JP2007078621A5 - - Google Patents
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- JP2007078621A5 JP2007078621A5 JP2005270050A JP2005270050A JP2007078621A5 JP 2007078621 A5 JP2007078621 A5 JP 2007078621A5 JP 2005270050 A JP2005270050 A JP 2005270050A JP 2005270050 A JP2005270050 A JP 2005270050A JP 2007078621 A5 JP2007078621 A5 JP 2007078621A5
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- specimen
- conductor
- electromagnetic wave
- detecting
- coupling
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- 239000004020 conductor Substances 0.000 claims 24
- 230000001808 coupling Effects 0.000 claims 11
- 238000010168 coupling process Methods 0.000 claims 11
- 238000005859 coupling reaction Methods 0.000 claims 11
- 230000005540 biological transmission Effects 0.000 claims 7
- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 claims 6
- 238000001514 detection method Methods 0.000 claims 5
- 230000000737 periodic Effects 0.000 claims 4
- 239000000969 carrier Substances 0.000 claims 2
- 230000001678 irradiating Effects 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000000862 absorption spectrum Methods 0.000 claims 1
- 230000001276 controlling effect Effects 0.000 claims 1
- 230000000875 corresponding Effects 0.000 claims 1
- 230000003993 interaction Effects 0.000 claims 1
- 230000001902 propagating Effects 0.000 claims 1
Claims (13)
導電体部、前記導電体部の一部または近傍に配置した周期的構造、および前記検体を保持する検体保持部を少なくとも備えており、
前記導電体部に前記電磁波を相互作用させるときに前記検体保持部近傍に表面プラズモン共鳴が発生する条件の前記検体による変化を検出することで前記検体に関する情報を取得する検体情報取得手段を、前記電磁波を発生させて前記導電体部に結合させる結合手段と前記電磁波を前記導電体部に相互作用させた後に検出する検出手段を含んで構成することを特徴とするセンシング装置。 An apparatus for acquiring information about a specimen as a target using an electromagnetic wave including at least a part of the frequency region in a frequency region of 30 GHz to 30 THz,
At least a conductor part, a periodic structure arranged in or near a part of the conductor part, and a specimen holding part for holding the specimen;
Specimen information acquisition means for acquiring information about the specimen by detecting a change caused by the specimen in a condition in which surface plasmon resonance occurs in the vicinity of the specimen holding section when the electromagnetic wave interacts with the conductor section; A sensing apparatus comprising: coupling means for generating an electromagnetic wave and coupling to the conductor part; and detecting means for detecting the electromagnetic wave after interacting with the conductor part.
その一部または近傍に周期的構造が配置された導電体部の近傍に検体を保持し、前記導電体部に電磁波を結合させて相互作用させ、前記相互作用させた後の電磁波を検出し、この検出に基づいて前記検体が保持された部分の近傍に表面プラズモン共鳴が発生する条件の前記検体による変化を検出して前記検体に関する情報を取得することを特徴とするセンシング方法。 A sensing method for acquiring information about a specimen as an object using an electromagnetic wave including at least a part of the frequency region in a frequency region of 30 GHz to 30 THz,
Holding a specimen in the vicinity of a conductor portion in which a periodic structure is disposed in part or in the vicinity thereof, coupling and interacting with an electromagnetic wave in the conductor portion, and detecting the electromagnetic wave after the interaction, A sensing method characterized in that based on this detection, a change in the condition under which surface plasmon resonance occurs in the vicinity of a portion where the specimen is held is detected to obtain information on the specimen.
テラヘルツ波を発生させるための発生手段と、Generating means for generating terahertz waves;
金属あるいはキャリア濃度が制御された半導体から成る導電体部と、A conductor made of a metal or a semiconductor having a controlled carrier concentration; and
前記発生手段が発生したテラヘルツ波を前記導電体部に結合させるための結合手段と、Coupling means for coupling the terahertz wave generated by the generating means to the conductor portion;
前記導電体部に相互作用させたテラヘルツ波を検出するための検出手段と、Detection means for detecting terahertz waves interacted with the conductor portion;
検体を保持するための検体保持部と、A sample holder for holding the sample;
検体に関する情報を取得するための検体情報取得手段と、を備え、A specimen information acquisition means for acquiring information about the specimen,
少なくとも1つの方向に沿って特性値が周期的に変化された構造から成る周期的構造が、前記導電体部の一部または近傍に配置され、A periodic structure composed of a structure whose characteristic values are periodically changed along at least one direction is disposed in a part of or near the conductor portion;
前記検体情報取得手段は、前記導電体部に前記テラヘルツ波を相互作用させるときに前記検体保持部近傍に表面プラズモン共鳴が発生する条件の前記検体による変化を検出することで前記検体に関する情報を取得することを特徴とするセンシング装置。The specimen information acquisition means acquires information on the specimen by detecting a change caused by the specimen in a condition where surface plasmon resonance occurs in the vicinity of the specimen holding section when the terahertz wave interacts with the conductor section. A sensing device characterized by:
前記発生手段が発生したテラヘルツ波を伝送するための導電体部を含み構成される伝送路と、A transmission path including a conductor portion for transmitting the terahertz wave generated by the generating means;
前記発生手段が発生したテラヘルツ波を前記導電体部に照射するための結合手段と、Coupling means for irradiating the conductor portion with the terahertz wave generated by the generating means;
前記伝送路を伝送したテラヘルツ波を検出するための検出手段と、を有し、Detecting means for detecting a terahertz wave transmitted through the transmission path,
前記伝送路は、前記導電体部に配置された回折格子を含み構成され、The transmission path is configured to include a diffraction grating disposed in the conductor portion,
前記回折格子の格子ピッチと前記テラヘルツ波を前記伝送路に入射する角度とが、表面プラズモン共鳴を起こす関係になるように構成されることを特徴とする装置。The apparatus is configured such that a grating pitch of the diffraction grating and an angle at which the terahertz wave is incident on the transmission line are in a relationship causing surface plasmon resonance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005270050A JP4726212B2 (en) | 2005-09-16 | 2005-09-16 | Sensing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005270050A JP4726212B2 (en) | 2005-09-16 | 2005-09-16 | Sensing device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007078621A JP2007078621A (en) | 2007-03-29 |
JP2007078621A5 true JP2007078621A5 (en) | 2008-09-04 |
JP4726212B2 JP4726212B2 (en) | 2011-07-20 |
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Family Applications (1)
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JP2005270050A Expired - Fee Related JP4726212B2 (en) | 2005-09-16 | 2005-09-16 | Sensing device |
Country Status (1)
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JP (1) | JP4726212B2 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2008014732A (en) * | 2006-07-04 | 2008-01-24 | Tohoku Univ | Surface plasmon resonance measuring instrument |
JP4183735B1 (en) | 2007-10-15 | 2008-11-19 | 国立大学法人 岡山大学 | Material distribution measuring device |
JP5083781B2 (en) * | 2008-03-25 | 2012-11-28 | 学校法人早稲田大学 | Optical sensor |
KR100993894B1 (en) * | 2008-10-21 | 2010-11-11 | 한국과학기술원 | High-harmonic generation apparatus using a local field enhancement for lap-top size |
WO2011096563A1 (en) * | 2010-02-08 | 2011-08-11 | 国立大学法人 岡山大学 | Measuring device and measuring method that use pulsed electromagnetic wave |
EP2537021A1 (en) * | 2010-02-15 | 2012-12-26 | Koninklijke Philips Electronics N.V. | Device for analyzing a sample using radiation in the terahertz frequency range |
JP4534027B1 (en) * | 2010-03-01 | 2010-09-01 | 国立大学法人 岡山大学 | Electromagnetic wavefront shaping element, electromagnetic wave imaging apparatus including the same, and electromagnetic wave imaging method |
JPWO2011142155A1 (en) * | 2010-05-12 | 2013-07-22 | 株式会社村田製作所 | Method for measuring characteristics of object to be measured, and void arrangement structure and measuring apparatus used therefor |
JP6117506B2 (en) | 2012-10-09 | 2017-04-19 | 国立大学法人 東京大学 | Terahertz wave measuring apparatus and method |
JP6099190B2 (en) * | 2012-11-21 | 2017-03-22 | ローム株式会社 | Solution inspection equipment |
RU2547164C1 (en) * | 2013-11-29 | 2015-04-10 | Федеральное государственное автономное образовательное учреждение высшего образования "Новосибирский национальный исследовательский государственный университет" (Новосибирский государственный университет, НГУ) | Geodetic prism for deflection of beam of monochromatic surface plazmon-polaritons of terahertz range |
JP6269008B2 (en) * | 2013-12-12 | 2018-01-31 | 株式会社豊田中央研究所 | Electromagnetic wave-surface polariton conversion element. |
JP6928931B2 (en) * | 2017-05-08 | 2021-09-01 | 国立大学法人電気通信大学 | Measurement device and measurement sensor |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS6021904A (en) * | 1983-07-13 | 1985-02-04 | Toray Ind Inc | Fiber generating extremely fine fibrils |
GB8509492D0 (en) * | 1985-04-12 | 1985-05-15 | Plessey Co Plc | Optical assay |
JP2002357543A (en) * | 2001-06-01 | 2002-12-13 | Mitsubishi Chemicals Corp | Analyzing element and method for analyzing sample using the same |
JP2005016963A (en) * | 2003-06-23 | 2005-01-20 | Canon Inc | Chemical sensor, and chemical sensor device |
JP3950820B2 (en) * | 2003-06-25 | 2007-08-01 | キヤノン株式会社 | High frequency electric signal control device and sensing system |
US6985664B2 (en) * | 2003-08-01 | 2006-01-10 | Corning Incorporated | Substrate index modification for increasing the sensitivity of grating-coupled waveguides |
JP4402026B2 (en) * | 2005-08-30 | 2010-01-20 | キヤノン株式会社 | Sensing device |
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2005
- 2005-09-16 JP JP2005270050A patent/JP4726212B2/en not_active Expired - Fee Related
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