JP2006161095A - Film deposition apparatus and film deposition method - Google Patents

Film deposition apparatus and film deposition method Download PDF

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JP2006161095A
JP2006161095A JP2004353466A JP2004353466A JP2006161095A JP 2006161095 A JP2006161095 A JP 2006161095A JP 2004353466 A JP2004353466 A JP 2004353466A JP 2004353466 A JP2004353466 A JP 2004353466A JP 2006161095 A JP2006161095 A JP 2006161095A
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tray
film forming
trays
dummy
vacuum chamber
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JP4583151B2 (en
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Satoshi Mori
聡 森
Toshiyuki Suemitsu
敏行 末光
Seiji Nakajima
誠二 中嶋
Takafumi Okuma
崇文 大熊
Hitoshi Yamanishi
斉 山西
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a film deposition apparatus and a film deposition method which enable pre-treatment such as pre-sputtering in a vacuum vessel to be performed without arranging complicated shutter mechanism. <P>SOLUTION: The film deposition apparatus performs film deposition in such a manner that a plurality of trays 4 are shifted in order to each of the plurality of vacuum vessels 1 connected in series and film-depositing treatment is applied to a work 6 held with the tray 4 in each vacuum vessel 1, wherein each of the plurality of trays 4 has constitution having, in at least the end parts, projecting parts 10 functioning as blocking parts for holding a prescribed atmosphere in the vacuum vessel 1 with conductance by blocking opening holes 2a disposed at both end parts of the vessel so as to leave a gap permissible to pass the tray 4 itself therethrough when the tray is set at a prescribed film-depositing position in each vacuum vessel 1. Some trays among the plurality of trays 4 are used as dummy trays 4b which do not convey the work 6, and the pre-deposition treatment is performed in the vacuum vessel 1 into which the dummy tray 4b is shifted. The individual atmosphere can be held in each vacuum vessel 1 by hermetically sealing the vacuum vessel with the tray 4 itself functioning as the shut-off means. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は真空槽内で被処理物に対してスパッタリング等の成膜処理を行う成膜装置及び成膜方法に関するものである。   The present invention relates to a film forming apparatus and a film forming method for performing a film forming process such as sputtering on an object to be processed in a vacuum chamber.

成膜装置の一例として、図5にスパッタ装置を示す。このスパッタ装置では、真空槽11内において、カソード12上にターゲット13を設置し、ターゲット13に対向するようにワーク14をトレー15(もしくはホルダー)を介して、あるいは直接に、ステージ(図示せず)上に載置し、その状態で、真空槽11内にAr等の不活性ガスを導入し、槽内を所定の圧力に調圧した後、カソード12に直流電力または高周波電力(ターゲット材料により決定される)を印加することにより、ワーク14とターゲット13との間にプラズマ放電P1を発生させて、ターゲット13をスパッタし、スパッタされたターゲット材料をワーク14上に沈着させて薄膜形成する。   As an example of the film forming apparatus, FIG. 5 shows a sputtering apparatus. In this sputtering apparatus, a target 13 is placed on a cathode 12 in a vacuum chamber 11, and a workpiece 14 is placed on a stage (not shown) via a tray 15 (or holder) or directly so as to face the target 13. In this state, an inert gas such as Ar is introduced into the vacuum chamber 11, the inside of the chamber is adjusted to a predetermined pressure, and then DC power or high-frequency power (depending on the target material) is applied to the cathode 12. The plasma discharge P1 is generated between the workpiece 14 and the target 13, the target 13 is sputtered, and the sputtered target material is deposited on the workpiece 14 to form a thin film.

ターゲット13は、装置待機中に表面が酸化されたり、プラズマ放電P1によって表面にターゲット材料以外の不純物が付着するので、図示したように、ターゲット13とワーク14との間で直動または旋回して両者間を遮断するシャッター16を設置しておき、成膜処理に先立って、ターゲット13とシャッター16との間にプラズマ放電P1を発生させて、ターゲット13の表面の酸化物や付着物を除去するプリスパッタ処理を行っている。シャッター16は、プリスパッタ処理で発生したダスト等が真空槽11内やワーク14上に付着するのを防ぐ機能を担う。   Since the surface of the target 13 is oxidized during the stand-by of the apparatus or impurities other than the target material adhere to the surface due to the plasma discharge P1, as shown in the figure, the target 13 moves linearly or swivels between the target 13 and the workpiece 14 A shutter 16 that cuts between the two is installed, and plasma discharge P1 is generated between the target 13 and the shutter 16 prior to the film forming process to remove oxides and deposits on the surface of the target 13. Pre-sputtering is performed. The shutter 16 has a function of preventing dust or the like generated in the pre-sputtering process from adhering to the inside of the vacuum chamber 11 or the work 14.

従来のスパッタ装置では、上記したようにシャッターを真空槽内で動作させるため、シャッター駆動部の真空シールやシャッター動作によるダスト発生を防ぐ構造等の複雑な機構が必要である。しかし近年、光学部品やMEMS(micro electro mechanical system)等、製造される部品が小型化されるに伴って、成膜装置のコンパクト化(卓上サイズ)、簡素化が求められ、複雑なシャッター機構を設けることは困難になってきた。   In the conventional sputtering apparatus, since the shutter is operated in the vacuum chamber as described above, a complicated mechanism such as a vacuum seal of the shutter driving unit and a structure for preventing dust generation due to the shutter operation is necessary. However, in recent years, as the parts to be manufactured, such as optical parts and MEMS (micro electro mechanical system), have been downsized, the film deposition system has been required to be compact (desktop size) and simplified. It has become difficult to provide.

本発明は、上記問題に鑑みて、複雑なシャッター機構を設けることなく真空槽内のプリスパッタ等の前処理が可能な成膜装置及び成膜方法を提供することを目的とする。   In view of the above problems, an object of the present invention is to provide a film forming apparatus and a film forming method capable of performing pretreatment such as pre-sputtering in a vacuum chamber without providing a complicated shutter mechanism.

上記目的を達成するために、本発明の成膜装置は、直列に接続された複数の真空槽のそれぞれに複数のトレーを順次に移送して、トレーに保持したワークに各真空槽内で成膜処理を施す成膜装置において、前記複数のトレーはそれぞれ、各真空槽内の所定の成膜位置に配置された時に槽両端の開口部をトレー自体の通過を許容する隙間を残して閉塞して、コンダクタンスにより真空槽内に所定の雰囲気を保持する閉塞部を少なくとも端部に有し、前記複数のトレーの内の一部は、ワークを搬送しないダミートレーとし、ダミートレーが移送された真空槽内でプリデポジション処理を行うように構成されたことを特徴とする。   In order to achieve the above object, the film forming apparatus of the present invention sequentially transfers a plurality of trays to each of a plurality of vacuum chambers connected in series, and forms a work held on the tray in each vacuum chamber. In the film forming apparatus that performs film processing, each of the plurality of trays closes the opening at both ends of the tank leaving a gap that allows the tray itself to pass when the trays are arranged at predetermined film forming positions in each vacuum tank. In addition, at least one end of the plurality of trays has a closed portion that maintains a predetermined atmosphere in the vacuum chamber due to conductance, and a part of the plurality of trays is a dummy tray that does not transfer workpieces, and the vacuum to which the dummy tray is transferred A predeposition process is performed in the tank.

また本発明の成膜方法は、直列に接続された複数の真空槽のそれぞれに複数のトレーを順次に移送して、トレーに保持したワークに各真空槽内で成膜処理を施す成膜方法において、前記複数のトレーとして、各真空槽内の所定の成膜位置に配置された時に槽両端の開口部をトレー自体の通過を許容する隙間を残して閉塞して、コンダクタンスにより真空槽内に所定の雰囲気を保持する閉塞部を少なくとも端部に有したトレーを、ワークを搬送しないダミートレーを含めて移送し、前記ダミートレーが移送された真空槽内でプリデポジション処理を行うことを特徴とする。   Further, the film forming method of the present invention is a film forming method in which a plurality of trays are sequentially transferred to each of a plurality of vacuum chambers connected in series, and a film forming process is performed in each vacuum chamber on a work held on the tray. The plurality of trays are closed at a predetermined film formation position in each vacuum chamber, and the openings at both ends of the chamber are closed leaving a gap that allows the tray itself to pass through, and the conductance creates the inside of the vacuum chamber. A tray having at least an obstructing portion for maintaining a predetermined atmosphere is transported including a dummy tray that does not transport a workpiece, and predeposition processing is performed in a vacuum chamber to which the dummy tray is transported. And

上記した成膜装置および成膜方法によれば、トレー自体を密封手段として各真空槽に個別の雰囲気を保持できるとともに、ダミートレーが移送された真空槽で、ダミートレーを遮蔽手段として、あるいはダミートレーによって成膜時と同様の槽内状態を実現して、所定のプリデポジション処理を行うことができる。したがって、従来のような複雑なシャッター機構は必要なく、装置を簡素化することができる。   According to the film forming apparatus and the film forming method described above, each atmosphere can be maintained in each vacuum chamber by using the tray itself as a sealing means, and the dummy tray can be used as a shielding means in the vacuum chamber to which the dummy tray is transferred, or a dummy The same state in the tank as that during film formation can be realized by the tray, and a predetermined predeposition process can be performed. Therefore, a complicated shutter mechanism as in the prior art is not necessary, and the apparatus can be simplified.

プリデポジション処理は、スパッタリングによる成膜前にターゲット表面の酸化物及び不純物を取り除くプリスパッタ処理であってよい。
ワークの種類および成膜条件に応じてダミートレーを増減すればよい。ダミートレー数によってプリデポジション処理回数が設定されるからである。
The pre-deposition process may be a pre-sputter process that removes oxides and impurities on the target surface before film formation by sputtering.
What is necessary is just to increase / decrease a dummy tray according to the kind of workpiece | work and film-forming conditions. This is because the number of predeposition processes is set by the number of dummy trays.

搬送トレーとダミートレーとを交互に配置することで、成膜とプリデポジション処理とを交互に行うことができる。たとえばスパッタリングでは、通常、1回の成膜処理毎にターゲット表面上の酸化物及び不純物を取り除いているので、それに適した処理と言える。   By alternately arranging the transfer tray and the dummy tray, film formation and predeposition processing can be performed alternately. For example, in sputtering, since oxides and impurities on the target surface are usually removed for each film formation process, it can be said to be a process suitable for that.

本発明の成膜装置及び成膜方法によれば、複雑なシャッター機構を設けることなく、所定のプリデポジション処理を行うことができる。プロセスに必要な機能を排除することなく、装置を簡素化できるものである。   According to the film forming apparatus and the film forming method of the present invention, a predetermined predeposition process can be performed without providing a complicated shutter mechanism. The apparatus can be simplified without eliminating the functions required for the process.

以下、本発明の実施の形態について、図面を参照しながら説明する。
図1は、本発明の第1の実施形態における成膜装置の概略構成を示す断面図である。
この成膜装置は、スパッタ装置として構成されており、複数種の異なる成膜処理を順次に行うことを目的として、複数の真空槽1が直列に接続されている。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a cross-sectional view showing a schematic configuration of a film forming apparatus according to the first embodiment of the present invention.
This film forming apparatus is configured as a sputtering apparatus, and a plurality of vacuum chambers 1 are connected in series for the purpose of sequentially performing a plurality of different types of film forming processes.

これら複数の真空槽1は、中央部に開口2aを有する隔壁2により互いに仕切られ、それぞれ内部に2つのカソード3(ターゲット含む)が対向して設置されており、複数個のトレー4が真空槽1の配列方向に沿って順次に移動して、各真空槽1内のカソード3間の所定の成膜位置に配置され、トレー4の貫通穴5内に保持されたワーク6の表裏両面に成膜処理が施される構造となっている。   The plurality of vacuum chambers 1 are separated from each other by a partition wall 2 having an opening 2a in the center, and two cathodes 3 (including a target) are disposed facing each other, and the plurality of trays 4 are vacuum chambers. 1 are sequentially moved along the arrangement direction of 1, arranged at predetermined film forming positions between the cathodes 3 in each vacuum chamber 1, and formed on both the front and back surfaces of the work 6 held in the through holes 5 of the tray 4. It has a structure in which film treatment is performed.

各真空槽1は、マグネトロンスパッタ方式を採用していて、マグネトロン放電によってカソード3の近傍で多量のイオンを作り、蒸着速度を高める。カソード3のワーク6への対向面以外が放電しないようにカソード3の周囲を覆っているアースシールド7には、トレー4が通過できる開口7aが設けられている。8は真空排気系、9は給気系である。   Each vacuum chamber 1 employs a magnetron sputtering method, and generates a large amount of ions in the vicinity of the cathode 3 by magnetron discharge to increase the deposition rate. The earth shield 7 covering the periphery of the cathode 3 is provided with an opening 7a through which the tray 4 can pass so that only the surface of the cathode 3 facing the work 6 is discharged. 8 is an evacuation system and 9 is an air supply system.

複数のトレー4は、上記した貫通穴5を有する搬送用トレー4aと、後述するプリデポジション処理に使用されるダミートレー4bとからなり、それぞれ、真空槽1の内側面に設けられたガイドローラ(図示せず)により位置規制されながら移動する。   The plurality of trays 4 include a transport tray 4 a having the above-described through holes 5 and dummy trays 4 b used for predeposition processing described later, and guide rollers provided on the inner surface of the vacuum chamber 1, respectively. It moves while being regulated by the position (not shown).

各トレー4(4a,4b)の移動方向における前端と後端にはそれぞれ、隔壁2に沿う方向に突出した突部10が開口2aよりやや小さい寸法で形成されていて、各トレー4が真空槽1内の所定の成膜位置に配置された時に、突部10がそれ自体の通過を許容するわずかな隙間を残して開口2aを閉塞する。真空槽1を密封するゲートバルブを設けることなく、コンダクタンス(管内気体の流れやすさを示す量)を利用して、各真空槽1内に所定の雰囲気を保持する構造である。通常は、単一の真空排気系8によって各真空槽1から排気しながら、各真空槽1に個別の給気系9より適量の給気を行うことで、真空槽1の両端に差圧を生じさせる。   Projections 10 projecting in the direction along the partition wall 2 are formed with dimensions slightly smaller than the opening 2a at the front end and the rear end in the moving direction of each tray 4 (4a, 4b). When the projection 10 is disposed at a predetermined film-forming position in 1, the projection 10 closes the opening 2 a leaving a slight gap allowing the passage of the projection 10. Without providing a gate valve for sealing the vacuum chamber 1, a predetermined atmosphere is maintained in each vacuum chamber 1 using conductance (an amount indicating the ease of gas flow in the tube). Usually, a differential pressure is applied to both ends of the vacuum chamber 1 by supplying an appropriate amount of air to each vacuum chamber 1 from an individual air supply system 9 while exhausting from each vacuum chamber 1 by a single vacuum exhaust system 8. Cause it to occur.

以下、上記した成膜装置における成膜方法を説明する。
図1においては、最も下流側の真空槽1内にダミートレー4bが配置され、上流側の2つの真空槽1に、ワーク6を保持した搬送用トレー4aが配置されている。
Hereinafter, a film forming method in the above-described film forming apparatus will be described.
In FIG. 1, a dummy tray 4 b is disposed in the most downstream vacuum chamber 1, and a transport tray 4 a holding a workpiece 6 is disposed in the two upstream vacuum chambers 1.

この状態で、各真空槽1内にAr等の不活性ガスを導入し、各真空槽1内を所定の圧力に調圧した後、各カソード3に直流電力または高周波電力(ターゲット材料により決定される)を印加することにより、上流側の2つの真空槽1内で、ワーク6とカソード3との間にプラズマ放電P1を発生させてカソード3(ターゲット)をスパッタし、スパッタされたターゲット材料をワーク6上に沈着させて薄膜形成する。最下流の真空槽1では、カソード3とダミートレー4bとの間でプラズマ放電(プリスパッタ放電)P2を発生させてプリスパッタ処理を行い、カソード3の表面の酸化物や不純物を取り除く。   In this state, an inert gas such as Ar is introduced into each vacuum chamber 1 and the inside of each vacuum chamber 1 is adjusted to a predetermined pressure, and then direct current power or high frequency power (determined by the target material) is applied to each cathode 3. In the two vacuum chambers 1 on the upstream side, a plasma discharge P1 is generated between the workpiece 6 and the cathode 3 to sputter the cathode 3 (target), and the sputtered target material is A thin film is formed by depositing on the workpiece 6. In the most downstream vacuum chamber 1, plasma discharge (pre-sputter discharge) P <b> 2 is generated between the cathode 3 and the dummy tray 4 b to perform pre-sputtering, thereby removing oxides and impurities on the surface of the cathode 3.

次いで、図2に示した状態を経てダミートレー4b,搬送用トレー4aを移送して、ワーク6が搬送された真空槽1内で成膜処理を行う。プリスパッタ処理で生じたダストは真空排気系9を通じて排気されるか、ダミートレー4bに付着して搬出される。   Next, the dummy tray 4b and the transfer tray 4a are transferred through the state shown in FIG. 2, and a film forming process is performed in the vacuum chamber 1 in which the workpiece 6 is transferred. Dust generated by the pre-sputtering process is exhausted through the vacuum exhaust system 9 or attached to the dummy tray 4b and carried out.

その後、同様にして、トレー4(4a,4b)を移送し、搬送用トレー4aが搬入された真空槽1内でワーク6に対する成膜処理を行い、ダミートレー4bが搬入された真空槽1内でプリスパッタ処理を行う。   Thereafter, in the same manner, the tray 4 (4a, 4b) is transferred, the film 6 is formed on the workpiece 6 in the vacuum chamber 1 in which the transfer tray 4a is loaded, and the inside of the vacuum chamber 1 in which the dummy tray 4b is loaded. Pre-sputtering is performed at

このようにして、複数の真空槽1に複数のワーク6を順次に搬送して成膜処理する成膜装置において、各真空槽1を密封する真空バルブを設けることなく、また複雑なシャッター機構を設けることなく、成膜処理とプリスパッタ処理とを並行して行うことができ、成膜装置の簡素化を実現できる。なお、複数の真空槽1に同一プロセスが並べられる場合は処理時間に差は生じないが、別プロセスが並べられる場合は、時間の長いプロセスに律速されることになる。   In this way, in a film forming apparatus that sequentially transfers a plurality of workpieces 6 to a plurality of vacuum chambers 1 and performs a film forming process, a complicated shutter mechanism is provided without providing a vacuum valve for sealing each vacuum chamber 1. Without being provided, the film forming process and the pre-sputtering process can be performed in parallel, and the film forming apparatus can be simplified. When the same process is arranged in a plurality of vacuum chambers 1, there is no difference in processing time. However, when another process is arranged, the process is limited to a process having a long time.

プリスパッタ処理の頻度は、複数の搬送用トレー4aの間に任意の間隔でダミートレー4bを配置することによって任意に設定できる。例えばワーク6を保持した10個の搬送用トレー4aの後にダミートレー4bを1個配置することで、10回の成膜を終了する毎に1回のプリスパッタ処理を行う設定とすることができる。しかし各真空槽1は、ダミートレー4bが配置された時に必ずしもプリスパッタ処理を行わなくてもよい。   The frequency of the pre-sputtering process can be arbitrarily set by arranging dummy trays 4b at arbitrary intervals between the plurality of transfer trays 4a. For example, by placing one dummy tray 4b after ten transfer trays 4a holding the workpiece 6, it is possible to set one pre-sputtering process every time ten film formations are completed. . However, each vacuum chamber 1 does not necessarily have to perform the pre-sputtering process when the dummy tray 4b is arranged.

図3は、本発明の第2の実施形態における成膜装置の概略構成を示す断面図である。
この成膜装置では、搬送用トレー4aとダミートレー4bとを交互に配置している。プリスパッタ処理は、1回の成膜を終了する毎に行うのが望ましく、現状でもそのような頻度で行うことが多いため、このような構成が実用的である。
FIG. 3 is a cross-sectional view showing a schematic configuration of a film forming apparatus according to the second embodiment of the present invention.
In this film forming apparatus, the transfer trays 4a and the dummy trays 4b are alternately arranged. Such a configuration is practical because it is desirable to perform the pre-sputtering process every time film formation is completed, and even in the present situation, it is often performed at such a frequency.

図4は、本発明の第3の実施形態における成膜装置の概略構成を示す断面図である。
この成膜装置では、トレー4を真空槽1の2つ分の大きさとし、トレー4の進行方向に向かって後ろ側半分にワーク3を保持することにより、トレー4の前半分に上記したダミートレー4bと同様の機能を持たせている。
FIG. 4 is a sectional view showing a schematic configuration of a film forming apparatus according to the third embodiment of the present invention.
In this film forming apparatus, the tray 4 has a size equivalent to two of the vacuum chamber 1, and the workpiece 3 is held in the rear half in the traveling direction of the tray 4, so that the dummy tray described above is placed in the front half of the tray 4. It has the same function as 4b.

上記した図1〜図4の成膜装置では、真空槽1内に2つのカソード3を対向して設置し、その間でトレー4(4a,4b)を移送して、ワーク6の表裏両面に成膜するようにしたが、先に図5を用いて説明したようなカソードが1つの成膜装置でも、搬送用トレーとダミートレーとを用いることにより、同様にしてプリスパッタ処理を行うことができる。トレー4(4a,4b)の移送も上記した手段に限定されない。   In the film forming apparatus shown in FIGS. 1 to 4 described above, two cathodes 3 are installed facing each other in the vacuum chamber 1, and the tray 4 (4 a, 4 b) is transferred between them to form both the front and back surfaces of the work 6. Although the film is formed, the pre-sputtering process can be similarly performed by using the transfer tray and the dummy tray even in the film forming apparatus having one cathode as described with reference to FIG. . The transfer of the tray 4 (4a, 4b) is not limited to the above-described means.

さらに、成膜をスパッタリングによらず行う場合、たとえばCVDにより成膜する場合に、上記と同様に搬送用トレーとダミートレーとを移送することにより、トレー自体を密封手段として各真空槽に個別の雰囲気を保持できるのはもちろん、ダミートレーが移送された真空槽で、成膜時と同様の槽内配置を実現して、槽内雰囲気を調整する目的でプラズマ放電するプリデポジション処理を行うことができる。   Further, when film formation is not performed by sputtering, for example, when film formation is performed by CVD, by transferring the transfer tray and the dummy tray in the same manner as described above, the tray itself is used as a sealing means for each vacuum chamber. In addition to being able to maintain the atmosphere, pre-deposition processing that performs plasma discharge for the purpose of adjusting the atmosphere in the tank is realized in the vacuum tank to which the dummy tray has been transferred, realizing the same arrangement as in the film formation. Can do.

本発明の成膜装置及び成膜方法は、複雑なシャッター機構を用いることなく、プリスパッタ等の前処理が可能なコンパクト、簡素な装置構成を実現したものであり、光学部品やMEMS等の小型部品の製造に特に有用である。   The film forming apparatus and the film forming method of the present invention realize a compact and simple apparatus configuration capable of preprocessing such as pre-sputtering without using a complicated shutter mechanism, and are small in size such as optical components and MEMS. Particularly useful in the manufacture of parts.

本発明の第1の実施形態における成膜装置の概略構成図1 is a schematic configuration diagram of a film forming apparatus according to a first embodiment of the present invention. 図1の成膜装置のトレー移送時の状態を示した概略構成図Schematic configuration diagram showing the state of the film forming apparatus of FIG. 本発明の第2の実施形態における成膜装置の概略構成図Schematic configuration diagram of a film forming apparatus in a second embodiment of the present invention 本発明の第3の実施形態における成膜装置の概略構成図Schematic configuration diagram of a film forming apparatus according to a third embodiment of the present invention. 従来の成膜装置の概略構成図Schematic configuration diagram of conventional film deposition equipment

符号の説明Explanation of symbols

1 真空槽
2 隔壁
2a 開口
3 カソード
4 トレー
4a 搬送用トレー
4b ダミートレー
6 ワーク
10 突部(閉塞部)
P1 プラズマ放電
P2 プリスパッタ放電
1 Vacuum chamber 2 Bulkhead
2a Opening 3 Cathode 4 Tray
4a Transport tray
4b Dummy tray 6 Workpiece
10 Protrusion (occlusion)
P1 Plasma discharge
P2 Pre-sputter discharge

Claims (5)

直列に接続された複数の真空槽のそれぞれに複数のトレーを順次に移送して、トレーに保持したワークに各真空槽内で成膜処理を施す成膜装置において、
前記複数のトレーはそれぞれ、各真空槽内の所定の成膜位置に配置された時に槽両端の開口部をトレー自体の通過を許容する隙間を残して閉塞して、コンダクタンスにより真空槽内に所定の雰囲気を保持する閉塞部を少なくとも端部に有し、前記複数のトレーの内の一部は、ワークを搬送しないダミートレーとし、ダミートレーが移送された真空槽内でプリデポジション処理を行うように構成された成膜装置。
In a film forming apparatus that sequentially transfers a plurality of trays to each of a plurality of vacuum tanks connected in series, and performs a film forming process in each vacuum tank on a work held on the tray,
When the plurality of trays are arranged at predetermined film formation positions in each vacuum chamber, the openings at both ends of the chamber are closed leaving a gap that allows the tray itself to pass through, and a predetermined conductance is provided in the vacuum chamber by conductance. And at least one end of the plurality of trays is a dummy tray that does not carry workpieces, and predeposition processing is performed in a vacuum chamber to which the dummy trays are transferred. A film forming apparatus configured as described above.
プリデポジション処理が、スパッタリングによる成膜前にターゲット表面の酸化物及び不純物を取り除くプリスパッタ処理である請求項1記載の成膜装置。   The film forming apparatus according to claim 1, wherein the predeposition process is a presputter process for removing oxides and impurities on the target surface before film formation by sputtering. ワークの種類および成膜条件に応じてダミートレーが増減される請求項1記載の成膜装置。   The film forming apparatus according to claim 1, wherein the number of dummy trays is increased or decreased in accordance with the type of work and the film forming conditions. 搬送トレーとダミートレーとが交互に移送される請求項3記載の成膜装置。   The film forming apparatus according to claim 3, wherein the transfer tray and the dummy tray are alternately transferred. 直列に接続された複数の真空槽のそれぞれに複数のトレーを順次に移送して、トレーに保持したワークに各真空槽内で成膜処理を施す成膜方法において、
前記複数のトレーとして、各真空槽内の所定の成膜位置に配置された時に槽両端の開口部をトレー自体の通過を許容する隙間を残して閉塞して、コンダクタンスにより真空槽内に所定の雰囲気を保持する閉塞部を少なくとも端部に有したトレーを、ワークを搬送しないダミートレーを含めて移送し、前記ダミートレーが移送された真空槽内でプリデポジション処理を行う成膜方法。
In the film forming method of sequentially transferring a plurality of trays to each of a plurality of vacuum tanks connected in series, and performing a film forming process in each vacuum tank on a work held on the tray,
When the plurality of trays are arranged at predetermined film forming positions in each vacuum chamber, the openings at both ends of the chamber are closed leaving a gap that allows the tray itself to pass through, and a predetermined conductance is provided in the vacuum chamber by conductance. A film forming method in which a tray having a closed portion for holding an atmosphere at least at an end thereof is transferred including a dummy tray that does not transport a workpiece, and a predeposition process is performed in a vacuum chamber to which the dummy tray is transferred.
JP2004353466A 2004-12-07 2004-12-07 Film forming apparatus and film forming method Expired - Fee Related JP4583151B2 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016148327A1 (en) * 2015-03-13 2016-09-22 (주)씨앤아이테크놀로지 In-line sputtering system having plurality of rotatable tray holders, and package shielding manufacturing method using same
CN112359340A (en) * 2020-10-30 2021-02-12 湘潭宏大真空技术股份有限公司 Coating system applied to plate-type workpiece

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01301853A (en) * 1988-05-31 1989-12-06 Hitachi Ltd Vacuum treatment equipment
JPH04228573A (en) * 1990-12-27 1992-08-18 Matsushita Electric Ind Co Ltd Method for reducing particulate contamination in plasma chemical vapor deposition device
JPH0574739A (en) * 1991-09-13 1993-03-26 Hitachi Ltd Vacuum processor and operating method therefor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01301853A (en) * 1988-05-31 1989-12-06 Hitachi Ltd Vacuum treatment equipment
JPH04228573A (en) * 1990-12-27 1992-08-18 Matsushita Electric Ind Co Ltd Method for reducing particulate contamination in plasma chemical vapor deposition device
JPH0574739A (en) * 1991-09-13 1993-03-26 Hitachi Ltd Vacuum processor and operating method therefor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016148327A1 (en) * 2015-03-13 2016-09-22 (주)씨앤아이테크놀로지 In-line sputtering system having plurality of rotatable tray holders, and package shielding manufacturing method using same
CN112359340A (en) * 2020-10-30 2021-02-12 湘潭宏大真空技术股份有限公司 Coating system applied to plate-type workpiece

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