JP2007107917A - 光パルス測定装置及び光パルス測定方法 - Google Patents
光パルス測定装置及び光パルス測定方法 Download PDFInfo
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- JP2007107917A JP2007107917A JP2005296531A JP2005296531A JP2007107917A JP 2007107917 A JP2007107917 A JP 2007107917A JP 2005296531 A JP2005296531 A JP 2005296531A JP 2005296531 A JP2005296531 A JP 2005296531A JP 2007107917 A JP2007107917 A JP 2007107917A
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Abstract
【解決手段】光パルス測定装置100は、光パルスを出力するパルス光源3と、パルス光源3から出力された光パルスを変調するマッハツェンダ型光強度変調器6と、マッハツェンダ型光強度変調器6に対して電圧値を変化させながらバイアス電圧を印加するバイアス電圧生成部102と、マッハツェンダ型光強度変調器6に対して高周波信号を印加する高周波信号生成部101と、マッハツェンダ型光強度変調器6から出力される光パルスのスペクトルを測定する光スペクトラムアナライザ7を備える。
【選択図】図1
Description
この従来技術の最終目標は、複素光電界の時間波形e(t)=|e(t)|exp[jφ(t)]を測定することである。そのために、e(t)を直接測定するのではなく、e(t)をフーリエ変換したE(ω)=|E(ω)|exp[jφ1(ω)]を測定し、E(ω)の逆フーリエ変換によってe(t)を求める。
Daniel J. Kane and Rick Trebino,"Characterization of Arbitrary Femtosecond Pulses Using Frequency-Resolved Optical Gating,"IEEE Journal of Quantum Electronics, Vol.29, No.2, February 1993, pp571 C. Iaconis and I. A. Walmsley, "Spectral phase interferometry for direct electric-field reconstruction of ultrashort optical pulses,"Optics Letters, Vol.23, No.10, May 15, 1998, pp792 Christophe Dorrer and Inuk Kang, "Highly sensitive direct characterization of femtosecond pulses by electro-optic spectral shearing interferometry,"Optics Letters, Vol.28, No.6, March 15, 2003, pp477 Christophe Dorrer and Inuk Kang, "Simultaneous temporal characterization of telecommunication optical pulses and modulators by use of spectrograms,"Optics Letters, Vol.27, No.15, August 1, 2002, pp1315 Christophe Dorrer and Inuk Kang, "Complete temporal characterization of short optical pulses by simplified chronocyclic tomography,"Optics Letters, Vol.28, No.16, August 15, 2003, pp1481
図1に、本発明の実施形態に係る光パルス測定装置100の構成を示す。光パルス測定装置100は、図1に示すように、高周波信号生成部101、バイアス電圧生成部102、パルス光源3、マッハツェンダ型光強度変調器6、光スペクトラムアナライザ7により構成される。
2 位相調整器
3 パルス光源
4 トリガ信号源
5 三角波生成器
6 マッハツェンダ型光強度変調器
7 光スペクトラムアナライザ(スペクトル測定手段)
100 光パルス測定装置
101 高周波信号生成部
102 バイアス電圧生成部
Claims (4)
- 光パルスを出力するパルス光源と、
前記パルス光源から出力された光パルスを変調するマッハツェンダ型光強度変調器と、
前記マッハツェンダ型光強度変調器に対して電圧値を変化させながらバイアス電圧を印加するバイアス電圧生成部と、
前記マッハツェンダ型光強度変調器に対して高周波信号を印加する高周波信号生成部と、
前記マッハツェンダ型光強度変調器から出力される光パルスのスペクトルを測定するスペクトル測定手段と、
を備えることを特徴とする光パルス測定装置。 - 前記バイアス電圧の時間波形は三角波状であることを特徴とする請求項1に記載の光パルス測定装置。
- 光パルスを出力し、
マッハツェンダ型光強度変調器に対し、高周波信号及びバイアス電圧を印加し、
前記マッハツェンダ型光強度変調器を用いて、前記出力された光パルスに対して、前記印加された高周波信号及びバイアス電圧に応じた変調を施し、
前記バイアス電圧を変化させながら光パルスのスペクトルを測定することを特徴とする光パルス測定方法。 - 前記バイアス電圧の時間波形は三角波状であることを特徴とする請求項3に記載の光パルス測定方法。
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102589721A (zh) * | 2011-11-28 | 2012-07-18 | 中国科学院武汉物理与数学研究所 | 基于微处理器的光频标离子钟跃迁探询方法 |
US9826754B2 (en) | 2011-08-12 | 2017-11-28 | Tetra Laval Holdings & Finance S.A. | Through-flow freezer and a method for starting up the same |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9826754B2 (en) | 2011-08-12 | 2017-11-28 | Tetra Laval Holdings & Finance S.A. | Through-flow freezer and a method for starting up the same |
CN102589721A (zh) * | 2011-11-28 | 2012-07-18 | 中国科学院武汉物理与数学研究所 | 基于微处理器的光频标离子钟跃迁探询方法 |
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