reference detection means 240 is adjusted.

  The optical element measuring jig of the second embodiment described above can also be set in the surface shape measuring apparatus 100 shown in FIGS. 4A and 4B, and the surface of the optical element OE having a rectangular outline. In addition, the shape of the back surface can be measured, and the eccentricity of the optical element OE can be measured.

As described above, the present invention has been described according to the embodiment, but the present invention is not limited to the above embodiment. For example, in the first embodiment, all three spherical portions 30 are movable by the outer shape reference detection means 40, but one or two spherical portions 30 are the same as the second outer shape reference detection means 246 shown in FIG. The remaining spherical portion 30 can be fixedly supported by the outer shape reference detection means 40 and urged toward the outer edge PA of the optical element OE.
Further, in the above-described embodiment, a plurality of spherical portions 30 having a known spherical shape are brought into contact with the side surface of the outer edge portion PA of the optical element OE, and a stylus is brought into contact with the spherical portion, thereby making the outer shape reference of the optical element OE. However, the measurement is not particularly limited to contact measurement, and the optical element OE and the spherical portion 30 can be photographed and the eccentricity of the optical element OE can be determined auxiliary by optical analysis.

(A), (b) is the top view and sectional drawing of the jig | tool for optical element measurement of 1st Embodiment. (A), (b) is the enlarged plan view and expanded sectional view of the optical element measurement jig | tool of FIG. (A) is the elements on larger scale of a rotation limiting member, (b) shows the modification of a rotation limiting member. (A), (b) is the front view and side view explaining the structure of a surface shape measuring apparatus. It is a flowchart explaining the measuring method using the surface shape measuring apparatus shown in FIG. (A), (b) is the top view and sectional drawing of the jig | tool for optical element measurement of 2nd Embodiment. FIG. 7 is an enlarged plan view of the optical element measurement jig of FIG. 6.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 ... Optical element measurement jig | tool, 20 ... Board | substrate, 22 ... Opening, 30 ... Spherical surface part, 40 ... External shape reference | standard detection means, 41 ... Rod, 43 ... Biasing member, 43a ... Spring, 43c ... Adjuster part, 50 ... Holding device, 51 ... Holding member, 51a ... Contact part, 60 ... Spherical member to be measured, 70 ... Rotation limiting member, 81 ... Surface plate, 82 ... XY stage device, 83a, 83b, 91a ... Mirror, 83d, 83e, 91b DESCRIPTION OF SYMBOLS ... Laser interferometer, 84 ... Z drive device, 86 ... Elevating mechanism, 99 ... Control device, 100 ... Surface shape measuring device, OA ... Optical axis, OE ... Optical element, OS1, OS2 ... Both optical surfaces, PA ... Outer edge part , PR ... Stylus,

Claims (18)

A substrate having a first surface on which an optical element to be measured is placed and a second surface corresponding to the back surface of the first surface;
An external reference detecting means, a part of which is supported by the substrate and has a spherical surface portion having a known spherical shape so as to be able to contact the side surface portion of the optical element from a direction perpendicular to the optical axis;
An optical element measuring jig having
The external reference detecting means is arranged at a plurality of positions of the substrate so that the external reference of the optical element can be grasped by measuring the abutting spherical surface portion, at least one of which presses the optical element An optical element measuring jig configured to be able to contact with such an urging force.   2. The optical device according to claim 1, wherein each of the spherical surface portions of the plurality of outer shape reference detection means is disposed so as to abut on the optical element at a position where the outer periphery of the optical element is equally divided. Element measurement jig. Of the plurality of outer shape reference detection means, the outer shape reference detection means that comes into contact with an urging force that presses the optical element,
An adjusting means having an elastic member between the support portion supported by the substrate and the spherical portion, and capable of adjusting a biasing force of the elastic member against the optical element between the elastic member and the spherical portion. The optical element measuring jig according to claim 1, wherein the optical element measuring jig is provided.   A plurality of clamping means that abut on the surface perpendicular to the optical axis of the optical element at a plurality of locations and clamp the optical element between the substrate and the optical element in the optical axis direction; The optical element measuring jig according to claim 1, wherein the optical element measuring jig is a jig.   The spherical surface portions of two of the plurality of outer shape reference detection means are in contact with the side surface portion at a position corresponding to one side of the outer shape viewed from the optical axis direction of the optical element placed on the substrate. It is comprised, The optical element measurement jig | tool as described in any one of Claims 1-4 characterized by the above-mentioned.   Of the plurality of outer shape reference detection means, the spherical surface portions of two of the outer shape reference detection means are configured such that the protrusions of the optical element are arranged between the contact portions of the side surface portions that contact each other. The jig for measuring an optical element according to any one of claims 1 to 5. When the pressing force for pressing the optical element is F (N), the clamping means that clamps the optical element with an urging force to press the optical element,
The following range 0.1 <F <10
The optical element measuring jig according to claim 4, wherein: In the outer shape reference detection that abuts with an urging force to press the optical element, when the pressing force pressing the optical element is F ′ (N),
The following range: 0.01 <F ′ <1
The optical element measuring jig according to claim 1, wherein the optical element measuring jig is satisfied.   The said board | substrate was equipped with the opening part which can measure the mounted optical element from any one of said 1st and 2nd surfaces, The any one of Claims 1-8 characterized by the above-mentioned. Optical element measurement jig.   The optical element measuring jig according to claim 4, wherein at least three clamping means are provided.   The optical element measuring jig according to claim 4, 7 or 10, wherein the contact portion where the clamping means comes into contact with the optical element is formed in a spherical shape.   The positions where the outer shape reference detection means and the clamping means come into contact with the optical element are alternately arranged at different positions when viewed from the optical axis direction of the optical element. The jig for measuring an optical element according to claim 4, 7, 10, or 11.   An optical element shape measuring apparatus comprising the optical element measuring jig according to claim 1.   The optical element shape measuring apparatus according to claim 13, further comprising a holding unit that holds the first surface and the second surface of the substrate in a reversible manner.   The optical element shape measuring method using the jig | tool for optical element measurement as described in any one of Claims 1-12.   An optical element shape measuring method using the optical element shape measuring apparatus according to claim 13.   The optical element shape measuring apparatus according to claim 14, wherein after measuring the surface shape of the optical element placed from the first surface side of the substrate, the substrate is inverted, and the second surface side of the substrate is An optical element shape measuring method, comprising measuring a surface shape of an optical element.   16. The optical element shape measuring method according to claim 15, wherein an optical element having an outer shape having a gate cut portion is such that an abutting position of the clamping means and the gate cut portion are over when viewed from an optical axis direction of the optical element. An optical element shape measuring method, wherein the optical element shape measuring method is arranged at a lapping position.

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