JP2007124137A - Imaging apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To easily obtain sensitivity and a dynamic range which are optimum for an image. <P>SOLUTION: A pixel array 101 includes a first pixel group constituted of a plurality of pixels 109<SB>-1</SB>, and a second pixel group constituted of a plurality of pixels 109<SB>-2</SB>. The respective pixels 109<SB>-2</SB>are deviated for the portion of a half pixel in a row direction and a column direction relative to the respective pixels 109<SB>-1</SB>. The color matrix of 2×2 RGBG Bayer array is formed individually and respectively in the first and second pixel groups. Image signals to be obtained from the first and second pixel groups are synthesized so as to obtain an output image signal. A user can arbitrarily set charge storage times Tc1, Tc2 (Tc1>Tc2) related to the first and second pixel groups. Thus, the sensitivity and dynamic range concerning the first and second pixel groups and also the sensitivity and dynamic range after the synthesis are adjusted, so that the sensitivity and dynamic range optimum for the image are easily obtained. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an image pickup apparatus composed of, for example, a CMOS image sensor. Specifically, the present invention uses an image sensor in which the first and second pixel groups are arranged in a state shifted by half a pixel in the row direction and the column direction, and the charge accumulation time of the first and second pixel groups is An imaging apparatus capable of easily obtaining the optimum sensitivity and dynamic range for an image by controlling differently and combining the image signals obtained from the first and second pixel groups into an output image signal. It is concerned.

  FIG. 9 shows a configuration of a conventional CMOS image sensor 300. The image sensor 300 includes a pixel array unit 301, a V decoder (vertical scanning circuit) 302, an H decoder (horizontal scanning circuit) 303, a CDS (Correlated Double Sampling) circuit 304, and a horizontal selection. A transistor 305, a horizontal signal line 306, a vertical signal line 307, and a vertical selection line 308 are included.

  The pixel array unit 301 has a configuration in which a plurality of pixels 309 are two-dimensionally arranged in a matrix. Each pixel 309 has a square or a rectangle as a unit, and the pixel array unit 301 is formed by expanding each pixel 309 vertically and horizontally at equal intervals. Each pixel 309 is provided with a pixel circuit described later. A color filter is set for each pixel 309, and a Bayer array color matrix composed of, for example, 2 × 2 RGBG is formed. Here, R represents a red filter, G represents a green filter, and B represents a blue filter.

  The V decoder 302 selects each pixel 309 of the pixel array unit 301 in units of rows through the vertical selection line 308. In this case, the lines are selected one by one from the bottom end, and pixel signals are read collectively for each line.

  The CDS circuit 304 performs correlated double sampling processing on each pixel signal read from the pixel array unit 301 in units of rows to reduce reset noise. In this case, the potential of the zero level period following the reset period of the pixel signal is clamped to a predetermined potential by the clamp pulse CLP, and then the signal period of the pixel signal is sampled and held by the sample hold pulse S / H to reduce reset noise. Obtained pixel signals are obtained.

  The H decoder 303 sequentially selects pixel signals for one row output from the CDS circuit 304 in units of pixels from the left end. The horizontal selection transistor 305 constitutes a horizontal output circuit. In this case, the transistor 305 at the position selected by the H decoder 303 is turned on, and the pixel signal sampled and held by the CDS circuit 304 is output to the horizontal signal line 306.

  Thus, the pixel signals sequentially output to the horizontal signal line 306 constitute an image signal. This image signal is amplified by a subsequent amplifier (not shown) and then output to the outside of the sensor.

  A pixel circuit of each pixel 309 will be described. As shown in FIG. 9, the pixel circuit includes a photodiode PD, a transfer transistor T1, a reset transistor T2, an amplification transistor T3, and a selection transistor T4. The photodiode PD has functions of photoelectric conversion and charge storage. The photodiode PD is grounded at its anode, photoelectrically converts incident light into a charge corresponding to the amount of light, and accumulates the charge generated by the photoelectric conversion.

  The transfer transistor T1 is connected between the cathode of the photodiode PD and the floating diffusion portion FD, and transfers the charge generated by the photodiode PD to the floating diffusion portion FD based on the transfer pulse TRS supplied to the gate of the transfer transistor T1. To do. The reset transistor T2 is connected between the power supply and the floating diffusion portion FD, and resets the potential of the floating diffusion portion FD to the power supply potential based on a reset pulse RST supplied to the gate of the reset transistor T2.

  The gate of the amplification transistor T3 is connected to the floating diffusion portion FD. The amplification transistor T3 is connected to the vertical signal line 307 through the selection transistor T4. When the selection transistor T4 is turned on based on the pixel selection signal SEL, the amplification transistor T3 amplifies the potential of the floating diffusion portion FD and outputs a voltage corresponding to the potential to the vertical signal line 307.

  The reset pulse RST and the transfer pulse TRS described above are supplied from the V decoder 302 in the same manner as the pixel selection signal SEL. FIG. 10 shows a waveform example of the signal SIG obtained on the vertical signal line 307 and the timing of the pixel selection signal SEL, reset pulse RST, transfer pulse TRS, clamp pulse CLP, sample hold pulse S / H described above.

  The CMOS image sensor 100 has an electronic shutter function for controlling the exposure time (charge accumulation time) of the sensor. In this case, prior to the pixel selection row, the V decoder 302 sweeps the operation of performing only pixel reset and charge transfer while the pixel selection signal SEL remains off (low level). 11A and 11B illustrate an operation when attention is paid to the pixel in the n-th row, for example.

  In the operation period of the electronic shutter row, the pixel selection signal SEL_n remains off and only the reset pulse RST_n and the transfer pulse TRS_n are operated, and the pixel signal is not sent to the vertical signal line, and the charge of the photodiode PD is transferred to the floating diffusion portion FD. Perform only the sweeping operation. Then, after a certain time Tc, a readout row selection period is reached, and pixel signals are read out by the same operation as in FIG. Here, the charge accumulation time of each pixel 309 corresponds to a period Tc from the shutter row to the readout row. That is, the exposure time (charge accumulation time) of the sensor can be changed at any time by changing the interval from the shutter row to the readout row.

  When the charge accumulation time Tc is long, the relationship between the light intensity and the output level of the image signal is, for example, as shown by line a in FIG. 12, and the slope is steep and the sensitivity is high at low illuminance, but the signal is saturated at high illuminance. However, the dynamic range Da is narrow. On the other hand, when the charge accumulation time Tc is short, the relationship between the light intensity and the output level of the image signal is as shown by the b line in FIG. 12, for example, and the signal is buried in noise at low illuminance. Does not saturate, the dynamic range Db is wide.

  Patent Document 1 proposes an imaging apparatus that has a steep slope at low illuminance and can realize a wide dynamic range. This Patent Document 1 includes a low-sensitivity pixel (R pixel) having a small area and low sensitivity, and a high-sensitivity pixel (S pixel) having a large area and high sensitivity, and an image signal obtained from the low-sensitivity pixel It is described that a wide dynamic range is realized by combining an image signal obtained from a high-sensitivity pixel.

JP-A-2005-286104

  In the invention described in Patent Document 1, since the area ratio between the low-sensitivity pixels and the high-sensitivity pixels is fixed, the sensitivity and the dynamic range cannot be adjusted according to the image. For this reason, the sensitivity of an image that does not require a wide dynamic range is worse than that of a normal sensor.

  An object of the present invention is to provide an imaging apparatus capable of easily obtaining an optimum sensitivity and dynamic range for an image.

The concept of this invention is
The first pixel group constituted by a plurality of pixels arranged two-dimensionally in a matrix and the plurality of pixels constituting the first pixel group are shifted by half a pixel in the row direction and the column direction. An image sensor having a second pixel group composed of a plurality of pixels arranged two-dimensionally in a matrix in a state;
The charge accumulation time of each pixel constituting the first pixel group of the image sensor is defined as a first time, and the charge accumulation time of each pixel constituting the second pixel group of the image sensor is defined as the first time. A control unit having a second time different from the time;
A combining unit configured to combine the first image signal obtained from the first pixel group of the image sensor and the second image signal obtained from the second pixel group of the image sensor into an output image signal; An image pickup apparatus comprising:

  In the present invention, the charge accumulation time of each pixel constituting the first pixel group of the image sensor is the first time. Therefore, the sensitivity and the dynamic range related to the first pixel group correspond to the first time. Further, the charge accumulation time of each pixel constituting the second pixel group of the image sensor is set to the second time. Therefore, the sensitivity and the dynamic range related to the second pixel group correspond to the second time.

  As a method for making the first time and the second time different, there is the following method. For example, the frame rates related to the first pixel group and the second pixel group are the same, and the charge accumulation times of the first pixel group and the second pixel group in each frame are different. Further, for example, the frame rates related to the first pixel group and the second pixel group are different.

  The first image signal obtained from the first pixel group of the image sensor and the second image signal obtained from the second pixel group of the image sensor are combined into an output image signal. This output image signal is based on the sensitivity and dynamic range obtained by combining the sensitivity and dynamic range related to the first and second pixel groups.

  By changing the first and second times, the sensitivity and dynamic range according to the first and second pixel groups, respectively, and thus the combined sensitivity and dynamic range can be adjusted, and the optimum sensitivity and dynamic range for the image can be adjusted. Can be easily obtained.

  For example, in the case of color, a color matrix (for example, a Bayer array) is individually formed in each of the first pixel group and the second pixel group of the image sensor. As a result, it can be considered that two independent color image sensors are superimposed on one light receiving area, and therefore, image signals obtained from the first and second pixel groups can be easily combined.

  According to the present invention, the charge storage times of the first and second pixel groups are different using the image sensor in which the first and second pixel groups are arranged in a state shifted by half a pixel in the row direction and the column direction. The image signals obtained from the first and second pixel groups are combined into an output image signal, and the optimum sensitivity and dynamic range for the image can be easily obtained.

  An embodiment of the present invention will be described. FIG. 1 shows a configuration of an imaging apparatus 100 as an embodiment.

  The imaging apparatus 10 includes a microcomputer and has a control unit 11 that controls the operation of the entire apparatus. An operation unit 12 as a user interface is connected to the control unit 11. The user can perform various operations and settings using the operation unit 12.

  In addition, the imaging apparatus 10 includes an imaging optical system 13 such as an imaging lens and a diaphragm, a CMOS image sensor 100, a driving unit 14, and a combining unit 15. The image sensor 100 includes first and second pixel groups having different charge accumulation times in the pixel array unit, and first and second image signals HL1 and HL2 obtained from the first and second pixel groups. Is output. Details of the image sensor 100 will be described later. The drive unit 14 supplies a necessary timing signal to the image sensor 100 and performs drive control of the image sensor 100. The synthesizer 15 synthesizes the first and second image signals HL1 and HL2 output from the image sensor 100 to obtain an output image signal.

  In addition, the imaging apparatus 10 includes an A / D converter 16, an image signal processing unit 17, a recording unit 18, and a display 19. The A / D converter 16 converts the output image signal obtained by the synthesis unit 15 from an analog signal to a digital signal. The image signal processing unit 17 processes the digital image signal obtained by the A / D converter 16, supplies it to the recording unit 18 as a recording signal, and supplies it to the display 19 as a display signal.

  The recording unit 18 records the recording signal supplied from the image signal processing unit 17 on a recording medium such as an optical disk, a magnetic disk, or a semiconductor memory. The display 19 is composed of, for example, an LCD (Liquid Crystal Display) or the like, and displays an image based on a display signal supplied from the image signal processing unit 17.

Next, details of the CMOS image sensor 100 will be described. FIG. 2 shows the configuration of the CMOS image sensor 100. The image sensor 100 includes a pixel array unit 101, V decoders (vertical scanning circuits) 102 _-1 and 102 _-2 , H decoders (horizontal scanning circuits) 103 _-1 and 103 _-2 , a CDS circuit 104 _-1 , 104 _-2 , horizontal selection transistors 105 _-1 and 105 _-2 , horizontal signal lines 106 _-1 and 106 _-2 , vertical signal lines 107 _-1 and 107 _-2 , and vertical selection lines 108 _-1 and 108 _-2 .

Pixel array section 101 is configured by a matrix on the first pixel group, as well as a matrix in a two-dimensional arranged plural pixels 109 _-2 composed of two-dimensionally arranged plurality of pixels 109 _-1 And a second pixel group. The pixels 109 _-1 and 109 _-2 of the pixel array unit 101 are arranged so that the configuration of square pixels used in a known image sensor is inclined 45 degrees.

In this case, the pixels arranged in adjacent rows and columns have a configuration in which the center position is shifted by a half pixel. That is, a plurality of pixels 109 _-2 constituting the second group of pixels, a state of half a pixel displacement in the row and column directions for each of the plurality of pixels 109 _-1 constituting the first pixel group It has become. Each pixel 109 _-1 and 109 _-2 is provided with a pixel circuit which will be described later.

A color filter is set for each of the pixels 109 ₋₁ and 109 ₋₂ . In each of the first pixel group and the second pixel group, a Bayer array color matrix composed of, for example, 2 × 2 RGBG is formed. Here, R represents a red filter, G represents a green filter, and B represents a blue filter. In FIG. 2, the Bayer array related to the first pixel group is shown as Bayer array 1, and the Bayer array related to the second pixel group is shown as Bayer array 2. As shown in the figure, the 2 × 2 color matrices of the first and second pixel groups are formed to overlap.

The V decoder 102 _-1 selects each pixel 109 _-1 of the first pixel group of the pixel array unit 101 in units of rows through the vertical selection line 108 _-1 . In this case, the lines are selected one by one from the bottom end, and pixel signals are read collectively for each line.

CDS circuit 104 _-1 reduces reset noise by performing the processing of correlated double sampling for each pixel signal read from the first pixel group of the pixel array unit 101 in units of rows. In this case, the potential of the zero level period following the reset period of the pixel signal is clamped to a predetermined potential by the clamp pulse CLP, and then the signal period of the pixel signal is sampled and held by the sample hold pulse S / H, thereby reducing reset noise. Obtained pixel signals are obtained.

The H decoder 103 _-1 sequentially selects pixel signals for one row output from the CDS circuit 104 _{-1 in} units of pixels from the left end. Horizontal selection transistor 105 _-1 constitutes the horizontal output circuit. In this case, H decoder 103 _-1 transistor 105 _-1 positions selected in is turned on, the sample and hold pixel signal is output to the horizontal signal line 106 _-1 in CDS circuit 104 _-1.

Such pixel signals sequentially output to the horizontal signal line 106 _-1 constitute the first image signal HL1. The first image signal HL1 obtained from the first pixel group is amplified by a subsequent amplifier (not shown) and then output to the outside of the sensor.

The V decoder 102 _-2 selects each pixel 109 _-2 of the second pixel group of the pixel array unit 101 in units of rows through the vertical selection line 108 _-2 . In this case, the lines are selected one by one from the bottom end, and pixel signals are read collectively for each line.

The CDS circuit 104 _-2 performs correlated double sampling processing on each pixel signal read out from the second pixel group of the pixel array unit 101 in units of rows to reduce reset noise. The H decoder 103 _-2 sequentially selects pixel signals for one row output from the CDS circuit 104 _{-2 in} units of pixels from the left end. The horizontal selection transistor 105 _-2 constitutes a horizontal output circuit. In this case, the transistors 105 _-2 selected locations in H decoder 103 _-2 turned on, the sample and hold pixel signal is output to the horizontal signal line 106 _-2 CDS circuit 104 _2.

Thus, the pixel signals sequentially output to the horizontal signal line 106 _-2 constitute the second image signal HL2. The second image signal HL2 obtained from the second pixel group is amplified by a subsequent amplifier (not shown) and then output to the outside of the sensor.

The pixel circuit of each pixel 109 _-1 and 109 _-2 will be described. FIG. 3 shows a pixel circuit.

  This pixel circuit includes a photodiode PD, a transfer transistor T1, a reset transistor T2, an amplification transistor T3, and a selection transistor T4. The photodiode PD has functions of photoelectric conversion and charge storage. The photodiode PD is grounded at its anode, photoelectrically converts incident light into a charge corresponding to the amount of light, and accumulates the charge generated by the photoelectric conversion.

  The transfer transistor T1 is connected between the cathode of the photodiode PD and the floating diffusion portion FD, and transfers the charge generated by the photodiode PD to the floating diffusion portion FD based on the transfer pulse TRS supplied to the gate of the transfer transistor T1. To do. The reset transistor T2 is connected between the power supply and the floating diffusion portion FD, and resets the potential of the floating diffusion portion FD to the power supply potential based on a reset pulse RST supplied to the gate of the reset transistor T2.

The gate of the amplification transistor T3 is connected to the floating diffusion portion FD. The amplification transistor T3 is connected to the vertical signal lines 107 _-1 and 107 _-2 via the selection transistor T4. When the selection transistor T4 is turned on based on the pixel selection signal SEL, the amplification transistor T3 amplifies the potential of the floating diffusion portion FD and outputs a voltage corresponding to the potential to the vertical signal lines 107 _-1 and 107 _-2 .

The reset pulse RST and the transfer pulse TRS described above are supplied from the V decoders 102 _-1 and 102 _{-2 in the same} manner as the pixel selection signal SEL.

_Obtained in the pixel selection signal SEL, reset pulse RST, transfer pulse TRS, clamp pulse CLP, sample hold pulse S / H timing, and vertical signal lines 107 _-1 and 107 _-2 in each pixel 109 _-1 and 109 _-2 . The waveform of the signal SIG to be generated is the same as that shown in FIG.

In this case, the charge accumulation time of each of the pixels 109 ₋₁ and 109 ₋₂ is a time Tc from the transfer pulse TRS in the shutter row selection period to the transfer pulse TRS in the readout row selection period (see FIG. 11). In the present embodiment, the charge accumulation time of each pixel constituting the first pixel group is defined as a first time Tc1, and the charge accumulation time of each pixel constituting the second pixel group is defined as a second time Tc2. In this case, these times Tc1 and Tc2 are set to be different from each other, for example, Tc1> Tc2. The user can arbitrarily set these times Tc1 and Tc2 by operating the operation unit 12 described above.

  As described above, the CMOS image sensor 100 can be regarded as if two independent color image sensors are superimposed on one light receiving area. Note that these two color image sensors are shifted by half a pixel in the row direction and the column direction. However, if the pixel size is reduced and the number of pixels is increased, this shift can be ignored.

  The operation of the imaging device 10 shown in FIG. 1 will be described.

  A subject image is formed on the imaging surface of the image sensor 100 by the imaging optical system 13. Then, as described above, the first and second image signals HL1 and HL2 relating to the first and second pixel groups of the pixel array unit 101 are obtained from the image sensor 100, and these first and second image signals are obtained. HL1 and HL2 are supplied to the synthesis unit 15. In the combining unit 15, the first and second image signals HL1 and HL2 are combined to obtain an output image signal.

  The output image signal is converted from an analog signal to a digital signal by the A / D converter 16 and then supplied to the image signal processing unit 17. The image signal processing unit 17 processes digital image signals. A recording signal obtained by processing the image signal is supplied from the image signal processing unit 17 to the recording unit 18, and the recording signal is recorded on a recording medium. In addition, a display signal obtained by processing the image signal is supplied from the image signal processing unit 17 to the display 19, and an image is displayed on the display 19.

In the image pickup apparatus 10 shown in FIG. 1, the first time Tc1 is a charge accumulation time of each pixel 109 _-1 constituting the first pixel group of the image sensor 100, a second pixel group of the image sensor 100 Is set to be different from the second time Tc2 that is the charge accumulation time of each pixel 109 _-2 that constitutes, for example, Tc1> Tc2.

  Since the first time Tc1 is set to be large in this way, the relationship between the light intensity and the image signal level related to the first pixel group of the image sensor 100 is, for example, as shown by line a in FIG. At illuminance, the slope is steep and the sensitivity is high, but at high illuminance, the signal is saturated and the dynamic range D1 is narrow.

  On the other hand, since the second time Tc2 is set to be small, the relationship between the light intensity and the image signal level related to the second pixel group of the image sensor 100 is, for example, as shown by line b in FIG. Then, the signal is buried in noise, but the signal does not saturate even at high illuminance, so the dynamic range D2 becomes wide.

  Therefore, the relationship between the light intensity and the image signal level related to the output image signal obtained by the synthesizing unit 15 is a combination of the a line and the b line in FIG. In the illuminance, the slope is steep and the sensitivity is high, and the signal is not saturated even in the high illuminance, and the dynamic range D3 becomes wide. In FIG. 5, lines corresponding to the lines a and b in FIG. 4 are indicated by broken lines.

  According to the imaging device 10 shown in FIG. 1, the user can arbitrarily set the first and second times Tc1 and Tc2 by operating the operation unit 12. As a result, the sensitivity and dynamic range relating to the first and second pixel groups, and thus the combined sensitivity and dynamic range can be adjusted, and the optimum sensitivity and dynamic range for the image can be easily obtained.

  For example, when it is desired to increase the dynamic range even at the expense of linearity, the first time Tc1 is set longer than the state shown in FIG. 5 described above, for example, as shown by lines a and b in FIG. Then, the sensitivity related to the first pixel group is increased, and the second time Tc2 is shortened to decrease the sensitivity related to the second pixel group. The range becomes wider.

  Further, for example, the dynamic range may be moderate, but when it is desired to further improve the linearity, the first time Tc1 is compared with the state shown in FIG. 5 described above, for example, as shown by a line and b line in FIG. As shown in the c line of FIG. 7, the sensitivity of the first pixel group is decreased to lower the sensitivity related to the first pixel group and the second time Tc2 is increased to increase the sensitivity related to the second pixel group. The linearity of increases.

  Further, according to the imaging device 10 shown in FIG. 1, the first pixel group and the second pixel group of the image sensor 100 are individually formed with the Bayer array color matrix, as described above. It can be considered that two independent color image sensors are superimposed on one light receiving area, and therefore the image signals HL1 and HL2 obtained from the first and second pixel groups can be easily combined. .

  In the above-described embodiment, the first and second times Tc1 and Tc2, which are the charge accumulation times related to the first and second pixel groups, are determined from the transfer pulse TRS in the shutter row selection period. Time until the transfer pulse TRS, so-called electronic shutter time (see FIG. 11), the first and second times Tc1, Tc2 can be set variously by changing the interval from the shutter row to the readout row showed that. That is, in this embodiment, the frame rates related to the first and second pixel groups are the same, and the charge accumulation times Tc1 and Tc2 of the first and second pixel groups in each frame are different. However, in order to make the charge accumulation times related to the first and second pixel groups different, a method of making the frame rates related to the first and second pixel groups different can also be adopted. In this case, by changing the frame rate, various charge accumulation times for the first and second pixel groups can be set.

  In the above-described embodiment, the first and second pixel groups are individually formed with the Bayer array color matrix. However, the color matrix formed in the first and second pixel groups is not limited to the repetition of the Bayer arrangement shown in FIG. 2, and other combinations such as those shown in FIG. 8 are also conceivable.

In the above-described embodiment, the image sensor 100 corresponds to the first and second pixel groups of the pixel array unit 101, respectively, and includes the V decoders 102 _-1 and 102 _-2 and the H decoders 103 _-1 and 103 _-2. However, the first and second pixel groups of the pixel array unit 101 may include a common V decoder, H decoder, and the like. In this case, since the pixel signals relating to the first and second pixel groups are alternately output to the horizontal signal line, two pixel signals relating to the continuous first and second pixel groups are synthesized. Thus, a synthesized output image signal can be obtained.

  In the above embodiment, the image sensor is the CMOS image sensor 100. However, the present invention can be similarly applied to an image sensor using another solid-state imaging device.

  The present invention can easily obtain the optimum sensitivity and dynamic range for an image, and can be applied to an image pickup apparatus including, for example, a CMOS image sensor.

It is a block diagram which shows the structure of the imaging device as embodiment. It is a figure which shows the structure of a CMOS image sensor. It is a connection diagram showing a pixel circuit. It is a figure which shows the relationship between light intensity and an image signal level. It is a figure which shows the relationship between light intensity and an image signal level. It is a figure which shows the relationship between light intensity and an image signal level. It is a figure which shows the relationship between light intensity and an image signal level. It is a figure which shows the other structure of a CMOS image sensor. It is a figure which shows the structure of the conventional CMOS image sensor. It is a figure which shows each signal of a pixel circuit. It is a figure for demonstrating operation of an electronic shutter. It is a figure which shows the relationship between light intensity and an image signal level.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 ... Imaging device, 11 ... Control part, 12 ... Operation part, 13 ... Imaging optical system, 14 ... Drive part, 15 ... Composition part, 16 ... A / D converter 17... Image signal processor 18. Recording unit 19 Display 19 100 CMOS image sensor 101 Pixel array unit 102 ₋₁ , 102 _−2. V decoder, 103 ₋₁ , 103 ₋₂ ... H decoder, 104 ₋₁ , 104 ₋₂ ... CDS circuit, 105 ₋₁ , 105 ₋₂ .. Horizontal selection transistor, 106 ₋₁ , 106 _-2 ... horizontal signal lines, 107 _-1 , 107 _-2 ... vertical signal lines, 108 _-1 , 108 _-2 ... vertical selection lines, 109 _-1 , 109 _-2 ... pixels

Claims (4)

The first pixel group constituted by a plurality of pixels arranged two-dimensionally in a matrix and the plurality of pixels constituting the first pixel group are shifted by half a pixel in the row direction and the column direction. An image sensor having a second pixel group composed of a plurality of pixels arranged two-dimensionally in a matrix in a state;
The charge accumulation time of each pixel constituting the first pixel group of the image sensor is defined as a first time, and the charge accumulation time of each pixel constituting the second pixel group of the image sensor is defined as the first time. A control unit having a second time different from the time;
A combining unit configured to combine the first image signal obtained from the first pixel group of the image sensor and the second image signal obtained from the second pixel group of the image sensor into an output image signal; An imaging apparatus comprising: The control unit
The frame rates of the first pixel group and the second pixel group are the same, and the charge accumulation times of the first pixel group and the second pixel group in each frame are different. The imaging device according to claim 1. The control unit
The imaging apparatus according to claim 1, wherein the frame rates of the first pixel group and the second pixel group are different. The imaging device according to claim 1, wherein a color matrix is formed individually for each of the first pixel group and the second pixel group of the image sensor.

Images