JP2007134035A5 - - Google Patents
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- JP2007134035A5 JP2007134035A5 JP2006300842A JP2006300842A JP2007134035A5 JP 2007134035 A5 JP2007134035 A5 JP 2007134035A5 JP 2006300842 A JP2006300842 A JP 2006300842A JP 2006300842 A JP2006300842 A JP 2006300842A JP 2007134035 A5 JP2007134035 A5 JP 2007134035A5
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- JP
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- Prior art keywords
- memory cell
- current source
- program
- bias voltage
- cell array
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- 229920001690 polydopamine Polymers 0.000 claims 1
- 230000004044 response Effects 0.000 claims 1
Claims (9)
前記第1電流源ライン及びワードラインに接続された第1電流源トランジスタと、
前記第1電流源トランジスタに接続され、前記複数の第1及び第2メモリセルのうち1つに接続されたビットラインを横切って延長され、前記プログラム電流を導通させるプログラム導体と、
前記プログラム導体に接続され前記プログラム導体から第2電流源トランジスタの出力端に向けて流れる前記プログラム電流をスイッチングするように構成された第2電流源トランジスタと、
前記複数の第1及び第2メモリセルのうち1つに隣接し、前記第1電流源ラインに対向するように延長された第2電流源ラインと、
判読動作間にアクセスのために選択された前記第1または第2メモリセルに第1バイアス電圧を印加するように構成された第1バイアス回路と、
前記判読動作間にアクセスのために選択されない前記第1または第2メモリセルに第2バイアス電圧を印加するように構成された第2バイアス回路と、
を具備することを特徴とする磁気メモリセルアレイ素子。 Extending between a plurality of first and second memory cells configured for simultaneous programming, conducting a program current for recording data in one of the plurality of first and second memory cells. A first current source line configured as follows:
A first current source transistor connected to the first current source line and the word line;
A program conductor connected to the first current source transistor and extending across a bit line connected to one of the plurality of first and second memory cells to conduct the program current;
A second current source transistor connected to the program conductor and configured to switch the program current flowing from the program conductor toward an output terminal of the second current source transistor;
A second current source line extending adjacent to one of the plurality of first and second memory cells and facing the first current source line;
A first bias circuit configured to apply a first bias voltage to the first or second memory cell selected for access during a read operation;
A second bias circuit configured to apply a second bias voltage to the first or second memory cell not selected for access during the read operation;
A magnetic memory cell array device comprising:
前記第3バイアス電圧は前記第2バイアス電圧と実質的に同一であることを特徴とする請求項1記載の磁気メモリセルアレイ素子。 A bit line driving circuit configured to provide a third bias voltage to the first or second memory cell that is not selected for access during the reading operation;
Wherein the third bias voltage is a magnetic memory cell array element according to claim 1, wherein the substantially identical to the second bias voltage.
前記第1及び第2伝達トランジスタのゲートに接続された第1及び第2イネーブルゲートとをさらに含み、
前記第1及び第2伝達トランジスタは前記イネーブルゲートの出力に応答して前記バイアス回路における各出力の所定の電圧レベルを前記第1及び第2ワードラインに伝達するように構成されたことを特徴とする請求項2記載の磁気メモリセルアレイ素子。 First and second transfer transistors respectively connected between the outputs of the first and second bias circuits and the first and second word lines;
First and second enable gates connected to gates of the first and second transfer transistors;
The first and second transfer transistors are configured to transmit a predetermined voltage level of each output in the bias circuit to the first and second word lines in response to an output of the enable gate. The magnetic memory cell array device according to claim 2 .
メモリセルを具備するブロックの第1及び第2端部にそれぞれ位置して前記メモリセルに接続されたビットラインを横切って前記第1端部から前記第2端部に向けて流れるプログラム電流を加えるように構成された一対の対向する電流源トランジスタを含み、前記一対の電流源トランジスタは前記プログラム電流が前記メモリセルの隣接ブロックに平行に流れるように構成されたことを特徴とする抵抗型メモリ素子。 In a resistive memory element,
A program current flowing from the first end toward the second end across the bit line connected to the memory cell located at the first and second ends of the block including the memory cell is applied. A pair of opposed current source transistors configured as described above, wherein the pair of current source transistors are configured such that the program current flows in parallel to adjacent blocks of the memory cell. .
判読動作間にアクセスのために選択された第1メモリセル、または第2メモリセルに第1バイアス電圧を印加するように構成された第1バイアス回路と、
前記判読動作間にアクセスのために選択されない前記第1メモリセルまたは前記第2メモリセルに第2バイアス電圧を印加するように構成された第2バイアス回路と、
を具備することを特徴とする抵抗型メモリ素子。 In a resistive memory element,
A first bias circuit configured to apply a first bias voltage to a first memory cell or a second memory cell selected for access during a read operation;
A second bias circuit configured to apply a second bias voltage to the first memory cell or the second memory cell that is not selected for access during the read operation;
A resistive memory element comprising:
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2005-0107178 | 2005-11-09 | ||
KR1020050107178A KR100735748B1 (en) | 2005-11-09 | 2005-11-09 | Semiconductor devices including memory cells employing variable resistors as data storage elements, systems employing the same and methods of operating the same |
US11/580,766 US20070103964A1 (en) | 2005-11-09 | 2006-10-13 | Resistive memory devices including selected reference memory cells and methods of operating the same |
US11/580,766 | 2006-10-13 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007134035A JP2007134035A (en) | 2007-05-31 |
JP2007134035A5 true JP2007134035A5 (en) | 2009-12-17 |
JP5101084B2 JP5101084B2 (en) | 2012-12-19 |
Family
ID=38047796
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006300842A Expired - Fee Related JP5101084B2 (en) | 2005-11-09 | 2006-11-06 | Magnetic memory cell array element |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5101084B2 (en) |
DE (1) | DE102006053744B4 (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10032275A1 (en) * | 2000-07-03 | 2002-01-24 | Infineon Technologies Ag | Integrated memory with memory cells with a magnetoresistive memory effect and method for operating such a memory |
US6317375B1 (en) * | 2000-08-31 | 2001-11-13 | Hewlett-Packard Company | Method and apparatus for reading memory cells of a resistive cross point array |
JP2003196973A (en) * | 2001-12-21 | 2003-07-11 | Mitsubishi Electric Corp | Thin film magnetic material storage device |
US6839269B2 (en) * | 2001-12-28 | 2005-01-04 | Kabushiki Kaisha Toshiba | Magnetic random access memory |
JP3812498B2 (en) * | 2001-12-28 | 2006-08-23 | 日本電気株式会社 | Semiconductor memory device using tunnel magnetoresistive element |
JP4208507B2 (en) * | 2002-02-04 | 2009-01-14 | 株式会社ルネサステクノロジ | Thin film magnetic memory device |
US6678189B2 (en) * | 2002-02-25 | 2004-01-13 | Hewlett-Packard Development Company, L.P. | Method and system for performing equipotential sensing across a memory array to eliminate leakage currents |
-
2006
- 2006-11-06 JP JP2006300842A patent/JP5101084B2/en not_active Expired - Fee Related
- 2006-11-09 DE DE200610053744 patent/DE102006053744B4/en not_active Expired - Fee Related
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