JP2006313827A - Method of manufacturing thin film device and electronic apparatus - Google Patents

Method of manufacturing thin film device and electronic apparatus Download PDF

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JP2006313827A
JP2006313827A JP2005135922A JP2005135922A JP2006313827A JP 2006313827 A JP2006313827 A JP 2006313827A JP 2005135922 A JP2005135922 A JP 2005135922A JP 2005135922 A JP2005135922 A JP 2005135922A JP 2006313827 A JP2006313827 A JP 2006313827A
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substrate
transfer
thin film
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manufacturing
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Yasuaki Kodaira
泰明 小平
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Seiko Epson Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To reduce the transfer failure in forming of devices using the transfer technology. <P>SOLUTION: The thin film device manufacturing method comprises a first step of forming a transferring object (14) on one surface of a first substrate (10) having a peel layer (12) on the one surface, a second step of bonding a second substrate (16) to the first substrate (10) by inserting an adhesive material (18) between the one surface of the first substrate and one surface of the second substrate, a third step of giving an energy to the peel layer of the first substrate to peel the interface of the peel layer and the first substrate or in the peel layer, and a fourth step of transferring the transferring object (14) to the second substrate from the first substrate after separating the first substrate and the second substrate. The first substrate uses a more flexible substrate than the second substrate. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、転写技術を用いて薄膜素子や薄膜回路等の薄膜デバイスを製造する技術の改良に関する。   The present invention relates to an improvement in a technique for manufacturing a thin film device such as a thin film element or a thin film circuit using a transfer technique.

薄膜デバイスの製造方法として転写技術を用いる手法が知られている。例えば、特開平10−125929号公報(特許文献1)や特開平10−125930号公報(特許文献2)には、予め転写元基板上に剥離層を介して薄膜トランジスタ等の被転写体を形成しておき、その後被転写体を転写先基板に接合し、剥離層に光照射等を行って剥離を生じさせることにより、被転写体を転写先基板に転写する手法が開示されている。また、転写元基板から転写先基板へと被転写体を移動させる過程において、一旦、転写元基板から仮転写基板へ被転写体を転写し、その後に仮転写基板から転写先基板へと被転写体を転写する2回転写プロセスも知られている。これらの手法によれば、製造条件の異なる複数種類の薄膜素子や薄膜回路等をそれぞれ最適な条件で転写元基板上に形成した後に、転写先基板へ移動させることにより、所望の電子デバイスを製造することができる。特に、2回転写プロセスを採用した場合には、初めに転写元基板上に形成した被転写体と転写先基板へ最終的に転写された被転写体とで上下方向が逆とならずにすむ利点がある。   A technique using a transfer technique is known as a method for manufacturing a thin film device. For example, in Japanese Patent Application Laid-Open No. 10-125929 (Patent Document 1) and Japanese Patent Application Laid-Open No. 10-125930 (Patent Document 2), a transfer body such as a thin film transistor is previously formed on a transfer source substrate via a release layer. A method is disclosed in which the transfer target is transferred to the transfer destination substrate by bonding the transfer target to the transfer destination substrate and then irradiating the release layer with light or the like to cause peeling. In addition, in the process of moving the transfer object from the transfer source substrate to the transfer destination substrate, the transfer object is once transferred from the transfer source substrate to the temporary transfer substrate, and then transferred from the temporary transfer substrate to the transfer destination substrate. Two-time transfer processes that transfer the body are also known. According to these methods, a desired electronic device can be manufactured by forming multiple types of thin film elements and thin film circuits with different manufacturing conditions on the transfer source substrate under optimum conditions and then moving them to the transfer destination substrate. can do. In particular, when a two-time transfer process is employed, the up-down direction does not have to be reversed between the transfer target formed on the transfer source substrate and the transfer target finally transferred to the transfer destination substrate. There are advantages.

特開平10−125929号公報Japanese Patent Laid-Open No. 10-125929 特開平10−125930号公報JP-A-10-125930

上述した転写技術を用いたプロセスでは、被転写体の転写時において各基板の双方又はいずれかに割れや亀裂等の損傷が生じ、被転写体が所望状態に転写されない状況、すなわち転写不良が発生する場合があった。また、同様な転写不良は、各基板に損傷が生じない場合においても発生する場合があった。このため、転写不良を低減させるための技術改良が望まれていた。   In the process using the transfer technology described above, when transferring the transfer object, damage such as cracks or cracks occurs on both or either of the substrates, and the transfer object is not transferred to the desired state, that is, transfer failure occurs. There was a case. Further, the same transfer failure may occur even when each substrate is not damaged. For this reason, an improvement in technology for reducing transfer defects has been desired.

そこで、本発明は、転写技術を用いてデバイス形成を行う場合において、転写不良を低減することが可能な技術を提供することを目的とする。   Therefore, an object of the present invention is to provide a technique capable of reducing transfer defects when a device is formed using a transfer technique.

第1の態様の本発明は、一方面側に剥離層を有する第1基板の当該一方面側に被転写体を形成する第1工程と、第2基板の一方面と上記第1基板の一方面との相互間に接着材を介在させることによって上記第1基板と上記第2基板とを接合する第2工程と、上記第1基板の上記剥離層にエネルギーを付与することによって当該剥離層と上記第1基板との界面又は当該剥離層層内に剥離を生じさせる第3工程と、上記第1基板と上記第2基板とを分離し、上記被転写体を上記第1基板から上記第2基板へ転写する第4工程と、を含み、上記第1基板として上記第2基板よりも撓みやすいものが用いられる、薄膜デバイスの製造方法である。   According to the first aspect of the present invention, there is provided a first step of forming a transfer target on the one side of the first substrate having a release layer on one side, one side of the second substrate, and one of the first substrates. A second step of bonding the first substrate and the second substrate by interposing an adhesive between them and the release layer; and applying the energy to the release layer of the first substrate; Separating the first substrate and the second substrate from the third step for causing separation at the interface with the first substrate or in the release layer, and separating the transferred object from the first substrate to the second substrate. And a fourth step of transferring to the substrate, wherein the first substrate is more flexible than the second substrate.

ここで、本発明における「被転写体」とは、薄膜素子、薄膜回路、微細構造体、機能性薄膜など各種の薄膜デバイスを含む。より具体的には、被転写体としては、薄膜トランジスタ、薄膜ダイオード、その他の薄膜半導体素子、当該半導体素子を含んで構成される薄膜回路、太陽電池やイメージセンサ等に用いられる光電変換素子、スイッチング素子、メモリ、圧電素子等のアクチュエータ、マイクロミラー(ピエゾ薄膜セラミックス)、磁気記録媒体、光磁気記録媒体、光記録媒体等の記録媒体、磁気記録ヘッド、コイル、インダクタ、薄膜高透磁材料およびそれらを組み合わせたマイクロ磁気デバイス、フィルタ、反射膜、ダイクロックミラー、偏光素子等の光学薄膜、半導体薄膜、超伝導薄膜(例えばYBCO薄膜)、磁性薄膜、金属多層薄膜、金属セラミック多層薄膜、金属半導体多層薄膜、セラミック半導体多層薄膜、有機薄膜と他の物質の多層薄膜等が挙げられる。   Here, the “transfer object” in the present invention includes various thin film devices such as a thin film element, a thin film circuit, a fine structure, and a functional thin film. More specifically, the transferred object includes a thin film transistor, a thin film diode, other thin film semiconductor elements, a thin film circuit including the semiconductor element, a photoelectric conversion element used for a solar cell, an image sensor, and a switching element. , Actuators such as memory, piezoelectric elements, micromirrors (piezo thin film ceramics), magnetic recording media, magneto-optical recording media, recording media such as optical recording media, magnetic recording heads, coils, inductors, thin-film highly permeable materials and the like Combined micro magnetic devices, filters, reflective films, dichroic mirrors, polarizing elements, etc. optical thin films, semiconductor thin films, superconducting thin films (eg YBCO thin films), magnetic thin films, metal multilayer thin films, metal ceramic multilayer thin films, metal semiconductor multilayer thin films Ceramic semiconductor multilayer thin film, organic thin film and multilayer thin film of other materials, etc. It is below.

かかる製造方法によれば、取り去られるべき基板である第1基板の方が撓みやすい状況としておくことにより、各基板の損傷等が生じることを回避し、転写不良の発生を低減することが可能となる。   According to such a manufacturing method, it is possible to avoid occurrence of damage and the like and to reduce the occurrence of transfer failure by setting the first substrate, which is the substrate to be removed, to be more easily bent. Become.

上述した第1基板が第2基板よりも撓みやすい状態を実現する具体的な態様としては以下のようなものがある。例えば、第1基板と第2基板とが同じ構成材料からなる場合には、第1基板の板厚を第2基板の板厚よりも薄くするとよい。また、第1基板の構成材料として、第2基板の構成材料よりも弾性率の小さいものを採用してもよい。   Specific modes for realizing a state in which the first substrate described above is more easily bent than the second substrate include the following. For example, when the first substrate and the second substrate are made of the same constituent material, the thickness of the first substrate may be made thinner than the thickness of the second substrate. Moreover, you may employ | adopt as a constituent material of a 1st board | substrate a smaller elastic modulus than the constituent material of a 2nd board | substrate.

これらによれば、第1基板が第2基板よりも撓みやすい状態を容易に実現することができる。   According to these, it is possible to easily realize a state in which the first substrate is more easily bent than the second substrate.

また、上述した第4工程においては、第2基板を真空吸着等の方法によって固定しつつ、第1基板に対して外力を加えることによって両基板の分離が行われることが好ましい。   In the fourth step described above, it is preferable that the two substrates are separated by applying an external force to the first substrate while fixing the second substrate by a method such as vacuum suction.

これにより、各基板に損傷が生じるのをより確実に回避することが可能となる。   Thereby, it is possible to more reliably avoid the occurrence of damage to each substrate.

第2の態様の本発明は、上述した製造方法によって製造される薄膜デバイスを含んで構成される電子機器である。ここで「電子機器」とは、回路基板やその他の要素を備え、一定の機能を奏する機器一般をいい、その構成に特に限定はない。かかる電子機器としては、例えば、ICカード、携帯電話、ビデオカメラ、パーソナルコンピュータ、ヘッドマウントディスプレイ、リア型またはフロント型のプロジェクター、テレビジョン、ロールアップ式テレビジョン、さらに表示機能付きファックス装置、デジタルカメラのファインダ、携帯型TV、DSP装置、PDA、電子手帳、電光掲示盤、宣伝公告用ディスプレイ等が含まれる。   The second aspect of the present invention is an electronic apparatus including the thin film device manufactured by the manufacturing method described above. Here, the “electronic device” means a general device having a circuit board and other elements and having a certain function, and there is no particular limitation on its configuration. Such electronic devices include, for example, IC cards, mobile phones, video cameras, personal computers, head mounted displays, rear or front projectors, televisions, roll-up televisions, fax machines with display functions, and digital cameras. Finder, portable TV, DSP device, PDA, electronic notebook, electric bulletin board, display for advertisement announcement, and the like.

以下、本発明の実施の形態について図面を参照しながら説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

図1及び図2は、一実施形態の薄膜デバイスの製造方法について説明する図である。図3は、被転写体(詳細は後述)の具体例を示す断面図である。図4は、各基板を分離する工程(詳細は後述)について詳細に説明する図である。本実施形態では、予め転写元基板上に形成した被転写体を一旦、仮転写基板によって保持した後に転写先基板へ移動させる2回転写プロセスについて説明する。なお、本実施形態においては、転写元基板が「第1基板」に相当し、仮転写基板が「第2基板」に相当する。   1 and 2 are diagrams illustrating a method for manufacturing a thin film device according to an embodiment. FIG. 3 is a cross-sectional view showing a specific example of a transfer target (details will be described later). FIG. 4 is a diagram for explaining in detail a process of separating each substrate (details will be described later). In the present embodiment, a two-time transfer process in which a transfer target formed in advance on a transfer source substrate is temporarily held by a temporary transfer substrate and then moved to a transfer destination substrate will be described. In this embodiment, the transfer source substrate corresponds to a “first substrate”, and the temporary transfer substrate corresponds to a “second substrate”.

まず、図1(A)に示すように、転写元基板10の一方面側に剥離層12を形成し、更にこの剥離層12の上側に被転写体14を形成する。被転写体14は、例えば図3に示すように複数の薄膜素子(例えば薄膜トランジスタT)や配線などを含んで構成されるものである。ここで、本工程における転写元基板10としては、適度な厚さを有し、石英ガラスやソーダガラス等の耐熱性材料、例えば半導体装置のプロセス温度である350℃〜1000℃程度に耐えうるものが用いられる。また、転写元基板10は、後の工程で剥離層12に対するエネルギーの付与を光照射によって行うことが可能となるように、当該光の波長に対して透明であることが望ましい。また、剥離層12としては、光照射などのエネルギー付与を受けることによって剥離を生じる特性を有するものが用いられる。このような剥離層12は、例えばアモルファスシリコン膜等の半導体膜、金属膜、導電性の酸化物膜、導電性の高分子膜又は導電性のセラミックスなどによって形成することが可能である。   First, as shown in FIG. 1A, a release layer 12 is formed on one side of the transfer source substrate 10, and a transfer body 14 is formed on the release layer 12. For example, as illustrated in FIG. 3, the transfer target 14 includes a plurality of thin film elements (for example, thin film transistors T), wirings, and the like. Here, the transfer source substrate 10 in this step has an appropriate thickness and can withstand a heat-resistant material such as quartz glass or soda glass, for example, about 350 ° C. to 1000 ° C. which is a process temperature of a semiconductor device. Is used. The transfer source substrate 10 is desirably transparent to the wavelength of the light so that energy can be applied to the release layer 12 by light irradiation in a later step. Moreover, as the peeling layer 12, what has the characteristic which produces peeling by receiving energy provision, such as light irradiation, is used. Such a release layer 12 can be formed of, for example, a semiconductor film such as an amorphous silicon film, a metal film, a conductive oxide film, a conductive polymer film, or a conductive ceramic.

次に、図1(B)に示すように、仮転写基板16の一方面と転写元基板10の一方面との相互間に水溶性接着材18を介在させることによって、仮転写基板16と転写元基板10とを接合する。本実施形態では、仮転写基板16としても石英ガラスやソーダガラス等のガラス基板を用いる。   Next, as shown in FIG. 1B, the temporary transfer substrate 16 and the transfer surface are transferred by interposing a water-soluble adhesive 18 between the one surface of the temporary transfer substrate 16 and the one surface of the transfer source substrate 10. The original substrate 10 is bonded. In the present embodiment, a glass substrate such as quartz glass or soda glass is used as the temporary transfer substrate 16.

次に、図1(C)に示すように、転写元基板10の剥離層12にエネルギーを付与することによって当該剥離層12と転写元基板10との界面又は剥離層層内に剥離を生じさせる。具体的には、図示のように転写元基板10を介して剥離層12にレーザ光を照射して当該剥離層12にレーザアブレーションを生じさせる。アブレーションとは、照射される光を吸収した固体材料(剥離層12の構成材料)が光化学的または熱的に励起され、その表面や内部の原子または分子の結合が切断されて放出される状態であり、主に、剥離層12の構成材料の全部または一部が溶融、蒸散(気化)等の相変化を生じる現象として現れる。また、相変化によって微小な発泡状態となり、結合力が低下することもある。   Next, as shown in FIG. 1C, energy is applied to the release layer 12 of the transfer source substrate 10 to cause peeling at the interface between the release layer 12 and the transfer source substrate 10 or in the release layer layer. . Specifically, as shown in the figure, the release layer 12 is irradiated with laser light through the transfer source substrate 10 to cause laser ablation in the release layer 12. Ablation is a state in which a solid material that absorbs irradiated light (a constituent material of the release layer 12) is photochemically or thermally excited, and its surface and internal atomic or molecular bonds are cut and released. In general, all or part of the constituent material of the release layer 12 appears as a phenomenon that causes a phase change such as melting and transpiration (vaporization). In addition, a phase change may result in a fine foamed state, which may reduce the bonding force.

次に、図1(D)に示すように、転写元基板10と仮転写基板14とを分離する。これにより、被転写体14が転写元基板10から仮転写基板16へ転写される。   Next, as shown in FIG. 1D, the transfer source substrate 10 and the temporary transfer substrate 14 are separated. As a result, the transfer target 14 is transferred from the transfer source substrate 10 to the temporary transfer substrate 16.

図4は、各基板(転写元基板10と仮転写基板14)を分離する工程について詳細に説明する部分拡大図である。上述したように本実施形態では、転写元基板10と仮転写基板16はともにガラスを構成材料としている。そして、図4に示すように、転写元基板10の板厚L1を仮転写基板16の板厚L2よりも薄くすることにより、転写元基板10が仮転写基板16よりも撓みやすい状態を実現している。また、本工程においては、仮転写基板16を真空吸着等の方法によって固定しつつ、転写元基板10に対して外力Fを加えることによって両基板の分離が行われる。   FIG. 4 is a partially enlarged view for explaining in detail a process of separating each substrate (transfer source substrate 10 and temporary transfer substrate 14). As described above, in this embodiment, both the transfer source substrate 10 and the temporary transfer substrate 16 are made of glass. Then, as shown in FIG. 4, by making the plate thickness L1 of the transfer source substrate 10 thinner than the plate thickness L2 of the temporary transfer substrate 16, a state in which the transfer source substrate 10 is more easily bent than the temporary transfer substrate 16 is realized. ing. Further, in this step, the two substrates are separated by applying an external force F to the transfer source substrate 10 while fixing the temporary transfer substrate 16 by a method such as vacuum suction.

なお、転写元基板10の構成材料として、仮転写基板16の構成材料よりも弾性率の小さいものを採用することによっても、転写元基板10が仮転写基板16よりも撓みやすい状態を容易に実現することができる。更に、板厚の増減と構成材料の選択とを組み合わせて、転写元基板10の撓み具合を調整してもよい。   In addition, by adopting a material having a lower elastic modulus than that of the temporary transfer substrate 16 as a constituent material of the transfer source substrate 10, a state in which the transfer source substrate 10 is more easily bent than the temporary transfer substrate 16 can be easily realized. can do. Further, the degree of bending of the transfer source substrate 10 may be adjusted by combining the increase / decrease of the plate thickness and the selection of the constituent materials.

次に、図2(A)に示すように、仮転写基板16の一方面と転写先基板20の一方面との相互間に接着材22を介在させることによって、仮転写基板16と転写先基板20とを接合する。本工程において用いられる接着材22としては、アクリレート樹脂系やエポキシ樹脂系の接着材などが挙げられる。   Next, as shown in FIG. 2A, the temporary transfer substrate 16 and the transfer destination substrate are interposed by interposing an adhesive 22 between one surface of the temporary transfer substrate 16 and one surface of the transfer destination substrate 20. 20 is joined. Examples of the adhesive 22 used in this step include acrylate resin-based and epoxy resin-based adhesives.

次に、図2(B)に示すように、水溶性接着材18に溶解用液体としての水を供給することにより、当該水溶性接着材18を溶解、除去する。これにより、被転写体14が仮転写基板16から転写先基板20へ転写される。   Next, as shown in FIG. 2B, the water-soluble adhesive 18 is dissolved and removed by supplying water as a dissolving liquid to the water-soluble adhesive 18. As a result, the transfer target 14 is transferred from the temporary transfer substrate 16 to the transfer destination substrate 20.

このように本実施形態によれば、取り去られるべき基板である転写元基板10の方が仮転写基板16よりも撓みやすい状況としておくことにより、各基板の損傷等が生じることを回避し、転写不良の発生を低減することが可能となる。   As described above, according to the present embodiment, the transfer source substrate 10 which is the substrate to be removed is more easily bent than the temporary transfer substrate 16, thereby avoiding the damage of each substrate and the like. The occurrence of defects can be reduced.

次に、上述した製造方法によって製造される薄膜デバイスを備える電子機器の例について説明する。本実施形態にかかる薄膜デバイスは、各種の電子機器において、表示部を構成する液晶表示パネルやエレクトロルミネッセンス表示パネルなどの製造や、回路部の製造などに適用することができる。   Next, an example of an electronic apparatus including a thin film device manufactured by the manufacturing method described above will be described. The thin film device according to the present embodiment can be applied to the manufacture of a liquid crystal display panel, an electroluminescence display panel, and the like that constitute a display unit, a circuit unit, and the like in various electronic devices.

図5は、電子機器の例を示す概略斜視図である。図5(A)は携帯電話への適用例であり、当該携帯電話530はアンテナ部531、音声出力部532、音声入力部533、操作部534、表示部535を備えている。図5(B)はビデオカメラへの適用例であり、当該ビデオカメラ540は受像部541、操作部542、音声入力部543、表示部544を備えている。図5(C)はテレビジョン装置への適用例であり、当該テレビジョン装置550は表示部551を備えている。図5(D)はロールアップ式テレビジョン装置への適用例であり、当該ロールアップ式テレビジョン装置560は表示部561を備えている。また、本発明にかかる薄膜デバイスは、上述した例に限らず各種の電子機器に適用可能である。例えばこれらの他に、表示機能付きファックス装置、デジタルカメラのファインダ、携帯型TV、電子手帳、電光掲示盤、宣伝公告用ディスプレイなどにも活用することができる。   FIG. 5 is a schematic perspective view illustrating an example of an electronic apparatus. FIG. 5A shows an application example to a mobile phone, and the mobile phone 530 includes an antenna portion 531, an audio output portion 532, an audio input portion 533, an operation portion 534, and a display portion 535. FIG. 5B shows an application example to a video camera. The video camera 540 includes an image receiving unit 541, an operation unit 542, an audio input unit 543, and a display unit 544. FIG. 5C illustrates an example of application to a television device, and the television device 550 includes a display portion 551. FIG. 5D illustrates an application example to a roll-up television device, and the roll-up television device 560 includes a display portion 561. Further, the thin film device according to the present invention is not limited to the above-described example, and can be applied to various electronic devices. For example, in addition to these, it can also be used for a fax machine with a display function, a finder for a digital camera, a portable TV, an electronic notebook, an electric bulletin board, a display for advertisements, and the like.

なお、本発明は上述した実施形態の内容に限定されることなく、本発明の要旨の範囲内で種々に変形実施が可能である。例えば、上述した実施形態では、いわゆる2回転写プロセスにおいて転写元基板から仮転写基板へと被転写体を転写する過程に本発明を適用した場合を例示して、本発明の実施の態様を説明していたが、本発明の適用範囲はこれに限定されるものではなく、1回の転写プロセスによって被転写体の転写を完了させる場合においても適用可能である。   The present invention is not limited to the contents of the above-described embodiments, and various modifications can be made within the scope of the gist of the present invention. For example, in the above-described embodiment, the embodiment of the present invention will be described by exemplifying a case where the present invention is applied to a process of transferring a transfer object from a transfer source substrate to a temporary transfer substrate in a so-called twice transfer process. However, the application range of the present invention is not limited to this, and the present invention can also be applied to the case where the transfer of the transfer target is completed by a single transfer process.

一実施形態の薄膜デバイスの製造方法について説明する図である。It is a figure explaining the manufacturing method of the thin film device of one Embodiment. 一実施形態の薄膜デバイスの製造方法について説明する図である。It is a figure explaining the manufacturing method of the thin film device of one Embodiment. 被転写体の具体例を示す断面図である。It is sectional drawing which shows the specific example of a to-be-transferred body. 各基板を分離する工程について詳細に説明する部分拡大図である。It is the elements on larger scale explaining in detail the process of separating each substrate. 電子機器の例を示す概略斜視図である。It is a schematic perspective view which shows the example of an electronic device.

符号の説明Explanation of symbols

10…転写元基板(第1基板)、12…剥離層、14…被転写体、16…仮転写基板(第2基板)、18…水溶性接着材、20…転写先基板、22…接着材

DESCRIPTION OF SYMBOLS 10 ... Transfer source substrate (first substrate), 12 ... Release layer, 14 ... Transfer object, 16 ... Temporary transfer substrate (second substrate), 18 ... Water-soluble adhesive, 20 ... Transfer destination substrate, 22 ... Adhesive

Claims (5)

一方面側に剥離層を有する第1基板の当該一方面側に被転写体を形成する第1工程と、
第2基板の一方面と前記第1基板の一方面との相互間に接着材を介在させることによって前記第1基板と前記第2基板とを接合する第2工程と、
前記第1基板の前記剥離層にエネルギーを付与することによって当該剥離層と前記第1基板との界面又は当該剥離層層内に剥離を生じさせる第3工程と、
前記第1基板と前記第2基板とを分離し、前記被転写体を前記第1基板から前記第2基板へ転写する第4工程と、
を含み、前記第1基板として前記第2基板よりも撓みやすいものが用いられる、薄膜デバイスの製造方法。
A first step of forming a transfer body on the one surface side of the first substrate having a release layer on one surface side;
A second step of bonding the first substrate and the second substrate by interposing an adhesive between the one surface of the second substrate and the one surface of the first substrate;
A third step of causing peeling in an interface between the peeling layer and the first substrate or in the peeling layer layer by applying energy to the peeling layer of the first substrate;
A fourth step of separating the first substrate and the second substrate and transferring the transferred object from the first substrate to the second substrate;
A method for manufacturing a thin film device, wherein the first substrate is more flexible than the second substrate.
前記第1基板は、前記第2基板と同じ構成材料からなり、かつ前記第2基板よりも板厚が薄い、請求項1に記載の薄膜デバイスの製造方法。   2. The method of manufacturing a thin film device according to claim 1, wherein the first substrate is made of the same constituent material as the second substrate and is thinner than the second substrate. 前記第1基板は、前記第2基板の構成材料よりも弾性率の小さい構成材料からなる、請求項1に記載の薄膜デバイスの製造方法。   The thin film device manufacturing method according to claim 1, wherein the first substrate is made of a constituent material having a smaller elastic modulus than that of the constituent material of the second substrate. 前記第4工程は、前記第2基板を固定し、前記第1基板に対して外力を加えることによって行われる、請求項1に記載の薄膜デバイスの製造方法。   The thin film device manufacturing method according to claim 1, wherein the fourth step is performed by fixing the second substrate and applying an external force to the first substrate. 請求項1乃至4のいずれかに記載の製造方法によって製造される薄膜デバイスを含んで構成される電子機器。

The electronic device comprised including the thin film device manufactured by the manufacturing method in any one of Claims 1 thru | or 4.

JP2005135922A 2005-05-09 2005-05-09 Method of manufacturing thin film device and electronic apparatus Pending JP2006313827A (en)

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