JP2006329920A5 - - Google Patents

Download PDF

Info

Publication number
JP2006329920A5
JP2006329920A5 JP2005156950A JP2005156950A JP2006329920A5 JP 2006329920 A5 JP2006329920 A5 JP 2006329920A5 JP 2005156950 A JP2005156950 A JP 2005156950A JP 2005156950 A JP2005156950 A JP 2005156950A JP 2006329920 A5 JP2006329920 A5 JP 2006329920A5
Authority
JP
Japan
Prior art keywords
sample
light sources
sample analyzer
light
analyzer according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005156950A
Other languages
Japanese (ja)
Other versions
JP2006329920A (en
JP4616079B2 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2005156950A priority Critical patent/JP4616079B2/en
Priority claimed from JP2005156950A external-priority patent/JP4616079B2/en
Publication of JP2006329920A publication Critical patent/JP2006329920A/en
Publication of JP2006329920A5 publication Critical patent/JP2006329920A5/ja
Application granted granted Critical
Publication of JP4616079B2 publication Critical patent/JP4616079B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Claims (10)

それぞれ異なる波長の光を発生する複数の光源と，試料を保持する試料保持部と，前記複数の光源から出射して前記試料保持部に保持された試料を透過した光を検出する光検出器とを有する測定部が複数並置され，
同じ測定部に属する複数の光源は，それぞれ異なる変調周波数で変調された光を同じタイミングで出射し，
少なくとも隣接する測定部に属する光源は，それぞれ異なるタイミングで発光することを特徴とする試料分析装置。 A plurality of light sources for generating light of different wavelengths, a sample holder for holding a sample, a photodetector for detecting light emitted from the plurality of light sources and transmitted through the sample held in the sample holder; A plurality of measuring units having
Multiple light sources belonging to the same measurement unit emit light modulated at different modulation frequencies at the same timing,
A sample analyzer characterized in that at least light sources belonging to adjacent measuring units emit light at different timings. 請求項１記載の試料分析装置において，各測定部に属する複数の光源が発生する波長の組み合わせが同一であることを特徴とする試料分析装置。 2. The sample analyzer according to claim 1 , wherein a combination of wavelengths generated by a plurality of light sources belonging to each measurement unit is the same. 請求項１記載の試料分析装置において，異なる測定部に属する光源は，それぞれ異なるタイミングで発光することを特徴とする試料分析装置。 2. The sample analyzer according to claim 1, wherein light sources belonging to different measurement units emit light at different timings. 請求項１記載の試料分析装置において，相互に隣接する所定数の測定部に属する光源は，それぞれ異なるタイミングで発光することを特徴とする試料分析装置。 2. The sample analyzer according to claim 1, wherein light sources belonging to a predetermined number of measurement units adjacent to each other emit light at different timings. 請求項１記載の試料分析装置において，複数の電極が設置された基板と，前記複数の電極に選択的に電圧を印加する電圧印加手段とを備える試料搬送路を有し，前記各測定部の試料保持部は，前記搬送路上に設定されることを特徴とする試料分析装置。 The sample analyzer according to claim 1 , further comprising: a sample transport path including a substrate on which a plurality of electrodes are installed, and a voltage applying unit that selectively applies a voltage to the plurality of electrodes. A sample analyzer, wherein the sample holder is set on the transport path. それぞれ異なる波長の光を発生する複数の光源と，試料を保持する試料保持部と，前記試料保持部に保持された試料を透過した前記複数の光源からの光を検出する光検出器とを備える測定部が複数並置され，
一つの測定部に属する複数の光源及び少なくとも当該測定部に隣接する測定部に属する複数の光源は，それぞれ異なる変調周波数で変調された光を出射することを特徴とする試料分析装置。 A plurality of light sources that generate light of different wavelengths, a sample holding unit that holds a sample, and a photodetector that detects light from the plurality of light sources that has passed through the sample held in the sample holding unit Multiple measuring units are juxtaposed,
A sample analyzer, wherein a plurality of light sources belonging to one measurement unit and at least a plurality of light sources belonging to a measurement unit adjacent to the measurement unit emit light modulated at different modulation frequencies. 請求項６記載の試料分析装置において，前記複数の測定部が備える複数の光源は，それぞれ異なる変調周波数で変調された光を出射することを特徴とする試料分析装置。 7. The sample analyzer according to claim 6 , wherein the plurality of light sources provided in the plurality of measuring units emit light modulated at different modulation frequencies. 請求項６記載の試料分析装置において，相互に隣接する所定数の測定部に属する複数の光源は，それぞれ異なる変調周波数で変調された光を出射することを特徴とする試料分析装置。 7. The sample analyzer according to claim 6 , wherein a plurality of light sources belonging to a predetermined number of measurement units adjacent to each other emit light modulated at different modulation frequencies. 請求項６記載の試料分析装置において，複数の電極が設置された基板と，前記複数の電極に選択的に電圧を印加する電圧印加手段とを備える試料搬送路を有し，前記各測定部の試料保持部は，前記搬送路上に設定されることを特徴とする試料分析装置。 7. The sample analyzer according to claim 6 , further comprising a sample transport path including a substrate on which a plurality of electrodes are installed, and a voltage applying unit that selectively applies a voltage to the plurality of electrodes. A sample analyzer, wherein the sample holder is set on the transport path. 請求項６記載の試料分析装置において，前記測定部は二次元的にマトリックス配列されていることを特徴とする試料分析装置。 7. The sample analyzer according to claim 6 , wherein the measurement units are two-dimensionally arranged in a matrix.
JP2005156950A 2005-05-30 2005-05-30 Sample analyzer Expired - Fee Related JP4616079B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005156950A JP4616079B2 (en) 2005-05-30 2005-05-30 Sample analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005156950A JP4616079B2 (en) 2005-05-30 2005-05-30 Sample analyzer

Publications (3)

Publication Number Publication Date
JP2006329920A JP2006329920A (en) 2006-12-07
JP2006329920A5 true JP2006329920A5 (en) 2008-01-24
JP4616079B2 JP4616079B2 (en) 2011-01-19

Family

ID=37551742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005156950A Expired - Fee Related JP4616079B2 (en) 2005-05-30 2005-05-30 Sample analyzer

Country Status (1)

Country Link
JP (1) JP4616079B2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2007097257A1 (en) * 2006-02-23 2009-07-16 コニカミノルタエムジー株式会社 Inspection device using microchip
JP2008020380A (en) * 2006-07-14 2008-01-31 Aloka Co Ltd Absorbance measuring instrument
JP4910949B2 (en) * 2007-08-29 2012-04-04 株式会社島津製作所 Method for analyzing samples in liquid
KR101202648B1 (en) * 2011-07-22 2012-11-19 (주)대경산업 Digital reader for urin detection
JP2014092485A (en) * 2012-11-05 2014-05-19 Sharp Corp Component detector
US9395346B2 (en) * 2013-11-18 2016-07-19 Zoetis Services Llc Non-contact egg identification system for determining egg viability, and associated method
JP6920887B2 (en) * 2017-06-02 2021-08-18 浜松ホトニクス株式会社 Optical measuring device and optical measuring method
WO2022153753A1 (en) 2021-01-13 2022-07-21 株式会社日立ハイテク Automatic analysis device and automatic analysis method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2561404B1 (en) * 1984-03-16 1988-04-08 Thomson Csf ELECTRICALLY CONTROLLED DEVICE FOR MOVING A FLUID
JPH0619351B2 (en) * 1985-07-23 1994-03-16 和光純薬工業株式会社 Latex agglutination reaction measuring device
JP3515646B2 (en) * 1995-09-18 2004-04-05 大塚電子株式会社 Multi-capillary electrophoresis device
JP3791999B2 (en) * 1997-03-24 2006-06-28 株式会社アドバンス Liquid particle handling equipment
JPH1137931A (en) * 1997-07-14 1999-02-12 Tokimec Inc Absorptiometer
US7147763B2 (en) * 2002-04-01 2006-12-12 Palo Alto Research Center Incorporated Apparatus and method for using electrostatic force to cause fluid movement
JP4087776B2 (en) * 2003-10-27 2008-05-21 Ｊｆｅアドバンテック株式会社 Liquid concentration measuring device

Similar Documents

Publication Publication Date Title
JP2006329920A5 (en)
DE602005000749D1 (en) Fluorescence imaging by means of telecentric excitation and imaging optics
ATE359500T1 (en) FLUORESCENCE IMAGING USING TELECENTRICITY
JP2017118872A5 (en)
JP2013178254A5 (en)
EP1830174A3 (en) Multi-channel fluorescence measuring optical system and multi-channel fluorescence sample analyzer
ATE474718T1 (en) DIRECT ENGRAVING OF FLEXO PRINTING PLATES
TW200730944A (en) Planar light source device
BRPI0702562A2 (en) apparatus for producing surface tension, and method for testing a surface with the apparatus
TW200725118A (en) Surface light source device and display device using same
DE602006015043D1 (en) MULTIPLEX FLUORESCENT DETECTION DEVICE WITH REMOVABLE OPTICAL MODULES
CA2504545A1 (en) Full width array scanning spectrophotometer
EA200801617A1 (en) METHOD AND DEVICE FOR MEASURING SURFACE MOVEMENT
ATE336721T1 (en) HIGH-THROUGHPUT ASSAY TO MEASURE CELLULAR RESPONSES USING MICROARRAYS
ATE503996T1 (en) SURFACE ANALYSIS OF AN ELONGATED OBJECT
US20180199409A1 (en) Optical detection device, its method for operating and computer program
BR112014016019A2 (en) analyte monitor
JP2018525649A5 (en)
ATE498690T1 (en) HEAT-INDUCABLE TETRAHYMENA PROMOTORS AND USE THEREOF
JP2009532687A5 (en)
JP2004191232A (en) Calibration method for light quantity detector, and luminous energy measuring instrument
DE602006000227D1 (en) Electrode substrate, detection device with the substrate, kit with the detection device and detection method using the kit
JP2019502126A5 (en)
ATE445854T1 (en) METHOD AND DEVICE FOR READING X-RAY INFORMATION STORED IN A FLUORESCENT STORAGE PLATE
WO2009131333A3 (en) Illuminator, backlight unit comprising the illuminator and display device using the backlight unit