JP2007028509A5 - - Google Patents

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JP2007028509A5
JP2007028509A5 JP2005211309A JP2005211309A JP2007028509A5 JP 2007028509 A5 JP2007028509 A5 JP 2007028509A5 JP 2005211309 A JP2005211309 A JP 2005211309A JP 2005211309 A JP2005211309 A JP 2005211309A JP 2007028509 A5 JP2007028509 A5 JP 2007028509A5
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Prior art keywords
scanning
scanned
scanning line
pitch interval
light beams
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JP2005211309A
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JP2007028509A (en
JP5127122B2 (en
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Claims (8)

直線状に所定の間隔で離間して配置した3つ以上の発光点を有する光源手段の各発光点から発せられた複数の光束を偏向手段で偏向し、該偏向手段で偏向された複数の光束を結像光学系で被走査面上に結像させて、該偏向手段の偏向動作により該被走査面を複数の光束で主走査方向に走査するとき、
該被走査面を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定し、その結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。
A plurality of light beams emitted from each light emitting point of a light source unit having three or more light emitting points arranged linearly at a predetermined interval are deflected by the deflecting unit, and the plurality of light beams deflected by the deflecting unit Is imaged on the surface to be scanned by the imaging optical system, and the surface to be scanned is scanned with a plurality of light beams in the main scanning direction by the deflection operation of the deflecting means.
Among the plurality of scanning lines that scan the surface to be scanned, the distance between two scanning lines that are the farthest in the sub-scanning direction is measured by the measuring means, and the scanning line pitch interval in the sub-scanning direction is adjusted based on the result. A method for adjusting a scanning line pitch interval of a scanning optical device .
n(nは3以上の整数)個の発光点が直線状に所定間隔で離間して配置した発光点列が該直線と直交する方向に所定間隔でm(mは2以上の整数)列配置した光源手段から発せられた複数の光束を偏向手段で偏向し、該偏向手段で偏向された複数の光束を結像光学系で被走査面上に結像させて、該偏向手段の偏向動作により該被走査面を複数の光束で主走査方向に走査するとき、
該被走査面を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定し、その結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。
A sequence of light emitting points in which n (n is an integer of 3 or more) light emitting points are linearly arranged at a predetermined interval, and m (m is an integer of 2 or more) is arranged in a direction orthogonal to the straight line. deflecting the plurality of light beams emitted from the light source means with deflection means, a plurality of light beams deflected by said deflecting means in the imaging optical system is focused on the surface to be scanned by the deflecting operation of said deflecting means When scanning the surface to be scanned in the main scanning direction with a plurality of light beams,
Among the plurality of scanning lines that scan the surface to be scanned, the distance between two scanning lines that are the farthest in the sub-scanning direction is measured by the measuring means, and the scanning line pitch interval in the sub-scanning direction is adjusted based on the result. A method for adjusting a scanning line pitch interval of a scanning optical device .
n(nは3以上の整数)個の発光点が直線状に所定間隔で離間して配置した発光点列が該直線と直交する方向に所定間隔でm(mは2以上の整数)列配置した光源手段から発せられた複数の光束を偏向手段で偏向し、該偏向手段で偏向された複数の光束を結像光学系で被走査面上に結像させて、該偏向手段の偏向動作により該被走査面を複数の光束で主走査方向に走査するとき、
該被走査面上を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定する第1工程と、
i列目(i=1,2,・・・,m−1)のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線の中で、i+1列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線に最も近い走査線と、i+1列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線の中で、i列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線に最も近い走査線との間隔を測定手段で測定する第2工程とを有し、
該第1、第2工程での測定結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。
A sequence of light emitting points in which n (n is an integer of 3 or more) light emitting points are linearly arranged at a predetermined interval, and m (m is an integer of 2 or more) is arranged in a direction orthogonal to the straight line. deflecting the plurality of light beams emitted from the light source means with deflection means, a plurality of light beams deflected by said deflecting means in the imaging optical system is focused on the surface to be scanned by the deflecting operation of said deflecting means When scanning the surface to be scanned in the main scanning direction with a plurality of light beams,
A first step of measuring a distance between two scanning lines farthest in the sub-scanning direction among a plurality of scanning lines scanning the surface to be scanned by a measuring unit;
Among the n scanning lines when the surface to be scanned is scanned with n light beams emitted from n light emitting points in the i-th column (i = 1, 2,..., m−1). Thus, the scanning line closest to the n scanning lines when the surface to be scanned is scanned with the n light beams emitted from the n light emitting points in the i + 1 column and the n light emission in the i + 1 column. Of the n scanning lines when scanning the surface to be scanned with n light beams emitted from a point, the n light beams emitted from n light emitting points in the i-th column are scanned with the light beam. A second step of measuring the distance from the scanning line closest to the n scanning lines when scanning on the surface with the measuring means,
First, the scanning line pitch interval adjusting method of a scanning optical apparatus and adjusting the sub-scanning direction of the scanning line pitch on the basis of the results of the measurements in the second step.
前記最も離間した2本の走査線の間隔の測定を、走査有効幅内の少なくとも2ヶ所で測定し、その結果に基づき走査線ピッチ間隔を調整することを特徴とする請求項1、2又は3に記載の走査光学装置の走査線ピッチ間隔調整方法。 4. The distance between the two most distant scanning lines is measured at at least two points within a scanning effective width, and the scanning line pitch interval is adjusted based on the result. 2. A method for adjusting a scanning line pitch interval of the scanning optical device according to 1) . 前記被走査面上において、副走査方向に最も離間した2本の走査線の間隔をL(mm)、走査線の数をPn、該被走査面上の副走査方向における画素密度をA(dot/inch)とするとき、走査有効幅内全域で、
2/3×(Pn−1)×25.4/A<L<4/3×(Pn−1)×25.4/A
但し、Pn=n×m
を満足するように走査線ピッチ間隔を調整することを特徴とする請求項1乃至4の何れか1項に記載の走査光学装置の走査線ピッチ間隔調整方法。
On the surface to be scanned, the distance between two scanning lines that are most separated in the sub-scanning direction is L (mm), the number of scanning lines is Pn, and the pixel density in the sub-scanning direction on the surface to be scanned is A (dot / inch) over the entire scanning effective width,
2/3 × (Pn−1) × 25.4 / A <L <4/3 × (Pn−1) × 25.4 / A
However, Pn = n × m
5. The method of adjusting a scanning line pitch interval of a scanning optical device according to claim 1, wherein the scanning line pitch interval is adjusted so as to satisfy the above.
前記画素密度は1200dpi以上であることを特徴とする請求項5に記載の走査光学装置の走査線ピッチ間隔調整方法。 The pixel density scanning line pitch interval adjusting method of a scanning optical apparatus according to claim 5, characterized in that at least 1200 dpi. 前記被走査面上において、副走査方向に最も離間した2本の走査線の間隔をL(mm)、同時刻における第1の走査線を描く結像点と第1の走査線と隣り合う第2の走査線を描く結像点とを結んだ直線と第2の走査線の成す角度をθ、同時刻における第1の走査線を描く結像点と第1の走査線と隣り合う第2の走査線を描く結像点とを結んだ直線の長さをaとするとき、
0.9L/(mn−1)<(L−am(n−1)sinθ)/(m−1)<1.1L/(mn−1)
を満足するように前記走査線ピッチ間隔を調整することを特徴とする請求項2又は3に記載の走査光学装置の走査線ピッチ間隔調整方法。
On the surface to be scanned, an interval between two scanning lines that are most separated in the sub-scanning direction is L (mm), and an imaging point that draws the first scanning line at the same time is adjacent to the first scanning line. The angle formed between the second scanning line and the straight line connecting the two scanning lines and the imaging point is θ, and the imaging point drawing the first scanning line at the same time is adjacent to the first scanning line. When the length of the straight line connecting the image forming point that draws the scanning line is a,
0.9L / (mn-1) <(L-am (n-1) sin θ) / (m-1) <1.1L / (mn-1)
4. The scanning line pitch interval adjusting method for a scanning optical apparatus according to claim 2, wherein the scanning line pitch interval is adjusted so as to satisfy the above.
前記光源手段を、最も離間した2つの発光点を結ぶ線分の中心を回転中心として光軸回りに回転させて走査線ピッチ間隔調整を行うことを特徴とする請求項1乃至7の何れか1項に記載の走査光学装置の走査線ピッチ間隔調整方法。 8. The scanning line pitch interval adjustment is performed by rotating the light source means around the optical axis with the center of a line segment connecting two light emitting points farthest apart as a rotation center. A scanning line pitch interval adjusting method of the scanning optical device according to Item.
JP2005211309A 2005-07-21 2005-07-21 Method for adjusting scanning line pitch interval of scanning optical device Expired - Fee Related JP5127122B2 (en)

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JP5228329B2 (en) 2007-02-07 2013-07-03 日本電気株式会社 Thin acoustic component mounting structure, portable acoustic device, mobile phone, thin acoustic component mounting method
JP4822542B2 (en) * 2007-03-14 2011-11-24 株式会社リコー Optical scanning apparatus and image forming apparatus
JP2008262125A (en) * 2007-04-13 2008-10-30 Ricoh Co Ltd Light source apparatus, optical scanner and image forming apparatus
JP4891146B2 (en) * 2007-05-09 2012-03-07 株式会社リコー Optical scanning apparatus and image forming apparatus
CN101676112B (en) 2008-09-17 2013-03-06 株式会社理光 Optical scanning device
JP2013174722A (en) * 2012-02-24 2013-09-05 Sharp Corp Adjustment method of optical scanner, and adjustment device of optical scanner

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