JP2006162259A - Spectrometry system - Google Patents

Spectrometry system Download PDF

Info

Publication number
JP2006162259A
JP2006162259A JP2004349476A JP2004349476A JP2006162259A JP 2006162259 A JP2006162259 A JP 2006162259A JP 2004349476 A JP2004349476 A JP 2004349476A JP 2004349476 A JP2004349476 A JP 2004349476A JP 2006162259 A JP2006162259 A JP 2006162259A
Authority
JP
Japan
Prior art keywords
sample
spectrum
light
background data
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004349476A
Other languages
Japanese (ja)
Inventor
Jun Koshobu
純 小勝負
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jasco Corp
Original Assignee
Jasco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jasco Corp filed Critical Jasco Corp
Priority to JP2004349476A priority Critical patent/JP2006162259A/en
Publication of JP2006162259A publication Critical patent/JP2006162259A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Spectrometry And Color Measurement (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a spectrometry system which does not require measurers to separately measure a background spectrum and a sample spectrum. <P>SOLUTION: The spectrometry system is provided with both a light emergent means for guiding light to a sample mounting position and a photo-detection means for detecting light emergent from a sample and measures a sample spectrum by irradiating the sample with light and detecting emergent light from the sample. The spectrometry system is provided with a detection means arranged in the vicinity of the sample mounting position for detecting information as to whether the sample is mounted or not; a determination means 24 for determining whether the sample is mounted to the sample mounting position or not on the basis of a signal from the detection means; a control means for controlling the light emergent means and the photo-detection means according to preset measurement conditions when it is determined by the determination means that the sample is not mounted to the measuring position and automatically acquiring background data by performing measurement without the sample mounted; and a storage means for storing acquired background data. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、分光測定装置、特にそのバックグラウンドスペクトルの取得機構の改良に関する。   The present invention relates to a spectroscopic measurement apparatus, and more particularly to an improvement of a background spectrum acquisition mechanism.

単光路の光学系を採用した分光測定装置では、例えば、試料の吸収スペクトルの算出の際、試料からの透過光のスペクトルとバックグラウンドスペクトルとを、別々に測定する必要がある(例えば、特許文献1の従来技術の欄を参照)。つまり、試料を設置しない状態でバックグラウンドスペクトルの測定を行い、続いて試料からの透過光のスペクトルの測定を行い、この透過光のスペクトルとバックグラウンドスペクトルを比較することで試料の吸収スペクトルが得られる。
特開2000−74826号公報
In a spectroscopic measurement apparatus that employs an optical system with a single optical path, for example, when calculating an absorption spectrum of a sample, it is necessary to separately measure a spectrum of transmitted light from the sample and a background spectrum (for example, Patent Documents). 1). In other words, the background spectrum is measured without the sample being placed, then the spectrum of the transmitted light from the sample is measured, and the absorption spectrum of the sample is obtained by comparing the spectrum of the transmitted light with the background spectrum. It is done.
JP 2000-74826 A

通常、試料を設置した状態でのスペクトル測定と、バックグラウンドスペクトルの測定とは、同じパラメータ設定で実行する必要があるため、バックグラウンド測定に費やされる時間は、試料のスペクトル測定にかかる時間とほぼ同じになる。そのため、全体の測定時間は、試料のスペクトル測定にかかる時間の倍の時間を要する。
また、光路上の大気の変動が測定に与える影響を抑制するため、試料スペクトルとバックグラウンドスペクトルの測定の時間的差は短いほど望ましい。
本発明は上記課題に鑑みなされたものであり、その目的は単光路の光学系においても、測定者がバックグラウンドスペクトルと試料スペクトルの測定を別々に行う必要のない分光測定装置を提供することにある。
Usually, the spectrum measurement with the sample installed and the background spectrum measurement must be performed with the same parameter settings, so the time spent for the background measurement is almost the same as the time required for the sample spectrum measurement. Be the same. Therefore, the total measurement time requires twice as long as the time required for measuring the spectrum of the sample.
Moreover, in order to suppress the influence which the fluctuation | variation of the atmosphere on an optical path has on a measurement, it is so preferable that the time difference of the measurement of a sample spectrum and a background spectrum is short.
The present invention has been made in view of the above problems, and an object of the present invention is to provide a spectrometer that does not require the measurer to separately measure the background spectrum and the sample spectrum even in an optical system with a single optical path. is there.

上記目的を達成するため、本発明の分光測定装置は、試料設置箇所に光を導光する光出射手段と、試料から出射された光を検出する光検出手段と、を備え、試料に光を照射し、試料からの出射光を検出することで試料スペクトルを測定する分光測定装置において、試料設置箇所近傍に配置され、試料の設置状態に関する情報を検知する検知手段と、該検知手段からの信号に基き、試料設置箇所に試料が設置されているか否かを判断する判断手段と、前記判断手段によって試料が測定位置に設置されていないと判断されたとき、あらかじめ設定された測定条件に従い、前記光出射手段及び光検出手段を制御して試料未設置の状態で測定を行うことで、バックグラウンドデータを自動的に取得する制御手段と、取得したバックグラウンドデータを記憶する記憶手段と、を備えたこと特徴とする。
上記の分光測定装置において、前記記憶手段は、所定回数分のバックグラウンドデータを記憶し、最も古い時刻に取得したバックグラウンドデータを、最も新しい時刻に取得したバックグラウンドデータに置き換えて記憶することが好適である。
上記の分光測定装置において、前記判断手段および制御手段に替えて、測定したスペクトルデータを基に試料の設置の有無を判断するスペクトル形状確認手段を備え、該スペクトル形状確認手段により、試料が設置されていないことを確認した場合にそのスペクトルデータをバックグラウンドデータとして記憶手段に記憶することが好適である。
In order to achieve the above object, a spectroscopic measurement apparatus of the present invention comprises a light emitting means for guiding light to a sample installation location and a light detecting means for detecting light emitted from the sample, and the light is applied to the sample. In a spectroscopic measurement apparatus that measures a sample spectrum by irradiating and detecting light emitted from the sample, a detection unit that is disposed in the vicinity of the sample installation location and detects information about the sample installation state, and a signal from the detection unit On the basis of the determination means for determining whether or not the sample is installed at the sample installation location, and when the determination means determines that the sample is not installed at the measurement position, according to the measurement conditions set in advance, By controlling the light emitting means and the light detecting means and performing measurement in a state where the sample is not installed, the control means for automatically acquiring the background data, and the acquired background data And wherein further comprising the 憶 storing means.
In the spectroscopic measurement apparatus, the storage unit may store background data for a predetermined number of times, and replace the background data acquired at the oldest time with the background data acquired at the newest time. Is preferred.
In the spectroscopic measurement apparatus, in place of the determination unit and the control unit, a spectrum shape confirmation unit for determining whether or not the sample is installed based on the measured spectrum data is provided, and the sample is installed by the spectrum shape confirmation unit. It is preferable to store the spectrum data in the storage means as background data when it is confirmed that the data is not present.

本発明の分光測定装置によれば、試料設置箇所に試料が設置されているか否かを判断し、自動的にバックグラウンド測定を行うことができる構成としたため、測定者がバックグラウンドスペクトルと試料スペクトルの測定を別々に行う必要がなく、測定者が行う測定時間を短縮できる。
また、本発明の分光測定装置によれば、所定回数分のバックグラウンドデータを記憶し、最も古い時刻に取得したバックグラウンドデータを、最も新しい時刻に取得したバックグラウンドデータに置き換えて記憶する構成としたため、測定者は常に最新のバックグラウンドデータを利用することができる。
According to the spectroscopic measurement apparatus of the present invention, it is possible to determine whether or not a sample is installed at the sample installation location and automatically perform background measurement. It is not necessary to perform the measurement separately, and the measurement time taken by the measurer can be shortened.
In addition, according to the spectroscopic measurement apparatus of the present invention, the background data for a predetermined number of times is stored, the background data acquired at the oldest time is replaced with the background data acquired at the newest time, and stored. Therefore, the measurer can always use the latest background data.

以下に図面を参照して本発明の好適な実施形態について説明する。
図1は本実施形態にかかる分光測定装置の概略構成図である。また、本実施形態ではフーリエ変換赤外分光光度計(FTIR)を例として説明を行うが、これに限定されるものではない。
図1の実施形態の分光測定装置10は、FTIR本体12と、FTIR本体12の制御、及び測定データの処理等を行うコンピュータ14と、を備える。本実施形態のFTIR本体12は、試料を設置する試料室16と、試料室16へ光を導入する光出射手段18と、試料室から出射される光を検出する光検出手段20と、により構成される。さらに、試料の設置状態に関する情報を検知する検知手段22が、FTIR本体12の試料室16等の試料設置箇所近傍に設けられる。
Preferred embodiments of the present invention will be described below with reference to the drawings.
FIG. 1 is a schematic configuration diagram of a spectrometer according to the present embodiment. In this embodiment, a Fourier transform infrared spectrophotometer (FTIR) is described as an example, but the present invention is not limited to this.
1 includes an FTIR main body 12 and a computer 14 that controls the FTIR main body 12, processes measurement data, and the like. The FTIR main body 12 according to this embodiment includes a sample chamber 16 in which a sample is placed, a light emitting means 18 for introducing light into the sample chamber 16, and a light detecting means 20 for detecting light emitted from the sample chamber. Is done. Further, detection means 22 for detecting information related to the sample installation state is provided in the vicinity of the sample installation location such as the sample chamber 16 of the FTIR main body 12.

コンピュータ14は、検知手段22からの信号により、試料が試料室16内の設置箇所に設置されたか否かを判断する判断手段24と、FTIR本体12の光出射手段18及び光検出手段20を制御を行う制御手段26と、を備える。この判断手段24によって試料が設置されていないことが確認されたとき、制御手段26によりバックグラウンド測定が自動的に行われる。
光出射手段18は、光源32と、干渉計34とで構成されており、光源32から出射した光を干渉計34に通すことで干渉光を生成する。本実施形態では干渉計を試料室の前段に配置した例を示したが、これに限定されず試料室の後段に配置する構成、つまり、光検出手段として検出器の前段に干渉計を備えた構成としてもよい。
The computer 14 controls the judgment means 24 for judging whether or not the sample is installed at the installation location in the sample chamber 16, and the light emitting means 18 and the light detection means 20 of the FTIR main body 12 based on a signal from the detection means 22. And a control means 26 for performing the above. When the determination means 24 confirms that no sample is installed, the control means 26 automatically performs background measurement.
The light emitting means 18 includes a light source 32 and an interferometer 34, and generates interference light by passing light emitted from the light source 32 through the interferometer 34. In the present embodiment, an example in which the interferometer is arranged in the front stage of the sample chamber is shown. However, the configuration is not limited thereto, that is, the interferometer is provided in the front stage of the detector as a light detection means. It is good also as a structure.

光検出手段20からの検出信号はデジタル信号に変換されてコンピュータ14に送られ、記憶手段28に記憶される。また、これらの検出信号はコンピュータ14内の演算手段30によって処理が行われる。FTIRでは、光検出手段20によって取得したインターフェログラムデータをフーリエ変換することによってスペクトルデータを得ている。
検知手段22は、試料室蓋、試料の設置箇所となる試料ホルダ等に取り付けられたセンサで構成されている。例えば図2に示すように、検知手段22は、試料室16の試料室蓋の開閉状態を検知する開閉状態検知部36と、試料セル等を保持する試料ホルダ等に取り付けられ、試料の設置の有無を検知する設置状態検知部38とを備える。開閉状態検知部36および設置状態検知部38に用いられるセンサとしては、マイクロスイッチ、フォトインタラプタ、ホールセンサ等を用いればよい。
また、判断手段24では、検知手段22から送られる信号を常時監視して、その情報に基づいて、試料が設置されているかどうかを判断する。
The detection signal from the light detection means 20 is converted into a digital signal, sent to the computer 14, and stored in the storage means 28. Further, these detection signals are processed by the calculation means 30 in the computer 14. In FTIR, spectrum data is obtained by Fourier transforming the interferogram data acquired by the light detection means 20.
The detection means 22 is composed of a sensor attached to a sample chamber lid, a sample holder serving as a sample installation location, and the like. For example, as shown in FIG. 2, the detection means 22 is attached to an open / close state detection unit 36 that detects the open / close state of the sample chamber lid of the sample chamber 16, a sample holder that holds a sample cell, and the like. And an installation state detection unit 38 for detecting presence or absence. As a sensor used for the open / close state detection unit 36 and the installation state detection unit 38, a micro switch, a photo interrupter, a hall sensor, or the like may be used.
The determination means 24 constantly monitors the signal sent from the detection means 22 and determines whether or not a sample is installed based on the information.

制御手段26は、判断手段24によって試料が設置されていないことが確認されたとき、あらかじめ設定された各種測定パラメータに従ってバックグラウンド測定を実行する。測定パラメータは記憶手段28に記憶されており、制御手段26は測定条件を読み出し、それに基づいて測定を行う。
また、バックグラウンド測定で得たデータ(積算回数1回のデータ)は、記憶手段28のバックグラウンドデータ記憶部に、あらかじめ設定された回数分(少なくとも試料スペクトル測定における積算回数分)記憶される。それらのデータは、測定した時刻と関連付けて記憶する等の方法で、測定した時系列が分かるように記憶しておく。設定された回数分より多くのバックグラウンド測定データを得たときは、一番古いデータを消去し、最新のデータと置き換える。
以上が本実施形態の概略構成であり、以下にその作用を説明する。
When the determination unit 24 confirms that no sample is installed, the control unit 26 performs background measurement according to various measurement parameters set in advance. The measurement parameters are stored in the storage unit 28, and the control unit 26 reads out the measurement conditions and performs measurement based on the measurement conditions.
Further, data obtained by background measurement (data of one integration number) is stored in the background data storage unit of the storage means 28 for a preset number of times (at least for the number of integrations in sample spectrum measurement). These data are stored so that the measured time series can be understood by a method such as storing the data in association with the measured time. When more background measurement data is obtained than the set number of times, the oldest data is deleted and replaced with the latest data.
The above is the schematic configuration of the present embodiment, and the operation thereof will be described below.

まず、判断手段24は、検知手段22からの信号を常時監視し、それらの信号に基づいて試料が設置されているかどうかを自動的に判断する。例えば、図2に示すように、試料設置箇所近傍に設けられた設置状態検知部38は、試料ホルダ等の設置箇所に試料セル等が取り付けられているかどうかを検知し、その情報を判断手段24へと送る。また、試料室蓋の近傍に設けられた開閉状態検知部36は、蓋の開閉状態を検知し、その情報を判断手段24へと送る。そして、判断手段24は、設置状態検知部38からの信号が試料未設置時のものであった場合、さらに開閉状態検知部36からの信号により試料室の蓋が閉じていることを確認し、バックグラウンドデータの取得を行うよう制御手段26に信号を送る。このように判断手段24は、試料の設置の有無に加え、試料室蓋が閉じていることを確認している。つまり、不適切な状態、例えば試料室16内に外部からの外乱光が入射する状態、および試料室16内の大気が変動する状態で、バックグラウンドデータの測定が行われることを防いでいる。   First, the determination means 24 constantly monitors signals from the detection means 22 and automatically determines whether or not a sample is installed based on those signals. For example, as shown in FIG. 2, the installation state detection unit 38 provided in the vicinity of the sample installation location detects whether or not a sample cell or the like is installed at the installation location such as the sample holder and determines the information. Send to. The open / close state detection unit 36 provided in the vicinity of the sample chamber cover detects the open / close state of the cover and sends the information to the determination means 24. Then, when the signal from the installation state detection unit 38 is that when the sample is not installed, the determination unit 24 further confirms that the lid of the sample chamber is closed by the signal from the open / close state detection unit 36, A signal is sent to the control means 26 to obtain background data. As described above, the determination unit 24 confirms that the sample chamber lid is closed in addition to the presence or absence of the sample. That is, the background data is prevented from being measured in an inappropriate state, for example, a state in which external disturbance light enters the sample chamber 16 and a state in which the atmosphere in the sample chamber 16 fluctuates.

制御手段26は、記憶手段28に記憶されている測定条件に基づいて、光出射手段18および/または検出手段20を動作させる。光出射手段18から出射した光は、試料室16内に導入され、さらに試料室16内から出射されて光検出手段20へと向う。光検出手段20にて検出された検出信号はAD変換等の処理を施された後、コンピュータ14へと送られ、データ処理が行われる。
このようにして得られたバックグラウンドスペクトルは、記憶手段26に記憶される。上記のバックグラウンド測定を、測定者が試料を設置するまで繰り返し、複数のバックグラウンドデータが記憶される。試料スペクトル測定時の積算回数と少なくとも同数のバックグラウンドデータが必要であるため、バックグラウンドデータは少なくとも積算回数分だけ記憶される。また、所定の回数以上データが得られたときは、最も古い時刻のデータを最も新しい時刻のデータに置き換えていく。試料スペクトル測定時には、試料スペクトルの積算回数分のバックグラウンドデータを積算して利用する。
The control unit 26 operates the light emitting unit 18 and / or the detection unit 20 based on the measurement conditions stored in the storage unit 28. The light emitted from the light emitting means 18 is introduced into the sample chamber 16 and further emitted from the sample chamber 16 toward the light detecting means 20. The detection signal detected by the light detection means 20 is subjected to processing such as AD conversion, and then sent to the computer 14 for data processing.
The background spectrum thus obtained is stored in the storage means 26. The above background measurement is repeated until the measurer installs the sample, and a plurality of background data are stored. Since at least the same number of background data as the number of times of integration at the time of sample spectrum measurement is required, the background data is stored at least for the number of times of integration. When data is obtained more than a predetermined number of times, the oldest data is replaced with the newest data. At the time of sample spectrum measurement, background data corresponding to the number of times of sample spectrum integration is integrated and used.

このように、本実施形態の分光測定装置によれば、装置が自動的に最新のバックグラウンドデータを取得するため、測定者が別途バックグラウンドスペクトルを測定する必要がない。つまり、測定者が装置を使用していない時間を利用して、バックグラウンド測定を行っているため、測定時間が大幅に短縮される。
また、試料を設置する直前の最新のバックグラウンドデータを用いることができるため、光路中の大気や、装置の安定性の影響を最小限に抑えることができる。
As described above, according to the spectroscopic measurement apparatus of the present embodiment, the apparatus automatically acquires the latest background data, so that the measurer does not need to measure the background spectrum separately. That is, the measurement time is greatly shortened because the background measurement is performed using the time when the measurer is not using the apparatus.
In addition, since the latest background data immediately before the sample is installed can be used, the influence of the atmosphere in the optical path and the stability of the apparatus can be minimized.

また、一般にFTIR等の分光測定装置では、試料の形態や測定目的等に合わせて、種々の測定法の選択が容易に行えるよう、干渉計と検出器間の構成部材をユニット化し、これを分析装置本体の試料室に着脱自在な付属品としている。このような付属品を試料形態や測定目的に合わせて選択し分析装置本体に設けることにより、種々の測定法に容易に対応できる。これらの測定法としては、反射ATR測定、高感度反射測定、拡散反射測定、赤外顕微測定、等がある。
装置本体に種々の付属品を着脱自在に設けることのできる分光測定装置では、付属品の認識機能を設けられている。例えば、付属品にその付属品情報を記憶したメモリ等を有する認識タグを設け、付属品の設置箇所に認識タグに記憶された情報を読み取るための読み取り手段を備えることで、コンピュータへ付属品の情報を送るように構成される。
そのため、上記の実施形態において、付属品に設けられたセンサからの識別信号に基づいて、記憶手段に付属品の種別毎にバックグラウンドデータを記憶、もしくはバックグラウンドデータを付属品の種別と関連付けて記憶するようにすることが好適である。
Moreover, in general, in a spectroscopic measurement apparatus such as FTIR, the constituent members between the interferometer and the detector are unitized and analyzed so that various measurement methods can be easily selected according to the form of the sample and the purpose of measurement. It is an accessory that can be attached to and detached from the sample chamber of the main body. By selecting such accessories according to the sample form and measurement purpose and providing them in the main body of the analyzer, it is possible to easily cope with various measurement methods. These measurement methods include reflection ATR measurement, high-sensitivity reflection measurement, diffuse reflection measurement, infrared microscopic measurement, and the like.
In a spectroscopic measurement apparatus in which various accessories can be detachably provided in the apparatus main body, an accessory recognition function is provided. For example, a recognition tag having a memory or the like that stores accessory information is provided on the accessory, and a reading means for reading the information stored in the recognition tag is provided at the installation location of the accessory so that the accessory can be connected to the computer. Configured to send information.
Therefore, in the above embodiment, based on the identification signal from the sensor provided in the accessory, the background data is stored in the storage means for each type of accessory, or the background data is associated with the type of accessory. It is preferable to memorize.

図1の実施形態では、試料室等に設置された検知部からの信号を基にして試料の設置の有無を判断したが、実際にスペクトルデータを測定して、そのスペクトルデータを基に試料の設置の有無を判断することも可能である。図3はその構成の場合の概略構成図である。図1に対応する構成部材には符号100を加え、詳しい説明を省略する。
図3の実施形態では、取得したスペクトルデータを基に試料の設置の有無を判断するスペクトル形状確認手段142を備える。光検出手段120で取得したインターフェログラムはコンピュータ114へ送られ、そこでフーリエ変換手段140にてフーリエ変換されてスペクトルデータが得られる。このスペクトルデータは、スペクトル形状確認手段142へと送られ、そこでスペクトルデータの形状情報を基に、試料設置時のデータか、試料未設置時のデータかを判断する。そしてスペクトル形状確認手段142により、試料が設置されていないことを確認した場合、そのスペクトルデータをバックグラウンドデータとして記憶手段128のバックグラウンドデータ記憶部144に記憶する。また、スペクトル形状確認手段142によって、試料が設置されていると判断された場合、そのスペクトルデータは、記憶手段128のスペクトルデータ記憶部146に記憶される。
In the embodiment of FIG. 1, the presence or absence of the sample is determined based on the signal from the detection unit installed in the sample chamber or the like. However, the spectrum data is actually measured, and the sample data is measured based on the spectrum data. It is also possible to determine the presence or absence of installation. FIG. 3 is a schematic diagram showing the configuration. Components corresponding to those in FIG. 1 are denoted by reference numeral 100 and detailed description thereof is omitted.
In the embodiment of FIG. 3, a spectrum shape confirmation unit 142 that determines whether or not a sample is installed based on the acquired spectrum data is provided. The interferogram acquired by the light detection means 120 is sent to the computer 114, where it is Fourier transformed by the Fourier transform means 140 to obtain spectral data. This spectrum data is sent to the spectrum shape confirmation means 142, where it is determined whether the data is when the sample is set or when the sample is not set based on the shape information of the spectrum data. When the spectrum shape confirmation unit 142 confirms that no sample is installed, the spectrum data is stored in the background data storage unit 144 of the storage unit 128 as background data. When the spectrum shape confirmation unit 142 determines that the sample is installed, the spectrum data is stored in the spectrum data storage unit 146 of the storage unit 128.

スペクトルの形状情報から試料の有無を判断する方法としては、単純には算出したスペクトルデータのピークの有無で試料の有無を判断すればよい。例えば、図4(同図(a)は試料未設置時のスペクトル、同図(b)は試料設置時のスペクトル)に示すように、所定の閾値(図4の点線)を設定して、取得したスペクトルの強度が閾値を超えたか否かによって試料の設置の有無を判断する。図4では取得するスペクトルの全波数範囲に渡って閾値を設定した例を示したが、所定の波長範囲でのみ閾値と比較するようにしてもよい。この閾値は、過去に取得したバックグラウンドデータ等から判断して当業者が適宜設定することができる。さらに、スペクトル強度の他に、スペクトルの面積や、一定区間での局所分散値(波数領域を所定の区間で区切って、その区間内で分散値を計算したもの。図4(c)を参照)に対して、所定の閾値を設定し、その閾値を超えた場合に試料が設置されていると判断してもよい。また、あらかじめ記憶してあるバックグラウンドスペクトルデータとの差の面積等も判断データとすることができる。
また、装置本体に付属品148が設置されていた場合、この付属品148からの識別信号から付属品148の種類を判断し、その付属品148に対応してスペクトル形状の判断を行う。つまり、試料の設置状況を判断するためのパラメータ、例えば、スペクトル強度や面積の閾値、あらかじめ記憶してあるバックグラウンドデータ、等を、付属品148の種類に応じて記憶手段128から読み出し、それらに基いて判断を行う。
As a method of determining the presence / absence of a sample from spectrum shape information, the presence / absence of a sample may be simply determined based on the presence / absence of a peak of calculated spectrum data. For example, as shown in FIG. 4 (the figure (a) is the spectrum when the sample is not installed, and the figure (b) is the spectrum when the sample is installed), the predetermined threshold (dotted line in FIG. 4) is set and acquired. The presence or absence of the sample is determined based on whether or not the intensity of the measured spectrum exceeds a threshold value. Although FIG. 4 shows an example in which the threshold is set over the entire wave number range of the acquired spectrum, the threshold may be compared only with a predetermined wavelength range. This threshold value can be appropriately set by those skilled in the art based on background data acquired in the past. Furthermore, in addition to the spectrum intensity, the area of the spectrum and the local dispersion value in a certain interval (the wave number region is divided by a predetermined interval, and the dispersion value is calculated within that interval; see FIG. 4C). On the other hand, a predetermined threshold value may be set, and if the threshold value is exceeded, it may be determined that the sample is installed. Further, the area of the difference from the background spectrum data stored in advance can be used as the judgment data.
When the accessory 148 is installed in the apparatus main body, the type of the accessory 148 is determined from the identification signal from the accessory 148, and the spectrum shape is determined corresponding to the accessory 148. That is, parameters for judging the installation status of the sample, for example, threshold values of spectrum intensity and area, background data stored in advance, and the like are read from the storage unit 128 according to the type of the accessory 148, and stored in them. Make a judgment based on this.

以上のように本実施形態によれば、バックグラウンドスペクトルの取得のための測定者の手間が省け、測定時間の短縮が実現できる。
また以上の実施形態では、フーリエ変換赤外分光光度計を例にして説明したが、本発明はこれに限定されず、他の型の分光測定装置にも適用可能である。
As described above, according to the present embodiment, it is possible to save the measurer's time for acquiring the background spectrum and to shorten the measurement time.
In the above embodiment, the Fourier transform infrared spectrophotometer has been described as an example. However, the present invention is not limited to this and can be applied to other types of spectroscopic measurement apparatuses.

本発明の実施形態にかかる分光測定装置の概略構成図1 is a schematic configuration diagram of a spectrometer according to an embodiment of the present invention. 本実施形態の検知手段の構成の一例An example of the configuration of the detection means of this embodiment 本発明の第2の実施形態にかかる分光測定装置の概略構成図Schematic configuration diagram of a spectrometer according to a second embodiment of the present invention 図3の実施形態の装置におけるスペクトルデータ確認方法の説明図Explanatory drawing of the spectrum data confirmation method in the apparatus of embodiment of FIG.

符号の説明Explanation of symbols

10 分光測定装置
12 FTIR本体
14 コンピュータ
16 試料室
18 光出射手段
20 光検出手段
22 検知手段
24 判断手段
26 制御手段
28 記憶手段
30 演算手段
DESCRIPTION OF SYMBOLS 10 Spectrometer 12 FTIR main body 14 Computer 16 Sample chamber 18 Light emitting means 20 Light detecting means 22 Detection means 24 Judging means 26 Control means 28 Storage means 30 Calculation means

Claims (3)

試料設置箇所に光を導光する光出射手段と、試料から出射された光を検出する光検出手段と、を備え、試料に光を照射し、試料からの出射光を検出することで試料スペクトルを測定する分光測定装置において、
試料設置箇所近傍に配置され、試料の設置状態に関する情報を検知する検知手段と、
該検知手段からの信号に基き、試料設置箇所に試料が設置されているか否かを判断する判断手段と、
前記判断手段によって試料が測定位置に設置されていないと判断されたとき、あらかじめ設定された測定条件に従い、前記光出射手段及び光検出手段を制御して試料未設置の状態で測定を行うことで、バックグラウンドデータを自動的に取得する制御手段と、
取得したバックグラウンドデータを記憶する記憶手段と、を備えたことを特徴とする分光測定装置。
A light emission means for guiding light to a sample installation location; and a light detection means for detecting light emitted from the sample; the sample spectrum is obtained by irradiating the sample with light and detecting light emitted from the sample; In a spectrometer for measuring
A detecting means arranged in the vicinity of the sample installation location for detecting information relating to the sample installation state;
A judging means for judging whether or not a sample is installed at a sample installation location based on a signal from the detection means;
When the determination means determines that the sample is not installed at the measurement position, the light emission means and the light detection means are controlled according to the measurement conditions set in advance to perform measurement in a state where the sample is not installed. Control means for automatically acquiring background data;
A spectroscopic measurement device comprising storage means for storing the acquired background data.
請求項1に記載の分光測定装置において、
前記記憶手段は、所定回数分のバックグラウンドデータを記憶し、最も古い時刻に取得したバックグラウンドデータを、最も新しい時刻に取得したバックグラウンドデータに置き換えて記憶することを特徴とする分光測定装置。
The spectroscopic measurement device according to claim 1,
The storage means stores background data for a predetermined number of times, and stores the background data acquired at the oldest time by replacing it with the background data acquired at the newest time.
請求項1に記載の分光測定装置において、
前記判断手段および制御手段に替えて、測定したスペクトルデータを基に試料の設置の有無を判断するスペクトル形状確認手段を備え、該スペクトル形状確認手段により、試料が設置されていないことを確認した場合にそのスペクトルデータをバックグラウンドデータとして記憶手段に記憶することを特徴とする分光測定装置。
The spectroscopic measurement device according to claim 1,
In place of the determination means and the control means, provided with a spectrum shape confirmation means for judging whether or not a sample is installed based on the measured spectrum data, and the spectrum shape confirmation means confirms that the sample is not installed And storing the spectrum data in a storage means as background data.
JP2004349476A 2004-12-02 2004-12-02 Spectrometry system Pending JP2006162259A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004349476A JP2006162259A (en) 2004-12-02 2004-12-02 Spectrometry system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004349476A JP2006162259A (en) 2004-12-02 2004-12-02 Spectrometry system

Publications (1)

Publication Number Publication Date
JP2006162259A true JP2006162259A (en) 2006-06-22

Family

ID=36664461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004349476A Pending JP2006162259A (en) 2004-12-02 2004-12-02 Spectrometry system

Country Status (1)

Country Link
JP (1) JP2006162259A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009145145A (en) * 2007-12-13 2009-07-02 Dkk Toa Corp Light diesel oil identifying method and light diesel oil monitor
JP2014089157A (en) * 2012-10-31 2014-05-15 Jasco Corp Spectroscopic instrument
US9829430B2 (en) 2012-08-20 2017-11-28 Hitachi High-Technologies Corporation Spectrophotometer

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6484036A (en) * 1987-09-22 1989-03-29 Matsushita Seiko Kk Indoor unit for separate type air conditioner
JPH06300699A (en) * 1993-02-19 1994-10-28 Kubota Corp Spectrochemical analyzer
JPH07103901A (en) * 1993-09-30 1995-04-21 Daikin Ind Ltd Protecting device for photodetector element of optical measuring apparatus
JP2000199743A (en) * 1998-05-15 2000-07-18 Mitsui Mining & Smelting Co Ltd Measuring apparatus for internal quality of object
JP2000241348A (en) * 1999-02-23 2000-09-08 Kubota Corp Optical measuring apparatus and optical changeover device therefor
JP2002202254A (en) * 2000-10-30 2002-07-19 Dkk Toa Corp Light measuring method and device therefor
JP2004522960A (en) * 2001-02-02 2004-07-29 ブリストル−マイヤーズ・スクイブ・ファーマ・カンパニー Apparatus and method for online monitoring of fluorinated material in vial headspace

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6484036A (en) * 1987-09-22 1989-03-29 Matsushita Seiko Kk Indoor unit for separate type air conditioner
JPH06300699A (en) * 1993-02-19 1994-10-28 Kubota Corp Spectrochemical analyzer
JPH07103901A (en) * 1993-09-30 1995-04-21 Daikin Ind Ltd Protecting device for photodetector element of optical measuring apparatus
JP2000199743A (en) * 1998-05-15 2000-07-18 Mitsui Mining & Smelting Co Ltd Measuring apparatus for internal quality of object
JP2000241348A (en) * 1999-02-23 2000-09-08 Kubota Corp Optical measuring apparatus and optical changeover device therefor
JP2002202254A (en) * 2000-10-30 2002-07-19 Dkk Toa Corp Light measuring method and device therefor
JP2004522960A (en) * 2001-02-02 2004-07-29 ブリストル−マイヤーズ・スクイブ・ファーマ・カンパニー Apparatus and method for online monitoring of fluorinated material in vial headspace

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009145145A (en) * 2007-12-13 2009-07-02 Dkk Toa Corp Light diesel oil identifying method and light diesel oil monitor
US9829430B2 (en) 2012-08-20 2017-11-28 Hitachi High-Technologies Corporation Spectrophotometer
JP2014089157A (en) * 2012-10-31 2014-05-15 Jasco Corp Spectroscopic instrument

Similar Documents

Publication Publication Date Title
KR101603344B1 (en) Apparatus and method for measuring optical characteristics suitable for spectrum measurement
EP2587237B1 (en) Raman spectrum detection system with automatic calibration device
EP3177899B1 (en) Method of reducing the frequency of taking background spectra in ftir or ftir-atr spectroscopy and handheld measurement device embodying same
US9316581B2 (en) Method, apparatus, and article to facilitate evaluation of substances using electromagnetic energy
KR20080096788A (en) A method for ensuring quality of a sample carrier
KR102022730B1 (en) Spectral characteristic measurement apparatus and spectral characteristic measurement method
JP5961482B2 (en) Spectrophotometer
WO2010064276A1 (en) Spectrophotometer
JP5769453B2 (en) Spectral characteristic measuring method and spectral characteristic measuring apparatus
JP5516521B2 (en) Spectrophotometer
US8717557B2 (en) Spectrophotometer and method for determining performance thereof
EP3940357A1 (en) System and method for improving calibration transfer between multiple raman analyzer installations
JP2006162259A (en) Spectrometry system
JP2010286291A (en) Infrared spectroscope and infrared spectral measuring device
JP4506524B2 (en) Optical emission spectrometer
JP2007003428A (en) Emission spectrophotometry and emission spectrophotometer
JP3142018U (en) Spectroscopic analyzer
JP2005037248A (en) Method for determining operational anomaly of spectroscopic analyzer instrument, and apparatus thereof
JP3624587B2 (en) Fluorescence measuring device
JP5949613B2 (en) Spectrophotometer
JP2002198342A (en) Polishing endpoint detector for wafer polishing apparatus
JP3135763U (en) Spectrophotometer
JP3692712B2 (en) Emission spectroscopic analyzer and data processing method using the same
JP2009250787A (en) Spectrophotometer
JPH0719960A (en) Fourier-transform spectrometer

Legal Events

Date Code Title Description
A621 Written request for application examination

Effective date: 20071109

Free format text: JAPANESE INTERMEDIATE CODE: A621

A977 Report on retrieval

Effective date: 20100422

Free format text: JAPANESE INTERMEDIATE CODE: A971007

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100518

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100720

A131 Notification of reasons for refusal

Effective date: 20101005

Free format text: JAPANESE INTERMEDIATE CODE: A131

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101202

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20110315