JP2006275612A5 - - Google Patents

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Publication number
JP2006275612A5
JP2006275612A5 JP2005091990A JP2005091990A JP2006275612A5 JP 2006275612 A5 JP2006275612 A5 JP 2006275612A5 JP 2005091990 A JP2005091990 A JP 2005091990A JP 2005091990 A JP2005091990 A JP 2005091990A JP 2006275612 A5 JP2006275612 A5 JP 2006275612A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005091990A
Other languages
Japanese (ja)
Other versions
JP4518494B2 (ja
JP2006275612A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005091990A priority Critical patent/JP4518494B2/ja
Priority claimed from JP2005091990A external-priority patent/JP4518494B2/ja
Priority to TW094145474A priority patent/TWI271505B/zh
Priority to CNB200610005927XA priority patent/CN100507530C/zh
Priority to KR1020060006935A priority patent/KR100660400B1/ko
Publication of JP2006275612A publication Critical patent/JP2006275612A/ja
Publication of JP2006275612A5 publication Critical patent/JP2006275612A5/ja
Application granted granted Critical
Publication of JP4518494B2 publication Critical patent/JP4518494B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2005091990A 2005-03-28 2005-03-28 ランドパターン検査方法及び検査装置 Expired - Fee Related JP4518494B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005091990A JP4518494B2 (ja) 2005-03-28 2005-03-28 ランドパターン検査方法及び検査装置
TW094145474A TWI271505B (en) 2005-03-28 2005-12-21 Method for examining land pattern and apparatus for examining the same
CNB200610005927XA CN100507530C (zh) 2005-03-28 2006-01-19 焊盘图案检查方法以及检查装置
KR1020060006935A KR100660400B1 (ko) 2005-03-28 2006-01-23 랜드 패턴 검사 방법 및 검사 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005091990A JP4518494B2 (ja) 2005-03-28 2005-03-28 ランドパターン検査方法及び検査装置

Publications (3)

Publication Number Publication Date
JP2006275612A JP2006275612A (ja) 2006-10-12
JP2006275612A5 true JP2006275612A5 (zh) 2008-03-06
JP4518494B2 JP4518494B2 (ja) 2010-08-04

Family

ID=37030156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005091990A Expired - Fee Related JP4518494B2 (ja) 2005-03-28 2005-03-28 ランドパターン検査方法及び検査装置

Country Status (4)

Country Link
JP (1) JP4518494B2 (zh)
KR (1) KR100660400B1 (zh)
CN (1) CN100507530C (zh)
TW (1) TWI271505B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5234639B2 (ja) * 2009-01-31 2013-07-10 株式会社メガトレード スルーホールの検査装置
CN101995223B (zh) * 2009-08-25 2013-05-08 比亚迪股份有限公司 一种芯片外观检测方法及系统
CN102595024B (zh) * 2011-12-16 2014-10-22 飞狐信息技术（天津）有限公司 一种数字视频图像修复方法与装置
CN104020222B (zh) * 2014-06-18 2016-06-22 长春光华微电子设备工程中心有限公司 全自动超声波铝丝压焊机焊接质量检测系统
CN104535587A (zh) * 2014-12-23 2015-04-22 安徽科鸣三维科技有限公司 一种基于机器视觉的pcba焊点检测方法
JP6496159B2 (ja) * 2015-02-23 2019-04-03 株式会社Ｓｃｒｅｅｎホールディングス パターン検査装置およびパターン検査方法
TWI521476B (zh) * 2015-04-17 2016-02-11 銘傳大學 週期性圖案之自動光學檢測方法
CN106651989B (zh) * 2016-12-21 2020-04-21 北京信息科技大学 用于微小孔对中的嵌套圆拟合方法及装置
CN109950165B (zh) * 2019-02-19 2021-06-04 长江存储科技有限责任公司 测试结构和测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01269035A (ja) * 1988-04-21 1989-10-26 Ibiden Co Ltd プリント回路基板の検査装置
JP2001267722A (ja) * 2000-03-23 2001-09-28 Ngk Spark Plug Co Ltd プリント配線板の検査方法
JP3589424B1 (ja) * 2003-12-22 2004-11-17 株式会社メガトレード 基板検査装置

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