JP2006275575A - 結晶多形のスクリーニング方法 - Google Patents
結晶多形のスクリーニング方法 Download PDFInfo
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- JP2006275575A JP2006275575A JP2005091272A JP2005091272A JP2006275575A JP 2006275575 A JP2006275575 A JP 2006275575A JP 2005091272 A JP2005091272 A JP 2005091272A JP 2005091272 A JP2005091272 A JP 2005091272A JP 2006275575 A JP2006275575 A JP 2006275575A
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Abstract
【解決手段】アモルファス状の対象化合物の懸濁液を加圧処理もしくは減圧処理する工程を含むことを特徴とする対象化合物の結晶多形のスクリーニング方法。
【選択図】なし
Description
γ形インドメタシン結晶を約180℃で融解させた後、液体窒素中へ流し込んだ。液体窒素をデカンテーションにより除去した後、塩化カルシウムを傍らにおいて減圧条件下乾燥させた。得られたアモルファス状のインドメタシンを、セイシン企業製A−Oジェットミル(ベンチュリー圧:0.5MPa、グランディング圧1:0.5MPaおよびグランディング圧2:0.5MPa)を用いて粉砕処理し(ジェットミルへのアモルファス状のインドメタシンの供給速度は、1時間あたり30〜40gとした。)、粒子径約10μm以下の粉末を得た。得られたアモルファス状のインドメタシン粉末を粉末X線回折測定し、α晶やγ晶が検出されず、アモルファスであることを確認した。図1に、得られた粉末X線回折プロファイルを示した。
<測定条件>
装置:リガク製Rint2500V型(出力:50kV×300mA,X線Cu−Kα)
走査速度 2°/分,サンプリング幅 0.02°,走査モード:連続モード,試料採取量:約50mg
前記実施例1において、加圧条件を、400MPaに代えた以外は実施例1と同様に実施した。得られた結晶を粉末X線回折測定(測定条件は前記実施例1と同じとした。)したところ、前記結晶はα晶であることが分かった。
Claims (1)
- アモルファス状の対象化合物の懸濁液を加圧処理もしくは減圧処理する工程を含むことを特徴とする対象化合物の結晶多形のスクリーニング方法。
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JP2005502861A (ja) * | 2001-08-10 | 2005-01-27 | サイミックス テクノロジーズ, インコーポレイテッド | 事前処方物を作製および試験するための装置および方法ならびにそのためのシステム |
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JP2005502861A (ja) * | 2001-08-10 | 2005-01-27 | サイミックス テクノロジーズ, インコーポレイテッド | 事前処方物を作製および試験するための装置および方法ならびにそのためのシステム |
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