JP2006208184A - Method and apparatus for inspecting sheet to be inspected and its system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a defect inspection method highly accurately detecting hollow defects on sheets to be inspected, which have been difficult to detect by conventional devices. <P>SOLUTION: In the method for inspecting surface defects of sheets to be inspected, a sheet P to be inspected, which is being transferred, is irradiated with irradiation light from an irradiation device 20, and light reflected on the sheet P to be inspected is received by a light receiving device 40. A main light area of light irradiated to the sheet P to be inspected is shielded by a light shielding mask 50, and a region on the sheet to be inspected irradiated with light past the light shielding mask 50 is inspected. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a surface inspection method, apparatus, and system for a sheet to be inspected, and in particular, the sheet to be inspected is a transparent cover sheet used for the surface coating of a Blu-ray disc. It relates to those that detect defects.

  A transparent sheet used for the surface coating of a Blu-ray disc is formed on a base layer made of a film such as PET (polyethylene terephthalate), a magnetic layer formed on one side of the base layer, and on the other side of the base layer. The back layer etc. are comprised. It is important that such a transparent sheet exhibits a predetermined stable performance when recording data or reproducing data from the transparent sheet. However, in the coating process for producing a transparent cover sheet for recording media, cutting waste adhering to the end surface of the base floats, and as shown in FIG. 1 due to the influence of dust adhering to the sheet surface and pass roll due to static electricity generated during conveyance. 4 types of surface defects occurred.

  FIG. 1 is a diagram for explaining four types of surface defects that occur on a transparent cover sheet. (A) is a protrusion defect formed on the surface of the transparent cover sheet, and (b) is a surface of the transparent cover sheet. The attached foreign substance defect, (c) is a scratch defect formed on the coated surface of the transparent cover sheet, and (d) is a dent defect formed on the coated surface of the transparent cover sheet. If any one of these surface defects (a) to (d) occurs, the output during recording or playback will drop during recording or playback, and data cannot be recorded correctly or data can be played back correctly. In some cases, it becomes a cause of dropout, and neither can be used as a product. Therefore, these surface defects must be reliably detected at the inspection stage and excluded so as not to use the partial sheet. For this purpose, it is necessary to accurately detect surface defects of the transparent sheet.

Currently known transparent sheet defect inspection apparatuses include those described in Patent Documents 1 and 2.
Japanese Patent Laid-Open No. 8-50012 JP 2003-172708 A

  The invention described in Patent Document 1 improves the detection accuracy of minute defects in a transparent sheet inspection apparatus. Specifically, the first defect detection unit includes a differentiation circuit that extracts a signal change, and a threshold value. Is set by a first threshold circuit that detects a large defect and a second threshold circuit that detects a medium defect, and a second defect detection unit is provided in front of the differentiating circuit on a tape substantially equal to a minute defect level. It is composed of a bandpass filter that removes running noise, electrical noise, and the like, and a third threshold circuit in which a threshold value corresponding to a minute defect level is set.

  The invention described in Patent Document 2 is related to the prior invention of the present applicant, and provides a defect inspection apparatus for a transparent sheet that can identify a foreign object in addition to detecting a scratch on the transparent sheet by nondestructive inspection. Therefore, it is a transparent sheet defect inspection apparatus that optically inspects a transparent sheet and detects defects in the transparent sheet, the light projecting means for projecting light on the transparent sheet, and reflected by the transparent sheet A light receiving means for receiving the received light, and a personal computer which is a detection means for detecting a defect in the transparent sheet based on a light component reflected by a predetermined defect and a light component received by the light receiving means; It is characterized by having.

The inventions described in Patent Documents 1 and 2 are common in that the tape running between the two guide rolls is inspected, but in the inspection between the pass rolls, the reflection is caused by fluttering and shaking of the running. It has been found that there is a disadvantage that the position of the direction becomes unstable.
Further, in the inspection between the pass rolls, since the transparent sheet surface is directly captured, there is a drawback that it is difficult to obtain the uneven density difference.
In addition, the applicant tried to detect the reflected specular light with the light receiving device by directly shining light on the transparent sheet on the pass roll, not between the pass rolls. It was extremely difficult to catch the dent defect because of less light scattering.

  Therefore, the present invention was made to solve these drawbacks, and the surface on which the surface of the sheet can be in-line detected to detect the surface defects accurately, sort out the non-standard defects, and specify the position thereof. An object is to provide an inspection method and an apparatus therefor.

In order to achieve the above object, the invention according to claim 1 relates to a surface inspection method for a sheet to be inspected, and irradiates light to the sheet to be inspected and reflects the light reflected on the sheet to be inspected by a light receiving device. In the inspection sheet surface defect inspection method for inspecting a defect on the inspection sheet surface by receiving light, a light shielding mask is provided in a main light region of light irradiated on the inspection sheet, and light passing next to the light shielding mask is transmitted. An area on the inspection sheet to be irradiated is inspected.
According to a second aspect of the present invention, in the surface inspection method for an inspected sheet according to the first aspect, the inspected sheet is conveyed onto a backup roll, and the inspected sheet is inspected on the backup roll. It is said.
According to a third aspect of the present invention, in the defect inspection method for a surface of the inspected sheet according to the first or second aspect, the inspected sheet is a transparent sheet.

  According to a fourth aspect of the present invention, in the defect inspection method for a surface of the inspected sheet according to any one of the first to third aspects, in order to indicate the position where the defect is detected to the sheet, the width direction of the sheet It is characterized in that at least one of winding length, defect position and defect rank is printed on the side edge.

The invention according to claim 5 relates to a defect inspection device for a sheet surface, a backup roll, a rod illumination device that irradiates a sheet traveling on the backup roll, and a main light irradiation region in which the rod illumination device irradiates the sheet. And a light receiving device that captures light reflected from the sheet as a light / dark signal.
A sixth aspect of the present invention is the sheet defect inspection apparatus according to the fifth aspect, wherein the backup roll is of a black matte.
According to a seventh aspect of the invention, in the sheet defect inspection apparatus according to the fifth or sixth aspect, the light receiving device is a line CCD camera.
The invention according to claim 8 is characterized in that in the sheet defect inspection apparatus, a plurality of sheet defect inspection apparatuses according to any one of claims 5 to 7 are juxtaposed.

The invention according to claim 9 relates to a defect inspection system, wherein the sheet defect inspection apparatus according to any one of claims 5 to 8 and the defect inspection apparatus disposed downstream of the sheet defect inspection apparatus in the sheet conveying direction. A defect address printing marker for writing the position address of the defect detected by the sheet on the sheet, and a personal computer for calculating the defect address based on the inspection data from the sheet defect inspection apparatus and outputting it to the defect address printing marker. It is a feature.
According to a tenth aspect of the present invention, in the defect inspection system according to the ninth aspect, the personal computer further causes a defect rank to be entered in the defect address print marker.
The invention described in claim 11 is the defect inspection system according to claim 9 or 10, further comprising a length measurement printing marker for entering the length measurement of the sheet, and the personal computer measures the length of the sheet on the length measurement print marker. It is characterized by having you fill in.
According to a twelfth aspect of the present invention, in the defect inspection system according to the eleventh aspect of the invention, the defect address print marker and the length measurement print marker are disposed on the edges of the sheet.

  A thirteenth aspect of the present invention relates to a defect inspection system, and the defect address is based on the sheet defect inspection apparatus according to any one of the fifth to eighth aspects, the image display monitor, and inspection data from the sheet defect inspection apparatus. In a defect inspection system comprising a personal computer that calculates and outputs to the image display monitor, a defect inspection characterized by displaying a detailed address screen that numerically displays the address of the defect on the two-dimensional plane of the image display monitor system.

  The invention described in claim 14 relates to a defect inspection system, wherein the defect address is based on the sheet defect inspection apparatus according to any one of claims 5 to 8, the image display monitor, and inspection data from the sheet defect inspection apparatus. A defect inspection system comprising a personal computer that calculates and outputs to the image display monitor, and displays a map screen that displays the position of the defect as a dot on a two-dimensional plane of the image display monitor. .

  A fifteenth aspect of the invention relates to a defect inspection system, wherein the defect address is based on the sheet defect inspection apparatus according to any one of the fifth to eighth aspects, an image display monitor, and inspection data from the sheet defect inspection apparatus. In a defect inspection system comprising a personal computer that calculates and outputs to the image display monitor, a multi-image display screen that displays a plurality of defect images on a two-dimensional plane of the image display monitor is displayed. Yes.

  A sixteenth aspect of the present invention is the defect inspection system according to any one of the thirteenth to fifteenth aspects, further comprising a memory, wherein inspection data from the sheet defect inspection apparatus is stored in the memory and stored in the memory. Based on the inspection data, at least one of the detailed address screen, the map screen, and the multi-image display screen is displayed.

  Due to the characteristics of Blu-ray recording media, the original product performance could not be achieved if various types of non-specified defects such as those shown in Fig. 1 existed. However, the above configuration can reliably detect non-standard defects. By eliminating that part, it becomes possible to guarantee the high quality of the product.

<Example 1>
The sheet surface defect inspection apparatus according to the first embodiment of the present invention will be described below.
FIG. 2 is a perspective view of a sheet surface defect inspection apparatus according to the present invention.
In the figure, the defect inspection apparatus 10 for a sheet surface according to the present invention includes a rod illumination device 20, a backup roll 30 that collects and irradiates light from the rod illumination apparatus 20, and a transparent sheet P that travels on the backup roll 30. And a light receiving device 40 that captures reflected light from the light source as a light / dark signal, and further includes a light shielding mask 50 in the vicinity of the backup roll 30 that shields the main light irradiation region where the rod illumination device 20 irradiates the transparent sheet P. It is said.

Here, each device will be described.
3A and 3B are diagrams for explaining an example of a rod illumination device used in the present invention. FIG. 3A is a front view of the rod illumination device, and FIG. (B) is a sectional view of the quartz rod, and (c) is an illuminance distribution diagram of the rod illumination device.
<Configuration of rod lighting device>
As shown in FIG. 2A, the rod illuminating device 20 includes a light source unit and a quartz rod unit, and the light source unit uses a highly condensing halogen lamp with a mirror. The rod unit includes a solid quartz rod that transmits light and an aluminum casing that supports the rod. White stripes are applied to the back surface of the rod in the axial direction. A cover glass or a cylindrical lens can be attached to the aluminum casing, and a slit or a polarizing plate for limiting the width and length of the beam angle can be attached. Although the reflection film is processed on the light source part and the end face on the reflection side, another light source part may be prepared instead of the reflection film and provided at a position symmetrical to the light source part.
<Principle of rod lighting device>
The light incident from the light source at the end is incident on the end face of the quartz rod and is totally reflected through the quartz rod. Since the reflection film is processed on the end surface on the reflection side, it is reflected here and returns to the opposite side of the quartz rod. The reflected light does not go out as it is, but when it hits a white stripe applied to a part of the back of the rod, the light is diffused there and emitted forward with directivity by the lens action of the rod. Is done. By condensing the diffused light emitted forward on the surface of the far inspection sheet, the surface of the inspection sheet can be illuminated.
<Illuminance distribution of rod lighting device>
In the illumination using such a quartz rod, since the light is scrambled by the rod, the color unevenness and the illuminance unevenness at the incident part of the rod are eliminated in the rod, and as a result, the rod as shown in FIG. Good illumination that is uniform in the axial direction and has no unevenness can be obtained. In FIG. 3C, the vertical axis represents illuminance (lux Lx), which is measured at a position 20 mm from the end face. The horizontal axis is the length direction of the rod. It can be seen that the rod illumination device 20 can obtain substantially uniform 4800 Lx illuminance except for both ends.

  The backup roll 30 is a roll whose surface has been subjected to black matting treatment, and after the irradiated light is transmitted through the transparent sheet P, it is not reflected by the black matting treatment, thereby preventing disturbance. . It has been confirmed that the size of the backup roll 30 is Φ50 to Φ500, but it is confirmed that the backup roll 30 can be adapted to the inspection.

  Here, the light receiving device 40 is constituted by a plurality of known CCD cameras arranged in a line.

  The light-shielding mask 50 is a light-shielding member that completely covers the main light irradiation area in the reflection / scattering light receiving optical system. By placing this in the main light irradiation area, halation is prevented and halation light enters the line CCD camera. I try not to shine. The position where the light-shielding mask 50 is placed may be either upstream or downstream in the conveyance direction of the main irradiation site A1.

FIG. 4 is a conceptual diagram showing the relationship between the irradiation position, the light shielding mask, and the inspection position.
In the figure, the outgoing light from the rod illumination device 20 is irradiated to the backup roll 30 at an inclination of an incident angle θ = about 20 ° with respect to the normal line of the backup roll 30. On the other hand, the light receiving device 40 is arranged so as to receive the emitted light of about 20 ° on the opposite side to the rod illumination device 20 with respect to the normal line of the backup roll 30.
When the light shielding mask 50 is disposed so as to cover a main light irradiation region (described later) of the light emitted from the rod illumination device 20 and is placed close to the backup roll 30, halation from the main light irradiation region is incident on the line CCD camera. It will be hard to do.

5A and 5B are diagrams for explaining the function of the light shielding mask 50. FIG. 5A is an irradiation state on the transparent sheet when the light shielding mask according to the present invention is not placed, and FIG. 5B is a light shielding mask used in the present invention. c) shows respective plan views of the irradiation state on the transparent sheet when the light shielding mask is placed.
In (a), P is a transparent sheet irradiated with the light emitted from the rod illumination device 20 (FIG. 4), A1 is the main irradiation site where the light emitted from the rod illumination device 20 is most concentrated, and A2 and A3 are the main irradiation. A light scattering site in the vicinity of the site A1, K is a surface defect on the transparent sheet P (any one of a to d in FIG. 1). As can be seen from the drawing, the light scattering portions A2 and A3 deviating from the brightest main irradiation portion S1 are on both sides of the main irradiation portion A1 in the upstream and downstream of the sheet conveyance direction, and both portions A2 and A3 are from the main irradiation portion A1. It becomes darker as it goes away in the sheet conveying direction.
Although the main irradiation site A1 has a surface defect K, halation occurs because the main irradiation site A1 is bright, and the line CCD camera 40 (FIG. 4) cannot detect the surface defect K (therefore, the dotted line K here). Is shown.)

Therefore, in the first embodiment, the main irradiation site A1 and one (right side in the figure) light scattering site A2 are covered with the light shielding mask 50 as shown in (b), and a shadow MS (FIG. C) is formed in this site. As a result, the result was as shown in (c).
In the figure, MS is a shadow on the transparent sheet blocked by the main light blocking mask 50. As can be seen from the figure, the main irradiation part A1 and one light scattering part A2 are covered with the shadow MS, so it becomes dark, so that halation does not occur, and the scattered light deviates from 1 mm to 5 mm from the center line of the main irradiation part A1. By using the light receiving portion A3 as the actual inspection position, disturbance is not incident on the line CCD camera 40 (FIG. 4), and the surface defect K that is difficult to detect as a defect in the main irradiation portion A1 is generated. Here, it becomes possible to recognize at a different density from the surroundings. The illuminance at the actual inspection position is lower than that of the main irradiation site A1, but this can be solved by increasing the overall sensitivity.

  Thus, in the conventional inspection method in which the surface defect was inspected at the main irradiation site, it was difficult to reliably detect the defect by halation. By making a shadow on the part and setting the part slightly away from it as the actual inspection position, it becomes possible to reliably detect non-standard defects, and it is possible to guarantee the high quality of the product.

<Example 2>
When the width of the transparent sheet to be inspected is wide, the illuminance is insufficient with one long rod illumination in FIG. 3, and sufficient reflected light may not be obtained. Embodiment 2 solves this problem. FIG. 6 shows an inspection apparatus according to the second embodiment. FIG. 6A is a view in the width direction of the transparent sheet P to be inspected and the inspection apparatus 10 inspecting the left side in the width direction view of the inspection sheet P in FIG. (B) Inspection apparatus 10 'which inspects the right side is arranged in parallel. In this case, the rod illumination 20 ′, the line CCD camera 40 ′, and the light shielding mask 50 ′ of the inspection apparatus 10 ′ are provided on the extension lines in the length direction of the rod illumination 20, the line CCD camera 40, and the light shielding mask 50 of the inspection apparatus 10. And the left and right sides of the inspected transparent sheet P on the common backup roll 30 are simultaneously inspected.
By doing in this way, even if the width | variety of a to-be-inspected transparent sheet is wide, the exact test | inspection of a surface defect is attained.

The above has described the case where the sheet P to be inspected is a transparent sheet, but it is also possible to inspect the defect of a black system such as a magnetic tape having a low reflectivity instead of the sheet P to be inspected. This is possible according to the invention.
In this case, since the sheet P to be inspected is not a transparent sheet, the amount of reflected light is small. Therefore, in order to increase the amount of reflected light, a device for increasing the amount of irradiated light may be used.
Therefore, the amount of light per unit length in the axial direction can be increased by reducing the length of the long-axis rod 23 in the rod illumination 20 of FIG. 3 to less than half and bringing the left and right halogen lamp light sources 22 closer to each other. . The length direction of the rod illumination (the width direction of the sheet to be inspected) can be increased by providing two or more as in Example 2 of FIG. That's fine.
By doing so, a sheet such as a magnetic tape that is not a transparent sheet can be inspected. Therefore, hereinafter, it will be referred to as “sheet” without being limited to “transparent sheet”.

<Example 3>
The first and second embodiments relate to the inspection apparatus 10 itself, but the third embodiment is a printing station that processes data inspected by the inspection apparatus 10 and prints a mark for specifying a defect position on the inspected sheet itself. It relates to the invention.
FIG. 7 is a conceptual perspective view for explaining the positional relationship between the inspection station in the first and second embodiments and the printing station in the third embodiment. In the figure, when the inspection station I is placed on the upstream (right) side of the inspected sheet P being conveyed from right to left in the figure, and the inspection station I detects a surface defect (FIG. 1) in the inspected sheet P. A printing station II for printing a mark for specifying the defect position on the inspection sheet P itself is provided in the vicinity of the position on the downstream (left) side. An inspection apparatus 10 is installed at the inspection station I, and print markers are installed at both ends in the width direction of the inspection sheet P at the printing station II. One is a defect type / address printing marker 60 for entering a defect address, and the other is a length measuring marker 70 for entering the length in the width direction of the inspection sheet P. The inspection apparatus 10, the defect type / address printing marker 60, and the length measurement marker 70 are incorporated in the system shown in FIG.

FIG. 8 is a conceptual diagram illustrating the entire inspection / printing system.
This inspection / printing system converts the inspection devices 10 and 10 'of the inspection station, the defect type / address printing marker 60 and the length measuring marker 70 of the printing station, and the detection results of the inspection devices 10 and 10' into data, A data processing unit 80 for outputting to the defect type / address printing marker 60 and the length measurement marker 70 is provided.
The data processing unit 80 is provided with an operation / counting personal computer 82 for setting inspection conditions and various data processing, and a plurality of client personal computers 84 and 86 are provided so that the data can be referred to outside the production machine room. In addition, the necessary data is processed and transmitted from the aggregate PC to the higher-level production management side.

The overall flow of inspection starts with the production line first, and when the application is started, the inspection starts. Actually, the inspection is started by tracking until the top of the application part reaches the inspection roll. The
The entire surface is inspected by the inspection devices 10 and 10 ′, and when a defect is inspected, the winding position and the position in the width direction at that time are transmitted to the personal computer 82.

9A and 9B are diagrams for explaining an example of work performed by the printing station II (FIG. 7) according to the third embodiment. FIG. 9A is a plan view and FIG. 9B is a side view.
In the figure, it is assumed that the inspection sheet P has surface defects K1, K2, and K3 having three different sizes. Reference numeral 60 denotes a defect type / address printing marker for entering a width direction address where a defect is located together with a defect type code, and 70 denotes a length measurement mark (◯ in the figure) indicating the width direction length of the inspection sheet P. The printing interval L2 (L2 = 10 cm in the figure) is set to 0 cm, the inspection start position is set to 0 cm, the winding length is printed in units of 10 cm, and length measurement values (0, 10, 20,...) Are displayed. This is a length measurement marker that prints numbers at a printing interval L1 (L1 = 1 m in the figure). Since both markers are maintenance-free if dust-free laser markers are used, laser markers are recommended compared to other markers (for example, inkjet).

  Here, the defect size to be detected is set to several tens of μm or more, and is classified into S1 to S3 in three stages on the basis of the size. S1 is a management size that does not become a practical defect, S2 is a size that can be used depending on the standard, and S3 is an NG level size to be excluded. Of course, it is not limited to three stages, and it is needless to say that it can be classified into multiple stages as needed.

  Of the three defects, the defect K1 that first appears during transportation is the management size S1 that does not become a practical defect as a result of the personal computer determination, so the defect type / address print marker 60 is in the width direction of the defect K1. A black square symbol meaning S1 is printed together with the address number “52” in the width direction on the edge of the sheet on the line.

  Since the defect K2 that appears next is S2 that can be used depending on the standard as a result of determination by the personal computer, the defect type / address print marker 60 is addressed in the width direction at the edge of the sheet on the width direction line of the defect K2. 86 "is printed together with a black triangle symbol meaning S2.

  Since the third defect K3 is determined to be an NG level S3 to be excluded as a result of the personal computer determination, the defect type / address printing marker 60 is placed in the width direction on the edge of the sheet on the width line of the defect K3. A black circle sign indicating S3 is printed together with the address number “67”.

Thus, by marking the defect information on the edge of the detected sheet P itself, the manufacturer can easily find the defects K1 to K at a later date using the mark printed on the edge, The processing method can be immediately known from the ranks S1 to S3 of the defects K1 to K.
In addition, if the defect itself is directly surrounded by a mark instead of marking the edge of the sheet, the manufacturer can more easily know the position of the defect. It is not recommended that the marker always come and go on the sheet P because this may cause a secondary disaster that dust adheres to the sheet P to be detected.
Therefore, in the present invention, since the defect type and the address in the length direction are printed on the edge that is not used when the detection sheet P is manufactured as described above, there is no problem even if dust adheres.

At the end of the inspection, the application end signal is tracked, and when the inspection position is reached, the inspection ends. The inspection data is subjected to various processes and stored as past data in a totaling personal computer.
Also, the position in the winding direction and the width address are clearly shown on the monitor of the personal computer so that the position can be specified in order to eliminate the defect. There are several contents displayed on the screen. Among them, there are a detailed address screen, a map screen, and a multi-image display screen.
The detailed address screen displays the position of the defect with an accurate numerical value on the two-dimensional plane (Example 4), and the map screen displays the position of the defect with a dot on the two-dimensional plane to determine the distribution status. The multi-image display screen trims and stores a defect image at a level for storing the image, and redisplays the screen when the user wants to view the image (Example 6). Hereinafter, three display screens will be described as Examples 4 to 6.

<Example 4>
FIG. 10 shows an example of the “detailed defect address” display screen according to the fourth embodiment.
In the figure, the left column 101 is a display unit for displaying “past list information” and the right column 102 is for displaying “detailed address of defect”. From the left, the upper column is a “stop” button, an “application length” display section (displayed as 6.5 m in the figure), a “current date and time” display section (in the figure, October 12, 2004, 16:42). Minute) and a “speed” display (0 m / min in the figure). The lower row shows the roll number currently displayed from the left. A display unit (0404061 in the figure), a screen type display unit (in the figure, “past defect detailed address screen”) for displaying the type of the screen being displayed, a “current” or “past” present past display unit. .
From the left, the lower column is “Current Details”, “Current Graph”, “Current Map”, “Current Cumulative”, “Past Details”, “Past Graph”, “Past Map”, “Past Cumulative”, “Current” There are buttons for “image”, “past image”, and “total”. Click “Current ...” to display the selected screen. Click the file you want to display in the past, and click “Past ...” for the item to display the selected screen. At the same time, the corresponding “current” lamp or “past” lamp in the current past display portion is brightened (in the figure, the “past” lamp is selected).

  The “past list information” in the left column 101 displays the number of the sheet roll that has been inspected so far and the inspection start date and time when the inspection was performed. In the figure, among the 291 rolls, the roll number No. 22-No. Up to 66 are displayed. Roll number no. To return to the smaller roll number from No. 22, click the upward triangle △ button on the right side, and roll number No. To proceed further from 66, click the downward triangle ▽ button. By clicking the sheet roll number to be displayed on the personal computer display screen with the mouse, the address of the surface defect existing on the sheet roll of the clicked sheet roll number is displayed on the right detailed address screen. In the figure, a roll No. “No. 57” indicated by reference numeral 103 is shown. “0404061” is selected.

In the detailed address screen in the right column 102, the vertical axis indicates the distance in the length direction from the inspection start point in units of 10 cm, and the horizontal axis indicates the defect information in the width direction of the sheet. Since the vertical axis is entered every time a defect is detected, if no defect is detected on the line in the width direction, the distance at that time is not entered, and conversely, a plurality of width directions are within a distance of 10 cm in the length direction. If a defect is detected on the line, the distance in the length direction from the inspection start point for each width direction is entered, so the same numerical value is entered multiple times.
The upper horizontal axis is slit information in the width direction of the sheet, and the first to eighth slits are engraved from left to right. One slit here is equal to the width of the sheet coated on the Blu-ray disc as a product. Further, the lower horizontal axis indicates the sheet width direction in mm.

  Therefore, for example, the display content “c30.5” of the part indicated by reference numeral 104 in the figure indicates that the defect type c exists at a position 30.5 mm from the sheet edge. Further, the display content “b690.7” of the part indicated by reference numeral 105 in the drawing indicates that the defect type b exists at a position of 690.7 mm from the sheet edge.

  In the detailed address screen, an asterisk mark “*” is displayed at a location where a defect image (described later in Example 6) is stored (for example, refer to reference numeral 106). The stored image shown below is displayed so that the defect shape can be visually confirmed.

  Since the inspector can accurately know the defect position of the inspected sheet from this “detailed address screen of defect”, this information can be used effectively in analyzing the characteristics of the manufacturing apparatus that manufactured the sheet. .

  Further, by clicking on any of the buttons selected in the “current map” and “past map” files at the bottom of FIG. 10 with the mouse, the screen is switched to the “map” screen described in the fifth embodiment.

<Example 5>
FIG. 11 shows an example of a “map” display screen according to the fifth embodiment.
The map display screen is configured so that the sheet width is set on the X axis and the winding length is set on the Y axis. When a defect occurs, the map is displayed in real time, and the distribution of the occurrence position can be easily confirmed. It is also possible to display in units. If a defect point is double-clicked, the detailed address screen is displayed and information about the point is displayed.
In the figure, the left column 111 is a display unit that displays “past list information”, and the right column 112 is a display unit that displays “map”. Of the various buttons in the upper column, the next column, and the lower column, the same as those in FIG. The defect level buttons a, b, c, and d are provided for each color so that individual defect levels can be selected and displayed.
In the map screen in the right column 112, the vertical axis displays the distance in the length direction from the inspection start point in meters (m), and the scale is given in units of 10 cm. The horizontal axis indicates defect information in the width direction of the sheet, the upper horizontal axis indicates slit information in the width direction of the sheet, and the lower horizontal axis indicates the width direction of the sheet in mm.
Defects are displayed as dots. When dots are continuous in the length direction or width direction, independent and independent defects may occur by chance in the length direction or width direction, but rather the length direction or width. There is a high possibility that the defect is one long piece connected in the direction. In any case, since such defects must be eliminated without using them, the present invention makes no distinction between the defects and does not require any distinction. If they are at the same width, a synchronization defect is expected, and there are many defects due to the pass roll system.

  In the present embodiment, the upstream (upper side in the figure) dot is displayed with the cursor line 113 as the boundary, and the downstream dot is not displayed, and it is easy to see by clarifying where the observation is now. ing. Further, if the display color is changed for the dots on the cursor line 113 as compared to other dots, the screen becomes easier to see.

  Since the inspector can know at a glance the defect distribution status of the sheet to be inspected from this “map screen”, this information can be used effectively when analyzing the characteristics of the manufacturing equipment that manufactured the sheet. .

  Further, by clicking one of the “current image” and “past image” buttons at the bottom of FIG. 11 with the mouse, the screen is switched to the “image” screen described in the sixth embodiment.

<Example 6>
FIG. 12 is an example of a “multi-image” display screen according to the sixth embodiment.
In the figure, the left column 121 is a display unit for displaying “past list information”, and the right column 122 is a display unit for displaying “multi-image”. The description of various buttons in the upper column, the next column, and the lower column that are the same as those in FIG. 10 will be omitted, and a different third column will be described.
In the third column, there is an “enlargement ratio” display portion, which indicates that it is currently displayed at 101%. Next to the buttons are an “enlarge” button and a “reduced” button. By clicking on each of them, a desired enlargement ratio is set. The “number of images” display section displays the roll number. The number of defect images for the roll sheet is displayed, and it can be seen that 1493 images are recorded in the figure.
In the “past list information” in the left column 121, a roll “No. 51” 0902-3 indicated by reference numeral 123 is selected. On the right multi-screen, the defect image captured by the line CCD camera 40 (FIG. 6) is enlarged or reduced (in the figure, the enlargement ratio is 101%), and the sheet defects are displayed in the order of upper left → upper right → lower left → lower right. It is displayed in order from the upstream (six defects in the figure).
On each screen, the defect image captured by the CCD camera is displayed in the center, and the defect types a, b, and c (ranked by a, b, and c based on the size of the defect area) and length measurement determined by the personal computer. A number 0.3 (part 0.3 m from the starting point) is displayed at the top, and its address S is displayed at the bottom. By enclosing the defect with a cursor, the size in the XY direction can be known.

  Further, when the next downstream image is to be displayed, the lower right “fingertip” button is clicked. When the latest image is to be displayed, the lower right “latest” button is clicked. Conversely, if you want to display the upstream image, click the “fingertip” button in the upper left, and if you want to display the oldest image, click the “oldest” button in the upper left.

  The multi-window display returns to the home screen when the keyboard or mouse is not operated for a certain period of time after the display.

There are various types of surface defects as shown in FIG. 1, but they are common in that any surface defects should be eliminated. Therefore, in the present invention, the types of surface defects are defined without distinction. I try to sort it out.
In this way, the detected defect leaves a visualized image as shown in FIG. 12, and is used as a means of searching for the cause of occurrence by making it possible to confirm it after the fact. At that time, the multi-image display screen for displaying the entire defect image is convenient because the entire defect shape can be listed because an image is displayed for each occurrence.

  In addition, in the present invention, as indicated by the button at the bottom, a "current graph" or "past graph" function that displays a graph of the number of defects in roll units, and a graph display that compares the number of defects of several rolls “Current total” and “Past total” functions are available.

  Further, according to the present invention, it is possible to arbitrarily display the past figure and the current figure, but it is difficult to determine which is the current display, so the color of the entire display is changed between the current display and the past display. This is easy to understand.

  In addition, when the past figure and the current figure are arbitrarily displayed, when the past figure is displayed, the display automatically returns to the current figure at a predetermined time (for example, one minute later). , It improves usability.

  As described above, according to the present invention, the sheet traveling on the backup roll is irradiated with light, and at that time, the light shielding mask is applied to the main light region of the light, and the light passing through the side of the light shielding mask is irradiated. Since the area on the inspection sheet is inspected, defects such as irregularities become dark portions and high contrast can be obtained, so that it is possible to detect irregularities such as irregularities that were impossible with conventional devices.

Further, when it is determined as a defect, the defect information on the actual sheet is printed on a sheet edge portion which is not used as a product with a print marker, so that it can be easily understood by an inspector at a later date.
In addition, by storing defect information and images determined as defects in a memory, it has become one of the materials that cause the quality manager to re-determine and analyze the cause of occurrence. At this time, since various grags and images are displayed in a multi-window so that the surface defect data can be easily seen, the determination can be made quickly and accurately.

The above display screen can be printed by a printer and left as paper material.
In addition, it has a function of compiling and comparing several files of past data, and data processing is diverse. Note that there is no restriction on reading and referring to past data without affecting the inspection even during the operation of the inspection machine.

It is a figure explaining the four types of surface defects which generate | occur | produce in a transparent cover sheet, (a) is a protrusion-like defect made on the coating surface surface of a transparent cover sheet, (b) is a foreign substance adhering to the coating surface surface of a transparent cover sheet. Defects, (c) are scratch defects formed on the coated surface of the transparent cover sheet, and (d) are dent defects formed on the coated surface of the transparent cover sheet. It is a perspective view of the defect inspection apparatus of the sheet | seat surface which concerns on this invention, and a conceptual diagram which shows the relationship between an irradiation position and an inspection position. It is a figure explaining an example of the rod illuminating device used by this invention, (a) (a) is a front view of a rod illuminating device, (b) is a side view. (B) is a sectional view of the quartz rod, and (c) is an illuminance distribution diagram of the rod illumination device. It is a conceptual diagram which shows the relationship between an irradiation position, a light shielding mask, and an inspection position. It is a figure explaining the function of a light-shielding mask, (a) is the irradiation state on the transparent sheet when not placing the light-shielding mask according to the present invention, (b) is a light-shielding mask used in the present invention, and (c) is a light-shielding mask. Each plan view of the irradiation state on the transparent sheet when placed is shown. The inspection apparatus which concerns on Example 2 is shown, (a) shows the inspection apparatus which test | inspects the left side of the width direction of the to-be-inspected sheet P, (b) shows the inspection apparatus which inspects the right side of the width direction. Yes. FIG. 6 is a conceptual perspective view illustrating the positional relationship between an inspection station according to Examples 1 and 2 and a printing station according to Example 3. It is a conceptual block diagram explaining the whole inspection and printing system. FIG. 9 is a diagram illustrating an example of work performed by the printing station II according to the third embodiment, where (a) is a plan view and (b) is a side view. FIG. 10 is an example of a “detailed defect address” display screen that is Embodiment 4. FIG. FIG. 10 is an example of a “map” display screen that is Embodiment 5. FIG. FIG. 10 is an example of a “multi-image” display screen that is Embodiment 6. FIG.

Explanation of symbols

10, 10 ′ Sheet surface defect inspection device 20 according to the present invention Rod illumination device 21 Reflection mirror 22 Halogen lamp light source 23 Long axis rod 30 Backup roll 40 Light receiving device 50 Light shielding mask P Transparent sheet

Claims (16)

  In the inspection sheet surface defect inspection method for inspecting a defect on the inspection sheet surface by irradiating the inspection sheet to be conveyed with light and receiving the light reflected on the inspection sheet with a light receiving device. A surface of a sheet to be inspected, characterized in that a light shielding mask is provided on a main light region of light irradiated on the sheet, and the region on the sheet to be inspected that is irradiated with light passing through the side of the light shielding mask is inspected. Inspection method.   2. The surface inspection method for an inspection sheet according to claim 1, wherein the inspection sheet is conveyed onto a backup roll and the inspection sheet is inspected on the backup roll.   3. The method for inspecting a defect on a surface of an inspected sheet according to claim 1, wherein the inspected sheet is a transparent sheet.   4. At least one of a winding length, a defect position, and a defect rank is printed on a side edge in the width direction of the sheet in order to indicate to the sheet a position where a defect is detected. A method for inspecting defects on the surface of a sheet to be inspected according to 1.   A backup roll, a rod illumination device that irradiates a sheet traveling on the backup roll, a light-shielding mask that shields a main light irradiation area that the rod illumination device irradiates the sheet, and a light-dark signal that reflects light reflected from the sheet A sheet surface defect inspection apparatus, comprising:   6. The sheet defect inspection apparatus according to claim 5, wherein the backup roll is a matte black mat.   7. The sheet defect inspection apparatus according to claim 5, wherein the light receiving device is a line CCD camera.   A sheet defect inspection apparatus comprising a plurality of sheet defect inspection apparatuses according to any one of claims 5 to 7.   The sheet defect inspection apparatus according to any one of claims 5 to 8, and a position address of a defect that is disposed downstream of the sheet defect inspection apparatus in the sheet conveyance direction and detected by the defect inspection apparatus is written on the sheet. A defect inspection system comprising: a defect address print marker; and a personal computer that calculates a defect address based on inspection data from a sheet defect inspection apparatus and outputs the defect address to the defect address print marker.   The defect inspection system according to claim 9, wherein the personal computer further causes a defect rank to be entered in the defect address printing marker.   11. The defect inspection system according to claim 9, further comprising a length measurement printing marker for entering the length measurement of the sheet, wherein the personal computer causes the length measurement print marker to enter the length measurement of the sheet.   The defect inspection system according to claim 11, wherein the defect address print marker and the length measurement print marker are disposed at edges of each other of the sheet.   9. A sheet defect inspection apparatus according to claim 5, an image display monitor, and a personal computer that calculates a defect address based on inspection data from the sheet defect inspection apparatus and outputs the defect address to the image display monitor. A defect inspection system comprising: a detailed address screen for displaying a defect address numerically on a two-dimensional plane of the image display monitor.   9. A sheet defect inspection apparatus according to claim 5, an image display monitor, and a personal computer that calculates a defect address based on inspection data from the sheet defect inspection apparatus and outputs the defect address to the image display monitor. A defect inspection system comprising: a defect inspection system that displays a map screen in which dots are displayed on a two-dimensional plane of the image display monitor.   9. A sheet defect inspection apparatus according to claim 5, an image display monitor, and a personal computer that calculates a defect address based on inspection data from the sheet defect inspection apparatus and outputs the defect address to the image display monitor. A defect inspection system comprising: a defect inspection system that displays a plurality of defect images on a two-dimensional plane of the image display monitor as a multi-image display screen.   And a memory, wherein inspection data from the sheet defect inspection apparatus is stored in the memory, and at least one of the detailed address screen, the map screen, and the multi-image display screen based on the inspection data stored in the memory The defect inspection system according to claim 13, wherein the defect inspection system is displayed.

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