JP2007028509A5 - - Google Patents
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- JP2007028509A5 JP2007028509A5 JP2005211309A JP2005211309A JP2007028509A5 JP 2007028509 A5 JP2007028509 A5 JP 2007028509A5 JP 2005211309 A JP2005211309 A JP 2005211309A JP 2005211309 A JP2005211309 A JP 2005211309A JP 2007028509 A5 JP2007028509 A5 JP 2007028509A5
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- scanning
- scanned
- scanning line
- pitch interval
- light beams
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- 230000003287 optical Effects 0.000 claims 12
- 238000003384 imaging method Methods 0.000 claims 6
- 238000005259 measurement Methods 0.000 claims 1
Claims (8)
該被走査面を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定し、その結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。 A plurality of light beams emitted from each light emitting point of a light source unit having three or more light emitting points arranged linearly at a predetermined interval are deflected by the deflecting unit, and the plurality of light beams deflected by the deflecting unit Is imaged on the surface to be scanned by the imaging optical system, and the surface to be scanned is scanned with a plurality of light beams in the main scanning direction by the deflection operation of the deflecting means.
Among the plurality of scanning lines that scan the surface to be scanned, the distance between two scanning lines that are the farthest in the sub-scanning direction is measured by the measuring means, and the scanning line pitch interval in the sub-scanning direction is adjusted based on the result. A method for adjusting a scanning line pitch interval of a scanning optical device .
該被走査面を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定し、その結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。 A sequence of light emitting points in which n (n is an integer of 3 or more) light emitting points are linearly arranged at a predetermined interval, and m (m is an integer of 2 or more) is arranged in a direction orthogonal to the straight line. deflecting the plurality of light beams emitted from the light source means with deflection means, a plurality of light beams deflected by said deflecting means in the imaging optical system is focused on the surface to be scanned by the deflecting operation of said deflecting means When scanning the surface to be scanned in the main scanning direction with a plurality of light beams,
Among the plurality of scanning lines that scan the surface to be scanned, the distance between two scanning lines that are the farthest in the sub-scanning direction is measured by the measuring means, and the scanning line pitch interval in the sub-scanning direction is adjusted based on the result. A method for adjusting a scanning line pitch interval of a scanning optical device .
該被走査面上を走査する複数の走査線の中で、副走査方向に最も離間した2本の走査線の間隔を測定手段で測定する第1工程と、
i列目(i=1,2,・・・,m−1)のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線の中で、i+1列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線に最も近い走査線と、i+1列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線の中で、i列目のn個の発光点から発せられたn本の光束によって該被走査面上を走査するときのn本の走査線に最も近い走査線との間隔を測定手段で測定する第2工程とを有し、
該第1、第2工程での測定の結果に基づき副走査方向の走査線ピッチ間隔を調整することを特徴とする走査光学装置の走査線ピッチ間隔調整方法。 A sequence of light emitting points in which n (n is an integer of 3 or more) light emitting points are linearly arranged at a predetermined interval, and m (m is an integer of 2 or more) is arranged in a direction orthogonal to the straight line. deflecting the plurality of light beams emitted from the light source means with deflection means, a plurality of light beams deflected by said deflecting means in the imaging optical system is focused on the surface to be scanned by the deflecting operation of said deflecting means When scanning the surface to be scanned in the main scanning direction with a plurality of light beams,
A first step of measuring a distance between two scanning lines farthest in the sub-scanning direction among a plurality of scanning lines scanning the surface to be scanned by a measuring unit;
Among the n scanning lines when the surface to be scanned is scanned with n light beams emitted from n light emitting points in the i-th column (i = 1, 2,..., m−1). Thus, the scanning line closest to the n scanning lines when the surface to be scanned is scanned with the n light beams emitted from the n light emitting points in the i + 1 column and the n light emission in the i + 1 column. Of the n scanning lines when scanning the surface to be scanned with n light beams emitted from a point, the n light beams emitted from n light emitting points in the i-th column are scanned with the light beam. A second step of measuring the distance from the scanning line closest to the n scanning lines when scanning on the surface with the measuring means,
First, the scanning line pitch interval adjusting method of a scanning optical apparatus and adjusting the sub-scanning direction of the scanning line pitch on the basis of the results of the measurements in the second step.
2/3×(Pn−1)×25.4/A<L<4/3×(Pn−1)×25.4/A
但し、Pn=n×m
を満足するように走査線ピッチ間隔を調整することを特徴とする請求項1乃至4の何れか1項に記載の走査光学装置の走査線ピッチ間隔調整方法。 On the surface to be scanned, the distance between two scanning lines that are most separated in the sub-scanning direction is L (mm), the number of scanning lines is Pn, and the pixel density in the sub-scanning direction on the surface to be scanned is A (dot / inch) over the entire scanning effective width,
2/3 × (Pn−1) × 25.4 / A <L <4/3 × (Pn−1) × 25.4 / A
However, Pn = n × m
5. The method of adjusting a scanning line pitch interval of a scanning optical device according to claim 1, wherein the scanning line pitch interval is adjusted so as to satisfy the above.
0.9L/(mn−1)<(L−am(n−1)sinθ)/(m−1)<1.1L/(mn−1)
を満足するように前記走査線ピッチ間隔を調整することを特徴とする請求項2又は3に記載の走査光学装置の走査線ピッチ間隔調整方法。 On the surface to be scanned, an interval between two scanning lines that are most separated in the sub-scanning direction is L (mm), and an imaging point that draws the first scanning line at the same time is adjacent to the first scanning line. The angle formed between the second scanning line and the straight line connecting the two scanning lines and the imaging point is θ, and the imaging point drawing the first scanning line at the same time is adjacent to the first scanning line. When the length of the straight line connecting the image forming point that draws the scanning line is a,
0.9L / (mn-1) <(L-am (n-1) sin θ) / (m-1) <1.1L / (mn-1)
4. The scanning line pitch interval adjusting method for a scanning optical apparatus according to claim 2, wherein the scanning line pitch interval is adjusted so as to satisfy the above.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005211309A JP5127122B2 (en) | 2005-07-21 | 2005-07-21 | Method for adjusting scanning line pitch interval of scanning optical device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005211309A JP5127122B2 (en) | 2005-07-21 | 2005-07-21 | Method for adjusting scanning line pitch interval of scanning optical device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007028509A JP2007028509A (en) | 2007-02-01 |
JP2007028509A5 true JP2007028509A5 (en) | 2008-09-04 |
JP5127122B2 JP5127122B2 (en) | 2013-01-23 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2005211309A Expired - Fee Related JP5127122B2 (en) | 2005-07-21 | 2005-07-21 | Method for adjusting scanning line pitch interval of scanning optical device |
Country Status (1)
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JP (1) | JP5127122B2 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5228329B2 (en) | 2007-02-07 | 2013-07-03 | 日本電気株式会社 | Thin acoustic component mounting structure, portable acoustic device, mobile phone, thin acoustic component mounting method |
JP4822542B2 (en) * | 2007-03-14 | 2011-11-24 | 株式会社リコー | Optical scanning apparatus and image forming apparatus |
JP2008262125A (en) * | 2007-04-13 | 2008-10-30 | Ricoh Co Ltd | Light source apparatus, optical scanner and image forming apparatus |
JP4891146B2 (en) * | 2007-05-09 | 2012-03-07 | 株式会社リコー | Optical scanning apparatus and image forming apparatus |
CN101676112B (en) | 2008-09-17 | 2013-03-06 | 株式会社理光 | Optical scanning device |
JP2013174722A (en) * | 2012-02-24 | 2013-09-05 | Sharp Corp | Adjustment method of optical scanner, and adjustment device of optical scanner |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH09251137A (en) * | 1996-03-15 | 1997-09-22 | Konica Corp | Laser recorder |
JP3687290B2 (en) * | 1997-08-05 | 2005-08-24 | 富士ゼロックス株式会社 | Multi-spot image forming apparatus |
JPH11174353A (en) * | 1997-12-08 | 1999-07-02 | Canon Inc | Multibeam scanning optical device |
JP2002189182A (en) * | 1999-11-30 | 2002-07-05 | Ricoh Co Ltd | Multi-beam light source device |
JP4358967B2 (en) * | 2000-03-31 | 2009-11-04 | 株式会社リコー | Optical scanning device |
JP2002277776A (en) * | 2001-03-16 | 2002-09-25 | Ricoh Co Ltd | Image forming device |
JP2004126482A (en) * | 2002-08-01 | 2004-04-22 | Ricoh Co Ltd | Multiple-beam light source device and multiple-beam scanning device |
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2005
- 2005-07-21 JP JP2005211309A patent/JP5127122B2/en not_active Expired - Fee Related
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