JP2007081453A - Imaging apparatus, signal processing method, and program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To generate an excellent signal any without noise in ordinary imaging. <P>SOLUTION: A column noise detection section 31 detects a column noise value in an effective image region A in a state of the region A being shielded by a shutter 11, a column noise change detection section 33 detects a column noise change amount in a HOPB region B in real time, a column noise correction value generating section 34 corrects the column noise value detected by the column noise detection section 31 on the basis of the column noise change amount detected by the column noise change detection section 33 and generates a column noise correction value, and a column noise correction section 35 corrects a signal S4 supplied from the effective image region A in the ordinary image photographing on the basis of the column noise correction value. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an imaging apparatus, a signal processing method, and a program for imaging a subject using an XY address type solid-state imaging device.

  An XY address type solid-state imaging device 1 typified by a CMOS (complementary metal oxide semiconductor) sensor has a large number of pixels arranged in a matrix as shown in FIG. Vertical scanning circuit 54 for sequentially selecting lines), a horizontal scanning circuit 60 for sequentially selecting each column (hereinafter referred to as a column) of the pixel portion 52, and an output circuit for outputting signals. 61 is provided.

  The vertical scanning circuit 54 and the horizontal scanning circuit 59 are constituted by, for example, a shift register, and generate a vertical scanning pulse and a horizontal scanning pulse one by one for each line and each column.

  Further, when the image signal stored in each pixel is read, a pulse signal is applied to one vertical selection line 53 by the vertical scanning circuit 54, and all the pixel transistors 51 for one line are all energized, and each photosensitive portion. An image signal is read out from each vertical signal line 55 from 50. The image signal read out to each vertical signal line 55 is supplied to a circuit such as a correlated double sampling circuit (CDS) 56 that removes an offset signal for each pixel.

  The horizontal scanning circuit 59 applies a pulse signal to the transistors 51 connected to the respective vertical signal lines 55 via the horizontal selection lines 59 to turn on the transistors 51. The column pixel signal from which the offset signal has been removed by the CDS 56 is read out to the horizontal signal line 58, converted into a voltage signal by the output circuit 61, and output to the outside.

  In such an XY address type solid-state imaging device, the pixel signal supplied from the output circuit 61 has a different vertical signal line 55 for each column. Different offsets are added to the image signal. This offset for each column appears as streak-like fixed pattern noise (hereinafter referred to as column noise) on the display screen, resulting in degradation of image quality.

  As a method for preventing this deterioration, only the column noise component is extracted from the solid-state image sensor, and the extracted column noise component is held as a reference signal for correction, and the signal output of the solid-state image sensor during normal imaging operation In some cases, column noise is corrected by subtracting the reference signal held from the column.

  However, normally, when the pixel unit 52 is irradiated with light, a signal component due to incident light is added to the column noise component, and thus this output signal cannot be used as a reference signal for correction. Therefore, in Patent Document 1, as shown in FIG. 7, the pixel unit 52 is irradiated with light from several columns to several tens of columns by an effective image area A irradiated with light and a light shielding plate made of an aluminum thin film or the like. Horizontal optical black (hereinafter referred to as HOPB) region B to be blocked, and vertical optical black (hereinafter referred to as VOPB) region C in which light irradiation is blocked from several lines to several tens of lines by a light shielding plate made of an aluminum thin film or the like. To detect and correct column noise.

  By the way, the offset for each column causing the column noise appears not only in the pixel located in the effective image area A but also in the output from the pixel located in the shielded black level reference VOPB area C. Therefore, it can be corrected by detecting a column noise component using a signal from a pixel in the VOPB area C and subtracting it from a signal from a pixel in the effective image area A.

  However, when obtaining a reference signal for correcting column noise using the signal of each pixel in the VOPB region C, there is a variation in dark current components (hereinafter referred to as random noise) output from each pixel in the VOPB region C. )) Is a problem. In particular, since the VOPB region C is from several lines to several tens of lines, the number of pixels is small, and even if averaging processing is performed, random noise output from each pixel cannot be sufficiently suppressed.

  Therefore, if the number of lines in the VOPB area C is increased, the area dedicated to column noise detection becomes larger, and the solid-state imaging device becomes larger correspondingly.

  In addition, the amount of signal read from the solid-state imaging device is also increased by the VOPB area C, and the hardware is required to have performance sufficient to read and process at high speed.

  On the other hand, it is conceivable that the solid-state imaging device is configured only by the effective image area A and the HOPB area B. In the case of this configuration, the effective image area A is temporarily shielded, column noise is detected and stored in the memory, and column noise is corrected.

JP 10-1226697 A

  However, in such a method, column noise is detected only once at the time of shipment from the factory or when the power is turned on, so when the column noise component changes due to external factors such as heat, the column noise is not corrected properly. As a result, the image quality deteriorates.

  Therefore, in the present invention, the solid-state imaging device is configured only by the effective image area A and the HOPB area B, and even when the column noise component is changed, the solid-state imaging device is adaptively adapted to the change of the column noise component, and the high quality. Provided are an imaging apparatus, a signal processing method, and a program for obtaining a clear image.

  In order to solve the above-described problems, an imaging apparatus according to the present invention includes a pixel unit including pixels, which are arranged in a matrix, an effective image area where light is irradiated, and a horizontal light-shielded image area where light irradiation is blocked. And a vertical scanning circuit for controlling the control electrodes of the pixels in the same row connected in common by the vertical selection line, and a pixel signal output via the vertical signal line in which the main electrodes of the pixels in the same column are connected in common A solid-state image pickup device means having a horizontal scanning circuit that sequentially outputs in units of rows, and an output circuit that outputs a pixel signal from the horizontal scanning circuit, a light shielding means for shielding light irradiated to an effective image area, and a light shielding means And a first detection means for detecting an offset signal of the effective image area based on a pixel signal output from a pixel arranged in the effective image area in a state where light is blocked by Out of the pixel A second detection unit that detects an offset signal that serves as a reference for the horizontal light-shielded image region based on the pixel signal that is generated, and an offset signal that serves as a reference is detected by the second detection unit and is then disposed in the horizontal light-shielded image region. A third detection unit that detects an offset signal of the horizontal light-shielded image region based on a pixel signal output from the active pixel, a reference offset signal detected by the second detection unit, and a third detection unit A comparison means for comparing the offset signal after the predetermined time has elapsed, a correction signal generation means for generating a correction signal based on the offset signal detected from the first detection means, and a comparison result by the comparison means, and a correction Correction means for correcting pixel signals output from pixels arranged in the effective image area based on the correction signal generated by the signal generation means; Provided.

  In order to solve the above-described problem, the signal processing method according to the present invention includes an effective image area where pixels are arranged in a matrix and irradiated with light, and a horizontal light-shielded image area where light irradiation is blocked. And a vertical scanning circuit for controlling the control electrodes of the pixels in the same row connected in common by the vertical selection line, and a vertical signal line in which the main electrodes of the pixels in the same column are connected in common. A signal processing method for a signal output from a solid-state imaging device having a horizontal scanning circuit that sequentially outputs pixel signals in units of rows and an output circuit that outputs pixel signals from the horizontal scanning circuit, the method including: A first step of detecting an offset signal of the effective image area based on a pixel signal output from a pixel arranged in the effective image area in a state where the light is blocked by the light shielding process; Detection process and A second detection step for detecting an offset signal serving as a reference for the horizontal shading image region based on a pixel signal output from a pixel arranged in the horizontal shading image region, and an offset signal serving as a reference by the second detection step After the detection, the third detection step of detecting the offset signal of the horizontal light-shielding image region based on the pixel signal output from the pixel arranged in the horizontal light-shielding image region, and the second detection step Based on the reference offset signal, the comparison step for comparing the offset signal detected after the elapse of the predetermined time detected by the third detection step, the offset signal detected from the first detection step, and the comparison result by the comparison step A correction signal generation step for generating a correction signal, and a pixel arranged in the effective image area based on the correction signal generated by the correction signal generation step. And a correction step of correcting a pixel signal that is output.

  In addition, in order to solve the above-described problem, the program according to the present invention is a pixel including pixels that are arranged in a matrix, an effective image area where light is irradiated, and a horizontal light-shielded image area where light irradiation is blocked. And a vertical scanning circuit for controlling control electrodes of pixels in the same row connected in common by a vertical selection line, and a pixel output through a vertical signal line in which main electrodes of pixels in the same column are connected in common A program for processing a signal output from a solid-state imaging device having a horizontal scanning circuit that sequentially outputs signals in units of rows and an output circuit that outputs pixel signals from the horizontal scanning circuit, and is applied to an effective image area. And a first detection for detecting an offset signal of the effective image area based on a pixel signal output from a pixel arranged in the effective image area in a state where the light is blocked by the light shielding process. Craft And a second detection step for detecting an offset signal serving as a reference for the horizontal light-shielded image region based on a pixel signal output from a pixel arranged in the horizontal light-shielded image region, and a reference by the second detection step. After detecting the offset signal, based on the pixel signal output from the pixel arranged in the horizontal light-shielding image region, a third detection step for detecting the offset signal in the horizontal light-shielding image region, and detection by the second detection step A comparison step for comparing the reference offset signal that has been detected and an offset signal after the elapse of a predetermined time detected by the third detection step, an offset signal detected from the first detection step, and a comparison result by the comparison step A correction signal generation step for generating a correction signal based on the correction signal, and an image arranged in the effective image area based on the correction signal generated by the correction signal generation step. It is intended for executing a correction process for correcting the pixel signal output to the computer from.

  In the present invention, when the column noise value of the effective image area A changes with the passage of time in the configuration of the solid-state imaging device (effective image area and HOPB area) of a normal imaging apparatus, the column noise in the HOPB area B A column noise correction value is generated according to the change, and the column noise in the effective image area A is appropriately corrected by the column noise correction value, so that a high-quality image can always be obtained.

  Hereinafter, an imaging apparatus, a signal processing method, and a program for imaging a subject will be described as embodiments of the present invention.

  As shown in FIG. 1, the imaging apparatus 1 is incident through a lens 10 that collects incident light, a shutter 11 that passes light collected by the lens 10 for a predetermined time, and the lens 10 and the shutter 11. A solid-state image pickup device 12 that picks up an image of a subject to be imaged, a control unit 13 that controls the shutter 11 and the solid-state image pickup device 12, and a signal processing unit 14 that performs predetermined signal processing on pixel signals picked up by the solid-state image pickup device 12. It has.

  Light emitted from the subject enters the solid-state imaging device 12 through the optical system of the lens 10 and the shutter 11. The solid-state imaging device 12 has a pixel unit that images a subject. As shown in FIG. 2, the pixel unit includes an effective image area A to which light is irradiated and a horizontal optical black (hereinafter referred to as “light”) that blocks light irradiation over several columns to several tens of columns by a light shielding plate made of an aluminum thin film or the like. This is called HOPB.) This HOPB region B exists in order to acquire a black signal level as a reference. When taking an image, the signals of the effective image area A and the HOPB area B are read in the same frame, and the black level of the image is detected and corrected. In the present invention, as will be described in detail below, a change in the column noise component is detected in real time using the presence of column noise in the signal in the HOPB region B, and corrected to the amount of column noise stored in the memory. The processing is performed.

  The control unit 13 controls the opening / closing operation of the shutter 11. In addition, the control unit 13 controls the solid-state imaging device 12 and causes the signal processing unit 14 to output a pixel signal S1 that is selectively output from pixels arranged in the effective image region A and the HOPB region B.

  Here, the solid-state imaging device 12 will be described with reference to FIG. The solid-state imaging device 12 adopts, for example, an XY address type, and outputs a charge accumulated in the photosensitive portion 15 and a photosensitive portion 15 that accumulates charges in response to light irradiation, as shown in FIG. A pulse signal is applied to a pixel portion 17 in which pixels composed of pixel transistors 16 to be arranged are arranged in a matrix, and a vertical selection line 18 connecting pixels arranged in the pixel portion 17 for each row (line). By applying a pulse signal from the vertical scanning circuit 19 and the vertical scanning circuit 19, an offset signal of a signal supplied to the vertical signal line 20 connecting the pixels arranged in the pixel unit 17 for each column (column) is obtained. The correlated double sampling circuit (CDS) 21 to be removed, the transistor 23 for supplying the signal from which the offset signal has been removed by the CDS 21 to the horizontal signal line 22, and the CDS 21 A horizontal scanning circuit 25 that supplies a pulse signal to the transistor 23 via the horizontal selection line 24 in order to supply a signal from which the set signal has been removed to the horizontal signal line 22, and signal processing of the signal supplied to the horizontal scanning circuit 25 And an output circuit 26 to be supplied to the unit 14.

  In such an XY address type solid-state imaging device 12, the pixel signal supplied from the output circuit 26 has a different vertical signal line 4 for each column depending on the arranged pixels. If there are variations in characteristics, etc., an offset signal that differs from column to column is added to the image signal. This offset signal for each column appears on the display screen as streak-like fixed pattern noise (hereinafter referred to as column noise), which causes image quality degradation. The signal processing unit 14 at the subsequent stage of the solid-state imaging device 12 removes such column noise.

  Next, the configuration of the signal processing unit 14 will be described below. As shown in FIG. 4, the signal processing unit 14 includes an AFE (analog front end) unit 30 that converts the output signal of the solid-state imaging device 12 into a digital signal, and a column noise component of the effective image area A that is shielded by the shutter 11. Column noise detection unit 31 that detects the column noise, line memory 32 that stores and holds the column noise component detected by the column noise detection unit 31, column noise in the HOPB region B is detected, and the reference column noise and a predetermined time elapse Based on the column noise change detection unit 33 that compares the subsequent column noise and detects a change, the change amount of the column noise detected by the column noise change detection unit 33, and the column noise stored in the line memory 32. Column noise correction value generation unit 34 for generating a column noise correction value and column noise generated by the column noise correction value generation unit 34 A column noise correction unit 35 that corrects a column noise component of a pixel signal supplied from the AFE unit 30 based on the correction value, and a camera signal processing unit 36 that performs predetermined camera processing on an output signal of the column noise correction unit 35. Prepare.

  The AFE unit 30 converts the pixel signal S1 supplied from the solid-state imaging device 12 into a digital signal, and outputs the converted pixel signal. Further, the AFE unit 30 supplies the signal S2 output from the pixels arranged in the HOPB region B to the column noise change detection unit 33, and is arranged in the effective image region A in a state where the light is blocked by the shutter 11. The signal S3 output from the active pixel is supplied to the column noise detection unit 31, and the signal S4 output from the pixel arranged in the effective image area A in a state where the light is not blocked by the shutter 11 is subjected to the column noise correction. To the unit 35.

  The column noise detection unit 31 detects the column noise value of the effective image area A based on the signal S3 supplied from the AFE unit 30. When the column noise detection unit 31 obtains the column noise value of the effective image area A (for example, at the time of factory adjustment or when the power is turned on), the shutter 11 is closed according to control by the control unit 13, and the effective image area A is A column noise detection signal S3 is supplied from the solid-state imaging device 12 in a light-shielded state. The column noise detection unit 31 performs an operation based on the signal S3 and stores the column noise value obtained (detected) by the operation in the line memory 32. Note that the column noise detection unit 31 calculates a column noise value for each column of the effective image area A, and stores the calculated column noise value for each column in the line memory 32.

  The column noise change detection unit 33 receives the signal of the HOPB region B supplied from the AFE unit 30 when the column noise detection unit 31 obtains the amount of column noise in the effective image region A (for example, at the time of factory adjustment or when the power is turned on). Column noise (reference column noise) is detected based on S2. The column noise change detection unit 33 detects the column noise (comparison column noise) based on the signal S2 of the HOPB region B supplied from the AFE unit 30 after detecting the reference column noise. The column noise change detection unit 33 compares the reference column noise with the comparison column noise, and detects the change amount of the column noise in real time. Then, the column noise change detection unit 33 supplies the detected column noise change amount to the column noise correction value generation unit 34.

  Here, an example in which the column noise change detection unit 33 detects a change in column noise will be described. As shown in FIG. 5, the column noise CNi detected in each column in the HOPB region B exists positively and negatively. Therefore, the absolute value | CNi | of the column noise is taken and averaged A = 1 / N (Σ | CNi |) is performed (the number of columns in the HOPB region B is N). In averaging, the change amount may be obtained for each column and then the change amount may be averaged.

  The column noise change detection unit 33 uses the ratio of the reference column noise A and the column noise B at the time of image capture as the amount of change in column noise. For example, if column noise B / column noise A = 2, the column noise is Assume that it has changed twice.

  The column noise correction value generation unit 34 corrects the column noise value of the effective image area A stored in the line memory 32 based on the column noise change amount of the HOPB area B supplied from the column noise change detection unit 33. And a column noise correction value is generated. The column noise correction value generation unit 34 supplies the generated column noise correction value to the column noise correction unit 35.

  The column noise correction value generation unit 34 may use the column noise change amount detected by the column noise change detection unit 33 as it is to generate the column noise correction value, but the HOPB region B and the effective image region A If the column noise characteristics are slightly different and the change amount cannot be used as it is, a conversion table corresponding to the column noise change amount detected by the column noise change detection unit 33 is provided, and the line memory is referenced with reference to the conversion table. The column noise correction value may be generated by correcting the column noise value of the effective image area A stored in the memory 32.

  In addition, the column noise correction value generation unit 34 applies a filter having a large time constant to the column noise change amount detected by the column noise change detection unit 33 to moderately change the column noise value used in the column noise correction unit 35. Alternatively, a configuration for improving the detection accuracy of the column noise change by applying a filter that removes a random noise component may be used.

  Also, the effective image area A tends to be more susceptible to temperature as the column is closer to the heat source (for example, power source). In order to generate a column noise correction value in consideration of the influence of such a heat source, the imaging apparatus 1 divides the pixels of the effective image area A into a plurality of columns and adjusts the column noise for each of the plurality of columns. The adjustment value holding unit 37 that holds the adjustment value is provided.

  The column noise correction value generation unit 34 stores the column noise change amount in the HOPB region B supplied from the column noise change detection unit 33 and the adjustment value held by the adjustment value holding unit 37 in the line memory 32. The column noise value of the saved effective image area A is corrected to generate a column noise correction value.

  The column noise correction unit 35 corrects the column noise component of the pixel signal supplied from the AFE unit 30 based on the column noise correction value supplied from the column noise correction value generation unit 34. The column noise correction unit 35 supplies the pixel signal whose column noise component has been corrected to the camera signal processing unit 36.

  The camera signal processing unit 36 performs predetermined camera signal processing on the signal whose column noise has been corrected by the column noise correction unit 35.

  Here, the operation of the imaging apparatus 1 will be described. In normal imaging, the imaging apparatus 1 reads the signal S4 of the effective image area A and the signal S2 of the HOPB area B from the solid-state imaging device 12, and the column noise change detection unit 33 determines the amount of column noise in the HOPB area B. Changes are observed in real time.

  The column noise correction value generation unit 34 corrects the column noise value of the effective image region A stored in the line memory 32 based on the column noise change amount supplied from the column noise change detection unit 33, and Generate a noise correction value.

  The column noise correction unit 35 subtracts the column noise component from the main line signal using the column noise correction value corrected in accordance with the change in the column noise in the HOPB region B supplied from the column noise correction value generation unit 34. Then, a signal is supplied to the camera signal processing unit 36.

  In this way, the imaging device 1 according to the present invention converts the output signal of the solid-state imaging device 12 into a digital signal in the configuration of the solid-state imaging device 12 (effective image region A and HOPB region B) of the normal imaging device. An AFE unit 30; a column noise detection unit 31 that detects a column noise component of the effective image area A shielded from light by the shutter 11; a line memory 32 that stores and holds the column noise component detected by the column noise detection unit 31; The column noise in the HOPB region B is detected, the reference column noise is compared with the column noise after the lapse of a predetermined time, and the change is detected by the column noise change detection unit 33 and the column noise change detection unit 33. A column that generates a column noise correction value based on the amount of change in column noise and the column noise stored in the line memory 32 A noise correction value generation unit 34, a column noise correction unit 35 that corrects a column noise component of the pixel signal supplied from the AFE unit 30 based on the column noise correction value generated by the column noise correction value generation unit 34, and a column The signal processing unit 14 includes a camera signal processing unit 36 that performs predetermined camera processing on the output signal of the noise correction unit 35, and column noise detection is performed on the column noise value of the effective image area A that is shielded by the shutter 11. The column noise change amount in the HOPB region B is detected in real time by the column noise change detection unit 33 and detected by the column noise detection unit 31 based on the column noise change amount detected by the column noise change detection unit 33. The column noise correction value generated by the column noise correction value generation unit 34 is corrected. Based on this column noise correction value, the signal S4 supplied from the effective image area A at the time of normal image shooting is corrected by the column noise correction unit 35. Therefore, the column noise value of the effective image area A over time. Since the column noise correction value is generated according to the change in the column noise in the HOPB area B and the column noise in the effective image area A is appropriately corrected by the column noise correction value, a high-quality image is always obtained. be able to.

  Further, in the imaging apparatus 1 according to the present invention, it is not necessary to shift to a special mode in order to correct a change in column noise detected in the effective image area A, and column noise correction is performed in real time while performing normal image capturing. This is particularly effective in so-called moving image shooting in which images are continuously shot.

  In the present invention, the series of processing by the imaging device 1 described above can also be performed by software. When a series of processing is performed by software, a program constituting the software is installed in a general-purpose computer or the like. The program may be recorded on a removable medium such as a CD-ROM and distributed to the user, or may be distributed by being downloaded to the user's computer via a network.

It is a block diagram which shows the structure of the solid-state image sensor device concerning this invention. It is a figure which shows a mode when the pixel part of a solid-state image sensor is divided | segmented and comprised in the effective image area | region and the HOPB area | region. It is a schematic diagram which shows the structure of a solid-state image sensor. It is a block diagram which shows the structure of a signal processing part. It is a figure where it uses for description about the detection of the variation | change_quantity of column noise. It is a schematic diagram which shows the structure of a solid-state image sensor. It is a figure which shows a mode when the pixel part of a solid-state image sensor is divided | segmented into an effective image area | region, a VOPB area | region, and a HOPB area | region.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 Image pickup device, 10 Lens, 11 Shutter, 12 Solid-state image sensor, 13 Control part, 14 Signal processing part, 15 Photosensitive part, 16 Pixel transistor, 17 Pixel part, 18 Vertical selection line, 19 Vertical scanning circuit, 20 Vertical signal line , 21 Correlated double sampling circuit (CDS), 22 horizontal signal line, 23 transistor, 24 horizontal selection line, 25 horizontal scanning circuit, 26 output circuit, 30 AFE (analog front end) part, 31 column noise detection part, 32 line Memory, 33 column noise change detection unit, 34 column noise correction value generation unit, 35 column noise correction unit, 36 camera signal processing unit, 37 adjustment value holding unit

Claims (6)

Control of pixels in the same row that are connected in common by vertical selection lines, and a pixel part that consists of an effective image area in which pixels are arranged in a matrix and light is irradiated, and a horizontal light-shielded image area that is blocked from light irradiation A vertical scanning circuit that controls the electrodes, a horizontal scanning circuit that sequentially outputs pixel signals output via a vertical signal line in which main electrodes of pixels in the same column are connected in common, and the horizontal scanning circuit Solid-state imaging device means having an output circuit for outputting the pixel signal of
A light shielding means for shielding light applied to the effective image area;
First detection means for detecting an offset signal of the effective image area based on a pixel signal output from a pixel arranged in the effective image area in a state where light is blocked by the light shielding means;
Second detection means for detecting an offset signal serving as a reference for the horizontal light-shielded image region based on a pixel signal output from a pixel arranged in the horizontal light-shielded image region;
After the offset signal serving as the reference is detected by the second detection means, a first offset signal for detecting the offset signal in the horizontal light-shielded image area is detected based on the pixel signal output from the pixel arranged in the horizontal light-shielded image area. 3 detection means;
A comparison means for comparing the reference offset signal detected by the second detection means with the offset signal after a predetermined time detected by the third detection means;
Correction signal generation means for generating a correction signal based on the offset signal detected from the first detection means and the comparison result by the comparison means;
An imaging apparatus comprising: correction means for correcting a pixel signal output from a pixel arranged in the effective image area based on the correction signal generated by the correction signal generation means. The pixel of the effective image area is divided into a plurality of columns, and includes adjustment value holding means for holding an adjustment value for adjusting the offset signal for each of the plurality of columns,
The correction signal generation unit generates a correction signal based on the offset signal detected from the first detection unit, the comparison result by the comparison unit, and the adjustment value held by the adjustment value holding unit. The imaging apparatus according to claim 1. Control of pixels in the same row that are connected in common by vertical selection lines, and a pixel part that consists of an effective image area in which pixels are arranged in a matrix and light is irradiated, and a horizontal light-shielded image area that is blocked from light irradiation A vertical scanning circuit that controls the electrodes, a horizontal scanning circuit that sequentially outputs pixel signals output via a vertical signal line in which main electrodes of pixels in the same column are connected in common, and the horizontal scanning circuit A signal processing method of a signal output from a solid-state imaging device having an output circuit for outputting the pixel signal of
A light shielding step for shielding the light applied to the effective image area;
A first detection step of detecting an offset signal of the effective image region based on a pixel signal output from a pixel arranged in the effective image region in a state where light is blocked by the light blocking step;
A second detection step of detecting an offset signal serving as a reference for the horizontal light-shielded image region based on a pixel signal output from a pixel arranged in the horizontal light-shielded image region;
After detecting the reference offset signal in the second detection step, the offset signal of the horizontal shading image area is detected based on the pixel signal output from the pixel arranged in the horizontal shading image area. 3 detection steps;
A comparison step of comparing the reference offset signal detected by the second detection step with the offset signal after the elapse of a predetermined time detected by the third detection step;
A correction signal generation step of generating a correction signal based on the offset signal detected from the first detection step and the comparison result of the comparison step;
And a correction step of correcting a pixel signal output from a pixel arranged in the effective image area based on the correction signal generated by the correction signal generation step.   The correction signal generation step divides the offset signal detected from the first detection step, the comparison result of the comparison step, and the pixels of the effective image area into a plurality of columns, and offsets the plurality of columns. 4. The signal processing method according to claim 3, wherein a correction signal is generated based on the adjustment value held by an adjustment value holding unit that holds an adjustment value for adjusting a signal. Control of pixels in the same row that are connected in common by vertical selection lines, and a pixel part that consists of an effective image area in which pixels are arranged in a matrix and light is irradiated, and a horizontal light-shielded image area that is blocked from light irradiation A vertical scanning circuit that controls the electrodes, a horizontal scanning circuit that sequentially outputs pixel signals output via a vertical signal line in which main electrodes of pixels in the same column are connected in common, and the horizontal scanning circuit A program for processing a signal output from a solid-state imaging device having an output circuit for outputting the pixel signal of
A light shielding step for shielding the light applied to the effective image area;
A first detection step of detecting an offset signal of the effective image region based on a pixel signal output from a pixel arranged in the effective image region in a state where light is blocked by the light blocking step;
A second detection step of detecting an offset signal serving as a reference for the horizontal light-shielded image region based on a pixel signal output from a pixel arranged in the horizontal light-shielded image region;
After detecting the reference offset signal in the second detection step, the offset signal of the horizontal shading image area is detected based on the pixel signal output from the pixel arranged in the horizontal shading image area. 3 detection steps;
A comparison step of comparing the reference offset signal detected by the second detection step with the offset signal after the elapse of a predetermined time detected by the third detection step;
A correction signal generation step of generating a correction signal based on the offset signal detected from the first detection step and the comparison result of the comparison step;
A program for causing a computer to execute a correction step of correcting a pixel signal output from a pixel arranged in the effective image area based on the correction signal generated by the correction signal generation step.   The correction signal generation step divides the offset signal detected from the first detection step, the comparison result of the comparison step, and the pixels of the effective image area into a plurality of columns, and offsets the plurality of columns. 6. The program according to claim 5, wherein the correction signal is generated based on the adjustment value held by an adjustment value holding unit that holds an adjustment value for adjusting the signal.

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